Dynamic Information Element Testing Patents (Class 324/212)
  • Patent number: 7954119
    Abstract: In one arrangement, apparatus for attaching a disk to a spindle of a spinstand has a spindle adapter. The spindle adapter has a drawbar movably disposed within. The drawbar has a connector end that is reversibly connectable to the cap and has a piston that is connectable to a source of fluid pressure. The drawbar is movable in response to fluid pressure so as to urge together the cap and the spindle adapter when connected. The cap and the spindle adapter are capable of holding a disk therebetween. In another arrangement, a movable stage movable over a deck of a spinstand has a lift stage arranged to hold a cap with a disk positioned thereon. The lift stage has at least one actuator for raising the lift stage so that the cap can be connected with a spindle adapter of an inverted spindle of a spinstand.
    Type: Grant
    Filed: September 8, 2006
    Date of Patent: May 31, 2011
    Assignees: Xyratex Technology Limited, Seagate Technology LLC
    Inventors: Ian Stanley Warn, Brett Robert Herdendorf
  • Patent number: 7891080
    Abstract: A method for detecting head-disc contact is disclosed. The method comprises locating a head including a head positioning microactuator and at least one of a read transducer and a write transducer adjacent to a disc such that the head is in communication with the disc, monitoring an output signal from the head positioning microactuator of the head, and evaluating the output signal to determine if the head contacts the disc.
    Type: Grant
    Filed: November 6, 2007
    Date of Patent: February 22, 2011
    Assignee: Seagate Technology LLC
    Inventors: James C. Alexander, Jason H. Laks
  • Patent number: 7888930
    Abstract: The present invention provides a method for testing a disc shaped mold structure having a convexo-concave pattern formed on a surface thereof based on a desired design pattern, including at least: transferring a magnetic signal corresponding to a convexo-concave pattern formed on the entire surface of the mold structure to a medium in a direction perpendicular to the surface of the medium, obtaining a reproduction signal by electrically reproducing the magnetic signal from the medium onto which the magnetic signal has been transferred, and comparing the desired design pattern with the reproduction signal.
    Type: Grant
    Filed: June 20, 2008
    Date of Patent: February 15, 2011
    Assignee: FUJIFILM Corporation
    Inventors: Kenji Ichikawa, Naoto Fujiwara
  • Patent number: 7880463
    Abstract: A mechanism for placing and removing a vacuum clamping device for a magnetic disk on a spinstand, comprised of automated vertical and horizontal movement arranged such that a vacuum disk chuck, comprised of a base (9) and cap (6), can be used without operator interaction. Linear actuators provide the horizontal (2) and vertical (3) movement forces to accurately move a chuck cap (6) over a magnetic disk (7) that has been placed on a chuck base (9). The same actuators remove the cap and move it away from the disk to allow quick replacement of the disk. The interface between the mechanism and disk chuck cap is designed such that the cap is securely held during motion, and does not create particles.
    Type: Grant
    Filed: January 17, 2007
    Date of Patent: February 1, 2011
    Assignee: Guzik Technical Enterprises
    Inventors: Naham Guzik, Forest Ray
  • Patent number: 7880987
    Abstract: Certifying a storage media while servowriting the media by formatting a full compliment of servo data in storage tracks of the media in a minimum number of passes per storage track while simultaneously performing a 100% media certification of the storage tracks during the minimum number of passes per storage track.
    Type: Grant
    Filed: January 17, 2008
    Date of Patent: February 1, 2011
    Assignee: Seagate Technology LLC
    Inventors: Ken L. Belmont, Dan R. McLeran, Dave Scott Williamson, Mark Christian Roberts, Gabor Szita
  • Patent number: 7848037
    Abstract: A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.
    Type: Grant
    Filed: November 19, 2007
    Date of Patent: December 7, 2010
    Assignee: Hitachi Global Storage Technologies, Netherlands, B.V.
    Inventors: Youping Deng, Terry Farren, Jing Zhang
  • Patent number: 7768740
    Abstract: Apparatus for attaching a disk to a spindle of a spinstand includes a spindle having a fluid pressure port therethrough for delivery of fluid pressure. A spindle adapter is adapted to be attached to the spindle and for holding a disk. The spindle adapter has a piston movable therein to clamp a disk between the piston and an opposing surface in response to fluid pressure applied through the spindle fluid pressure port. A disk can be attached to the spindle by offering the disk up to the spindle adapter, and applying fluid pressure to the spindle fluid pressure port to cause the piston to clamp the disk against the opposing surface. The disk can then be spun up on the spindle.
    Type: Grant
    Filed: September 8, 2006
    Date of Patent: August 3, 2010
    Assignees: Xyratex Technology Limited, Seagate Technology LLC
    Inventors: Simon Yorick Pettman, Alexander Stephen Kay, Ian Stanley Warn, Graham Collins
  • Patent number: 7723982
    Abstract: A magnetic head suffers mechanical stresses by striking against a magnetic disc surface and dust, so that there are problems such as the reduction of reproduction output due to the mechanical stresses and the reversal of output polarity due to the mechanical stresses. Embodiments in accordance with the present invention relate to a method of testing reliability of reproduction elements of a magnetic head against outside stress. In a first step, a Giant Magnetoresistive (GMR) element on a row bar of the object of inspection, or a GMR element on a slider is measured for the output against external magnetic field. In the next step, prescribed shearing stress is applied with indenter to the edge where the GMR element-formed surface of the row bar or slider and the air-bearing surface are crossed. Then, output of the GMR element is measured again. Lastly, the outputs of the GMR element before and after application of stress are compared.
    Type: Grant
    Filed: January 19, 2007
    Date of Patent: May 25, 2010
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Shinji Sasaki, Makoto Torigoe, Takayoshi Ohtsu, Kouji Kataoka
  • Patent number: 7690100
    Abstract: A device and method for testing a slider of a head-gimbal assembly during disc drive manufacturing. The device includes a test disc, an actuator arm and a control module. The test disc has a first circumferential area for detecting contact between the slider and the test disc and a second circumferential area for burnishing sliders that contact the first circumferential area as the test disc rotates at or above the predetermined velocity. The head-gimbal assembly is affixed to the actuator arm such that the slider is operable to move between an inner diameter and an outer diameter of the test disc. The control module controls the movement of the actuator arm, and thus the slider, relative to the test disc. The control module monitors the slider-disc interface for contact therebetween. If contact is detected, the slider is either burnished or the head-gimbal assembly is discarded altogether.
    Type: Grant
    Filed: March 13, 2007
    Date of Patent: April 6, 2010
    Assignee: Seagate Technology LLC
    Inventors: Serge J. Fayeulle, Paul W. Smith, Gary E. Bement
  • Patent number: 7676700
    Abstract: A system for testing hard disks includes a hard disk testing device and a computer. The computer has a mainboard and a key-press controller. The hard disk testing device connects with the mainboard and includes: a hard disk interface configured for connecting one or more hard disks to be tested to a south bridge of the mainboard; a key-press panel configured for connecting the key-press controller of the computer, and providing a hard disk testing control interface for users; and a hard disk testing unit configured for testing the one or more hard disks.
    Type: Grant
    Filed: June 7, 2007
    Date of Patent: March 9, 2010
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventors: Chiou-Lin Fan, Ying-Chih Huang, Chin-Feng Chen
  • Publication number: 20090296285
    Abstract: A system in one approach includes a sensor stack formed of a plurality of thin film layers; a shunt formed of at least some of the same layers as the sensor stack, the shunt being spaced from the sensor stack; a first lead coupled to the sensor stack and the shunt; and a second lead coupled to the sensor stack and the shunt. A method in one embodiment includes forming a plurality of thin film layers; removing a portion of the thin film layers for defining at least a portion of a sensor stack and at least a portion of a shunt spaced front the sensor stack; forming a first lead coupled to the at least a portion of the sensor stack and the at least a portion of the shunt and a second lead coupled to the at least a portion of the sensor stack and the at least a portion of the shunt. Additional systems and methods are also presented.
    Type: Application
    Filed: May 30, 2008
    Publication date: December 3, 2009
    Inventors: Satoru Araki, Ying Hong, Edward Hin Pong Lee, Tsann Lin, David John Seagle
  • Publication number: 20090165539
    Abstract: Glide test systems and associated methods are described. A glide test system includes a glide test head that is flown over the surface of a recording disk to detect asperities on the recording disk. The glide test head includes a detection pad on the trailing end of the head. Heating elements are fabricated proximate to the detection pad. The heating elements are independently controllable to control the amount of protrusion of different regions of the detection pad. The heating elements thus provide a way to substantially flatten the detection surface of the detection pad, and compensate for an uneven topography on a detection surface.
    Type: Application
    Filed: December 26, 2007
    Publication date: July 2, 2009
    Inventors: Shanlin Duan, Jizhong He, Bruno Marchon, Ullal V. Nayak
  • Patent number: 7549215
    Abstract: A structure and method for performing magnetic inductance testing of write heads formed on a wafer. The structure and method allows for the effective inductive testing of magnetic write heads at wafer level even if the write heads have an inductance that is too low to be effectively measured directly. A test head is constructed having a structure similar to that of the write heads, but having a significantly higher magnetic inductance. The higher magnetic inductance of the write head can be provided by extending the shaping layer to or beyond the air bearing surface plane ABS. The inductance of the test head can be further increased by increasing the width of the portion of the shaping layer that extends to the ABS (ie. shaping layer throat) and by increasing the width of the write pole throat.
    Type: Grant
    Filed: March 28, 2007
    Date of Patent: June 23, 2009
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Wen-Chien David Hsiao, Michael Ming Hsiang Yang
  • Publication number: 20090128142
    Abstract: A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.
    Type: Application
    Filed: November 19, 2007
    Publication date: May 21, 2009
    Inventors: Youping Deng, Terry Farren, Jing Zhang
  • Publication number: 20090085561
    Abstract: A testing apparatus for a magnetic head tests electromagnetic conversion characteristics of the magnetic head by causing a magnetic head 10 to fly above a surface of the recording medium 16 and testing recording and playback characteristics of the magnetic head for the recording medium. The testing apparatus includes a setting portion 14 that moves the magnetic head 10 to and supports the magnetic head at a position where the magnetic head 10 is loaded on the recording medium 16 and a position where the magnetic head is withdrawn from the load position; an electromagnetic wave emitting device 30 that emits electromagnetic waves toward the magnetic head; and a detector 20 that is electrically connected to the magnetic head and detects an output signal of the magnetic head. By applying electromagnetic waves from the electromagnetic wave emitting device 30 onto the magnetic head, it is possible to detect the electromagnetic wave durability of the magnetic head 10.
    Type: Application
    Filed: December 12, 2008
    Publication date: April 2, 2009
    Applicant: FUJITSU LIMITED
    Inventor: Hiroyuki Kawata
  • Patent number: 7511486
    Abstract: A non-contact sensor system according to one embodiment comprises a substrate having at least one sensor element, the at least one sensor element being directed towards at least one data track on a medium positioned opposite the at least one sensor element, wherein the substrate and the medium each carry at least one magnetic track, wherein orientations of magnetizations of the magnetic tracks are such that the substrate experiences a force away from the medium. Other embodiments are also presented.
    Type: Grant
    Filed: February 13, 2008
    Date of Patent: March 31, 2009
    Assignee: International Business Machines Corporation
    Inventor: Rolf Schaefer
  • Patent number: 7506282
    Abstract: An apparatus and methods for predicting and/or for calibrating memory yields due to process defects and/or device variations, including determining a model of a memory cell, identifying a subset of parameters associated with the model, determining and executing a refined model using the parameters, determining a predicted probability the simulated memory cell will be operational based on the simulated operation of the refined model, determining yield prediction information from the predicted probability, and determining the minimum number of repair elements to include in a memory array design to insure a desired yield percentage based on the yield prediction information.
    Type: Grant
    Filed: August 18, 2005
    Date of Patent: March 17, 2009
    Assignee: International Business Machines Corporation
    Inventors: Chad A. Adams, Anthony G. Aipperspach, George F. Paulik
  • Publication number: 20080186020
    Abstract: A testing apparatus for magnetic recording medium and a testing method for magnetic recording medium which are able to conduct in a short time high-precision certify testing close to the actual method of use of magnetic recording media in hard disk drives can be provided.
    Type: Application
    Filed: January 30, 2008
    Publication date: August 7, 2008
    Applicant: SHOWA DENKO K.K.
    Inventor: Junichi FUJITA
  • Patent number: 7405907
    Abstract: A read head for reading magnetically stored data in adjacent tracks of a medium has at least two elongate bodies, each having at least one magnetoresistive part. The magnetoresistive parts have sensor portions defined along a length of the elongate bodies, by electrical connections to the magnetoresistive parts. A shield is provided at least on opposite transfer sides of the elongate bodies. The read head is used for calculating a position error signal by calculating a correlation between signals received from the respective sensor portions when the head is positioned over adjacent tracks on the medium, with one of the sensors positioned near a boundary between the tracks. The position error is calculated by determining the correlation between signals from the respective sensor portions.
    Type: Grant
    Filed: August 3, 2004
    Date of Patent: July 29, 2008
    Assignee: O-Mass AS
    Inventor: Jørn Raastad
  • Publication number: 20080100286
    Abstract: A spinstand includes a baseplate, a spindle mounted to the baseplate and a platform connected to the baseplate. A first component and a second component are mounted to the platform. An actuator moves the platform in a first direction relative to the baseplate, and mechanism moves the second component in approximately the first direction relative to the platform. The actuator moves the platform to position the first component at any radius of a disc placed on the spindle. The mechanism positions the second component at the same radius on an opposite surface of the disc according to a predetermined position adjustment. The first and second components are selected from a group consisting of: a burnish head, a glide head, a read head, a write head, and a read/write head. Embodiments provide automatic alignment of two components for simultaneous testing of both sides of a disc on the spinstand.
    Type: Application
    Filed: November 1, 2006
    Publication date: May 1, 2008
    Inventors: Mark A. Meder, Wafaa A Abdalla
  • Publication number: 20080100287
    Abstract: Techniques are described in which a hard disc media tester uses busses conforming to a single bus format to connect control components within a control system of the hard disc media tester. A hard disc media tester may include several control components such as a testing control module, a motion interface, a defect analyzer, a write controller, a motion controller, head loaders, and so on. Busses conforming to a single bus format, such as the Universal Serial Bus (USB) or FireWire formats, may facilitate the communication of control messages among each of these control components. Furthermore, the hard disc media tester may include one or more bus hubs to allow many components to be controlled through a single cable.
    Type: Application
    Filed: November 1, 2006
    Publication date: May 1, 2008
    Inventors: Douglas Andrew Peale, Wafaa A. Abdalla
  • Patent number: 7355399
    Abstract: A non-contact sensor system according to one embodiment includes a substrate having a substantially planar surface with at least one sensor element mounted to the substrate, the at least one sensor element being directed by a guiding element towards at least one data track on a substantially planar medium positioned opposite the at least one sensor element, wherein the substantially planar surface of the substrate and the substantially planar surface of the medium each carry at least one magnetic track, wherein orientations of magnetizations of the magnetic tracks are such that the substrate experiences a force away from the medium.
    Type: Grant
    Filed: March 12, 2007
    Date of Patent: April 8, 2008
    Assignee: International Business Machines Corporation
    Inventor: Rolf Schaefer
  • Patent number: 7352175
    Abstract: A probe card method, wherein a base supports a probe pin and an electromagnet. When the probe pin contacts a magnetic-sensor terminal on a chip on a wafer, magnetic force is applied to a magnetic-field sensing section in the chip.
    Type: Grant
    Filed: January 23, 2007
    Date of Patent: April 1, 2008
    Assignee: Fujitsu Limited
    Inventor: Hisanori Murata
  • Publication number: 20080074107
    Abstract: A system for testing hard disks includes a hard disk testing device and a computer. The computer has a mainboard and a key-press controller. The hard disk testing device connects with the mainboard and includes: a hard disk interface configured for connecting one or more hard disks to be tested to a south bridge of the mainboard; a key-press panel configured for connecting the key-press controller of the computer, and providing a hard disk testing control interface for users; and a hard disk testing unit configured for testing the one or more hard disks.
    Type: Application
    Filed: June 7, 2007
    Publication date: March 27, 2008
    Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: CHIOU-LIN FAN, YING-CHIH HUANG, CHIN-FENG CHEN
  • Patent number: 7307418
    Abstract: Described are system for recording piston rod position information in a magnetic layer on the piston rod. A piston rod has a magnetically hard layer formed thereon to provide a recording medium. A magnetic pattern is recorded in the magnetically hard layer. A magnetic field sensor disposed adjacent to the piston rod senses the recorded magnetic pattern while the piston rod is moving and generates signals in response to the magnetic pattern that are used to determine a position of the piston rod.
    Type: Grant
    Filed: April 24, 2006
    Date of Patent: December 11, 2007
    Assignee: SRI International
    Inventors: Thomas P. Low, C. Bruce Clark, Ronald E. Pelrine, Joseph S. Eckerle, Chris Smith
  • Publication number: 20070262771
    Abstract: A metrology system for measuring the magnetic properties of a magnetic recording medium layer on a device used for perpendicular recording.
    Type: Application
    Filed: March 28, 2007
    Publication date: November 15, 2007
    Applicant: KLA-Tencor Technologies Corporation
    Inventors: William Van Drent, Ferenc Vajda
  • Patent number: 7295002
    Abstract: A spinstand having a vacuum chuck clamping mechanism for securing magnetic discs includes a cap (9) and a base (10). A disk-to-be-clamped is held between the cap (9) and the base (10). Vacuum, applied through a port (4) in a mounting screw (12) of the base, provides the clamping force. The vacuum is held constant using a circumferential seal (27) on a piston (2) of the cap, which extends into a cylindrical countering bushing (3) extending from the base. In one form, the cap (9) is centered about a spin axis (SA) extending through the base (10), using a hardened pin (1) extending from the cap and a locating bushing (19) affixed to the base. When the cap (9) is inserted into the base (10), the pin (1) prevents a piston (2) in the cap from contacting the inside walls/sealing surface (11) of the centering bushing (3) of the base.
    Type: Grant
    Filed: January 17, 2006
    Date of Patent: November 13, 2007
    Assignee: Guzik Technical Enterprises
    Inventors: Nahum Guzik, Forest E. Ray, Charles Brice Arnold
  • Patent number: 7288935
    Abstract: A dynamic electrical tester (DET) for testing head gimbal assemblies (HGA) is disclosed. The DET simulates disk drive operation while significantly reducing tester capital investment. Multiple HGAs are tested simultaneously using modular spin stands with shared electronics. This design increases utilization of electronics and minimizes the effect of spindle start/stop time. A parallel array of spin stands with shared electronics is used to reduce tester component and materials cost by multiplexing between the spin stands. The DET has the significant advantage of reducing wait time by making use of the electronics while they are idle during mechanical-related delays. In addition, the DET includes more channels per test head that can readily switch back and forth between the products being tested.
    Type: Grant
    Filed: April 15, 2005
    Date of Patent: October 30, 2007
    Assignee: Hitachi Global Storage Technologies Netherlands BV
    Inventors: Terry Farren, Yong Shen
  • Patent number: 7276900
    Abstract: A magnetic characteristic inspecting apparatus including a plurality of disk rotating devices or a plurality of magnetic heads include a unit for switching output signals of write signal production units or allocating the output signals to the magnetic heads, a unit for switching signals read from the magnetic heads or allocating the read signals to measurement resources, and a unit for selecting any of the disk rotating devices synchronously with which the measurement resources will perform measurement. The write signal production units and measurement resources are shared among inspections of the plurality of disk rotating devices or the plurality of heads.
    Type: Grant
    Filed: November 15, 2005
    Date of Patent: October 2, 2007
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Masayoshi Takahashi, Masami Makuuchi, Ritsuro Orihashi, Shinji Homma
  • Patent number: 7249406
    Abstract: The perpendicular magnetic head fabrication and testing method includes the additional fabrication of magnetic pole testing structures in the kerf area of the wafer substrate. Particularly, magnetic interconnect pieces are fabricated in the kerf area to magnetically connect an extending portion of the first magnetic pole with an extending portion of the second magnetic pole. As a result, when the perpendicular magnetic heads are fabricated at the wafer level, the first and second magnetic poles are interconnected through structures located in the kerf area. Thereafter, an ISAT magnetic pole test can be conducted by passing electrical current through the induction coil of the magnetic head, and magnetic flux will flow through the interconnected magnetic pole structure, thereby enabling the testing of the magnetic poles of the perpendicular magnetic head at the wafer level.
    Type: Grant
    Filed: February 28, 2005
    Date of Patent: July 31, 2007
    Assignee: Hitachi Global Storage Technologies Netherlands, B.V.
    Inventors: Wolfgang Goubau, Edward Hin Pong Lee
  • Patent number: 7248039
    Abstract: A method for testing electromagnetic characteristics of magnetic media while maintaining consistent performance of a read/write head and recording channel is disclosed. The disclosed method is performed such that reduced statistical sampling is achieved. The method includes recording a first set of baseline measurements utilizing a first magnetic media with the read/write head and recording channel. The first magnetic media is then removed from an assembly containing the read/write head and recording channel and is replaced with a second magnetic media. Measurements are made utilizing the second magnetic media with the read/write head and recording channel, wherein the measurements are comparable with the baseline measurements and wherein consistent performance of the read/write head and the recording channel is maintained so as to reduce the size of statistical samples needed.
    Type: Grant
    Filed: August 27, 2004
    Date of Patent: July 24, 2007
    Assignee: Hitachi Global Storage Technologies Netherlands, B.V.
    Inventors: Paul M. Green, Peter Ivett, Wyman Pang
  • Patent number: 7248040
    Abstract: A disk testing apparatus that sets a predetermined condition of a recording density for a disk apparatus, and conducts a test relating to at least readout of data stored in the disk apparatus includes a condition relaxing unit that relaxes, when a result of the test is unsatisfactory, a condition of the recording density currently set for the disk apparatus to set a new condition of the recording density; and a re-testing unit that re-conducts the test on the disk apparatus to which the new condition is set.
    Type: Grant
    Filed: December 27, 2004
    Date of Patent: July 24, 2007
    Assignee: Fujitsu Limited
    Inventors: Masaki Makifuchi, Shigenori Yanagi
  • Patent number: 7212000
    Abstract: A method and apparatus for detecting a defective disk for a hard disk drive. The method includes placing a disk into a tester so that a first side of the disk is adjacent to a first head of the tester and a second side of the disk is adjacent to a second head. First data is read from the first side of the disk, and second data is read from the second side of the disk. The disk is then flipped so that the second side is adjacent to the first head and the first side is adjacent to the second head. Third data is read from the first side. Fourth data is read from the second side. A first area between a curve generated from the first data and a curve generated from the third data is calculated. Likewise, a second area is calculated between a curve generated from the second data and a curve generated from the fourth data. An average of the first and second areas is then calculated and used to detect a defective disk.
    Type: Grant
    Filed: October 30, 2003
    Date of Patent: May 1, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Geng Wang, Sang Lee
  • Patent number: 7208948
    Abstract: A non-contact magnetic sensor system according to one embodiment includes a substrate and a magnetic medium spaced from the substrate and having a data track thereon. A sensor element is mounted to the substrate. A guiding element biases the substrate towards the magnetic medium. A first magnetic track is positioned on the substrate. A second magnetic track is positioned on the magnetic medium. Orientations of the magnetizations of the magnetic tracks are such that the substrate experiences a vertical force away from the magnetic medium.
    Type: Grant
    Filed: November 5, 2004
    Date of Patent: April 24, 2007
    Assignee: International Business Machines Corporation
    Inventor: Rolf Schaefer
  • Patent number: 7194802
    Abstract: A device and method for testing a slider of a head-gimbal assembly during disc drive manufacturing. The device includes a test disc, an actuator arm and a control module. The test disc has a first circumferential area for detecting contact between the slider and the test disc and a second circumferential area for burnishing sliders that contact the first circumferential area as the test disc rotates at or above the predetermined velocity. The head-gimbal assembly is affixed to a support, or flexure, on the actuator arm such that the slider is operable to move between an inner diameter and an outer diameter of the test disc. The control module controls rotation of the test disc and movement of the actuator arm, and thus the slider, relative to the test disc. The control module monitors the slider-disc interface for contact therebetween. If contact is detected, the slider is either burnished or the head-gimbal assembly is discarded altogether.
    Type: Grant
    Filed: November 26, 2002
    Date of Patent: March 27, 2007
    Assignee: Seagate Technology LLC
    Inventors: Serge J. Fayeulle, Paul W. Smith, Gary E. Bement
  • Patent number: 7196513
    Abstract: A testing method for a magnetic hard disk or a magnetic head in a test system includes a moving step in which the magnetic head, which moves to fly closely over the magnetic disk, moves to a predetermined radial position corresponding to the position data of the magnetic disk which rotates at a predetermined constant speed; a reading step in which imbedded position data is read out for each sector of the magnetic disk is by the magnetic head; and a reading/writing step in which a predetermined signal is written in or read out from a data area of the sector by the magnetic head when the position data is one of equal to a predetermined value and within a predetermined range.
    Type: Grant
    Filed: July 31, 2006
    Date of Patent: March 27, 2007
    Assignee: International Manufacturing and Engineering Services Co., Ltd.
    Inventor: John Perez
  • Patent number: 7183763
    Abstract: A probe card includes a base that supports a probe pin and an electromagnet. When the probe pin contacts a magnetic-sensor terminal in on a chip on a wafer, magnetic force is applied to a magnetic-field sensing section in the chips.
    Type: Grant
    Filed: March 14, 2006
    Date of Patent: February 27, 2007
    Assignee: Fujitsu Limited
    Inventor: Hisanori Murata
  • Patent number: 7173415
    Abstract: A magnetic test module runs on a spin stand to detect amplitude decay and noise evolution at the same time. Signal-to-noise ratio (SNR) decay is directly measured. The recording performance is correlated better with SNR instead of signal only. The thermal stability of the system is evaluated more accurately with this SNR decay method. A heater is placed under the media disk, and a remote sensing thermometer and temperature controller form a subsystem to set up desired environmental temperature. The heater creates a heated band and the read/write head flies above the heated band. The temperature control system may be removed when SNR decay measurement is performed under room temperature.
    Type: Grant
    Filed: July 26, 2005
    Date of Patent: February 6, 2007
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Shanlin Duan, Jizhong He, Zhupei Shi, Jane Jie Zhang
  • Patent number: 7165462
    Abstract: Systems and methods of testing individual sliders are disclosed. One embodiment is a test system that includes a mechanical stress system, a quasi-static measurement system, a transport system, and a slider holder. The individual sliders to be tested are aligned in a row in the slider holder, and the slider holder secures the sliders. The measurement system performs quasi-static measurements on sliders in the slider holder simultaneously. The transport system then transports the slider holder to the mechanical stress system. The mechanical stress system applies mechanical stress to the sliders in slider holder. The transport system then transports the slider holder again to the quasi-static measurement system. This process repeats a desired number of times to complete testing.
    Type: Grant
    Filed: November 29, 2004
    Date of Patent: January 23, 2007
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Jih-Shiuan Luo, Ali Sanayei
  • Patent number: 7141969
    Abstract: An XY platen positioning system includes a fixed base rigidly coupled to a essentially planar surface. An XY intermediate plate is slidably coupled to the fixed base, such that the XY intermediate plate is slidable in the X axis along the fixed base. An XY stage is slidably coupled to the XY intermediate plate, such that the XY stage is slidable in the Y axis along the XY intermediate plate. A platen is flexibly coupled to the XY stage, such that the platen, with respect to the XY stage, is essentially constrained in the X and Y axes and moveable in the Z axis.
    Type: Grant
    Filed: March 29, 2004
    Date of Patent: November 28, 2006
    Assignee: Guzik Technical Enterprises
    Inventor: Nahum Guzik
  • Patent number: 7131346
    Abstract: Head stack fixtures for securing head stack assemblies to spin stand testing systems, and spin stand testing systems incorporating such fixtures, are disclosed. Exemplary head stack fixtures comprise a base supporting a piezoelectric actuator. The base includes an attachment mechanism for securing the HSA in such a way that the HSA will pivot relative to the base. When the HSA is secured to the base, the piezoelectric actuator engages the HSA. The piezoelectric actuator is therefore able to pivot the HSA relative to the base for fine positioning of a head of the HSA.
    Type: Grant
    Filed: October 15, 2004
    Date of Patent: November 7, 2006
    Assignee: Western Digital (Fremont), Inc.
    Inventors: Jagdeep S. Buttar, David Terrill, Kenneth R. Davies, Herman Ferrier, Xiaodong Che
  • Patent number: 7129702
    Abstract: An XY stage includes a movable frame having a rectangular space inside thereof and movable on a reference base along one of X and Y axes, a first drive source provided in the reference base for moving the movable frame, a rectangular movable base mounted in the rectangular space of the movable frame, which is movable on the reference base along the other of the X and Y axes and stopped on the reference base, and a second drive source provided in the movable frame, for moving the movable base.
    Type: Grant
    Filed: March 19, 2004
    Date of Patent: October 31, 2006
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kyoichi Mori, Fujio Yamasaki, Toshinori Sugiyama
  • Patent number: 7124625
    Abstract: A glide-height disk-tester operates with the test disk rotating at a predetermined constant rotational speed and uses a glide head with an electrically-resistive heater and a thermally-responsive protrusion pad located on its trailing end. The linear velocity of the disk relative to the slider maintains the slider at its nominal fly height, which is typically higher than any expected asperity. With no current applied to the heater, the protrusion pad is generally flush with the air-bearing surface of the slider. Increasing levels of current are applied to the heater, which causes movement of the protrusion pad toward the disk surface. When the pad contacts an asperity, the current level applied at the instant of asperity contact is recorded. The applied current level can be correlated to the glide height from a previous calibration process using a calibration disk with known calibration bump heights.
    Type: Grant
    Filed: May 17, 2005
    Date of Patent: October 24, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Masayuki Kurita, Remmelt Pit, Shozo Saegusa, Toshiya Shiramatsu, Mike Suk, Hideaki Tanaka
  • Patent number: 7124654
    Abstract: A spin stand testing system is used to determine a positioning range of a microactuator disposed on a head gimbal assembly. The microactuator is configured to laterally translate a read sensor of a head of the head gimbal assembly through the positioning range. The spin stand testing system includes a disk having a track, and a secondary mover configured to laterally translate the head gimbal assembly. During testing, a feedback loop keeps the read sensor locked to the track. While the read sensor remains locked, the head gimbal assembly is translated laterally. The microactuator translates the read sensor in an opposite direction until the microactuator reaches an end of its range, which is determined by monitoring a signal. The amount of translation of the head gimbal assembly by the secondary mover when the signal indicates the end of the range is the measured positioning range in one direction.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: October 24, 2006
    Assignee: Western Digital (Fremont), Inc.
    Inventors: Kenneth R. Davies, David Terrill, Jagdeep S. Buttar
  • Patent number: 7109701
    Abstract: A testing method for a magnetic hard disk or a magnetic head in a test system includes a moving step in which the magnetic head, which moves to fly closely over the magnetic disk, moves to a predetermined radial position corresponding to the position data of the magnetic disk which rotates at a predetermined constant speed; a reading step in which imbedded position data is read out for each sector of the magnetic disk is by the magnetic head; and a reading/writing step in which a predetermined signal is written in or read out from a data area of the sector by the magnetic head when the position data is one of equal to a predetermined value and within a predetermined range.
    Type: Grant
    Filed: September 12, 2003
    Date of Patent: September 19, 2006
    Assignee: International Manufacturing and Engineering Services Co., Ltd.
    Inventor: John Perez
  • Patent number: 7075294
    Abstract: In the method of inspecting a thin-film magnetic head, a thin-film magnetic head provided with a magnetoresistive film having a free layer whose magnetization direction changes depending on an external magnetic field and ferromagnetic layers for applying a bias magnetic field to the free layer is prepared. Then, a DC magnetic field is applied to the ferromagnetic layers in the bias magnetic field applying direction. Subsequently, an AC magnetic field is applied to the ferromagnetic layers in the bias magnetic field applying direction. Thereafter, an external magnetic field is applied to the magnetoresistive film while supplying a current thereto, and a property of the thin-film magnetic head such as asymmetry and reproducing output is inspected.
    Type: Grant
    Filed: August 17, 2004
    Date of Patent: July 11, 2006
    Assignees: TDK Corporation, SAE Magnetics (H.K.) Ltd.
    Inventors: Hiroki Matsukuma, Muneyoshi Kobashi
  • Patent number: 7064539
    Abstract: A method for identifying a problem with a magnetic disk, comprising testing both sides of a disk for read errors using a pair of heads, flipping the disk 180 degrees, again testing both sides of the disk for read errors using the same heads, determining whether one side of the disk has more errors than the other side both before and after the flip, and determining that the disk is the cause of the read errors if the same side of the disk still has more errors than the other side after the flip.
    Type: Grant
    Filed: August 8, 2003
    Date of Patent: June 20, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Paul Marion Green, Garth Wade Helf
  • Patent number: 7064659
    Abstract: A method is presented for glide testing a disk which tests the glide head fly-height by inducing a collision between the glide head and a disk under test. The glide test system is initially calibrated using calibration disks. The method of the invention periodically tests the calibration without interrupting the production testing by lowering the rotation rate until the glide head collides with the rotating disk surface. The rotation rate at which the collision occurs is then compared with the value expected based on knowledge of disk samples and the initial calibration. Parameters for acceptable high and low values are established to detect changes in the glide test system performance to trigger automatic or manual recalibration.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: June 20, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Bradley Frederick Baumgartner, Norman Chu, Patricia Galindo, Hang Fai Ngo, Yu Lo, Nalin Zhou
  • Patent number: 7057385
    Abstract: A magnetic recording medium inspection method detects small protrusions that constitute defects on the surface of a magnetic recording medium. The method includes flying a glide inspection head at a predetermined height over the surface of the moving magnetic recording medium; detecting a contact duration time during which the glide head is in contact with a protrusion on the surface of the magnetic recording medium using a contact detection sensor attached to the glide inspection head; and determining the small protrusion based on the contact duration time.
    Type: Grant
    Filed: March 12, 2003
    Date of Patent: June 6, 2006
    Assignee: Fujitsu Limited
    Inventors: Toru Yokohata, Takahiro Imamura, Toshiya Fujita, Yojiro Ochiai, Masahiro Ozeki, Naoki Satake
  • Patent number: 7051423
    Abstract: This invention relates to a testing method for a head IC which makes it possible to simplify checking of the head. The head IC is installed on a head suspension, and probes are placed on terminals of the head suspension to check electric characteristics of the head IC. With this invention, contact of the probes for checking the head IC when the head IC has been installed, but before installing the head, becomes easier.
    Type: Grant
    Filed: September 10, 2003
    Date of Patent: May 30, 2006
    Assignee: Fujitsu Limited
    Inventor: Akio Gouo
  • Patent number: 4933311
    Abstract: In the process of producing a linear alternating polymer of carbon monoxide and at least one ethylenically unsaturated hydrocarbon in the presence of a palladium salt, the anion of a strong non-hydrohalogenic acid and a bis(phosphino)propane, improved polymerization rates are obtained when employing a novel catalyst composition formed from a novel 1,3-bis(phosphino)propane wherein the propane moiety is additionally substituted in the 2 position with two hydrocarbyl substituents.
    Type: Grant
    Filed: April 26, 1989
    Date of Patent: June 12, 1990
    Assignee: Shell Oil Company
    Inventors: Johannes A. van Doorn, Richard L. Wife