Using Time Measuring Patents (Class 324/532)
  • Patent number: 11531051
    Abstract: A method identifies a location of a fault on a faulty line of an electrical power supply network having a plurality of lines, a plurality of inner nodes, and at least three outer nodes. The outer nodes each bound a line and are provided with measurement devices which are used to measure high-frequency current and/or voltage signals. To locate faults, one of the outer nodes is selected as the starting node for the search for the fault location. Starting from the starting node, paths to the other outer nodes are determined, and that those paths on which the fault location could be located are selected. A line on which the fault location could be located, in principle, is identified for each of the selected paths using the respective times at which the traveling waves arrive, and a potential fault location is determined for the respectively identified line.
    Type: Grant
    Filed: August 13, 2021
    Date of Patent: December 20, 2022
    Assignee: Siemens Aktiengesellschaft
    Inventors: Cezary Dzienis, Andreas Jurisch, Igor Kogan
  • Patent number: 11428732
    Abstract: A deskew fixture includes first and second deskew probe points for contacting first and second probes, respectively, during deskew calibration, a signal generating circuit for generating a calibration signal provided to the first and second deskew probe points, and a feedback loop for automatically self-calibrating the deskew fixture. The feedback loop includes first and second analog to digital converters (ADCs) for digitizing the calibration signal at the first and second deskew probe points while contacting the first and second probes, respectively, to provide first and second digitized calibration signals, and a processing unit programmed to determine inherent skew of the deskew fixture between the first and second skew probe points using the first and second digitized calibration signals, and to provide the determined inherent skew to a test instrument for use in the deskew calibration of the first and second probes.
    Type: Grant
    Filed: August 28, 2019
    Date of Patent: August 30, 2022
    Assignee: Keysight Technologies, Inc.
    Inventor: Edward Vernon Brush
  • Patent number: 11372040
    Abstract: A method and arrangement for detecting partial discharges in an electric operating device, wherein electromagnetic pulses are detected by means of a sensor device, a narrow frequency band from a frequency spectrum of the electromagnetic pulses is selected by a filter device, the narrow frequency band is amplified by an amplifier device, and signals contained in the narrow frequency band are compared with a threshold value for the amplitude by an evaluation device, wherein a partial discharge is identified in the event that the threshold value is exceeded.
    Type: Grant
    Filed: September 19, 2018
    Date of Patent: June 28, 2022
    Assignee: SIEMENS ENERGY GLOBAL GMBH & CO. KG
    Inventor: Anton Wiedenbauer
  • Patent number: 11103735
    Abstract: A corrosion monitoring system of a fire protection system includes at least one first antenna and a processing circuit. The at least one first antenna receives a radio frequency (RF) signal through an internal volume of at least one pipe of the fire protection system. The processing circuit includes one or more processors and memory including computer-readable instructions that when executed by the one or more processors, cause the one or more processors to determine a signature of the RF signal, compare the signature to an expected signature, and determine, based on the comparison, that corrosion in the at least one pipe has occurred.
    Type: Grant
    Filed: February 11, 2019
    Date of Patent: August 31, 2021
    Assignee: Tyco Fire Products LP
    Inventors: Steve Edward Trivelpiece, Craig Evan Trivelpiece
  • Patent number: 11061099
    Abstract: Illustrative systems and methods disclosed herein pertain to calibrating a wafer inspection apparatus. In one exemplary embodiment, a calibration system includes a wafer emulator in the form of a substrate having a first porthole extending from a bottom major surface of the substrate to a top major surface of the substrate. The first porthole accommodates a fixture that holds an optical fiber such that a proximal end of the optical fiber is coplanar to the top major surface of the substrate. The optical fiber has a light emitting profile that emulates a beam profile of a semiconductor laser element. A laser transmitter is coupled to a distal end of the optical fiber and propagates a laser beam through the optical fiber and out of the proximal end of the optical fiber. The wafer inspection apparatus is arranged to receive the laser beam and use the laser beam for calibration purposes.
    Type: Grant
    Filed: July 9, 2019
    Date of Patent: July 13, 2021
    Assignee: Keysight Technologies, Inc.
    Inventor: Douglas Michael Baney
  • Patent number: 11061062
    Abstract: The invention provides an Intelligent Electronic Device (IED) and a method for locating a fault in a power transmission line with the IED. The method comprises measuring arrival times of a first, second and third peak of a travelling wave, using measurements obtained with one or more measurement equipment connected with the power transmission line. The method further comprises generating two or more initial estimates for the location of the fault, estimating time of initiation of the travelling wave, and estimating an arrival time of the third peak. The estimated arrival time of the third peak is compared with the measured arrival time of the third peak, to select an initial estimate of the two or more initial estimates as the location of the fault.
    Type: Grant
    Filed: April 20, 2017
    Date of Patent: July 13, 2021
    Assignee: ABB Power Grids Switzerland AG
    Inventors: Obbalareddi Demudu Naidu, Neethu George, Sachin Srivastava
  • Patent number: 10923005
    Abstract: The present disclosure relates to the field of display technologies and provides a display panel and a display apparatus for improving the accuracy of test signals acquired in a VT test. The display panel includes a base substrate. The base substrate is provided with a plurality of test leads in a non-display area, and the plurality of test leads includes a circuit board lead and a test point lead. The base substrate is also provided with a test pad and a test circuit board pin in the non-display area. The circuit board lead is electrically connected to the test circuit board pin, the test point lead is electrically connected to the test pad, and the test pad being reused as a circuit board alignment mark.
    Type: Grant
    Filed: May 6, 2019
    Date of Patent: February 16, 2021
    Assignee: Xiamen Tianma Micro-Electronics Co., Ltd.
    Inventors: Rucuo Wei, Qiang Tian, Xiangzi Kong, Bojia Lv
  • Patent number: 10372569
    Abstract: A system for detecting false data injection attacks includes one or more sensors configured to each monitor a component and generate signals representing measurement data associated with the component. The system also includes a fault detection computer device configured to: receive the signals representing measurement data from the one or more sensors, receive a fault indication of a fault associated with the component, generate a profile for the component based on the measurement data, and determine an accuracy of the fault indication based upon the generated profile.
    Type: Grant
    Filed: July 25, 2016
    Date of Patent: August 6, 2019
    Assignee: General Electric Company
    Inventors: William James Premerlani, Chaitanya Ashok Baone, Yan Pan
  • Patent number: 10162002
    Abstract: Embodiments herein discuss tuning a testing apparatus to better match the input response of a target system in which a cable will be used. For example, conductors in the cable may have a different skew depending on the system in which they are used. The testing apparatus may be tuned using frequency information regarding the type of signals that will be driven on the cable when installed in the target system. In one embodiment, the testing apparatus uses the frequency information to configure a programmable clock source that can be used to shape a reference clock and control a driver to match the signals in the target system. Using the clock source to modify the reference clock results in the driver outputting a testing signal that better reflects the actual signals that will be transmitted on the cable in the target system.
    Type: Grant
    Filed: July 20, 2015
    Date of Patent: December 25, 2018
    Assignee: International Business Machines Corporation
    Inventors: Layne A. Berge, Benjamin A. Fox, Wesley D. Martin, David W. Siljenberg, George R. Zettles, IV
  • Patent number: 9989581
    Abstract: Methods and devices for locating partial discharges in electric cables with a high-voltage source coupled to the cable to be tested, a decoupling unit connected to an end of the cable and a data-processing system that is connected via a sensor unit to the decoupling unit and that detects a partial discharge or partial discharges when they exist from the sensor signals. The methods and devices particularly distinguish themselves by a short evaluation duration for the locating process. This is done by detecting events, parameterizing the events identified as pulses, formation of pairs of the events identified as pulses and parameterized, classification of the event pairs, assignment of a partial discharge from the classification and determination of the location of the partial discharge(s) from the different in transit times between the respective partial discharge and its accompanying reflection.
    Type: Grant
    Filed: November 17, 2014
    Date of Patent: June 5, 2018
    Assignee: Hagenuk KMT Kabelmesstechnik GmbH
    Inventors: Sacha Markalous, Marco Küttner
  • Patent number: 9970841
    Abstract: A method for monitoring a civil engineering construction including a first metal reinforcement and a reference conductor element. The first metal reinforcement and the reference conductor being separated by dielectric material and each having a first end that is electrically accessible. The method including injecting an incident electrical signal which is applied differentially between the first ends of the first reinforcement and of the reference conductor element collecting reflected signals returning along the conductors in return, and analyzing the reflected signals by comparing them against reference signals in order to determine any potential structural defect in the first reinforcement.
    Type: Grant
    Filed: December 18, 2013
    Date of Patent: May 15, 2018
    Assignees: SOLETANCHE FREYSSINET, INSTITUT FRANCAIS DES SCIENCES ET TECHNOLOGIES DES TRANSPORTS DE L'AMENAGEMENT ET DES RESEAUX
    Inventors: Frédéric Taillade, Gilles Hovhanessian, Nicolas Freitag
  • Patent number: 9954546
    Abstract: An automated test equipment for analyzing an analog time domain output signal of an electronic device under test includes: an analog-to-digital converter configured for converting an analog time domain signal; a sampling clock configured for producing a clock signal; a time-to-frequency converter configured for converting the digital time domain signal into a digital frequency domain signal so that the digital frequency domain signal is represented by frequency bins; a memory device configured for storing a set of empirically determined operating parameters; and a jitter components removal module for removing jitter components produced by the analog-to-digital converter, wherein the jitter removal module is configured for subtracting the lower spur and the upper spur of each frequency bin of the frequency bins from the digital frequency domain signal so that the cleaned digital frequency domain signal is produced.
    Type: Grant
    Filed: May 24, 2017
    Date of Patent: April 24, 2018
    Assignee: ADVANTEST CORPORATION
    Inventor: Bernd Laquai
  • Patent number: 9880212
    Abstract: A method and device for diagnosing an electrical condition of a spatially extended hardware component in a spatially resolved manner via interference between pulses fed into the component by a signal generator. The method includes: feeding at least two pulses into the component offset by a pulse interval; detecting the interfered pulses and echoes via an analysis unit; varying the pulse interval for the spatially resolved scanning of the hardware component along its length; repeating the steps until the component has been scanned at least in some sections; and analyzing the detected interfered pulses in the analysis unit. The device includes at least one signal generator connected to the component and to an analysis unit to generate the pulses, wherein local energy losses are mathematically determined over the length of the component on the basis of a plurality of interference voltage waveforms and voltage waveforms induced by the pulses.
    Type: Grant
    Filed: April 10, 2015
    Date of Patent: January 30, 2018
    Assignee: Friedrich-Alexander-Universitaet Erlangen Nuernberg
    Inventors: Christian Weindl, Erik Fischer
  • Patent number: 9864007
    Abstract: Embedded processor-based self-test and diagnosis using the compressed test data is described for ICs having on-chip memory. Techniques for compressing the test data before the compressed test data is transferred to a device under test (DUT) are also described. A modified LZ77 algorithm can be used to compress strings of test data in which don't care bits are handled by assigning a value to the don't care bits according to a longest match in the window as the data is being encoded. The compressed test data can be decompressed at the DUT using a software program transferred by the automated test equipment (ATE) to the DUT with the compressed test data. Decompression and diagnostics can be carried out at the DUT using an embedded processor and the on-chip memory. Results from the diagnostics can be read by the ATE.
    Type: Grant
    Filed: April 30, 2014
    Date of Patent: January 9, 2018
    Assignee: Duke University
    Inventors: Sergej Deutsch, Krishnendu Chakrabarty
  • Patent number: 9838679
    Abstract: A TDR technique for performing in-service distance-to-fault measurements in cable TV networks is disclosed. Using a cable network tester configured to generate chirped probe pulses and to perform pulse-matched filtering and averaging of received echoes, network faults may be detected without interfering with the downstream reception. The probe pulse transmission may be timed to take advantage of the error correction coding in the network.
    Type: Grant
    Filed: July 28, 2015
    Date of Patent: December 5, 2017
    Assignee: VIAVI SOLUTIONS INC.
    Inventors: Kyle Harris, Daniel K. Chappell
  • Patent number: 9806801
    Abstract: Systems and methods for in-service optical fault isolation on a link between a first node and a second node include transmitting counters between each of the first node and the second node; determining associated values for the counters responsive to an event associated with the link; and determining a location of the event based on the associated values for the counters. The determining includes converting time differences between the counters into distance, based on propagation speed of a signal over optical fiber forming the link. The location is determined in-service based on a single occurrence of the event without external equipment.
    Type: Grant
    Filed: November 3, 2015
    Date of Patent: October 31, 2017
    Assignee: Ciena Corporation
    Inventor: Eric Maniloff
  • Patent number: 9658273
    Abstract: Provided is a method of accurately detecting the location of a partial discharge in a power device. For this purpose, the present invention measures sequential positions of arrival of partial discharge signals and the differences in the time of arrival between the partial discharge signals with respect to a plurality of partial discharge sensors installed on the outside surface of a power device, divides the power device into a plurality of spatial sections, determines a spatial section where the location of a partial discharge is present using the sequential positions of arrival of the partial discharge signals, calculates the representative location value of the determined spatial section, and determines compensation values for the differences in the time of arrival to be applied with respect to the respective spatial sections.
    Type: Grant
    Filed: October 2, 2013
    Date of Patent: May 23, 2017
    Assignee: HYOSUNG CORPORATION
    Inventors: Kyung Rok Hwang, Jae Ryong Jung, Young Min Kim
  • Patent number: 9485353
    Abstract: The present invention refers to a method and device for detecting a bridged tap within a telecommunication line. In order to reliably detect bridged taps of different types, in particular wire pair bridged taps and single wire bridged taps, and/or to determine a type of each detected bridged tap the method includes determining first transfer function data that characterize an actual transfer function of the telecommunication line; detecting the bridged tap depending on the first transfer function data; simulating the telecommunication line based on a result of the detecting; and identifying the type of the bridged tap by comparing results of the simulating with the first transfer function data.
    Type: Grant
    Filed: May 22, 2013
    Date of Patent: November 1, 2016
    Assignee: Alcatel Lucent
    Inventors: Xavier Dardenne, Benoît Drooghaag
  • Patent number: 9068442
    Abstract: A string of subs includes a controller sub. The controller sub includes a first end, a second end, a controller, a first controller bus coupled to the controller, the first controller bus exiting at the first end of the controller sub, and a second controller bus coupled to the controller, the second controller bus being separate from the first controller bus, the second controller bus exiting at the second end of the controller sub. The string of subs also includes a first measuring sub and a second measuring sub. A process, running on a computer, discovers that the first measuring sub is connected to the first controller bus, discovers that the second measuring sub is connected to the first controller bus, determines that the first measuring sub is physically closer to the controller sub than the second measuring sub, and use the fact that the first measuring sub is physically closer to the controller sub than the second measuring sub in controlling the operation of the string of subs.
    Type: Grant
    Filed: May 13, 2010
    Date of Patent: June 30, 2015
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Christopher Golla, Laban Marsh
  • Patent number: 8963558
    Abstract: A current differential protection system for a multi-terminal power line includes a current sensor for sensing a current at a local terminal, a controller for time synchronizing the local terminal and remote terminals, and a fault detection module to detect a fault in the multi-terminal power line if a differential current exceeds a threshold value. The controller includes a time measurement exchange module for exchanging time stamp data with remote terminals, an upper range clock for exchanging time stamp data with remote terminals and a lower range clock for indexing the current at the local terminal. A first time period of the upper range clock is N times a second time period of the lower range clock where N is a number of multi-terminals. The controller includes a clock offset calculation module for determining an average time offset based on time stamp data from remote terminals and the local terminal.
    Type: Grant
    Filed: October 31, 2012
    Date of Patent: February 24, 2015
    Assignee: General Electric Company
    Inventors: Yan Pan, William James Premerlani
  • Patent number: 8922224
    Abstract: An electronic system having a high speed signaling bus requiring training (calibration) of a calibrated item in a driver circuitry or a receiver circuitry for reliable operation. At manufacturing or in a secure location, secure calibration coefficients are determined for the electronic system and are stored in a non-volatile storage. During operation, the high speed signaling bus may be re-calibrated, resulting in a new currently active calibration coefficient for the calibrated item. A coefficient watchdog checks a new coefficient value selected by the re-calibration at present environmental conditions such as voltage and temperature against the secure calibration coefficients. If the new calibration coefficient value is the same as a calibration coefficient value in an acceptably close secure calibration coefficient, the new calibration coefficient is accepted; if not, a potentially probed warning is created by the coefficient watchdog.
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: December 30, 2014
    Assignee: Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
    Inventors: Ronald L. Billau, Roger J. Gravrok, Brian G. Holthaus, Darryl Solie
  • Patent number: 8854049
    Abstract: A timer unit includes a timer for timing the period of time the logic circuit has been in the self-test mode. A comparator is connected to the timer, for comparing the period of time with a maximum for the period of time the logic circuit is allowed to be in the self-test mode and outputting an error signal when the period of time exceeds the maximum. The test timer unit further includes a mode detector for detecting a switching of the logic circuit to the self-test mode. The mode detector is connected to the timer, for starting the timer upon the switching to the self-test mode and stopping the timer upon a switching of the logic circuit out of the self-test mode. The timer unit can be used in a system for testing a logic circuit which includes a test routine module containing a set of instructions which forms a test routine for performing a test on a tested part of the logic circuit.
    Type: Grant
    Filed: September 25, 2007
    Date of Patent: October 7, 2014
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Florian Bogenberger, Leos Chalupa
  • Patent number: 8823447
    Abstract: Systems, methods, and computer readable media that can mitigate the effects of semiconductor aging in a semiconductor device are described. Traditional methods of mitigating semiconductor aging can be wasteful since they overcorrect for aging using a high operational voltage. The approach discussed herein steps up the operational voltage for the electronic device with time based on predetermined aging models. This allows power consumption by the electronic device, particularly early in the designed operational life, to be much less than it would otherwise be.
    Type: Grant
    Filed: December 20, 2011
    Date of Patent: September 2, 2014
    Assignee: Broadcom Corporation
    Inventor: Anatoly Gelman
  • Patent number: 8810253
    Abstract: Embodiments of methods and apparatuses for characterizing an electrical power distribution system are disclosed. One method includes applying a plurality of test signals to a first plurality of test points of the electrical power distribution system, measuring a plurality of response signals at a second plurality of test points of the electrical distribution system, deriving a characterization matrix for the electrical power distribution system from the plurality of test signals and response signals, and characterizing the electrical power distribution system based on the derived characterization matrix.
    Type: Grant
    Filed: March 18, 2012
    Date of Patent: August 19, 2014
    Inventors: Thomas L. Marzetta, Bertrand M. Hochwald
  • Patent number: 8773140
    Abstract: A system for inspection of electrical circuits including a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein.
    Type: Grant
    Filed: July 26, 2011
    Date of Patent: July 8, 2014
    Assignee: Photon Dynamics, Inc
    Inventors: Sam-Soo Jung, Raul Martin
  • Patent number: 8680884
    Abstract: A circuit for detecting fault conditions in a supply circuit includes a monitoring circuit and a comparator circuit. The monitoring circuit is operable to output a detection signal related to a control signal for the switched mode power supply. The control signal may be configured to operate at least one switch of the supply circuit between alternating activated and deactivated states to supply power to a load. The comparator circuit is operable to compare the detection signal to a range defined by first and second thresholds and output a fault signal according to a relationship of the detection signal to the range over a time period. Related methods of operation are also discussed.
    Type: Grant
    Filed: April 8, 2010
    Date of Patent: March 25, 2014
    Assignee: Cree, Inc.
    Inventor: Joseph Paul Chobot
  • Publication number: 20140062497
    Abstract: A method and an apparatus are provided to reduce or eliminate interference signals that have been additively superimposed on a useful signal for locating a cable sheathing fault of a buried electrical cable. A correction unit includes a filter, a delay device and/or a DC component estimator. The correction unit automatically determines a transient interference signal and a DC offset voltage component that have been superimposed on the useful signal as received in an input signal of the correction unit, and then subtracts these determined interference signals from the input signal to provide the interference-free or interference-suppressed useful signal as the output.
    Type: Application
    Filed: July 31, 2013
    Publication date: March 6, 2014
    Applicant: Hagenuk KMT Kabelmesstechnik GmbH
    Inventors: Marco STEPHAN, Marco KUETTNER, Rainer PURSCHWITZ
  • Patent number: 8664950
    Abstract: A method for measuring longitudinal bias magnetic field in a tunnel magnetoresistive sensor of a magnetic head, the method includes the steps of: applying an external longitudinal time-changing magnetic field onto the tunnel magnetoresistive sensor; determining a shield saturation value of the tunnel magnetoresistive sensor under the application of the external longitudinal time-changing magnetic field; applying an external transverse time-changing magnetic field and an external longitudinal DC magnetic field onto the tunnel magnetoresistive sensor; determining a plurality of different output amplitudes under the application of the external transverse time-changing magnetic field and the application of different field strength values of the external longitudinal DC magnetic field; plotting a graph according to the different output amplitudes and the different field strength values; and determining the strength of the longitudinal bias magnetic field according to the graph and the shield saturation value.
    Type: Grant
    Filed: July 1, 2011
    Date of Patent: March 4, 2014
    Assignee: SAE Magnetics (H.K.) Ltd.
    Inventors: Siuman Mok, Hokei Lam, Cheukwing Leung, Juren Ding, Rongkwang Ni, Wanyin Kwan, Cheukman Lui, Chiuming Lueng
  • Publication number: 20140043035
    Abstract: This invention concerns methods and devices for calibrating a partial discharge measuring device and for locating faults on cables. In the method, calibration signals, which can include a band-limited white noise, are used with a periodically repeated signal course. By averaging over a predetermined period duration (T) of the calibration signal, it is possible, in the case of a partial discharge measurement, to recalibrate the measuring device continuously during the measurement, and additionally on cables to determine the fault location with great precision.
    Type: Application
    Filed: October 16, 2013
    Publication date: February 13, 2014
    Applicant: OMICRON ELECTRONICS GMBH
    Inventors: Ulrich Klapper, Harald Emanuel, Caspar Steineke
  • Patent number: 8633705
    Abstract: Embodiments of methods and apparatuses for characterizing an electrical power distribution system are disclosed. One method includes applying, by at least one test/response unit, at least one test signal to at least one test point of the system, measuring, by a plurality of test/response units, a plurality of response signals at a plurality of test points, wherein the plurality of response signals are generated in response to the at least one test signal, and characterizing the system based on the plurality of response signals.
    Type: Grant
    Filed: March 17, 2013
    Date of Patent: January 21, 2014
    Inventors: Bertrand M. Hochwald, Thomas L. Marzetta
  • Patent number: 8564302
    Abstract: The test instrument is used to perform both time domain reflectometry (TDR) and analysis of transmission signals on a line under test. Further, the test instrument provides for both pulse TDR and step TDR. A coupling transformer having an enhanced low frequency response provides for coupling of the test instrument to the line under test. Isolation circuits between the coupling transformer and the line under test to prevent damage to the test instrument due to voltages on the line under test allow the test instrument to be used in connection with an active line under test. Two isolation circuits are utilized to maintain longitudinal balance of the circuit. During step TDR, the positive and negative transmitter circuits provide step-shaped impulse signals.
    Type: Grant
    Filed: July 16, 2010
    Date of Patent: October 22, 2013
    Assignee: Greenlee Textron Inc.
    Inventor: Thomas W. Durston
  • Patent number: 8552739
    Abstract: In an electronic device and a method of correcting time-domain reflectometers, two channels of a time-domain reflectometer are connected to a corrector using cables, and the two channels are enabled to transmit pulses. Parameters Step Deskew and Channel Deskew of the two channels are zeroed. Resistance values of the two channels are measured simultaneously, and the value of the parameter Step Deskew of one of the two channels is adjusted according to the Resistance values of the two channels. Times of achieving the same resistance value of the two channels are measured after the cables and the connector have been disconnected, and the value of the parameter Channel Deskew of one of the two channels is adjusted according to the times of achieving the same resistance value. The adjusted values of the parameters Step Deskew and Channel Deskew are displayed through a display unit.
    Type: Grant
    Filed: March 4, 2011
    Date of Patent: October 8, 2013
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventors: Hsien-Chuan Liang, Shen-Chun Li, Shou-Kuo Hsu
  • Patent number: 8489345
    Abstract: A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
    Type: Grant
    Filed: September 26, 2011
    Date of Patent: July 16, 2013
    Assignee: Rambus Inc.
    Inventors: Haw-Jyh Liaw, Xiangchao Yuan, Mark A. Horowitz
  • Patent number: 8442788
    Abstract: Provided is a measurement apparatus that measures a signal under measurement, including a strobe timing generator that sequentially generates strobes arranged at substantially equal time intervals; a level comparing section that detects a signal level of the signal under measurement at a timing of each sequentially provided strobe; a capture memory that stores therein a data sequence of the signal levels sequentially detected by the level comparing section; a window function multiplying section that multiplies the data sequence by a window function; a frequency domain converting section that converts the data sequence multiplied by the window function into a spectrum in the frequency domain; and an instantaneous phase noise calculating section that calculates instantaneous phase noise on a time axis of the signal under measurement, based on the spectrum.
    Type: Grant
    Filed: August 25, 2008
    Date of Patent: May 14, 2013
    Assignee: Advantest Corporation
    Inventors: Harry Hou, Takahiro Yamaguchi
  • Patent number: 8427169
    Abstract: Embodiments of methods and apparatuses for characterizing an electrical power distribution system are disclosed. One method includes applying at least one test signal to at least one test point of the system, measuring a plurality of response signals at a plurality of test points, wherein the plurality of response signals are generated in response to the at least one test signal, and characterizing the system based on the plurality of response signals. One system includes a plurality of test/response units attached to a plurality of test points, the units configured to generate test signals and/or measure response signals at the test points. At least one controller coordinates application of the test signals and characterizes the electrical network based on the response signals. A communications link allows the test/response units to communicate with the at least one controller.
    Type: Grant
    Filed: September 20, 2010
    Date of Patent: April 23, 2013
    Inventors: Bertrand M. Hochwald, Thomas L. Marzetta
  • Patent number: 8416699
    Abstract: A physical layer device for a network interface, in which the physical layer device includes a cable-test module and a data processing module. The physical layer module is configured to selectively test a cable connected to the physical layer device and to generate test data. The data processing module includes a first processor configured to process the test data and to generate test results indicating a cable status of the cable. The first processor is configured to selectively communicate the cable status to a second processor of a medium access controller.
    Type: Grant
    Filed: September 22, 2010
    Date of Patent: April 9, 2013
    Assignee: Marvell International Ltd.
    Inventor: William Lo
  • Patent number: 8373421
    Abstract: An ambulatory infusion device for infusion of a liquid drug into a patient's body over an extended period of time and methods thereof are disclosed. The device includes a sensor assembly, which produces a sensor assembly output based on an infusion characteristic of the ambulatory infusion device and based on a supply voltage/current, and a supply unit which is coupled to a sensor of the sensor assembly and generates the supply voltage/current. A sensor testing unit detects a failure of the sensor assembly, wherein the sensor testing unit is coupled to the sensor assembly and the supply unit, and the sensor testing unit carries out a sensor testing sequence. The sensor testing sequence includes controlling the supply unit so as to produce a variation of the supply voltage/current, and determining whether the variation of the supply voltage/current produces a corresponding variation of the sensor assembly output.
    Type: Grant
    Filed: April 16, 2010
    Date of Patent: February 12, 2013
    Assignee: Roche Diagnostics International AG
    Inventors: Stefan Lindegger, Reto Schrotberger, Alex Muri
  • Patent number: 8344733
    Abstract: A sample measurement device (110), in which a biosensor (30) having an electrode is mounted, voltage is applied to the electrode, and the concentration of a specific component in a sample deposited on the biosensor (30) is measured, comprises a voltage source (19) configured to apply voltage to the electrode, a time measurement component (22), and a controller (18) configured to control the voltage to be applied and measure the concentration of the specific component. The time measurement component (22) measures a detection time, which is the length of time between the mounting of the biosensor (30) and the deposition of a sample on the biosensor (30). The controller (18) changes a set value for measuring the concentration of a specific component according to the detection time. Consequently, measurement accuracy can be improved regardless of the temperature of the biosensor (30).
    Type: Grant
    Filed: March 27, 2009
    Date of Patent: January 1, 2013
    Assignee: Panasonic Corporation
    Inventors: Toshifumi Nakamura, Teppei Shinno
  • Patent number: 8269505
    Abstract: One embodiment provides a method of locating a short circuit in a printed circuit board. Test signals may be injected at different test points on the circuit board. The distance between each test point and the short circuit may be determined according to how long it takes for a signal reflection at the short circuit to propagate back to each test point. The distances between the various test points and the short circuit can be used to narrow the possible locations of the short circuit or even to pinpoint the location of the short circuit.
    Type: Grant
    Filed: December 15, 2009
    Date of Patent: September 18, 2012
    Assignee: International Business Machines Corporation
    Inventors: Moises Cases, Bhyrav M. Mutnury, Terence Rodrigues
  • Patent number: 8193818
    Abstract: A method of detecting partial corona discharge in a targeted circuit of an electrical apparatus, comprises the steps of: wrapping a Rogowski coil around a leg of the targeted circuit to produce a Rogowski coil signal that represents electrical current rate of change in the leg of the targeted circuit; coupling the Rogowski coil signal to a three-dimensional display device that may represent the dimension of time, the dimension of amplitude as a function of a time, and the dimension of duration of amplitude as a function of time in successive periods of that have a preselected duration; monitoring the display device to detect deviations of the duration of amplitude as a function of time from a normal waveform in the leg of the targeted circuit; and correlating ones of the detected deviations of the duration of amplitude as a function of time from a normal waveform that exceed a preselected deviation level as indicative of partial corona discharge within the targeted circuit.
    Type: Grant
    Filed: January 15, 2009
    Date of Patent: June 5, 2012
    Assignee: Hamilton Sundstrand Corporation
    Inventors: John Horowy, Neal D. Clements
  • Patent number: 8161516
    Abstract: One or more of a topology location test and a distance test are applied to determine if a CPE device has moved in a cable plant. An indication of service fraud is provided if the CPE topology location or distance test indicate an unauthorized CPE device move.
    Type: Grant
    Filed: June 20, 2007
    Date of Patent: April 17, 2012
    Assignee: ARRIS Group, Inc.
    Inventors: Robert F. Cruickshank, III, Marcel F. Schemmann, Steven W. Moyer, Daniel J. Rice
  • Patent number: 8154303
    Abstract: Methods are disclosed for identifying and locating points of impairment in a cable plant, such as that used for cable television (CATV). The methods utilize both known characteristics of signals as well as propagation times in free space and within the cable in conjunction with accurate determination of locations at which measurements are taken. The methods can be applied to both RF cable leaks as well as points of ingress of interference.
    Type: Grant
    Filed: October 10, 2008
    Date of Patent: April 10, 2012
    Inventors: Ben Maxson, Daniel K. Chappell
  • Publication number: 20120068718
    Abstract: Embodiments of methods and apparatuses for characterizing an electrical power distribution system are disclosed. One method includes applying at least one test signal to at least one test point of the system, measuring a plurality of response signals at a plurality of test points, wherein the plurality of response signals are generated in response to the at least one test signal, and characterizing the system based on the plurality of response signals. One system includes a plurality of test/response units attached to a plurality of test points, the units configured to generate test signals and/or measure response signals at the test points. At least one controller coordinates application of the test signals and characterizes the electrical network based on the response signals. A communications link allows the test/response units to communicate with the at least one controller.
    Type: Application
    Filed: September 20, 2010
    Publication date: March 22, 2012
    Inventors: Bertrand M. Hochwald, Thomas L. Marzetta
  • Patent number: 8055458
    Abstract: A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
    Type: Grant
    Filed: May 22, 2009
    Date of Patent: November 8, 2011
    Assignee: Rambus Inc.
    Inventors: Haw-Jyh Liaw, Xiangchao Yuan, Mark A. Horowitz
  • Publication number: 20110204899
    Abstract: This invention concerns a method and devices for calibrating a partial discharge measuring device and for locating faults on cables. In the method, calibration signals, which can include a band-limited white noise, are used with a periodically repeated signal course. By averaging over a predetermined period duration (T) of the calibration signal, it is possible, in the case of a partial discharge measurement, to recalibrate the measuring device continuously during the measurement, and additionally on cables to determine the fault location with great precision.
    Type: Application
    Filed: February 24, 2011
    Publication date: August 25, 2011
    Applicant: OMICRON electronics GmbH
    Inventors: Ulrich Klapper, Harald Emanuel, Caspar Steineke
  • Patent number: 7970565
    Abstract: A measurement apparatus that measures a signal under measurement, including a strobe timing generator that sequentially generates strobes arranged at substantially even time intervals, a level comparing section that detects a signal level of the signal under measurement at a timing of each sequentially provided strobe, a capture memory that stores therein a data sequence of the signal levels sequentially detected by the level comparing section, a frequency domain converting section that converts the data sequence into a spectrum in the frequency domain, and a jitter calculating section that calculates jitter of the signal under measurement based on a value obtained by integrating levels of frequency components in a predetermined frequency range of the spectrum.
    Type: Grant
    Filed: August 25, 2008
    Date of Patent: June 28, 2011
    Assignee: Advantest Corporation
    Inventors: Harry Hou, Takahiro Yamaguchi
  • Patent number: 7915863
    Abstract: A charge protection circuit with a timing function is disclosed. The circuit includes a charge protection module constituting of a second switch, a second capacitor and a control integrated circuit (IC). The second switch Q2 is switched to turn on or turn off to charge or discharge the lithium-ion battery. The second capacitor configured for setting a delay time of a Ct terminal of the control IC, thus to prevent the battery from being overcharged. The circuit further includes a charge timing circuit configured for predetermining a time threshold value. When the charge time reaches the time threshold value, the charge timing circuit outputs a second high level signal to charge the second capacitor. The second capacitor triggers the control IC to turn off the second switch, thereby terminating the charge of the battery body.
    Type: Grant
    Filed: June 23, 2008
    Date of Patent: March 29, 2011
    Assignees: Hong fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Shih-Fang Wong, Tsung-Jen Chuang, Jun-Wei Zhang
  • Patent number: 7855561
    Abstract: A test circuit according to the present invention includes: a synthesis circuit that synthesizes a first test result signal output from a first test target circuit in response to a test instruction, and a second test result signal output from a second test target circuit in response to the test instruction; an inter-block delay generation circuit that delays the second test result signal with respect to the first test result signal; and a test result holding circuit that holds a synthesized test result signal every predetermined timing, the synthesized test result signal being output from the synthesis circuit.
    Type: Grant
    Filed: December 23, 2008
    Date of Patent: December 21, 2010
    Assignee: NEC Electronics Corporation
    Inventor: Kenichi Itoh
  • Patent number: 7856330
    Abstract: A measuring apparatus measures a signal-under-test having a signal level that changes at predetermined bit time intervals. A strobe timing generator sequentially generates strobes at even time intervals. A level comparator detects a level of the signal at a timing at which each strobe is sequentially provided. A capture memory stores a signal level output from the comparator. A signal processor calculates a measurement of the signal based on a data series including data taken at even time intervals, each larger than a bit time interval of the signal.
    Type: Grant
    Filed: January 15, 2007
    Date of Patent: December 21, 2010
    Assignee: Advantest Corporation
    Inventors: Harry Hou, Takahiro Yamaguchi
  • Publication number: 20090240448
    Abstract: A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
    Type: Application
    Filed: May 22, 2009
    Publication date: September 24, 2009
    Applicant: Rambus Inc.
    Inventors: Haw-Jyh Liaw, Xingchao Yuan, Mark A. Horowitz