Stress Or Contact Indicators Patents (Class 252/961)
  • Patent number: 7393468
    Abstract: An adhesive adapted with particular optical properties, and its use to couple a substrate to a substrate holder during substrate processing are disclosed. After processing the substrate, the optical properties of the adhesive may be exploited to locate and/or remove adhesive residue that may be present on the substrate.
    Type: Grant
    Filed: February 23, 2005
    Date of Patent: July 1, 2008
    Assignee: Intel Corporation
    Inventors: Daoqiang Lu, Eric J. Li
  • Patent number: 6159394
    Abstract: The present invention provides a new stress emission material that is different from the other known materials and that efficiently emits light when subjected to a mechanical external force such as a frictional force, a shear force, an impact, or a pressure. This stress emission material is configured by adding an emission center comprising one or more rare earths or transition metals that emit light when electrons excited by a mechanical force return to their normal state, to a base material comprising one or more of an oxide, a sulfide, a carbide, and a nitride each having an FeS.sub.2 structure. This material has an emission intensity that depends on stress.
    Type: Grant
    Filed: February 5, 1999
    Date of Patent: December 12, 2000
    Assignee: Agency of Industrial Science and Technology
    Inventors: Morito Akiyama, Chaonan Xu, Kazuhiro Nonaka, Tadahiko Watanabe
  • Patent number: 5182212
    Abstract: A new and improved integrating indicator system operable to signal the attainment of one or more preselected time-temperature integrals which monitor the temperature and time history of a product utilizes a dual system of specific reaction pairs which simultaneously generate acid and alkali from two neutral substrates. One of the substrates is present in excess of the other. The preferred dynamic indicator system generates a constant pH buffer in the alkali range that is maintained until one of the substrates is depleted. At that time, a rapid pH change in the indicator solution to the acid range occurs, resulting in a very sharp visual color change in a pH-sensitive dye. In preferred embodiments, the specific reaction pairs are enzyme/substrate pairs, preferably urease/urea and yeast/triacetin.
    Type: Grant
    Filed: October 18, 1991
    Date of Patent: January 26, 1993
    Assignee: Oscar Mayer Foods Corporation
    Inventor: Thomas J. Jalinski
  • Patent number: 5085802
    Abstract: A new and improved integrating indicator system operable to signal the attainment of one or more preselected time-temperature integrals which monitor the temperature and time history of a product utilizes a dual system of specific reaction pairs which simultaneously generate acid and alkali from two neutral substrates. One of the substrates is present in excess of the other. The preferred dynamic indicator system generates a constant pH buffer in the alkali range that is maintained until one of the substrates is depleted. At that time, a rapid pH change in the indicator solution to the acid range occurs, resulting in a very sharp visual color change in a pH-sensitive dye. In preferred embodiments, the specific reaction pairs are enzyme/substrate pairs, preferably urease/urea and yeast/triacetin.
    Type: Grant
    Filed: January 31, 1991
    Date of Patent: February 4, 1992
    Assignee: Oscar Mayer Foods Corporation
    Inventor: Thomas J. Jalinski
  • Patent number: 4918711
    Abstract: A process for improving the technique of measuring residual stress by x-ray diffraction in pieces of nickel-base alloys which comprises covering part of a predetermined area of the surface of a nickel-base alloy with a dispersion, exposing the covered and uncovered portions of the surface of the alloy to x-rays by way of an x-ray diffractometry apparatus, making x-ray diffraction determinations of the exposed surface, and measuring the residual stress in the alloy based on these determinations. The dispersion is opaque to x-rays and serves a dual purpose since it masks off unsatisfactory signals such that only a small portion of the surface is measured, and it supplies an internal standard by providing diffractogram peaks comparable to the peaks of the nickel alloy so that the alloy peaks can be very accurately located regardless of any sources of error external to the sample.
    Type: Grant
    Filed: April 26, 1988
    Date of Patent: April 17, 1990
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Robert M. Berman, Isadore Cohen