Abstract: Target devices for characterizing terahertz imaging systems are provided. The target devices include a terahertz resolution pattern having spatially distributed resolution features and one or more prism assemblies configured to provide a variable contrast level within the resolution features when used with terahertz radiation. Each prism assembly includes first and second prisms arranged in a Frustrated Total Internal Reflection (FTIR) configuration.

Abstract: The present invention relates to the field of biochemical detection, and in particular to a reading apparatus for reading an assay result on a testing element. The reading apparatus comprises a first light-emitting element, a first photodetector and a light blocking element, wherein the first light-emitting element emits light and illuminates one or more corresponding areas of the testing element, the first photodetector receives light from one or more corresponding areas of the testing element, and the light blocking element guides a path of light emitted from a light emitting element and/or from a testing element. The light blocking element separates photodetectors in separate spaces, including a first light blocking element and a second light blocking element, wherein the first light blocking element is located between the first light-emitting element and the first photodetector, to guide the light emitted from the light emitting element to illuminate the testing element.

Abstract: Apparatus and associated methods relate to a method of non-contact motion detection. A one-dimensional optical sensor detects motion of a target or objects on a conveyor belt through a continuous measurement of targets or objects and a real-time comparison of the pixel images captured by the one-dimensional optical sensor. In an illustrative embodiment, a one-dimensional sensor may be configured to determine motion of objects based on changes to the captured intensities of pixel images over time. The sensor may continually capture photoelectric pixel images and compare a current pixel image with a previous pixel image to determine a frame differential image value. The frame differential image value is evaluated against a predetermined threshold over a predetermined time period. Based on the evaluation, a signal is output indicating whether the objects on the conveyor belt are moving or jammed.

Abstract: The optical device for measuring at least one of reflected light (BRDF) and transmitted light (BTDF) from a sample, in all spherical directions of space around the sample, for each spherical direction of incident light includes a light source, and a goniophotometer configured to measure at least one of: directions of the incident light in spherical coordinates, and directions of the reflected light in spherical coordinates. The device further includes a dispersive screen, and a multi-sensor imaging device. The goniophotometer includes a first articulated arm supporting the light source; and a second articulated arm supporting the sample or a sample holder.

Abstract: Overlay-shift measurement systems are provided. An overlay-shift measurement system includes an optical device, a first light detection device and a processor. The optical device is configured to provide an input light to a metrology target of a semiconductor structure. The first light detection device is configured to receive a transmitted light from the metrology target when the input light penetrates the metrology target. The processor is configured to determine whether overlay-shift between a plurality of first photonic crystals and a plurality of second photonic crystals in the metrology target is present according to characteristics of the transmitted light.

Abstract: Evaluation of a rotating wheel is described. The evaluation utilizes information acquired by radiation reflecting off of one or more regions of the rotating wheel. An imaging device can acquire image data which is processed to evaluate the wheel. The radiation can comprise diffuse and/or coherent radiation. Image data for substantially an entire circumference of the wheel can be used in the evaluation.

Abstract: The optical imaging apparatus includes a metasurface lens including a substrate and a plurality of nano-structures patterned on a first side of the substrate. The optical imaging apparatus further includes imaging optics disposed in a spaced apart relationship with a second side of the substrate. The second side is opposite the first side on which the nano-structures are patterned. A surface of the imaging optics and the second side of the substrate define a space for accommodating an immersion fluid. The metasurface lens is configured to direct light incident on the plurality of nano-structures towards the imaging optics through the space accommodating the immersion fluid.

Abstract: An input device comprises a plurality of optical vibration sensors mounted in a common housing. Each optical vibration sensor comprises a diffractive optical element; a light source arranged to illuminate the diffractive optical element such that a first portion of light passes through the diffractive optical element and a second portion of light is reflected from the diffractive optical element; and a photo detector arranged to detect an interference pattern generated by said first and second portions of light. The optical vibration sensor is configured so that in use, after the first portion of light passes through the diffractive optical element, the first portion of light is reflected from a reflective surface onto the photo detector. The input device is placed in contact with a surface of a solid body, and an object is brought into physical contact with the surface of the solid body, thereby causing vibrations in the solid body.

Abstract: In one aspect, a system for monitoring soil composition within a field using an agricultural machine may include a ground-engaging tool configured to rotate relative to soil within a field as the agricultural machine is moved across the field. The ground-engaging tool may, in turn, include a tooth defining a cavity therein, with the cavity including an opening. Furthermore, the system may include a sensor positioned within the cavity, with the sensor configured emit an output signal through the opening for reflection off of the soil within the field. The sensor may also be configured to detect the reflected output signal as a return signal, with a parameter of the return signal being indicative of a soil composition of the soil within the field.

Abstract: The invention provides a calibration method and a calibration device of a system for measuring corneal parameters, and particularly the invention provides a system calibration method and device for geometric distortion, caused by camera shooting angle when measuring cornea-related parameters, of a digital slit lamp and a system of similar principles based on machine vision.

Abstract: A hand held spectrometer is used to illuminate the object and measure the one or more spectra. The spectral data of the object can be used to determine one or more attributes of the object. In many embodiments, the spectrometer is coupled to a database of spectral information that can be used to determine the attributes of the object. The spectrometer system may comprise a hand held communication device coupled to a spectrometer, in which the user can input and receive data related to the measured object with the hand held communication device. The embodiments disclosed herein allow many users to share object data with many people, in order to provide many people with actionable intelligence in response to spectral data.

Abstract: The optical displacement meter generates, from each position of a plurality of pixel rows in a U direction and a peak position in a V direction, a plurality of profiles of the X-Z cross section, and measures a three-dimensional shape of the measuring object based on the plurality of profiles acquired at different positions in the Y direction. The optical displacement meter determines, based on whether a profile exists in a blind spot region in which it is impossible to measure a height which occurs in a Y-Z cross section corresponding to an angle formed between a light projecting axis of a light projecting section and a light receiving axis of an image sensor based on a principle of triangulation, a part of the three-dimensional shape generated by a measuring unit as an erroneous detection value.

Abstract: A plurality of nozzles are arranged at intervals of a center-to-center distance along a circumferential orbit around the predetermined rotation axis integrally. The nozzle that is positioned at the working position is changed by rotating the plurality of nozzles around the predetermined rotation axis. At that time, regardless of the manner in which the nozzle positioned at the working position is changed, the nozzle approaching the working position, and the nozzle moving away from the working position, move within an imaging target range having a width smaller than twice the center-to-center distance with the working position as the center along the circumferential orbit. Then, a camera images the nozzle which is moving within the imaging target range. Thus, it is not necessary to temporarily stop the nozzle for imaging, and as a result, imaging of the nozzles is performed efficiently.

Abstract: Embodiments of the present disclosure provide a substrate measuring device in a lithography projection apparatus that provides multiple light sources having different wavelengths. In some embodiments, a lithography projection apparatus includes a substrate measuring system disposed proximate to a substrate stage, the substrate measuring system further including an emitter including multiple light sources configured to provide multiple beams of light, each of at least some of the multiple beams of light having a different wavelength, at least one optical fiber, wherein each of respective portions of the at least one optical fiber is configured to pass a respective one of the multiple beams of light, and a receiver positioned to collected light emitted from the emitter and reflected off of a substrate disposed on the substrate stage.

Abstract: An agricultural implement includes a chassis and a shank carried by the chassis. The shank includes: a shank body configured to penetrate a soil top surface; a sensor attached to an outer surface of the shank body and defining a probing area; and a sensor shield carried by the shank body in front of the sensor, the sensor shield being configured to deflect oncoming soil flow away from the sensor without substantially disrupting soil flow into the probing area.

Abstract: Disclosed is a metrology apparatus for use in a lithographic manufacturing process. The metrology apparatus comprises a radiation source comprising a drive laser having an output split into a plurality of optical paths, each comprising a respective broadband light generator. The metrology apparatus further comprises illumination optics for illuminating a structure, at least one detection system for detecting scattered radiation, having been scattered by the structure and a processor for determining a parameter of interest of the structure from the scattered radiation.

Abstract: Systems and methods for sensing changes in an optical sensing fibre, principally for detecting changes in strain. A plurality of optical probe pulses at different optical frequencies (f1, f2, . . . fn) spaced by ?f are transmitted into the sensing fibre. Light backscattered from the optical sensing fibre may be mixed with delayed backscatter frequency shifted by ?f+fm where fm is a heterodyne frequency. The backscattered or mixed light may be detected to determine changes in the sensing fibre. ?f may be chosen to optimise performance.

Abstract: An optical measuring device includes a measuring unit (an optical head and a control unit) that irradiates a detection portion of an immunochromatographic test piece with measurement light and measures light obtained from the detection portion due to the irradiation with the measurement light, and a determination unit that performs a determination regarding the immunochromatographic test piece on the basis of a determination according to a comparison of a measurement value obtained by the measuring unit with a preset threshold value, the measuring unit performs the measurement of the light obtained from the detection portion a plurality of times, and the determination unit performs a determination regarding the immunochromatographic test piece when the determination unit determines that a measurement value in an nth measurement is equal to or greater than the threshold value and also determines that a measurement value in an (n+1)th measurement is equal to or greater than the threshold value.

Abstract: A device is disclosed for measuring the geometry of the inner wall of bores, drill holes and passages, which are optionally countersunk, and in particular for threaded, pin, and rivet connections of workpieces, said device comprising at least one optical sensor measuring towards the inner wall and capable of being introduced into the drill hole and rotated via a feed/rotating unit, wherein an auxiliary object is provided with a passage and rests on the surface of the workpiece, through which passage said sensor is inserted into the countersink and/or bore. The device is characterized in that the inner wall of the auxiliary object is provided with a structure and that the sensor scans said structure(s) while passing through the auxiliary object. The disclosure also relates to a corresponding method.

Abstract: In a semiconductor manufacturing process, it is necessary to cut a die close to the edge of a wafer in order to obtain as many dies as possible from one wafer. Accordingly, with respect to a charged particle beam device and an optical inspection device used in a semiconductor manufacturing process, there is a demand for detecting the height of the wafer close to the edge of the wafer with high accuracy, in order to measure or examine close to the edge of the wafer with high accuracy. Further, there is a demand for high speed height-detection in order to realize high throughput for the semiconductor manufacturing process. In the present invention, the foregoing can be achieved by the following configuration: sandwiching a target region on a wafer, a first pattern and a second pattern are projected onto one side and the other side respectively of the target region from an oblique direction with respect to the wafer top-surface, enabling an image of the first pattern and/or second pattern to be used.

Abstract: This automatic analysis apparatus is provided with: an analysis port comprising a reaction container holding part that holds a reaction container storing the liquid mixture of a sample and a reagent, a light source that emits light to the liquid mixture stored in the reaction container held by the reaction container holding part, and a detector that detects light generated when the light from the light source is emitted to the liquid mixture; and a control unit that controls the analysis port, and analyzes the sample on the basis of information about the detected light.

Abstract: An inspection system for inspecting a composite material member formed of a composite material has a main body part; an ultrasonic probe connected with the main body part and configured to contact the main surface; an optical sensor part connected to the main body part to be movable in a first direction; and a processor. The ultrasonic probe is configured to input ultrasonic wave to the main surface of the composite material member and to receive reflection wave generated from the ultrasonic wave reflected by the composite material member. The optical sensor part is configured to emit sensor light in a second direction orthogonal to the first direction, and to receive reflection light generated from the sensor light reflected on the intersection surface. The processor is configured to output a measurement result based on the reflection wave and the reflection light.

Abstract: A measurement probe is configured to be detachably connected to a bio-optical measurement apparatus and includes: an illuminating fiber configured to irradiate body tissues with illumination light; light receiving fibers configured to receive return light of the illumination light reflected and/or scattered from the body tissues; an optical element configured to transmit the illumination light and the return light and to keep distances between the body tissues and distal ends of the illuminating fiber and the light receiving fibers, constant; and a contact detecting fiber configured to receive the return light to detect contact between a distal end face of the optical element and the body tissues, and detect the return light at a detection region on the distal end face through which the illumination light and the return light pass. The detection region is located outside an illumination region of the illuminating fiber.

Abstract: A nephelometry system for an automatic analysis device may include a light source, a stop, and a photodetector on the one hand and a receptacle position on the other hand that are movable relative to one another in order to improve the measurement quality of a nephelometry system. The nephelometry system may determine a location of an interval I of recorded light intensity signals which only contains light intensity signals that emerge from a scattered portion of a light beam after passing through a measurement cell placed into the nephelometry system. Methods of nephelometric determination of an analyte are also provided, as are other aspects.

Abstract: Low-coherence enhanced backscattering (LEBS) spectroscopy is an angular resolved backscattering technique that is sensitive to sub-diffusion light transport length scales in which information about the scattering phase function is preserved. Lens-based and lens-free fiber optic LEBS probes are described that are capable of measuring optical properties of a target tissue through depth-limited measurements of backscattering angles within the enhanced backscattered cone.

Abstract: A method for detecting a defect on a surface (12) by multidirectional lighting includes acquiring a plurality of images of the surface (12) using an optical device (14) having an optical axis, each image being acquired with a lighting of the surface along a lighting direction (E, E?) given for each point of the surface (12) and an optical direction (O), the images being acquired with different lighting directions (E, E?) or different combinations and/or with different optical directions (O); for each point, calculating a plurality of parameters, the parameters including coefficients of an equation characterizing the response of said point of the surface as a function of the lighting direction (E, E?) and an observation direction (B, B?); and deducing from the calculated parameters whether the surface (12) has a defect at said point.

Abstract: Disclosed is a method to produce composite materials, which contain customized mixes of nano- and/or micro-particles with tailored electromagnetic spectral properties, structural elements based thereon, in particular layers, but also bulk materials including inhomogeneous bulk materials. In some embodiments the IR-reflectivity is enhanced predominantly independently of reflectivity for visible wavelength. The enhanced IR-reflectivity is achieved by combining spectral properties from a plurality of nano- and/or micro-particles of distinct size distribution, shape distribution, chemical composition, crystal structure, and crystallinity distribution. This enables to approximate desired target spectra better than know solutions, which comprise only a single type of particles and/or an uncontrolled natural size distribution.

Abstract: An evaluation device includes a projector to project a pattern having an edge component onto an object, an imaging device to capture an image of the object, a reflective-property correction unit to correct an amount of change in shape of a virtual image of the pattern reflected in the object, using reflective-property data of a surface of the object, and an evaluation-value calculator to evaluate image clarity of the surface of the object based on the corrected amount of change. A computer-readable non-transitory recording medium storing a program for causing a computer to execute a method. The method includes correcting an amount of change in shape of a virtual image of the pattern reflected in the object based on image data that is obtained by capturing an object onto which a pattern having an edge component is projected, using reflective-property data of a surface of the object.

Abstract: A respiratory therapy system configured to deliver gases to a patient can have a non-sealed gas flow generating arrangement configured to deliver a high flow of positive gas to an airway of a patient and a negative flow of gas away from an airway of the patient. The positive and negative flows of gas can be generated simultaneously. The flow of positive and negative gases reduces exhaled gases in anatomical dead spaces of the patient.

Abstract: A radiation system to generate a radiation emitting plasma, the radiation system include a fuel emitter to provide a fuel target at a plasma formation region, a first laser arranged to provide a first laser beam at the plasma formation region incident on the fuel target to generate a radiation emitting plasma, an imaging device arranged to obtain a first image of the radiation emitting plasma at the plasma formation region, the first image indicating at least one image property of the radiation emitting plasma, and a controller. The controller is arranged to receive the first image, and to generate at least one instruction based on the at least one image property of the radiation emitting plasma to modify operation of at least one component of the radiation system to reduce a detrimental effect of debris.

Abstract: Methods of optimizing a metrology process are disclosed. In one arrangement, measurement data from a plurality of applications of the metrology process to a first target on a substrate are obtained. Each application of the metrology process includes illuminating the first target with a radiation spot and detecting radiation redirected by the first target. The applications of the metrology process include applications at a) plural positions of the radiation spot relative to the first target, and/or b) plural focus heights of the radiation spot. The measurement data includes, for each application of the metrology process, a detected pupil representation of an optical characteristic of the redirected radiation in a pupil plane. The method includes determining an optimal alignment and/or an optimal focus height based on comparisons between the detected pupil representations in the measurement data and a reference pupil representation.

Abstract: Systems for visually inspecting a surface of an object are provided, which includes a visual inspection head, and a positioning apparatus for controlling a position and/or an orientation of the visual inspection head with respect to the object. The visual inspection head includes a visual inspection module, and an angle controlling module for ensuring a predetermined angle of the visual inspection system with respect to an area to be inspected of the surface of the object. The angle controlling module may include a pointer for projecting a light beam onto the area to be inspected and a camera for determining whether the light beam is reflected substantially perpendicularly. The system is configured to move the visual inspection head relative to the object until the light beam is reflected substantially perpendicularly. Methods for visually inspecting a surface are also provided.

Abstract: An assay device is disclosed comprising a housing (10) and a test portion (2), electronic circuitry (30) and an optical assembly (41), each at least partially located in the housing (10). The test portion (2) comprises one or more test zones (2E, 2F) adapted to receive an analyte (22) and a fluorescent label associated with the analyte, the fluorescent label being excitable by excitation light and adapted to emit emission light upon excitation by excitation light. The electronic circuitry (30) comprises one or more light sources (31, 32) and one or more light detectors (33). The optical assembly (41-44) comprises one or more excitation light guides (41, 44) adapted to guide excitation light from the one or more light sources (31, 32) to the one or more test zones (2e, 2f), and/or one or more emission light guides (43, 44) adapted to guide emission light from the one or more test zones (2e, 2f) to the one or more light detectors (33).

Abstract: Methods and apparatus are used to assess the viability of tissue such as flap tissue. According to one aspect of the present invention, a method for assessing the viability of flap tissue includes obtaining an oxygen saturation level associated with a first location on the flap tissue, determining whether the oxygen saturation level is less than a first level, and identifying the first location as having a poor blood supply if the oxygen saturation level is less than the first level.

Abstract: Embodiments described are generally directed to a test sample apparatus. The test sample apparatus generally comprises a holder base arranged that accommodates a tablet or cell phone. The apparatus has a hood that is placed over a portion of the tablets illuminating touchscreen such that the illuminating touchscreen provides light that can be collected by the hood. There is a chamber integrated with the hood adapted to accommodate a chemically activated test strip. The chemically activated test strip is illuminated when the hood collects light from the illuminating touchscreen. A lens in the hood interposed between the camera and the test strip enables the camera to focus on a portion of the chemically activated test strip when the hood is placed over the portion of the illuminating touchscreen.

Abstract: A method for detecting abnormality in a light emitting device including a semiconductor laser element that is pulse-driven by pulse-control to emit excitation light, a wavelength conversion member including a phosphor and that emits fluorescent light by being irradiated with the excitation light, and a light receiving element disposed on a light extraction side of the wavelength conversion member and that detects the excitation light, the method includes: pulse-controlling an applied voltage with a pulse width shorter than a time from a start of voltage application until an optical intensity of light extracted from the wavelength conversion member reaches a maximum intensity, thereby pulse-driving the semiconductor laser element to achieve laser oscillation; measuring an optical intensity of the excitation light, or optical intensities of both the excitation light and the fluorescent light; and determining whether or not the optical intensity or the optical intensities falls within a prescribed range.

Abstract: A three-dimensional (three dimensional) segmentation method with intensity-based Doppler variance (IBDV) based on swept-source OCT. The automatic three dimensional segmentation method is used to obtain seven surfaces of intra-retinal layers. The microvascular network of the retina, which is acquired by the IBDV method, can be divided into six layers. The microvascular network of the six individual layers are visualized, and the morphology and contrast images can be improved by using the segmentation method. This method has potential for earlier diagnosis and precise monitoring in retinal vascular diseases. Each tomographic image is composed of eight repeat scans at the same position, which achieves a high time difference to improve the sensitivity of the angiographic method. A subpixel registration algorithm is used to reduce the eye movement. The GPU was used to accelerate the data processing to achieve real-time preview of the acquired data.

Abstract: A test system for determining a surface characteristic of a chip facet includes an on-chip waveguide, a detector, and a processor. The on-chip waveguide is configured to direct test light towards the facet, where a portion of the test light is reflected and a portion of the test light is transmitted. The detector is configured to measure an amount of the reflected portion or the transmitted portion, and the processor is configured to determine a surface characteristic of the facet, such as a facet angle, a facet curvature, and/or a facet roughness, on the basis of the measured amount.

Abstract: Technologies are generally described for optical image diversion to provide image capture and display from one or more directions using an image sensor. In some examples, an optical assembly may be used to receive light or other electromagnetic radiation from multiple (including opposing) directions and to provide light or other electromagnetic radiation to an image sensor or detector to capture images. The optical assembly may be centrally-aligned or offset. The optical assembly may be configured to allow collection of light or other electromagnetic radiation from two or more locations. An auto focus or stabilization element may be integrated into one or more optical paths inside an optical switching device. In other examples, a conical or spherical element may be employed to allow capture of panoramic/360 degree images or video. Elements may also be stacked.

Abstract: This invention relates to an apparatus for retro-reflection measurement. By using the one or more sampling devices each consists of a holed mirror and an circular aperture, and corresponding one or more measuring devices, it realize the retro-reflection measurement in one or more observation angles at one time. By flexibly selecting the size of the circular apertures and holed mirrors, it can accurately adjust the measuring annular bands and corresponding observation angles. Without any other intermediate devices, it can realize complete annular band of light measurement which ensures the measurement accuracy. At the same time, filters and monitor device can be set flexibly to realize various measurement functions. It has the advantages of speed measurement, high accuracy, small volume, wide application, comprehensive functions, and can be widely applied in laboratory, industrial production line and field measurement etc.

Abstract: A surface property indexing apparatus includes a measurement device that generates a plurality of captured images and an arithmetic processing apparatus that indexes a surface property of the measured object. The captured images are of the same wavelength of the reflected light that forms images in an image capturing device, and is of different reflection angles of the reflected light that forms images in the image capturing device in the direction corresponding to the longitudinal direction of the measured object in the captured image. The arithmetic processing apparatus reconstructs the generated captured images to generate processing target images having a common wavelength of the reflected light and a common reflection angle of the reflected light and composed of pixels corresponding to the different view field positions of the measured object, and indexes the surface property of the measured object on the basis of the generated processing target images.

Abstract: In an illumination system (12, 13) for a scatterometer, first and second spatial light modulators lie in a common plane and are formed by different portions of a single liquid crystal cell (260). Pre-polarizers (250) apply polarization to first and second radiation prior to the spatial light modulators. A first spatial light modulator (236-S) varies a polarization state of the first radiation in accordance with a first programmable pattern. Second spatial light modulator (236-P) varies a polarization state of the second radiation accordance with a second programmable pattern. A polarizing beam splitter (234) selectively transmits each of the spatially modulated first and second radiation to a common output path, depending on the polarization state of the radiation. In an embodiment, functions of pre-polarizers are performed by the polarizing beam splitter.

Abstract: Disclosed is a method to produce composite materials, which contain customized mixes of nano- and/or micro-particles with tailored electromagnetic spectral properties, structural elements based thereon, in particular layers, but also bulk materials including inhomogeneous bulk materials. In some embodiments the IR-reflectivity is enhanced predominantly independently of reflectivity for visible wavelength. The enhanced IR-reflectivity is achieved by combining spectral properties from a plurality of nano- and/or micro-particles of distinct size distribution, shape distribution, chemical composition, crystal structure, and crystallinity distribution. This enables to approximate desired target spectra better than know solutions, which comprise only a single type of particles and/or an uncontrolled natural size distribution.

Abstract: Methods, analytical devices and analytical systems are provided for determining at least one analyte concentration in a body fluid sample. The methods, which may be incorporated into the devices and systems, can include the following steps: applying a body fluid to a test carrier; illuminating the test carrier by at least one light source, where the at least one light source is modulated by using at least two modulation frequencies; receiving light remitted by the test carrier by using at least one detector; determining an analyte concentration by evaluating at least one detector signal generated by the detector, where the detector signal is demodulated with the at least two modulation frequencies to generate at least two demodulated detector signals, each demodulated signal corresponding to one of the modulation frequencies; and detecting a fault by comparing the at least two demodulated detector signals.

Abstract: A method and a gonioradiometer for the direction-dependent measurement of at least one photometric or radiometric characteristic of an optical radiation source. The emission direction of the photometric or radiometric characteristic is described using a system of planes (A, B, C), the planes of which intersect at an intersection line which passes through the radiation centroid of the radiation source, and using an emission angle (?, ?, ?) which specifies the emission direction (?, ?, ?) within a considered plane. A sensor or the radiation source is fastened to a multi-axis articulated robot. The robot is configured to only swivel about precisely one of its axes during a measuring process, in which measurement values relating to different emission angles (?, ?, ?) within a considered plane of the system of planes (A, B, C) or to different planes at a considered emission angle (?, ?, ?) are detected.

Abstract: A hand-held measurement device for appearance analyses includes a measurement array which comprises a number of illumination means for applying illumination light to a measurement field in at least three illumination directions and a number of pick-up means for capturing the measurement light in at least one observation direction. The illumination directions and the observation directions lie in a common system plane. At least one pick-up means is embodied to spectrally gauge the measurement light in a locally integral way, and at least one imaging pick-up means is embodied to gauge the measurement light in terms of color in a locally resolved way. The spectral pick-up means and the locally resolving pick-up means are arranged such that they receive the measurement light reflected by the measurement field under the same observation conditions and in particular from the same observation direction.

Abstract: The present disclosure relates to an optical gas sensor including at least: an optical wave guide including a first elliptical mirror formed along at least part of a first 3-dimensional ellipsoid and having a first focal point and a second focal point, a second elliptical mirror formed along at least part of a second 3-dimensional ellipsoid and having the first focal point and a third focal point, and a third elliptical mirror formed along at least part of a third 3-dimensional ellipsoid and having the first focal point and a fourth focal point; one or more optical sensors installed at at least one of the first, second, third, and fourth focal points; and one or more light sources installed at at least one of the first, second, third, and fourth focal points where the one or more optical sensors are not installed.

Abstract: In one embodiment, a method includes receiving a search query by one or more computing devices. A set of data objects to search are identified, and then an operation is executed. The operation involves stepping through the set of data objects with a step size of N, and at each step determining whether the object is responsive to the query. If the end of the set is reached before Y data objects are determined to be responsive, and X or more data objects are determined to be responsive, then an estimate of the number of responsive data objects in the set is provided. Otherwise, N is modified and the operation is re-executed.

Abstract: Described herein are systems and methods for noninvasive functional brain imaging using low-coherence interferometry (e.g., for the purpose of creating a brain computer interface with higher spatiotemporal resolution). One variation of a system and method comprises optical interference components and techniques using a lock-in camera. The system comprises a light source and a processor configured to rapidly phase-shift the reference light beam across a pre-selected set of phase shifts or offsets, to store a set of interference patterns associated with each of these pre-selected phase shifts, and to process these stored interference patterns to compute an estimate of the number of photons traveling between a light source and the lock-in camera detector for which the path length falls within a user-defined path length range.

Abstract: Metrology measurement methods and tools are provided, which illuminate a stationary diffractive target by a stationary illumination source, measure a signal composed of a sum of a zeroth order diffraction signal and a first order diffraction signal, repeat the measuring for a plurality of relations between the zeroth and the first diffraction signals, while maintaining the diffractive target and the illumination source stationary, and derive the first order diffraction signal from the measured sums. Illumination may be coherent and measurements may be in the pupil plane, or illumination may be incoherent and measurements may be in the field plane, in either case, partial overlapping of the zeroth and the first diffraction orders are measured. Illumination may be annular and the diffractive target may be a one cell SCOL target with periodic structures having different pitches to separate the overlap regions.