Dynamic Information Element Testing Patents (Class 324/212)
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Patent number: 7954119Abstract: In one arrangement, apparatus for attaching a disk to a spindle of a spinstand has a spindle adapter. The spindle adapter has a drawbar movably disposed within. The drawbar has a connector end that is reversibly connectable to the cap and has a piston that is connectable to a source of fluid pressure. The drawbar is movable in response to fluid pressure so as to urge together the cap and the spindle adapter when connected. The cap and the spindle adapter are capable of holding a disk therebetween. In another arrangement, a movable stage movable over a deck of a spinstand has a lift stage arranged to hold a cap with a disk positioned thereon. The lift stage has at least one actuator for raising the lift stage so that the cap can be connected with a spindle adapter of an inverted spindle of a spinstand.Type: GrantFiled: September 8, 2006Date of Patent: May 31, 2011Assignees: Xyratex Technology Limited, Seagate Technology LLCInventors: Ian Stanley Warn, Brett Robert Herdendorf
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Patent number: 7891080Abstract: A method for detecting head-disc contact is disclosed. The method comprises locating a head including a head positioning microactuator and at least one of a read transducer and a write transducer adjacent to a disc such that the head is in communication with the disc, monitoring an output signal from the head positioning microactuator of the head, and evaluating the output signal to determine if the head contacts the disc.Type: GrantFiled: November 6, 2007Date of Patent: February 22, 2011Assignee: Seagate Technology LLCInventors: James C. Alexander, Jason H. Laks
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Patent number: 7888930Abstract: The present invention provides a method for testing a disc shaped mold structure having a convexo-concave pattern formed on a surface thereof based on a desired design pattern, including at least: transferring a magnetic signal corresponding to a convexo-concave pattern formed on the entire surface of the mold structure to a medium in a direction perpendicular to the surface of the medium, obtaining a reproduction signal by electrically reproducing the magnetic signal from the medium onto which the magnetic signal has been transferred, and comparing the desired design pattern with the reproduction signal.Type: GrantFiled: June 20, 2008Date of Patent: February 15, 2011Assignee: FUJIFILM CorporationInventors: Kenji Ichikawa, Naoto Fujiwara
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Patent number: 7880463Abstract: A mechanism for placing and removing a vacuum clamping device for a magnetic disk on a spinstand, comprised of automated vertical and horizontal movement arranged such that a vacuum disk chuck, comprised of a base (9) and cap (6), can be used without operator interaction. Linear actuators provide the horizontal (2) and vertical (3) movement forces to accurately move a chuck cap (6) over a magnetic disk (7) that has been placed on a chuck base (9). The same actuators remove the cap and move it away from the disk to allow quick replacement of the disk. The interface between the mechanism and disk chuck cap is designed such that the cap is securely held during motion, and does not create particles.Type: GrantFiled: January 17, 2007Date of Patent: February 1, 2011Assignee: Guzik Technical EnterprisesInventors: Naham Guzik, Forest Ray
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Patent number: 7880987Abstract: Certifying a storage media while servowriting the media by formatting a full compliment of servo data in storage tracks of the media in a minimum number of passes per storage track while simultaneously performing a 100% media certification of the storage tracks during the minimum number of passes per storage track.Type: GrantFiled: January 17, 2008Date of Patent: February 1, 2011Assignee: Seagate Technology LLCInventors: Ken L. Belmont, Dan R. McLeran, Dave Scott Williamson, Mark Christian Roberts, Gabor Szita
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Patent number: 7848037Abstract: A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.Type: GrantFiled: November 19, 2007Date of Patent: December 7, 2010Assignee: Hitachi Global Storage Technologies, Netherlands, B.V.Inventors: Youping Deng, Terry Farren, Jing Zhang
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Patent number: 7768740Abstract: Apparatus for attaching a disk to a spindle of a spinstand includes a spindle having a fluid pressure port therethrough for delivery of fluid pressure. A spindle adapter is adapted to be attached to the spindle and for holding a disk. The spindle adapter has a piston movable therein to clamp a disk between the piston and an opposing surface in response to fluid pressure applied through the spindle fluid pressure port. A disk can be attached to the spindle by offering the disk up to the spindle adapter, and applying fluid pressure to the spindle fluid pressure port to cause the piston to clamp the disk against the opposing surface. The disk can then be spun up on the spindle.Type: GrantFiled: September 8, 2006Date of Patent: August 3, 2010Assignees: Xyratex Technology Limited, Seagate Technology LLCInventors: Simon Yorick Pettman, Alexander Stephen Kay, Ian Stanley Warn, Graham Collins
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Patent number: 7723982Abstract: A magnetic head suffers mechanical stresses by striking against a magnetic disc surface and dust, so that there are problems such as the reduction of reproduction output due to the mechanical stresses and the reversal of output polarity due to the mechanical stresses. Embodiments in accordance with the present invention relate to a method of testing reliability of reproduction elements of a magnetic head against outside stress. In a first step, a Giant Magnetoresistive (GMR) element on a row bar of the object of inspection, or a GMR element on a slider is measured for the output against external magnetic field. In the next step, prescribed shearing stress is applied with indenter to the edge where the GMR element-formed surface of the row bar or slider and the air-bearing surface are crossed. Then, output of the GMR element is measured again. Lastly, the outputs of the GMR element before and after application of stress are compared.Type: GrantFiled: January 19, 2007Date of Patent: May 25, 2010Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Shinji Sasaki, Makoto Torigoe, Takayoshi Ohtsu, Kouji Kataoka
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Patent number: 7690100Abstract: A device and method for testing a slider of a head-gimbal assembly during disc drive manufacturing. The device includes a test disc, an actuator arm and a control module. The test disc has a first circumferential area for detecting contact between the slider and the test disc and a second circumferential area for burnishing sliders that contact the first circumferential area as the test disc rotates at or above the predetermined velocity. The head-gimbal assembly is affixed to the actuator arm such that the slider is operable to move between an inner diameter and an outer diameter of the test disc. The control module controls the movement of the actuator arm, and thus the slider, relative to the test disc. The control module monitors the slider-disc interface for contact therebetween. If contact is detected, the slider is either burnished or the head-gimbal assembly is discarded altogether.Type: GrantFiled: March 13, 2007Date of Patent: April 6, 2010Assignee: Seagate Technology LLCInventors: Serge J. Fayeulle, Paul W. Smith, Gary E. Bement
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Patent number: 7676700Abstract: A system for testing hard disks includes a hard disk testing device and a computer. The computer has a mainboard and a key-press controller. The hard disk testing device connects with the mainboard and includes: a hard disk interface configured for connecting one or more hard disks to be tested to a south bridge of the mainboard; a key-press panel configured for connecting the key-press controller of the computer, and providing a hard disk testing control interface for users; and a hard disk testing unit configured for testing the one or more hard disks.Type: GrantFiled: June 7, 2007Date of Patent: March 9, 2010Assignee: Hon Hai Precision Industry Co., Ltd.Inventors: Chiou-Lin Fan, Ying-Chih Huang, Chin-Feng Chen
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Publication number: 20090296285Abstract: A system in one approach includes a sensor stack formed of a plurality of thin film layers; a shunt formed of at least some of the same layers as the sensor stack, the shunt being spaced from the sensor stack; a first lead coupled to the sensor stack and the shunt; and a second lead coupled to the sensor stack and the shunt. A method in one embodiment includes forming a plurality of thin film layers; removing a portion of the thin film layers for defining at least a portion of a sensor stack and at least a portion of a shunt spaced front the sensor stack; forming a first lead coupled to the at least a portion of the sensor stack and the at least a portion of the shunt and a second lead coupled to the at least a portion of the sensor stack and the at least a portion of the shunt. Additional systems and methods are also presented.Type: ApplicationFiled: May 30, 2008Publication date: December 3, 2009Inventors: Satoru Araki, Ying Hong, Edward Hin Pong Lee, Tsann Lin, David John Seagle
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Publication number: 20090165539Abstract: Glide test systems and associated methods are described. A glide test system includes a glide test head that is flown over the surface of a recording disk to detect asperities on the recording disk. The glide test head includes a detection pad on the trailing end of the head. Heating elements are fabricated proximate to the detection pad. The heating elements are independently controllable to control the amount of protrusion of different regions of the detection pad. The heating elements thus provide a way to substantially flatten the detection surface of the detection pad, and compensate for an uneven topography on a detection surface.Type: ApplicationFiled: December 26, 2007Publication date: July 2, 2009Inventors: Shanlin Duan, Jizhong He, Bruno Marchon, Ullal V. Nayak
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Patent number: 7549215Abstract: A structure and method for performing magnetic inductance testing of write heads formed on a wafer. The structure and method allows for the effective inductive testing of magnetic write heads at wafer level even if the write heads have an inductance that is too low to be effectively measured directly. A test head is constructed having a structure similar to that of the write heads, but having a significantly higher magnetic inductance. The higher magnetic inductance of the write head can be provided by extending the shaping layer to or beyond the air bearing surface plane ABS. The inductance of the test head can be further increased by increasing the width of the portion of the shaping layer that extends to the ABS (ie. shaping layer throat) and by increasing the width of the write pole throat.Type: GrantFiled: March 28, 2007Date of Patent: June 23, 2009Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Wen-Chien David Hsiao, Michael Ming Hsiang Yang
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Publication number: 20090128142Abstract: A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.Type: ApplicationFiled: November 19, 2007Publication date: May 21, 2009Inventors: Youping Deng, Terry Farren, Jing Zhang
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Publication number: 20090085561Abstract: A testing apparatus for a magnetic head tests electromagnetic conversion characteristics of the magnetic head by causing a magnetic head 10 to fly above a surface of the recording medium 16 and testing recording and playback characteristics of the magnetic head for the recording medium. The testing apparatus includes a setting portion 14 that moves the magnetic head 10 to and supports the magnetic head at a position where the magnetic head 10 is loaded on the recording medium 16 and a position where the magnetic head is withdrawn from the load position; an electromagnetic wave emitting device 30 that emits electromagnetic waves toward the magnetic head; and a detector 20 that is electrically connected to the magnetic head and detects an output signal of the magnetic head. By applying electromagnetic waves from the electromagnetic wave emitting device 30 onto the magnetic head, it is possible to detect the electromagnetic wave durability of the magnetic head 10.Type: ApplicationFiled: December 12, 2008Publication date: April 2, 2009Applicant: FUJITSU LIMITEDInventor: Hiroyuki Kawata
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Patent number: 7511486Abstract: A non-contact sensor system according to one embodiment comprises a substrate having at least one sensor element, the at least one sensor element being directed towards at least one data track on a medium positioned opposite the at least one sensor element, wherein the substrate and the medium each carry at least one magnetic track, wherein orientations of magnetizations of the magnetic tracks are such that the substrate experiences a force away from the medium. Other embodiments are also presented.Type: GrantFiled: February 13, 2008Date of Patent: March 31, 2009Assignee: International Business Machines CorporationInventor: Rolf Schaefer
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Patent number: 7506282Abstract: An apparatus and methods for predicting and/or for calibrating memory yields due to process defects and/or device variations, including determining a model of a memory cell, identifying a subset of parameters associated with the model, determining and executing a refined model using the parameters, determining a predicted probability the simulated memory cell will be operational based on the simulated operation of the refined model, determining yield prediction information from the predicted probability, and determining the minimum number of repair elements to include in a memory array design to insure a desired yield percentage based on the yield prediction information.Type: GrantFiled: August 18, 2005Date of Patent: March 17, 2009Assignee: International Business Machines CorporationInventors: Chad A. Adams, Anthony G. Aipperspach, George F. Paulik
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Publication number: 20080186020Abstract: A testing apparatus for magnetic recording medium and a testing method for magnetic recording medium which are able to conduct in a short time high-precision certify testing close to the actual method of use of magnetic recording media in hard disk drives can be provided.Type: ApplicationFiled: January 30, 2008Publication date: August 7, 2008Applicant: SHOWA DENKO K.K.Inventor: Junichi FUJITA
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Patent number: 7405907Abstract: A read head for reading magnetically stored data in adjacent tracks of a medium has at least two elongate bodies, each having at least one magnetoresistive part. The magnetoresistive parts have sensor portions defined along a length of the elongate bodies, by electrical connections to the magnetoresistive parts. A shield is provided at least on opposite transfer sides of the elongate bodies. The read head is used for calculating a position error signal by calculating a correlation between signals received from the respective sensor portions when the head is positioned over adjacent tracks on the medium, with one of the sensors positioned near a boundary between the tracks. The position error is calculated by determining the correlation between signals from the respective sensor portions.Type: GrantFiled: August 3, 2004Date of Patent: July 29, 2008Assignee: O-Mass ASInventor: Jørn Raastad
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Publication number: 20080100286Abstract: A spinstand includes a baseplate, a spindle mounted to the baseplate and a platform connected to the baseplate. A first component and a second component are mounted to the platform. An actuator moves the platform in a first direction relative to the baseplate, and mechanism moves the second component in approximately the first direction relative to the platform. The actuator moves the platform to position the first component at any radius of a disc placed on the spindle. The mechanism positions the second component at the same radius on an opposite surface of the disc according to a predetermined position adjustment. The first and second components are selected from a group consisting of: a burnish head, a glide head, a read head, a write head, and a read/write head. Embodiments provide automatic alignment of two components for simultaneous testing of both sides of a disc on the spinstand.Type: ApplicationFiled: November 1, 2006Publication date: May 1, 2008Inventors: Mark A. Meder, Wafaa A Abdalla
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Publication number: 20080100287Abstract: Techniques are described in which a hard disc media tester uses busses conforming to a single bus format to connect control components within a control system of the hard disc media tester. A hard disc media tester may include several control components such as a testing control module, a motion interface, a defect analyzer, a write controller, a motion controller, head loaders, and so on. Busses conforming to a single bus format, such as the Universal Serial Bus (USB) or FireWire formats, may facilitate the communication of control messages among each of these control components. Furthermore, the hard disc media tester may include one or more bus hubs to allow many components to be controlled through a single cable.Type: ApplicationFiled: November 1, 2006Publication date: May 1, 2008Inventors: Douglas Andrew Peale, Wafaa A. Abdalla
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Patent number: 7355399Abstract: A non-contact sensor system according to one embodiment includes a substrate having a substantially planar surface with at least one sensor element mounted to the substrate, the at least one sensor element being directed by a guiding element towards at least one data track on a substantially planar medium positioned opposite the at least one sensor element, wherein the substantially planar surface of the substrate and the substantially planar surface of the medium each carry at least one magnetic track, wherein orientations of magnetizations of the magnetic tracks are such that the substrate experiences a force away from the medium.Type: GrantFiled: March 12, 2007Date of Patent: April 8, 2008Assignee: International Business Machines CorporationInventor: Rolf Schaefer
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Patent number: 7352175Abstract: A probe card method, wherein a base supports a probe pin and an electromagnet. When the probe pin contacts a magnetic-sensor terminal on a chip on a wafer, magnetic force is applied to a magnetic-field sensing section in the chip.Type: GrantFiled: January 23, 2007Date of Patent: April 1, 2008Assignee: Fujitsu LimitedInventor: Hisanori Murata
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Publication number: 20080074107Abstract: A system for testing hard disks includes a hard disk testing device and a computer. The computer has a mainboard and a key-press controller. The hard disk testing device connects with the mainboard and includes: a hard disk interface configured for connecting one or more hard disks to be tested to a south bridge of the mainboard; a key-press panel configured for connecting the key-press controller of the computer, and providing a hard disk testing control interface for users; and a hard disk testing unit configured for testing the one or more hard disks.Type: ApplicationFiled: June 7, 2007Publication date: March 27, 2008Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventors: CHIOU-LIN FAN, YING-CHIH HUANG, CHIN-FENG CHEN
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Patent number: 7307418Abstract: Described are system for recording piston rod position information in a magnetic layer on the piston rod. A piston rod has a magnetically hard layer formed thereon to provide a recording medium. A magnetic pattern is recorded in the magnetically hard layer. A magnetic field sensor disposed adjacent to the piston rod senses the recorded magnetic pattern while the piston rod is moving and generates signals in response to the magnetic pattern that are used to determine a position of the piston rod.Type: GrantFiled: April 24, 2006Date of Patent: December 11, 2007Assignee: SRI InternationalInventors: Thomas P. Low, C. Bruce Clark, Ronald E. Pelrine, Joseph S. Eckerle, Chris Smith
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Publication number: 20070262771Abstract: A metrology system for measuring the magnetic properties of a magnetic recording medium layer on a device used for perpendicular recording.Type: ApplicationFiled: March 28, 2007Publication date: November 15, 2007Applicant: KLA-Tencor Technologies CorporationInventors: William Van Drent, Ferenc Vajda
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Patent number: 7295002Abstract: A spinstand having a vacuum chuck clamping mechanism for securing magnetic discs includes a cap (9) and a base (10). A disk-to-be-clamped is held between the cap (9) and the base (10). Vacuum, applied through a port (4) in a mounting screw (12) of the base, provides the clamping force. The vacuum is held constant using a circumferential seal (27) on a piston (2) of the cap, which extends into a cylindrical countering bushing (3) extending from the base. In one form, the cap (9) is centered about a spin axis (SA) extending through the base (10), using a hardened pin (1) extending from the cap and a locating bushing (19) affixed to the base. When the cap (9) is inserted into the base (10), the pin (1) prevents a piston (2) in the cap from contacting the inside walls/sealing surface (11) of the centering bushing (3) of the base.Type: GrantFiled: January 17, 2006Date of Patent: November 13, 2007Assignee: Guzik Technical EnterprisesInventors: Nahum Guzik, Forest E. Ray, Charles Brice Arnold
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Patent number: 7288935Abstract: A dynamic electrical tester (DET) for testing head gimbal assemblies (HGA) is disclosed. The DET simulates disk drive operation while significantly reducing tester capital investment. Multiple HGAs are tested simultaneously using modular spin stands with shared electronics. This design increases utilization of electronics and minimizes the effect of spindle start/stop time. A parallel array of spin stands with shared electronics is used to reduce tester component and materials cost by multiplexing between the spin stands. The DET has the significant advantage of reducing wait time by making use of the electronics while they are idle during mechanical-related delays. In addition, the DET includes more channels per test head that can readily switch back and forth between the products being tested.Type: GrantFiled: April 15, 2005Date of Patent: October 30, 2007Assignee: Hitachi Global Storage Technologies Netherlands BVInventors: Terry Farren, Yong Shen
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Patent number: 7276900Abstract: A magnetic characteristic inspecting apparatus including a plurality of disk rotating devices or a plurality of magnetic heads include a unit for switching output signals of write signal production units or allocating the output signals to the magnetic heads, a unit for switching signals read from the magnetic heads or allocating the read signals to measurement resources, and a unit for selecting any of the disk rotating devices synchronously with which the measurement resources will perform measurement. The write signal production units and measurement resources are shared among inspections of the plurality of disk rotating devices or the plurality of heads.Type: GrantFiled: November 15, 2005Date of Patent: October 2, 2007Assignee: Hitachi High-Technologies CorporationInventors: Masayoshi Takahashi, Masami Makuuchi, Ritsuro Orihashi, Shinji Homma
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Patent number: 7249406Abstract: The perpendicular magnetic head fabrication and testing method includes the additional fabrication of magnetic pole testing structures in the kerf area of the wafer substrate. Particularly, magnetic interconnect pieces are fabricated in the kerf area to magnetically connect an extending portion of the first magnetic pole with an extending portion of the second magnetic pole. As a result, when the perpendicular magnetic heads are fabricated at the wafer level, the first and second magnetic poles are interconnected through structures located in the kerf area. Thereafter, an ISAT magnetic pole test can be conducted by passing electrical current through the induction coil of the magnetic head, and magnetic flux will flow through the interconnected magnetic pole structure, thereby enabling the testing of the magnetic poles of the perpendicular magnetic head at the wafer level.Type: GrantFiled: February 28, 2005Date of Patent: July 31, 2007Assignee: Hitachi Global Storage Technologies Netherlands, B.V.Inventors: Wolfgang Goubau, Edward Hin Pong Lee
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Patent number: 7248039Abstract: A method for testing electromagnetic characteristics of magnetic media while maintaining consistent performance of a read/write head and recording channel is disclosed. The disclosed method is performed such that reduced statistical sampling is achieved. The method includes recording a first set of baseline measurements utilizing a first magnetic media with the read/write head and recording channel. The first magnetic media is then removed from an assembly containing the read/write head and recording channel and is replaced with a second magnetic media. Measurements are made utilizing the second magnetic media with the read/write head and recording channel, wherein the measurements are comparable with the baseline measurements and wherein consistent performance of the read/write head and the recording channel is maintained so as to reduce the size of statistical samples needed.Type: GrantFiled: August 27, 2004Date of Patent: July 24, 2007Assignee: Hitachi Global Storage Technologies Netherlands, B.V.Inventors: Paul M. Green, Peter Ivett, Wyman Pang
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Patent number: 7248040Abstract: A disk testing apparatus that sets a predetermined condition of a recording density for a disk apparatus, and conducts a test relating to at least readout of data stored in the disk apparatus includes a condition relaxing unit that relaxes, when a result of the test is unsatisfactory, a condition of the recording density currently set for the disk apparatus to set a new condition of the recording density; and a re-testing unit that re-conducts the test on the disk apparatus to which the new condition is set.Type: GrantFiled: December 27, 2004Date of Patent: July 24, 2007Assignee: Fujitsu LimitedInventors: Masaki Makifuchi, Shigenori Yanagi
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Patent number: 7212000Abstract: A method and apparatus for detecting a defective disk for a hard disk drive. The method includes placing a disk into a tester so that a first side of the disk is adjacent to a first head of the tester and a second side of the disk is adjacent to a second head. First data is read from the first side of the disk, and second data is read from the second side of the disk. The disk is then flipped so that the second side is adjacent to the first head and the first side is adjacent to the second head. Third data is read from the first side. Fourth data is read from the second side. A first area between a curve generated from the first data and a curve generated from the third data is calculated. Likewise, a second area is calculated between a curve generated from the second data and a curve generated from the fourth data. An average of the first and second areas is then calculated and used to detect a defective disk.Type: GrantFiled: October 30, 2003Date of Patent: May 1, 2007Assignee: Samsung Electronics Co., Ltd.Inventors: Geng Wang, Sang Lee
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Patent number: 7208948Abstract: A non-contact magnetic sensor system according to one embodiment includes a substrate and a magnetic medium spaced from the substrate and having a data track thereon. A sensor element is mounted to the substrate. A guiding element biases the substrate towards the magnetic medium. A first magnetic track is positioned on the substrate. A second magnetic track is positioned on the magnetic medium. Orientations of the magnetizations of the magnetic tracks are such that the substrate experiences a vertical force away from the magnetic medium.Type: GrantFiled: November 5, 2004Date of Patent: April 24, 2007Assignee: International Business Machines CorporationInventor: Rolf Schaefer
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Patent number: 7194802Abstract: A device and method for testing a slider of a head-gimbal assembly during disc drive manufacturing. The device includes a test disc, an actuator arm and a control module. The test disc has a first circumferential area for detecting contact between the slider and the test disc and a second circumferential area for burnishing sliders that contact the first circumferential area as the test disc rotates at or above the predetermined velocity. The head-gimbal assembly is affixed to a support, or flexure, on the actuator arm such that the slider is operable to move between an inner diameter and an outer diameter of the test disc. The control module controls rotation of the test disc and movement of the actuator arm, and thus the slider, relative to the test disc. The control module monitors the slider-disc interface for contact therebetween. If contact is detected, the slider is either burnished or the head-gimbal assembly is discarded altogether.Type: GrantFiled: November 26, 2002Date of Patent: March 27, 2007Assignee: Seagate Technology LLCInventors: Serge J. Fayeulle, Paul W. Smith, Gary E. Bement
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Patent number: 7196513Abstract: A testing method for a magnetic hard disk or a magnetic head in a test system includes a moving step in which the magnetic head, which moves to fly closely over the magnetic disk, moves to a predetermined radial position corresponding to the position data of the magnetic disk which rotates at a predetermined constant speed; a reading step in which imbedded position data is read out for each sector of the magnetic disk is by the magnetic head; and a reading/writing step in which a predetermined signal is written in or read out from a data area of the sector by the magnetic head when the position data is one of equal to a predetermined value and within a predetermined range.Type: GrantFiled: July 31, 2006Date of Patent: March 27, 2007Assignee: International Manufacturing and Engineering Services Co., Ltd.Inventor: John Perez
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Patent number: 7183763Abstract: A probe card includes a base that supports a probe pin and an electromagnet. When the probe pin contacts a magnetic-sensor terminal in on a chip on a wafer, magnetic force is applied to a magnetic-field sensing section in the chips.Type: GrantFiled: March 14, 2006Date of Patent: February 27, 2007Assignee: Fujitsu LimitedInventor: Hisanori Murata
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Patent number: 7173415Abstract: A magnetic test module runs on a spin stand to detect amplitude decay and noise evolution at the same time. Signal-to-noise ratio (SNR) decay is directly measured. The recording performance is correlated better with SNR instead of signal only. The thermal stability of the system is evaluated more accurately with this SNR decay method. A heater is placed under the media disk, and a remote sensing thermometer and temperature controller form a subsystem to set up desired environmental temperature. The heater creates a heated band and the read/write head flies above the heated band. The temperature control system may be removed when SNR decay measurement is performed under room temperature.Type: GrantFiled: July 26, 2005Date of Patent: February 6, 2007Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Shanlin Duan, Jizhong He, Zhupei Shi, Jane Jie Zhang
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Patent number: 7165462Abstract: Systems and methods of testing individual sliders are disclosed. One embodiment is a test system that includes a mechanical stress system, a quasi-static measurement system, a transport system, and a slider holder. The individual sliders to be tested are aligned in a row in the slider holder, and the slider holder secures the sliders. The measurement system performs quasi-static measurements on sliders in the slider holder simultaneously. The transport system then transports the slider holder to the mechanical stress system. The mechanical stress system applies mechanical stress to the sliders in slider holder. The transport system then transports the slider holder again to the quasi-static measurement system. This process repeats a desired number of times to complete testing.Type: GrantFiled: November 29, 2004Date of Patent: January 23, 2007Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Jih-Shiuan Luo, Ali Sanayei
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Patent number: 7141969Abstract: An XY platen positioning system includes a fixed base rigidly coupled to a essentially planar surface. An XY intermediate plate is slidably coupled to the fixed base, such that the XY intermediate plate is slidable in the X axis along the fixed base. An XY stage is slidably coupled to the XY intermediate plate, such that the XY stage is slidable in the Y axis along the XY intermediate plate. A platen is flexibly coupled to the XY stage, such that the platen, with respect to the XY stage, is essentially constrained in the X and Y axes and moveable in the Z axis.Type: GrantFiled: March 29, 2004Date of Patent: November 28, 2006Assignee: Guzik Technical EnterprisesInventor: Nahum Guzik
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Patent number: 7131346Abstract: Head stack fixtures for securing head stack assemblies to spin stand testing systems, and spin stand testing systems incorporating such fixtures, are disclosed. Exemplary head stack fixtures comprise a base supporting a piezoelectric actuator. The base includes an attachment mechanism for securing the HSA in such a way that the HSA will pivot relative to the base. When the HSA is secured to the base, the piezoelectric actuator engages the HSA. The piezoelectric actuator is therefore able to pivot the HSA relative to the base for fine positioning of a head of the HSA.Type: GrantFiled: October 15, 2004Date of Patent: November 7, 2006Assignee: Western Digital (Fremont), Inc.Inventors: Jagdeep S. Buttar, David Terrill, Kenneth R. Davies, Herman Ferrier, Xiaodong Che
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Patent number: 7129702Abstract: An XY stage includes a movable frame having a rectangular space inside thereof and movable on a reference base along one of X and Y axes, a first drive source provided in the reference base for moving the movable frame, a rectangular movable base mounted in the rectangular space of the movable frame, which is movable on the reference base along the other of the X and Y axes and stopped on the reference base, and a second drive source provided in the movable frame, for moving the movable base.Type: GrantFiled: March 19, 2004Date of Patent: October 31, 2006Assignee: Hitachi High-Technologies CorporationInventors: Kyoichi Mori, Fujio Yamasaki, Toshinori Sugiyama
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Patent number: 7124625Abstract: A glide-height disk-tester operates with the test disk rotating at a predetermined constant rotational speed and uses a glide head with an electrically-resistive heater and a thermally-responsive protrusion pad located on its trailing end. The linear velocity of the disk relative to the slider maintains the slider at its nominal fly height, which is typically higher than any expected asperity. With no current applied to the heater, the protrusion pad is generally flush with the air-bearing surface of the slider. Increasing levels of current are applied to the heater, which causes movement of the protrusion pad toward the disk surface. When the pad contacts an asperity, the current level applied at the instant of asperity contact is recorded. The applied current level can be correlated to the glide height from a previous calibration process using a calibration disk with known calibration bump heights.Type: GrantFiled: May 17, 2005Date of Patent: October 24, 2006Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Masayuki Kurita, Remmelt Pit, Shozo Saegusa, Toshiya Shiramatsu, Mike Suk, Hideaki Tanaka
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Patent number: 7124654Abstract: A spin stand testing system is used to determine a positioning range of a microactuator disposed on a head gimbal assembly. The microactuator is configured to laterally translate a read sensor of a head of the head gimbal assembly through the positioning range. The spin stand testing system includes a disk having a track, and a secondary mover configured to laterally translate the head gimbal assembly. During testing, a feedback loop keeps the read sensor locked to the track. While the read sensor remains locked, the head gimbal assembly is translated laterally. The microactuator translates the read sensor in an opposite direction until the microactuator reaches an end of its range, which is determined by monitoring a signal. The amount of translation of the head gimbal assembly by the secondary mover when the signal indicates the end of the range is the measured positioning range in one direction.Type: GrantFiled: September 30, 2004Date of Patent: October 24, 2006Assignee: Western Digital (Fremont), Inc.Inventors: Kenneth R. Davies, David Terrill, Jagdeep S. Buttar
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Patent number: 7109701Abstract: A testing method for a magnetic hard disk or a magnetic head in a test system includes a moving step in which the magnetic head, which moves to fly closely over the magnetic disk, moves to a predetermined radial position corresponding to the position data of the magnetic disk which rotates at a predetermined constant speed; a reading step in which imbedded position data is read out for each sector of the magnetic disk is by the magnetic head; and a reading/writing step in which a predetermined signal is written in or read out from a data area of the sector by the magnetic head when the position data is one of equal to a predetermined value and within a predetermined range.Type: GrantFiled: September 12, 2003Date of Patent: September 19, 2006Assignee: International Manufacturing and Engineering Services Co., Ltd.Inventor: John Perez
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Patent number: 7075294Abstract: In the method of inspecting a thin-film magnetic head, a thin-film magnetic head provided with a magnetoresistive film having a free layer whose magnetization direction changes depending on an external magnetic field and ferromagnetic layers for applying a bias magnetic field to the free layer is prepared. Then, a DC magnetic field is applied to the ferromagnetic layers in the bias magnetic field applying direction. Subsequently, an AC magnetic field is applied to the ferromagnetic layers in the bias magnetic field applying direction. Thereafter, an external magnetic field is applied to the magnetoresistive film while supplying a current thereto, and a property of the thin-film magnetic head such as asymmetry and reproducing output is inspected.Type: GrantFiled: August 17, 2004Date of Patent: July 11, 2006Assignees: TDK Corporation, SAE Magnetics (H.K.) Ltd.Inventors: Hiroki Matsukuma, Muneyoshi Kobashi
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Patent number: 7064539Abstract: A method for identifying a problem with a magnetic disk, comprising testing both sides of a disk for read errors using a pair of heads, flipping the disk 180 degrees, again testing both sides of the disk for read errors using the same heads, determining whether one side of the disk has more errors than the other side both before and after the flip, and determining that the disk is the cause of the read errors if the same side of the disk still has more errors than the other side after the flip.Type: GrantFiled: August 8, 2003Date of Patent: June 20, 2006Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Paul Marion Green, Garth Wade Helf
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Patent number: 7064659Abstract: A method is presented for glide testing a disk which tests the glide head fly-height by inducing a collision between the glide head and a disk under test. The glide test system is initially calibrated using calibration disks. The method of the invention periodically tests the calibration without interrupting the production testing by lowering the rotation rate until the glide head collides with the rotating disk surface. The rotation rate at which the collision occurs is then compared with the value expected based on knowledge of disk samples and the initial calibration. Parameters for acceptable high and low values are established to detect changes in the glide test system performance to trigger automatic or manual recalibration.Type: GrantFiled: August 31, 2004Date of Patent: June 20, 2006Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Bradley Frederick Baumgartner, Norman Chu, Patricia Galindo, Hang Fai Ngo, Yu Lo, Nalin Zhou
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Patent number: 7057385Abstract: A magnetic recording medium inspection method detects small protrusions that constitute defects on the surface of a magnetic recording medium. The method includes flying a glide inspection head at a predetermined height over the surface of the moving magnetic recording medium; detecting a contact duration time during which the glide head is in contact with a protrusion on the surface of the magnetic recording medium using a contact detection sensor attached to the glide inspection head; and determining the small protrusion based on the contact duration time.Type: GrantFiled: March 12, 2003Date of Patent: June 6, 2006Assignee: Fujitsu LimitedInventors: Toru Yokohata, Takahiro Imamura, Toshiya Fujita, Yojiro Ochiai, Masahiro Ozeki, Naoki Satake
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Patent number: 7051423Abstract: This invention relates to a testing method for a head IC which makes it possible to simplify checking of the head. The head IC is installed on a head suspension, and probes are placed on terminals of the head suspension to check electric characteristics of the head IC. With this invention, contact of the probes for checking the head IC when the head IC has been installed, but before installing the head, becomes easier.Type: GrantFiled: September 10, 2003Date of Patent: May 30, 2006Assignee: Fujitsu LimitedInventor: Akio Gouo
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Patent number: 4933311Abstract: In the process of producing a linear alternating polymer of carbon monoxide and at least one ethylenically unsaturated hydrocarbon in the presence of a palladium salt, the anion of a strong non-hydrohalogenic acid and a bis(phosphino)propane, improved polymerization rates are obtained when employing a novel catalyst composition formed from a novel 1,3-bis(phosphino)propane wherein the propane moiety is additionally substituted in the 2 position with two hydrocarbyl substituents.Type: GrantFiled: April 26, 1989Date of Patent: June 12, 1990Assignee: Shell Oil CompanyInventors: Johannes A. van Doorn, Richard L. Wife