Abstract: A semiconductor integrated circuit device having a control signal system for avoiding failure to check an indefinite signal propagation prevention circuit, for facilitating a check included in an automated tool, and for facilitating a power shutdown control inside a chip. In the semiconductor integrated circuit device, power shutdown priorities are provided by independent power domains (Area A to Area I). A method for preventing a power domain having a lower priority from being turned OFF when a circuit having a high priority is turned ON is also provided.

Abstract: A modularly expandable data storage device receptacle includes a housing configured to receive a memory device for providing additional data storage for a computer system, in which the housing is external to the computer system. A first connector is provided for receiving data signals from the computer system for accessing the memory device. A second connector is provided for passing data signals from the computer system to a connector of another modularly expandable data storage device receptacle.

Abstract: A connector system includes a circuit board having a plurality of holes extending therethrough. First and second connector bodies, each having a front wall, are positioned on first and second sides of the circuit board, respectively. The front walls of the connector bodies have a plurality of signal pin openings aligned with the circuit board holes. A plurality of signal pins extend through the signal pin openings of the first and second connector bodies and through the circuit board holes. At least one of the plurality of circuit board holes has a diameter larger than a diameter of the signal pin extending therethrough, such that walls of the at least one circuit board hole are spaced apart from the signal pin extending therethrough.

Abstract: A multi-potential guarding technique for preventing electrical charge exchange to or from an electrical system containing potential gradients and sources of electrical noise. An inner electrically conductive guard shield surrounds the system to be guarded. The electrical potential of the inner electrically conductive guard shield is such that there is ideally no net current flow to the guard shield from the electrical system therewithin. An outer electrically conductive guard shield surrounds the inner electrically conductive guard shield. An operational amplifier drives the outer electrically conductive guard shield to an electrical potential that is substantially equal to that of the inner electrically conductive guard shield so that there is substantially no potential difference between the inner and outer guard shields which has the effect of producing a high insulation impedance around the guarded system.

Abstract: Power cable includes, along with standard conductor wires encased in insulation, a heat responsive cable alongside the conductor wires. The heat responsive cable includes helically wound wires each coated with heat sensitive dielectric, The two wound wires at one end are oppositely connected to an alarm and to a main power switch, forming a normally open safety circuit. The dielectric on the heat responsive cable is subject to vaporization in response to a fault in the power cable, whereby the wound wires make electrical contact to close the safety circuit, activate the alarm, and open the main power switch.

Abstract: A protective circuit for the input of a multimeter is provided with series connected thermistors partially shunted by a varistor whereby overload voltage is distributed between the thermistors enabling protection at higher voltage levels. Shunt connected varistors protect primarily against transient overloads and are thermally coupled to the aforementioned thermistors to bring the thermistors more rapidly to their high resistance condition such that damage to the varistors is avoided and continued protection is provided.

Abstract: A stimulus generator comprising a single-shot pulse generator, a measuring resistor, a differential amplifier, and a gated comparator to identify the moment of onset of a mismatch between the patterns of current and voltage variation in the output electric signal, this mismatch being caused by the onset of a thermal breakdown in the circuit under test.