Axes Determination Patents (Class 356/31)
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Patent number: 8854614Abstract: A method of thermally treating a wafer includes loading a wafer into a process chamber having one or more regions of uniform temperature gradient and one or more regions of non-uniform temperature gradient. A defect is detected in the wafer. The wafer is aligned to position the defect within one of the one or more regions of uniform temperature gradient. A rapid thermal process is performed on the wafer in the process chamber while the defect is positioned within one of the one or more regions of uniform temperature gradient.Type: GrantFiled: December 14, 2012Date of Patent: October 7, 2014Assignee: Samsung Electronics Co., Ltd.Inventors: Jong-Hoon Kang, Taegon Kim, Hanmei Choi, Eunyoung Jo, Gonsu Kang, Sungho Kang, Sungho Heo
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Patent number: 8436986Abstract: An apparatus (10) for assessment, evaluation and grading of gemstones has a stage (11) upon which a gemstone may be supported, the stage being enclosed in a housing (15) that is impervious to light. At least one light source (14) located in the housing is adapted to project incident light onto the gemstone. There are means for rotating and tilting the stage so as to vary the orientation of the gemstone to the incident light. A digital camera (16) is located in the housing adjacent the or each light source and is adapted to take images of the gemstone based on reflection and/or refraction of the incident light. There are also information processing means for calibrating and analyzing the images, with the information processing means being programmed with an instruction set for color calibrating the images and then analyzing the color calibrated images by segmentation and histogram measurement.Type: GrantFiled: April 2, 2008Date of Patent: May 7, 2013Assignee: Opal Producers Australia LimitedInventors: Graham Alfred Hornabrook, Stuart Norman Marchant, Rodney Herbert Lummis, Kathryn Elizabeth Primmer, Peter Bruce Sutton, Angus Nelson Hornabrook, Leanne Bischof, Ryan Lagerstrom, Volker Hilsenstein, Robert George Imrie
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Patent number: 8170277Abstract: An automatic tracking apparatus is provided, which is capable of solving a failure occurred in an automatic tracking operation in connection with a zooming operation, and capable of tracking an object in a stable manner, while a zooming-up operation, or a zooming-down operation is carried out in a high speed.Type: GrantFiled: January 30, 2007Date of Patent: May 1, 2012Assignee: Panasonic CorporationInventors: Yasuyuki Michimoto, Satoru Ooyabu
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Patent number: 8098368Abstract: A method of determining the position of inclusions in a gemstone, comprising: (a) placing the gemstone within a material having a refractive index within 0.5, optionally 0.2 or 0.1, of that of the gemstone; (b) illuminating the gemstone and imaging the illuminated gemstone; and (c) determining the position of inclusions based on images of the inclusions in the images.Type: GrantFiled: August 21, 2006Date of Patent: January 17, 2012Assignee: Galatea Ltd.Inventors: Haim Shlezinger, Ran Ziskind, Adam Devir, Dan Sheffer
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Publication number: 20110299063Abstract: A device for measuring properties of scatterers which measures properties of a scatterer from a stereoscopic scattering distribution of the scatterer upon receiving an electromagnetic wave with a certain wavelength distribution is provided. In the device, a scatterer to be measured is placed on a specimen platform; the electromagnetic wave is irradiated onto the scatterer from at least either any one or more directions, or one or more continuous directions of a hypothetical spherical surface having the above-mentioned focal point as its center; scattering waves scattered by the scatterer and reflected off the paraboloidal mirror or projected onto the paraboloidal screen are imaged by the imaging means as planar imaging data; and from thus obtained imaging data, a stereoscopic distribution of the scattering waves generated by the scatterer is obtained so as to measure properties of the scatterer from the distribution result.Type: ApplicationFiled: May 10, 2011Publication date: December 8, 2011Applicant: NINOMIYA JEWELRY CO., LTD.Inventors: Hirofumi Ninomiya, Akio Kawaguchi
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Patent number: 7973914Abstract: A physical quantity measuring apparatus utilizing optical frequency domain reflectometry includes a tunable laser; a first polarization maintaining fiber; a polarization maintaining coupler; a second polarization maintaining fiber; a third polarization maintaining fiber; a sensor consists of a fiber Bragg grating formed in a core of the third polarization maintaining fiber; a fourth polarization maintaining fiber; a photodiode detects Bragg reflected light from the sensor and reference light from the referential reflecting end; a controller that detects modulation of an interference intensity between the Bragg reflected light and the reference light; and an incidence part that inputs the measuring light, wherein the incidence part being provided on the first polarization maintaining fiber or on both the second polarization maintaining fiber and the third polarization maintaining fiber.Type: GrantFiled: February 4, 2010Date of Patent: July 5, 2011Assignee: Fujikura Ltd.Inventors: Koji Omichi, Akira Sakamoto, Shunichirou Hirafune
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Patent number: 7834987Abstract: Of the “four C's,” cut has historically been the most complex to understand and assess. This application presents a three-dimensional mathematical model o study the interaction of light with a fully faceted, colorless, symmetrical round-brilliant-cut diamond. With this model, one can analyze how various appearance factors (brilliance, fire, and scintillation) depend on proportions. The model generates images and a numerical measurement of the optical efficiency of the round brilliant-called DCLR—which approximates overall fire. DCLR values change with variations in cut proportions, in particular crown angle, pavilion angle, table size, star facet length, culet size, and lower girdle facet length. The invention describes many combinations of proportions with equal or higher DCLR than “Ideal” cuts, and these DCLR ratings may be balanced with other factors such as brilliance and scintillation to provide a cut grade for an existing diamond or a cut analysis for prospective cut of diamond rough.Type: GrantFiled: March 22, 2006Date of Patent: November 16, 2010Assignee: Gemological Institute of America, Inc.Inventors: Ilene M. Reinitz, Mary L. Johnson, James E. Shigley, Thomas S. Hemphill
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Patent number: 7700381Abstract: A semiconductor wafer has a bevel contour formed along the periphery thereof, products formed on the wafer, and an ID mark formed on the bevel contour. The ID mark shows at least the properties, manufacturing conditions, and test results of the products.Type: GrantFiled: February 9, 2006Date of Patent: April 20, 2010Assignee: Kabushikia Kaisha ToshibaInventors: Tsunetoshi Arikado, Masao Iwase, Soichi Nadahara, Yuso Udo, Yukihiro Ushiku, Shinichi Nitta, Moriya Miyashita, Junji Sugamoto, Hiroaki Yamada, Hajime Nagano, Katsujiro Tanzawa, Hiroshi Matsushita, Norihiko Tsuchiya, Katsuya Okumura
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Publication number: 20080316612Abstract: An optical device includes an interface between two or more media. The refractive indices, orientations of media, and alignment relative to a propagating wave define a refractive boundary at which reflections may be reduced or eliminated, and at which, for certain incident angles, rays may be refracted on the same side of the normal as the incident ray.Type: ApplicationFiled: August 13, 2008Publication date: December 25, 2008Applicant: Searette LLCInventors: Roderick A. Hyde, Nathan P. Myhrvold, Clarence T. Tegreene
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Patent number: 7382445Abstract: Methods for grading gemstones, apparatus for grading gemstones, and systems that utilize such methods and apparatus are disclosed.Type: GrantFiled: December 20, 2004Date of Patent: June 3, 2008Assignee: American Gem SocietyInventors: Jose Sasian, James Caudill, Peter Yantzer
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Publication number: 20070201023Abstract: A method of determining the crystalline orientation of a crystal surface of a workpiece using Raman spectroscopy. A beam of substantially monochromatic light is directed to be incident on the crystal surface at a predetermined angle of incidence. The beam of light is substantially polarized. The workpiece is rotated relative to the beam of light about a rotation axis substantially normal to the crystal surface. A Raman shift of scattered light is measured at each of a number of rotational positions during the rotation of the workpiece. The crystalline orientation of the crystal surface is determined based on the measured Raman shifts. Data indicating the determined crystalline orientation of the crystal surface is stored.Type: ApplicationFiled: February 23, 2007Publication date: August 30, 2007Inventor: Ming Li
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Patent number: 7260544Abstract: Of the “four C's,” cut has historically been the most complex to understand and assess. This application presents a three-dimensional mathematical model to study the interaction of light with a fully faceted, colorless, symmetrical round-brilliant-cut diamond. With this model, one can analyze how various appearance factors (brilliance, fire, and scintillation) depend on proportions. The model generates images and a numerical measurement of the optical efficiency of the round brilliant—called DCLR—which approximates overall fire. DCLR values change with variations in cut proportions, in particular crown angle, pavilion angle, table size, star facet length, culet size, and lower girdle facet length. The invention describes many combinations of proportions with equal or higher DCLR than “Ideal” cuts, and these DCLR ratings may be balanced with other factors such as brilliance and scintillation to provide a cut grade for an existing diamond or a cut analysis for prospective cut of diamond rough.Type: GrantFiled: October 12, 2000Date of Patent: August 21, 2007Assignee: Gemological Institute of America, Inc.Inventors: Ilene M. Reinitz, Mary L. Johnson, James E. Shigley, Thomas S. Hemphill
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Patent number: 6496255Abstract: A sample is rotated about an axis perpendicular to a surface of the sample in predetermined angular steps. The surface of the sample is irradiated with linearly polarized light, and a reflected intensity of light reflected from the surface of the sample is detected in each angular step. Based on a rotational angle dependency of the reflected intensity, the crystal face orientation of the sample is determined. To improve signal-to-noise ratio, the crystal lattice of the sample is excited. Further, the surface of the sample is irradiated with a plurality of linearly polarized light beams to obtain a plurality of reflected intensities.Type: GrantFiled: August 6, 2001Date of Patent: December 17, 2002Assignee: NEC CorporationInventors: Kazumi Sugai, Belgacem Haba, Yukio Morishige
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Patent number: 6182729Abstract: An apparatus for manufacturing a plurality of wafers by slicing a cylindrical ingot with a wire saw. The apparatus includes a measuring device for measuring the crystal orientation of the ingot; an adhering device for adhering a support to the surface of the ingot based on the orientation where the support includes an intermediate plate and a support plate, where the support plate is adapted to fit the wire saw, and where the adhering device includes an auxiliary adhering element for adhering the intermediate plate to the surface of the ingot and an adhering element for adhering the support plate to the intermediate plate; a dryer for drying and solidifying an adhesive applied between the ingot and the intermediate plate and an adhesive applied between the intermediate plate and the support plate; and the wire saw for slicing the ingot into the plurality of wafers while the ingot is supported on the support.Type: GrantFiled: January 29, 1998Date of Patent: February 6, 2001Assignee: Nippei Toyama CorporationInventors: Yoshiaki Banzawa, Nobuaki Hayashi, Kiyoakira Shimizu
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Patent number: 6056031Abstract: An apparatus for connecting a cylindrical ingot to a support plate includes means for measuring a crystal orientation of the ingot based on a diffraction of x-rays, means for rotating the ingot about a center axis based on the crystal orientation so that a center axis of the ingot is held parallel to a first plane and an orientation axis based on the crystal orientation is placed in a plane parallel to the first plane, means for adhering an intermediate plate to the ingot, means for adjusting a position of one of the support plate and the ingot in a plane parallel to the first plane based on the crystal orientation so that a mounting axis of the support plate is in a specific relationship with the orientation axis, and means for attaching the support plate to the intermediate plate.Type: GrantFiled: November 6, 1998Date of Patent: May 2, 2000Assignee: Nippei Toyama CorporationInventors: Yoshiaki Banzawa, Nobuaki Hayashi, Kiyoakira Shimizu
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Patent number: 6031600Abstract: In a method for determining the position of an object with reference to a measurement device having an optical transmitter which emits a light beam at a varying transmission angle, and having an angularly resolving optical receiver spaced away from the transmitter, a conclusion being drawn, from the respective transmission angle and from the respective angle at which the receiver receives radiation reflected from the object (reception angle), as to the resolution cell, defined by the angular resolution of the transmitter and the receiver, in which the object is located, the light beam emitted from the transmitter is modulated. The phase difference between the modulation of the transmitted light beam and the modulation of the received radiation is measured. From the phase difference, the position of the object within the respective resolution cell is calculated.Type: GrantFiled: October 20, 1998Date of Patent: February 29, 2000Assignee: Robert Bosch GmbHInventors: Hermann Winner, Alain Gaillard, Werner Uhler
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Patent number: 6024814Abstract: A method for connecting a cylindrical ingot to a support plate includes measuring a crystal orientation of the ingot based on a diffraction of x-rays, rotating the ingot about a center axis based on the crystal orientation so that a center axis of the ingot is held parallel to a first plane and an orientation axis based on the crystal orientation is placed in a plane parallel to the first plane, adhering an intermediate plate to the ingot, adjusting a position of one of the support plate and the ingot in a plane parallel to the first plane based on the crystal orientation so that a mounting axis of the support plate is in a specific relationship with the orientation axis, and attaching the support plate to the intermediate plate.Type: GrantFiled: November 26, 1996Date of Patent: February 15, 2000Assignee: Nippei Toyama CorporationInventors: Yoshiaki Banzawa, Nobuaki Hayashi, Kiyoakira Shimizu
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Patent number: 5875408Abstract: An automated vehicle guidance system for guiding a movable vehicle along a predetermined desired path over a surface that is provided with at least one reference marking includes a laser radar for emitting laser pulses towards the reference marking and for receiving laser pulses reflected from the reference marking, a steering actuator for steering the vehicle, and a computer connected to the laser radar and the steering actuator. The laser radar is designed to determine the distance between the vehicle and the reference marking and that distance is used by the computer to determine the lateral position of the vehicle relative to the desired path of vehicle travel. The computer then controls the steering actuator in the manner necessary to effect guidance of the vehicle along the desired path.Type: GrantFiled: July 17, 1995Date of Patent: February 23, 1999Assignee: IMRA America, Inc.Inventors: Mark P. Bendett, Alan Y. Aral
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Patent number: 5811827Abstract: A method and apparatus for optically determining the dimension of part surfaces. Particular embodiments describe optical triangulation based coordinate measurement machines capable of accurate measurement of complex surfaces, such as gear teeth and turbine blades. Other embodiments provide highly useful sensors for robot guidance and related purposes. Up to 5 axis sensing capability is provided on surfaces of widely varying form.Type: GrantFiled: June 5, 1995Date of Patent: September 22, 1998Assignee: Sensor Adaptive Machines, Inc.Inventors: Timothy R. Pryor, Bernard Hockley, Nick Liptay-Wagner, Omer L. Hageniers, W. J. Pastorius
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Patent number: 5757498Abstract: An optical spray coating monitoring system uses a laser displacement sensor and a data acquisition system to monitor a spray gun operator's technique, and display information relating to coating conditions and/or technique. The system includes a laser displacement sensor having a sensor head that is removably attached to a hand held spray gun. The laser displacement sensor measures the distance from the spray nozzle to the surface being coated. The laser displacement sensor also preferably measures the angle of orientation of the spray gun with respect to the surface being coated. The sensor head can also include an infrared temperature sensor. Another embodiment of the invention also uses a second laser displacement sensor.Type: GrantFiled: May 30, 1996Date of Patent: May 26, 1998Inventors: Richard J. Klein, II, Douglas L. Sevey, Ricky Jay Bauer
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Patent number: 5717484Abstract: A first light receiving portion and a second light receiving portion are provided on the upper surface of a moving body having driving wheels at an interval of a prescribed distance in a plane. The first light receiving portion and the second light receiving portion rotate around the axis in the vertical direction. On the other hand, a first light emitting portion and a second light emitting portion are provided on the side face of a station serving as a reference station at an interval of a prescribed distance in a plane. The first and second light receiving portions carry out sampling while rotating, so that the quantity of light reception is changed according to the directivities of the first and second light receiving portions. When the peaks of the directivities of the first and second light receiving portions match the direction of the first light emitting portion or the second light emitting portion, the quantity of light reception is maximized.Type: GrantFiled: March 17, 1995Date of Patent: February 10, 1998Assignee: Minolta Co., Ltd.Inventors: Takayuki Hamaguchi, Nobukazu Kawagoe
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Patent number: 5598972Abstract: An optical spray paint optimization system can be removably mounted to a spray paint gun, thus enhancing the ability of the user to guide the direction of the spray and also locate the nozzle at an optimum spray distance from the surface being painted. The preferred apparatus uses a diode laser, a beam splitter and a reflecting mirror to generate a reference beam and a gauge beam. The reference beam propagates in a fixed forward direction, but the direction of the gauge beam is adjustable by adjusting the attitude of the reflecting mirror. The reference beam and the gauge beam intersect at a convergence point which can be repositioned to a selected distance from the nozzle of the spray painting system by adjusting the path of the gauge beam, thus allowing the user to spray at the optimum spray distance by locating the convergence point on the surface being painted. The beams also aid in aiming the spray.Type: GrantFiled: July 19, 1995Date of Patent: February 4, 1997Assignee: University of Northern Iowa FoundationInventors: Richard J. Klein, II, Douglas L. Sevey, Alireza Badakhshan, Ricky J. Bauer
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Patent number: 5485240Abstract: A focusing controller for photographic apparatuses includes: a distance meter which detects film-to-object distance to calculate and emit a distance signal; a lens shifting distance calculating device which calculates a lens shifting distance for effecting focusing in a focusing optical system on the basis of the distance signal by using one or two or more linear expressions; and a driving device for driving the focusing optical system in accordance with the lens shifting distance; the focusing controller allowing both the lens shifting amount for the focusing optical system and the reciprocal of film-to-object distance to be set at equal intervals.Type: GrantFiled: August 3, 1994Date of Patent: January 16, 1996Assignee: Nikon CorporationInventors: Hiroyuki Tsuru, Shigemasa Sato, Hiroshi Terunuma
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Patent number: 5422718Abstract: The elastic-port immersion cell (10) is an optical oil immersion vessel which has a flexible latex (or other) sheath (24) protruding from its sidewall. The sheath is affixed to an opening in the wall of the vessel using a collar, O-ring (26) or other connecting means. The base of the vessel is an optical glass window. A sample (20) mounted on to the end of spindle (14) is placed into the cell. The end of the spindle (14), without the sample, is inserted into the sheath and the latex together with the spindle is attached to a goniometer head of a spindle stage such that the spindle is horizontal. Immersion oil (22) that has a refractive index similar to the sample is added to the cell until the sample is totally submerged. Minute features within the sample (20) may then be observed under the microscope as the sample is rotated 360 degrees about a vertical or horizontal axis. The latex sheath prevents the oil from escaping from the cell and also provides the flexibility required to orient and rotate a sample.Type: GrantFiled: May 10, 1993Date of Patent: June 6, 1995Assignees: The Center for Innovative Technology, Virginia Polytechnic Institute & State University, Virginia Tech Intellectual Properties, Inc.Inventor: Alan J. Anderson
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Patent number: 5345310Abstract: Techniques for identifying and determining the orientation, magnitude, and direction of slip plane dislocations transecting semiconductor dies are described, whereby a four point alignment pattern is examined for "squareness" and size integrity. Lack of squareness or significant change in apparent size of various aspects of the alignment pattern indicate slip-plane dislocations. The magnitude, orientation and direction of the dislocations are determined geometrically from measurement of the alignment pattern. Various other aspects of the invention are directed to optimal alignment of a photolithographic mask to a die which has experienced a slip-plane dislocation, and to discrimination between slip-plane dislocation and die-site rotation.Type: GrantFiled: June 15, 1993Date of Patent: September 6, 1994Assignee: LSI Logic CorporationInventors: Michael D. Rostoker, Nicholas F. Pasch, Joe Zelayeta
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Patent number: 5298963Abstract: An apparatus for inspecting the surface of a sheet-like object has a movable stage with an object mounted thereon; a source for lighting the object on the stage, particularly by making a plurality of illumination lights respectively having different wavelengths incident on the surface of the object from respective predetermined directions; image pickup device for fetching the image of the object under illumination of the light as image data or the images of parts of the object as image data obtained on the respective different wavelengths; image data processing device for inspecting the image data for defects; and a device for synchronizing control either for flashing the light at a predetermined time interval just after the stage commences its movement, synchronously with fetching the image data or for flashing the light and simultaneously fetching the image data obtained on the respective different wavelengths, synchronously with the object on the stage reaching respective predetermined positions while moviType: GrantFiled: February 26, 1992Date of Patent: March 29, 1994Assignee: Mitsui Mining & Smelting Co., Ltd.Inventors: Kazuo Moriya, Takayuki Tsuzura
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Patent number: 5239355Abstract: An optical microscope equipped with an optical device allowing a convergent beam to irradiate the surface of a specimen through a microscope tube and an objective lens. The device detects the deviation of the convergent beam reflected from the surface of the specimen to an optical axis of the microscope. A driving mechanism moves the specimen in a three-dimensional direction to automatically eliminate the deviation. With this microscope, it is possible to position the specimen automatically, thus reducing the time for examination and improving precision of the examination.Type: GrantFiled: January 10, 1992Date of Patent: August 24, 1993Assignee: NEC CorporationInventor: Koji Hirose
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Patent number: 5187729Abstract: A method and an apparatus for detecting a crystallographic axis of a single crystal ingot based on the X-ray diffractometry, wherein and whereby a crystal habit line of the single crystal ingot is optically detected first, and thereafter making use of the geographical relation of the crystallographic axis to the crystal habit line, the crystallographic axis is detected with improved economy of time and labor and with improved precision, so that the orientation flat (OF) is made in the right place and direction.Type: GrantFiled: February 19, 1992Date of Patent: February 16, 1993Assignee: Shin-Etsu Handotai Co., Ltd.Inventors: Hiroyaki Ibe, Seiichi Terashima, Tsumoru Masui
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Patent number: 5008542Abstract: A method and system for measuring whole-wafer etch pit density (.rho..sub.D) is disclosed in which an etch GaAs wafer is tested for fractional transmission at a plurality of points over its surface. The fractional transmission (T) of light through the wafer is detected, amplified and fed to a computer where at least two points of transmission measurement are selected for calibration. From these measurements, together with an estimate of the average etch pit size (area), the values for fractional transmission in regions of low etch pit density T.sub.O and high etch pit density T.sub.E may be calculated, and used to convert transmission data directly to etch pit density (.rho..sub.Type: GrantFiled: December 20, 1989Date of Patent: April 16, 1991Assignee: The United States of America as represented by the Secretary of the Air ForceInventors: David C. Look, James S. Sewell, Millard G. Mier, John R. Sizelove, Dennis C. Walters, Scott C. Dudley
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Patent number: 4884887Abstract: An apparatus is disclosed for use with a device for processing a crystal having crystallographic axes and crystallographic facets on its surface. A light beam is supplied towards the facets where the light beam has a selected spatial relationship to the device. The directions of reflections of the light beam from the facets are detected to determine the spatial relationship between one crystallographic axis and the processing device so that the body is processable using the device in reference to the crystallographic axis. A U-shaped member is placed with its open ends in contact with or adjacent to a reference surface of the processing device. The U-shaped member encloses and is urged against the body when the body is rotated about a reference direction of the device The U-shaped member is of such dimensions that the surface portions of the body at distances smaller than a predetermined distance will cause both ends of the member to contact the reference surface.Type: GrantFiled: January 23, 1987Date of Patent: December 5, 1989Assignee: Hewlett-Packard CompanyInventor: David A. Vanderwater
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Patent number: 4840487Abstract: An apparatus for measuring dry etching pits formed in a semiconductor device during the manufacture thereof by employing optical means. Wiring on semiconductor devices increasingly become fine or minute, i.e., the size of wiring of some devices is less than 1 .mu.m. A technical matter to be solved is to effect highly accurate dimensional measurement in such submicron region. The apparatus has a .theta. stage which is additionally provided on an XY stage, and a mechanism which provides excellent selectivity in detection of interference intensity of diffracted beam. In addition, a short wavelength laser, such as a He-Ne, He-Cd, N.sub.2 or Ar laser, is employed as a laser source. As a practical advantage, it is possible to monitor etching of a pit with a depth on the order of 10 .mu.m with respect to a pattern with a planar dimension of 0.3 .mu.m to 1.0 .mu.m.Type: GrantFiled: June 19, 1986Date of Patent: June 20, 1989Assignee: Hitachi, Ltd.Inventors: Minori Noguchi, Toru Otsubo, Susumu Aiuchi
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Patent number: 4802760Abstract: A Raman microprobe apparatus for determining crystal orientation comprises a polarizer for polarizing not only incident light but also Raman light. The polarizer is provided between a half mirror for deflecting the incident light toward a specimen and an object lens system for focusing the incident light on the specimen.Type: GrantFiled: January 13, 1988Date of Patent: February 7, 1989Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Yasuo Inoue, Takeshi Ikeda
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Patent number: 4787740Abstract: An apparatus for determining crystal orientation comprises: a polarizer for polarizing an incident light beam; a polarization analyzer for selecting light having a selected polarization direction in Raman scattered light; and a synchronizer for enabling synchronous rotations of the polarizer and the polarization analyzer.Type: GrantFiled: February 5, 1987Date of Patent: November 29, 1988Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Yasuo Inoue, Tadashi Nishimura, Kazuyuki Sugahara, Shigeru Kusunoki
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Patent number: 4778269Abstract: In a method for determining orientation of a crystal with polarization selective Raman microprobe spectroscopy, polarization angles of both light incident on the crystal and Raman scattered light emitted from the crystal are varied coincidently in ordinary circumstances and only either one of the polarization angles is varied in only case that intensity of the scattered beam does not change substantially in spite of the coincident variation of both the polarization angles.Type: GrantFiled: February 6, 1987Date of Patent: October 18, 1988Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Yasuo Inoue, Tadashi Nishimura, Kazuyuki Sugahara, Shigeru Kusunoki
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Patent number: 4747684Abstract: A specific small area of a crystal sample is scanned by a laser beam which rotates about an axis substantially perpendicular to the sample surface such that the intersection of the beam with a plane above and parallel to the surface describes a true spiral or a stepwise spiral pattern. The laser beam is reflected different amounts for different beam positions to produce a reflectance pattern indicative of crystallographic orientation.Type: GrantFiled: August 27, 1987Date of Patent: May 31, 1988Assignee: The United States of America as represented by the Secretary of the ArmyInventor: Sidney Weiser
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Patent number: 4412345Abstract: An apparatus and method for precisely measuring the angles of cut of single nd doubly rotated cuts of quartz crystal blanks on a high volume production basis.Type: GrantFiled: August 3, 1981Date of Patent: October 25, 1983Assignee: The United States of America as represented by the Secretary of the ArmyInventors: S. Thomas Workman, John L. Chambers, Myron A. Pugh, Roger W. Ward
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Patent number: 4332474Abstract: A method and apparatus for checking the orientation of crystal plates in a stacked configuration. The plate stack (15) is placed between a polarizer (11) and analyzer (12). A cylindrical lens (13) placed between the stack and analyzer is utilized as a convergent element. Included with the stack are reference plates (17, 18) having known orientation angles representing the upper and lower limits of the desired orientation tolerance. Monochromatic light is made incident on one surface of the plates in the stack through the polarizer. Since the crystals are birefringent, an interference pattern will be produced by light emerging from the opposite surface. Due to the presence of the cylindrical lens, this pattern can be viewed as a series of essentially linear, parallel bands of light. Deviations within a particular band are compared with bands produced by the reference plates to determine if the angle of each plate falls within the desired limits.Type: GrantFiled: June 11, 1980Date of Patent: June 1, 1982Assignee: Bell Telephone Laboratories, IncorporatedInventor: Anton J. Miller
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Patent number: 4065211Abstract: An X-ray diffraction system for crystal analysis employing laser alignment o reduce errors inherent in the mechanical operation of the goniometer apparatus.Type: GrantFiled: March 1, 1976Date of Patent: December 27, 1977Assignee: The United States of America as represented by the Secretary of the ArmyInventor: John R. Vig
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Patent number: 4002410Abstract: A small portable device quickly secured to and removed from a body of monocrystalline material to be sawed and useful for aligning the body with respect to a saw blade, permitting sawing with precisely predetermined crystallographic orientation. The device has a viewing screen, a light source, and first and second autocollimators. The first autocollimator directs a first collimated light beam toward a surface of the material. The resultant reverse reflection is directed back through the collimating lens and a beam splitter images the reflection on the screen, providing a pattern on the screen characteristic of a crystallographic plane of the material, the pattern position corresponding to the orientation of the device with respect to the crystallographic plane.Type: GrantFiled: March 17, 1975Date of Patent: January 11, 1977Assignee: MonsantoInventors: Roger A. Frederick, Thomas E. Reichard