To Determine Dimension (e.g., Distance Or Thickness) Patents (Class 324/699)
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Publication number: 20130076379Abstract: Embodiments of suspension clamps for use in testing membrane samples used in fuel cells are provided. One example of a suspension clamp comprises a frame, a clamp member, a plurality of electrodes, and a suspension component. The clamp member is hingedly attached to one end of the frame. Each of the plurality of electrodes extends along a membrane-facing surface of at least one of the clamp member and the frame. A suspension component is attached to at least one of the clamp member and the frame and is configured to suspend the suspension clamp during testing of a membrane sample. The suspension clamp can be used to measure one or more of resistance, impedance, conductance, proton permeability and through-thickness of the membrane sample.Type: ApplicationFiled: September 22, 2011Publication date: March 28, 2013Applicant: NISSAN NORTH AMERICA, INC.Inventors: GREGORY JAMES DILEO, KEVORK ADJEMIAN
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Patent number: 8395398Abstract: Mixtures containing homogeneously-sized particles with a minimum concentration of agglomerates or larger particles are desired in various manufacturing processes such as, for example, in the manufacture and use of chemical mechanical polishing slurries, food emulsions, pharmaceutical products, paints, and print toner. The method disclosed herein provides these industries with an accurate and efficient method of screening such mixtures for such agglomerates and large particles. The method generally includes preparing a suspension of the mixture in an electrolyte, wherein the suspension includes a specified concentration of small particles per unit of electrolyte. The method further includes passing the prepared suspension, and a plurality of the particles therein, through an aperture of a device capable of characterizing particles according to the Coulter principle to obtain data on the particles.Type: GrantFiled: April 23, 2010Date of Patent: March 12, 2013Assignee: Beckman Coulter, Inc.Inventors: Renliang Xu, Yiming Yang
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Patent number: 8384403Abstract: In a system or method to detect an electrical potential and layer thickness of a layer of toner particles in a printer or copier, a measurement arrangement is provided having a first electrode and at least one second electrode situated opposite the first electrode. An intermediate image carrier is provided on a surface of which a toner image is generated. A drive unit drives the intermediate image carrier so that its surface is directed past the first electrode situated opposite the surface. An evaluation unit is electrically connected with the first electrode. The evaluation unit detects an electrical current flowing between the first electrode and the evaluation unit. The evaluation unit determines an electrical charge of toner particles arranged in a detection region in a first measurement procedure with aid of the detected current. The evaluation unit also determines the layer thickness of the layer of toner particles in an inked region via at least one second measurement procedure.Type: GrantFiled: February 20, 2008Date of Patent: February 26, 2013Assignee: Océ Printing Systems GmbHInventors: Alfred Zollner, Markus Jeschonek
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Patent number: 8373426Abstract: An arrangement for indicating correct installation of a plug-in unit (102) of a telecommunications device includes at least one distance indicator (106) located in the plug-in unit and adapted to produce an indication for correct installation of the plug-in unit in response to a situation where the distance of the distance indicator from a wall (107) of the frame of the telecommunications device is smaller than a predetermined threshold value. The distance indicator, which may be e.g. an electromechanical limit switch or capacitive distance sensor, is adapted to produce the indication for correct installation without a need for a galvanically conducted electric current between the distance indicator and the frame of the telecommunications device. There is thus no need to make any electric circuit arrangements in the frame of the telecommunications device for the indication of correct installation of a plug-in unit.Type: GrantFiled: May 11, 2010Date of Patent: February 12, 2013Assignee: Tellabs OyInventor: Jari Matero
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Publication number: 20130002270Abstract: A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.Type: ApplicationFiled: September 14, 2012Publication date: January 3, 2013Applicant: GENERAL ELECTRIC COMPANYInventors: Emad Andarawis Andarawis, Chukwueloka Obiora Umeh
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Patent number: 8339149Abstract: A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.Type: GrantFiled: August 30, 2010Date of Patent: December 25, 2012Assignee: General Electric CompanyInventors: Emad Andarawis Andarawis, Chukwueloka Obiora Umeh
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Patent number: 8336406Abstract: A conduit interrogation tool is provided that includes a pair of spaced apart contact elements that deform as the tool moves in the conduit. A deformation control member positioned proximate the contact element reduces or limits deformation of the contact element to a desired extent.Type: GrantFiled: March 11, 2008Date of Patent: December 25, 2012Assignee: Baker Hughes IncorporatedInventors: Paul Pirner, Vyacheslav Akulshyn
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Patent number: 8212575Abstract: A matrix analyzer for determining the size and location of a conductive item placed thereon. The matrix analyzer includes plural row conductors and column conductors with a corresponding grid of conductive areas exposed on the surface of the matrix analyzer. When a conductive item, such as an ink droplet, is jetted onto the matrix analyzer, the intersection of various row conductors and column conductors exhibit a low resistance. The rows and columns of the matrix analyzer can be sequentially accessed to find those intersections where the low resistance exists. From such data, the size and location of the ink droplets can be determined.Type: GrantFiled: December 29, 2008Date of Patent: July 3, 2012Assignee: Lexmark International, Inc.Inventor: David Thomas Shadwick
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Patent number: 8203350Abstract: A method and apparatus for direct measurement of rider band wear in a valve assembly for a reciprocating compressor is provided. A distance transducer probe is inserted through a compressor valve assembly to measure a distance between a piston assembly and the transducer probe and the wear of a rider band is determined based on the distance.Type: GrantFiled: October 2, 2009Date of Patent: June 19, 2012Assignee: General Electric CompanyInventors: Roger Aloysius Hala, Brian Francis Howard
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Patent number: 8138753Abstract: A measurement system for detecting a rotary movement of a rotor that is situated in particular in rotatable fashion in a compressor housing of a jet engine, includes the rotor having vane elements that are preferably situated equidistant from one another on its periphery, and in addition at least one sensor being provided, and at least one material measure being fashioned on the rotor that can be periodically detected by the sensor due to the rotational movement, the material measure is formed by at least one modified vane element that is truncated in the area of the vane tip, the sensor outputting an identical measurement signal in each case when the vane elements travel past, and outputting a modified measurement signal when the modified vane element travels past.Type: GrantFiled: September 1, 2007Date of Patent: March 20, 2012Assignee: MTU Aero Engines GmbHInventors: Johann Eberl, Michael Zielinski, Gerhard Ziller
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Publication number: 20110279134Abstract: A wire processing machine includes a signal applicator that applies a sensing signal to a section of wire. When the signal applicator is applying the sensing signal to the wire core of a section of wire, the wire processing machine is actuated to move a pair of wire processing blades until the wire processing blades contact the wire core. When the blades contact the wire core, the wire core is grounded, which is sensed by the control unit of the device. The position of the wire processing blades when the wire core is grounded is used to determine the diameter of the wire core.Type: ApplicationFiled: May 9, 2011Publication date: November 17, 2011Applicant: ARTOS ENGINEERING COMPANYInventors: Michael A. Kirst, Harold J. Keene
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Patent number: 8049522Abstract: An ice thickness probe includes a longitudinally-extending probe rod, an insulator casing and a sleeve. The probe rod is fabricated from an electrically-conductive material. The insulator casing is fabricated from an electrically-insulative material and is wrapped around, is in contact with and extends along the probe rod. The sleeve is fabricated from a stiff yet resilient material and is wrapped around, is in contact with and extends along the insulator casing. The insulator casing and the sleeve are concentrically disposed about the probe rod as viewed in cross-section. An ice thickness probe assembly includes a frame structure, a reference bar and at least one ice thickness probe. An ice thickness monitoring apparatus is used in a thermal storage coil having a tank containing water and a tube disposed in the water so that, when the thermal ice storage coil is energized, ice is produced and accumulates on the tube.Type: GrantFiled: August 26, 2008Date of Patent: November 1, 2011Assignee: Evapco, Inc.Inventors: Davey Joe Vadder, Jeffrey Michael Kane, Arthur James Marshall
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Publication number: 20110193564Abstract: An apparatus for measuring cement expansion comprises an expansion cell that comprises two nodes separated by a slit. The nodes are separated by a distance such that a change of the distance between the nodes may be correlated to a linear expansion of cement contained in the expansion cell. An electrical component is coupled to the two nodes, and the electrical component has an electrical property that may be correlated to the distance between the nodes. Measurement of the electrical-property change may be performed continuously and in real time. In addition, the expansion cell may be placed in a vessel equipped to simulate downhole pressure and temperature conditions.Type: ApplicationFiled: January 11, 2011Publication date: August 11, 2011Inventor: Youssef Elmarsafawi
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Publication number: 20110187394Abstract: A method for determining damaged faulty and/or weak points in a structural seal. The seal is provided with an electrically conductive layer arranged inside or outside the structural seal and extends over substantially the entire surface of the structural seal and to which layer an electrical test voltage is applied. To establish the damaged, faulty and/or weak points, a further electrically conductive layer is used, which is electrically separated from the aforementioned electrically conductive layer by the structural seal and extends over substantially the entire surface of the structural seal. The level of the test voltage between the electrically conductive layers charged with voltage is selected such that when at least one electrically non-conductive damaged, faulty and/or weak point is present in the structural seal, the electrical disruptive strength is exceeded and an electric spark or arc is formed at the location of the damaged, faulty and/or weak point.Type: ApplicationFiled: July 20, 2009Publication date: August 4, 2011Applicant: PROGEO MONITORING GMBHInventors: Andreas Rödel, Norbert Komma
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Patent number: 7982473Abstract: A method for diagnosing a position detector used in determining the position of a control means. The position detector includes a resistance track, and a first terminal in connection with its first end, and a second terminal in connection with second end of the resistance track, and a slide electrically connected to the resistance track. The slide is arranged to move in relation to the control by the effect of a position change. Additionally, the position detector includes a slide terminal in connection with the slide, an electricity supply, a voltage measurer and a signal processing unit for diagnosing measurement data. In the method, a supply voltage is arranged in the slide terminal, the output voltage of the first terminal is measured, the output voltage of the second terminal is measured, and at least a first and a second output voltage are arranged to the signal processing unit.Type: GrantFiled: January 25, 2006Date of Patent: July 19, 2011Assignee: Intellectual Ventures Holding 9 LLCInventor: Ari Virtanen
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Publication number: 20110102003Abstract: Methods and devices for measuring conductivity of ink in a printing system are disclosed. An embodiment of the method is used with a printing system comprising a developer roller, wherein the ink is formed on the developer roller using electrostatic forces. The method comprises printing on a substrate using the ink; measuring a first current that charges the developer roller during the printing; and determining the conductivity of the ink, wherein the conductivity is proportional to the square of the first current.Type: ApplicationFiled: May 30, 2008Publication date: May 5, 2011Inventor: Manoj K. Bhattacharyya
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Publication number: 20110101971Abstract: Methods are provided for reducing interference from stray currents in buried pipelines/metal structures during MEIS testing or other current-sensing applications in the pipeline. Methods are also provided for measuring bulk complex electrical impedance between a buried pipe and the soil, thereby rendering an indication of the quality of the anti-corrosive coating. Methods are also provided for measuring the complex propagation constant of AC voltages propagating along an attenuative pipeline. This information is useful for assessing the general condition of the anti-corrosive coating involved, or to enhance MEIS inspection of the pipeline.Type: ApplicationFiled: December 10, 2010Publication date: May 5, 2011Inventors: Scott Downing MILLER, Thomas James DAVIS, Jaime Paunlagui PEREZ
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Publication number: 20110025352Abstract: A touch device includes a first conductive film, a plurality of first electrodes, a first auxiliary electrode, a plurality of second electrodes, a second auxiliary electrode, and a second conductive film. The first conductive film has a first side, a second side, a first area, and a second area. The first electrodes are disposed at the portion of the first side located at a side of the first area. The first auxiliary electrode is disposed at the portion of the first side located at a side of the second area. The second electrodes are disposed at the portion of the second side located at another side of the second area. The second auxiliary electrode is disposed at the portion of the second side located at another side of the first area. The second conductive film is disposed beside the first conductive film.Type: ApplicationFiled: June 29, 2010Publication date: February 3, 2011Applicant: CHIMEI INNOLUX CORPORATIONInventors: HSUAN-LIN PAN, PO-SHENG SHIH
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Patent number: 7876109Abstract: The sensor according to the invention for detecting the position of a movable magnetic object includes a resistance track and a contact electrode arranged thereon. Moreover the sensor includes a magnetic position transmitter, which is developed in such a way that it can follow the magnetic object, that it can be moved along the contact electrode and through which the contact electrode can be brought into contact with the resistance track.Type: GrantFiled: February 29, 2008Date of Patent: January 25, 2011Assignee: J.Wagner AGInventors: Godram Mohr, Ignaz Hutter, Thomas Stieger
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Publication number: 20110012627Abstract: Propagation of ultrasound through a porous body saturated with liquid generates electric response.Type: ApplicationFiled: August 23, 2010Publication date: January 20, 2011Applicant: Dispersion Technology IncInventors: Andrei Dukhin, Philip J. Goetz
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Publication number: 20100327888Abstract: In a method for determining the size and shape value (M) for a solid material (S), in particular scrap metal, in an arc furnace (1), an electrode flow fed to an electrode (3a, 3b, 3c) for forming an arc furnace (L) between the electrode (3a, 3b, 3c) and the solid (S) is measured (30) and from the measured electrode flow (I (t)), an effective measurement value of the electrode flow is determined (31) and from the measured electrode flow (I (t)) (32), a flow part associated with a frequency range of the measured electrode flow is determined (32), and a quotient of the flow part and an effective measurement value is formed as a measurement of the shape and size value of the flow (M). Thus, a method is provided that enables a property of a fusible element introduced into one of the arc furnaces to be determined.Type: ApplicationFiled: January 12, 2009Publication date: December 30, 2010Applicant: SIEMENS AKTIENGESELLSCHAFTInventors: Arno Döbbeler, Klaus Krüger, Thomas Matschullat, Detlef Rieger
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Publication number: 20100321047Abstract: In a system or method to detect an electrical potential and layer thickness of a layer of toner particles in a printer or copier, a measurement arrangement is provided having a first electrode and at least one second electrode situated opposite the first electrode. An intermediate image carrier is provided on a surface of which a toner image is generated. A drive unit drives the intermediate image carrier so that its surface is directed past the first electrode situated opposite the surface. An evaluation unit is electrically connected with the first electrode. The evaluation unit detects an electrical current flowing between the first electrode and the evaluation unit. The evaluation unit determines an electrical charge of toner particles arranged in a detection region in a first measurement procedure with aid of the detected current. The evaluation unit also determines the layer thickness of the layer of toner particles in an inked region via at least one second measurement procedure.Type: ApplicationFiled: February 20, 2008Publication date: December 23, 2010Inventors: Alfred Zollner, Markus Jeschonek
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Publication number: 20100321048Abstract: A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.Type: ApplicationFiled: August 30, 2010Publication date: December 23, 2010Applicant: GENERAL ELECTRIC COMPANYInventors: Emad Andarawis Andarawis, Chukwueloka Obiora Umeh
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Patent number: 7852092Abstract: A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The at least one resistive element is embedded within a thermal barrier coating layer deposited on a base portion of the shroud and an abradable coating layer deposited on the thermal barrier coating layer or directly into the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.Type: GrantFiled: March 25, 2008Date of Patent: December 14, 2010Assignee: General Electric CompanyInventors: Emad Andarawis Andarawis, Chukwueloka Obiora Umeh
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Publication number: 20100277188Abstract: Systems, methods and program products of instructions stored on a computer readable medium related to a tether free piggable inspection tool capable of detecting holidays and able to read and store non-conductive internal coating thickness values in very long conductive pipes, along with distance values for further off-line analysis, are provided. The inspection tool includes a plurality of thickness probes, a data storage unit, a control unit, a plurality of navigation wheels and a holiday detector that uses an electrical conductive medium, such as a gas or fluid, as the ground connection. A closed loop configuration is adopted allowing the system to autocorrect itself for different coating thicknesses along the pipe.Type: ApplicationFiled: July 13, 2010Publication date: November 4, 2010Applicant: ITROBOTICS,INC.Inventors: Matias Brusco, Anouar Jamoussi, Roderic K. Stanley, Fathi H. Ghorbel
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Patent number: 7825671Abstract: The invention relates to electrophoretic immersion lacquering of objects, e.g. the bodies of automotive vehicles, wherein the object which is to be lacquered is immersed into lacquer immersion basin containing a lacquer fluid. An electric field is produced by the object in its capacity as an electrode with at least one counter electrode. In order to determine the thickness of the lacquer layer applied in said manner, the electric charge flowing through the object during the immersion lacquering process and the surface of the object exposed to the lacquer fluid are determined in order to determine the thickness of the lacquer layer therefrom. The thickness of the lacquer coating can thus be determined during the immersion lacquering process, resulting in fewer rejects.Type: GrantFiled: December 4, 2004Date of Patent: November 2, 2010Assignee: Eisenmann Anlagenbau GmbH & Co. KGInventors: Zoltan-Josef Horvath, Martin Kern, Stephen Sindlinger, Juergen Schlecht
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Publication number: 20100271053Abstract: Mixtures containing homogeneously-sized particles with a minimum concentration of agglomerates or larger particles are desired in various manufacturing processes such as, for example, in the manufacture and use of chemical mechanical polishing slurries, food emulsions, pharmaceutical products, paints, and print toner. The method disclosed herein provides these industries with an accurate and efficient method of screening such mixtures for such agglomerates and large particles. The method generally includes preparing a suspension of the mixture in an electrolyte, wherein the suspension includes a specified concentration of small particles per unit of electrolyte. The method further includes passing the prepared suspension, and a plurality of the particles therein, through an aperture of a device capable of characterizing particles according to the Coulter principle to obtain data on the particles.Type: ApplicationFiled: April 23, 2010Publication date: October 28, 2010Applicant: BECKMAN COULTER, INC.Inventors: Renliang Xu, Yiming Yang
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Publication number: 20100225339Abstract: A defect detection method for a sensor in which a fixing member provides a seal between a sensor element and tubular metallic members, the method being capable of detecting breakage of a conductor caused by breakage of the element.Type: ApplicationFiled: January 18, 2010Publication date: September 9, 2010Inventors: Tomohisa Fujita, Takeshi Kawai, Satoshi Teramoto, Shigeki Mori
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Publication number: 20100176827Abstract: A substance detection sensor includes an insulating layer; two electrodes spaced in opposed relation to each other on the insulating layer; and conductive layers formed between the two electrodes on the insulating layer so as to electrically connect the two electrodes, and of which a swelling ratio varies depending on the type and/or amount of a specific gas. The conductive layers are formed by dividing into plural layers between the two electrodes.Type: ApplicationFiled: December 22, 2009Publication date: July 15, 2010Applicant: Nitto Denko CorporationInventors: Hiroshi Yamazaki, Toshiki Naito, Hiroyuki Hanazono
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Publication number: 20100117636Abstract: On a friction stir spot welded workpiece having a first side including a friction stir spot weld hole and an opposing smooth second side, an eddy current probe is passed over the spot weld hole from the second side, and an eddy current signal representative of a material thickness of the workpiece is produced. The eddy current is analyzed via an eddy current analyzer, and a graphic representation of the analyzed eddy current signal is monitored as the probe passes over the spot weld hole, and a local minima of the graphic representation defined by a displayed characteristic J-shaped curve is identified, the local minima defining a remaining material thickness of the workpiece at the bottom of the spot weld hole. From the graphic representation, a value of the remaining material thickness is determined, and a weld strength of the spot weld as a function of the remaining material thickness is determined.Type: ApplicationFiled: October 12, 2009Publication date: May 13, 2010Applicant: GM GLOBAL TECHNOLOGY OPERATIONS, INC.Inventor: Cameron John Dasch
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Publication number: 20100102798Abstract: There is described an arrangement for detecting a change in a position between two parts which can be displaced in relation to one another. The arrangement has at least one electromechanical registering device having a monitoring chamber, which is shielded from manipulations taking effect from the outside, a number of monitoring bodies in the monitoring chamber, the number comprising at least two components and these components differing from one another in terms of a physical parameter, motion transfer means, which, in the event of the change in the positioning being returned to an initial state, cause the monitoring bodies to be moved from a first monitoring arrangement into a second monitoring arrangement. A sensor device has sensors which generate a sensor signal corresponding to the physical parameter of a monitoring body associated with each sensor in the first and second monitoring arrangement, and each sensor signal is fed to an evaluation unit.Type: ApplicationFiled: April 20, 2006Publication date: April 29, 2010Inventor: Carsten Siebold
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Publication number: 20100079157Abstract: An eddy current system and method enables detection of sub-surface damage in a cylindrical object. The invention incorporates a dual frequency, orthogonally wound eddy current probe mounted on a stepper motor-controlled scanning system. The system is designed to inspect for outer surface damage from the interior of the cylindrical object.Type: ApplicationFiled: June 29, 2009Publication date: April 1, 2010Applicants: Space AdministrationInventors: Russell A. Wincheski, John W. Simpson
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Patent number: 7688083Abstract: A method of obtaining parametric test data for use in monitoring alignment between layers of a semiconductor device. The method employs a test structure comprising a meander (10, 30) of the material of a first layer of the semiconductor device, deposited relative to a conductive line (18,38). A number of sets (16a, 16b, 16e, 16d) of components 16, such as contacts or vias, are provided relative to the meander (10), at successively smaller distances therefrom. A single analogue measurement can be performed between a first and (A) of the meander (10, 30) and the conductive line (18, 38) so as to determine the resistance therebetween, and the critical distance at (or on acceptable margin in relation thereto) between the first layer and a component of the semiconductor device can be obtained.Type: GrantFiled: September 19, 2005Date of Patent: March 30, 2010Assignee: NXP B.V.Inventors: Dirk Kenneth De Vries, Albert Van De Goor
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Patent number: 7679379Abstract: A detecting apparatus for checking shape, size and/or position of a hole of a workpiece, includes a platform for supporting the workpiece, a detecting board, which includes a detecting unit, movably set above the platform, an electrical source, a processor, and an indicator. The source, the unit, and the workpiece make up a circuit connected to the processor. When the board is moved to the workpiece, and the unit enters the hole without touching the workpiece the circuit will remain open, and the processor will control the indicator to indicate that the hole is eligible. If the detecting unit touches the workpiece, the circuit closes, and the processor will control the indicator to indicate that the hole is ineligible. An end of the unit that enters the hole is radially deformable. The apparatus improves detecting efficiency and accuracy, and is suitable for use in mass production.Type: GrantFiled: August 7, 2007Date of Patent: March 16, 2010Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.Inventors: Bing-Jun Zhang, Lian-Zhong Gong
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Publication number: 20100052703Abstract: An ice thickness probe includes a longitudinally-extending probe rod, an insulator casing and a sleeve. The probe rod is fabricated from an electrically-conductive material. The insulator casing is fabricated from an electrically-insulative material and is wrapped around, is in contact with and extends along the probe rod. The sleeve is fabricated from a stiff yet resilient material and is wrapped around, is in contact with and extends along the insulator casing. The insulator casing and the sleeve are concentrically disposed about the probe rod as viewed in cross-section. An ice thickness probe assembly includes a frame structure, a reference bar and at least one ice thickness probe. An ice thickness monitoring apparatus is used in a thermal storage coil having a tank containing water and a tube disposed in the water so that, when the thermal ice storage coil is energized, ice is produced and accumulates on the tube.Type: ApplicationFiled: August 26, 2008Publication date: March 4, 2010Applicant: EVAPCO, INC.Inventors: Davey J. VADDER, Jeffrey M. Kane, Arthur J. Marshall
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Publication number: 20100026325Abstract: The method for detecting at least one structural defect in a spherical particle (33) comprises at least the following steps of passing the particle (33) into at least one induction coil (15); exciting the induction coil (15) in order to induce Foucault currents in the particle (33); acquiring an output signal at the terminals of the induction coil (15); and analyzing the signal in order to establish whether or not the particle (33) comprises a structural defect. A plurality of output signals are acquired by passing the particle (33) successively into one or more induction coils (15) with different positions of the particle (33), the or each induction coil (15) being excited at least each time the particle (33) passes in order to induce Foucault currents in the particle (33).Type: ApplicationFiled: October 11, 2007Publication date: February 4, 2010Applicant: AREVA NPInventors: Sebastien Hermosilla-Lara, Lenaig Gravot
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Publication number: 20090174418Abstract: A method and device for determining the thicknesses of semiconductor membranes uses electrical measurements. Energy is coupled into the membrane in a defined manner and the membrane thickness is determined from the distribution or diffusion of the energy. A change of state of the membrane is detected by measuring electroconductivity of measuring resistances at least one of which is on the membrane. The electroconductivity varies according to the temperature and the mechanical strain of the membrane, which both depend on the thickness of the membrane.Type: ApplicationFiled: October 20, 2005Publication date: July 9, 2009Applicant: X-FAB Semiconductor Foundries AGInventors: Siegfried Hering, Gisbert Hoelzer
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Patent number: 7552799Abstract: FIG. 2 shows a cross-section through a piston 10 and cylinder wall 12 of an internal combustion engine. A piston ring 14 is located within a ring groove 16 and the piston 10. The piston ring 14 is part of an oil film thickness measurement section 18, the other parts of which comprise a displacement transducer 20 and an electrical signal conditioning unit 22. The oil supply control system also includes a control system section 24, which comprises an on line calibration section 26, an oil injection system 28 and a controller 30. Also, a user interface 38 and a secondary signal conditioning unit 40 receiving secondary signal measurements from unit 42 or several units 42 are included.Type: GrantFiled: December 21, 2000Date of Patent: June 30, 2009Assignee: University of Central LancashireInventor: Ian Sherrington
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Patent number: 7511516Abstract: A system for monitoring the displacement of turbine blades that includes a turbine blade with a cutting tooth and one or more sensor wires, each sensor wire including a severable portion, that become severed by the cutting tooth as turbine blade displacement occurs. The sensor wires may be embedded in a honeycomb, which may be an area of abradable material attached to turbine shrouds. The sensor wires may include a plurality of radial sensor wires embedded in the honeycomb at varying predetermined radial distances from a turbine rotor. The sensor wires also may include a plurality of axial sensor wires embedded in the honeycomb at varying predetermined axial locations along the length of the honeycomb.Type: GrantFiled: June 13, 2006Date of Patent: March 31, 2009Assignee: General Electric CompanyInventors: Tagir R. Nigmatulin, Ariel Caesar-Prepena Jacala, Charles A. Bulgrin
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Patent number: 7491476Abstract: The present invention relates to a method, apparatus, and system for monitoring photomasks used in the production of semiconductor wafers for defects, degradation or a combination thereof. The invention provides an integrated test structure on the photomask itself and a method of positioning the test structure in conjunction with the photomask for a masking layer of an integrated circuit. The integrated test structures provide for an in-situ electrical or electromagnetic monitor on the photomask that doesn't adversely affect the integrated semiconductor devices on the wafers during the lithographic masking process.Type: GrantFiled: April 16, 2008Date of Patent: February 17, 2009Assignee: International Business Machines CorporationInventors: Jed Hickory Rankin, Brent Alan Anderson
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Publication number: 20090032502Abstract: The technology features an apparatus and a method for sensing the length of a lead that connects to a power source to a thermal processing system such as a plasma torch system. Components disposed in the thermal processing system enable the length of the lead to be sensed. In addition, the time for contact starting a thermal processing system enables determination of the length of the lead.Type: ApplicationFiled: July 31, 2007Publication date: February 5, 2009Applicant: Hypertherm, Inc.Inventors: Stephen Theodore Eickhoff, Peter J. Twarog
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Publication number: 20090009196Abstract: A method of obtaining parametric test data for use in monitoring alignment between layers of a semiconductor device. The method employs a test structure comprising a meander (10, 30) of the material of a first layer of the semiconductor device, deposited relative to a conductive line (18,38). A number of sets (16a, 16b, 16e, 16d) of components 16, such as contacts or vias, are provided relative to the meander (10), at successively smaller distances therefrom. A single analogue measurement can be performed between a first and (A) of the meander (10, 30) and the conductive line (18, 38) so as to determine the resistance therebetween, and the critical distance at (or on acceptable margin in relation thereto) between the first layer and a component of the semiconductor device can be obtained.Type: ApplicationFiled: September 19, 2005Publication date: January 8, 2009Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.Inventors: Dirk Kenneth De Vries, Albert Van De Goor
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Publication number: 20080265915Abstract: A system and method of detecting a network cabling change comprises measuring cable parameters of a cable to create a baseline signature of the cable and storing the baseline signature in a memory. The system and method is operable to detect a cable change based upon a comparison of the stored baseline signature and a subsequent cable measurement. A network device operable to perform the above method comprises a physical layer device that transmits signals into a coupled cable and receives return signals from the cable, a cable diagnostic module that measures cable parameters, a memory operable to store a baseline cable signature, and a controlling system that compares subsequently measured cable parameters to the baseline cable signatures to detect a cable change.Type: ApplicationFiled: April 24, 2007Publication date: October 30, 2008Applicant: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.Inventors: Charles F. Clark, Paul T. Congdon
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Publication number: 20080252306Abstract: A displacement detection pattern, usable for detection of a relative displacement between a wiring and a via plug, includes a wiring provided between via plugs and a conductor. The conductor is provided in the same layer level as a level at which the wiring is provided and is provided at a predetermined distance from the wiring.Type: ApplicationFiled: April 8, 2008Publication date: October 16, 2008Applicant: NEC ELECTRONICS CORPORATIONInventor: Yoshihisa Matsubara
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Publication number: 20080211522Abstract: The sensor according to the invention for detecting the position of a movable magnetic object includes a resistance track and a contact electrode arranged thereon. Moreover the sensor includes a magnetic position transmitter, which is developed in such a way that it can follow the magnetic object, that it can be moved along the contact electrode and through which the contact electrode can be brought into contact with the resistance track.Type: ApplicationFiled: February 29, 2008Publication date: September 4, 2008Inventors: Godram Mohr, Ignaz Hutter, Thomas Stieger
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Publication number: 20080191719Abstract: The invention relates to a device for measuring the pressure between two rollers tightly placed against one another or the deformation caused by this pressure in their mutual contact area. The invention is for use in the fields of machines and mechanical assemblies comprising rollers pressed against one another, for example, in printing presses or rolling machines. A crushing width can also be measured, for example, for a deformable seal or a line of glue or cement in an assembly process. This device comprises a thin sensor to be inserted between the rollers and whose shape has a return (14) provided in such a manner that, when the sensor is in a measuring position, the mechanical connections (131) connecting the sensor to the maneuvering part are situated in the squeezing area or on the side opposite the maneuvering part with regard to the squeezing area (ZP).Type: ApplicationFiled: April 6, 2006Publication date: August 14, 2008Applicant: KRIER S.A.Inventor: Antoine Philippe Krier
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Publication number: 20080169829Abstract: The invention relates to electrophoretic immersion lacquering of objects, e.g. the bodies of automotive vehicles (28), wherein the object which is to be lacquered (28) is immersed into lacquer immersion basin (12) containing a lacquer fluid (14). An electric field is produced by the object (28) in its capacity as an electrode with at least one counter electrode (16, 18). In order to determine the thickness of the lacquer layer applied in said manner, the electric charge flowing through the object (28) during the immersion lacquering process and the surface of the object (28) exposed to the lacquer fluid are determined in order to determine the thickness of the lacquer layer therefrom. The thickness of the lacquer coating can thus be determined during the immersion lacquering process, resulting in fewer rejects.Type: ApplicationFiled: December 4, 2004Publication date: July 17, 2008Inventors: Zoltan-Josef Horvath, Martin Kern, Stephen Sindlinger, Jurgen Schlecht
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Publication number: 20080164889Abstract: A detecting apparatus for checking shape, size and/or position of a hole of a workpiece, includes a platform for supporting the workpiece, a detecting board, which includes a detecting unit, movably set above the platform, an electrical source, a processor, and an indicator. The source, the unit, and the workpiece make up a circuit connected to the processor. When the board is moved to the workpiece, and the unit enters the hole without touching the workpiece the circuit will remain open, and the processor will control the indicator to indicate that the hole is eligible. If the detecting unit touches the workpiece, the circuit closes, and the processor will control the indicator to indicate that the hole is ineligible. An end of the unit that enters the hole is radially deformable. The apparatus improves detecting efficiency and accuracy, and is suitable for use in mass production.Type: ApplicationFiled: August 7, 2007Publication date: July 10, 2008Applicants: HONG FU JIN PRECISION INDUSTRY ( ShenZhen) CO., LTD, HON HAI PRECISION INDUSTRY CO., LTD.Inventors: BING-JUN ZHANG, LIAN-ZHONG GONG
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Publication number: 20080122460Abstract: A thickness variation detector of a photoconductor includes: a current detection unit that detects a value of current being used for charging a surface of the photoconductor in a state in which a charging unit is in contact with a surface of the photoconductor; and a thickness variation detection unit that detects a thickness variation along a rotation direction of the photoconductor based on the value of current.Type: ApplicationFiled: July 10, 2007Publication date: May 29, 2008Inventors: Junichi Ichikawa, Kenji Ogi, Masao Ito, Tomoshi Hara, Kenji Hara, Yoshifumi Takebe
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Publication number: 20080007276Abstract: A position sensor comprises a first part having several electrically conductive elements, a second part having an electrical conductor, and holding means holding the first part and the second part together with the conductive elements and the conductor being spaced apart and permitting relative movement between the conductive elements and the conductor. Included is a signal generator for generating and supplying different electrical signals to one of the first part and the second part for reception in a contactless manner by the other of the first part and the second part with a magnitude that is dependent upon the relative position between the conductive elements and the conductor. There is also a signal detector connected to the other of the first part and the second part for differentiating the electrical signals received thereby to determine the relative position between the conductive elements and the conductor.Type: ApplicationFiled: July 5, 2006Publication date: January 10, 2008Applicant: Mosway Semiconductor LimitedInventors: Celement Chiu Sing Tse, Chi Keung Tang, Kenny Chi Ken Lee, Peter On Bon Chan, Chun Ching Lee, Chi Pui Ho