Abstract: An I/O pin is connected to a DUT via a transmission line. A driver generates a test signal to be supplied to the DUT. A driver-side switch and an output resistor are arranged in series between the driver and the I/O pin. A comparator is arranged such that the input terminal thereof is connected to the I/O pin, and configured to judge the level of a signal output from the DUT. A short-circuit switch is arranged between the I/O pin and the ground terminal.

Abstract: A short circuit detection module for a touch panel includes first and second short circuit detection circuits. The first short circuit detection circuit is coupled to a first conductive line of the touch panel. The first short circuit detection circuit is configured to drive the first conductive line with a first signal having a first logic level. The second short circuit detection circuit is coupled to second, adjacent, conductive line of the touch panel. The second short circuit detection circuit is configured to drive the second conductive line with a second signal having a second logic level that is complementary to the first logic level.

Abstract: Embodiments of the invention are generally directed to testing of high-speed input-output devices. An embodiment of a high-speed input-output apparatus includes a transmitter and a receiver, and a loop-back connection from an output of the transmitter to an input of the receiver, the loop-back connection including a first connector and a second connector for transmission of differential signals. The apparatus further includes a first inductor having a first terminal and a second terminal and second inductor having a first terminal and a second terminal, the first terminal of the first inductor being connected to the first connector and the first terminal of the second inductor being connected to the second connector, the second terminal of the first inductor and the second terminal of the second inductor providing a test access port for direct current testing of the apparatus.

Abstract: A system and method for detecting damage in an electrical wire, including delivering at least one test electrical signal to an outer electrically conductive material in a continuous or non-continuous layer covering an electrically insulative material layer that covers an electrically conductive wire core. Detecting the test electrical signals in the outer conductive material layer to obtain data that is processed to identify damage in the outer electrically conductive material layer.

Abstract: Methods and systems are provided for sensing electrical faults. The system includes a current sensor disposed between a battery and at least one electrical load. The current sensor is capable of sensing electrical current flowing from the battery to the load at a sensitivity sufficient to detect a current transient. The system also includes a controller in communication with the current sensor. The controller is capable of comparing the sensed current transient to a predetermined current transient for the load and signaling a fault when the sensed current transient and the predetermined current transient vary by a predetermined amount.

Abstract: An electronic protection module adapted for an electronic device to protection information read and stored in a signal reading element. The electronic protection module includes a circuit board, a first loop, a cover, a first flexible circuit board with a second loop, a second flexible circuit board with a third loop, electrical conductor(s) and conductive element(s). When one of the first loop, second loop and the third loop is disconnected, the signal reading element will be disconnected and lose the information, thereby preventing information leak from the electronic device. The electronic device may be a card reader capable of reading a barcode type, magnetic strip type or chip type of a financial card, credit card or personal identity card.

Abstract: Wireless electronic devices may include a transceiver, an antenna resonating element coupled to the transceiver via a transmission line path, transceiver and antenna impedance matching circuits, and other circuitry. The transceiver and the impedance matching circuits may be formed on a first substrate. The antenna resonating element may be formed using a second substrate. The antenna resonating element may be decoupled from the first substrate during testing. First and second sets of test points may be formed at first and second locations long the transmission line path. During testing, a test probe may mate with the first set of test points, whereas an impedance adjustment circuit that serves to electrically isolate the antenna impedance matching circuit from the transceiver may mate with the second set of test points. The impedance adjustment circuit need not be used if the antenna impedance matching circuit is decoupled from the transceiver during testing.

Abstract: An inspection jig for a display panel, used in an inspection system for the display panel and in a method for inspecting the display panel, includes a plate, a ground plate and at least one side holder. The ground plate is disposed on the plate and receives the display panel. The at least one side holder is disposed at a side surface of the plate to control the angle of the plate.

Abstract: AC shield continuity for shielded twisted pair structured datacomm cable is determined by testing the cable, driven in a common mode, over a range of frequencies, to determine presence and location of shield breaks. DC ground path generated false results are thereby avoided.

Abstract: A method and apparatus are provided for detecting the occurrence of arcing of a conductor by monitoring the current on an AC power line.

Abstract: The test instrument is used to perform both time domain reflectometry (TDR) and analysis of transmission signals on a line under test. Further, the test instrument provides for both pulse TDR and step TDR. A coupling transformer having an enhanced low frequency response provides for coupling of the test instrument to the line under test. Isolation circuits between the coupling transformer and the line under test to prevent damage to the test instrument due to voltages on the line under test allow the test instrument to be used in connection with an active line under test. Two isolation circuits are utilized to maintain longitudinal balance of the circuit. During step TDR, the positive and negative transmitter circuits provide step-shaped impulse signals.

Abstract: A transceiver module for monitoring a voltage distribution network that includes a voltage carrying power line and a transmitter along the voltage carrying power line for transmitting a first monitoring signal that includes information related to the condition of the voltage distribution network. The transceiver module comprises a receiver located along the voltage carrying power line at a distance from the transmitter, the receiver configured to receive the first monitoring signal; a sensor that monitors a condition of the voltage distribution network and produces a sensor signal that contains information related to the condition being monitored; and a monitor in communication with the receiver and the sensor thereby receiving the first monitoring signal and the sensor signal, the monitor configured to provide a second monitoring signal that includes the information contained in the first monitoring signal and the sensor signal.

Abstract: A load detection technique for a load comprising multiple frequency-dependant sub-loads comprises measuring a representation of the impedance characteristic of the load; providing stored representations of a multiplicity of impedance characteristics of the load; each one of the stored representations represents the impedance of the load when at least a particular one of the sub-loads is in a fault condition; and comparing the measured representation of the current impedance characteristic of the load with each one of the stored representations and in case that the measured representation matches a stored representation, identifying the sub-load or sub-loads being in a fault condition by the corresponding stored representation.

Abstract: An electronic test system to evaluate the pixel and array properties of active-matrix displays that use charge or current sensitive circuits attached to the array data lines is described. Leakage-current, charging time, and other metrics can be measured for all pixels in the array without electrical or optical connection to the interior of the array. Charge or current sensitive amplifiers and selected voltage drivers may be used in conjunction with variable timing and voltages to determine individual transistor properties over an entire array in just a few seconds. Signals to be measured may be injected in several ways. Ultimately, an output signal for each pixel is measured. Thus, based on the output signal, the charging time or current, the leakage time or current, and other pixel or transistor parameters may be characterized for the entire array.

Abstract: An apparatus for detecting an arc in a plasma chamber is designed to detect the respective voltage and current values of RF power supplied to the plasma chamber and calculate the ratio of the voltage and current values to accomplish a required control of the supplying of the power. When it is determined that the arc is generated, the apparatus rapidly controls the supplying of the power to prevent damages on the plasma chamber and contaminations on the materials to be processed due to the generation of the arc.

Abstract: An RC test circuit includes an RC circuit, a digital rheostat, a control chip, and an oscillograph. The RC circuit includes a plurality of positive terminals and a plurality of negative terminals. The digital rheostat includes a plurality of rheostats each including a sliding terminal and a fixed terminal. The sliding terminals are correspondingly connected to the positive terminals while the fixed terminals are correspondingly connected to the negative terminals. The control chip is connected to the digital rheostat, and configured for controlling the digital rheostat to change the resistance of each rheostat. The oscillograph is connected to the RC circuit for displaying a waveform of the RC circuit.

Abstract: An electronic device, and associated method, provided with a circuit board (10), with a set of input contacts (IN/COM), a set of output contacts (OUT/COM) and an electrical circuit (18) connected between the input contacts (IN/COM) and the output contacts (OUT/COM) and a controller. The controller carries out a real-time test of the circuit board using a test signal introduced into the electrical circuit, the electrical circuit (18) being designed as a passive network having a characteristic transfer function and provided with at least one capacitive element, wherein the capacitive element is a conductor surface (221) forming a capacitor in the assembled state with a corresponding, device-side conductor surface (222?), which is connected to the electrical circuit (18) via a contact element in the assembled state, whereby the capacitive value of the capacitive element in the assembled state differs from the capacitive value of the capacitive element in the disassembled state.

Abstract: An electronic device, and associated method, provided with a circuit board (10), with a set of input contacts (IN/COM), a set of output contacts (OUT/COM) and an electrical circuit (18) connected between the input contacts (IN/COM) and the output contacts (OUT/COM) and a controller. The controller carries out a real-time test of the circuit board using a test signal introduced into the electrical circuit, the electrical circuit (18) being designed as a passive network having a characteristic transfer function and provided with at least two separate partial circuits (18?, 18?) wherein the separate partial circuits are electrically connected in the assembled state by cooperation with at least one of: at least one device components and/or assembly components (181).

Abstract: An apparatus for dispensing solid articles includes a housing and at least one vacuum source. The housing defines a hopper chamber to hold the articles and a dispensing channel fluidly connected to the hopper chamber. The dispensing channel has an inlet and an outlet defining a dispensing flow path therebetween. The vacuum source is adapted to provide a vacuum pressure and induce a gas flow in the housing. The apparatus is configured to generate a forward drive gas flow from the vacuum pressure and induced gas flow, and the forward drive gas flow conveys articles through the dispensing channel along the dispensing flow path in a direction from the inlet to the outlet to dispense the articles.

Abstract: This invention provides a method and an apparatus for detecting a short-circuit occurring between a signal line and a ground line of a lead wire. The apparatus comprises a circuit and a resistive element. The circuit has an output terminal, an input terminal and ground. One end of the ground line is connected to the ground of the circuit, and the other end of the ground line is disconnected. A first terminal of the resistive element is connected to the output terminal of the circuit. One end of the signal line is connected to a second terminal of the resistive element, and the other end of the signal line is disconnected.

Abstract: An ECU executes a program including a step of determining that a pilot wire for transferring a pilot signal CPLT, which is output when a charging cable is connected to a plug-in hybrid vehicle and an external power source, to the ECU is broken, when output of the pilot signal CPLT is currently stopped and a voltage VAC of the external power source (absolute value of voltage VAC) detected by a voltmeter provided within the plug-in hybrid vehicle is greater than zero.

Abstract: Exemplary embodiments are directed to a test arrangement for testing surge voltage in electrical high voltage components with a surge voltage generator and a voltage distributor. The surge voltage generator and voltage distributor have a tower-like structure with a first and a second structure end. A rectangular container is connected to the first and second structure and includes a first and a second container end. At least one of the surge voltage generator and the voltage distributor are movable between a first substantially horizontal position inside the container and a substantially vertical position relative to the container. Each movement between the two positions involves a pivot motion about a rotational axis perpendicular to the longitudinal direction of the surge voltage generator.

Abstract: A system for testing a DC power supply performance includes a comparison module, a judge module, and an alarm module. The comparison module receives DC voltage signals from the DC power supply, compares the DC voltage signals with a reference voltage respectively, and outputs a voltage level signal when the DC power supply is normal. The judge module receives the voltage level signal, and outputs a control signal according to the voltage level signal. The alarm module receives the control signal, and indicates status of the DC power supply according to the control signal.

Abstract: A failure detecting method for a solar power generation system having plural solar cell strings in each of which plural solar cell modules are connected to each other in series. Specifically, by comparing the current value of each of the solar cell modules or strings with the average current value per one module or string, calculated from the total current value of the entire solar cell modules or strings, one or more failure candidates can be detected with high precision.

Abstract: In a method for operating a power tool with a diagnostic device, wherein the power tool has an internal combustion engine, a generator as an energy supply, and an electronic control unit, wherein a diagnostic device is connectable to the electronic control unit, and wherein the electronic control unit has an operating mode and a diagnostic mode, a non-uniform voltage signal is supplied by the generator as an energy supply and a uniform voltage signal is supplied by the diagnostic device as an energy supply. The electronic control unit evaluates the voltage signal that is being supplied as an energy supply and switches to diagnostic mode when the voltage signal is the uniform voltage signal supplied by the diagnostic device.

Abstract: An electronic device includes an internal device and a voltage tester. The internal device includes a power supply source input terminal. The voltage tester supplies one of first and second power supply source voltages to the power supply source input terminal of the internal device, in response to a test signal. The first and second power supply source voltages have different voltage levels. The first power supply source voltage has a voltage level within a normal range required for normal operations of the internal device. The second power supply source voltage has an abnormal voltage level outside the normal range.

Abstract: A modular test plug for voltage, current and saturation testing has a housing having a handle portion, a plurality of jaw connections for injecting upstream toward the equipment to be tested, a plurality of blade connections for injecting downstream toward a transformer, a first plurality of binding posts on a top of the housing connected to the jaw connections, and a second plurality of binding posts also on a top of the housing connected to the blade connections. Also provided is a short-defeating insert for defeating a shorting mechanism in an FT switch. This insert has a thin flat extension member extending from the body to prevent a bottom cam on a shorting blade from making contact with a shorting spring that would otherwise short the circuit when the switch handle is moved from the open position to the closed position.

Abstract: A holding member for use in a test includes a base made of silicon or glass and chips in which devices are formed is mountable thereon. Positioning members made of resist sheets are formed on the top surface of the base. A resist film is formed on the bottom surface of the base, and suction grooves (intersection portions, connection portions) and support members are formed in the resist film. Suction holes are formed in regions of the top surface of the base where the chips are mounted, wherein the suction holes are formed through the base and communicate with the suction groove.

Abstract: One or more apparatuses and methods for enabling easy diagnosis, repair, and maintenance of a commercial display screen are disclosed. In one embodiment of the invention, this apparatus includes a removable commercial display kit box, a corresponding base plate interface unit attached to a rear panel of the commercial display screen, and a guiding mechanism for docking the removable commercial display kit box and the corresponding base plate interface unit. Furthermore, in one embodiment of the invention, the removable display kit box contains an analog-to-digital converter board, a power board, automatic-switching dual data ports, maintenance check visual indicators, and a removable fuse inlet. In case of a commercial display screen malfunction, the removable display kit box allows a quick inspection and a modular repair or replacement of a malfunctioning part, without requiring the entire commercial display screen to be dismounted from a wall or another attached structure.

Abstract: A coupon board is cut out together with a printed wiring board from a sheet material in which a solder resist film is formed on a surface of a glass cloth fiber. The coupon board is for evaluating characteristics of the printed wiring board. The coupon board includes a region on which the solder resist film is not formed, and which extends parallel with one side of the printed wiring board.

Abstract: A transmission line substrate includes at least an insulating layer of a predetermined thickness, a pair of conductor layers arranged in a state of being opposed to each other such that the insulating layer is interposed between the conductor layers, the pair of conductor layers functioning as a high-frequency transmission line, and a fault part formed so as to make the conductor layer on one side disconnected, into which a sample to be measured can be introduced.

Abstract: A detecting station of a winding product and a method for detecting an inter-turn short circuit are provided. The method includes following steps. First, a high voltage pulse is input to two ends of a winding of a winding product. Next, a voltage value of an electrifying process of the winding is extracted for generating an extracting data. Finally, a time-frequency converting operation is performed to the extracting data, and a time-frequency analysis information is generated for indicating whether or not the inter-turn short circuit is occurred in the winding.

Abstract: A test device with uninterruptible power supply supplies external power to a product under test (PUT) and performing electric power tests thereon. The PUT has a processing unit, a power input end, a battery connection end, and a charging and discharging circuit. The device includes a first test port, a second test port, and a power-storing unit. The PUT is electrically connected to the first and second test ports to receive the external power through the first test port and be switchable to the second test port to selectively receive power from the power-storing unit, thereby preventing interruption of operation of the PUT. A charging voltage from the charging and discharging circuit is applied to the power-storing unit via the second test port to charge the power-storing unit. An operation-required power level of the PUT can be maintained, even if the test device receives no power.

Abstract: Systems and methods for radiation-tolerant overcurrent detection are disclosed. In some embodiments, an integrated circuit may include a plurality of overcurrent detectors, each of the plurality of overcurrent detectors configured to detect a candidate overcurrent event. The integrated circuit may also include a voting circuit coupled to the overcurrent detectors, the voting circuit configured to indicate an overcurrent in response to receiving a selected number of candidate overcurrent events from the overcurrent detectors. At least one of the overcurrent detectors may be subject to detecting the candidate overcurrent in error, at least in part, due to exposure to ionizing radiation.

Abstract: A fan failure detector for detecting whether a fan is locked with a drive IC, a coil and an inspection circuit, the drive IC outputting a pulse signal, the coil is electrically connected to the drive IC and driven by the drive IC, the inspection circuit is electrically connected to the drive IC and the coil, the inspection circuit includes an RC charge/discharge circuit, a diode, a second capacitor, a voltage divider and a transistor having an output terminal, wherein the RC charge/discharge circuit, the diode, the voltage divider and the transistor are sequentially connected in series, the second capacitor is electrically connected with the diode and the voltage divider, when the fan operates normally, the output terminal provides a low voltage signal, when the fan locks, the output terminal provides a high voltage signal to avoid a wrong judgment that the fan still operates normally.

Abstract: A circuit test interface and a test method are disclosed. The circuit test interface may include a test voltage input pad, a test voltage output pad, and a plurality of input buffers. Each of the plurality of input buffers may have a first input terminal, a second input terminal, and an output terminal. The first input terminal of each respective input buffer may be coupled to one of a plurality of through-silicon vias (TSVs). The circuit test interface may further include a plurality of switch units. Each of the plurality of switch units may have a first terminal and a second terminal. The circuit test interface may further include a scan chain, coupled to both the output terminal of each of the plurality of input buffers and to the test voltage output pad.

Abstract: A method and an apparatus for measuring performance of an electronic device are provided. The apparatus includes an electromagnetic wave measuring device for measuring an actual level of an electromagnetic wave of an electronic device, and an analysis controller for applying a previously stored level change value to the actual level of the electromagnetic wave to compute a measured level of the electromagnetic wave. The method and the apparatus for measuring performance of an electronic device can easily measure an electromagnetic wave level of the electronic device without using a device suggested by an international standard.

Abstract: A DC high potential testing meter comprises first and second probes. The first probe comprises an insulated shield supporting an electrode extending from a distal end of the shield. A high voltage resistor and a high voltage diode in the shield are connected in series with the electrode. A capacitance formed by a metallic collar across the high voltage diode provides uniform voltage distribution along the high voltage diode. The second probe comprises an insulated shield supporting an electrode. A high voltage resistor in the shield is connected in series with the electrode. A meter comprises a housing enclosing an electrical circuit for measuring voltage across the electrodes and provides an output representing measured voltage.

Abstract: A measuring device is provided, the measuring device including: a power supply to provide electric power to a chip via at least one of a chip connection and a chip-carrier connection; a chip arrangement receiving portion configured to receive a chip arrangement, the chip arrangement including a chip and a plurality of chip-to-chip-carrier connections; a detection portion including: a plate; a detection circuit coupled to the plate and configured to detect an electrical signal from the plate; wherein the plate is configured such that it covers at least part of the chip arrangement; and wherein at least one chip-carrier connection is in electrical connection with the plate.

Abstract: A circuit for controlling temperature of a semiconductor chip includes a first heating element that is built into the semiconductor chip. The first heating element generates heat to increase the temperature of the semiconductor chip. The chip also includes a temperature controller that is coupled to the first heating element and built into the semiconductor chip. The temperature controller controls the temperature to enable testing of the semiconductor chip at a desired temperature.

Abstract: Methods and apparatus for continuous ground fault self-test are disclosed. An example ground fault detection device includes a sense coil to detect current in a line conductor and a neutral conductor, the sense coil comprising a winding influenced by a current difference between the line conductor and the neutral conductor. The example ground fault detection device also includes a current bypass to facilitate a continuous current imbalance detected by the sense coil, and a ground fault detector circuit to detect at least one of the continuous current imbalance in the sense coil or a ground fault current imbalance.

Abstract: A thermal wrap for testing electronic components has a web having an inside and an outside surface and a first end and a second end and a thermal element incorporated in said web. An edge element incorporated substantially along at least one edge of said web promotes a thermal seal between said web and the electronic component being tested when the electronic component in installed in the wrap. A closure disposed on the ends may be reversibly closed sufficiently tightly to promote the thermal seal.

Abstract: Test structures for simultaneously testing for electromigration or stress migration fails and time dependent dielectric breakdown fails in integrated circuits, test circuits using four test structures arranged as a bridge balance circuit and methods of testing using the test circuits. The electromigration or stress migration portions of the test structures include via chains of wire segments connected in series by electrically conductive vias, the wire segments formed in at least two adjacent wiring levels of an integrated circuit. The time dependent dielectric breakdown portions of the test structures include digitized wire structures in one of the at least two adjacent wiring levels adjacent to a less than whole portion of the wire segments in the same wiring level as the digitized wire structures.

Abstract: A package of a switching apparatus that houses an actuator having a movable contact point and in which a fixed contact point, which is electrically connected to or disconnected form the movable contact point, is accurately formed. Provided is a switching apparatus comprising a first substrate provided with a via that electrically connects a top surface thereof and a bottom surface thereof, while maintaining an air-tight state between the top surface and the bottom surface; a second substrate provided on the first substrate and in which is formed a through-hole that houses an actuator; and a third substrate provided on the second substrate and supporting the actuator, which has a moveable contact point.

Abstract: An electronic device testing apparatus for conveying electronic devices to be tested to sockets of a contact portion and bringing the electronic devices to be tested electrically contact with the sockets to conduct a test of electric characteristics of the electronic devices to be tested, comprising an image pickup portion that takes an image of the sockets; a memory portion that stores reference image data of the sockets in a state of not being attached with any electronic devices to be tested obtained by taking images by the image pickup portion; and a mislay determination portion that obtains check image data of the sockets from the image pickup portion, reads the reference image data from the memory portion, compares the check image data with the reference image data and determines whether any of the electronic devices to be tested remain on the sockets.

Abstract: In a method for testing functionality of a field device or a field device for sending a control signal to a final controlling device of an industrial processing plant, the final controlling device is operated by a secondary power. With the method, a current/secondary power converter is provided for generating a predetermined secondary power safety control signal to bring the final controlling device into a predetermined safe position. An electronic safety circuit is provided connected to the current/secondary power converter which, depending on an electrical control signal received by the field device, is switched from a passive state into an active state in which the electronic safety circuit causes the current/secondary power converter to output the secondary output power safety control signal. The safety circuit automatically adopts the active state if the electrical control signal falls below or exceeds at least one of a current and a voltage threshold value specific to the safety circuit.

Abstract: Disclosed is a multi-MEA test station capable of simultaneously testing and activating a plurality of MEAs and a multi-MEA test method using the same. The multi-MEA test station includes a chamber capable of receiving a plurality of MEAs; a first multi cell body including a first channel for supplying an oxidant to a cathode electrode of the MEA, and a second multi cell body including a second channel for supplying fuel to an anode electrode of the MEA; a pressing means closely adhering the first multi cell body, the second multi cell body and the MEA positioned therebetween by applying force in a direction that the first multi cell body and the second multi cell body are opposed to each other; a reactant supply means for supplying the oxidant to the first channel and supplying the fuel to the second channel; and a multi-loader controlling the environment of a test and activation on the plurality of MEAs and performing the test and the activation.

Abstract: A circuit tester device for testing continuity and polarity of vehicle relay circuits may include a housing and a plug carried by the housing. The circuit tester device may also have a battery lead adapted to connect to a battery terminal, and a ground lead adapted to connect to a ground. Further, the circuit tester device may have circuitry including three or more circuits connected between the battery and ground leads. Each circuit may have in series a first resistor, a first status indicator, a first diode, a test terminal, a second diode, a second status indicator and a second resistor. Each test terminal may be connected to a respective one of the pins. The circuitry may also have one or more load circuits tapped into one of the circuits between the first and second diodes. The load circuits may include in series a test switch and a load terminal.

Abstract: Systems and methods are disclosed for identifying improper cabling of control system devices connected to redundant communication networks of distributed control systems. In an embodiment, a receiving device receives messages including a sender identification or source address, and a network or associated device port identification, from sending devices, over redundant networks. The receiving device determines a connect status indicating whether a message was received on a particular device port, and an error event indicating whether the port is associated with the network identified in the message. A system diagnoses an improper communication path between devices and produces an indication of a location and/or type of improper cabling. A method supplants error events with error rates calculated as a probability of receiving messages on a device port not associated with the network identified in a received message. The method compares the error rates to error thresholds to identify improper cabling.

Abstract: The measuring array with an earth connection point (5) for determining the insulation resistance (Riso) of an energized electrical apparatus or of an installation with a supply voltage UB with a positive pole (6) and a negative pole (7), two switches (S1, S2) or a corresponding two-way switch being provided for creating a current path between one of the two poles and said earth connection point (5) in order to determine the insulation resistance (Riso) generally obtained when one or a plurality of insulation faults occur at any potential reference, two measurements being performed one after the other for determining the insulation resistance, the first switch (S1) being closed and the second switch (S2) open during the first of these two measurements and the first switch (S1) being open and the second switch (S2) closed during the second of these measurements.