Ion Collectors Patents (Class 250/489)
  • Patent number: 7999241
    Abstract: An extreme ultraviolet light source apparatus has a magnetic field generator which generates a magnetic field region around a direction of the magnetic field passing through a plasma region in which a plasma is to be generated and converges charged particles including ion emitted from the plasma region toward the direction of the magnetic field, a first charged particle collector (receiver) mounted at both sides of an axis of the magnetic field in the magnetic field region in order to collect (receive) the charged particles converged by the magnetic field, a target supply unit supplying a target from a nozzle located outside a converging region in which the charged particles are to be converged inside the magnetic field region in an extreme ultraviolet light generating chamber, and a target collector located at a position opposite to the nozzle, the target retrieval portion retrieving a residual target which does not contribute to generation of the plasma.
    Type: Grant
    Filed: October 23, 2009
    Date of Patent: August 16, 2011
    Assignee: Gigaphoton Inc.
    Inventors: Shinji Nagai, Takanobu Ishihara, Kouji Kakizaki, Tamotsu Abe
  • Publication number: 20110031388
    Abstract: A detector array and method for making the detector array. The array includes a substrate including a plurality of trenches formed therein, and includes a plurality of collectors electrically isolated from each other, formed on the walls of the trenches, and configured to collect charge particles incident on respective ones of the collectors and to output from said collectors signals indicative of charged particle collection. The array includes a plurality of readout circuits disposed on a side of the substrate opposite openings to the collectors. The readout circuits are configured to read charge collection signals from respective ones of the plurality of collectors.
    Type: Application
    Filed: February 27, 2009
    Publication date: February 10, 2011
    Applicant: Research Triangle Institute
    Inventors: Christopher A. Bower, Kristin Hedgepath Gilchrist, Brian R. Stoner, Dorota Temple
  • Patent number: 7875860
    Abstract: According to an embodiment, an apparatus for measuring the uniformity of a beam of charged particles at an exposure location includes a plurality of Faraday cups, each cup including an electrometer for determining the current collected by said cup, at least one multi-channel low current scanner card electrically coupled to the electrometers, a processor electrically coupled to said at least one scanner card, computational analysis software for receiving signals from said processor and calculating beam parameters, and display software for generating a graphical representation of the beam parameters calculated by said computational analysis software.
    Type: Grant
    Filed: September 19, 2008
    Date of Patent: January 25, 2011
    Assignee: The Boeing Company
    Inventors: Jason Andrew Koehn, Dennis A. Russell
  • Publication number: 20110006204
    Abstract: A detector array and method for making the detector array. The detector array includes a substrate including a plurality of trenches formed therein, and a plurality of collectors electrically isolated from each other, formed on the walls of the trenches, and configured to collect charged particles incident on respective ones of the collectors and to output from the collectors signals indicative of charged particle collection. In the detector array, adjacent ones of the plurality of trenches are disposed in a staggered configuration relative to one another. The method forms in a substrate a plurality of trenches across a surface of the substrate such that adjacent ones of the trenches are in a staggered sequence relative to one another, forms in the plurality of trenches a plurality of collectors, and connects a plurality of electrodes respectively to the collectors.
    Type: Application
    Filed: February 24, 2009
    Publication date: January 13, 2011
    Applicant: RESEARCH TRIANGLE INSTITUTE
    Inventors: Christopher A. Bower, Kristin Hedgepath Gilchrist, Brian R. Stoner
  • Publication number: 20100276591
    Abstract: This invention describes an electrode structure formed from a plurality of individual electrodes, the individual electrodes being provided on separate submounts, the submounts being coupled to one another using kinematic ball mounts. Such a structure may be configured as a RF ion guide, mass filter or ion trap.
    Type: Application
    Filed: July 15, 2010
    Publication date: November 4, 2010
    Applicant: Microsaic Systems Limited
    Inventor: Alan Finlay
  • Publication number: 20100072362
    Abstract: A time-of-flight mass spectrometer (1) comprises an ion source a segmented linear ion device (10) for receiving sample ions supplied by the ion source and a time-of-flight mass analyser for analysing ions ejected from the segmented device. A trapping voltage is applied to the segmented device to trap ions initially into a group of two or more adjacent segments and subsequently to trap them in a region of the segmented device shorter than the group of segments. The trapping voltage may also be effective to provide a uniform trapping field along the length of the device (10).
    Type: Application
    Filed: December 7, 2007
    Publication date: March 25, 2010
    Inventors: Roger Giles, Michael Sudakov, Hermann Wollnik
  • Patent number: 7639770
    Abstract: A cylindrical neutron generator is formed with a coaxial RF-driven plasma ion source and target. A deuterium (or deuterium and tritium) plasma is produced by RF excitation in a cylindrical plasma ion generator using an RF antenna. A cylindrical neutron generating target is coaxial with the ion generator, separated by plasma and extraction electrodes which contain many slots. The plasma generator emanates ions radially over 360° and the cylindrical target is thus irradiated by ions over its entire circumference. The plasma generator and target may be as long as desired. The plasma generator may be in the center and the neutron target on the outside, or the plasma generator may be on the outside and the target on the inside. In a nested configuration, several concentric targets and plasma generating regions are nested to increase the neutron flux.
    Type: Grant
    Filed: April 22, 2008
    Date of Patent: December 29, 2009
    Assignee: The Regents of the University of California
    Inventor: Ka-Ngo Leung
  • Patent number: 7609067
    Abstract: Embodiments of the present invention pertain to an electronic portion of a MEMs ion gauge with ion collectors bowed out of plane to form a three dimensional arrangement and a method for forming an electronic portion of a MEMs ion gauge with ion collectors bowed out of plane to form a three dimensional arrangement. In one embodiment, an ion gauge substrate is formed. The electronic portion of the MEMs ion gauge is assembled by coupling a plurality of ion collectors with the ion gauge substrate, wherein the coupling of the plurality of ion collectors with the ion gauge substrate further comprises performing an operation that causes the plurality of ion collectors to be bowed out of plane to form a three dimensional arrangement.
    Type: Grant
    Filed: November 9, 2005
    Date of Patent: October 27, 2009
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Chien-Hua Chen, James McKinnell
  • Publication number: 20090256072
    Abstract: A particle inlet system comprises a first chamber having a limiting orifice for an incoming gas stream and a micrometer controlled expansion slit. Lateral components of the momentum of the particles are substantially cancelled due to symmetry of the configuration once the laminar flow converges at the expansion slit. The particles and flow into a second chamber, which is maintained at a lower pressure than the first chamber, and then moves into a third chamber including multipole guides for electromagnetically confining the particle. The vertical momentum of the particles descending through the center of the third chamber is minimized as an upward stream of gases reduces the downward momentum of the particles. The translational kinetic energy of the particles is near-zero irrespective of the mass of the particles at an exit opening of the third chamber, which may be advantageously employed to provide enhanced mass resolution in mass spectrometry.
    Type: Application
    Filed: April 9, 2008
    Publication date: October 15, 2009
    Applicant: UT-BATTELLE, LLC
    Inventor: Peter T. A. Reilly
  • Patent number: 7550719
    Abstract: An electron beam source device is provided in which the disconnection and deterioration of a filament of the electron beam source device can be accurately predicted and determined, so as to avoid an unnecessary resource waste and increase of cost due to a premature replacement of a still-functional filament in a conventional device. Additionally, disorganization caused by a sudden disconnection or by the subsequent recovery procedure when the deformation of the filament occurs can be avoided to, reduce the measuring time, the maintenance and management man-hour. A filament current is measured at all time through a filament current measuring circuit 11, and a ratio of the filament current when the light-on time is zero to the current filament current is calculated at all time through an operational circuit 12.
    Type: Grant
    Filed: February 5, 2007
    Date of Patent: June 23, 2009
    Assignee: Shimadzu Corporation
    Inventor: Shuichi Kawana
  • Patent number: 7501640
    Abstract: A low energy electron cooling system and method for increasing the phase space intensity and overall intensity of low energy ion beams, including a vacuum chamber to allow electron beam and ion beam merging and separation, a cathode to generate the electron beam, a collector to collect the electron beam, magnetic field generation devices to guide the electrons on their desired trajectories, and electrodes to accelerate and decelerate the electron beam. By overlapping the electron and ion beams, thermal energy is transferred from the ion beam to the electron beam, which allows an increase in the phase space density and overall density of the ion beams. Advantageously, the low energy electron cooling system uses electrodes to set up electrostatic potentials that trap non-beam neutralizing-background-ions longitudinally within the electron cooling region and solenoidal fields that trap the non-beam neutralizing-background-ions radially within the electron cooling region.
    Type: Grant
    Filed: February 24, 2007
    Date of Patent: March 10, 2009
    Inventor: Delbert J. Larson
  • Publication number: 20090039282
    Abstract: Analyte ions are generated in an ion source by matrix-assisted laser desorption (MALDI) in which laser light pulses have significantly less than one nanosecond duration, focal diameters of less than twenty micrometers and energy densities such that only about one picogram of sample is desorbed per pulse of laser light and per laser spot. An unexpectedly high degree of ionization of analyte molecules is produced for selected matrix substances. Many laser spots can be generated side-by-side from a single laser light pulse for use with MALDI time-of-flight mass spectrometers. Applying pulses with a repetition rate of around 50 kilohertz and moving the sample or guiding the laser light beam so each laser light pulse impinges on a cool sample spot allows the ion source to be used with spectrometers that require a constant ion current.
    Type: Application
    Filed: July 22, 2008
    Publication date: February 12, 2009
    Applicant: BRUKER DALTONIK GMBH
    Inventors: Andreas Haase, Jens Hohndorf
  • Patent number: 7479644
    Abstract: This invention relates to a method of measuring a property of an ion beam, for example an ion beam current profile or the emittance of an ion beam. A Faraday array comprising an array of ion beam current sensors is employed. The array can provide an ion beam current profile at the plane of the array. The Faraday array is also used in conjunction with an occluding element that may be moved through the ion beam upstream of the Faraday array, there obscuring varying portions of the ion beam from the Faraday array. Suitable manipulation of the signals from the Faraday allows the ion beam current profile to be determined for the plane of the occluding element, and also for the emittance of the ion beam at the plane of the occluding element to be determined.
    Type: Grant
    Filed: October 30, 2006
    Date of Patent: January 20, 2009
    Assignee: Applied Materials, Inc.
    Inventors: Geoffrey Ryding, Takao Sakase, Marvin Farley, Theodore Smick
  • Patent number: 7446327
    Abstract: Apparatus for amplifying a stream of primary charged particles comprises a body defining a chamber and an entrance aperture for receiving the stream of primary charged particles into the chamber, and an incident dynode, adapted to be charged to a pre-determined electrical potential, having a surface positioned in the chamber to be impacted by said primary charged particles at an angle of incidence greater than 30° from the surface normal and in response to the impact to generate a stream of secondary charged particles.
    Type: Grant
    Filed: April 21, 2006
    Date of Patent: November 4, 2008
    Assignee: ETP Electron Multipliers Pty Ltd.
    Inventor: Richard W. Stresau
  • Patent number: 7442945
    Abstract: A Faraday assembly of an ion implantation apparatus includes a Faraday cup in a vacuum chamber, a driving shaft to which the Faraday cup is connected, a motor for inserting the driving shaft further into and drawing the driving shaft out of the vacuum chamber to cause the Faraday cup to advance and retreat within the chamber, and an auxiliary supplier of power for exerting a force that acts on the driving shaft as the driving shaft is being extracted by the motor from the vacuum chamber. Therefore, the force of suction, due to a pressure difference between interior and exterior of the vacuum chamber, is prevented from overloading the motor as the Faraday cup retreats within the vacuum chamber. As a result, the Faraday cup is positioned precisely and efficiently within the vacuum chamber.
    Type: Grant
    Filed: November 23, 2005
    Date of Patent: October 28, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Sun-Ho Hwang, Sang-Kuk Park
  • Patent number: 7427864
    Abstract: An ion balance monitor for simultaneous monitoring of the positive and negative ion production rates, and therefore ion concentration, by measurement of currents resulting from the presence of airborne ions as created for example by an air (gas) ionizer. Additionally it examines the ion balance by comparing the aforementioned currents. Information acquired in this way can be used in real time monitoring of the ionizer. Ion balance and production rate of ions of both polarities can be recorded by the ion monitor, regardless of the type of the ionizer. The ion monitor can provide a feedback signal needed to keep an ionizer system in balance.
    Type: Grant
    Filed: October 28, 2005
    Date of Patent: September 23, 2008
    Assignee: Trek, Inc.
    Inventors: Bruce T. Williams, Jerzy Kieres, Maciej A. Noras
  • Patent number: 7421973
    Abstract: An ion shower comprises a plasma source operable to generate source gas ions within a chamber, and an extraction assembly associated with a top portion of the chamber. The extraction assembly is operable to extract ions from the top portion of the chamber. The ion shower further comprises a workpiece support structure associated with the top portion of the chamber that is operable to secure the workpiece having an implantation surface orientated facing downward toward the extraction assembly for implantation thereof. The ion shower of the present invention advantageously facilitates SIMOX processing with a high oxygen fraction, and uniform beam current for next generation processing.
    Type: Grant
    Filed: January 21, 2004
    Date of Patent: September 9, 2008
    Assignee: Axcelis Technologies, Inc.
    Inventors: Peter L. Kellerman, Victor M. Benveniste, William F. DiVergili, Michael P. Bradley
  • Publication number: 20080135781
    Abstract: A substrate for mass spectrometry for effectively performing ionization has been demanded. The substrate for mass spectrometry includes a base, a porous film formed on the base, and an inorganic material film formed on the porous film. The inorganic material film has a plurality of concaves formed vertically to the base, and the diameter of the concaves is not less than 1 nm and less than 1 ?m.
    Type: Application
    Filed: July 10, 2007
    Publication date: June 12, 2008
    Applicant: CANON KABUSHIKI KAISHA
    Inventors: Hirokatsu Miyata, Kazuhiro Yamauchi, Kimihiro Yoshimura
  • Patent number: 7355169
    Abstract: A method of inhibiting the reaction between ions of opposite polarity is disclosed. The method includes exposing a population of ions to a resonance excitation frequency during a mass-to-charge altering reaction between a first subpopulation of ions and a second subpopulation of ions, the resonance excitation frequency being tuned to inhibit the mass-to-charge altering reaction between an ion of the first subpopulation of ions having a predetermined mass-to-charge ratio and an ion of the second subpopulation of ions so that when an ion of the first subpopulation of ions attains the predetermined mass-to-charge ratio, the ion having the predetermined mass-to-charge ratio is selectively inhibited from reacting with ions of the second subpopulation of ions.
    Type: Grant
    Filed: May 5, 2006
    Date of Patent: April 8, 2008
    Assignee: Purdue Research Foundation
    Inventors: Scott A. McLuckey, Gavin E. Reid, James Mitchell Wells
  • Patent number: 7282702
    Abstract: An ion neutralizer enhances a heat transfer rate between a reflecting plate and a frame while preventing the reflecting plate from being bent due to thermal deformation. The ion neutralizer includes a frame and a plurality of reflecting plates integrally formed with the frame to neutralize plasma ions. Each reflecting plate has a cantilever shape. Each reflecting plate has a supporting end in surface contact with the frame, and a free end to define a space with the frame in order to prevent the reflecting plate from being bent upon stretching due to thermal deformation.
    Type: Grant
    Filed: July 6, 2005
    Date of Patent: October 16, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Yun Kwang Jeon, Jung Wook Kim
  • Patent number: 7180078
    Abstract: An apparatus for an ion trap includes an electrically conductive substrate having top and bottom surfaces and having vias that cross from the top surface to the bottom surface. The apparatus includes a pair of planar first electrodes supported over said top surface and second electrodes having planar surfaces. The planar surfaces are located over said top surface, and portions of the planar surfaces are located laterally adjacent to said planar first electrodes. One of the second electrodes includes a portion that is located in one of the vias and traverses the substrate.
    Type: Grant
    Filed: February 1, 2005
    Date of Patent: February 20, 2007
    Assignee: Lucent Technologies Inc.
    Inventors: Stanley Pau, Richart Elliott Slusher
  • Patent number: 7064321
    Abstract: An ion funnel screen ions from a gas stream flowing into a differential pump stage of a mass spectrometer, transfers them to a subsequent differential pump stage. The ion funnel uses apertured diaphragms between which gas escapes easily. Holders for the apertured diaphragms are also provided that offer little resistance to the escaping gas while, at the same time, serving to feed the RF and DC voltages.
    Type: Grant
    Filed: April 6, 2004
    Date of Patent: June 20, 2006
    Assignee: Bruker Daltonik GmbH
    Inventor: Jochen Franzen
  • Patent number: 7064317
    Abstract: A method of inhibiting the reaction between ions of opposite polarity is disclosed. The method includes exposing a population of ions to a resonance excitation frequency during a mass-to-charge altering reaction between a first subpopulation of ions and a second subpopulation of ions, the resonance excitation frequency being tuned to inhibit the mass-to-charge altering reaction between an ion of the first subpopulation of ions having a predetermined mass-to-charge ratio and an ion of the second subpopulation of ions so that when an ion of the first subpopulation of ions attains the predetermined mass-to-charge ratio, the ion having the predetermined mass-to-charge ratio is selectively inhibited from reacting with ions of the second subpopulation of ions.
    Type: Grant
    Filed: August 12, 2002
    Date of Patent: June 20, 2006
    Assignee: Purdue Research Foundation
    Inventors: Scott A. McLuckey, Gavin E. Reid, James Mitchell Wells
  • Patent number: 6822238
    Abstract: The invention provides apparatus and methods which facilitate movement of an instrument relative to an item or location being monitored and/or the item or location relative to the instrument, whilst successfully excluding extraneous ions from the detection location. Thus, ions generated by emissions from the item or location can successfully be monitored during movement. The technique employs sealing to exclude such ions, for instance, through an electro-field which attracts and discharges the ions prior to their entering the detecting location and/or using a magnetic field configured to repel the ions away from the detecting location.
    Type: Grant
    Filed: August 20, 2002
    Date of Patent: November 23, 2004
    Assignee: British Nuclear Fuels PLC
    Inventors: Christopher Henry Orr, Craig Janson Luff, Thomas Dockray, Duncan Whittemore Macarthur
  • Patent number: 6653637
    Abstract: In a high-sensitivity X-ray detector, an image of the secondary electrons is little shifted and deformed by the astigmatism or the like even when it approaches very close to a specimen set on the stage of an electron microscope. When a beam of charged particles strike a specimen, the specimen emits backscattered charged particles along with X-rays. To prevent such undesired charged particles from entering into the X-ray detecting element of the X-ray detector, a means for generating a first magnetic field is applied. Another means for generating a second magnetic field is provided to cancel the magnetic filed leaked from the first means for generating magnetic field at the position of the specimen.
    Type: Grant
    Filed: December 19, 2001
    Date of Patent: November 25, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Isao Ochiai, Hiroyuki Shinada, Kimio Kanda
  • Patent number: 6566661
    Abstract: A beam/wafer alignment arrangement has a laser and sensor mounted on the scanning magnet. Direct alignment of the wafer relative to the scanning magnet is determined by reflecting the beam in a specular surface on the wafer holder back to the sensor. Correct alignment of the wafer translation direction is also confirmed from any movement of the reflected light spot on the sensor as the wafer holder is translated up and down. A further sensor is mounted on the beam stop to monitor any misalignment of the process chamber to the collimator magnet, and for checking the location of the travelling Faraday.
    Type: Grant
    Filed: October 11, 2000
    Date of Patent: May 20, 2003
    Assignee: Applied Materials, Inc.
    Inventor: Robert John Clifford Mitchell
  • Publication number: 20020100877
    Abstract: In a high-sensitivity X-ray detector, an image of the secondary electrons is little shifted and deformed by the astigmatism or the like even when it approaches very close to a specimen set on the stage of an electron microscope. When a beam of charged particles strike a specimen, the specimen emits backscattered charged particles along with X-rays. To prevent such undesired charged particles from entering into the X-ray detecting element of the X-ray detector, a means for generating a first magnetic field is applied. Another means for generating a second magnetic field is provided to cancel the magnetic filed leaked from the first means for generating magnetic field at the position of the specimen.
    Type: Application
    Filed: December 19, 2001
    Publication date: August 1, 2002
    Inventors: Isao Ochiai, Hiroyuki Shinada, Kimio Kanda
  • Publication number: 20020088946
    Abstract: A device for trapping at least one chromatography peak of a chromatography flow comprises at least one trapping column, an inlet capillary for leading the chromatography flow into the trapping column and an outlet capillary departing from the trapping column. A plurality of trapping columns are provided on a column carrier wherein the trapping columns are separately and selectively connectable to the inlet and outlet capillary.
    Type: Application
    Filed: October 24, 2001
    Publication date: July 11, 2002
    Inventors: Martin Hofmann, Manfred Spraul, Marcus Godejohann
  • Patent number: 5527731
    Abstract: A surface treating method of the invention comprises the steps of generating mixed chemical species containing an intended chemical species of ions necessary for surface treatment by ionization of a gas, selectively trapping the intended chemical species from the mixed chemical species, exciting the intended chemical species to predetermined vibrational and electronic states, extracting the excited chemical species from a position where trapped, and subjecting the extracted chemical species to surface treatment on a surface of an article to be treated. In this method, the intended chemical species of ions which are under vibrational and electronic conditions effective for the surface treatment and have a certain mass number have been once trapped at a given position. The trapped ions are uniformly arranged with respect to their translational velocity and applied to a sample surface. Thus, dry etching with high anisotropy and high selectivity to material and deposition with good uniformity can be realized.
    Type: Grant
    Filed: November 10, 1993
    Date of Patent: June 18, 1996
    Assignee: Hitachi, Ltd.
    Inventors: Seiji Yamamoto, Kozo Mochiji
  • Patent number: 4545383
    Abstract: A tapered substantially cylindrical housing forming an antenna structure to collect radiation as an emission from a human body and consisting of an antenna, the antenna forming a reflective liner having an upward taper relative to the housing becoming reduced to a small outlet passage in the neck portion of the housing, a sensing plate across the neck portion of the housing above the outlet passage, a shutter pivotal to overlie the outlet passage, a hood having a reflective lining extending upwardly of the housing and providing access to the sensing plate, and both the liner and the hood focus radiation onto the sensing plate.
    Type: Grant
    Filed: May 23, 1983
    Date of Patent: October 8, 1985
    Assignee: Toftness Post-Graduate School of Chiropratic Inc.
    Inventor: Irwing N. Toftness
  • Patent number: 4302679
    Abstract: An ion gauge having a reduced "x-ray limit" and means for measuring that limit. The gauge comprises an ion gauge of the Bayard-Alpert type having a short collector and having means for varying the grid-collector voltage.The "x-ray limit" (i.e. the collector current resulting from x-rays striking the collector) may then be determined by the formula: ##EQU1## where: I.sub.x ="x-ray limit",I.sub.l and I.sub.h =the collector current at the lower and higher grid voltage respectively; and,.alpha.=the ratio of the collector current due to positive ions at the higher voltage to that at the lower voltage.
    Type: Grant
    Filed: August 7, 1979
    Date of Patent: November 24, 1981
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: David Edwards, Jr., Christopher P. Lanni
  • Patent number: 4286153
    Abstract: Method and apparatus for separation of an isotope substance from a mixture of isotope substances such as UF.sub.6 by adiabatically decompressing the mixture in vaporous or gaseous form to cool the mixture to a temperature below 100.degree. K. and irradiating by an electromagnetic wave selectively absorbed by an isotope substance, passing the mixture after cooling and irradiating in a diffuser at a velocity greater than the speed of sound and decelerating to convert the velocity into pressure with reduced velocity of the mixture. The higher pressure results in substantial reduction in operating costs and capital investment.
    Type: Grant
    Filed: July 9, 1976
    Date of Patent: August 25, 1981
    Assignee: Kraftwerk Union Aktiengesellschaft
    Inventors: Karl Janner, Klaus Gregorius, Eberhard Schuster
  • Patent number: 4250430
    Abstract: A multi-stage collector for a transit-time tube has a catcher plate with a hollow element extending inwardly therefrom and coaxially aligned with the electron beam of the tube.
    Type: Grant
    Filed: September 20, 1978
    Date of Patent: February 10, 1981
    Assignee: Siemens Aktiengesellschaft
    Inventor: Hinrich Heynisch
  • Patent number: 4179615
    Abstract: A Faraday dish for making measurements at a beam path of a heavy ion accelerator comprising a supporting structure, a hollow outer conductor and an inner conductor coaxial with the outer conductor. The outer and inner conductors each have a first portion with an open end facing the beam and a second portion perpendicular to the beam path.
    Type: Grant
    Filed: September 1, 1978
    Date of Patent: December 18, 1979
    Assignee: Gesellschaft fur Schwerionenforschung mbH, Darmstadt
    Inventors: Hubert Kraus, Peter Strehl
  • Patent number: 3986024
    Abstract: An arrangement for the electrical detection of ions for mass spectroscopic etermination of the mass values and of the mass intensities, in which a channel multiplier plate has a number of electron multipliers of minimum dimension, and is located behind the exit gap of the magnet of the mass spectroscopic device for capturing ions focused in the focal plane of the spectroscopic device. The electrons emanating from the channel multiplier plate and emitted off by ions of different mass in the electron multipliers, are captured and the signals generated by the collected electrons are transmitted to a recorder. Wires located behind and along the channel multiplier plate, capture the electrons and transmit the signals generated by the electrons, to the recorder. The wires are perpendicular to the direction of the electron multipliers, and perpendicular to the lengthwise direction of the exit gap. The wires are isolated from each other and do not contact one another.
    Type: Grant
    Filed: December 15, 1975
    Date of Patent: October 12, 1976
    Assignee: Kernforschungsanlage Julich Gesellschaft mit beschrankter Haftung
    Inventor: Leonhard Radermacher