For Excitation Patents (Class 324/603)
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Publication number: 20110316558Abstract: A circuit system for evaluating a sensor, wherein the circuit system comprises two complex impedances (2, 3, 13, 14), wherein the complex impedances (2, 3, 13, 14) are each part of a resonant circuit in which the complex impedances (2, 3, 13, 14) can be excited to perform oscillations, and wherein at least one of the two complex impedances (2, 3, 13, 14) are part of the sensor, is characterized with respect to a particularly cost-effective and as simple a circuit design as possible in that a counter (9, 18) and a switch apparatus (8, 16) are provided, wherein the counter (9, 18) can be used to alternately count the oscillations of one of the two resonant circuits, the switch apparatus (8, 16) can be switched when a specifiable counter reading has been reached, and the switch signal of the switch apparatus serves as a pulse width-modulated output signal (11, 21) for the circuit system.Type: ApplicationFiled: November 17, 2009Publication date: December 29, 2011Inventors: Christian Pfaffinger, Felix Mednikov
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Patent number: 8063648Abstract: A method and device are provided for demodulation of an output signal from a transducer (1) driven by an alternating excitation signal having an excitation frequency. The transducer produces an amplitude-modulated output signal (y(t)) containing the quantity to be measured. The device has sampling units (5,6,7) to sample the output signal from the transducer and the output signal from the excitation unit, and a computation unit (8) to compute a first complex valued quantity ( Y) including information on the amplitude and phase of the output signal at the excitation frequency based on sampled values of the output signal from the transducer, compute a second complex valued quantity (?, ?) including information on the amplitude and phase of the excitation signal at the excitation frequency based on sampled values of the excitation signal, forming a complex valued output quotient between the first and second complex valued quantities, and compute the demodulated output signal (Od) based on the output quotient.Type: GrantFiled: May 10, 2007Date of Patent: November 22, 2011Assignee: ABB ABInventors: Jan Nilsson, Jarl R. Sobel
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Patent number: 8060196Abstract: An electromedical implant includes a measuring signal generator, an impedance measuring unit to determine the impedance of human or animal tissue, a control unit which, for controlling the measuring signal generator and the impedance measuring unit, is at least indirectly connected to the measuring signal generator and to the impedance measuring unit, as well as an electrode arrangement comprising at least two electrodes which can be directly or indirectly connected or at least temporarily connected to the measuring signal generator and to the impedance measuring unit, or to a connection for such an electrode arrangement.Type: GrantFiled: December 2, 2005Date of Patent: November 15, 2011Assignee: Biotronik CRM Patent AGInventors: Michael Lippert, Gerald Czygan
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Patent number: 7888948Abstract: A method of controlling an analog signal in an integrated circuit includes generating a first control signal having a first predetermined duration within the integrated circuit. The first control signal is configured to cause the analog signal to have a first signal level. The first signal level is compared to a level of a target signal. A second control signal is generated within the integrated circuit based on a result of the comparison. The second control signal is configured to cause the analog signal to have a second signal level. The second control signal has a second predetermined duration that is different than the first predetermined duration.Type: GrantFiled: February 5, 2008Date of Patent: February 15, 2011Assignee: Qimonda AGInventor: Andreas Jakobs
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Patent number: 7834639Abstract: Provided is a jitter injection circuit that generates a jittery signal including jitter, including a plurality of delay circuits that receive a supplied reference signal in parallel and that each delay the received reference signal by a preset delay amount and a signal generating section that generates each edge of the jittery signal according to a timing of the signal output by each delay circuit. In the jitter injection circuit the delay amount of at least one delay circuit is set to be a value different from an integer multiple of an average period of the jittery signal.Type: GrantFiled: January 30, 2008Date of Patent: November 16, 2010Assignee: Advantest CorporationInventors: Kiyotaka Ichiyama, Masahiro Ishida
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Publication number: 20100176817Abstract: A Bulk Current Injection (BCI) transformer is provided herein with a magnetic core and a plurality of windings. The magnetic core is configured for encircling one or more electrical conductors under test. Each of the plurality of windings are wrapped, at least in part, around a longitudinal dimension of the magnetic core and spaced apart around an azimuthal dimension of the magnetic core. During injection tests, a power source may be coupled for supplying current to each of the windings at a respective “feed point.” Arranging multiple feed points around the magnetic core enables current flow through the windings to generate an azimuthally-uniform magnetic flux density in the magnetic core. The uniform magnetic flux density enables the BCI transformer to excite only common mode currents in the electrical conductors under test. BCI test methods, including injection tests and current sensing tests are also provided herein, along with a test setup for characterizing BCI transformers.Type: ApplicationFiled: January 9, 2009Publication date: July 15, 2010Applicant: TDK CORPORATIONInventors: James S. McLean, Robert A. Sutton
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Patent number: 7642770Abstract: This present invention discloses a light-driving system capable of providing an accurate calibration of signal measurement and a method for performing the same, including an automatic power control (APC) circuit which is pre-calibrated for a signal measurement process. By enlarging at least one measured pad of the APC circuit, multiple grounding paths are established via a plurality of probes of a test instrument. An impedance effect predicted on the contact between the probes and the pad is diminished greatly. A voltage value on the pad can be accurately measured. Thus, a reference voltage value input to a first input of a comparator of the APC circuit can be determined on a basis of a specific condition when a ramping voltage value input to a second input of the comparator is substantially equal to a sum of a predetermined reference voltage value and the voltage value of the pad.Type: GrantFiled: March 16, 2007Date of Patent: January 5, 2010Assignee: MEDIATEK Inc.Inventors: An-nan Chang, Chien-ming Chen
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Patent number: 7557587Abstract: An excluding unit is controlled by a control signal received from a control unit, and based on the control signal a determination is made for each of circuit blocks as to whether either a voltage signal at a position of its corresponding circuit block or a signal indicating a voltage is outputted to a selection unit. From a circuit block which is not in operation, the voltage, but not a voltage signal at a position of the circuit block, is outputted to the selection unit. By this, the circuit block which is not in operation cannot be judged to have voltage drop, and accordingly, a high supply voltage cannot be supplied. Consequently, a malfunction caused by supply voltages to other circuit blocks being too high does not occur.Type: GrantFiled: March 21, 2007Date of Patent: July 7, 2009Assignee: Fujitsu Microelectronics LimitedInventor: Yasushige Ogawa
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Patent number: 7482817Abstract: A signal including at least one group of a group comprised of two slopes having different gradients and a known temporal position relationship is applied to a device under test, the time intervals between the specific transitions of the logic level produced in the output signal of the device under test in response to the slopes included in the applied signal are measured, and the measurements are used to obtain the input threshold level of the device under test.Type: GrantFiled: September 11, 2006Date of Patent: January 27, 2009Assignee: Verigy (Singapore) Pte. Ltd.Inventor: Junichi Miyamoto
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Publication number: 20090015266Abstract: A plurality of through-hole vias connected to conductor layers is disposed with gaps left between these vias around opening parts disposed in the conductor layers in a printed board in which these conductor layers are disposed parallel to each other so as to sandwich a dielectric layer in between. Furthermore, through-hole vias used for excitation are disposed in the opening parts of the conductor layers and regions of the dielectric layer matching these opening parts in a non-contact manner with the conductor layers. When the complex dielectric constant is measured, a high-frequency power is applied to the through-hole vias, and the power loss between the through-hole vias and the conductor layers is measured by the S parameter method.Type: ApplicationFiled: March 22, 2006Publication date: January 15, 2009Applicant: NEc CorporationInventors: Kaoru Narita, Taras Kushta
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Publication number: 20080315896Abstract: A system and technique for measuring the mutual inductance in a switched reluctance machine (SRM). In a first example embodiment of the technique, a voltage pulse is applied to primary coil when the machine is stationery. By measuring current in the primary coil and measuring induced voltages in adjacent open circuited coils mutual inductance may be determined. In another example embodiment, a voltage pulse is applied to the primary coil when the machine is stationery. The secondary coil is allowed to freewheel current through the phase. By measuring time taken by the primary phase to reach a preset value, the mutual inductance for the known position of a rotor can be determined.Type: ApplicationFiled: June 16, 2008Publication date: December 25, 2008Applicant: BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEMInventors: BABAK FAHIMI, UMAMAHESHWAR KRISHNAMURTHY
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Patent number: 7463826Abstract: An apparatus for measuring response time of a display apparatus including a photographing part including a charge coupled device camera and a microscope, an image processing part receiving a picture taken from a photographing part and calculating the response time thereof, and a control part applying a predetermined image signal to the display apparatus and controlling the photographing part to take a picture change of the display apparatus at a predetermined time.Type: GrantFiled: September 14, 2005Date of Patent: December 9, 2008Assignee: Samsung Electronics Co., Ltd.Inventors: Fusayuki Takeshita, Hiroyuki Kamiya, Kyeong-Hyeon Kim, Yong-hwan Shin, Hak-sun Chang
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Publication number: 20080297170Abstract: A system, apparatus, and method for dynamic measurement of inductance trend of a motor are disclosed. In one of the embodiment herein the system is configured to acquire inputs from the DUT using a Trigger system, a horizontal subsystem and the programming unit. The system is also configured to process such information for dynamic analysis and representation on an interface provided in the system based on different step sizes.Type: ApplicationFiled: May 21, 2008Publication date: December 4, 2008Applicant: TEKTRONIX, INC.Inventors: Krishna N. H. Sri, Mukesh Soni, Narasimha Murthy K.
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Patent number: 7427867Abstract: Method and system for non-destructive evaluation for a conducting structure by measuring the electrical impulse response thereof including applying a PRBS test input signal to the conducting structure, detecting an output signal from the conducting structure and processing the data to assess the condition of the conducting structure via changes in the electrical impulse response and to locate any defects along the conducting structure.Type: GrantFiled: May 17, 2007Date of Patent: September 23, 2008Assignee: Intelligent Automation, Inc.Inventors: Leonard S. Haynes, Eric van Doom
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Publication number: 20080224715Abstract: This present invention discloses a light-driving system capable of providing an accurate calibration of signal measurement and a method for performing the same, including an automatic power control (APC) circuit which is pre-calibrated for a signal measurement process. By enlarging at least one measured pad of the APC circuit, multiple grounding paths are established via a plurality of probes of a test instrument. An impedance effect predicted on the contact between the probes and the pad is diminished greatly. A voltage value on the pad can be accurately measured. Thus, a reference voltage value input to a first input of a comparator of the APC circuit can be determined on a basis of a specific condition when a ramping voltage value input to a second input of the comparator is substantially equal to a sum of a predetermined reference voltage value and the voltage value of the pad.Type: ApplicationFiled: March 16, 2007Publication date: September 18, 2008Applicant: MEDIATEK Inc.Inventors: An-nan Chang, Chien-ming Chen
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Publication number: 20080204039Abstract: The present invention is a method to allow a vector network analyzer (VNA) to self calibrate without the addition of calibration standards, e.g. a calibration kit with a network analyzer.Type: ApplicationFiled: February 22, 2007Publication date: August 28, 2008Inventors: Kenneth H. Wong, James C. Liu, Keith F. Anderson, Bobby Y. Wong
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Patent number: 7395163Abstract: Real time battery impedance spectrum is acquired using one time record, Compensated Synchronous Detection (CSD). This parallel method enables battery diagnostics. The excitation current to a test battery is a sum of equal amplitude sin waves of a few frequencies spread over range of interest. The time profile of this signal has duration that is a few periods of the lowest frequency. The voltage response of the battery, average deleted, is the impedance of the battery in the time domain. Since the excitation frequencies are known, synchronous detection processes the time record and each component, both magnitude and phase, is obtained. For compensation, the components, except the one of interest, are reassembled in the time domain. The resulting signal is subtracted from the original signal and the component of interest is synchronously detected. This process is repeated for each component.Type: GrantFiled: July 5, 2007Date of Patent: July 1, 2008Assignee: Montana Tech of the University of MontanaInventors: John L. Morrison, William H. Morrison
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Patent number: 7285962Abstract: A system for injecting noise signals onto power generated by a power source comprising: a voltage source; a device under test having a power input in operable communication with the noise introduction apparatus; and a noise introduction apparatus interposed between the power source and device under test in operable communication with the voltage source, the noise introduction apparatus comprising, a switching device configured to provide a low impedance conductive path when commanded, and a current limiting device in series with the switching device, the current limiting device configured to provide a low impedance conductivity for a selected current and a selected duration. The switching device and current limiting device cooperate to shunt the voltage source to the power input.Type: GrantFiled: May 11, 2004Date of Patent: October 23, 2007Assignee: International Business Machines CorporationInventors: Joseph W. Bogdanski, King M. Chu, William M. Lorenz, Tuan D. Ngo, Andrew Rybak, Kwok M. Soohoo, Gerard V. Weber, Jr., William T. Winkler
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Patent number: 7251284Abstract: A QAM receiver is disclosed. According to one aspect, a QAM receiver includes a signal input for receiving an analog input signal. Further, the QAM receiver includes an anti-aliasing filter and a series connected analog/digital converter for converting the received analog input signal into a digital signal. A carrier freguency loon detects a carrier freguency of the received analog input signal. A clock phase loon detects a clock phase of the received analog input signal. A control circuit is switchable between a receive mode of operation and a test mode of operation. In the test mode, the control circuit applies a center freauency adiusting signal to the carrier freauency loon for adiustment of a center freguency and applies a freguency band adjusting signal to the clock phase loon for adiustment of a freguency bandwidth to measure power level values for the entire freauency band of the received analog input signal.Type: GrantFiled: November 25, 2002Date of Patent: July 31, 2007Assignee: Infineon Technologies AGInventors: Andreas Menkhoff, Ruth Maijer
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Patent number: 7245129Abstract: A novel mechanism for performing high accuracy cable diagnostics. The mechanism utilizes time domain reflectometry (TDR) to detect and identify cable faults, perform estimations of cable length, identify cable topology, identify load and irregular impedance on metallic paired cable, such as twisted pair and coaxial cables. The TDR mechanism transmits pulses whose shapes are programmable and analyzes the signal reflections. The shapes of the pulses transmitted can be optimized in accordance with the channel characteristics. Further, the TDR mechanism is adapted to operative in the presence of high pass filters in the channel.Type: GrantFiled: February 13, 2006Date of Patent: July 17, 2007Assignee: Texas Instruments IncorporatedInventors: Daniel Wajcer, Naftali Sommer, Nohik Semel
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Patent number: 7218122Abstract: An apparatus selectively generates a disturbance in a three-phase supply voltage provided to a load. The apparatus includes input connections for receiving a first phase voltage, a second phase voltage and a third phase voltage of the three-phase supply voltage. The apparatus includes a voltage disturbance generator for selectively adjusting the amplitudes of the first, second and third phase voltages according to a first test method, a second test method or a third test method. Output connections are provided for connecting to the load to provide the load the first, second and third phase voltages as altered according to the first, second or third test method. In the first test method, a phase-to-phase voltage disturbance is introduced between the first and second phase voltages by altering the amplitude of the first phase voltage against the second phase voltage.Type: GrantFiled: February 28, 2005Date of Patent: May 15, 2007Assignee: Electric Power Research InstituteInventors: Doni J. Nastasi, Scott D. Bunton
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Patent number: 7072781Abstract: A test system having a feedback loop that facilitates adjusting an output test waveform to a DUT/CUT (Device Under Test/Circuit Under Test) on-the-fly according to changing DUT/CUT parameters. The system includes a tester having an arbitrary waveform generator (AWG) and a data acquisition system (DAS) that monitors the status of the DUT/CUT. The AWG and DAS connect to the DUT/CUT through a feedback loop where the AWG outputs the test waveform to the DUT/CUT, the DAS monitors the DUT/CUT parameters, and the DAS analyzes and communicates changes to the AWG to effect changes in the output waveform, when desired. The AWG builds the output waveform in small slices (or segments) that are assembled together through a process of selection and calibration. The feedback architecture facilitates a number of changes in the output waveform, including a change in the original order of the preassembled slices, and changes in the magnitude/shape of the output waveform.Type: GrantFiled: July 6, 2004Date of Patent: July 4, 2006Assignee: Advanced Micro Devices, Inc.Inventors: Eugen Gershon, David Gaun, Colin S. Bill, Tzu-Ning Fang
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Patent number: 7061255Abstract: A system for monitoring corrosion in metal by comparing a test sample exposed to a corrosion causing environment and a reference sample exposed to a protected environment. An AC voltage source generates a square wave signal oscillating between ground and voltage Vcc and a filter is positioned to filter the signal to produce a sine wave with no second harmonic component. A voltage-driven current source and inverting amplifier produce a current referenced to 0.5 Vcc to provide an AC current from the drive voltage driven sinusoidally and symmetrically above and below 0.5 Vcc. A transformer steps up the AC current and thereafter transmits the current through the samples to an amplifier for amplifying the current to provide outputs in a ratio representing the degree of corrosion of the reference sample. The system can operate in situ for on site measurement and uses relatively low current to permit long operation.Type: GrantFiled: November 24, 2004Date of Patent: June 13, 2006Assignee: Honeywell International Inc.Inventors: Donald S. Foreman, Russ A. Braunling, Darryl J. Wrest
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Patent number: 7030627Abstract: Impedance of an unknown load is determined by applying a reference signal from a signal generator through a multi-position switch to the unknown load, a first known calibration impedance, and second known impedance, which can be an open circuit, while measuring the complex voltage developed across each load. The source impedance of the signal generator can be determined from the measurements of the known impedances, and then the unknown impedance can be calculated, using complex voltage divider relationships. The reference signal is applied at one or more frequencies of interest and is preferably a sine wave. Impedance is measured accurately at all frequencies and the limitations of prior art frequency dependant directional-coupler methods of impedance measurement are overcome. The impedance measurement device can be incorporated into a handheld device with a keypad and display.Type: GrantFiled: August 27, 2004Date of Patent: April 18, 2006Assignee: AEA Technology Inc.Inventor: William B. Ashley
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Patent number: 7015701Abstract: A highly time resolved impedance spectroscopy enhances measurement of the dynamics of non-stationary systems with enhanced time resolution. The highly time resolved impedance spectroscopy includes an optimized, frequency rich a.c., or transient, voltage signal is used as the perturbation signal, non-stationary time to frequency transformation algorithms are used when processing the measured time signals of the voltage and current to determine impedance spectra which are localized in time; and the system-characterizing quantities are determined from the impedance spectra using equivalent circuit fitting in a time-resolution-optimized form. Also provided are measuring cells and methods for measuring impedance spectra of biofunctional molecules and aggregates.Type: GrantFiled: March 4, 2003Date of Patent: March 21, 2006Inventors: Gerald Wiegand, Erich Sackman
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Patent number: 6943561Abstract: Radio Frequency (RF) signal network measurement data of a device under test are acquired by exciting the device using a modulated RF excitation signal, while measuring RF signal data at the signal ports of the device, measuring bias signal data, and processing the RF signal data and the bias signal data, providing the RF signal network measurement data of the device. By acquiring bias signal data, in particular by measuring variations in the bias signals, a more accurate and reliable characterization of the non-linear behavior of the device under test can be provided. A Non-linear Network Measurement System (NNMS) is arranged for acquiring the RF and biasing signal data and characterizing the non-linear signal behavior of a device under test.Type: GrantFiled: September 23, 2002Date of Patent: September 13, 2005Assignee: Agilent Technologies, Inc.Inventor: Jan Verspecht
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Patent number: 6940286Abstract: Methods and apparatus are provided for obtaining a representation of the distribution of electrical impedance within a multiphase flow with an electrically continuous or discontinuous principle flow contained within an electrically conductive solid ring electrode, including providing a plurality of mutually spaced electrical contacts mounted at the outside wall of the ring and electrically contacting with the ring, applying currents or voltages to the ring from the electrical contacts, generating a more homogeneous electric field distribution within the material, measuring voltage or current distribution alone the ring from other electrical contacts, relatively intensifying the imaging sensitivity at the central area of the sensing domain using a ?/2 angle sensing strategy and reconstructing the representation of the impedance distribution using CG method with an error processing strategy.Type: GrantFiled: December 28, 2001Date of Patent: September 6, 2005Assignee: University of LeedsInventors: Mi Wang, Wuliang Yin
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Patent number: 6788071Abstract: A method and apparatus for generating a transmembrane voltage, including a semiconductive substrate having a surface for receiving a membrane thereon, and a light source for illuminating at least a portion of the semiconductive substrate. Measurement of current through the membrane addresses ion channels through the membrane at the location illuminated by the light source.Type: GrantFiled: July 23, 2002Date of Patent: September 7, 2004Assignee: Auburn UniversityInventors: Vitaly J. Vodyanoy, Solomon Yilma, Ting To Lo, Alexander Samoylov
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Patent number: 6727721Abstract: The invention provides a method for switching from a first operating condition of an integrated circuit to a second operating condition of the integrated circuit differing from the first operating condition. To that end, the output signal generated at a circuit output is externally overwritten. The inventive method or the inventive integrated circuit have the advantage that the switching from one operating condition into another operating condition of the integrated circuit can be implemented in a very simple way but with a high immunity to interference. The switching can be very easily initiated as needed because the only thing needed is the application of a voltage level—which is already available in the system—to an output of the integrated circuit.Type: GrantFiled: July 12, 2002Date of Patent: April 27, 2004Assignee: Infineon Technologies AGInventors: Hans Altrichter, Dieter Draxelmayr, Mario Motz
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Patent number: 6636722Abstract: A method of broadband receiver amplitude/phase normalization uses internal normalization sources—a thermally compensated noise source and a pseudo random sequence generator. A calibrated signal is applied to the input of the broadband receiver and processed by a digital signal processor to generate a gain versus frequency table. Then the internal noise source is applied to the input of the broadband receiver and process by a digital signal processor to generate a noise level versus frequency table. Finally the internal pseudo random sequence generator applies a pseudo random sequence waveform to the input of the broadband receiver, the pseudo random sequence waveform being process by the digital signal processor to generate equalization filter coefficients for the IF stages.Type: GrantFiled: September 12, 2000Date of Patent: October 21, 2003Assignee: Tektronix, Inc.Inventors: Donald J. Dalebroux, Xiaofen Chen
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Publication number: 20030173976Abstract: A highly time resolved impedance spectroscopy that enhances the measurement of the dynamics of non-stationary systems with enhanced time resolution. The highly time resolved impedance spectroscopy includes an optimized, frequency rich a.c., or transient, voltage signal is used as the perturbation signal, non-stationary time to frequency transformation algorithms are used when processing the measured time signals of the voltage and current to determine impedance spectra which are localized in time; and the system-characterizing quantities are determined from the impedance spectra using equivalent circuit fitting in a time-resolution-optimized form.Type: ApplicationFiled: March 4, 2003Publication date: September 18, 2003Inventors: Gerald Wiegand, Erich Sackman
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Patent number: 6549019Abstract: A testing device generates electromagnetic noise such as transients, power interruptions and Radio Frequency Interference (RFI) for application to an electronic device to test the immunity of the electronic device to electromagnetic noise or to test the performance of the electronic device during exposure to electromagnetic noise. The testing device promotes an economical and efficient evaluation of Electromagnetic Compatibility (EMC) of an electronic device during product design or otherwise. The testing device includes a switch having electrical contacts for producing electromagnetic noise during a transition between a closed state and an open state of the electrical contacts and a trigger that is coupled to the switch. The trigger is arranged to change states between the closed state and the open state of the electrical contact. An input terminal is associated with the switch for applying electrical energy to the switch.Type: GrantFiled: December 11, 2000Date of Patent: April 15, 2003Assignee: Visteon Global Technologies, Inc.Inventor: Arnold David Nielsen
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Publication number: 20030057964Abstract: Radio Frequency (RF) signal network measurement data of a device under test are acquired by exciting the device using a modulated RF excitation signal, while measuring RF signal data at the signal ports of the device, measuring bias signal data, and processing the RF signal data and the bias signal data, providing the RF signal network measurement data of the device. By acquiring bias signal data, in particular by measuring variations in the bias signals, a more accurate and reliable characterization of the non-linear behavior of the device under test can be provided. A Non-linear Network Measurement System (NNMS) is arranged for acquiring the RF and biasing signal data and characterizing the non-linear signal behavior of a device under test.Type: ApplicationFiled: September 23, 2002Publication date: March 27, 2003Inventor: Jan Verspecht
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Publication number: 20030020489Abstract: A method and apparatus for generating a transmembrane voltage, including a semiconductive substrate having a surface for receiving a membrane thereon, and a light source for illuminating at least a portion of the semiconductive substrate. Measurement of current through the membrane addresses ion channels through the membrane at the location illuminated by the light source.Type: ApplicationFiled: July 23, 2002Publication date: January 30, 2003Inventors: Vitaly J. Vodyanoy, Solomon Yilma, Ting To Lo, Alexander Samoylov
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Patent number: 6396286Abstract: The power supply of equipment being tested for common mode noise problems is connected to a source of power with the power and neutral input terminals of the power supply isolated from the power ground. Recorded common mode noise signals are then inserted between the power supply's neutral input terminal and power ground to produce problem conditions. When the cause of the problem conditions are identified, steps are taken to eliminate the condition.Type: GrantFiled: December 3, 1999Date of Patent: May 28, 2002Assignee: International Business Machines CorporationInventors: King M. Chu, William M. Lorenz, Tuan D. Ngo, Prabjit Singh, Gerald J. Fahr, John P. McConnell
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Patent number: 6373260Abstract: A single cable, single point stimulus and response probing system allows the measurement of both low impedance stimulus measurements and high impedance response measurements using a single probe cable. Circuitry located within the probe cable receives stimulus input from the stimulus circuitry located within a test and measurement device, and delivers input to response measurement circuitry also located within the test and measurement device. Certain embodiments of the probing system use feedback supplied to an amplifier located within the stimulus circuitry to improve the accuracy of the measurement device and control output impedance. Feedback can be locally supplied from the output of the stimulus circuitry, or can be generated using an additional amplifier located within the response measurement circuitry.Type: GrantFiled: February 24, 1998Date of Patent: April 16, 2002Assignee: Agilent Technologies, Inc.Inventors: Dennis J. Weller, Robert H. Noble
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Patent number: 6285197Abstract: A jitter unit converts a stable input test signal into a jittering output test signal used to test the jitter tolerance of electronic equipment. This jitter device allows any test or sample signal (analog or digital, video or audio) to be used for testing such equipment. Jitter is a type of timing error between the expected or ideal timing of a signal and the actual timing of a signal in which the characteristics of the timing error change with time. The characteristics of jitter include the level of error, the frequency of change in the error and whether the change is periodic or random. The jitter unit uses a variable delay unit to delay the signal and uses a controller to regulate the delay of the delay unit in order to transform the stable signal into a jittering signal.Type: GrantFiled: July 31, 1998Date of Patent: September 4, 2001Assignee: Philips Electronics North America CorporationInventor: Marc S. Walker
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Publication number: 20010011893Abstract: A jitter unit converts a stable input test signal into a jittering output test signal used to test the jitter tolerance of electronic equipment. This jitter device allows any test or sample signal (analog or digital, video or audio) to be used for testing such equipment. Jitter is a type of timing error between the expected or ideal timing of a signal and the actual timing of a signal in which the characteristics of the timing error change with time. The characteristics of jitter include the level of error, the frequency of change in the error and whether the change is periodic or random. The jitter unit uses a variable delay unit to delay the signal and uses a controller to regulate the delay of the delay unit in order to transform the stable signal into a jittering signal.Type: ApplicationFiled: July 31, 1998Publication date: August 9, 2001Applicant: PHILIPS ELECTRONICS NORTH AMERICA CORPORATIONInventor: MARC S. WALKER
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Patent number: 6268735Abstract: A module for use in automatic test equipment is disclosed. The module is especially useful for measuring noise parameters of high frequency devices. The module includes a noise generator and a plurality of EEPROM's that store reflection coefficients and ENR data for the noise generator. Computerized control circuitry in the automatic test equipment uses the stored data to reduce impedance mismatch and Excess Noise Ratio (ENR) data uncertainties in the measured noise parameters.Type: GrantFiled: June 4, 1999Date of Patent: July 31, 2001Assignee: Teradyne, Inc.Inventors: Thomas Michael Craig, Matthew Thomas Begg
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Patent number: 6177802Abstract: A system for detecting defects in an interlayer dielectric (ILD) interposed between first and second conductive lines lying adjacent each other along a first plane is provided. A processor controls general operations of the system. A voltage source adapted to apply a bias voltage between the first and second conductive lines is employed to induce a leakage current across the ILD. A light source for illuminating at least a portion of the ILD is used to enhance the leakage current. A magnetic field source applies a magnetic field in a direction orthogonal to the leakage current. The magnetic field deflects carriers in a direction substantially perpendicular to the first plane. A voltage monitor measures a voltage generated across third and fourth conductive lines, the third and fourth conductive lines lying adjacent each other along a second plane which is substantially perpendicular to the first plane. The voltage monitor is operatively coupled to the processor.Type: GrantFiled: August 10, 1998Date of Patent: January 23, 2001Assignee: Advanced Micro Devices, Inc.Inventors: Sunil N. Shabde, Yowjuang William Liu, Ting Yiu Tsui
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Patent number: 6172507Abstract: A circuit configuration for measuring resistance and/or leakage between two nodes, which includes a current source for feeding a test current into one of the two nodes and a circuit element that detects the voltage resulting between the two nodes. The output of a broadband signal generator is connected to a control input of the current source. The outputs of the circuit element and of the signal generator are connected to the inputs of the correlator for determining the correlation between their output signals.Type: GrantFiled: March 19, 1999Date of Patent: January 9, 2001Assignee: Siemens AktiengesellschaftInventor: Stefan Hermann
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Patent number: 6064212Abstract: The invention relates to a method for determining the transmission characteristics (H(jf)) of an electric line (2) in an ISDN system, in which a test signal (m(t)) is applied to the line (2) at one end, and at the other end of the line (2) the received signal (g(t)) produced owing to the test signal (m(t)) is evaluated.In order to be able to carry out such a method using a test signal having a crest factor of one with relatively little cost, use is made as test signal of a binary, bipolar random number sequence signal (m(t)) having the crest factor of one, and during a time interval corresponding to the period of the test signal (m(t)) the received signal (g(t)) is scanned and subjected to a Fourier transformation to obtain a spectral signal (G(jf)); the latter is complexly multiplied by a reference spectrum Mi(jf) to obtain an output signal (H(jf) which represents a measure of the transmission characteristics of the line (31).Type: GrantFiled: September 27, 1993Date of Patent: May 16, 2000Assignee: Tektronix, Inc.Inventors: Hans Werner Arweiler, Andreas Wolf
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Patent number: 5977774Abstract: A method for determining whether a circuit under test is open is presented. A digital-to-analog converter is dithered to generate a known signal. This known signal is summed with an external attenuation signal which is brought into the system from a probe on the circuit under test. This summation is then measured by an analog-to-digital converter (ADC). If the known signal is not attenuated by the probe (i.e., the ADC measures essentially the known signal), we can conclude that the circuit is open.Type: GrantFiled: October 31, 1997Date of Patent: November 2, 1999Assignee: Hewlett-Packard CompanyInventors: Robert H. Noble, Robert B. Smith
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Patent number: 5818240Abstract: A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal.Type: GrantFiled: December 12, 1996Date of Patent: October 6, 1998Assignee: Audio Precision, Inc.Inventor: Richard C. Cabot
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Patent number: 5818905Abstract: A measurement method and measuring circuit are described for high-speed measurement of subscriber line impedance without the influence of counter electromotive force of the bell circuit or hum noise. A measurement current is supplied from a controlled-current source to each of a pair of subscriber lines by way of switches, and subscriber line voltage and current values are measured during the transient state. A measurement time interval is divided into a first-half and a second-half interval, the average values of the voltage and current are detected for each time interval, and moreover, the difference between voltages at the beginning and end of each time interval is detected. In this case, the controlled-current source is controlled by a control means such that the rate of change of the current value over time remains at or below a fixed value.Type: GrantFiled: January 6, 1997Date of Patent: October 6, 1998Assignee: NEC CorporationInventor: Masahiko Ohno
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Patent number: 5760596Abstract: A method of testing series passive components in electronic assemblies. Only one test pin per passive component is required, thereby reducing the cost and complexity of test fixtures and the electronic assemblies. A passive component is connected between the output of a driving circuit and (optionally) an input of a receiving circuit. The output of the driving circuit is placed in a low impedance state. The receiving end of the passive component is stimulated and the response is measured. For reactive components, the stimulus and response are AC. For resistors, multiple DC measurements may be made. A optional DC bias may be provided to limit DC current and to further reduce the small signal output impedance of the driving circuit.Type: GrantFiled: March 3, 1997Date of Patent: June 2, 1998Assignee: Hewlett-Packard CompanyInventors: Ronald J. Peiffer, Kenneth P. Parker
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Patent number: 5708363Abstract: A liquid conductivity measurement system is disclosed that accurately measures a liquid's conductivity over a range spanning at least several orders of magnitude using just a single sensor, but minimizing the adverse effects of capacitive and other non-linear factors on the conductivity measurement. The system includes a sensor having two spaced-apart electrodes immersed in the liquid and a drive signal source that applies to the sensor an ac electrical signal having a selected frequency and predetermined magnitude. A voltage detector monitors a sensor voltage signal across the sensor's two electrodes and produces a measurement of the liquid's conductivity. The drive signal source is configured to iteratively adjust the frequency of the ac electrical signal based on the sensor voltage signal, to optimize the liquid's conductivity measurement.Type: GrantFiled: October 16, 1995Date of Patent: January 13, 1998Assignee: Signet Scientific CompanyInventors: Ronald J. Yates, Martin M. Munzer, Frederic D. Hook
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Patent number: 5701082Abstract: Apparatus and method for low cost monitoring the level of signal at a test point in a system for susceptibility to electromagnetic fields. A probe, including a detector diode, and a non-metallic, electrically overdamped conductor, which is transparent to the electromagnetic field, is used to monitor the signal level at a test point as an amplitude modulated radio frequency carrier. The carrier is transmitted to a monitor outside of the range of the electromagnetic field using a transmission link, such as an optical waveguide transmitter, that is transparent to the electromagnetic field when the system under test fails. The probe may include a plurality of detector diodes mounted on a printed circuit board in a shielded structure that is directly connected to the test wire of the circuit to be monitored.Type: GrantFiled: June 7, 1996Date of Patent: December 23, 1997Assignee: Electronic Development, Inc.Inventor: Wesley A. Rogers
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Patent number: 5689192Abstract: Apparatus and method for low cost monitoring the level of signal at a test point in a system for susceptibility to electromagnetic fields. A probe, including a detector diode, and a non-metallic, electrically overdamped conductor, which is transparent to the electromagnetic field, is used to monitor the signal level at a test point as an amplitude modulated radio frequency carrier. The carrier is transmitted to a monitor outside of the range of the electromagnetic field using a transmission link, such as an optical waveguide transmitter, that is transparent to the electromagnetic field when the system under test fails. The system under test can then be removed from the electromagnetic field and, for each frequency at which the system failed, a voltage can be injected, using a voltage injection probe, into the system at another point to recreate the detected level of signal at the test point that was coupled into the system from the electromagnetic field.Type: GrantFiled: June 7, 1996Date of Patent: November 18, 1997Assignee: Electronic Development, Inc.Inventor: Wesley A. Rogers
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Patent number: 5514969Abstract: A power monitoring instrument evaluates and displays the source impedance, load impedance, and distribution system impedance of an alternating current power system using voltage and current measurements taken at a source and load of the power system. The power monitoring instrument and associated voltage and current pods for coupling to voltage probes and current clamps incorporate unique safety features to minimize operator exposure to high-voltage. The measurements are performed noninvasively without disconnecting elements of the power system. Evaluation of impedances takes advantage of incidental variations in the load characteristics.Type: GrantFiled: May 24, 1994Date of Patent: May 7, 1996Assignee: Reliable Power Meters, Inc.Inventors: Robert E. Moore, Frederic W. Nitz