With Electrical Switch Or Transducer Responsive To Probe Patents (Class 33/561)
  • Patent number: 6922905
    Abstract: The invention is directed to a probe for coordinate measuring apparatus. The apparatus includes measuring systems (15, 16, 17) for measuring the deviation of the flexible part (10) of the probe and a damping device damps the flexible part (10) of the probe. The damping device is embodied as at least one friction brake (19, 27) and the friction force of the friction brake is adjustable. The flexible part (10) of the probe can also be blocked by the friction brake (19, 27).
    Type: Grant
    Filed: July 7, 2003
    Date of Patent: August 2, 2005
    Assignee: Carl-Zeiss-Stiftung
    Inventors: Franz Szenger, Walter Jenisch, Hans-Jörg Furtwängler, Kurt Brenner, Thomas Maier, Horst Stacklies
  • Patent number: 6922904
    Abstract: A method and a system is for evaluating the transmitted signals of a probe system, which has a probe element that is deflectable out of a rest position and which generates transmitted signals, which include a switch-on signal during a deflection of the probe element out of its rest position and which, together with interference signals, are transmitted to a receiving unit, in which the received signals made up of the transmitted signals and the interference signals, are compared to a reference signal. In this context, the reference signal is formed by interlinking information signals generated from the received signals, and the interference signals, and/or the received signals are differentiated by time, prior to the comparison with the reference signal.
    Type: Grant
    Filed: January 29, 2004
    Date of Patent: August 2, 2005
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Klaus Groell, Christian Eisenberger
  • Patent number: 6907673
    Abstract: Touch-triggered probe comprising a fixed part, designed to be fastened onto a measuring machine or a machine tool, and a mobile contact feeler that can be oriented on two independent axes along a multiplicity of spatial directions. The two axes of the probe comprise each an actuator for unlocking and adjusting the axes. The operation force is reduced as compared with the high effective indexing force by a demultiplying mechanism.
    Type: Grant
    Filed: January 20, 2004
    Date of Patent: June 21, 2005
    Assignee: Tesa SA
    Inventors: Adriano Zanier, Pascal Jordil, Claude Rouge
  • Patent number: 6812850
    Abstract: The present invention has an object to provide a measuring apparatus which can surely prevent the collision of a moving member.
    Type: Grant
    Filed: August 23, 2002
    Date of Patent: November 2, 2004
    Assignee: Mitutoyo Corporation
    Inventors: Sadayuki Matsumiya, Masanori Arai
  • Patent number: 6782634
    Abstract: A method and apparatus for locating a discontinuity such as a hole in a work piece is provided. The apparatus includes a probe having a shaft attached to a handle for locating a discontinuity in relation to a coordinate system. The probe includes an end unit attached to an end of the shaft opposite an end of the shaft to which the handle is attached. The end unit is configured to contact a surface associated with the discontinuity and move in relation to the coordinate system to align the end unit to an axis associated with the discontinuity. At least one position sensor is located entirely within the shaft and configured to sense the position of the end unit in relation to the coordinate system. The shaft includes a plurality of bores and the sensor is located within at least one of the bores.
    Type: Grant
    Filed: May 13, 2002
    Date of Patent: August 31, 2004
    Assignee: United Dominion Industries, Inc.
    Inventor: Daniel L. Morneweck
  • Publication number: 20040154179
    Abstract: Touch-triggered probe comprising a fixed part, designed to be fastened onto a measuring machine or a machine tool, and a mobile contact feeler that can be oriented on two independent axes along a multiplicity of spatial directions. The two axes of the probe comprise each an actuator for unlocking and adjusting the axes. The operation force is reduced as compared with the high effective indexing force by a demultiplying mechanism having an increasing transmission ratio, for making easier the operation in unlocked position. The indication elements can easily be read whatever the feeler's orientation.
    Type: Application
    Filed: January 20, 2004
    Publication date: August 12, 2004
    Inventors: Claude Rouge, Pascal Jordil, Adriano Zanier
  • Publication number: 20040148792
    Abstract: Touch-triggered probe comprising a fixed part, designed to be fastened onto a measuring machine or a machine tool, and a mobile contact feeler that can be oriented on two independent axes along a multiplicity of spatial directions. The two axes of the probe comprise each an actuator for unlocking and adjusting the axes. The operation force is reduced as compared with the high effective indexing force by a demultiplying mechanism.
    Type: Application
    Filed: January 20, 2004
    Publication date: August 5, 2004
    Inventors: Adriano Zanier, Pascal Jordil, Claude Rouge
  • Patent number: 6760977
    Abstract: Trigger probe, constructed on the principle of the Boys connection, serving to detect the contact between the probe's stylus and a piece to be measured, comprising an electric circuit with at least one switch, whose contact elements are positioned by means of several connecting elements of the circuit.
    Type: Grant
    Filed: November 26, 2002
    Date of Patent: July 13, 2004
    Assignee: Tesa SA
    Inventors: Pascal Jordil, Claude Rouge, Adriano Zanier, Charles-Henri Zufferey
  • Publication number: 20040128848
    Abstract: The invention is directed to a probe for coordinate measuring apparatus. The apparatus includes measuring systems (15, 16, 17) for measuring the deviation of the flexible part (10) of the probe and a damping device damps the flexible part (10) of the probe. The damping device is embodied as at least one friction brake (19, 27) and the friction force of the friction brake is adjustable. The flexible part (10) of the probe can also be blocked by the friction brake (19, 27).
    Type: Application
    Filed: July 7, 2003
    Publication date: July 8, 2004
    Inventors: Franz Szenger, Walter Jenisch, Hans-Jorg Furtwangler, Kurt Brenner, Thomas Maier, Horst Stacklies
  • Patent number: 6678966
    Abstract: A reseat system of a touch signal probe includes a fixed component, a movable component, a pair of hard balls provided on the fixed component, a cylindrical body provided on the movable component for abutting the hard balls, and a piezoelectric element for relatively sliding the hard balls and the cylindrical body. Since an outer circumference of the cylindrical body has conic shape, both a contact point on the cylindrical body and a contact point on a hard ball change position thereof during relative slide movement.
    Type: Grant
    Filed: June 16, 2000
    Date of Patent: January 20, 2004
    Assignee: Mitutoyo Corporation
    Inventors: Satoshi Koga, Nobuhisa Nishioki
  • Patent number: 6665945
    Abstract: A touch probe system that includes a receiver and a probe head that has a probe element positioned in a work space and a transmitter that transmits signals to the receiver. A rotating mechanism connected to the probe head for rotating the probe head around an axis in case of a change of position of the probe head within the work space so that the receiver receives signals from the transmitter even after the change of position.
    Type: Grant
    Filed: July 3, 2002
    Date of Patent: December 23, 2003
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Rainer Hagl, Kurt Feichtinger
  • Publication number: 20030208920
    Abstract: A product contact sensor of the type shown and described herein.
    Type: Application
    Filed: March 27, 2003
    Publication date: November 13, 2003
    Inventors: David K. Giegerich, Munroe Chirnomas
  • Patent number: 6643944
    Abstract: A touch signal probe comprises a fixed member, a movable member, a bias means, a drive member, a deformation touch signal processing circuit, a contact touch signal processing circuit, and a latch circuit. A stylus is attached to the movable member. The drive member relatively drives reseat position elements respectively placed on the fixed member and the movable member. The bias means restores the movable member to a still position. The deformation touch signal processing circuit generates a deformation touch signal. The contact touch signal processing circuit uses the reseat position elements as make-and-break electric contacts to generate a contact touch signal. The latch circuit inputs coordinate values every instant at which the deformation touch signal is output and stores the coordinate values as the most recent coordinate values for update, and when the contact touch signal is output, outputs the most recent coordinate values as detected coordinate values.
    Type: Grant
    Filed: May 30, 2002
    Date of Patent: November 11, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Yukiji Yoda, Tomoyuki Miyazaki, Yutaka Nishitsuji, Yoshikazu Kobayashi, Keiji Akagi
  • Patent number: 6640459
    Abstract: A multidimensional surface mechanics measurement system applies forces to a surface while minimizing coupling between the forces so applied. The system includes first, second, and third elongate members, a coupler for coupling the elongate members together, and a probe connected to the coupler having a contact point for contacting the surface. The first elongate member extends in a first axial direction that is substantially normal to the surface, the second elongate member extends in a second axial direction that is substantially orthogonal to the first axial direction, and the third elongate member extends in a third axial direction that is substantially orthogonal to the first and second axial directions. Desired relationships between the free length and diameter, and between the axial stiffness and transverse stiffness, and the orthogonal relative positioning of the elongate members, minimizes cross-talk between the measurement axes while maintaining the necessary structural rigidity.
    Type: Grant
    Filed: February 15, 2001
    Date of Patent: November 4, 2003
    Assignee: Fast Forward Devices, LLC
    Inventors: Barry N. Lucas, John C. Hay, Jr.
  • Patent number: 6622114
    Abstract: The invention is directed to a method for determining the weight of a probe of a coordinate measuring machine wherein the probe is connected to a probe head (1) of the machine. The machine includes a control unit and the weight of the probe (3) is preferably statically determined without active control of the movement of the probe. Signals from the probe (3) and/or the probe head (1) are supplied to the control unit (51).
    Type: Grant
    Filed: June 23, 2000
    Date of Patent: September 16, 2003
    Assignee: Carl-Zeiss Stiftung
    Inventors: Franz Szenger, Günter Grupp, Ralf Bernhardt
  • Patent number: 6553682
    Abstract: The present invention is a touch probe which can be connected to a computer controlled machine for determining positions of and defining shapes of work pieces, edges, hole centers and contours. The probe due to it design allows for a simpler and effective alternative to previous probes. The probe includes a body, stylus, a shank and an internal assembly. The body contains the internal assembly, which provide signals to a computer. The arrangement of the internal assembly is what makes the present invention simpler to manufacture and allow the probe to be miniaturized. The internal assembly includes an upper circuit board with a Light Emitting Diode (LED), a spring, a spring cap, a stylus mount, a housing, carbide balls, a lower circuit board, a support ring and wires.
    Type: Grant
    Filed: March 14, 2000
    Date of Patent: April 29, 2003
    Assignee: Paradyne
    Inventor: Timothy R. Willoughby
  • Patent number: 6526672
    Abstract: A head for the linear dimension checking of mechanical pieces, including a casing that defines a longitudinal geometric axis, an arm—set movable with respect to the casing, a feeler coupled to the movable arm—set for touching the piece to be checked, a biased device arranged between the casing and the movable arm—set for urging the movable arm—set into contact with the casing, a detecting device coupled to the casing, including a movable element and a transmission device between the movable arm—set and the movable element of the detecting device. In order to reduce the frictions and improve the repeatability of the head, the transmission device includes a wire substantially rigid in a longitudinal direction but flexible in the direction perpendicular to the longitudinal direction. The wire has a first end coupled to the movable arm—set and a second end for cooperating with the movable element of the detecting device.
    Type: Grant
    Filed: February 5, 2001
    Date of Patent: March 4, 2003
    Assignee: Marposs Societa′ per Azioni
    Inventors: Franco Danielli, Roberto Baruchello
  • Patent number: 6523273
    Abstract: A reseat system capable of restraining reseat shift in returning from escape movement and thus capable of obtaining reseat return accuracy without adding separate mechanism is provided. A locus drawn by a tip of a stylus when the stylus moves parallel to an axis thereof at a rest position while a hard ball on a fixed component is in contact with a cylindrical body on a movable-component having the stylus is inclined in a direction of a biasing force. When a pressing force is applied to the movable component, since a reaction force against the pressing force is generated at a contact point of the cylindrical body and the hard ball, reseat shift of the movable component can be restrained.
    Type: Grant
    Filed: June 16, 2000
    Date of Patent: February 25, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Nobuhisa Nishioki, Satoshi Koga
  • Patent number: 6516529
    Abstract: A stylus has a detection element support part 1E for supporting and fixing piezoelectric elements 21 to 24 and a rod 1D placed on the detection element support part 1E. The detection element support part 1E has a plurality of flange parts 1F each being regular polygonal in cross section orthogonal to the axis of the rod 1D. The displacement detection elements are attached to the sides of the flange parts 1F in a state in which they are inclined at a predetermined angle &agr; relative to the axis of the rod 1D. If a measured force in a torsion direction Q or in a bend direction P occurs on the rod 1D through a contact ball 1A, the measured force is transmitted along substantially the length direction of the piezoelectric elements 21 to 24.
    Type: Grant
    Filed: June 22, 2001
    Date of Patent: February 11, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Hidaka, Akinori Saitoh, Kunitoshi Nishimura
  • Patent number: 6487785
    Abstract: A circuit for adjusting a switching threshold of a touch probe, which has a touch element that can be deflected out of a position of repose and which upon a deflection of the touch element out of its position of repose causes a defined change in a measurable system parameter and outputs a switching signal when the value of the system parameter exceeds the switching threshold. The circuit includes a device for measuring the measurable system parameter, an electrical circuit for ascertaining a reference value from which the switching threshold is determinable and an incremental corrector that changes the value of the measurable reference value to the value of the measurable system parameter at the position of repose of the touch element, in which the switching threshold is determinable from the reference value.
    Type: Grant
    Filed: June 15, 2000
    Date of Patent: December 3, 2002
    Assignee: Dr. Johammes Heidenvain GmbH
    Inventor: Franz Ritz
  • Patent number: 6487896
    Abstract: A checking head (T) includes a casing (1), an arm (2) with a feeler, movable with respect to the casing, and a sensor, such as an inductive position transducer (5). An electronic identifier (27) is fixed to a frame coupled to the head (T), for storing identifying data relevant to the head, information relating e.g. to the configuration and calibration features of the head, and/or compensation values obtained in the 41 course of the calibration phase carried out on a suitable testing equipment.
    Type: Grant
    Filed: August 9, 2000
    Date of Patent: December 3, 2002
    Assignee: Marposs Societa' Per Azioni
    Inventor: Carlo Dall'Aglio
  • Patent number: 6484571
    Abstract: A surface configuration measuring method is provided, the surface configuration measuring method being characterized in having the steps of: moving a touch signal probe by a command velocity vector to touch a surface of the workpiece to be measured; scanning the surface of the workpiece to be measured, the touch signal probe being moved along the surface to be measured while controlling the distance relative to the surface to be measured so that detected amplitude value of a detection signal outputted by the detecting circuit becomes a predetermined reference value, thus outputting the detected amplitude value and corresponding measuring position; and calculating an estimated surface position based on the detected amplitude value and the measuring position estimated to be obtained when surface is scanned to keep the detected amplitude value constant.
    Type: Grant
    Filed: July 24, 2000
    Date of Patent: November 26, 2002
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Hidaka, Akinori Saito, Kiyokazu Okamoto
  • Patent number: 6459281
    Abstract: A head for the linear dimension checking of pieces in machine tools or measuring machines with a support structure (1), a movable arm-set (4) including an arm (6) carrying a feeler (8) for contacting the piece (37) to be checked, a spring (17) arranged between the support structure and the movable arm-set, a first annular surface (19) fixed to the support structure, a second annular surface (18) fixed to the movable arm-set and urged by the spring into contact with the first annular surface and an electric detecting device. The detecting device includes a ring (16) made of electrically resistive material that defines the first annular surface and another ring (13) made of electrically resistive material that defines the second annular surface, a circuit (21) for applying a difference of potential across two points (22, 23) of the first ring and another circuit (30) for detecting the difference of potential across two points (24, 25) of the other ring.
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: October 1, 2002
    Assignee: Marposs Societa′ per Azioni
    Inventor: Carlo Carli
  • Patent number: 6457373
    Abstract: The shock protection device prevents damage to optically and micromechanically acting gyroscopes. The gyroscope or precision instrument to be protected can be located in an inner housing shell which is spaced apart from an outer housing shell by elastic elements, and is thereby protected against shock. The inner housing shell can be brought temporarily into accurate mechanical contact with the outer housing shell by an electromechanical device. The spatial orientations of the inner and outer housing shells then correspond with high precision. In a further embodiment of the invention, the electromechanical device can be used precisely conversely to deactivate an existing shock protection and temporarily to bring about direct contact between a sensing element and an object to be checked on the occasion of a measuring operation.
    Type: Grant
    Filed: February 16, 2000
    Date of Patent: October 1, 2002
    Assignee: Pruftechnik Dieter Busch AG
    Inventors: Heinrich Lysen, Michael Hermann
  • Patent number: 6446496
    Abstract: A surface texture measuring instrument has a pre-load leaf spring (41, 42) for biasing a detector (10) having a skid (14) at a distal end thereof, a pre-load force controller (47) for controlling a pre-load force of the pre-load leaf spring (41, 42), and a stopper (50) for restricting movement of the detector (10) in a biasing direction when a predetermined pre-load force is applied to the detector (10) by the pre-load force controller (47). In conducting a skidless measurement, the detector (10) is locked by applying the predetermined pre-load force to the detector (10) by the pre-load force controller (47). In conducting a skid measurement, the pre-load force less than the predetermined value is applied to the detector (10) by the pre-load force controller (47).
    Type: Grant
    Filed: October 26, 2000
    Date of Patent: September 10, 2002
    Assignee: Mitutoyo Corporation
    Inventors: Nobuyoshi Fujii, Satoshi Ueda, Futoshi Doi
  • Patent number: 6438856
    Abstract: An apparatus for fine positioning of a component has a symmetrical, one-piece double parallel spring element having a movable center bar, suspended on bending points, which carries the component. The center bar is preloaded in the direction of the frame by way of an elastic element. The center bar can be adjusted in almost ideally tilt-free fashion with a fine adjustment element arranged between the center bar and frame. A high-precision coordinate measuring instrument having a measurement stage for receiving a substrate that is to be measured, an incident-light and/or transmitted-light illumination device, and an imaging optical system with a vertical optical axis, has a fine positioning apparatus of this kind with a vertically arranged double parallel spring element. Mounted on its center bar is an objective holder, and thereon the objective with an objective axis parallel to the movement direction of the center bar.
    Type: Grant
    Filed: October 11, 2000
    Date of Patent: August 27, 2002
    Assignee: Leica Microsystems Wetzlar GmbH
    Inventor: Ulrich Kaczynski
  • Patent number: 6434851
    Abstract: A constant pressure mechanism of a probe for urging the probe in a predetermined direction by virtue of elastic force of a spring is provided. The mechanism comprises a circular pulley rotatably supported around a central axis by an instrument stationary portion, a rotation force urging mechanism for urging the pulley in the predetermined direction, and a first wire adjoining the pulley to the probe. The rotation force urging mechanism comprises a spiral pulley coaxial with and capable of combined rotation with the circular pulley, and a second wire connecting the spiral pulley to the spring. The other end of the spring is connected to the instrument stationary portion. Strict contact pressure of the probe is maintained throughout its motion.
    Type: Grant
    Filed: May 3, 2000
    Date of Patent: August 20, 2002
    Assignee: Mitutoyo Corporation
    Inventor: Shingo Nishina
  • Patent number: 6430833
    Abstract: A measuring probe includes a suspension module 112 in which a stylus holder 140 is suspended from a housing on a pair of diaphragms 142, 144. At least one of the diaphragms is formed with spiral cut-outs whereby the stylus, which is connected at the centre of the diaphragms, is able to move transversely of the axis of the housing as the stylus holder pivots when transverse forces are applied to the stylus tip. A transducer module 110 is releasably supported on the suspension module by a kinematic mounting 116, 118 and is retained in position by magnets 120. The transducer module contains optical transducers 200, 210, 220 for measuring the deflection of the stylus.
    Type: Grant
    Filed: November 27, 2000
    Date of Patent: August 13, 2002
    Assignee: Renishaw PLC
    Inventors: Andrew G Butter, David R McMurtry
  • Patent number: 6370789
    Abstract: Probe for attaching at certain times to the tool spindle of a machine tool, which probe emits by means of a stylus (5) a measuring signal which is transmitted via a transmission channel (8) to a receiving and evaluating device (9) of the machine tool. For power-saving purposes, the transmission channel (8) is kept in the functioning state, by means of an activation system contained in the probe, only during the actual measuring operation. The activation system comprises a switching device (15) and an electronic assembly (13), which is characterized in that, from when it reaches its switching position, a control check is carried out with respect to continuance of the switching position and the activation or deactivation of the transmission channel (8) is only triggered when the switching position continues uninterruptedly for the duration of a certain interrogation time.
    Type: Grant
    Filed: March 24, 2000
    Date of Patent: April 16, 2002
    Inventors: Wolfgang Madlener, Wilfried Veil
  • Publication number: 20010054237
    Abstract: A stylus has a detection element support part 1E for supporting and fixing piezoelectric elements 21 to 24 and a rod 1D placed on the detection element support part 1E. The detection element support part 1E has a plurality of flange parts 1F each being regular polygonal in cross section orthogonal to the axis of the rod 1D. The displacement detection elements are attached to the sides of the flange parts 1F in a state in which they are inclined at a predetermined angle &agr; relative to the axis of the rod 1D. If a measured force in a torsion direction Q or in a bend direction P occurs on the rod 1D through a contact ball 1A, the measured force is transmitted along substantially the length direction of the piezoelectric elements 21 to 24.
    Type: Application
    Filed: June 22, 2001
    Publication date: December 27, 2001
    Inventors: Kazuhiko Hidaka, Akinori Saitoh, Kunitoshi Nishimura
  • Patent number: 6327789
    Abstract: In a touch signal probe (10) having a stylus holder (11), a vibrator (12) supported by the stylus holder (11) and has a contact portion (12A) to contact to a workpiece at a distal end thereof, a vibrating means (13A) for vibrating the vibrator (12) in an axial direction resonantly, and a detecting means (13B) for detecting the contact by a change in the vibration of the vibrator (12) caused by the contact to the workpiece is provided. The vibrator (12) is supported by the stylus holder (11) at two support points (A) and (B) positioned with a node of vibration of the vibrator (12) therebetween. Since the vibrating means (13A) and the detecting means (13B) are disposed spanning over the two support points, the node of vibration can be formed between the support points A and B and the size of the touch signal probe (10) can be easily reduced.
    Type: Grant
    Filed: August 4, 1999
    Date of Patent: December 11, 2001
    Assignee: Mitutoyo Corp.
    Inventors: Kunitoshi Nishimura, Kazuhiko Hidaka, Nobuhisa Nishioki
  • Patent number: 6314800
    Abstract: A micro-geometry measuring device capable of reducing measuring force thereof for avoiding damage on micro-geometry of workpiece surface and measuring at a high-speed is provided. The micro-geometry measuring device has a stylus mechanism having a stylus mechanism provided to an arm and having a stylus body, a measuring force adjusting mechanism for adjusting a measuring force working between the stylus body and the workpiece, a displacement sensor for detecting a position of the arm, and a measuring force controller for controlling the measuring force adjusting mechanism. The stylus mechanism includes a vibrator for resonantly vibrating the stylus body, and a detector for detecting vibration status changing when the stylus body touches the workpiece. The change in vibration of the stylus body vibrated by the vibrator is directly detected by the detector and a signal therefrom is fed back to the measuring force controller to keep constant measuring force working between the stylus body and the workpiece.
    Type: Grant
    Filed: December 14, 1999
    Date of Patent: November 13, 2001
    Assignee: Mitutoyo Corporation
    Inventor: Kunitoshi Nishimura
  • Patent number: 6307084
    Abstract: A contact location detecting mechanism (1) of a touch signal probe (10) includes a rotary motion generator (30) for scanningly moving a stylus (102) on a plane (A), a phase value detector (50) for detecting a phase value (&thgr;) indicating a rotation position of the scanning rotary motion, and a contact location detector (70)for detecting a contact location of a contact portion (102A) based on a detection signal value (V) detected by the detector (103B) and the phase value (&thgr;). Since the contact location of the contact portion (102A) can be detected by the contact location detector (70), the touch signal probe (10) can be used for a profiling measurement and continuous measurement of a workpiece.
    Type: Grant
    Filed: January 5, 2000
    Date of Patent: October 23, 2001
    Assignee: Mitutoyo Corporation
    Inventors: Kaoru Matsuki, Kiyokazu Okamoto, Kazuhiko Hidaka
  • Patent number: 6295866
    Abstract: A surface-tracking measuring machine is provided, in which measurement range is enlarged while keeping a measuring force, responsivity, resolution thereof. For the object, the surface-tracking measuring machine has a frame (10), a probe (11) swingably supported by the frame (10) and having a tracer (15) at an end thereof, a measuring force controller (21) for controlling the measuring force applied to the probe, a displacement detector (31) for detecting a displacement of the probe, a measuring force detector (41) for detecting the measuring force applied to the probe, and a controller (51) for comparing a measuring force detected value detected by the measuring force detector and a previously commanded measuring force command value and to control the measuring force controller so that the measuring force detected value is equal to the measuring force command value.
    Type: Grant
    Filed: August 26, 1999
    Date of Patent: October 2, 2001
    Assignee: Mitutoyo Corporation
    Inventors: Takeshi Yamamoto, Takenori Akaike
  • Patent number: 6199024
    Abstract: A calibration method for a shape measurement with a variable distance between the scanning probe datum point and the measuring point on the surface of a workpiece, is provided. Based on the measured distance between the scanning probe datum point and each of a plurality of measuring points on the surface of a calibration object, and on the position of a reference point on a motion system platform on which the scanning probe assembly is mounted, corresponding to the scanning probe being in a sensing position of each of the plurality of measuring points, the method provides the necessary data for calculating the coordinate of a measuring point of the workpiece from the measured distance between the scanning probe datum point and the measuring point, and from the position of the reference point corresponding to the to the scanning probe being in a sensing position of the measuring point.
    Type: Grant
    Filed: September 7, 1999
    Date of Patent: March 6, 2001
    Assignee: Nextel Ltd.
    Inventors: David Bunimovich, Gabi Horovitz
  • Patent number: 6163974
    Abstract: A position sensor having a housing which defines a carriage guide, a carriage movably arranged in the guide, and a measurement probe arranged on the carriage for transmitting a measurement signal as a function of a position of the carriage. The measurement probe includes a measurement probe carrier separated from the carriage and the carriage guide and movably arranged in the housing. The measurement probe carrier is also connected to the carriage and the carriage guide so that a force can only be transmitted to the measurement probe carrier parallel to a movement direction.
    Type: Grant
    Filed: September 14, 1998
    Date of Patent: December 26, 2000
    Assignee: Horst Siedle GmbH & Co. KG
    Inventors: Ivan Masek, Rainer Utz
  • Patent number: 6131301
    Abstract: Velocity dependent measurement errors made by coordinate measuring machines (CMMs) are corrected by deriving a polynomial expression which relates components of the errors to the relative velocity between the probe and the workpiece. A calibration is performed to establish the constant of the polynomial for different stylus configurations of the probe and these constants are stored. During a measuring process the probe produce analogue output signals from which a trigger signal is generated to latch the output signals of the machine measuring devices. The probe and machine output signals are monitored and recorded at clocked intervals over a range of positions within which lies the position at which the machine readings were latched. Actual relative velocity values are calculated at each position and, using these values and the stored constants, the errors in the machine readings at each position can be calculated from the polynomial.
    Type: Grant
    Filed: July 14, 1998
    Date of Patent: October 17, 2000
    Assignee: Renishaw PLC
    Inventor: Alexander T Sutherland
  • Patent number: 6121890
    Abstract: An electronic indicator that includes a means for a scaling the actual displacement of the spindle by a user-adjustable scale factor representing the ratio of the actual displacement of a spindle to the value displayed. The indicator includes a body, transducer assembly, controller, and display. The transducer outputs a value representing the spindle displacement to the controller. The controller converts the value to standard length units and scales the standard units by the desired ratio of the actual displacement to the displayed value, as set by the user prior to use of the indicator.
    Type: Grant
    Filed: September 3, 1999
    Date of Patent: September 19, 2000
    Assignee: Mahr Federal, Inc.
    Inventor: Raymond W. Tetreault
  • Patent number: 6044569
    Abstract: In a measuring method with a probe (a touch trigger probe 70), a velocity V1 and a coordinate value P1 of the prove trigger probe 70 are detected when a contact-detection signal is generated from the probe 70, and then a coordinate value P0 at the moment of contact is found from the coordinate value P1, the velocity V1, and an elapsed time T1 of the touch trigger prove 70 since the contact detection (an elapsed time from the contact until the contact-detection signal is generated).
    Type: Grant
    Filed: February 10, 1998
    Date of Patent: April 4, 2000
    Assignee: Mitutoyo Corporation
    Inventors: Motonori Ogihara, Nobuhiro Ishikawa, Takashi Noda
  • Patent number: 5952589
    Abstract: A method and device for moving a probe assembly into soft contact with a work surface includes initially placing the probe into an approach position. Advancement of the probe along a substantially perpendicular path toward the work surface is then controlled by applying a restraining force on the probe. This resisting force is decreased until the weight of the probe assembly just overcomes the static friction forces that are acting on the probe. After the static friction forces are overcome, the probe advances along a path toward the work surface. By monitoring this advancement, soft contact of the probe with the work surface can be determined when the velocity of the probe changes to zero. First, the position of the probe can be monitored to advance the probe along the path through a known travel distance. Second, the velocity of probe advancement can be monitored to indicate soft contact when velocity changes to zero.
    Type: Grant
    Filed: January 11, 1996
    Date of Patent: September 14, 1999
    Assignee: Systems, Machines, Automation Components Corporation
    Inventors: Arthur T. Leung, Michael S. Sheaffer, Edward A. Neff, Michael A. Ferris, Kieran Boyle, Christopher Johnson, Joseph M. Quashnock
  • Patent number: 5949352
    Abstract: A system for transmitting a radio-frequency signal from a contact detecting probe (1), powered by a battery (4), to a remote interface (11), that includes the transmitting, by way of coded serial signals, of messages containing information regarding the state of the probe, the level of charge of its associated battery, and other possible control and identification information. In order to guarantee the repeatability of the delay time that cannot be avoided in the transmission of the change of state of the probe, the bit periods of the single bits that form the message are changed, with respect to a nominal bit period (TN) of the serial signal, on the basis of the delay or the advance at which there occurs the change of state, with respect to a theoretical instant (C0) pre-set within the nominal bit period.
    Type: Grant
    Filed: October 23, 1997
    Date of Patent: September 7, 1999
    Assignee: Marposs Societa'Per Azioni
    Inventor: Andrea Ferrari
  • Patent number: 5917181
    Abstract: A profile measuring apparatus provided with an improved probe for measuring profiles throughout a wide area of the surface of an object with a high level of response and high accuracy. The probe 10 comprises an arm 3 having a stylus 1 fixedly mounted to the distal end thereof, which is coupled to a stationary part 11 of the apparatus by an arm holding member 5 made of a V-shaped leaf spring in such a way that the arm 3 is tilted in one axial direction by a contact pressure exerted thereto during measurement. Displacement of the arm 3 is thereby detected through measuring an elastic deformation of the leaf spring caused by the contact pressure exerted to the stylus 1 being pressed against the surface to be measured.
    Type: Grant
    Filed: April 1, 1997
    Date of Patent: June 29, 1999
    Assignee: Marsushita Electric Industrial, Co., Ltd.
    Inventors: Keiichi Yoshizumi, Keishi Kubo, Shoji Kusumoto, Kiyokazu Uchimura, Keinosuke Kanashima
  • Patent number: 5884410
    Abstract: A sensing system has a sensor arranged in the immediate neighborhood of a contacting shaped body. The sensor is connected to a circuit which is likewise arranged in the neighborhood of the contacting shaped body and emits electromagnetic radiation when the sensor responds to contact by the contacting shaped body with a surface to be measured.
    Type: Grant
    Filed: December 17, 1996
    Date of Patent: March 23, 1999
    Assignee: Carl-Zeiss-Stiftung
    Inventor: Reinhard Prinz
  • Patent number: 5864962
    Abstract: An apparatus is disclosed for checking the geometric characteristics of mechanical objects having rotational symmetry, such as shafts or bushings. A longitudinal support element defines a longitudinal axis and first reference surfaces, at least one modular coupling element is removably coupled to, and is adjustable longitudinally along, the longitudinal support element and provides second reference surfaces which cooperate with the first reference surfaces to align a linear guide portion transversely of the longitudinal axis. A fastener secures the modular coupling element, which removably supports a gauging device, to the longitudinal support element and a locking/unlocking device cooperates with the gauging device and guide portion for locking the gauging device to the modular coupling element.
    Type: Grant
    Filed: May 23, 1997
    Date of Patent: February 2, 1999
    Assignee: Maposs Societa' Per Azioni
    Inventor: Guido Golinelli
  • Patent number: 5839202
    Abstract: A manual three dimensional coordinate measuring machine has a probe manually movable along three orthogonal coordinate axes, X, Y and Z, and a Z axis member supporting the probe. The size and shape of a workpiece is determined by displacements along the three axes from a predetermined origin when the probe contacts the workpiece. The manual coordinate measuring machine further includes a slide ring positioned at the bottom side of the Z axis member and at least one elastic member. The slide ring is movable in an arbitrary direction relative to the Z axis and along the Z axis. The slide ring is held at a predetermined position in the plane and along the Z axis by the at least one elastic member. The at least one elastic member allows the slide ring to move in the plane or along the Z axis by elastic deformation of the at least one elastic member in response to a force which is larger than a predetermined value.
    Type: Grant
    Filed: September 12, 1996
    Date of Patent: November 24, 1998
    Assignee: Mitutoyo Corporation
    Inventors: Kazusaku Tezuka, Takao Oneta
  • Patent number: 5819429
    Abstract: A touch sensor of the invention can output a directional information from which direction an object to be measured touches a contact, as well as a positional information. The touch sensor includes a movable plate; at least four movable support points provided on the movable plate in a rectangular shape; a measuring shaft attached to the movable plate to extend perpendicularly thereto; and a base plate situated at a side facing the movable support points and having at least four fixed support portions corresponding to the respective support points. When no force is applied to the measuring shaft, all the support points and support portions contact together. When the object to be measured touches a contact portion, two of the support points situated adjacent to each other become temporary rotational supporting points, and two support points provided at a side opposite to the temporary rotational supporting points are separated from the support members corresponding thereto.
    Type: Grant
    Filed: December 30, 1996
    Date of Patent: October 13, 1998
    Assignee: Metrol Co., Ltd.
    Inventor: Akira Matsuhashi
  • Patent number: 5806201
    Abstract: A multi-coordinate touch probe including a deflectable stylus, a stylus support, and a sensor arrangement for sensing the deflection of the stylus and for generating a deflection signal, with the deformation parameters of the assembly stylus/support, which include a geometrical layout of the support, a geometrical shape of the stylus, and properties of a stylus material, being so selected that a noticeable scanning direction-dependent characteristic is eliminated.
    Type: Grant
    Filed: March 8, 1996
    Date of Patent: September 15, 1998
    Assignee: Johannes Heidenhain GmbH
    Inventor: Kurt Feichtinger
  • Patent number: 5756886
    Abstract: A touch probe which includes a fixed member, a movable member, a stylus, a bias means, and a reseat position system which permits the fixed member and the movable member to make contact with each other at pairs of contact points at positions which are spaced from one another. In the reseat position system, piezoelectric elements are provided which cause the fixed member and the movable member to move relatively in directions constrained by said pairs of contact points after a force applied to the movable member is removed. This realizes a touch probe which can secure high position reproducibility for a long period of time even if frictional forces act between the fixed member and the movable member.
    Type: Grant
    Filed: September 25, 1996
    Date of Patent: May 26, 1998
    Assignee: Mitutoyo Corporation
    Inventors: Kunitoshi Nishimura, Kazuhiko Hidaka
  • Patent number: 5727326
    Abstract: The scanning head according to the invention has the horizontal main axis (1) and is provided for numerically controlled gear measuring devices. Its feeler (2) is guided by a linear slide (4) and the latter is guided by a leaf spring parallelogram (11, 12, 13, 14) in the two coordinate directions (6) and (16). Mechanical devices (8) and (18) hold the feeler in a definite central position from which it can be deflected with the same measuring force in both the positive and negative coordinate directions. A centrally located two-dimensional ruled grating scale (10) detects all deflections of the feeler in the plane spanned by the two coordinates. To adjust the third coordinate direction, a pivot mechanism (3) is used, with a roller bearing (2) being provided for weight balance for the leaf spring parallelogram, the outer ring of the bearing being suspended by at least two springs (21, 22) on a fixed part (23) above the scanning head.
    Type: Grant
    Filed: January 17, 1996
    Date of Patent: March 17, 1998
    Assignee: Klingelnberg Sohne GmbH
    Inventors: Georg Mies, Gunter Mikoleizig
  • Patent number: RE37030
    Abstract: A touch trigger probe incorporates piezoelectric sensors 50, whose outputs are processed by an interface circuit. The interface circuit discriminates between signals generated from the piezoelectric sensors 50 as a result of machine vibration and those generated as a result of a genuine measurement event, by the use of a timing circuit 90. The timing circuit 90 compares the time intervals (t1-t2);(t2-t3) between attainment of first 11 and second 12, and second 12 and third 13 output signal levels from the sensor 50, and upon the basis of this comparison validates (or rejects) measurements made with the probe. Additionally, the interface determines whether measurements made with the probe are taken upon the basis of outputs generated by the sensors 50 due to a shock wave in the stylus 24 of the probe, or as a result of strain in the stylus 24; as an alternative, measurements may be made only on the basis of strain.
    Type: Grant
    Filed: July 25, 1997
    Date of Patent: January 30, 2001
    Assignee: Renishaw PLC
    Inventors: Peter G. Lloyd, Peter K. Hellier, David R. McMurtry