Optical Center, Cylinder Axis, Or Prism Measuring Or Determining Patents (Class 356/127)
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Patent number: 7728974Abstract: An enhanced detection system can eliminate use of a sheath fluid by selecting which particles that pass through an sensing region to detect parametric characteristics thereof based upon position of each particle while it is in a sensing region relative to one or more predetermined positions, such as an in-focus position relative to one or more light beams directed into the sensing region, to enhance accuracy and robustness of particle parametric characteristics detection.Type: GrantFiled: February 7, 2008Date of Patent: June 1, 2010Assignee: Cytopeia, Inc.Inventor: Gerrit van den Engh
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Patent number: 7701563Abstract: A lens decenter error measuring apparatus including a testing device, a lens supporter, and a lens carrier is disclosed. The testing device is configured for measuring a decenter error of a lens. The lens supporter is configured for receiving the lens. The lens carrier is installed within the lens supporter and includes at least three spheres and an elastic member. The spheres associated with the elastic member constrain the lens when the lens is placed in the lens supporter.Type: GrantFiled: February 28, 2008Date of Patent: April 20, 2010Assignee: Hon Hai Precision Industry Co., Ltd.Inventors: Sheng-An Wang, Ming-Shan Chan
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Patent number: 7701562Abstract: A method of measuring a front surface profile and a back surface profile of a target object includes: mounting the target object in such a posture that a first measuring surface (front surface) is measurable by a probe; first measuring a contour of the target object; measuring the first measuring surface of the target object; reversing the target object; second measuring the contour of the target object with the reversed posture of the target object being maintained; obtaining a measurement position of a second measuring surface by comparison of contour data obtained through the first and second measuring of the contour, the measurement position of the second measuring surface corresponding to a measurement position of the first measuring surface at which the measuring of the first measuring surface is conducted; and measuring a profile of the second measuring surface along the obtained measurement position of the second measuring surface.Type: GrantFiled: February 13, 2009Date of Patent: April 20, 2010Assignee: Mitutoyo CorporationInventors: Kentaro Nemoto, Masaoki Yamagata
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Patent number: 7688431Abstract: The invention relates to an apparatus for comparatively demonstrating the optical properties of eyewear lenses, particularly dispersion. The apparatus includes an illumination source that provides output of shorter wavelength visible light and longer wavelength visible light, a target that creates an image on the light path, a test lens made of eyewear lens material that is illuminated by the light path from the target, and a detector that displays the image acted upon and transmitted through the test lens. The test lens can be interchangeably replaced with another test lens, for comparison of each lens' optical properties. Alternate configurations include multiple light paths, for simultaneous viewing of images through different test lenses.Type: GrantFiled: April 9, 2009Date of Patent: March 30, 2010Assignee: Younger Mfg. Co.Inventors: Thomas A. Balch, John M. Tamkin, Nancy L. S. Yamasaki, Jotinderpal S. Sidhu
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Patent number: 7656513Abstract: A system for checking centration of lens surfaces of an aspheric lens includes a light-emitting device, a lens holder and an image processing device. The light-emitting device emits a light. The lens holder positions the aspheric lens in a light path of the light emitted from the light-emitting device. The image processing device receives the light which is emitted from the light-emitting device and has passed through the aspheric lens, and produces an image and shows the image. A quality of the image shown by the image processing device determines a tilt degree of the aspheric lens.Type: GrantFiled: December 14, 2007Date of Patent: February 2, 2010Assignees: Premier Image Technology(China) Ltd., Hon Hai Precision Industry Co., Ltd.Inventor: Bin Lei
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Patent number: 7627197Abstract: A method for measuring a position of an object according to an image of the object captured by a camera unit. The method includes the following steps: calculating a discrepancy of an incident beam of light penetrating a lens system of the camera unit relative to an optical center of the lens system, and compensating the position of the object according to the discrepancy.Type: GrantFiled: March 23, 2004Date of Patent: December 1, 2009Assignee: Honda Motor Co., Ltd.Inventor: Chiaki Aoyama
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Patent number: 7619722Abstract: A method for replacing a lens having refractive power in a first projection optical system includes measuring a wavefront of measuring light passing through the first projection optical system in a state in which the lens having refractive power or a master lens is mounted in the first projection optical system, measuring a wavefront of measuring light passing through a second projection optical system in a state in which the master lens or an alternative lens is mounted in the second projection optical system, processing the alternative lens in accordance with measurement results, and replacing the lens having refractive power in the first projection optical system with the processed alternative lens.Type: GrantFiled: August 20, 2008Date of Patent: November 17, 2009Assignee: Canon Kabushiki KaishaInventors: Jun Moizumi, Ryo Koizumi
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Patent number: 7609371Abstract: A lens meter for measuring optical characteristics of a lens to be measured includes a measurement optical system including a light source which projects a measurement light beam to the lens and a light receiving sensor which receives the measurement light beam having passed through the lens; an arithmetic part which obtains optical characteristic distribution of a predetermined measurement region of the lens based on a light reception result of the light receiving sensor; near-vision-portion determination means which determines whether a near vision portion of the lens is present in the measurement region based on the optical characteristic distribution in the measurement region; and detection means which detects presence of a non-optical region in addition to an optical region of the lens in the measurement region based on the light reception result of the light receiving sensor; the arithmetic part obtains additional power of the lens based on the optical characteristic distribution of the optical region iType: GrantFiled: November 2, 2005Date of Patent: October 27, 2009Assignee: Nidek Co., Ltd.Inventor: Tadashi Kajino
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Patent number: 7581305Abstract: A method of manufacturing an optical component comprising a substrate and a mounting frame with plural contact portions disposed at predetermined distances from each other is provided. The method comprises providing a measuring frame separate from the mounting frame for mounting the substrate, which measuring frame comprises a number of contact portions equal to a number of the contact portions of the mounting frame, wherein respective distances between the contact portions of the measuring frame are substantially equal to the corresponding distances between those of the mounting frame, measuring a shape of the optical surface of the substrate, while the substrate is mounted on the measuring frame, and mounting the substrate on the mounting frame such that the contact portions of the mounting frame are attached to the substrate at regions which are substantially the same as contact regions at which the substrate was attached to the measuring frame.Type: GrantFiled: April 12, 2004Date of Patent: September 1, 2009Assignee: Carl Zeiss SMT AGInventors: Bernhard Geuppert, Jens Kugler, Thomas Ittner, Bernd Geh, Rolf Freimann, Guenther Seitz, Bernhard Fellner, Bernd Doerband, Stefan Schulte
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Patent number: 7540982Abstract: A molding lens with indentations for measuring eccentricity and a method for measuring eccentricity thereof are disclosed. At least one indentation concentric with an optical surface is respectively disposed on a front plane and a rear plane of the molding lens on area outside the optical surface while the indentation is observed by means of a measuring microscope. Moreover, the eccentricity of the molding lens is detected by eccentricity test function of the measuring microscope and the eccentric direction is defined so as to modify the lens mould and replace conventional eccentricity test that uses a transmission eccentric scale indicator in combination with a jig. Thus the cost of test equipment is reduced, test procedure is simplified and efficiency of mould modification is improved. Therefore, it's more convenient to manage manufacturing of the lens.Type: GrantFiled: September 27, 2007Date of Patent: June 2, 2009Assignee: E-Pin Optical Industry Co., Ltd.Inventors: San-Woei Shyu, Chi-Hsiung Wang, Chih-Hsiung Huang
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Patent number: 7538863Abstract: Device (100) for automatically detecting various characteristics of an ophthalmic lens (10), the device includes a support (110) adapted to receive the lens. The support is displaceable in translation along two mutually perpendicular axes, and include elements for forming a positioning image on first acquisition and analysis elements.Type: GrantFiled: November 4, 2004Date of Patent: May 26, 2009Assignee: Essilor International (Compagnie Generale d'Optique)Inventor: Fabien Divo
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Patent number: 7535557Abstract: A device for measuring a lens, comprising a first interferometer having a first optical axis and carried on a first adjustment base, a lens holder for holding the lens having a first surface having a first lens optical axis and a second surface having a second lens optical axis, and a platen having a sliding rail and carrying the first adjustment base and the lens holder thereon, wherein the lens holder is movable on the sliding rail, wherein each of the first adjustment base and the lens holder has a tetra-axis adjustment mechanism through which a relative positional relationship of the first optical axis of the first interferometer and the first lens optical axis of the first surface of the lens is adjustable.Type: GrantFiled: August 31, 2006Date of Patent: May 19, 2009Assignee: Instrument Technology Research CenterInventors: Wen-Hong Wu, Kuo-Cheng Huang, Chien-Shing Lee, Jung-Ru Yu
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Patent number: 7532315Abstract: An automatic lens blocking apparatus having a tracer and a lensmeter therein, for adhering a block to a lens by using a robot arm, is disclosed. The automatic lens blocking apparatus comprises: a tracer for obtaining data on a shape of a glass frame and data on a center of the glass frame; a lensmeter for obtaining data on an optical center of a blank lens by measuring physical property of the blank lens; an image camera part for obtaining an image of a shape and a position of the blank lens; and a blocker (a) for determining a blocking position to which a block is adhered on the basis of (i) the data on the shape of the glass frame and the data on the center of the glass frame obtained from the tracer, (ii) the data on the optical center of the blank lens and physical property of the blank lens obtained from the lensmeter and (iii) the image of the shape and the position of the blank lens obtained from the image camera part, (b) for moving the block and (c) for adhering the block to the blank lens.Type: GrantFiled: December 5, 2007Date of Patent: May 12, 2009Assignee: Huvitz Co., Ltd.Inventor: Joon-Seok Song
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Patent number: 7523848Abstract: A system for measuring the size of free air balls for use with a wire bonder having a wire bonding tool and an Electric Flame Off (EFO) device is provided. The system includes an imager disposed above a first image plane, a prism disposed below the imager, and at least one lens positioned between the first image plane and the prism in a first optical path. The at least one lens is positioned between the prism and the imager in a second optical path, where the second optical path is different from the first optical path. An image of the free air ball disposed at a lower portion of the wire bonding tool is provided to the imager via the prism and the at least one lens.Type: GrantFiled: June 9, 2005Date of Patent: April 28, 2009Assignee: Kulicke and Soffa Industries, Inc.Inventors: David T. Beatson, Deepak Sood, Norman Lucas, Zhijie Wang
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Patent number: 7515255Abstract: A detecting apparatus includes a light source configured (i.e., structured and arranged) for irradiating the lens module with light, the light being brought into a focus by the lens module; a detecting device configured for measuring and recording a location of the focus; and a driving device configured for driving a barrel of the lens module to rotate relative to a holder of the lens module. The detecting apparatus is particularly configured such that, when the driving device drives the barrel of the lens module to rotate to two different angular locations, the light source irradiates the lens module with light, the lens module making the light be brought into two respective focuses at (i.e., relative to) the two different angular locations, and the detecting device measures a deviation distance between the two respective focuses. A method of detecting concentricity of a lens module is further provided.Type: GrantFiled: September 6, 2007Date of Patent: April 7, 2009Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Shih-Chieh Yen
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Publication number: 20090051904Abstract: A lens decenter error measuring apparatus including a testing device, a lens supporter, and a lens carrier is disclosed. The testing device is configured for measuring a decenter error of a lens. The lens supporter is configured for receiving the lens. The lens carrier is installed within the lens supporter and includes at least three spheres and an elastic member. The spheres associated with the elastic member constrain the lens when the lens is placed in the lens supporter.Type: ApplicationFiled: February 28, 2008Publication date: February 26, 2009Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventors: Sheng-An Wang, Ming-Shan Chan
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Publication number: 20090046144Abstract: Non-symmetrically located lenses are employed with semiconductor devices comprising optically active regions which are non-symmetrically located on a surface thereof The optical axes of the lenses are aligned with the centers of the optically active regions. Wafer-level assemblies of semiconductor devices and lenses may be fabricated, mutually secured with the non-symmetrically placed lenses aligned over the non-symmetrically placed optically active regions, and singulated to form packages, such as image sensor packages. Related methods, and systems incorporating devices with non-symmetrically placed optically active regions and aligned lenses are also disclosed.Type: ApplicationFiled: August 15, 2007Publication date: February 19, 2009Applicant: MICRON TECHNOLOGY, INC.Inventor: Mark E. Tuttle
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Publication number: 20080316470Abstract: A system for checking centration of lens surfaces of an aspheric lens includes a light-emitting device, a lens holder and an image processing device. The light-emitting device emits a light. The lens holder positions the aspheric lens in a light path of the light emitted from the light-emitting device. The image processing device receives the light which is emitted from the light-emitting device and has passed through the aspheric lens, and produces an image and shows the image. A quality of the image shown by the image processing device determines a tilt degree of the aspheric lens.Type: ApplicationFiled: December 14, 2007Publication date: December 25, 2008Applicants: PREMIER IMAGE TECHNOLOGY(China) LTD., HON HAI Precision Industry CO., LTD.Inventor: Bin Lei
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Publication number: 20080304080Abstract: A relationship between surface decenter of a lens 1 under test and surface-decenter comatic aberration and a relationship between surface tilt of the lens 1 under test and surface-tilt comatic aberration are calculated by computer simulation. The surface tilt of the lens 1 under test is calculated by measuring a transmissive wavefront of a projecting portion 3, and comatic aberration of the lens 1 under test is calculated by measuring a transmissive wavefront of a lens portion 2. The surface-decenter comatic aberration that occurs due to the surface decenter is calculated by subtracting the surface-tilt comatic aberration from the calculated comatic aberration. The surface decenter of the lens 1 under test is calculated based on the calculated surface-decenter comatic aberration.Type: ApplicationFiled: March 13, 2008Publication date: December 11, 2008Inventor: Nobuaki UEKI
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Publication number: 20080297776Abstract: A cup attaching apparatus for attaching a cup as a processing jig to an eyeglass lens, comprises: an illumination optical system comprising an illumination light source and arranged to illuminate the lens from a side of a front surface of the lens by illumination light from the light source; an imaging optical system comprising an imaging device and a retroreflection member placed on an opposite side from the light source with respect to the lens, the imaging optical system being adapted such that the retroreflection member returns the illumination light passing through the lens back to its incoming direction, and the imaging device receives the returned illumination light, and the imaging optical system being adjusted to focus on a point near a surface of the lens; an image processing device adapted to process an image signal from -the- imaging device to detect at least one of a mark point provided on a unifocal lens, a small lens portion of a bifocal lens, and a progressive mark provided on a progressive foType: ApplicationFiled: May 15, 2008Publication date: December 4, 2008Applicant: NIDEK CO., LTD.Inventors: Toshiaki Mizuno, Yoshinori Matsuyama, Toshiro Matsumoto, Kenji Suzuki, Satoshi Imaizumi
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Publication number: 20080285019Abstract: Modified MZ (Mach-Zender) interferometers preferably are utilized to analyze the transmitted, aspherical wavefront of an ophthalmic lens by mounting the lens in a cuvette having a rotatable carousel that can hold multiple lenses. Fresh, temperature controlled, saline solution is circulated about the lenses, and the cuvette is positioned in a vertical test arm of the interferometer configuration. Reverse raytracing preferably is utilized to remove aberrations induced into the wavefront as it is imaged from immediately behind the lens to the detector of the interferometer.Type: ApplicationFiled: December 21, 2007Publication date: November 20, 2008Applicant: Johnson & Johnson Vision CareInventors: Gregory A. Williby, Russell T. Spaulding, Larry G. Jones, James W. Haywood, John Edward Greivenkamp, JR.
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Patent number: 7440088Abstract: Methods and devices are provided for profiling a beam of light that includes a wavelength ?. The beam of light is received. Secondary light is generated at a wavelength ?? different from wavelength ? by fluorescing a material with the received beam of light. The secondary light is separated from the received beam of light. The separated secondary light is optically directed to a sensor.Type: GrantFiled: October 28, 2005Date of Patent: October 21, 2008Assignee: Applied Materials, Inc.Inventors: Timothy N. Thomas, Bruce Adams, Dean C. Jennings
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Patent number: 7440089Abstract: Disclosed is a measuring method which can measure the decentering of an axis by the measurement of a two-dimensional curved surface profile. This method has a first step of measuring a profile of a examined surface by a probe from a first reference position which is a position separate by a predetermined amount from a predetermined position on the examined surface of a subject lens, a second step of measuring the profile of the examined surface by scanning the examined surface by the probe from the second reference position which is a position separate by a predetermined amount from said predetermined position in a route opposite to the scanning direction of said first step after a rotation of the subject lens; and the step of obtaining the decentering amount of the examined surface by the use of the measurement results obtained at the first and second steps.Type: GrantFiled: March 17, 2006Date of Patent: October 21, 2008Assignee: Canon Kabushiki KaishaInventor: Yasunori Murata
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Publication number: 20080204728Abstract: A detecting apparatus includes a light source configured (i.e., structured and arranged) for irradiating the lens module with light, the light being brought into a focus by the lens module; a detecting device configured for measuring and recording a location of the focus; and a driving device configured for driving a barrel of the lens module to rotate relative to a holder of the lens module. The detecting apparatus is particularly configured such that, when the driving device drives the barrel of the lens module to rotate to two different angular locations, the light source irradiates the lens module with light, the lens module making the light be brought into two respective focuses at (i.e., relative to) the two different angular locations, and the detecting device measures a deviation distance between the two respective focuses. A method of detecting concentricity of a lens module is further provided.Type: ApplicationFiled: September 6, 2007Publication date: August 28, 2008Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: SHIH-CHIEH YEN
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Publication number: 20080204729Abstract: A method and an apparatus for determining at least one optical property of an imaging optical system which is designed to image an object disposed in an object plane of the optical system into an assigned image plane. The method includes disposing at least one test structure in the object plane of the optical system, disposing an image recording device in at least two different positions relative to the image plane of the optical system, in each of the at least two relative positions the image recording device being offset in relation to the image plane to such an extent that an image of the pupil of the optical system is produced respectively on the image recording device by the optical system by means of the test structure, and recording an image produced on the image recording device by the optical system by means of the test structure in each of the at least two relative positions by means of the image recording device.Type: ApplicationFiled: November 19, 2007Publication date: August 28, 2008Applicant: Carl Zeiss SMT AGInventors: Matthias Manger, Markus Goeppert, Gordon Doering, Alfred Gatzweiler
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Publication number: 20080192200Abstract: Method of automatically preparing an ophthalmic lens for mounting, includes the following steps: automatically measuring centering characteristics of the lens; blocking the lens on cutting-out elements; feeling the lens; and cutting out the lens, wherein the lenses are treated together in pairs of lenses belonging to the same jobs, with the following consecutive steps being performed: measuring and feeling both lenses of the job; then reconciling the detected centering characteristics and the feeler information for both lenses of the job taken together, so that as a function of the result of this reconciliation, the job is confirmed or refused, and then if the job is confirmed, cutting both lenses of the job to shape, or if the job is refused, stopping the preparation of the lenses of the job.Type: ApplicationFiled: November 22, 2005Publication date: August 14, 2008Applicant: ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D' OPTIQInventor: Lionel Iribarne
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Patent number: 7400388Abstract: A method for determining at least one of distortion and de-focus for an optical imaging system. The method includes determining wavefront aberrations in a pupil plane of the optical imaging system by a wavefront measurement method, determining focus offset measured values in an xy-direction and/or z-direction for one or more different illumination settings by a test pattern measurement method with imaging and comparative evaluation of test patterns for the optical imaging system, and determining values for one or more aberration parameters that relate to the distortion and/or image surface from a prescribed relationship between the determined wavefront aberrations and the determined focus offset measured values.Type: GrantFiled: May 27, 2005Date of Patent: July 15, 2008Assignee: Carl Zeiss SMT AGInventors: Wolfgang Emer, Uwe Schellhorn, Manfred Dahl, Rainer Hoch
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Publication number: 20080160889Abstract: An automatic lens blocking apparatus having a tracer and a lensmeter therein, for adhering a block to a lens by using a robot arm, is disclosed. The automatic lens blocking apparatus comprises: a tracer for obtaining data on a shape of a glass frame and data on a center of the glass frame; a lensmeter for obtaining data on an optical center of a blank lens by measuring physical property of the blank lens; an image camera part for obtaining an image of a shape and a position of the blank lens; and a blocker (a) for determining a blocking position to which a block is adhered on the basis of (i) the data on the shape of the glass frame and the data on the center of the glass frame obtained from the tracer, (ii) the data on the optical center of the blank lens and physical property of the blank lens obtained from the lensmeter and (iii) the image of the shape and the position of the blank lens obtained from the image camera part, (b) for moving the block and (c) for adhering the block to the blank lens.Type: ApplicationFiled: December 5, 2007Publication date: July 3, 2008Inventor: Joon-Seok Song
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Patent number: 7310136Abstract: Disclosed herein is a method comprising illuminating a microstructured prism, or linear array of prisms of a prism sheet with an incident beam. The method further comprises making measurements of the refracted image of the beam on a measuring device to measure the distance disposed on an opposing side of the prism sheet from the side that the light beam is incident upon. Measurement of two angles of the refracted images of the beam on the ruled scale, measured twice, illuminating the sample at different angles are used in an equation to simultaneously provide the apex angle, the skew angle and the refractive index of the prism sheet.Type: GrantFiled: November 23, 2005Date of Patent: December 18, 2007Assignee: General Electric CompanyInventors: Dennis Joseph Coyle, Micah Sakiestewa Sze, Masako Yamada
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Patent number: 7307708Abstract: A surface to be tested and an optical system for projecting an index to an apparent spherical center position of the surface to be tested are moved relative to each other and an eccentric quantity of the surface to be tested is calculated from an movement quantity. A focal distance of an optical system is changed according to an apparent radius of curvature of each surface to be tested, which is calculated in advance. A reflection image on a surface to be tested, which is to be measured, is determined from the apparent radius of curvature of each surface to be tested, which is calculated in advance. Thus, an eccentric quantity of the entire lens system is accurately measured.Type: GrantFiled: November 9, 2004Date of Patent: December 11, 2007Assignee: Canon Kabushiki KaishaInventor: Yasunori Murata
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Patent number: 7307706Abstract: Estimating one or more optical characteristics of a Device-Under-Test (DUT). The method, includes directing an optical wavefront, generated by a source, towards a test location and generating at least one ray from the wavefront at the test location. Then for each ray at two or more measurement planes, each measurement plane transverse to the direction of travel of the wavefront and beyond the test location relative to the source at different optical path distances, measuring respective points of intersection of the ray with the measurement planes with and without the DUT at the test location.Type: GrantFiled: April 22, 2003Date of Patent: December 11, 2007Assignee: The University of AdelaideInventor: Peter Veitch
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Patent number: 7307709Abstract: A device is presented for computing an optical center of a sensor array relative to a lens. The sensor array includes a plurality of sensor units, and each sensor unit has a position on the sensor array. The lens defines an optical axis. The device includes a configuration module and a processing circuit. The configuration module is provided for positioning the lens and the sensor array thereon. When test light is parallel to the optical axis and is incident to the lens, the sensor array receives the test light transmitted by the lens so that each sensor unit outputs a value. The processing circuit is linked to the sensor array for receiving values outputted from the sensor units and selecting positions of sensor units outputting a specific value among the values, for computing the optical center of the sensor array.Type: GrantFiled: July 5, 2005Date of Patent: December 11, 2007Assignee: Asia Optical Co., Inc.Inventors: Yi-Hsuan Lin, Teck Wee Low
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Patent number: 7301614Abstract: A lens-refracting characteristic measuring apparatus includes a measuring optical device to measure refracting characteristics of eyeglass lenses, an input device to input a pupillary distance of eyes of a person wearing eyeglasses, and an arithmetic and control circuit for obtaining refracting characteristics of the eyeglass lenses in positions of centers of right and left pupils of the person wearing the eyeglasses based on the pupillary distance of right and left eyes of the person wearing the eyeglasses input by the input device and the refracting characteristics measured by the measuring optical device.Type: GrantFiled: January 26, 2005Date of Patent: November 27, 2007Assignee: Kabushiki Kaisha TOPCONInventors: Eiichi Yanagi, Shinichi Nakamura
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Patent number: 7286212Abstract: An apparatus for measuring the eccentricity of the aspherical surface has a light source unit; a condenser lens condensing light rays in the proximity of the center of paraxial curvature of a surface to be examined, of an aspherical lens; an angle changing means for entering the rays on the surface to be examined, at angles ?1i (i=1, 2, . . . , N) with an optical axis; a holding tool of the aspherical lens; a light-splitting element; an imaging lens; a light-detecting element detecting the situation of light collected by the imaging lens; and an arithmetical unit. The arithmetical unit is such as to calculate the amount of eccentricity of the surface to be examined, from amounts of shift ?P1i (i=1, 2, . . . , N) between spot positions P1i (i=1, 2, . . . , N) based on the design data of the surface to be examined and spot positions P1mi (i=1, 2, . . . , N) derived from the light-detecting element, with respect to light rays Q1i (i=1, 2, . . . , N) produced by the angle changing means.Type: GrantFiled: November 3, 2004Date of Patent: October 23, 2007Assignee: Olympus CorporationInventor: Mitsuru Namiki
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Patent number: 7280191Abstract: A lens meter that measures optical characteristics of lenses of an eyeglass unit and an inspection glass unit, including a glass unit support, light sources, light-projecting and -detecting optical systems, light detectors, and inspection glass frame adaptors for the inspection glass unit. The support includes two sandwiching members displaceable to sandwich an outer peripheral portion of the eyeglass unit, and the adaptors can be fitted to and detached from the sandwiching members. The adaptors include projecting sandwiching portions projecting toward opposite sandwiching members when the adaptors are fitted to the sandwiching members and which contact portions of the inspection glass unit's frame, other than movable areas of tabs of detachable lenses projecting from a frame of an inspection glass lens unit supported by the support as the eyeglass unit, whereas adaptor portions other than the projecting sandwiching portions do not interfere with the movable areas of the tabs.Type: GrantFiled: January 26, 2005Date of Patent: October 9, 2007Assignee: Kabushiki Kaisha TopconInventors: Eiichi Yanagi, Shinichi Nakamura
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Publication number: 20070229803Abstract: A measurement method for measuring a position of an aperture stop in an optical system includes the steps of measuring a light intensity distribution of light that passes the aperture stop, at a position that is optically conjugate with a pupil position in the optical system, and determining a position of the aperture stop in the optical system based on a diffraction fringe of the light intensity distribution measured by the measuring step.Type: ApplicationFiled: March 30, 2007Publication date: October 4, 2007Inventor: Yoshihiro Shiode
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Patent number: 7245362Abstract: A lens meter excellent in operability during alignment capable of informing in which direction a subject lens should be moved. A lens meter has a measurement optical system having an optical axis, a light source projecting a light bundle onto the lens, and a photo-sensor photo-receiving the bundle, a part which obtains the optical characteristics from a photo-receiving result, a device which detects an alignment condition of a desired position or region with the axis, a part which displays an alignment screen, and a part which provides fixed display of a target mark indicating a measurement position or region and provides movable display of a lens mark representing the lens and a guide mark indicating an alignment target position or region, where a movement direction of the lens relative to the axis coincides with movement directions of the lens mark and the guide mark relative to the target mark.Type: GrantFiled: April 26, 2005Date of Patent: July 17, 2007Assignee: Nidek Co., Ltd.Inventors: Toshiya Kobayashi, Tadashi Kajino
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Patent number: 7167584Abstract: The invention concerns a device for acquiring the three-dimensional shape of an object (10) by opto-electronic process, comprising a chromatic system (18) for illuminating the object (10) and for picking up the light reflected or backscattered by the object (10), and a reflecting mirror (26) placed on the optical axis between the optical system (18) and an illumination slot (16) for deflecting the light reflected by the object towards a spectral analysis means (30).Type: GrantFiled: April 13, 2001Date of Patent: January 23, 2007Assignee: Cynovad Inc.Inventor: Yves Guern
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Patent number: 7158222Abstract: A dioptric power distribution measuring device (1) measures the dioptric power distribution of a target lens. A computer (3) constructs a design lens spatial model in a virtual space, and calculates the dioptric power distribution of the design lens spatial model by performing simulation processing for incident/exit light for only the same point in the design lens spatial model as a measurement point on the target lens. The computer then compares the calculated dioptric power distribution with the dioptric power distribution of the target lens which is measured by the dioptric power distribution measuring device (1).Type: GrantFiled: May 16, 2003Date of Patent: January 2, 2007Assignee: Hoya CorporationInventors: Shin-ichiro Taguchi, Masaaki Matsushima
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Patent number: 7155030Abstract: The invention relates to a camera calibration system and method thereof which is capable of easily performing camera calibration using a concentric circle pattern. According to the invention, a method of calibrating a camera calibrates the intrinsic parameters of the camera required to measure geometric information of an object using projection invariable characteristics of concentric circles. The method includes the steps of taking images of the calibration pattern consisting of two or more concentric circles located in the same plane and having different radius at different angles to obtain projected images calculating the central point of the projected images using a given algorithm, and calculating the principal point and focal point of camera using a nonlinear minimization algorithm based on the central point thus obtained.Type: GrantFiled: March 8, 2005Date of Patent: December 26, 2006Assignee: Korea Advanced Institute of Science and TechnologyInventors: Jun-Sik Kim, In-So Kweon
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Patent number: 7142293Abstract: An optical system for an automatic lens meter for measuring the refractive power of a lens to be examined.Type: GrantFiled: October 8, 2004Date of Patent: November 28, 2006Assignee: Potec Co., Ltd.Inventors: Ki-Jun Nam, Sang-Jun Han
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Patent number: 7046351Abstract: An apparatus for measuring eccentricity of an optical lens includes a rotary lens holder which supports a first lens surface of an optical lens by vacuum aspiration; a first determining device for determining whether a curvature center of a central portion of the first lens surface is positioned on the rotational axis; a second determining device for determining whether a curvature center of a peripheral portion of the first lens surface is positioned on the rotational axis; and an eccentricity detection device which detects an eccentricity of the optical lens with respect to the rotational axis to calculate an eccentricity of a vertex of the first lens surface with respect to the radial center of the optical lens, including a detector contacts a rim of the optical lens to detect the eccentricity of the optical lens with respect to the rotational axis.Type: GrantFiled: May 19, 2003Date of Patent: May 16, 2006Assignee: PENTAX CorporationInventor: Takayuki Ito
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Patent number: 6993165Abstract: A rotating optical system includes an optical element and a measuring device for locating and/or scanning a full palm print and/or full palm and fingerprint for a hand positioned on a non-planar surface of an optical element. The hand is placed on the non-planar surface of the optical element. A measuring device can be rotated about a centerline axis of the optical element. During the rotation, a circular image of the full palm print (including thenar, hypothenar, interdigital, palm heel, “writers palm,” palm pocket, and fingertips) and/or full palm and finger prints, and/or hand characteristic information (e.g., hand geometry, spacing, etc.) can be captured by the measuring portion.Type: GrantFiled: December 3, 2003Date of Patent: January 31, 2006Assignee: Cross Match Technologies, Inc.Inventors: George W. McClurg, John F. Carver
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Patent number: 6985183Abstract: The present invention is a method for exploring the viewpoint and focal length of a fisheye lens camera (FELC). It employs the characteristic of the central symmetry of the distortion of the fisheye lens (FEL) to set its optic axis by means of a calibration target with a plurality of symmetrically homocentric figures. Once the optic axis is fixed, further disclose the viewpoint (VP) of the FELC along the optic axis through a trail-and-error procedure and calculate its effective focal length and classify it to the primitive projection mode. Because the invention is capable of finding out both the internal and external parameters of the FELC and the calibration method is easy, low-cost, suitable to any projection model, and has greater sensitivity corresponding to an increasing in image distortion, the distortive images can be transformed easily to normal ones which fit in with a central perspective mechanism.Type: GrantFiled: October 19, 2001Date of Patent: January 10, 2006Assignee: APPRO Technology Inc.Inventors: Gwo-Jen Jan, Chuang-Jan Chang
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Patent number: 6867435Abstract: Microoptical systems with clear aperture of about one millimeter or less are fabricated from a layer of photoresist using a lithographic process to define the optical elements. A deep X-ray source is typically used to expose the photoresist. Exposure and development of the photoresist layer can produce planar, cylindrical, and radially symmetric micro-scale optical elements, comprising lenses, mirrors, apertures, diffractive elements, and prisms, monolithically formed on a common substrate with the mutual optical alignment required to provide the desired system functionality. Optical alignment can be controlled to better than one micron accuracy. Appropriate combinations of structure and materials enable optical designs that include corrections for chromatic and other optical aberrations. The developed photoresist can be used as the basis for a molding operation to produce microoptical systems made of a range of optical materials.Type: GrantFiled: January 15, 2003Date of Patent: March 15, 2005Assignee: Sandia CorporationInventors: William C. Sweatt, Todd R. Christenson
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Patent number: 6851870Abstract: In measuring and assembling a transceiver optical sub-assembly that includes a one-piece or two-piece housing having two opposite apertures separately for an optical fiber and a functional element to assemble thereto, and a lens located between the fiber and the functional element, an image sensor is aligned with the fiber aperture to set a focus on a fiber coupling plane in the housing, and a light spot presented on the fiber coupling plane by a laser beam emitted from the functional element through the lens, or an image of a light-emitting area or a receiving area of the functional element presented on the fiber coupling plane via the lens, is measured to adjust size and/or position thereof, so as to precisely align and fix the functional element to the housing.Type: GrantFiled: December 22, 2003Date of Patent: February 8, 2005Assignee: E-Pin Optical Industry Co., Ltd.Inventors: Jau-Jan Deng, I-Lin Chu, Guo-Zen Chen
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Patent number: 6844925Abstract: A refracting power measuring apparatus according to the present invention comprises an optical system 1 for projecting a measuring light P toward a lens TL wet with liquid 12, a light receiving sensor 7 for receiving and outputting the measuring light P which passes through the lens TL, an arithmetic circuit 13 for calculating optical characteristic values based on a receiving signal, a residual quantity arithmetic circuit 14 for outputting a residual quantity signal based on characteristic value data of the arithmetic circuit 13, a delay circuit 19 for delaying the residual quantity signal, a comparing circuit 18 which compares a residual quantity signal delayed by the delaying circuit 19 and the following residual quantity signal and judges whether a difference therebetween is less than an allowed value.Type: GrantFiled: August 13, 2001Date of Patent: January 18, 2005Assignee: Kabushiki Kaisha TOPCONInventors: Yasufumi Fukuma, Eiichi Yanagi
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Patent number: 6798501Abstract: In a cup attaching apparatus, a cup is attached as a processing jig to a subject lens along a reference axis, the lens and an index plate having an index of a predetermined pattern are illuminated by substantially parallel rays of light shaped into a diameter larger than a diameter of the lens so that an image of the lens and an image of the index are projected onto a screen, and the index image projected onto the screen is detected, whereas an entire image of the lens projected onto the screen is picked up. An optical center of the lens with respect to the reference axis is obtained on the basis of the index image detected by said detecting means, thereby displaying in a superposed manner alignment information indicating a relative position of the optical center with respect to the reference axis and the image thus picked up. The alignment is effected while observing the displayed information.Type: GrantFiled: August 31, 2000Date of Patent: September 28, 2004Assignee: Nidek Co., Ltd.Inventor: Toshiaki Mizuno
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Patent number: 6788399Abstract: An assembly and method for inspecting ophthalmic lenses includes a light source and a 360° light structuring aperture configured to direct structured light toward an open center where a lens is positioned for imaging by an imaging device positioned beneath the assembly. The structured light is directed at the entire periphery of the lens and is internally reflected by the lens in the manner of a fiber optic conduit whereby the lens appears dark at clear areas of the lens. If there are defects or imprints on the lens, the internally reflected light will scatter at that point and appear as a bright spot to the imaging device.Type: GrantFiled: November 30, 2001Date of Patent: September 7, 2004Assignee: Bausch & Lomb IncorporatedInventors: Gerald J. Frumusa, Thomas A. Brown, Ronald D. Spoor, Joseph D. Blasiak
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Patent number: 6750959Abstract: A method and apparatus enabling the placement of a mark on a lens at a desired position, easily and rapidly, without damaging the lens. The method comprising (1) the step of measuring a lens in which the optical properties and the reference position of the spectacle lens are measured and (2) the step of processing in which the lens is processed based on the optical information obtained in the step of measuring a lens. In the step of measuring a lens, the optical properties of the lens, such as the prism value, are measured using a desirable position selected as on the uncut lens as the position of measurement. An an optical reference position, such as the optical center, is calculated, a guiding mark is placed at the calculated position the relationship between the mark and the optical reference position is used in subsequent cut processing.Type: GrantFiled: December 10, 2001Date of Patent: June 15, 2004Assignee: Hoya CorporationInventors: Takashi Daimaru, Masahiko Samukawa