Memory Core Storage Element Testing Patents (Class 324/211)
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Patent number: 11782080Abstract: The present invention is a remotely controlled, automated shielding effectiveness test system for hardening against the effects of high altitude electromagnetic pulses. The system monitors and reports the on-going effectiveness of an enclosure that shields electronic devices and communications systems from electromagnetic pulses. The system reports provide information to a user to determine whether corrective action is needed for the enclosure to ensure continued protection of the electronic devices and communications systems within the enclosure. The system comprises providing a high-altitude electromagnetic pulse (HEMP) enclosure enclosing at least an electronic device, and an electronic testing apparatus for testing effectiveness of HEMP shielding of the enclosure; and performing a shielding effectiveness test by the apparatus on the enclosure, comprising a first compression sub-test, a second environment sub-test, and a third final shielding effectiveness sub-test.Type: GrantFiled: July 30, 2021Date of Patent: October 10, 2023Assignee: JaXon Engineering and Maintenance LLCInventors: Robert N Bogojevich, Chris T. Martin, Kelly L. Rice, David S. Robley, Blake L. Smith
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Patent number: 10637643Abstract: The invention Ubit can make data semantics understandable to both humans and machine; semantic translating tools no needed any more, such as compiler, interpreter, semantic analysis, web parser, domain name resolution; machine embodies real intelligence. The three password authentication makes entity authentication nearly unbreakable. Three key encryption can easily realize one-time pad, and also can used in data storage encryption; making data in perfect secure. Ubit presents an interface method between human and human, between machine and human, and between machine and machine; makes all data compatible one another; and anyone can access anything, from anywhere, and in anytime. The methods make hardware and software much more precisely, efficiency and space saved. All methods can be easily implemented.Type: GrantFiled: November 25, 2013Date of Patent: April 28, 2020Inventor: Shengyuan Wu
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Patent number: 9040933Abstract: Controlling electromagnetic (‘EM’) radiation in a data center having a number EM sections, including: receiving, by an EM controller, a specification of preferred EM radiation characteristics for the data center; and setting, by the EM controller, a state of each EM section in accordance with the specification, where the state of each EM section may be one of: an absorption state in which the EM section absorbs EM radiation or a reflection state in which the EM section reflects EM radiation.Type: GrantFiled: March 10, 2014Date of Patent: May 26, 2015Assignee: Lenovo Enterprise Solutions (Singapore) Pte. Ltd.Inventors: Milton Cobo, James E. Hughes, Thomas D. Pahel, Jr., Pravin S. Patel, Challis L. Purrington, Jack P. Wong
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Publication number: 20140139209Abstract: Several novel features pertain to an automatic testing equipment (ATE) memory tester that includes a load board, a projected-field electromagnet, a positioning mechanism and a memory tester. The load board is for coupling to a die package that includes a magnetoresistive random access memory (MRAM) having several cells, where each cell includes a magnetic tunnel junction (MTJ). The projected-field electromagnet is for applying a portion of a magnetic field across the MRAM. The portion of the magnetic field may be substantially uniform. The positioning mechanism is coupled to the electromagnet and the load board, and is configured to position the electromagnet vertically about (above/below) the die package when the die package is coupled to the load board. The memory tester is coupled to the load board. The memory tester is for testing the MRAM when the substantially uniform portion of the magnetic field is applied across the MRAM.Type: ApplicationFiled: November 19, 2012Publication date: May 22, 2014Applicant: QUALCOMM INCORPORATEDInventors: Kangho Lee, Xiao Lu, Wah Nam Hsu, Seung H. Kang
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Patent number: 8653824Abstract: A method for quasi-static testing a magnetic recording head read sensor is described. The method includes applying a first voltage to a heater in the magnetic recording head and measuring an output of the magnetic recording head read sensor while applying the first voltage to the heater and recording the measured output as a first set of measurements. The method further includes applying a second voltage to the heater in the magnetic recording head and measuring the output of the magnetic recording head read sensor while applying the second voltage to the heater and recording the measured output as a second set of measurements. The first and second sets of measurements are then compared.Type: GrantFiled: December 16, 2009Date of Patent: February 18, 2014Assignee: Western Digital (Fremont), LLCInventors: Feng Liu, Mehran Zargari
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Publication number: 20130057265Abstract: A tamper sensing system mounted with respect to a protected structure so as to have corresponding stress changes occur therein in response to selected kinds of tamperings with said protected structure comprising a first pair of stress affected magnetoresistive memory devices each capable of having a magnetic material layer therein established in a selected one of a pair of alternative magnetization states if in a first kind of stress condition and of being established in a single magnetization state if in an alternative second kind of stress condition, and the magnetic material layer in each having a magnetization in a first direction in one of the pair of alternative magnetization states and in a second direction in that remaining one of the pair of magnetization states.Type: ApplicationFiled: September 14, 2012Publication date: March 7, 2013Applicant: NVE CORPORATIONInventor: James G. Deak
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Patent number: 8358127Abstract: A measuring circuit system in a magnetic field measuring apparatus of the invention has an amplifier and a band-pass filter connected in sequence on an output terminal side of the TMR element, the band-pass filter is a narrow-range band-pass filter such that a peak pass frequency of the filter that is a center is a basic frequency selected from a range of 10 to 40 GHz and a band width centered around the basic frequency is a narrow range of ±0.5 to ±4 GHz; and with the measuring circuit system, an SIN ratio (SNR) of 3 dB or greater is obtained, the SNR being defined by a ratio of an amplitude S of a high-frequency generated signal induced by the TMR element to a total noise N that is a sum of a head noise generated by the TMR element and a circuit noise generated by the amplifier. With such a configuration, an in-plane high-frequency magnetic field generated by a microwave-assisted magnetic head is reliably and precisely measured.Type: GrantFiled: April 7, 2010Date of Patent: January 22, 2013Assignee: TDK CorporationInventors: Isamu Sato, Hiroshi Ikeda, Mikio Matsuzaki, Tetsuya Roppongi, Noboru Yamanaka, Tsutomu Aoyama
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Patent number: 8063630Abstract: In testing thin-film magnetic heads, first, a back surface opposite to a medium facing surface of each of a plurality of thin-film magnetic heads is attached to a first surface of a first plate of a jig, the jig including the first plate of rubber having the first and second surfaces facing toward opposite directions, and a second plate greater in rigidity than the first plate and bonded to the second surface of the first plate. Next, the plurality of thin-film magnetic heads and the jig are mounted on a metal plate having a flat top surface, such that the medium facing surfaces of the thin-film magnetic heads touch the top surface of the metal plate. Next, heat-generating components of the plurality of thin-film magnetic heads mounted on the metal plate are energized.Type: GrantFiled: March 14, 2008Date of Patent: November 22, 2011Assignee: TDK CorporationInventors: Takamitsu Kamimura, Masato Sugahara, Kenji Yumoto
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Patent number: 7982466Abstract: A method for inspecting a semiconductor memory having nonvolatile memory cells using ferroelectric capacitors is disclosed which comprises, after shelf-aging the ferroelectric capacitor in a first polarized state, the steps of: (a) writing a second polarized state opposite to the first polarized state; (b) shelf-aging the ferroelectric capacitor in the second polarized state; and (c) reading the second polarized state. The temperature or voltage in the step (a) is lower than the temperature or voltage in the step (c). This method for inspecting a semiconductor memory enables to evaluate the imprint characteristics in a short time.Type: GrantFiled: November 6, 2006Date of Patent: July 19, 2011Assignee: Fujitsu Semiconductor LimitedInventors: Yukinobu Hikosaka, Tomohiro Takamatsu, Yoshinori Obata
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Patent number: 7288935Abstract: A dynamic electrical tester (DET) for testing head gimbal assemblies (HGA) is disclosed. The DET simulates disk drive operation while significantly reducing tester capital investment. Multiple HGAs are tested simultaneously using modular spin stands with shared electronics. This design increases utilization of electronics and minimizes the effect of spindle start/stop time. A parallel array of spin stands with shared electronics is used to reduce tester component and materials cost by multiplexing between the spin stands. The DET has the significant advantage of reducing wait time by making use of the electronics while they are idle during mechanical-related delays. In addition, the DET includes more channels per test head that can readily switch back and forth between the products being tested.Type: GrantFiled: April 15, 2005Date of Patent: October 30, 2007Assignee: Hitachi Global Storage Technologies Netherlands BVInventors: Terry Farren, Yong Shen
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Patent number: 7009390Abstract: The invention relates to a method for characterizing a ferroelectric material, comprising application of an electric voltage to a sample of said ferroelectric material, measuring the electric current flowing through said sample, and joint treatment of the applied voltage signal and the measured current signal in order to provide representation data characterizing the polarization of the ferroelectric material. The method also includes controlling the applied electric voltage in such a way that superpositioning can be performed for a first current component having a large signal amplitude at a first frequency and a second current component having a second small signal amplitude at a second frequency which is much greater than the first frequency, and identifying the characteristics of the ferromagnetic material respectively associated with locally reversible polarization effects and locally irreversible polarization effects.Type: GrantFiled: September 16, 2003Date of Patent: March 7, 2006Assignees: Centre Nationa de la Recherche Scientifique-CNRS, Ecole Normale Superieure de CachanInventors: Lionel Cima, Eric Laboure
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Patent number: 6944837Abstract: A system and method for evaluating a device under test (DUT) that utilizes a model of the DUT interfaced to DUT interface logic, which is designed to interface the DUT to automated testing equipment (ATE). By ensuring that the model includes a description of the DUT and of the DUT testing interface, conditions such as connections between ports of the IC (i.e., buddying) that may or may not be interfaced to the ATE may be included in the model to enable precise test pattern sets to be generated using the model. The test pattern sets may be used by a simulator to test the design of an IC or by ATE to test a fabricated IC having the design.Type: GrantFiled: December 20, 2002Date of Patent: September 13, 2005Assignee: Agilent Technologies, Inc.Inventors: John G Rohrbaugh, Jeff Rearick, Christopher M Juenemann
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Patent number: 6684173Abstract: The present invention provides a screen for abnormal cells using the cell transconductance. In one embodiment, a method involves reading cells against an elevated reference current while applying an elevated gate voltage, or alternatively, reading all cells against a standard reference current while applying a nominal or elevated gate voltage, and a reduced drain voltage. The abnormal cells fail this test while normal cells pass.Type: GrantFiled: October 9, 2001Date of Patent: January 27, 2004Assignee: Micron Technology, Inc.Inventors: Jeffrey Alan Kessenich, Andrei Mihnea, Devin Batutis
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Patent number: 6633459Abstract: The invention is a magnetoresistive recording head including the reader portion that has a top and bottom shield, a first auxiliary electrical connection, a second auxiliary electrical connection, a first auxiliary electrical contact, and a second auxiliary electrical contact, where the first auxiliary electrical connection electrically connects the first auxiliary electrical contact to the top shield, and where the second auxiliary electrical connection electrically connects the second auxiliary electrical contact to the bottom shield.Type: GrantFiled: June 18, 2001Date of Patent: October 14, 2003Assignee: Seagate Technology LLCInventors: Kevin Richard Heim, Clifton H. Chang, Peter Thomas Weyandt, Patrick Joseph Ryan
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Patent number: 6535011Abstract: A testing device tests a LCD driver LSI which incorporates a multiple number of D/A converters and outputs voltages from the D/A converters via associated output terminals. A voltage meter measures a multiple levels of tonal voltages output from the first output terminal and calculates the differential voltage value between each measured voltage and the associated expected voltage. Each differential amplifier has an input for receiving the output voltage output from the first output terminal in common and another input for receiving the output voltage output from one output terminal other than the first output terminal. A comparator receives the amplified differential voltages output from the plural differential amplifiers and checks whether the amplified differential voltages from the differential amplifiers fall within given voltage ranges, receptively.Type: GrantFiled: July 21, 2000Date of Patent: March 18, 2003Assignee: Sharp Kabushiki KaishaInventor: Hideaki Sakaguchi
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Patent number: 6100685Abstract: A high frequency magnetic properties measuring system is used for measurement of high frequency magnetic properties, for example high frequency core-loss and magnetic hysteresis curve (coercivity force, magnetic flux density, permeability) in soft magnetic materials such as ferrites, permalloy and amorphous magnetic cores used in inductors, transformers and filters of various electric and electromagnetic systems and devices such as computers and multimedia devices. A digital oscilloscope is operated as a waveform detection unit for measuring magnetic fields and magnetic flux density. A signal generator and a power amplifier are operated as a signal input unit. The digital oscilloscope and the signal generator are remotely controlled through a General Purpose Interface Bus by the computer. The high frequency magnetic properties are measured by remote control and the resulting data can be outputted and stored by the computer.Type: GrantFiled: February 19, 1998Date of Patent: August 8, 2000Assignee: Korea Electrotechnology Research InstituteInventors: Ki Uk Kim, Jae Sung Song
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Patent number: 5959450Abstract: A fastening portion 1a of a plate spring 1 of a head unit H supported by a support member 12 and an arm portion 1d is pressed by a pressurizing pin 22a to impart the same displacement to a slider 4 as a Z-height when the head unit is mounted to an apparatus. In this condition, the inclination of the slider 4 is measured, and, further, the arm portion 1d is twisted by a tool 30 to correct deformation in the roll direction. Since the plate spring 1 is corrected in the same condition as when the unit is mounted to the apparatus, an accurate correcting operation is conducted.Type: GrantFiled: January 27, 1998Date of Patent: September 28, 1999Assignee: Alps Electric Co., Ltd.Inventors: Michiaki Moroe, Michiharu Motonishi, Hitoshi Yamazaki, Kazunari Takida
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Patent number: 4649495Abstract: According to the process, a toroidal sample of ferrimagnetic material to be analyzed is placed in a thermostatically-controlled enclosure fitted with temperature regulation and detection means. The toroidal sample is submitted to an electro-magnetic magnetizing field of given frequency and the flux induced in the sample is measured directly using a measuring loop, around the sample and which is connected to a vectorial voltmeter.Type: GrantFiled: August 1, 1984Date of Patent: March 10, 1987Assignee: Centre National de la Recherche Scientifique (CNRS)Inventors: Vladimir Cagan, Marcel Guyot
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Patent number: 4623841Abstract: A piece of the magnetic material to be tested is coupled to the device by primary and secondary windings. The material is then exposed to varying polarities of a controlled electrical current, such as a ramped current, through the primary winding causing the magnetic flux of the material to vary with respect to the controlled current; and creating varying voltage levels across the secondary winding. When this process has been completed the data is made available to a computer which now has data for the current levels transmitted through the primary winding and the corresponding voltage levels across the secondary winding. The computer can then utilize this data to provide a variety of magnetic property values of the magnetic material.Type: GrantFiled: March 29, 1985Date of Patent: November 18, 1986Assignee: Motorola, Inc.Inventors: Michael K. Stinson, William L. Hines, David J. Hesser
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Patent number: 4547542Abstract: This invention relates to unique and novel compositions based on chemically combining a sulfonated polymer and an amine terminated polylactone composition. The resulting amine neutralized sulfonated polymer compositions have a variety of uses including those as diverse as adhesive agents, thermoplastic elastomers, additive uses wherein these materials can be utilized to compatibilize two different polymers which are normally incompatible. These compositions can also be blended with fillers and/or oils when the sulfonated polymer is elastomeric. The materials display thermoplastic character.Type: GrantFiled: December 23, 1983Date of Patent: October 15, 1985Assignee: Exxon Research and Engineering Co.Inventors: Robert D. Lundberg, Warren A. Thaler
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Patent number: 4301535Abstract: A programmable read only memory (PROM) integrated circuit is constructed with two new operating modes: a bit-check mode and a deprogramming mode. In the bit-check mode, circuitry is provided to readily determine the apparent threshold voltage of each programmable transistor within the PROM. In the deprogrammable mode, circuitry is provided to simultaneously subject all programmable transistors within the PROM to a deprogramming stress. The bit-check mode provides a rapid programming method, and the bit-check mode and deprogramming mode are utilized in conjunction with each other to provide a rapid and thorough testing method.Type: GrantFiled: July 2, 1979Date of Patent: November 17, 1981Assignee: Mostek CorporationInventors: Vernon G. McKenny, John K. Hampton