Noncoil Type Patents (Class 324/235)
  • Patent number: 11555834
    Abstract: A current sensor includes a magnetic detection unit capable of detecting the magnetism, a first magnetic shield and a second magnetic shield. The first magnetic shield includes a first shield section and two second shield sections respectively connected in the vicinity of the two ends thereof. The second magnetic shield includes a third shield section and two fourth shield sections respectively connected in the vicinity of the two ends thereof. Between the first shield section and the third shield section is a conductor placement region, and the magnetic detection unit is positioned between the first shield section and the conductor placement region and is provided at a magnetic field canceling position where the magnetic field in the second direction is substantially zero at non-energized times after a prescribed current has flowed in the conductor, in relationship to the length of the two fourth shield sections along the third direction.
    Type: Grant
    Filed: March 17, 2021
    Date of Patent: January 17, 2023
    Assignee: TDK Corporation
    Inventor: Makoto Takahashi
  • Patent number: 11519940
    Abstract: A current sensor that is less affected by the residual magnetization is provided. A current sensor of the present invention has a magnetic circuit that is magnetized by electric current; a first magnetic field detecting element that is positioned where a magnetic field, when the electric current is present, is directed in a same direction as a magnetic field that is caused by residual magnetization of the magnetic circuit when the electric current is not present; and a second magnetic field detecting element that is positioned where a magnetic field, when the electric current is present, is directed opposite to a direction of a magnetic field that is caused by residual magnetization of the magnetic circuit when the electric current is not present.
    Type: Grant
    Filed: January 22, 2021
    Date of Patent: December 6, 2022
    Assignee: TDK Corporation
    Inventors: Hiroyuki Hirano, Makoto Takahashi, Ryoichi Menju, Teiichiro Oka
  • Patent number: 11360123
    Abstract: The current sensor has a conductive member through which a current to be measured flows in a predetermined direction, and a magneto electric converter facing and spaced apart from the conductive member in an intersecting direction intersecting the predetermined direction. An opposing portion of the conductive member facing the magneto electric converter has an annular shape in which two tip surfaces face each other via a gap around the predetermined direction. The magneto electric converter is opposed to the hollow portion, arranged in the opposing portion having an annular shape, in the intersecting direction via the gap.
    Type: Grant
    Filed: August 25, 2020
    Date of Patent: June 14, 2022
    Assignee: DENSO CORPORATION
    Inventors: Tatsuaki Sugito, Takeshi Tsukamoto, Takuma Esaka, Ryosuke Sakai, Akito Sasaki, Hatsuomi Isogai, Hiroaki Miwa, Hiroshi Nomura, Takashi Ishikawa, Katsunori Michiyama
  • Patent number: 11237240
    Abstract: A ferromagnetic resonance (FMR) measurement system is disclosed with a plurality of “m” RF probes and one or more magnetic assemblies to enable a perpendicular-to-plane or in-plane magnetic field (Hap) to be applied simultaneously with a sequence of microwave frequencies (fR) at a plurality of “m” test locations on a magnetic film formed on a whole wafer under test (WUT). A FMR condition occurs in the magnetic film (stack of unpatterned layers or patterned structure) for each pair of (Hap, fR) values. RF input signals are distributed to the RF probes using RF power distribution or routing devices. RF output signals are transmitted through or reflected from the magnetic film to a plurality of “n” RF diodes where 1?n?m, and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening at the predetermined test locations.
    Type: Grant
    Filed: August 24, 2020
    Date of Patent: February 1, 2022
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Santiago Serrano Guisan, Luc Thomas, Son Le, Guenole Jan
  • Patent number: 11092570
    Abstract: This magnetic body inspection apparatus (100, 200, 300, 400) includes a magnetic field application unit (1) configured to apply a magnetic field in advance to a steel wire rope (W) and to adjust a magnetization direction of the steel wire rope (W), and is configured to detect a magnetic field change by a detector (2).
    Type: Grant
    Filed: January 26, 2017
    Date of Patent: August 17, 2021
    Assignee: Shimadzu Corporation
    Inventor: Kenji Iijima
  • Patent number: 10976382
    Abstract: Even in a case in which a comb-teeth shape is provided at an end portion of a cover covering an opening in a magnetic shield case that accommodates a magnetic sensor, the present disclosure obtains a magnetic sensor device and a housing therefor capable of maintaining the strength of a comb-teeth portion. The magnetic sensor device and the housing therefor include: a comb-teeth portion in which protrusions are formed in the shape of comb teeth along an intersecting direction intersecting a conveying direction, the comb-teeth portion being formed at an end portion of a cover with respect to the conveying direction, the cover covering an opening in a magnetic shield case that accommodates a magnetic sensor; and support members formed on a lateral face of the magnetic shield case, the support members supporting the protrusions on the side opposite to the conveying path.
    Type: Grant
    Filed: December 20, 2017
    Date of Patent: April 13, 2021
    Assignee: Mitsubishi Electric Corporation
    Inventors: Hideki Matsui, Tomokazu Ogomi, Sadaaki Yoshioka
  • Patent number: 10962444
    Abstract: A belt drive monitoring system comprising a driver, a driven, the driver and driven connected by an endless member, a first magnetic member having a magnetic field attached to the driver, a second magnetic member having a magnetic field attached to the driven, a first sensor disposed to detect a changing magnetic field caused by passage of the first magnetic member, a second sensor disposed to detect a changing magnetic field caused by passage of the second magnetic member, a first transmitter configured to wirelessly transmit to a receiver a first data signal from the first sensor and a second transmitter configured to wirelessly transmit to the receiver a second data signal from the second sensor, and the receiver configured to manipulate the data signal whereby a system parameter is calculated and provided to a user.
    Type: Grant
    Filed: November 7, 2018
    Date of Patent: March 30, 2021
    Assignee: Gates Corporation
    Inventors: Kane Chinnel, John Ragan, Baron Sanders, Leslee Brown, Vladislav Soukhovei
  • Patent number: 10782435
    Abstract: A detection device includes a spiral structure, a proximity sensor, a via element, an electrostatic-field enhancement element, and a nonconductive substrate. The spiral element has a first end and a second end. The proximity sensor is coupled to the first end of the spiral element. The electrostatic-field enhancement element is disposed adjacent to the spiral structure. The first end of the spiral structure is coupled through the via element to the electrostatic-field enhancement element. The second end of the spiral structure is an open end. The electrostatic-field enhancement element is configured to increase the directivity of the detection device. The nonconductive substrate is disposed between the spiral structure and the electrostatic-field enhancement element. The via element penetrates the nonconductive substrate.
    Type: Grant
    Filed: October 25, 2018
    Date of Patent: September 22, 2020
    Assignee: ACER INCORPORATED
    Inventors: Kun-Sheng Chang, Ching-Chi Lin
  • Patent number: 10761154
    Abstract: A scanning ferromagnetic resonance (FMR) measurement system is disclosed with a radio frequency (RF) probe and one or two magnetic poles mounted on a holder plate and enable a perpendicular-to-plane or in-plane magnetic field, respectively, at test locations. While the RF probe tip contacts a magnetic film on a whole wafer under test (WUT), a plurality of microwave frequencies (fR) is sequentially transmitted through the probe tip. Simultaneously, a magnetic field (HR) is applied to the contacted region thereby causing a FMR condition in the magnetic film for each pair of (HR, fR) values. RF output signals are transmitted through or reflected from the magnetic film to a RF diode and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening for a sub-mm area. The WUT is moved to preprogrammed locations to enable multiple FMR measurements at each test location.
    Type: Grant
    Filed: January 19, 2018
    Date of Patent: September 1, 2020
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Guenole Jan, Son Le, Luc Thomas, Santiago Serrano
  • Patent number: 10754000
    Abstract: A ferromagnetic resonance (FMR) measurement system is disclosed with a plurality of “m” RF probes and one or more magnetic assemblies to enable a perpendicular-to-plane or in-plane magnetic field (Hap) to be applied simultaneously with a sequence of microwave frequencies (fR) at a plurality of “m” test locations on a magnetic film formed on a whole wafer under test (WUT). A FMR condition occurs in the magnetic film (stack of unpatterned layers or patterned structure) for each pair of (Hap, fR) values. RF input signals are distributed to the RF probes using RF power distribution or routing devices. RF output signals are transmitted through or reflected from the magnetic film to a plurality of “n” RF diodes where 1?n?m, and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening at the predetermined test locations.
    Type: Grant
    Filed: August 7, 2018
    Date of Patent: August 25, 2020
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Santiago Serrano Guisan, Luc Thomas, Son Le, Guenole Jan
  • Patent number: 10466206
    Abstract: A ferromagnetic strip sensor for use in magnetostrictive testing of various structures. In its simplest form, the sensor has a ferromagnetic strip with an electrical coil winding. A permanent magnet is positioned atop the strip, aligned with but offset from, a center axis of the strip. The sensor is operable such that a time varying current in the coil results in a unidirectional guided wave. This guided wave travels within the structure, and is reflected from anomalies in the structure.
    Type: Grant
    Filed: December 12, 2016
    Date of Patent: November 5, 2019
    Assignee: Southwest Research Institute
    Inventors: Sergey A. Vinogradov, Glenn M. Light, Charles E. Duffer
  • Patent number: 10436856
    Abstract: A sensor apparatus adjusts output timings of a detection signal and a sensing signal for sensing an abnormality in the detection signal. Provided is a magnetic sensor apparatus comprising a magnetic sensor element, an amplifying section that amplifies and outputs an output of the magnetic sensor element, a plurality of comparing sections that compare the output of the magnetic sensor element or an output of the amplifying section to a threshold value, and a plurality of delaying sections that each delay and output a comparison result output by a corresponding comparing section among the plurality of comparing sections. Also provided is a current sensor apparatus including a current path through which a current serving as a measurement target flows and a magnetic sensor apparatus that is arranged corresponding to the current path and detects a magnetic field generated according to the current serving as the measurement target.
    Type: Grant
    Filed: December 21, 2016
    Date of Patent: October 8, 2019
    Assignee: Asahi Kasei Microdevices Corporation
    Inventors: Takenobu Nakamura, Yuusuke Aiba
  • Patent number: 10352886
    Abstract: Disclosed herein is a probe for detecting structural integrity of a part. The probe comprises an outer shield, having a hollow tubular shape, defining a first interior channel, and comprising a part-engagement end. The probe also comprises an inner shield, within the first interior channel, having a hollow tubular shape, spaced apart from the outer shield, and comprising a first end portion and a second end portion, opposite the first end portion. The first end portion of the inner shield is closer to the part-engagement end of the outer shield than the second end portion of the inner shield. The first end portion of the inner shield comprises a wall extension, protruding in a direction extending from the second end portion of the inner shield to the first end portion of the inner shield and circumferentially extending about less than an entire circumference of the inner shield.
    Type: Grant
    Filed: March 21, 2017
    Date of Patent: July 16, 2019
    Assignee: The Boeing Company
    Inventors: Steven K. Brady, Landon K. Henson, Benjamin E. Koltenbah
  • Patent number: 10217560
    Abstract: An inductor for induction thermography may be designed, in at least one section, as a rectangularly wound conductor that includes a closed conductor loop which, except for a conductor forming the conductor loop, is free from electrical components.
    Type: Grant
    Filed: January 21, 2015
    Date of Patent: February 26, 2019
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventor: Max Rothenfusser
  • Patent number: 10101411
    Abstract: A circuit removing static electricity from a connected electronic device includes a detecting device, an amplifier, a switch device, and a control device. The detecting device detects a change of a magnetic flux surrounding the electronic device, and generates an analog electronic signal accordingly. The amplifier connects to the detecting device and amplifies the analog electronic signal. The control device connects to the amplifier, filters an amplified analog electronic signal, and generates a control signal. The switch device connected to the control device as well as the electronic device conducts the static electricity to earth in response to the control signal.
    Type: Grant
    Filed: April 29, 2016
    Date of Patent: October 16, 2018
    Assignees: HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Ji-Xiang Yin, Jiang-Feng Shan, Tsung-Jen Chuang
  • Patent number: 10042010
    Abstract: A Hall sensor (HS) comprises at least four sensor terminals (EXT_A, EXT_B, EXT_C, EXT_D) for connecting the Hall sensor (HS) in at least two Hall sensing elements (11, 12, . . . , 44) connected together, element terminals (A, B, C, D) of the Hall sensing elements (11, 12, . . . , 44) are connected in between the sensor terminals (EXT_A, EXT_B, EXT_C, EXT_D). Each of the Hall sensing elements (11, 12, . . . , 44) is configured to provide an individual sensor value between two of its element terminals (A, B, C, D). The at least two Hall sensing elements (11, 12, . . . , 44) are distributed basically equally into two halves (B1, B2) and are connected such that a difference value is electrically formed between two of the sensor terminals (EXT_A, EXT_B, EXT_C, EXT_D) resulting from the respective individual sensor values.
    Type: Grant
    Filed: November 13, 2012
    Date of Patent: August 7, 2018
    Assignee: ams AG
    Inventor: Georg Röhrer
  • Patent number: 10018688
    Abstract: Systems and methods to detect when the external magnetic field becomes higher than the saturation field of AMR material are described. Approaches include saturation detection by combining sensors with different full-scale ranges, saturation detection using DC current and saturation detection by arranging sensitive axes at 45° offsets.
    Type: Grant
    Filed: November 19, 2014
    Date of Patent: July 10, 2018
    Assignee: MEMSIC, INC.
    Inventors: Daniel Vasquez, Yongyao Cai, Shuo Gu, James Fennelly
  • Patent number: 9995714
    Abstract: There is provided an apparatus for monitoring a condition of an elongated ferrous object having a longitudinal axis, said apparatus including at least one magnetizing circuit including magnetic poles separated along the longitudinal axis, and magnetic field sensors arranged at the poles, said poles including pole shoes for directing magnetic flux between the poles and the monitored object. The pole shoes include openings between the monitored object and the poles, an opening including two ends separated in a direction perpendicular to the longitudinal axis by a mid-section defining a smaller opening than the ends for concentrating the magnetic flux at the mid-section. There is further provided an arrangement including one or more elongated objects for hoisting payload, wherein the monitoring apparatus is attached to the elongated objects.
    Type: Grant
    Filed: November 11, 2014
    Date of Patent: June 12, 2018
    Assignee: KONECRANES GLOBAL CORPORATION
    Inventors: Joni Silvo, Antti Tanskanen
  • Patent number: 9541526
    Abstract: The device has a processor (20) that applies a magnetic field to a measurement subject (2) and after the magnetic field is discontinued, uses an induced electromotive force detector (17) to measure the magnetic fluxes emitted from multiple locations, calculates time constants of transient change of the plurality of magnetic fluxes, and detects the internal structure of the measurement subject (2) from the distribution of the time constants. The processor (20) prompts the induced electromotive force detector (17) to make first measurements at predetermined locations, prompts the induced electromotive force detector (17) to make second measurements at locations rotated by a predetermined angle from the predetermined locations, and based on the internal structure detected by the first measurements and the internal structure detected by the second measurements, estimates the center location of the nugget and/or the diameter of the nugget which has been formed inside the measurement subject (2).
    Type: Grant
    Filed: April 5, 2012
    Date of Patent: January 10, 2017
    Assignees: Honda Motor Co., Ltd., Nippon Kouatsu Electric Co., Ltd.
    Inventors: Toshihiko Kubota, Osamu Kawanabe, Takashi Kimura, Atsushi Okuda
  • Patent number: 9506997
    Abstract: In a magnetic-field angle detection device and a rotation angle detection device in which the accuracy of the measured angle is not degraded even if the MR ratio of the tunneling magnetoresistance element is increased. In a magnetic-field-angle measurement apparatus including a magnetic-field-angle detection circuit and a magnetic sensor having a tunneling magnetoresistance element with a pinned magnetic layer, the magnetic-field-angle detection circuit has a power-supply unit that outputs a constant voltage as a bias voltage to the tunneling magnetoresistance element of the magnetic sensor and a current-detection unit that detects an output current of the tunneling magnetoresistance element.
    Type: Grant
    Filed: May 14, 2010
    Date of Patent: November 29, 2016
    Assignee: Hitachi, Ltd.
    Inventors: Mutsumi Suzuki, Hiroshi Iwasawa, Masahiro Iwamura
  • Patent number: 9448054
    Abstract: A throttle opening detection device includes a rotor which is rotated in an interlocking manner by manipulation of an acceleration grip which is mounted together with the rotor on a handlebar. First magnets are arranged near a peripheral portion of one side surface of the rotor along the circumferential direction of the rotor, while second magnets are respectively laminated to the first magnets, and have opposite polarities to the first magnets. The first magnets with the second magnets laminated thereto are disposed with a set spacing therebetween. A magnetic sensor for detecting a magnetic force generated by all the magnets is arranged to oppose, with a clearance therebetween, the one side surface of the rotor in which the magnets are arranged, in an axial direction of the rotor.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: September 20, 2016
    Assignee: Honda Motor Co., Ltd.
    Inventors: Yoshihiro Nomura, Yuichi Kawasaki
  • Patent number: 9389275
    Abstract: Techniques to provide calibration of a measurement system in conjunction with measurement operations. The techniques may include providing a reference device in a signal processing chain within the measurement system. An excitation signal may be driven through the reference device while it may be connected to the signal processing chain within the measurement system and a calibration response may be captured. During a measurement operation, the reference device connection may be complemented with a sensor connection in the signal processing chain and the excitation signal may be driven through the signal processing chain. A measurement response may be captured from the system. The measurement system may generate a calibrated measurement signal that accounts for phase and/or amplitude errors within the system from the calibration response and the measurement response.
    Type: Grant
    Filed: January 31, 2012
    Date of Patent: July 12, 2016
    Assignee: Analog Devices, Inc.
    Inventors: Gabriel Banarie, Andreas Callanan, Damien McCartney, Colin Lyden
  • Patent number: 9284817
    Abstract: A well tool comprising a housing comprising ports and defining a flow passage, an actuator, a dual magnetic sensor actuation assembly (DMSAA) in signal communication with the actuator and comprising a first magnetic sensor up-hole relative to a second magnetic sensor, and an electronic circuit comprising a counter, and wherein, the DMSAA detects a magnetic signal and determines the direction of movement of the magnetic device emitting the magnetic signal, and a sleeve slidable within the housing and transitional from a first position in which the sleeve prevents fluid communication via the ports to a second position in which the sleeve allows fluid communication via the ports, wherein, the sleeve transitions from the first to the second position upon recognition of a predetermined quantity of magnetic signals traveling in a particular direction.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: March 15, 2016
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Zachary W. Walton, Matthew T. Howell
  • Patent number: 9279866
    Abstract: A magnet is disposed on one face of a hollow section which is the conveyance path of an object of detection, and has a magnetic pole of designated length along the conveyance direction of the object of detection. A magnetic body is disposed along the conveyance direction opposite the magnet with the hollow section therebetween, and generates a cross magnetic field that crosses the hollow section formed between the magnetic body and the magnet. An anisotropic magnetoresistance element is disposed on the side of the magnetic body carrier facing the hollow section, and has magneto-sensing action in the conveyance direction.
    Type: Grant
    Filed: April 2, 2013
    Date of Patent: March 8, 2016
    Assignee: Mitsubishi Electric Corporation
    Inventors: Tomokazu Ogomi, Kenji Shimohata, Hiroyuki Asano
  • Patent number: 9201125
    Abstract: A method for continuous quality control of geometric, structural and functional parameters of an applied element, such as a staple, in printed products. The quality control is realized with the aid of at least one measuring device that comprises at least one measuring head including at least one permanent magnet and at least one giant magneto resistance sensor chip. The applied element is detected with the measuring head and, based thereon, a magnetic image is generated of the condition of the element.
    Type: Grant
    Filed: September 23, 2011
    Date of Patent: December 1, 2015
    Assignee: Muller Martini Holding AG
    Inventors: Thomas Schenker, Beat Von Aesch, Thomas Liebi
  • Patent number: 9170309
    Abstract: One embodiment relates to a sensing system that includes a magnetic encoder wheel having alternating pole magnetic domains along a circumference thereof. The magnetic encoder wheel is configured to rotate about a first axis. The sensing system further includes a magnetic field sensing element in spatial relationship with the magnetic encoder wheel that is oriented to sense magnetic field components extending generally in a direction parallel to a second axis that is perpendicular to the first axis. The sensing system also includes a magnetic flux influencing element configured to influence magnetic field components associated with the alternating pole magnetic domains of the magnetic encoder to reduce magnetic field components associated with the first axis.
    Type: Grant
    Filed: June 8, 2010
    Date of Patent: October 27, 2015
    Assignee: Infineon Technologies AG
    Inventor: James William Sterling
  • Patent number: 9103657
    Abstract: A magnetic field sensor system for measuring rotational movements of a shaft is disclosed. The sensor system includes a biasing magnet configured for generating a biasing magnetic field and a magnetic wheel having a wheel axis and a circumferential surface which comprises a regular structure of teeth and gaps arranged in an alternating manner. The magnetic wheel is attachable to the shaft and is magnetizable by the biasing magnetic field. A magnetoresistive sensor arrangement comprising four magnetoresistive sensor elements being connected with each other in a Wheatstone bridge, respectively two of the magnetoresistive sensor elements being assigned to one half bridge of the Wheatstone bridge. The four magnetoresistive sensor elements are arranged within an x-y plane.
    Type: Grant
    Filed: September 4, 2013
    Date of Patent: August 11, 2015
    Assignee: NXP B.V.
    Inventors: Jacobus Josephus Maria Ruigrok, Alexe Levan Nazarian, Frederik Willem Maurits Vanhelmont
  • Patent number: 8884613
    Abstract: A water-chamber working apparatus 1 according to the present invention includes a movable body that can move along a tube plate 12 of a steam generator 10, an extendable member 21 that extends and retracts in a direction in which a first coupling portion 21d approach each other and a direction in which these portions move away from each other, where the first coupling portion 21d is attached to a maintenance hatch 15 via a first joint 23a including two rotation axes intersecting with each other, and the second coupling portion 21e is attached to the movable body via a second joint 23b including two rotation axes intersecting with each other, which are different from the rotation axes of the first joint 23a.
    Type: Grant
    Filed: January 19, 2011
    Date of Patent: November 11, 2014
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventor: Jun Fujita
  • Patent number: 8878527
    Abstract: A system for testing a magnetic sensor has a plurality of coils, wherein the coils are positioned along perpendicular planes. A magnetic field is generated along each of the perpendicular planes when a current is sent to each of the plurality of coils.
    Type: Grant
    Filed: November 29, 2010
    Date of Patent: November 4, 2014
    Assignee: Amkor Technology, Inc.
    Inventors: Raimondo Sessego, Gerard John, Pete Duchine
  • Publication number: 20140311547
    Abstract: The invention proposes: a distributor measuring box (2) designed to be installed on a photovoltaic solar module (40), having a housing with a support section (3) embodied to be supported on the solar module, an encompassing side wall, and a cover, and string line feedthroughs (4a) and/or string line connectors (4b), and having a string current measuring module (1) that includes a measuring component (30, 30a, 30b, 30c) and an evaluation unit (20) for measuring the string current in the distributor measuring box (2); a photovoltaic solar module having a plurality of solar cells, in which a distributor measuring box (2) is mounted to the back of the solar module (40) oriented away from the sun; and a photovoltaic system having a plurality of photovoltaic solar modules (40), having a plurality of string lines (10, 10a, 12), having a generator junction box, and having at least one inverter for supplying the electrical power produced by the photovoltaic generator.
    Type: Application
    Filed: August 14, 2012
    Publication date: October 23, 2014
    Applicant: PHOENIX CONTACT GMBH & CO. KG
    Inventor: Carston Thoerner
  • Patent number: 8847586
    Abstract: A magnetic sensor inspection apparatus has a rectangular frame including a stage, a probe card, and a plurality of magnetic field generating coils. A wafer-like array of magnetic sensors is mounted on the stage, which is movable in horizontal and vertical directions. The probe card includes a plurality of probes which are brought into contact with a plurality of magnetic sensors encompassed in a measurement area. The magnetic field generating coils are driven to generate a magnetic field toward the stage. A plurality of magnetic field environment measuring sensors is arranged in the peripheral portion of the probe card surrounding the probes. A magnetic field controller controls magnetic fields generated by the magnetic field generating coils based on the measurement result of the magnetic field environment measuring sensors. Thus, it is possible to concurrently inspect a wafer-like array of magnetic sensors with the probe card.
    Type: Grant
    Filed: August 8, 2012
    Date of Patent: September 30, 2014
    Assignee: Yamaha Corporation
    Inventor: Takashi Suzuki
  • Patent number: 8704514
    Abstract: An integrated circuit includes a semiconductor die including a first magnetic field sensor. The integrated circuit includes an isolation material layer over the first magnetic field sensor and a sintered metal layer over the isolation material layer. The first magnetic field sensor is configured to sense a magnetic field generated by a current passing through the sintered metal layer.
    Type: Grant
    Filed: February 11, 2010
    Date of Patent: April 22, 2014
    Assignee: Infineon Technologies AG
    Inventors: Mario Motz, Udo Ausserlechner, Martin Mischitz
  • Patent number: 8680851
    Abstract: A facility for generating a detection signal upon the presence of metallic-conductive parts in a conveyed flow that is at least largely non-conductive, in which, for example, an alternating electromagnetic field is established in a section of the conveyed flow to be monitored by means of an alternating current generator and a transmitter coil system, whereby a variation of the signal of said field that is triggered by passage of a part is detected by a receiver coil system and converted into a detection signal by an analytical circuit. The individual components of the system are distributed over separate circuit modules which in turn act in concert by means of a bus system.
    Type: Grant
    Filed: April 22, 2009
    Date of Patent: March 25, 2014
    Assignee: Mesutronic Gerätebau GmbH
    Inventor: Manfred Artinger
  • Patent number: 8680852
    Abstract: A method of detecting defects using eddy currents is disclosed. The method comprises: exciting eddy currents in a test material using an eddy current probe driven by a drive signal; detecting induced eddy currents in the test material; converting the detected signal into integer values using an analog to digital converter; and adding or subtracting the generated integer values to or from each of two accumulators, or taking no action, so that one accumulator produces a value proportional to one component of the detected signal and the other produces a value proportional to another component of the detected signal and using these values to detect the presence of a defect.
    Type: Grant
    Filed: February 6, 2009
    Date of Patent: March 25, 2014
    Assignee: GE Inspection Technologies Ltd.
    Inventors: Alan Daly, Xiaoyu Qiao, Ian Christopher Mayes, John Hansen
  • Patent number: 8653824
    Abstract: A method for quasi-static testing a magnetic recording head read sensor is described. The method includes applying a first voltage to a heater in the magnetic recording head and measuring an output of the magnetic recording head read sensor while applying the first voltage to the heater and recording the measured output as a first set of measurements. The method further includes applying a second voltage to the heater in the magnetic recording head and measuring the output of the magnetic recording head read sensor while applying the second voltage to the heater and recording the measured output as a second set of measurements. The first and second sets of measurements are then compared.
    Type: Grant
    Filed: December 16, 2009
    Date of Patent: February 18, 2014
    Assignee: Western Digital (Fremont), LLC
    Inventors: Feng Liu, Mehran Zargari
  • Patent number: 8604781
    Abstract: There are provided a crack determining device capable of determining, in real time and with precision, the fact that a crack has occurred in a solder layer, and a semiconductor device comprising same.
    Type: Grant
    Filed: June 9, 2010
    Date of Patent: December 10, 2013
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventor: Hisamitsu Toshida
  • Patent number: 8502529
    Abstract: Provided is a magnetic sensor device capable of suppressing a variation in determination for detection or canceling of a magnetic field intensity, which is caused by noise generated from respective constituent elements included in the magnetic sensor device and external noise, to thereby achieve high-precision magnetic reading. The magnetic sensor device includes: a first D-type flip-flop and a second D-type flip-flop each having an input terminal connected to an output terminal of a comparator; an XOR circuit having a first input terminal and a second input terminal which are connected to an output terminal of the first D-type flip-flop and an output terminal of the second D-type flip-flop, respectively; a selector circuit; and a third D-type flip-flop having an input terminal connected to an output terminal of the selector circuit.
    Type: Grant
    Filed: November 30, 2010
    Date of Patent: August 6, 2013
    Assignee: Seiko Instruments Inc.
    Inventors: Daisuke Muraoka, Minoru Ariyama, Tomoki Hikichi, Manabu Fujimura
  • Patent number: 8314713
    Abstract: A method for monitoring the operation of a metal detection system that comprises a balanced coil system with a transmitter coil that is connected to a transmitter unit, which provides transmitter signals having a fixed or variable transmitter frequency, and with a first and a second receiver coil that provide output signals to a receiver unit. A system adapted to operate according to an exemplary method is also provided. According to one embodiment, a carrier signal having the transmitter frequency and a monitoring signal having a monitoring frequency are provided to a modulation unit that suppresses the carrier signal and provides a modulated monitoring signal, which is supplied to a monitoring coil that is inductively coupled with at least one of the receiver coils, whose output signals are demodulated in a demodulation unit that provides a demodulated monitoring signal, which is compared in phase and/or in amplitude with a reference.
    Type: Grant
    Filed: September 21, 2011
    Date of Patent: November 20, 2012
    Assignee: Mettler-Toledo Safeline Limited
    Inventor: Stephen McAdam
  • Publication number: 20120200288
    Abstract: The present invention relates to a hall-effect measuring apparatus for measuring characteristic values of a semiconductor using hall-effect. In an embodiment of the present invention, the hall-effect measuring apparatus for measuring characteristic values of a semiconductor sample using hall-effect comprises a magnetic flux density applying device for accommodating a sample holder where the sample is set therein and moving permanent magnets by an electric motor installed at one side thereof to form a certain magnetic field at the sample; and a sample temperature control means for setting temperature of the sample by controlling temperature of the sample holder, in which current is applied to the sample, and hall voltage outputted from the sample is measured.
    Type: Application
    Filed: November 11, 2009
    Publication date: August 9, 2012
    Inventors: Suk Whan Jung, Geun Taek Lee, Young Kyu Park, Ahn Su Lee
  • Patent number: 8237433
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Grant
    Filed: January 19, 2011
    Date of Patent: August 7, 2012
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein
  • Publication number: 20120098531
    Abstract: A device for testing to detect defects at a surface or at shallow depth in a part, for example a blade root for an airplane engine fan. The device includes a probe including a sensor, the probe being hinge-mounted to the end of a handle, a guide presenting a reference surface, and a mechanism adjusting the position of the guide parallel to an axis of the handle.
    Type: Application
    Filed: June 8, 2010
    Publication date: April 26, 2012
    Applicant: SNECMA
    Inventors: Christian Armand Marceau, Andre Rouff
  • Patent number: 8148976
    Abstract: The invention relates to a method and arrangement for the contactless determination of conductivity-influencing properties and their spatial distribution over the entire cross section of an electrically conductive substance moving in a primary magnetic field (B). The substance may be a liquid or a solid. A simultaneous measurement of a number of mechanical state parameters of the magnetic system is performed (three-dimensional components of the force and the torque), said parameters being variable by the effect of a secondary field on the magnetic system, the secondary field being produced on the basis of eddy currents induced in the substance by the primary field (B). To determine the spatial distribution of the property that is sought, the primary field is changed in intensity or form a number of times and a measurement of the state parameters is carried out for each change.
    Type: Grant
    Filed: September 21, 2006
    Date of Patent: April 3, 2012
    Assignee: Technische Universitat Ilmenau
    Inventors: André Thess, Yuri Kolesnikov, Christian Karcher
  • Patent number: 8063631
    Abstract: A device for non destructive evaluation of defects in a metallic object (2) by eddy currents, comprises a field emitter (3) for emitting an alternating electromagnetic field at a first frequency fi in the neighborhood of the metallic object (2), and a magnetoresistive sensor (1) for detecting a response signal constituted by a return electromagnetic field which is re-emitted by eddy currents induced by the alternating electromagnetic field in the metallic object (2).
    Type: Grant
    Filed: February 24, 2006
    Date of Patent: November 22, 2011
    Assignee: Commissariat a l'Energie Atomique et aux Energies Alternatives
    Inventors: Claude Fermon, Myriam Pannetier, Nicolas Biziere, Francois Vacher, Thierry Sollier
  • Patent number: 8035373
    Abstract: It is possible to accurately and stably inspect a scratch in the vicinity of a surface of a cell external case formed by a cylindrical copper plate by using a simple device. The cell external case (1) is rotated around the center axis of the cylindrical shape by a rotation device (2) and a magnetic flux is applied to the rotating cell external case from both ends of a frame (4). When a scratch is present on the cell external case (1), leak magnetic flux is generated which is detected by a magnetic sensor (6) arranged in the vicinity of the cell external case (1) and displayed on a display device (12) via a signal processing device (11). Since the cylindrical cell external case (1) rotates around its center axis, the distance between its surface and the magnetic sensor (6) is not changed and a scratch can be detected stably.
    Type: Grant
    Filed: October 25, 2005
    Date of Patent: October 11, 2011
    Assignee: Toyo Kohan Co., Ltd.
    Inventor: Osami Matsumura
  • Patent number: 7812601
    Abstract: Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.
    Type: Grant
    Filed: June 15, 2009
    Date of Patent: October 12, 2010
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Darrell E. Schlicker, Robert J. Lyons, Mark D. Windoloski, Christopher A. Craven, Vladimir B. Tsukernik, David C. Grundy
  • Patent number: 7759931
    Abstract: The present invention relates to a magnetic impedance measurement device comprising an apply coil for generating an alternate magnetic field of variable frequency, a power source for the apply coil, at least one magnetic sensor means comprising a pair of magnetic sensors for detecting orthogonal vector components of a magnetic field generated from a test object, the vector components being parallel to the face of the apply coil, a measurement means for the magnetic sensor for measuring a detected signal from said magnetic sensor mean, the measurement means being located at a distance from the face of the apply coil and facing the test object, a lock-in amplifier circuit for detecting from an output of the measurement means a signal having the same frequency as the frequency of the apply coil and an analysis means for analyzing intensity and phase changes of an output of the magnetic sensor means with the use of an output signal of the lock-in amplifier circuit.
    Type: Grant
    Filed: March 13, 2006
    Date of Patent: July 20, 2010
    Assignee: National University Corporation, Okayama University
    Inventors: Keiji Tsukada, Toshihiko Kiwa
  • Patent number: 7710111
    Abstract: The present invention nondestructively analyzes the position or corrosion state of a magnetic material present in the interior of a non-magnetic material structure. The magnetic material is magnetized from the outside of the structure, and magnetic flux density of the thus-magnetized magnetic material is measured at the outside of the structure, to thereby specify the position of the magnetic material or to analyze the corrosion state of the magnetic material. The magnetic material is magnetized in two stages. After the position of the magnetic material magnetized through first-stage magnetization is specified through measurement of magnetic flux density of the magnetic material, the magnetic material is demagnetized through application of an alternating magnetic field.
    Type: Grant
    Filed: August 8, 2006
    Date of Patent: May 4, 2010
    Assignee: Kyushu Institute of Technology
    Inventor: Mochimitsu Komori
  • Patent number: 7626383
    Abstract: An RFEC excitation unit and sensor apparatus and method that facilitate detection of cracks or other anomalies within or under a surface and immediately next to an expected structure (such as a rivet) that would otherwise cause a signal change preventing detection of the cracks. In some embodiments, the apparatus includes actuators and control that move the apparatus and analyze sensed RFEC signals to determine the location of the rivet, and then to rotate (mechanically or electronically) the sensed signal and/or excitation signal to maintain a constant relationship to the edge of the rivet in order that signals from the rivet edge are suppressed and signals from the cracks are detected. In some embodiments, the excitation unit is maintained at the center of the rivet surface, and the sensor is moved around the rivet in a circle centered on the rivet.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: December 1, 2009
    Assignee: Innovative Materials Testing Technologies, Inc.
    Inventors: Yushi Sun, Tianhe Ouyang
  • Patent number: 7598736
    Abstract: An integrated circuit includes two first adjacent magneto-resistive effect (xMR) structures. Each first xMR structure is configured to sense a first magnetic field direction. The integrated circuit includes two second adjacent xMR structures at a distance from the two first xMR structures. Each second xMR structure is configured to sense a second magnetic field direction. The two first xMR structures and the two second xMR structures are configured for in-plane magnetic field components perpendicular to the first magnetic field and the second magnetic field and phase shifted by approximately 90° from the first magnetic field and the second magnetic field acting on the two first xMR structures and the two second xMR structures.
    Type: Grant
    Filed: August 27, 2007
    Date of Patent: October 6, 2009
    Assignee: Infineon Technologies AG
    Inventors: Jürgen Zimmer, Klemens Prügl
  • Patent number: H2278
    Abstract: A wire rope tester including a magnetic testing device; the wire rope tester includes a Remote Data Recorder mounted on a sensor head of the magnetic testing device.
    Type: Grant
    Filed: March 2, 2011
    Date of Patent: July 2, 2013
    Assignee: The United States of America, as represented by the Secretary of the Navy
    Inventor: Larry Dean Underbakke