Abstract: To generate a signal when a target temperature is reached, a temperature detector circuit is provided with a first and second current sources connected in series, of which the first current source generates a PTAT current and the second current source is supplied with a temperature-independent reference voltage to generate a second current proportional to the reference voltage. The first and second currents are a first and second reference currents, respectively, at a reference temperature, and the first and second current sources are configured such that the ratio of the second reference current to the first reference current is proportional to the ratio of the target temperature to the reference temperature.

Abstract: A method for measuring a temperature of an integrated circuit is disclosed. The integrated circuit includes a temperature sensing element being excited by a first switched current and a second switched current. The method includes coupling a first capacitor to the temperature sensing element through a first switch and coupling a second capacitor to the temperature sensing element through a second switch. The first and second capacitors are external to the integrated circuit. The method further includes charging the first capacitor through the first switch to a first voltage when the temperature sensing element is being excited by the first switched current, charging the second capacitor through the second switch to a second voltage when the temperature sensing element is being excited by the second switched current, and measuring a difference between the first voltage and the second voltage to determine the temperature of the integrated circuit.