Plural Diverse Parameters Patents (Class 324/630)
  • Patent number: 11621568
    Abstract: A fast charging method for an electronic device is disclosed. The method includes obtaining, when the electronic device has a successful communication handshake with a USB host device using the USB interface, a corresponding charging data set of the electronic device under the charging current threshold by means of measurement according to a preset charging current threshold. The charging current threshold includes at least a first charging current threshold and a second charging current threshold. The charging data set includes at least a corresponding first charging voltage value and a corresponding first charging current value of the electronic device under the first charging current threshold, and a corresponding second charging voltage value and a corresponding second charging current value of the electronic device under the second charging current threshold. The method further includes determining, according to the charging data set, a maximum charging current value.
    Type: Grant
    Filed: May 17, 2019
    Date of Patent: April 4, 2023
    Assignee: HONOR DEVICE CO., LTD.
    Inventor: Fuzhou Xiao
  • Patent number: 11249528
    Abstract: A power supply device for supplying power to a server and a power supply management system are provided. The device includes: a power supply control chip, a first connector, a voltage comparator, a counter and a resistance regulation circuit. The resistance regulation circuit includes a pull-up resistance circuit and a pull-down resistance circuit including multiple resistor branches and switches. An input terminal of the voltage comparator is connected to an address input terminal, the other input terminal of the voltage comparator is connected to a connection point of the resistance regulation circuit. An input terminal of the counter is connected to an output terminal of the voltage comparator, each output terminal of the counter is connected to one switch and controls a state of the switch. Each output terminal of the counter is connected to one address pin of the power supply control chip.
    Type: Grant
    Filed: December 28, 2017
    Date of Patent: February 15, 2022
    Assignee: ZHENGZHOU YUNHAI INFORMATION TECHNOLOGY CO LTD
    Inventor: Siheng Luo
  • Patent number: 9625556
    Abstract: An impedance synthesis method for single and multi-probe high resolution slide screw impedance RF and microwave tuners employs a fast calibration algorithm, which creates appropriately distributed calibration points over the Smith chart and a second order interpolation algorithm between calibration points, optimized for best suitability to the natural behavior of the tuners. The fast tuning algorithm uses a general search in order to identify the closest calibrated points, followed by a gradient search using fine interpolation grid in order to reach the final target. The method is applicable, after proper data preparation, also to double and triple probe harmonic tuners. The method allows tuning accuracy as high as ?60 dB, or deviation-from-target vector distance of 0.001 units on the Smith chart, whereas absence of the fine grid interpolation typically yields accuracies of the order of ?20 dB, or a deviation-from-target vector distance of 0.1 reflection factor units.
    Type: Grant
    Filed: February 7, 2011
    Date of Patent: April 18, 2017
    Inventor: Christos Tsironis
  • Publication number: 20150042360
    Abstract: A method for person identification includes acquiring a data from impedance measurements on the body of a person and comparing the data with a reference data relating to the person. The method further includes inferring an identity of the person from the comparison. The method further includes carrying out the impedance measurements by a combination of at least one two-pole measurement and at least one four-pole measurement.
    Type: Application
    Filed: August 6, 2014
    Publication date: February 12, 2015
    Inventors: Kathrin Graner, Henning Hayn, Tatjana Thumm
  • Publication number: 20130293244
    Abstract: A material-discerning proximity sensor is arranged to include an antenna that is arranged to radiate a radio-frequency signal. A capacitive sensor is arranged to detect a change in capacitance of the capacitive sensor and to receive the radio-frequency signal. An electrical quantity sensor is arranged to detect a change of the received radio-frequency signal.
    Type: Application
    Filed: June 26, 2012
    Publication date: November 7, 2013
    Applicant: TEXAS INSTRUMENTS, INCORPORATED
    Inventor: Alan Henry Leek
  • Publication number: 20130249569
    Abstract: A measuring part measures the amount of matter dispersed in a suspension on the basis of a measurement, in which electromagnetic radiation interacts with the suspension, and the proportional volume of a free gas contained in the suspension on the basis of a measurement of electrical conductivity and/or impedance distribution for determining the amount of dispersed solid matter in the suspension.
    Type: Application
    Filed: November 29, 2011
    Publication date: September 26, 2013
    Applicant: METSO AUTOMATION OY
    Inventors: Sami Saarenmaa, Marko Heikkinen, Matti-Paavo Saren, Arvo Rahikkala
  • Patent number: 8456176
    Abstract: This invention relates to a hybrid passive agent system impedance monitoring station and method. The method of monitoring impedance of an electrical system includes the steps of providing an impedance monitoring station adapted to test and monitor system impedance, solving for system impedance in a time domain, solving for system impedance in a frequency domain, and determining a time domain driving point impedance and a frequency domain driving point impedance to identify the impedance of the system.
    Type: Grant
    Filed: October 6, 2009
    Date of Patent: June 4, 2013
    Assignee: Electric Power Research Institute, Inc.
    Inventors: Matthew Robert Rylander, William Mack Grady, Arshad Mansoor, Frederic Gorgette
  • Publication number: 20130027140
    Abstract: The described systems and methods can facilitate examination of device parameters including analysis of relatively dominant characteristic impacts on delays. In one embodiment, at least some coupling components (e.g., metal layer wires, traces, lines, etc.) have a relatively dominate impact on delays and the delay is in part a function of both capacitance and resistance of the coupling component. In one embodiment, a system comprises a plurality of dominate characteristic oscillating rings, wherein each respective one of the plurality of dominate characteristic oscillating rings includes a respective dominate characteristic. Additional analysis can be performed correlating the dominate characteristic delay impact results with device fabrication and operation.
    Type: Application
    Filed: June 20, 2012
    Publication date: January 31, 2013
    Applicant: NVIDIA CORPORATION
    Inventors: Wojciech Jakub Poppe, Ilyas Elkin, Puneet Gupta
  • Patent number: 8305088
    Abstract: A process for differentiating conductive and/or ferromagnetic objects (O) in a material stream (2) comprises generating an electromagnetic alternating field by exciting a coil (S) with a sinusoidal voltage (ue(t)) of a constant frequency (fM), detecting an impedance change in the coil, which has been caused by an object (O), by determining at least one pair of values from a peak value (ÎM) and a phase shift (?m) of the coil current (iM(t)) toward the excitation potential (ue(t)) of the coil, and determining the material by comparing the peak values (ÎM) and phase shifts (?m) with reference values, wherein the peak values (ÎM) of the coil current (iM(t)) are calculated at at least one measuring phase angle (?m) with the aid of a window comparator having a constant window width (?i), wherein the time (?tM) between the window inlet point (p4) and the window outlet point (p6) of the coil current (iM(t)) is measured and the gradient of the current profile (iM(t)) is calculated from the window width (?i) and the me
    Type: Grant
    Filed: February 22, 2008
    Date of Patent: November 6, 2012
    Assignee: EVK di Kerschhaggl GmbH
    Inventors: Michael Kiss, Bernhard Kohla, Bernd Graze
  • Patent number: 7929580
    Abstract: Pulses of signals in the terahertz region are generated using an apparatus made up of a mode-locked semiconductor laser diode with a short duty cycle that is optically coupled to a biased Auston switch. The output from the mode-locked semiconductor laser diode may first be supplied to a pulse compressor, and the resulting compressed pulses supplied to the Auston switch. Preferably, the mode-locking of the semiconductor laser diode is controllable, i.e., it is an active mode-locking semiconductor laser, so that the phase of the output optical signal from the laser is locked to the phase of an input control signal.
    Type: Grant
    Filed: September 22, 2006
    Date of Patent: April 19, 2011
    Assignee: Alcatel-Lucent USA Inc.
    Inventor: Lothar Benedict Erhard Josef Moeller
  • Patent number: 7847564
    Abstract: A probe (1) for measuring the conductivity of a solution comprises a hydraulic part and an electronic part; the hydraulic part comprises a conduit (2) in the shape of a double tuning fork having an inlet (3) and an outlet (4) for the solution whose conductivity is to be measured; the electronic part comprises an energizing toroidal coil (7) and a receiving toroidal coil (22), both fitted round the conduit (2); the receiving coil (22) is mutually concatenated with the energizing coil (7) through an electromagnetic flux (F) generated by the energizing coil (7) in the respective toroid (T1) and through the solution circulating in the conduit (2); the probe (1) also comprises a feedback circuit (111) to keep the electromagnetic flux (F) constant.
    Type: Grant
    Filed: August 2, 2007
    Date of Patent: December 7, 2010
    Assignee: Tecnologie Dinamiche S.A.S. di Rossi Vincenzo & C.
    Inventor: Vincenzo Rossi
  • Publication number: 20100164512
    Abstract: The invention relates to a method for differentiating conductive and/or ferromagnetic objects (O) in a material stream (2), comprising the generation of an electromagnetic alternating field by means of exciting a coil (S) having a sinusoidal voltage (ue(t)) of a constant frequency (fM), the detection of an impedance change of the coil caused by an object (O) by determining at least one pair of values from a peak value (ÎM) and a phase shift (?M) of the coil current (iM(t)) for the excitation voltage (ue(t)) of the coil, and the determination of the material by comparing the peak values (ÎM) and the phase shifts (?M) to reference values, wherein the peak values (ÎM) of the coil current (iM(t)) are calculated at least one measuring phase angle (?M) by means of a limit comparator at a constant limit width (?i), wherein the time (?tM) between the limit entry point (p4) and the limit exit point (p6) of the coil current (iM(t)) is measured, and the increase of the current path (iM(t)) is calculated from the limit w
    Type: Application
    Filed: February 22, 2008
    Publication date: July 1, 2010
    Inventors: Michael Kiss, Bemhard Kohla, Bemd Graze
  • Patent number: 7683633
    Abstract: A system for measuring a frequency response of an electrical network includes a signal source, a signal source path, a reflectometer receiver interactively associated with the signal source path by a directional coupler, and one or more additional reflectometer receivers arranged in series along the signal source path and associated with the signal source path by one or more respective additional directional couplers. The directional coupler and one or more respective additional directional couplers operate at different frequency ranges.
    Type: Grant
    Filed: September 11, 2007
    Date of Patent: March 23, 2010
    Assignee: Anritsu Company
    Inventor: Karam Michael Noujeim
  • Patent number: 7518379
    Abstract: A connection unit for electrically connecting a DUT mounting board, on which an IC socket is mounted, with a testing apparatus for testing an electronic device inserted into the IC socket, the connection unit has a holding substrate provided to face the DUT mounting board and a connection-unit-side connector, which is provided on the holding substrate to be able to change a position of the connection-unit-side connector on the holding substrate, for being connected to a performance-board-side connector included in the DUT mounting board.
    Type: Grant
    Filed: July 14, 2006
    Date of Patent: April 14, 2009
    Assignee: Advantest Corp.
    Inventors: Kentaro Pukushima, Masashi Hoshino
  • Publication number: 20090009187
    Abstract: A method for identifying connected devices and an electronic device using the method are disclosed. When the connected device is connected to the electronic device, a type of the connected device is identified based on the voltage change according to a change of current flowing in therebetween, and then a corresponding function is performed based on the identified type.
    Type: Application
    Filed: June 19, 2008
    Publication date: January 8, 2009
    Applicant: Samsung Electronics Co. Ltd.
    Inventor: Dong Hoon KWAK
  • Publication number: 20080094072
    Abstract: A system for measuring a frequency response of an electrical network, comprises a signal source, a signal source path, a reflectometer receiver interactively associated with the signal source path by a directional coupler, and one or more additional reflectometer receivers arranged in series along the signal source path and associated with the signal source path by one or more respective additional directional couplers. The directional coupler and one or more respective additional directional couplers operate at different frequency ranges.
    Type: Application
    Filed: September 11, 2007
    Publication date: April 24, 2008
    Applicant: ANRITSU COMPANY
    Inventor: Karam Michael Noujeim
  • Publication number: 20080030204
    Abstract: A probe (1) for measuring the conductivity of a solution comprises a hydraulic part and an electronic part; the hydraulic part comprises a conduit (2) in the shape of a double tuning fork having an inlet (3) and an outlet (4) for the solution whose conductivity is to be measured; the electronic part comprises an energizing toroidal coil (7) and a receiving toroidal coil (22), both fitted round the conduit (2); the receiving coil (22) is mutually concatenated with the energizing coil (7) through an electromagnetic flux (F) generated by the energizing coil (7) in the respective toroid (T1) and through the solution circulating in the conduit (2); the probe (1) also comprises a feedback circuit (111) to keep the electromagnetic flux (F) constant.
    Type: Application
    Filed: August 2, 2007
    Publication date: February 7, 2008
    Applicant: TECNOLOGIE DINAMICHE S.a.s. di Rossi Vincenzo & C.
    Inventor: Vincenzo Rossi
  • Patent number: 6690176
    Abstract: A tunable ferroelectric component and a narrowband resonant circuit for measuring the loss of the ferroelectric component. The ferroelectric component may be a capacitor integrated in the resonant circuit. The testing method eliminates other sources of loss to isolate the loss due to the ferroelectric material and to demonstrate that this loss is low.
    Type: Grant
    Filed: August 8, 2001
    Date of Patent: February 10, 2004
    Assignee: Kyocera Wireless Corporation
    Inventor: Stanley S. Toncich
  • Patent number: 6646450
    Abstract: The present invention provides an improved measuring circuit for measuring a current of an inductor with minimum losses and errors. According to one embodiment of the invention, the measuring circuit comprises an op-amp, a RC network connected in a feedback loop of the op-amp, and a scaling resistor connected in series to one of the input terminals of the op-amp. By setting the RC constant of the RC network to be equal to the ratio of the inductor value over its internal resistance value, the inductor current can be derived independent of the frequencies of AC signals.
    Type: Grant
    Filed: October 16, 2001
    Date of Patent: November 11, 2003
    Assignee: Koninklijke Philips Electronics N.V.
    Inventor: Jerome E. Liebler
  • Publication number: 20030071636
    Abstract: The present invention provides an improved measuring circuit for measuring a current of an inductor with minimum losses and errors. According to one embodiment of the invention, the measuring circuit comprises an op-amp, a RC network connected in a feedback loop of the op-amp, and a scaling resistor connected in series to one of the input terminals of the op-amp. By setting the RC constant of the RC network to be equal to the ratio of the inductor value over its internal resistance value, the inductor current can be derived independent of the frequencies of AC signals.
    Type: Application
    Filed: October 16, 2001
    Publication date: April 17, 2003
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventor: Jerome E. Liebler
  • Patent number: 6452400
    Abstract: A probe (6) is brought into contact with a plasma produced by ionizing Ar gas, a saturation current (Ies2) at which current flowing through the probe is saturated when the potential of the probe is changed in a potential region where the potential of the probe is higher than a ground potential, and a saturation current (Iis2) at which current flowing through the probe is saturated when the potential of the probe is changed in a potential region where the potential of the probe is lower than the ground potential. Similarly, saturation currents (Ies2, Iis2) are measured by bringing the probe (6) into contact with a plasma produced by ionizing a mixed gas containing Ar gas and a process gas, such as C4F8 gas, and changing the potential of the probe (6). The negative ion density of the plasma produced by ionizing C4F8 gas is determined by using saturation current ratios (Iis1/Iis2, Ies1/Ies2).
    Type: Grant
    Filed: June 19, 2000
    Date of Patent: September 17, 2002
    Assignee: Tokyo Electron Limited
    Inventors: Yoshinobu Kawai, Yoko Ueda, Nobuo Ishii, Satoru Kawakami
  • Patent number: 5656932
    Abstract: A non-contact type wave signal observation apparatus measures transfer functions of a distributed constant network. A signal is input from a network analyzer to the network to be measured. Electromagnetic waves radiated from the network are received at each observation point on an observation plane arranged in a manner facing the network. The received signals are input to the network analyzer. The transfer functions between an input terminal of the network and each observation point are measured by the network analyzer. The measured transfer functions are converted by an inverse-Fresnel transformer and are stored in memories. The stored data is specified by a control unit and is displayed on a display unit. The stored data can be converted by an inverse-Fourier transformer and is displayed on the display unit as waveforms.
    Type: Grant
    Filed: January 12, 1995
    Date of Patent: August 12, 1997
    Assignee: Advantest Corporation
    Inventor: Hitoshi Kitayoshi
  • Patent number: 5105157
    Abstract: A system for determining the average water film thickness on surfaces, and in particular roadways, with the reflection of microwaves on the surface of the film of water being measured. To be able to easily measure water film thicknesses of several millimeters without contact and with great accuracy, the system includes at least two partial systems which each comprise a signal source and a receiver. The individual partial systems operate at different frequencies which are selected such that the maximum accuracy measuring regions associated with the respective frequencies are contiguous and cover the predetermined water film thickness range to be determined. The partial systems are connected with a sampling and control device which activates at least that partial system which exhibits maximum measuring accuracy for the respective water film thickness being measured and utilizes only the output signal from the receiver of that partial system for the measurement.
    Type: Grant
    Filed: December 6, 1990
    Date of Patent: April 14, 1992
    Assignee: TZN Forschungs- und Entwicklungszentrum Unterluss GmbH
    Inventor: Klemens Schmitt
  • Patent number: 5020920
    Abstract: A method and apparatus for generating thermal waves in a sample and for measuring thermal inhomogeneities at subsurface levels using millimeter-wave radiometry. An intensity modulated heating source is oriented toward a narrow spot on the surface of a material sample and thermal radiation in a narrow volume of material around the spot is monitored using a millimeter-wave radiometer; the radiometer scans the sample point-by-point and a computer stores and displays in-phase and quadrature phase components of thermal radiations for each point on the scan. Alternatively, an intensity modulated heating source is oriented toward a relatively large surface area in a material sample and variations in thermal radiation within the full field of an antenna array are obtained using an aperture synthesis radiometer technique.
    Type: Grant
    Filed: November 3, 1989
    Date of Patent: June 4, 1991
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Nachappa Gopalsami, Apostolos C. Raptis