For Figure Of Merit Or Q Value Patents (Class 324/653)
  • Patent number: 11218014
    Abstract: The present disclosure relates to a circuitry and a method for detecting a temperature of a wireless charging coil, and a storage medium. The circuitry includes: a target resistor, a voltage supply circuit, a voltage detection circuit, and a processing component. The voltage supply circuit is configured to apply a target voltage to the series circuit. The voltage detection circuit is configured to obtain a first measured voltage across two ends of the wireless charging coil and a second measured voltage across two ends of the target resistor. The processing component is configured to: determine a working current of the series circuit based on the second measured voltage and a resistance of the target resistor; determine a real-time resistance of the wireless charging coil based on the first measured voltage and the working current; determine a real-time temperature of the wireless charging coil based on the real-time resistance.
    Type: Grant
    Filed: August 30, 2019
    Date of Patent: January 4, 2022
    Assignee: BEIJING XIAOMI MOBILE SOFTWARE CO., LTD.
    Inventors: Chunjie Zhang, Hui Li
  • Patent number: 9859094
    Abstract: In an image forming method of charged particle beam apparatus for scanning a sample by irradiating the sample with a converged charged particle beam and detecting secondary charged particles generated from the sample by a detection unit, receiving and processing an output signal from the detection unit, and receiving the processed signal and forming an image of the sample, receiving and processing the output signal are performed by analogically processing the output signal and by performing pulse-count processing on the output signal, and pulse-count processing is performed by removing a ringing pulse in the output signal and counting pulses in the signal from which the ringing pulse has been removed.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: January 2, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Wen Li, Kazuki Ikeda, Takuma Nishimoto, Hiroyuki Takahashi, Hajime Kawano
  • Publication number: 20130063160
    Abstract: There is provided a sensing device including a circuit including at least a coil electromagnetically coupled to an outside; a temperature detection unit for detecting a temperature of the coil; a sensing unit for measuring a Q value of the circuit; and a correction unit for correcting the Q value measured by the sensing unit based on temperature information detected by the temperature detection unit.
    Type: Application
    Filed: August 31, 2012
    Publication date: March 14, 2013
    Applicant: SONY CORPORATION
    Inventors: Hiroaki Nakano, Tomomichi Murakami, Osamu Kozakai, Kenichi Fujimaki
  • Patent number: 6832507
    Abstract: The system comprises at least one electronic sensor for detecting the presence of moisture. The system further comprises at least one reading device for obtaining information from the sensor about the presence of moisture. The sensor comprises a resonant circuit which is at least partly formed from a moisture sensitive material, the electrical resistance of which increases when the material comes into contact with moisture. The reading device comprises transmitter-receiver means for generating an elecromagnetic interrogation field.
    Type: Grant
    Filed: September 19, 2001
    Date of Patent: December 21, 2004
    Assignee: Telesensing Holding B.V.
    Inventors: Jan van de Berg, Peter Hillebrand de Haan
  • Patent number: 6583630
    Abstract: A distance measurement system is provided. The distance measurement system includes at least one resonant circuit, at least one magnetic element with predetermined magnetic properties, a transmitter operable to transmit an electromagnetic pulse, a receiver operable to detect oscillations emitted by said resonant circuit in response to said electromagnetic pulse, and an analyzer operable to analyze an amplitude envelope property of said oscillations, to thereby determine a distance between the resonant circuit and the magnetic element.
    Type: Grant
    Filed: January 31, 2001
    Date of Patent: June 24, 2003
    Assignee: IntelliJoint Systems Ltd.
    Inventors: Emanuel Mendes, David Mendes, Ruth Beer, Gilad Barak
  • Patent number: 6528859
    Abstract: The present invention provides a foil wound low profile power L-C processor. A magnetic winding is disposed within a core. The magnetic winding can be made of one or more sets of conductive foil and insulation film wound together in a spiral pattern. The magnetic winding can also include dielectric film. The magnetic winding can have a center aperture in which a non-magnetic and non-conductive center post can be disposed. The center post can also be divided into portions with a combined length less than the length of the center aperture to form an air gap within the center aperture.
    Type: Grant
    Filed: May 11, 2001
    Date of Patent: March 4, 2003
    Assignee: Koninklijke Philips Electronics N.V.
    Inventor: Willem G. Odendaal
  • Patent number: 6366096
    Abstract: An apparatus and method for accurately estimating the absolute value of surface resistances and penetration depths of metallic films and bulk samples. The apparatus carries out measurements using two nominally identical samples with flat sample surfaces which are brought together with a thin dielectric separation of variable thickness sandwiched between the samples in order to form a two-conductor parallel plate transmission line resonator which carries an electromagnetic wave. A liquid or gas of unknown dielectric properties fills the dielectric spacer. A resonant condition of the microwave signal is established and the resonant frequency and the quality factor Q are measured while the spacing between the sample plates is varied. The variation of the resonant frequency and Q with spacer thickness is then analyzed to yield absolute values of the sample surface resistance and penetration depth which are then further used for determination of absolute complex conductivity and surface impedance of the samples.
    Type: Grant
    Filed: August 4, 2000
    Date of Patent: April 2, 2002
    Assignee: University of Maryland, College Park
    Inventors: Vladimir V. Talanov, Steven Mark Anlage
  • Patent number: 6345228
    Abstract: A road vehicle sensor provides an output signal having a magnitude which varies with time through a plurality of values as a vehicle passes the sensor. Signal processing apparatus monitors the timing of sensor signals generated from sensors in adjacent lanes of a highway and provides an indication when such sensor signals could correspond to a double count with a single vehicle being detected by both sensors. Then, the geometric mean of the amplitudes of the sensor signals from the sensors in adjacent lanes is calculated and is used to indicate a double count if the geometric mean is below a threshold value. Signal processing arrangements are also described to detect tailgating vehicles which may be simultaneously detected by a sensor, and for determining the length of slow moving or stationary traffic.
    Type: Grant
    Filed: August 5, 1998
    Date of Patent: February 5, 2002
    Assignee: Diamond Consulting Services Limited
    Inventor: Richard Andrew Lees
  • Patent number: 6242938
    Abstract: An electric circuit for determining the load current of a clocked load having at least one inductive component and being assigned a free-wheeling circuit has a shunt whose voltage drop is used to determine the current. The shunt is arranged in the free-wheeling circuit to determine the free-wheeling current which is used as a measure for determining the load current (motor current). Furthermore, according to another embodiments the shunt is in series with the load and the free-wheeling circuit is arranged in parallel to the series connection of load and shunt.
    Type: Grant
    Filed: June 4, 1999
    Date of Patent: June 5, 2001
    Assignee: Robert Bosch GmbH
    Inventor: Martin Kessler
  • Patent number: 6025725
    Abstract: A planar electromagnetic resonator utilizes an electromagnetically active material located between the capacitive or inductive elements of the resonator. A microscopic electrical property of this material is altered by an external condition, and that alteration, in turn, affects the behavior of the resonator in a consistent and predictable manner.
    Type: Grant
    Filed: December 4, 1997
    Date of Patent: February 15, 2000
    Assignee: Massachusetts Institute of Technology
    Inventors: Neil Gershenfeld, Richard Fletcher
  • Patent number: 5869958
    Abstract: A method of determining a response characteristic of a microwave device includes coupling a microwave resonator to the device, loading the resonator with microwave radiation, monitoring the time decay of power from the resonator, and comparing the monitored time decay with a known characteristic of the time decay of radiation in the microwave resonator when loaded with radiation.
    Type: Grant
    Filed: May 19, 1997
    Date of Patent: February 9, 1999
    Assignee: The Secretary Of State For Trade And Industry
    Inventors: John Charles Gallop, Conway David Langham
  • Patent number: 5420518
    Abstract: An electronic resonator is employed for the on-line nondestructive measurement of microstructure, as defined by the diameter of grains of the type found in ferritic steel alloys during high rate formation processes. The quality factor (Q) of an inductive-capacitive (LC) tank circuit is determined to obtain a measure of energy dissipated in a steel alloy sample inductively coupled to it. Dissipative energy in the sample results from two sources, hysteresis and eddy currents. Eddy current loss is relatively microstructure insensitive and is mainly related to chemical composition and temperature while hysteresis loss is determined by microstructural factors. If microstructural variables other than grain size, and the factors determining eddy current loss are held constant, grain size becomes the dominant factor in differential energy loss with grain size being inversely related to hysteresis loss.
    Type: Grant
    Filed: September 23, 1993
    Date of Patent: May 30, 1995
    Inventor: Kenneth L. Schafer, Jr.
  • Patent number: 5142228
    Abstract: Method and apparatus for non-destructively monitoring the thickness and uniformity of electrically conductive coatings (12) that have been deposited upon optical waveguide fibers (10). The monitoring may be performed while coated fiber (22) is at rest or while it is in motion. Physical contact with fiber (22) is not required. Monitoring is accomplished by feeding coated fibers (22) through an inductive coil (24) while simultaneously measuring an electrical value that is dependent upon the electrical resistance of conductive coating (10) then passing through inductive coil (24). The electrical value measured for a given section of coated fiber (22) becomes indicative of the coating thickness and uniformity of the coating about optical waveguide fiber (10) by correlating the electrical value measured with previously measured electrical values generated by coated fibers having coatings of known thicknesses and having no bald spots or other non-uniformities.
    Type: Grant
    Filed: March 14, 1991
    Date of Patent: August 25, 1992
    Assignee: Corning Incorporated
    Inventor: Paul I. Kingsbury
  • Patent number: 5072186
    Abstract: An electric coil to be tested for interturn and/or interlayer faults is coupled into a series resonant circuit. A measurement of the quality-factor (Q-factor) is carried out by measuring the overshoot voltage in circuit resonance. Through the selection of a suitable capacitance in the series resonant circuit, the resonant frequency can be placed in a range in which the quality-factor of the coil attains its maximum value. The coil to be tested is therefore a component of a series resonant circuit. The measuring system for determining the quality-factor of the coil is low capacitively coupled into the resonant circuit. Because the interturn resistance of the test coil must be measured in any event, since this value is also obtained during Q-factor measurement, the necessary operating and measuring periods can be optimized.
    Type: Grant
    Filed: February 1, 1990
    Date of Patent: December 10, 1991
    Assignee: Siemens Aktiengesellschaft
    Inventor: Wolfgang Trampert
  • Patent number: 4968945
    Abstract: An apparatus and method for measurement of ohmic loss and surface resistivity is provided with a straight lumen waveguide with at least one opening at one end. Diffraction of radiation introduced to the lumen at one end of the tube provides feedback to establish resonances within the tube. Using the "whispering gallery" resonant modes maximizes the total ohmic loss and thereby enhances sensitivity of resistivity measurements. The angle at which resonant radiation exits the lumen is a function of the mode and size of the operative. Thus, preferred spatial detection allows enhancement of the device signal while discriminating against undesired modes. Selection of modes allows high frequency measurements, into the tetraherz range, to be made without disabling restrictions in the device dimensions, spatial input/output coupling or ohmic loss depending on alignment for analysis of, for example, high temperature superconductors.
    Type: Grant
    Filed: December 2, 1988
    Date of Patent: November 6, 1990
    Assignee: Massachusetts Institute of Technology
    Inventors: Paul P. Woskov, Daniel R. Cohn