Abstract: The present invention provides an FTIR system comprising a first light source emitting light of a first wavelength, a sample volume with an adjacent sensor surface, a detector for detecting light reflected at said sensor surface. The sensor surface is illuminated by said first light source fulfilling the condition of total internal reflection and generating an evanescent field with a decay length within the sample volume. The system further comprises means for changing the decay length of the evanescent field and means for correlating the detected signals with the change of the decay length of the evanescent field.

Abstract: The present invention provides systems, apparatus and methods for detecting a film in an electronic device disposed in an electronic device processing tool. The invention includes a mounting member adapted to couple the apparatus to a view port of the electronic device processing tool, an optical energy source disposed within the mounting member and adapted to illuminate the electronic device within the electronic device processing tool, an optical system adapted to pass wavelengths indicative of a presence of the film, and an optical detector positioned to receive optical energy reflected from the substrate and passing through the optical system adapted to detect a presence or absence of the film. Numerous other features are disclosed.

Abstract: A semiconductor examination apparatus includes an energy source device that supplies a semiconductor substrate having a pn junction with excitation energy that causes luminescence in the semiconductor substrate, an image capturing device that captures a first luminescence image of the semiconductor substrate supplied with first excitation energy and a second luminescence image of the semiconductor substrate supplied with second excitation energy that is different in magnitude from the first excitation energy, a luminescence image processing device that calculates the difference in luminescence intensity between the first luminescence image and the second luminescence image at positions on the semiconductor substrate and generates intensity difference image data, and a detecting device that detects a crack position of a crack occurring in the semiconductor substrate on the basis of determination values based on the magnitude of the difference on the intensity difference image data.

Abstract: Embodiments are generally described that include lasers having two mirrors, at least one of which has a reflectivity related to a presence or concentration of a target analyte. Output radiation generated by the laser may be related to the presence of the target analyte.

Abstract: Nanohole electrodes useful in opto-electronic devices, and in particular, organic photovoltaics devices incorporating nanohole electrodes, are disclosed. An exemplary embodiment includes a photovoltaic device with a first electrode comprising a nanohole film, a second electrode, and an active layer located between the electrodes. Methods of producing a nanostructured electrode are also provided.

Abstract: This invention generally relates to a composition, an apparatus, and a method for authenticating a product. In particular, the invention relates to an ink composition for marking a product with a continuous inkjet printer. The composition includes a visible ink and a UV, visible, and/or IR marker. Marking includes depositing the ink composition on the product with the continuous inkjet printer. A marked product is authenticated with a hand-held apparatus that activates the marker in the mark with UV radiation. Activation of the marker in the mark changes the absorbance/reflectance of visible radiation by the mark without changing the visual appearance of the mark. Authenticity of the product is assessed by a change in absorbance or reflectance of visible radiation by the mark after activation of the mark.

Abstract: A record medium determining device 1, which determines a kind of a record medium 16 by irradiating a laser light 17 to a surface of the record medium 16, detecting a received light position and a received light intensity of a reflected light 18 by a line sensor 14, and comparing a distribution state of the received light position and the received light intensity with a previously determined distribution state, is disposed on the upstream side of a record medium conveyance path 653 with respect to a fixing unit.

Abstract: The present subject matter relates to methods of high-speed analysis of product samples. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward an optical detector. Signals for the detector are compared with reference signals based on a portion of the illuminating light passing through a reference element to determine characteristics of the product under analysis. Temperature within the analysis system is monitored and the output signals of the optical detectors are compensated or corrections are made within the analysis calculations to compensate or correct for the system temperature. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Abstract: Aberrations in an optical system can be detected and measured using a method comprised of a test target in the object plane of a projection system and imaging onto the image plane with the system. The test target comprises at least one open figure which comprises a multiple component array of phase zones, where the multiple zones are arranged within the open figure so that their response to lens aberration is interrelated and the zones respond uniquely to specific aberrations depending on their location within the figure. This is a unique and new method of detecting a variety of aberration types including coma, spherical, astigmatism, and three-point through the imaging onto photosensitive material or image detector placed in the image plane of the system and the evaluation of these images.

Abstract: A spatial frequency optical measurement instrument (100) is provided according to the invention. The instrument (100) includes a spatial frequency mask (120) positioned in a light path and configured to encode light with spatial frequency information, a light receiver (140) positioned to receive the light encoded with the spatial frequency information, wherein the light encoded with the spatial frequency information has been interacted with a sample material, and a processing system (180) coupled to the light receiver (140) and configured to determine a change in the spatial frequency information due to the interaction of the light with the sample material.

Abstract: A method and apparatus is disclosed for measuring properties of an unknown sample. A reflectometer and one or more reference pieces is provided. A set of data is collected from the unknown sample and a combination of the reference pieces. A combination of the sample and reference piece data independent of incident intensity is used to determine a property of the unknown sample without calibrating incident reflectometer intensity. The method and apparatus disclosed can measure properties of thin films or scattering structures on semiconductor work pieces. In one embodiment the reflectometer utilizes vacuum ultraviolet (VUV) wavelength reflectometry. Multiple relative reflectance measurements are used to overcome effects of the inevitable contamination buildup that occurs when using optical systems in the VUV region.

Abstract: A light scattering type smoke sensor includes a sensor body, light-emitter for emitting light toward an open smoke-sensing space and outputting a light-received signal according to the amount of scattering light received, and a fire judging unit for judging whether fire occurs or not on the basis of the amount of received light determined on the basis of the outputted light-received signal.

Abstract: Apparatuses and methods for accurately measuring the reflectivity of a target surface, under conditions where the distance between a measuring probe and the target surface is not fixed. At least two measurements of the target reflectivity are taken under different conditions, and then these two or more measurements are combined in order to calculate the target reflectivity in a way which is independent of the probe-to-target distance. In particular, the different conditions are such that each measurement samples radiation reflected from the target surface at a different distribution of angles. The apparatus can also be used to accurately measure the distance between the probe measurement head and a target surface.

Abstract: A non-contacting type paint film thickness measuring device includes a generating portion for generating a terahertz pulse light, a detecting portion for detecting the terahertz pulse light, a measured wave form in time-series obtaining portion for obtaining a measured wave form indicating an electric field intensity of a terahertz echo pulse light, and an intrinsic wave form in time-series obtaining portion, having an intrinsic electric field spectrum calculating portion and an intrinsic wave form in time-series calculating portion, for calculating an intrinsic wave form in time-series of an object.

Abstract: A fluorescence sensor is constituted by: a light source, for emitting excitation light of a predetermined wavelength; a dielectric block, formed of a material that transmits the excitation light; a metal film, formed on a surface of the dielectric block; a non flexible film of a hydrophobic material, formed on the metal film at a film thickness within a range of 10 to 100 nm; a sample holding portion, for holding a sample such that the sample contacts the non flexible film; an incident optical system, for causing the excitation light to enter the interface between the dielectric block and the metal film through the dielectric block such that conditions for total internal reflection are satisfied; and fluorescence detecting means, for detecting fluorescence emitted by a substance within the sample, which is excited by evanescent waves that leak from the interface when the excitation light enters the interface.

Abstract: A reflection characteristic measuring apparatus for measuring a characteristic, such as a gloss, of a sample surface. The apparatus includes at least one illuminator for illuminating a sample surface to be measured with light and a plurality of light receiving sections which are arranged axially symmetrically to each other with respect to a normal to an intended object surface and which output two-dimensional light receiving data. A deriving section derives a characteristic of the sample surface such as gloss based on a weighted average obtained by applying a weighting factor to each of the light receiving data outputted from the light receiving sections.

Abstract: In a method of detecting an abnormal semiconductor device, a pattern on a semiconductor substrate may be irradiated by a light. A reflected light from the pattern may be detected. Spectrum data of the reflected light may be compared with a predetermined reference spectrum data that is obtained from a test pattern of a reference sample. Whether the pattern is normal or not may be determined based on comparison results. Thus, the abnormal semiconductor device may be recognized in the processes for manufacturing the semiconductor device to prevent the subsequent processes from being performed on the abnormal semiconductor device. As a result, the yield of normal or non-defective semiconductor devices may be improved.

Abstract: A system is provided to monitor targeted pest populations, disease, presence of transgenic and non-transgenic plants, or targeted pest population in a transgenic crop using remote imagery to discern differences in crops along with pest infestation in all crop varieties. The system relies on the fact that plant leaves are known to change color based on stress, herbivory, and other environmental factors. The system provides a special camera that can see reflected light energy across the visible and near infrared (about 400-1000 nm) to identify these effects.

Abstract: An image acquisition device capable of accomplishing special-effect processing on real-time motion of the image data in a preview mode is disclosed. The device includes a lens, an optical sensor, an image signal processor, a special-effect processor, a storage unit, and an image display unit. The optical sensor receives an optical signal representing an image through the lens and outputs an electric signal corresponding to the image. The image signal processor couples to the optical sensor for processing the electric signal with a first processing mode and then outputting a raw image data. The special-effect processor couples to the image signal processor for processing the raw image data with a second processing mode and then outputting a processed image data. The storage unit saves the processed image data. The image display unit displays the image based on the processed image data.

Abstract: A fault detection and classification method is disclosed that uses raw back-focal-plane image data of radiation from a substrate surface, detected by a scatterometer detector, to determine a variation in the raw data and correlate the variation in the raw data with a possible fault in a lithographic apparatus or a process that patterned the substrate surface. The correlation is carried out by comparing the variation in the raw data with known metrology data. Once a fault has been determined, a user may be notified of the fault.

Abstract: A method and a device for carrying out surface plasmon resonance measurement. A beam of electromagnetic radiation is produced by a source of electromagnetic radiation. The beam of electromagnetic radiation is directed through a prism onto a material layer in an angle of incidence, which material layer covers a planar surface of the prism. A resonance phenomenon is caused. A beam of reflected electromagnetic radiation is produced and directed by the surface to a detector for detecting the level of intensity of the beam of reflected electromagnetic radiation. The change of intensity of the beam of reflected electromagnetic radiation, caused by the surface resonance phenomenon, is measured. The beam of reflected electromagnetic radiation is reflected with a mirror to the detector.

Abstract: A method for detecting blast induced pressure changes includes exposing a material, a contained solution, a membrane-bound solution, or a photonic crystal material, having a first optical property, to a pressure wave having a blast level. A change in the first optical property to a second optical property of the exposed material, contained solution, membrane-bound solution, or photonic crystal material is determined, and the extent of change corresponds to the blast level.

Abstract: An object is to improve production efficiency as well as reducing the burden on an operator. Light is radiated on a crystalline silicon film used for a thin-film silicon device, reflection light reflected by the crystalline silicon film is detected, a parameter of the luminance of the detected reflection light is measured, and film quality evaluation of the crystalline silicon film is performed in accordance with whether the parameter of the luminance is within a predetermined proper range or not.

Abstract: A method, device and computer program product for determining the material of an object based on its optical characteristics is disclosed. More specifically, the method operable on a touch screen that includes on its periphery a plurality of light sources (Li, i=1 to N) and sensors (Sj, j=1 to M), comprises the steps of transmitting a light from each of the light sources to an object within the boundary of the touch screen, determining a distance from the object to each of the light sources and each of the sensors, detecting the presences of the transmitted light at each of the sensors, determining, at each of the sensors a reflective index, n2 of the object and determining the object material based on the determined reflective indices.

Abstract: The present invention provides a method for detecting a drug resistant microorganism by surface plasmon resonance (SPR). Values of SPR angle shift (V) and the drop of SPR angle shift (D) of control group (V1 and D1) and sample (V2 and D2) can determine the microorganism is drug resistant by identifying (I) ration of V1/V2 larger than 1.001, (II) ration of D1/D2 larger than 1.001 and (III) the SPR angle shift of the sample more smooth or monotonic that that of the control. The present invention further provides SPR as a device used for the method of the present invention.

Abstract: A plant sensor includes a light source section having first and second light emitters configured to irradiate the first and second measuring light toward the object to be measured, respectively, and a light receiver configured to receive reflected light from the object to be measured, and output light-receiving signals, a controller configured to control emission of the first and second light emitters at a different timing, an integrator configured to integrate the light-receiving signals, and output an integration signal, and a calculator configured to calculate, according to the integration signal, a reflection rate as a ratio of light volume of the reflected light of the first measuring light from the object to be measured to light volume of the first measuring light, a reflection rate as a ratio of light volume of the reflected light of the second measuring light from the object to be measured to light volume of the second measuring light, and obtains information regarding a growing condition of the objec

Abstract: A device for measuring light scattering and absorption properties of a tissue, the device comprising: a probe comprising first and second optical fibers for irradiation and detection. The optical fibers are substantially parallel to each other at the distal end, and are separated by a distance of less than 2 mm, wherein said first and second optical fibers are arranged in said probe at an angle, 6=10 deg. to 45 deg., to the plane perpendicular to the distal end of said probe and wherein the tips of the optical fibers at the distal end are polished parallel to the plane perpendicular to the distal end of said probe.

Abstract: An image taken by an imaging device is displayed on a display unit. When a confirmation instruction is inputted through an input unit, image teaching is performed while the image displayed on the display unit is set to a setting object image. A measurement item which is of a candidate of a measurement process including specification of a reference position is displayed as the measurement process to accept selection. Specification of cutout area which constitutes one measurement target region is accepted, a measurement point including a local region or a feature point which is used for the measurement is automatically set in the measurement target region based on pieces of information on the set measurement process and reference position.

Abstract: The invention relates to a method of optical characterization, comprising a step of evaluating the doping of a substrate (SUB) using a reflected beam emanating from a light source, said method being carried out using apparatus comprising: said light source (LAS) to produce an incident beam (I) in an axis of incidence; a first detector (DET1, DET2) to measure the power of said reflected beam (R) in an axis of reflection; said axes of incidence and reflection crossing at a measurement point and forming a non-zero angle of measurement; and a polarizer (POL) disposed in the path of the incident beam (I). Furthermore, the light source (LAS) is monochromatic. The invention also envisages an ion implanter provided with said apparatus.

Abstract: The present invention is a method of determining the presence of keratin, particularly hard keratin, such as exists in mammalian hair and feathers, and objects comprising such materials. The method of the present invention also includes displaying information derived from such a determination, as well as a measurement method followed by transmission of data to a remote processing site for analysis or display. The invention also includes devices for carrying out the determination, display and/or transmission.

Abstract: A system (and corresponding methodology) for testing, evaluating and diagnosing quality of solar concentrator optics is provided. The innovation discloses mechanisms for evaluating the performance and quality of a solar collector via emission of modulated laser radiation upon (or near) a position of photovoltaic (PV) cells. The innovation discloses positioning two receivers at two distances from the source (e.g., solar collector or dish). These receivers are employed to collect modulated light which can be compared to standards or other thresholds thereby diagnosing quality of the collectors.

Abstract: An analytical instrument for making measurements based on detection of an SPR resonance minimum or a refractometer transition shadowline on a detector array is improved by configuring a diaphragm of the instruments illumination system to include a first aperture, a second aperture, and an opaque region between the first and second apertures, wherein the opaque region of the diaphragm casts a shadow on the detector array to provide a reference minimum from which a relative location of the resonance minimum or transition shadowline is measurable. By establishing a reference minimum on the detector array as a reference location for relative measurement, the instrument compensates for signal drift and other instrument variations. The diaphragm may include additional apertures and opaque regions for generating additional reference minima over the extent of the detector array.

Abstract: The present disclosure presents systems and methods for providing for detecting a presence of an object or a user via a non-contact selection switch. An LED may emit a signal, comprising high components and low components within a plurality of pulses. A detector may determine that an average intensity of a received portion of the electromagnetic signal is below a predetermined threshold. The average intensity may be responsive to a ratio of high components duration over a period of time to low components duration over the period of time. An object located in proximity of the non-contact switch may reflect the portion of the signal. The detector may detect presence of the object by determining that a sum of average intensities of the received portion of the electromagnetic signal and the reflected portion of the electromagnetic signal exceeds the predetermined threshold responsive to the ratio of a duration of high components to a duration of low components within or over the period of time.

Abstract: The invention makes use of the air-polycarbonate interface of an optical disk as an accurate reflection reference. The air-polycarbonate interface can be used both during production of an optical disk or during normal operation of an optical disk drive. The air-polycarbonate reflection measurement can be used in a number of applications, including the process of identifying an optical disk during normal operation, detecting contamination of the optical disk during use, and testing of an optical disk during manufacture.

Abstract: The plasmon resonance sensor (1) comprises a chip (2) of transparent plastic with a gold layer (3) made up of narrow part surfaces (4), arranged in a row, on the inner side of which light from a planar light source (12) is convergently guided. A Fourier lens (24) integrated in the chip (2) forms the reflected angular spectrum on the detector (23), arranged at a focal separation (F) from the integrated Fourier lens (24) for temporal determination of the incident angle with a resonant intensity minimum of reflected light. An incident lens (13) brings about imaging of the planar light source (12) in the form of lines of light on the part surfaces (4), which are further imaged in the form of lines of light on the detector (23).

Abstract: A metal identifying device precisely identifies a metal material in a metal member having a plurality of through-hole portions penetrating through the metal member. The metal identifying device of the present invention includes a measurement unit that obtains a measurement value by measuring an electrical property and/or optical property of a test object, a threshold value determination unit that determines a threshold value with use of a reference value obtained by measuring the property of a metal member having a metal composition to be identified and information indicating a ratio of the through-hole portions to a measurement area in the test object and/or information indicating a configuration of the through-hole portion, and a comparison/identification unit that identifies a metal composition of the test object by comparing the measurement value and the threshold value.

Abstract: A system and method for identifying a biological sample associated with a container is disclosed. A universally unique identifier is associated with each container. In one or more embodiments, the identifier comprises one or more markings having a specular reflectance which differs from the specular reflectance of the outer surface of the container adjacent the markings. A detection apparatus detects the differences in specular reflectance light to identify the identifier associated with the container. The identifier is associated with certain information regarding the container and biological sample. From that point forward, any information about the contents of the container may be retrieved by searching on its container ID. Because the container ID is assured by its manufacturer to be universally unique, the container and sample may move from one organization to another under the same identifier, and information about the contents of the container may be shared by querying on its container ID.

Abstract: There is disclosed a phase sensitive surface plasmon resonance sensing apparatus wherein a testing beam may be reflected from a sensing surface at a plurality of angles. There are also disclosed methods for surface plasmon resonance sensing.

Abstract: A method of analyzing the quality of optical effects on an optical recording medium as well as applications of the method in connection with optimizing a write strategy and analyzing the write quality for an optical recording medium are disclosed. The method comprising the steps of determining waveforms of a measured (61) and a nominal (60) optical signal, and calculating an amplitude-difference parameter from a difference (62-65) in the measured and nominal waveforms. A quality measure of the optical effects can thereby be determined from the amplitude-difference parameter. The applications of the method include, but are not limited to: a device for reading optical effects from an optical storage medium with means for determining the an amplitude-difference parameter, an optical recording apparatus with means for adjusting the power level and/or level duration in a write strategy and an IC for controlling an optical storage apparatus.

Abstract: A plasmon sensor apparatus using a metallic fine periodic structure designed to reduce the dependences of the resonance wavelength and sensitivity on the incident angle. The plasmon sensor apparatus has a sensing element including a metallic member having periodic slit openings and metallic portions, and a substrate on which the metallic member is held, a light source which emits light so that the light is incident on the sensing element, and a photodetector which detects light obtained from the light source. If the period of the slit openings is ?; the width of the metallic portions is d; and the thickness of the metallic member is h, the aspect ratio h/(??d) of the slit openings is 3 or higher and the opening width (??d) is equal to or smaller than the wavelength of light applied from the light source to the sensing element.

Abstract: An apparatus for recognizing objects with a laser light source and a light receiver has an at least partly reflective wall and an interspace between the laser light source and the wall, through which an object can be moved or in which an object can be placed. A movable mirror device is arranged between the laser light source and the wall in such a way that light emitted by the laser light source can be directed onto the wall. In a method for recognizing objects a mirror device directs the light onto an at least partly reflective wall and is controlled in such a way that the wall is irradiated by the light. The light receiver detects the light reflected from the wall and, in the process, registers an object moving or placed between the laser light source and the wall by way of a change in the reflected light detected.

Abstract: A preferred embodiment comprises a method and system for (a) detecting objects or targets which may or may not be nonreflective to electromagnetic radiation, and/or (b) generating an image of a subject or area, comprising generating an entangled photon pair beam; splitting the entangled photon pair beam into first and second parts; the first parts being directed in a first direction towards a first location, and the second parts being received into a measuring device; measuring the physical characteristics of the conjugate second parts to determine whether or not the first parts have encountered the presence or absence of an object at the first location in combination with the time that the first part takes to enter the first location. The method and system incorporate a photon beam in a reference path that never directly interacts with the object yet is determinative of presence or absence of an object at the first location.

Abstract: The invention relates to a device for use in analysing the performance of a spectrometric system of the type which comprises a spectrometer to which a probe for propagating electromagnetic radiation is connected. The device comprises a holder for holding both a reflectance standard and the probe so that the tip of the probe is fixated at a predetermined position relative to the reflectance standard and so that at least part of the electromagnetic radiation emitted from the probe is diffusely reflected from the reflectance standard back to the probe. The invention also relates to a method, a kit and an assembly.

Abstract: A method and a device for a spatially resolved examination and evaluation of the properties of surfaces, in particular such properties of surfaces which affect the optical impression which the surface makes. A defined radiation is directed at a first predetermined solid angle to an examined surface. Furthermore, at least a portion of the radiation affected by the examined surface in particular by diffusion and reflection, is detected at a second predefined solid angle. At least one measured variable is spatially resolved captured which characterizes at least one predetermined property of the radiation affected by the examined surface. At least over a portion of the spatially resolved measured values at least one statistical parameter for characterizing the surface is determined.

Abstract: The measuring method for providing a precise determination of a geometry of a concave portion is provided.

Abstract: A conveyor system comprises means for conveying a sample at a controlled velocity between functions of a production line and through an interrogation zone, means for generating at least one beam of electromagnetic radiation of a terahertz frequency and directing the beam through the interrogation zone, means for detecting the electromagnetic radiation reflected from or transmitted through the sample as it moves through the interrogation zone, and means for analyzing the detected electromagnetic and for outputting a signal to at least one of the functions in dependence on the result of the analysis.

Abstract: A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.

Abstract: In temperature-controlled printing plate exposers, it is possible for condensation of dampening solution or moisture to occur in a region of printing plates or laser apparatus. In this way, imaging of printing plates can be impaired and/or the laser apparatus can suffer damage resulting from corrosion. An apparatus detects the quantity of dampening solution on a measuring spot in an exposer for printing forms. The intention is for the ingress of condensation within a printing plate exposer to be detected more accurately. A measuring beam having a first intensity is reflected from the measuring spot and a measured signal is generated at a photoelectric conductor. Following evaporation of the dampening layer on the measuring spot, a reference signal is generated at a photoelectric converter by reflected radiation from the measuring spot. By comparing a measured signal and a reference signal, the dampening solution or moisture can be detected.

Abstract: A reflectometer calibration technique is provided that may include the use of two calibration samples in the calibration process. Further, the technique allows for calibration even in the presence of variations between the actual and assumed properties of at least one or more of the calibration samples. In addition, the technique utilizes a ratio of the measurements from the first and second calibration samples to determine the actual properties of at least one of the calibration samples. The ratio may be a ratio of the intensity reflected from the first and second calibration samples. The samples may exhibit relatively different reflective properties at the desired wavelengths. In such a technique the reflectance data of each sample may then be considered relatively decoupled from the other and actual properties of one or more of the calibration samples may be calculated. The determined actual properties may then be utilized to assist calibration of the reflectometer.

Abstract: An analysis system for determining an analyte of a body fluid comprises a test element and an analysis instrument having a measurement and evaluation unit. The test element has a sample application zone and two analysis zones and a reagent system, whose reaction with the analyte results in a detectable change characteristic for the desired analytical result. The measurement and evaluation unit comprises two analog measuring units, in each of which an analog measurement signal corresponding to one of the analysis zones is generated, two analog-digital converters for digitizing the analog measurement signal, a comparator unit for comparing control data values based on the digitized measurement signals, and a final processing unit, in which, if the determined deviation between the control data values of the digitized measurement signals is less than a predefined value, at least one of the control data values is allowed to pass for further processing into the desired analytical result.