Abstract: The disclosure is directed to a photoelastic method for measuring the absolute Tzc of a sample of materials (transparent glass, glass-ceramic or ceramic) directly, without requiring calibration against a primary technique. The method involves subjecting the sample to a temperature gradient that generates a stress distribution pattern within the sample. When some portion of the sample is at a temperature equal to the Tzc of the material, the pattern adopts an easily identifiable shape whose measurement allows the calculation of Tzc. Silica-titania glass, which has a low thermal expansion, is used as an exemplary material.

Abstract: A physical quantity measuring apparatus utilizing optical frequency domain reflectometry of the invention includes a tunable laser; a first polarization-maintaining fiber; a polarization-maintaining coupler; a second polarization-maintaining fiber; a third polarization-maintaining fiber; a sensor consists of fiber Bragg gratings formed at a core of the third polarization-maintaining fiber; a fourth polarization-maintaining fiber; a photodiode detects Bragg reflected light from the sensor and reference light from the referential reflecting end; a controller detects a modulation of an interference intensity between the Bragg reflected light and the reference light, based on an intensity change of multiplexed light of the Bragg reflected light and the reference light; an incidence part inputs the measuring light; and an optical path-length adjuster arranged on the third polarization-maintaining fiber; the incidence part provided on the first polarization-maintaining fiber, or on both the second and third polariz

Abstract: An apparatus and method for measurement of the stress in and thickness of the walls of glass containers is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in glass containers. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of the side walls of glass containers throughout the circumference of the glass containers. The apparatus and method are adapted for large scale glass container manufacturing, and are capable of high speed measurement of the stress in and the thickness of the side walls of glass containers.

Abstract: An apparatus and method for measurement of the stress in and thickness of flat glass or curved glass segments is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in flat glass or curved glass segments. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of flat glass or curved glass segments at a plurality of various locations therein. The apparatus and method are adapted for large scale flat glass or curved glass segment manufacturing, and are capable of high speed measurement of the stress in and the thickness of the flat glass or curved glass segments.

Abstract: A method, computer program product and system for analyzing multispectral images from a plurality of regions of birefringent material, such as a polymer film, using polarized light and a corresponding polar analyzer to identify differential strain in the birefringent material. For example, the birefringement material may be low-density polyethylene (LDPE), high-density polyethylene (HDPE), polypropylene, polyethylene terephthalate (PET), polyvinyl chloride (PVC), polyvinylidene chloride, polyester, nylon, or cellophane film. Optionally, the method includes generating a real-time quantitative strain map.

Abstract: A sensor for measuring in a borehole at least one of orientation, acceleration and pressure, the sensor including: a light source; a birefringent material receiving light from the source; and a photodetector for measuring light transmitted through the birefringent material to measure the at least one of orientation, acceleration and pressure.

Abstract: A physical quantity measuring apparatus utilizing optical frequency domain reflectometry of the invention includes a tunable laser; a first polarization-maintaining fiber; a polarization-maintaining coupler; a second polarization-maintaining fiber; a third polarization-maintaining fiber; a sensor consists of fiber Bragg gratings formed at a core of the third polarization-maintaining fiber; a fourth polarization-maintaining fiber; a photodiode detects Bragg reflected light from the sensor and reference light from the referential reflecting end; a controller detects a modulation of an interference intensity between the Bragg reflected light and the reference light, based on an intensity change of multiplexed light of the Bragg reflected light and the reference light; an incidence part inputs the measuring light; and an optical path-length adjuster arranged on the third polarization-maintaining fiber; the incidence part provided on the first polarization-maintaining fiber, or on both the second and third polariz

Abstract: A physical quantity measuring apparatus utilizing optical frequency domain reflectometry includes a tunable laser; a first polarization maintaining fiber; a polarization maintaining coupler; a second polarization maintaining fiber; a third polarization maintaining fiber; a sensor consists of a fiber Bragg grating formed in a core of the third polarization maintaining fiber; a fourth polarization maintaining fiber; a photodiode detects Bragg reflected light from the sensor and reference light from the referential reflecting end; a controller that detects modulation of an interference intensity between the Bragg reflected light and the reference light; and an incidence part that inputs the measuring light, wherein the incidence part being provided on the first polarization maintaining fiber or on both the second polarization maintaining fiber and the third polarization maintaining fiber.

Abstract: A phase retardance inspection instrument, comprising: a light source module for generating a single-wavelength light beam; a circularly polarized light generating module, comprising a polarizer and a first phase retarder, for receiving the single-wavelength light beam as it is guided to passe through the polarizer and the first phase retarder in order; and a detecting module, comprising a second phase retarder, a polarizing beam splitter, a first image sensor and a second image sensor, for receiving and guiding a circularly polarized light beam to travel through the second phase retarder and the polarizing beam splitter in order after it passes through a substrate under inspection, wherein the polarizing beam splitter splits an elliptically polarized light beam into intensity vector components of a left-hand circularly polarized light beam and a right-hand circularly polarized light beam, which are to be emitted into the first image sensor and the second image sensor, respectively.

Abstract: The stress of a sample semiconductor wafer is detected with high accuracy in the form of an absolute value without rotating the sample or the entire optical system. A laser light R is subjected to photoelastic modulation in a PEM 6 to generate a birefringence phase difference and then it is passed through first and second quarter wavelength plates and passes through a semiconductor wafer D having residual stress. When it is passed through a test piece, the direction of the stress of the test piece is detected when the angle between the laser light R and a linear polarization light is 0 and 90 degrees. The transmitted electric signal is delivered to an analog/digital converter 16, and the signal is inputted to a signal processor thus generating transmission signal data. The signal processor reads out the stored reference signal data and the transmission signal data and calculates a reference birefringence phase difference and the absolute values of the birefringence phase difference.

Abstract: In accordance with the present invention, a photoelastic layer for detecting stress and strain is described. The photoelastic layer comprises a photoelastic material that when strained refracts light anisotropically. The photoelastic layer further comprises an integrated polarizer attached on top of the photoelastic material. Also in accordance with the present invention, a photoelastic monitoring device is described for structural monitoring. The photoelastic monitoring device is made out of a photoelastic material or comprises a photoelastic material attached to a base material. The photoelastic monitoring device further comprises an integrated polarizer attached or coated directly over at least a portion of the photoelastic material. The photoelastic monitoring device is designed to be attached to a structure or a part. The monitoring device is attached to the structure in such a way that stresses and strains from the structure are transmitted into the photoelastic monitoring device.

Abstract: A method includes selecting one of performing ellipsometry or performing optical stress generation and detection. The method also includes, in response to selecting performing ellipsometry, applying at least one first control signal to a controllable retarder that modifies at least polarization of a light beam, and performing ellipsometry using the modified light beam. The method further includes, in response to selecting performing optical stress generation and detection, applying at least one second control signal to the controllable retarder, and performing optical stress generation and detection using the modified light beam. Apparatus and computer readable media are also disclosed.

Abstract: It is possible to observe a state of stress applied to a region around a cavity replicating a body cavity such as a blood vessel and the like in a three-dimensional model. In catheter insert simulation, when stress is applied to the region around the cavity in the three-dimensional model, it is possible to observe the catheter state together with a photoelastic effect corresponding to the stress state in the surrounding region caused by the catheter.

Abstract: It is possible to observe a state of stress applied to a region around a cavity replicating a body cavity such as a blood vessel and the like in a three-dimensional model. In catheter insert simulation, when stress is applied to the region around the cavity in the three-dimensional model, it is possible to observe the catheter state together with a photoelastic effect corresponding to the stress state in the surrounding region caused by the catheter.

Abstract: Disclosed is a method for characterizing a sample having a structure disposed on or within the sample, comprising the steps of applying a first pulse of light to a surface of the sample for creating a propagating strain pulse in the sample, applying a second pulse of light to the surface so that the second pulse of light interacts with the propagating strain pulse in the sample, sensing from a reflection of the second pulse a change in optical response of the sample, and relating a time of occurrence of the change in optical response to at least one dimension of the structure.

Abstract: Systems and methods for measuring stress in a specimen are provided. One system includes an optical subsystem configured to measure stress-induced birefringence in patterned structures formed on the specimen. In some embodiments, the optical subsystem may be configured as a spectroscopic ellipsometer, a multi-angle laser ellipsometer, a polarimeter, a polarized reflectometer, or some combination thereof. The system also includes a processor coupled to the optical subsystem. The processor is configured to determine stress in a material of the patterned structures using the stress-induced birefringence measurements. One method includes measuring stress-induced birefringence in patterned structures formed on the specimen using an optical technique. The method also includes determining stress in a material of the patterned structures using the stress-induced birefringence measurements.

Abstract: A method of making a standard tool for calibrating polarimeters that analyze stress in photoelastic material, includes the steps of partially annealing a starting piece of tempered glass so that the starting piece has a retardance below 250 nm/cm, removing a peripheral portion of the starting piece (preferably, at least about 20% of its radial dimension) to leave a working piece, cutting a rectangular parallelepiped from the working piece, polishing two opposing faces of the rectangular parallelepiped where the two opposing faces are spaced apart by a measurement distance through which light passes during stress analysis in a polarimeter, and determining a birefringence of the rectangular parallelepiped across the measurement distance using a calibrated polarimeter. The standard tool is the rectangular parallelepiped having the determined birefringence for the measurement distance. The method can be used to make a set of the standard tools with different measurement distances.

Abstract: A method for optical stress analysis comprises the steps of directing an incident beam of polarized light to the sample to be analyzed and analyzing a light bundle exiting the sample in two detection channels extending perpendicular to one another with respect to the polarization direction, providing that the incident beam is elliptically polarized, carrying out the elliptical polarization with an elliptic shape having a comparatively large ratio of the large principal axis to the small principal axis, the direction of rotation of the elliptical polarization of the incident beam changing periodically and using two alternative states of the direction of rotation for each measurement process, adjusting the detection channels which extend perpendicular to one another corresponding to the position of the principal axes of the ellipse and carrying out the difference between two measurements consecutively with the same beam intensity of the incident beam and the same ratio of principal axes, but with opposite direc

Abstract: A method and apparatus for characterizing and screening an array of material samples is disclosed. The apparatus includes a sample block having a plurality of regions for containing the material samples, a polarized light source to illuminate the materials, an analyzer having a polarization direction different than the polarization direction of the polarized light source, and a detector for analyzing changes in the intensity of the light beams. The light source, together with a polarizer, may include a plurality of light beams to simultaneously illuminate the entire array of materials with linearly polarized light so that characterization and screening can be performed in parallel. In addition, the materials in the sample block maybe subjected to different environmental conditions or mechanical stresses, and the detector analyzes the array as a function of the different environmental conditions or mechanical stresses.

Abstract: Stress-induced photoelastic birefringence compensates for intrinsic birefringence of cubic crystalline structures in deep ultraviolet (less than 200 nm) microlithographic imaging systems. Both the photoelastic birefringence and the intrinsic birefringence are expressed in a tensor format simplified by the symmetries of cubic crystalline structures. The stress-induced photoelastic birefringence can be sized to individually compensate for intrinsic birefringence exhibited in the same optical elements or preferably to collectively compensate for the cumulative effects of intrinsic birefringence in other optical elements in the lithography system.

Abstract: Titania-containing silica glass bodies and extreme ultraviolet elements having low levels of striae are disclosed. Methods and apparatus for manufacturing and measuring striae in glass elements and extreme ultraviolet elements are also disclosed.

Abstract: A measuring method capable of automatically analyzing quantitatively the inner state of a disk is provided. Linearly polarized light from a light source enters a retarder to produce a desired elliptically polarized state. The elliptically polarized light is then passed through a half-wave plate to rotate the direction of a principal axis of the ellipse. The light is expanded into two dimensions by lens systems and to obtain planar information, and is further transmitted through a disk substrate so that the birefringence of a specimen, which depends on an inner stress state and a polymer orientation state, changes the phase of the light. The light wave with its phase changed is passed through a polarizer arranged perpendicular to the principal axis of the retarder. The CCD detects the light wave as a light intensity.

Abstract: A method of detecting stress and strain using a powder coat finish and photoelastic techniques. A part is provided with a photoelastic layer comprising a non-opaque powder coat finish that becomes optically anisotropic when stressed. Photoelastic techniques are used to detect and measure stress and strain in the part. Fringe patterns appear in the photoelastic layer indicating the locations and magnitudes of the stress and strain when the part is illuminated with polarized light and viewed through a polarizing filter. Stress and strain resulting from applied forces are detected. Structural deformation in parts that have experienced plastic deformation is also detected. Photoelastic techniques using powder coat as a photoelastic technique are less expensive and easier to apply than traditional photoelastic coatings. Applications include testing of prototypes, stress testing, inspection and monitoring of production parts, and anywhere that viewing and measuring of stress and strain are of interest.

Abstract: The elaborately calculated method of the present invention using photoelastic analysis for finding contact relation between ball and track is characterized in that a photoelastic plate having a semi-circular section is used in measurement by observing contrast of stripes appeared thereon in stead of observing track profile from the plucked image of the object in conventional technique therefore being released from shortcoming of inaccurate measurement result due to vagueness of profile of plucked image.

Abstract: A method for optical stress analysis comprises the steps of directing an incident beam of polarized light to the sample to be analyzed and analyzing a light bundle exiting the sample in two detection channels extending perpendicular to one another with respect to the polarization direction, providing that the incident beam is elliptically polarized, carrying out the elliptical polarization with an elliptic shape having a comparatively large ratio of the large principal axis to the small principal axis, the direction of rotation of the elliptical polarization of the incident beam changing periodically and using two alternative states of the direction of rotation for each measurement process, adjusting the detection channels which extend perpendicular to one another corresponding to the position of the principal axes of the ellipse and carrying out the difference between two measurements consecutively with the same beam intensity of the incident beam and the same ratio of principal axes, but with opposite direc

Abstract: A non-destructive and non-contact method for measuring stress at the mid-plane of tempered glass plates that uses Bragg scattering from a pair of thermal gratings. The gratings are formed by parallel writing beams of laser light retroreflected through the glass. The polarization state of light from a delayed laser beam that scatters from both these thermal gratings is measured, and the change in polarization of the doubly scattered light with separation between the two gratings is correlated to the in-plane stress. Systems and techniques to take these measurements and control a glass manufacturing process are also disclosed.

Abstract: The elaborately calculated method of the present invention using photoelastic analysis for finding contact relation between ball and track is characterized in that a photoelastic plate having a semi-circular section is used in measurement by observing contrast of stripes appeared thereon in stead of observing track profile from the plucked image of the object in conventional technique therefore being released from shortcoming of inaccurate measurement result due to vagueness of profile of plucked image.

Abstract: In order to provide comprehensive and multi-purpose security, an optical security device comprises a substrate (10), and at least a first optically structured layer (14) which is such as to provide first, second and third optical inspection levels, namely a first inspection level (2) where a first optical property can be discerned with the naked eye, a second level (4) in which an object can be discerned with the aid of an optical inspection tool (26), and a third level (6) in which an encrypted object can be discerned with a decrypting optical inspection tool (20). The first layer (14) is constructed as a retarder plate of LCP material, having an array of elemental areas having different predetermined orientations.

Abstract: A method of detecting stress and strain using a powder coat finish and photoelastic techniques. A part is provided with a photoelastic layer comprising a non-opaque powder coat finish that becomes optically anisotropic when stressed. Photoelastic techniques are used to detect and measure stress and strain in the part. Fringe patterns appear in the photoelastic layer indicating the locations and magnitudes of the stress and strain when the part is illuminated with polarized light and viewed through a polarizing filter. Stress and strain resulting from applied forces are detected. Structural deformation in parts that have experienced plastic deformation is also detected. Photoelastic techniques using powder coat as a photoelastic technique are less expensive and easier to apply than traditional photoelastic coatings. Applications include testing of prototypes, stress testing, inspection and monitoring of production parts, and anywhere that viewing and measuring of stress and strain are of interest.

Abstract: A measuring method capable of automatically analyzing quantitatively the inner state of a disk is provided. Linearly polarized light from a light source enters a retarder to produce a desired elliptically polarized state. The elliptically polarized light is then passed through a half-wave plate to rotate the direction of a principal axis of the ellipse. The light is expanded into two dimensions by lens systems and to obtain planar information, and is further transmitted through a disk substrate so that the birefringence of a specimen, which depends on an inner stress state and a polymer orientation state, changes the phase of the light. The light wave with its phase changed is passed through a polarizer arranged perpendicular to the principal axis of the retarder. The CCD detects the light wave as a light intensity.

Abstract: An optical system with at least one optical element that causes a disturbance of the distribution of polarization over the cross section of a light beam wherein at least one birefringent optical element is provided, with a thickness which varies irregularly over the cross section, such that the disturbance of the distribution of polarization is at least partially compensated.

Abstract: Absolute strain is measured by providing a coherent beam of light and separating the coherent beam of light into first and second beams which are in quadrature with one another and which have different polarization angles. The first and second beams are combined in a manner which maintains the different polarization angles thereof, so as to form a combined beam. The combined beam is then applied to a Fabry-Perot strain sensor so as to form a reflected combined beam. The reflected combined beam is then separated into first and second reflected beams having different polarization angles. The intensity of the first and second reflected beams is then sensed, so as to determine a change in the etalon length of the Fabry-Perot sensor. The change in etalon length is indicative of the absolute strain sensed.

Abstract: The present invention relates to methods and apparatus for measuring the optical properties, eg twist angle, cell gap, input director, of a transmissive or reflective liquid crystal cell. For a transmissive liquid crystal cell the cell is placed between a polarizer and an analyzer and the transmission spectrum observed while rotating the analyzer until zero transmission is obtained at at least one wavelength. The twist angle and the surface rubbing orientations of the liquid crystal cell are determined by the relative angle between the polarizer and the analyzer while the cell gap is determined from the calculated retardation value d.DELTA.n with known .DELTA.n. For reflective cells cell gap is determined based on a knowledge of twist angle and is accomplished by observing zero reflection wavelengths from a reflective cell with the polarizer and analyzer in cross-orientation.

Abstract: An optical collector head comprises a beam splitting device (5) capable of producing at least three output beams (9) in different directions; a single objective lens (4) to provide a collimated beam to the beam splitting device (5); and an assembly of: (a) a quarter wave plate (6), or plate producing a similar effect; (b) a polarizer acting as an analyzing element; (c) a lens; and (d) a recording device (3/1, 3/2, 3/4) for the simultaneous capture of phase-stepped images from each output beam. The invention also includes a polarimetric device comprising an optical collector head as defined above and a source (12) of polarized light; and a polarimetric device comprising an optical collector head as defined above and a source (12) of polarized light.

Abstract: A pressure sensor includes two birefringent media, one of which is exposed o pressure to undergo pressure-variable birefringence. Polarized light passes through the birefringent media to be modulated in accordance with the pressure and is then made incident on a photodetector to detect the modulation. The use of two birefringent media provides temperature compensation.

Abstract: A birefringent bias is provided to an optical sensor by the addition of one or more single birefringent elements where the total birefringence-length product remains within the accepted tolerances of current devices. The bias provided by two or more elements is such that where each element has a birefringence, a dB/dT and a coefficient of thermal expansion term, the elements are arranged in tandem so that the combined birefringence terms equal the required birefringence bias and the dB/dT and coefficient of thermal expansion terms effectively cancel.

Abstract: The invention pertains to a method and a device for carrying out the quality control of an object (10) that comprises at least one transparent layer (18). According to this method and this device, at least one light beam (41) of a light source (42) is projected onto the object (10) at an angle (.alpha.) and is received by at least one photosensitive receiver (53). According to the invention, it is proposed that the light beam that emerges from the object be split before it is projected onto the first photosensitive receiver (53), with part of the light beam being deflected in the direction toward a second photosensitive receiver (62). This measure makes it possible to expose simultaneously two different photosensitive receivers (53, 62) so as to display different defects of an object (10).

Abstract: A fully distributed optical fiber strain sensor that makes use of the nonlinear Kerr effect and the photoelastic effect. The sensor includes a polarization maintaining optical fiber having a core region and a cladding region where the fiber is embedded within or adhered to a structural element that is to be monitored for strain. Counterpropagating optical pulses interact within the fiber such that the change in refractive index caused by the Kerr effect causes a portion of the pulse intensities to be emitted from the fiber. A strain on the fiber will cause the index of refraction of the core region to change such that a different pulse intensity is emitted from the core region. This change in the loss of pulse intensity can be used to determine the amount of strain on the structure at the interaction region. By taking a strain measurement along two polarization directions and at two different wavelengths, the direction of the strain can also be determined.

Abstract: A cladded birefringent pressure sensor for use in a pressure-sensing system. The sensor is a single composite plate consisting of two plates each with different indices of refraction. One surface of the sensor is exposed to the environmental pressure under measurement. A collimated broad band light source is transmitted via a fiber optic cable, a polarizer and a birefringent bias element which transmits a wavelength/polarization component of light through the sensor. An external force applied to the sensor adds a stress-induced component to the polarized lightwave. The lightwave exits the sensor and is captured by a second polarizer producing a modulated light spectrum. A focusing element collects the light and transmits it down another fiber optic cable. The cable transmits the light to an opto-electronic interface where the fringe pattern is extracted and a computer compatible signal is generated for a CPU.

Abstract: A fibre Bragg grating is used to stabilize the intensity and frequency fluctuations of two diode lasers simultaneously. The polarized optical output from the diode lasers is collimated and directed through a beam combiner device which combines the separate beams into a single beam, thus summing the optical power. The combined beam is directed into an optical fibre containing a fibre Bragg grating which reflects a fraction of the light back into each diode laser to cause low-coherence, stable operation of each laser.

Abstract: The present invention is arranged such that: laser light is irradiated onto the surface of a specimen over a predetermined length thereof in the direction of elongation to be measured; that scattering light of the laser light reflected from the specimen surface is photoelectrically converted to obtain speckle pattern data; out of the speckle pattern data thus obtained, the data from two zones on the specimen which are separated from each other by a predetermined distance in the elongation direction, are initially set as observation point data; with the use of the observation point data, the amounts of movement of the speckle patterns from the two zones on the specimen are calculated; the zones serving as observation point data sources are shifted in the speckle pattern movement direction each time the calculation results of the speckle pattern movement amounts reach a predetermined amount; and the elongation of the specimen between the initially set two zones is calculated based on (i) the shift amounts of th

Abstract: A birefringent active fiber laser sensor includes one or more fiber lasers 12, 14, 16, each having a pair of Bragg gratings 18, 20, embedded in a fiber 10 and excited by a common pump light 30. At least one of the lasers 12, 14, 16 has a laser cavity wit a predetermined birefrigence and a lasing light at a first lasing frequency along a first polarization axis, and at a second fusing frequency along a second polarization axis. A difference frequency between the first and the second lasing frequencies is related to the magnitude of the birefringence, and the birefringence varies in response to a perturbation. Output light 104 from each of the lasers 12,14,16 is fed to a defraction grating 106 which splits the beam 104 into different wavelength groups, each group having the two lasing frequencies and polarizations of a given laser.

Abstract: An integrated optical temperature and pressure sensor system that is birefringently biased. A broad band light source is transmitted via a fiber optic cable having a splitter, a collimator and a polarizer to a first birefringent bias element. The first birefringent element has a partially reflective coating to reflect back a portion of the light signal to the first polarizer to yield a first reflective modulated light that consists of temperature information irrespective of external forces. The non-reflected light continues to a second birefringent bias element. The second birefringent crystal provides additional birefringent bias to the light wave before the light wave enters an isotropic pressure sensor media. An external pressure applied to the sensor causes the light to experience stress-induced birefringence. The sensor comprises a highly reflective surface which redirects the light back through the sensor, both bias crystals and the polarizer to yield a second reflective modulated light spectrum.

Abstract: A polarization-independent optical detection apparatus for measuring light output from optical fibers comprises an optical detector having an input port for receiving input light by way of an optical path and an output for a corresponding detection signal. A polarization-transformation element is rotatably mounted in the optical path so that the input light passes through the element to reach the input port. A drive motor rotates the polarization-transformation element in a plane extending transversely of the optical path. The polarization-transforming element is selected to transform the polarization state of the input light reaching the detector, as the element spins, so that, for any given input polarization state, the time averaged electrical signal from the detector is approximately the average electrical signal from the detector over all input polarization states.

Abstract: The present invention is a method and an apparatus for the precise quantitative measurement of the magnitude of force exerted at the points of contact on a high density electrical interconnect that quantitatively determines the magnitude of the force. The invention includes the steps of establishing a pressing relationship between a photoelastic material and the high density interconnect, coupling plane-polarized light into the photoelastic material stressed as a result of the pressing relationship with the high density interconnect, coupling of the polarized light being at 45 degrees with the direction of pressing, capturing an image of the fringe pattern of the plane polarized light exiting the stressed photoelastic material, the fringe pattern comprising of fringes wherein the number of fringes varies with the magnitude of the pressing force, and counting the number of fringes produced to determine the magnitude of force exerted on the photoelastic member.

Abstract: Polarized light from a polarizer 12 is passed through a stressed birefringent object 14 and an analyser 16 to produce a fringe pattern representative of the stress in the object 14. The fringe pattern is observed with a CCD camera 18 and intensity information of the pattern is input to a computer 22. The process is repeated for at least two wavelengths of light and the information for the different wavelengths is combined to form a stress map of the object 14 for display on a VDU 24.

Abstract: A stress sensor having directional measurement capabilities based on the photoelastic effect in isotropic photoelastic materials. Directional measurement capability is achieved in the sensor by the incorporation of three different optical axes passing through the photoelastic element. This creates three independent stress sensors which utilize a single sensing element. Each of the three independent stress sensors are sensitive to applied stress in different directions. The response of each of the sensors is analyzed and the magnitude and direction of incoming stress is determined. The use of a sum-difference output detection scheme results in immunity to light source intensity variations, optical fiber microbending losses, and fiberoptic connector losses. The stress sensor is immune to electromagnetic interference (EMI) and electromagnetic pulse (EMP), and is compatible with fiberoptic data transmission and control lines.

Abstract: A method and apparatus for optically determining the distribution of normal force present at the mating surfaces of an electrical surface connector uses the birefringent properties of a photoelastic material. Photoelastic members are distributed between the two planar surfaces, and plane-polarized, narrow-band wave-length light is coupled into each member with an optical fiber. The light is directed to propagate along a principle strain axis of the photoelastic member. The temporarily birefringent photoelastic material provides a relative propagation delay between vector components of the light in each member which are perpendicular to the propagation direction. The light exiting each member is input to a plane polarizer, the output of which is measured with an intensity meter. The relative delay between the vector components creates a detectable change in intensity at the intensity meter.

Abstract: A method and apparatus for the automatic analysis of stress in a body. The device includes a measuring head and an apparatus for traversing the measuring head across a photosensitive material attached to the body. The measuring head measures the intensity of light reflected or dispersed from the photosensitive material. The reflected or dispersed light is emitted from and received by diodes in the measuring head. Electrical signals representative of the intensity of light traversing the photosensitive material in three directions are generated for each of a set of points on the photosensitive material. The electrical signals are analyzed by computer and converted to stress and strain data which may then be displayed on a plotter or monitor.

Abstract: An optical frequency domain distributed strain sensor for determining the strain distribution along an optical fiber includes an optical source that provides a polarization controlled optical interrogation signal having a frequency that varies in a recurring linear manner. The interrogation signal is injected into a sensor fiber embedded within a composite structure that places the fiber under strain. A portion of the interrogation signal is backscattered from the sensing fiber as a consequence of the strain experienced by the fiber and is mixed with a reference signal to produce beat frequency signals. The frequency of the beat signals is directly related the to position of backscatter in the sensing fiber while the amplitude of each beat frequency signal is directly related to the integrated strain-induced birefringence up to the backscatter point.