By Laser Ablation Patents (Class 324/758.02)
  • On-chip photonic integrated circuit optical validation
    Patent number: 11499923
    Abstract: Photonic errors in a photonic integrated circuit can be imaged using an on-chip light source integrated in a photonic layer of the circuit. The on-chip light source can generate light at wavelengths that propagates through one or more substrate layers to an image sensor sensitive to the wavelength range. The on-chip light source can be tunable and provide different power settings that can be utilized to detect different types of optical errors in the photonic integrated circuit.
    Type: Grant
    Filed: September 30, 2020
    Date of Patent: November 15, 2022
    Assignee: OpenLight Photonics, Inc.
    Inventor: Benjamin M. Curtin
  • Laser assisted device alteration using two-photon absorption
    Patent number: 8860447
    Abstract: A Two-Photon Laser Assisted Device Alteration technique is presented. Fault localization is investigated by exploiting the non-linear two-photon absorption mechanism to induce LADA effects. Femtosecond laser pulses of wavelength having photon energy lower than the silicon bandgap are directed at the area of interest, while the DUT is stimulated with test vectors. The laser pulses are synchronized to the DUT stimulation, so that switching timing can be altered using the two-photon absorption effect.
    Type: Grant
    Filed: September 8, 2011
    Date of Patent: October 14, 2014
    Assignee: DCG Systems, Inc.
    Inventors: Praveen Vedagarbha, Derryck Reid