Abstract: A nonvolatile semiconductor memory device is provided, which includes an input buffer provided with a first inverter that can electrically adjust circuit threshold values, a circuit: threshold value monitor provided with a second inverter having the same circuit configuration as the first inverter to detect the circuit threshold values of the first inverter when the input and output of the second inverter are short-circuited, respectively, a memory storing parameter values that correspond to the circuit threshold values detected by the circuit threshold value monitor, and a data-reader circuit reading the parameter values given to the first inverter from the memory.

Abstract: The addressing circuit of a semiconductor memory device includes a plurality of register units coupled to an input unit and a plurality of memory cell arrays, wherein the plurality of register units are configured to store inputted data in response to register control signals, and a control unit configured to generate the register control signals, using defect information of respective memory cell arrays, to control whether or not the register units store the inputted.

Abstract: A data output circuit for a semiconductor memory apparatus includes a data output control unit that generates a selection signal, an output timing signal, and an input control signal in response to a read command and a clock, and a signal-responsive data output unit that receives parallel data in response to the input control signal, arranges the parallel data in response to the selection signal, and sequentially outputs the arranged parallel data as serial data in synchronization with the output timing signal.

Abstract: A circuit for controlling the read cycle includes plurality of shift stages configured to sequentially shift read signals; and an activating unit configured to activate a read cycle signal which represents a read cycle, by performing logical operation for output signals of the plurality of the shift stages, wherein the plurality of the shift stages are configured to sequentially shift the read signals for a period corresponding to burst setting information.

Abstract: A programming method applied to a memory is provided. The memory includes a number of memory cells. The method includes the following steps. A target cell of the memory cells is programmed in response to a first programming command. The target cell is programmed in response to a second programming command.

Abstract: A page buffer includes a first ground voltage supply unit for applying a ground voltage to first and second registers according to a level of a sense node, and a second ground voltage supply unit for applying the ground voltage to the first and second registers irrespective of a level of the sense node. A method of programming a non-volatile memory device includes storing a high-level data in a first node of a first register of a plurality of page buffers, precharging a sense node with a high level, resetting the data stored in the first node of the first register according to a voltage level of the sense node, precharging the sense node with a high level, storing external data in the first node according to a voltage level of the sense node, and performing a program operation according to the data stored in the first node.

Abstract: A semiconductor memory device includes a control circuit to control an access to a memory cell according to an input command, a transfer mode setting circuit to hold a transfer mode, an address pin input/output with an address in a first transfer mode and input/output with data in a second transfer mode and a switching circuit to switch a connection destination of the address.

Abstract: A method for improving a maximum operating frequency of an integrated circuit including a first shift register within a first random access memory (RAM) block is described. The method includes improving the maximum operating frequency by finding the first shift register implemented within the first RAM block.

Abstract: A memory device and a refresh method are provided herein. The memory device includes a memory array having memory rows. When an array refresh strobe (ARS) signal is received, it is determined whether the memory rows are required to be refreshed according to tag flags and reset statuses corresponding to the memory rows. When a row refresh strobe (RRS) signal is received, it is determined whether to refresh one of the memory rows according to a plurality of parameters including a value of a row to refresh counter, a value of a refresh deadline counter and/or a queue. When it is decided to start a refresh operation, one of the memory rows is selected according to the tag flag and the status, and the status of the selected memory row is updated after the selected memory row is refreshed.

Abstract: A write driving circuit is provided to drive a global input/output line to write same data to memory cells according to a combination of a first test data signal and a second test data signal in a test mode, regardless of input data signals.

Abstract: A semiconductor memory device including a first latch that latches a Mode Register Set (MRS) code consisting of multiple bits in response to an MRS command pulse, a code controller that generates a control signal in response to a code value of preset bits out of an output signal from the first latch, a second latch that selectively latches the output signal from the first latch in response to the control signal and a mode decoder that decodes an output signal from the second latch to output an operation mode.

Abstract: A memory access scheme employing one or more sets of shift registers interconnected in series to which data may be loaded from or written into one or more memory devices. That is, data from the memory devices may be parallel loaded into the sets of shift registers and then serially shifted through the shift registers until it is output from the sets of shift registers and transferred to its destination. Additionally, the data may be read from and loaded into the memory devices to/from the sets of shift registers such that the shifting of the shift registers is uninterrupted during the reading and/or loading of data. Additionally, data from the memory devices may be loaded into two or more parallel chains of shift registers and then serially shifted through the shift register chains.

Abstract: In one embodiment, an apparatus comprises a queue, write control logic coupled to the queue and operable in a write clock domain, and a first-in, first-out buffer (FIFO) coupled to the write control logic. The queue is configured to store a plurality of data items, wherein each data item has a type which is one of a plurality of types of data items that can be stored in the queue. The write control logic is configured to maintain write pointers that identify entries in the queue for each of the plurality of types. The write control logic is configured to update the write pointer corresponding to an input type for an input data item written to the queue. Additionally, the write control logic is configured to enqueue a write event in the FIFO to transport the enqueue event to a read clock domain different from the write clock domain.

Abstract: A signal aligning circuit includes a plurality of pads receiving input signals in parallel 1 bit by 1 bit; a first transferring unit for transferring the input signals as first signals in synchronization with a first clock signal of an internal clock, and transferring the input signals as second signals in synchronization with a second clock signal of the internal clock; a second transferring unit for transferring the first signals in synchronization with the second clock signal of the internal clock; and an aligning unit for aligning the first and second signals transferred from the first and second transferring units and outputting the aligned signal as output signals.

Abstract: Program voltages of a non-volatile memory device are controlled variably according to a program/erase operation count. The non-volatile memory device includes a program voltage supply unit for applying a program voltage to a memory cell, a program/erase count storage unit for storing a total program/erase operation count of the non-volatile memory device, a program start voltage storage unit for storing levels of program start voltages to be differently supplied according to the program/erase operation count, and a program voltage controller for controlling the program start voltage according to the program/erase operation count.

Abstract: Semiconductor devices include a plurality of fuses and a plurality of program circuits, respective ones of which are configured to program respective ones of the plurality of fuses. The devices further include a shift register configured to activate at least two of the program circuits. In some embodiments, the shift register includes a first shift register configured to generate first select signals and a second shift register configured to generate second select signals corresponding to data to be programmed to the plurality of fuses. Respective ones of the program circuits may be configured to program respective ones of the fuses responsive to respective pairs of the first select signals and the second select signals.

Abstract: A semiconductor device having a register and an information generation circuit can reduce data to be transferred, and consequently save electric power. The register stores first information. The information generation circuit generates, in response to a signal acquired from the an exterior of the device, second information indicating which bits of the first information is to be inverted.

Abstract: Disclosed is a FIFO peek access device that utilizes a peek signal to access data stored in a FIFO without losing or erasing data. The peek signal is applied to read address logic and prevents the incrementing of the pointers in the peek address logic, so that after a read enable signal is asserted, the same data block can be accessed again on the next read enable signal.

Abstract: An integrated circuit having a plurality of sectors is disclosed. One embodiment includes a sector driver for simultaneously driving word lines corresponding to a single sector, the sector driver being connected to each word line and comprising a programmable sector memory for storing the sectors and word lines corresponding to each sector.

Abstract: A semiconductor memory device includes n stages of memory cell units, sense amplifier units, and shift registers. N units of the shift registers are connected to one another on the left end sides. The signal processing units and the reversed signal processing units are disposed adjacent to one another in each of the n units of the shift registers. The signal processing units located on the odd-numbered positions counted from the input end side are connected to one another. The reversed signal processing units located on the even-numbered positions counted from the input end side are connected to one another. The signal processing units located on the end opposite to the input end side are connected to the reversed signal processing units located on the end opposite to the input end side. Each of the signal processing units includes the logic circuit unit and the flip-flop while each of the reversed signal processing units includes the reversed logic circuit unit and the reversed flip-flop.

Abstract: In one embodiment, an integrated circuit comprises at least one logic circuit supplied by a first supply voltage and at least one memory circuit coupled to the logic circuit and supplied by a second supply voltage. The memory circuit is configured to be read and written responsive to the logic circuit even if the first supply voltage is less than the second supply voltage during use. In another embodiment, a method comprises a logic circuit reading a memory cell, the logic circuit supplied by a first supply voltage; and the memory cell responding to the read using signals that are referenced to the first supply voltage, wherein the memory cell is supplied with a second supply voltage that is greater than the first supply voltage during use.

Abstract: Embodiments of the present invention are directed to memory subsystems implemented within, or connected to and accessed by, parallel, pipelined, integrated-circuit implementations of computational engines designed to solve complex computational problems. Additional embodiments of the present invention are directed to memory subsystems implemented within, or connected to and accessed by, a variety of different types of electronic devices. One embodiment of the present invention comprises a memory controller implemented in a first integrated circuit or other electronic system and one or more separate memory devices. Alternative embodiments of the present invention incorporate the memory controller within one or more memory devices that are connected to, and accessed by, an integrated-circuit-implemented computational engine or another electronic device.

Abstract: A capacitor structure having a dielectric layer disposed between two conductive electrodes, wherein the dielectric layer contains at least one charge trap site corresponding to a specific energy state. The energy states may be used to distinguish memory states for the capacitor structure, allowing the invention to be used as a memory device. A method of forming the trap cites involves an atomic layer deposition of a material at pre-determined areas in the dielectric layer.

Abstract: An improved cross-coupled CMOS high-voltage latch that is used for storing data bits to be written to memory cells of a non-volatile memory is provided with a switching circuit that, during writing of data bits into the memory cells of the latch, provides a high series impedance between one leg of the latch and ground to limit leakage current. A large number of latches are connected in parallel and their accumulated leakage currents are limited by the switching circuit to prevent overload of a high-voltage generator, such as a charge pump circuit, for the high-voltage latch, so that data can be properly written in the memory cells of the non-volatile memory.

Abstract: Embodiments of the invention relate generally to a coupling device, to a processor arrangement, to a data processing arrangement, and to methods for transmitting data. In an embodiment of the invention, a coupling device for coupling a memory, which has a serial data output, with a processor, which has a parallel data input, is provided. The coupling device may include a serial data interface configured to receive data, a parallel data interface configured to transmit data, and a cache memory coupled to the serial data interface and to the parallel data interface, wherein the cache memory is configured to receive and store data, which have been received in a serial data format via the serial data interface, and to transmit data stored in the cache memory to the parallel data interface.

Abstract: Performing a hash algorithm in a processor architecture to alleviate performance bottlenecks and improve overall algorithm performance. In one embodiment of the invention, the hash algorithm is pipelined within the processor architecture.

Abstract: The semiconductor integrated circuit includes a command decoder, a shift register unit and a command address latch unit. The command decoder is responsive to an external command defining write and read modes and configured to provide a write command or a read command according to the external command using a rising or falling clock. The shift register unit is configured to shift an external address and the write command by a write latency in response to the write command. The column address latch unit is configured to latch and provide the external address as a column address in the read mode, and to latch a write address, which is provided from the shift register unit, and provide the write address as the column address in the write mode.

Abstract: A data input circuit converts input serial data to n-bit parallel data, and outputs the n-bit parallel data by following an address signal. The data input circuit includes a data shifting unit including a plurality of columns, and sequentially shifting the input serial data through the plurality of columns; and a selection unit selecting a column among the plurality of columns as an input column by following the address signal, wherein the input serial data is inputted to the data shifting unit through the input column. Thus, the data input device can speed up its processing speed with a simplified circuit structure whose circuit size is reduced.

Abstract: A circuit can control a bit rate of information output from a multi-purpose register (MPR) of a semiconductor memory device in a test mode, thereby reducing current consumption for outputting information in a multi-purpose register (MPR). The semiconductor memory device includes a multi-purpose register configured separately to store a plurality of information, and to control a bit rate of the stored information in a test mode, each of the information having multiple bits, and a connection selector configured selectively to connect an output terminal of the multi-purpose register to one of a number of global lines according to an operation mode.

Abstract: In one embodiment of the invention, circuitry and hardware for connectivity testing are fabricated on an IC, and in particular an IC containing a flash memory array. This testing circuitry is electrically connected to the bond pads of the IC. In some embodiments, the testing circuitry includes a boundary scan cell connected to each bond pad, allowing for rapid connectivity testing of flash memory chips in accordance with testing standards such as the JTAG standard. The invention further includes methods in which the pins and/or memory cells of a flash memory chip are sequentially sent a series of data so as to test the connectivity of portions of the IC. The sequentially-sent data is then retrieved and compared to the original data. Discrepancies between these sets of data thus highlight connectivity problems in the IC.

Abstract: A memory circuit includes a latch having a first node and a second node to store data such that a logic level of the first node is an inverse of a logic level of the second node, a MIS transistor having a gate node, a first source/drain node, and a second source/drain node, the first source/drain node coupled to the first node of the latch, and a control circuit configured to control the gate node and second source/drain node of the MIS transistor to make an upward lingering change in a threshold voltage of the MIS transistor in a first operation in response to data stored in the latch and to make a downward lingering change in the threshold voltage in a second operation in response to data stored in the latch.

Abstract: A memory cell array includes a plurality of non-volatile semiconductor memory elements, each memory element storing data in a non-volatile manner. A shift register stores data read from the semiconductor memory element and sequentially transfers the data outside, the shift register also stores data transferred from outside and stores the data in the semiconductor memory element. A syndrome generation circuit is connected to an output terminal of the shift register, the syndrome generation circuit generating syndrome of data output from the output terminal. An error-correction circuit uses the data and the syndrome to correct an error of the data.

Abstract: Embodiments of the present invention include circuitry for issuing address and data signals to a memory array using a system clock and a write clock. A locked loop may be used to compensate for additional delay experienced by the system clock relative to write clock and ensure synchronization of the clock signals. A write latch enable block may be used to develop a write latch enable signal for issuance along with a corresponding address signal. The write latch enable signal can be timed such that it arrives at an appropriate time to issue the data corresponding to the issued address.

Abstract: The non-volatile semiconductor memory device has a circuit which maintains and holds the potentials of bit lines, and either ones of even-bit lines or odd-bit lines are connected to the circuit. When the bit line potential holding circuit is connected to even-bit lines and a block copy is performed, data is first outputted to the even-bit lines, and after the potential of the even-bit line is determined, the bit line potential holding circuit operates. Then, biasing of the potential of the even-bit lines is carried out by the bit line potential holding circuit, the potentials of the bit lines are maintained and held. At the same time, data is outputted to the odd-bit lines and the potentials of the odd-bit lines are determined. Then, a program voltage is supplied to a selected word line, and data is simultaneously written (programmed) in the memory cells connected to the even-bit lines, and the memory cells connected to the odd-bit lines.

Abstract: A pipe latch device includes an output controller for outputting first and second output control signal groups based on a DLL clock signal and a driving signal; an input controller for generating an input control signal group; and a pipe latch unit for latching data on a data line when a corresponding input control signal is activated, and outputting latched data when a corresponding output control signal is activated, wherein the output controller includes a plurality of shifters, each for delaying an input data signal by half clock and one clock to output a first and second output signals in synchronization with the DLL clock signal and the driving signal; and a plurality of output control signal drivers for outputting the first and second output control signal groups based on the first and second output signals.

Abstract: A semiconductor memory device includes a memory cell array including primary word lines and one or more redundant word lines, a timing signal generating circuit configured to generate a refresh timing signal comprised of a series of pulses arranged at constant intervals, and a refresh-target selecting circuit configured to successively select all the primary word lines and all the one or more redundant word lines one by one in response to the respective pulses of the refresh timing signal, wherein a refresh operation is performed with respect to the word lines that are successively selected by the refresh-target selecting circuit.

Abstract: A circuit and method includes first circuits powered by a first supply voltage and second circuits powered by a second supply voltage. A level shifter is coupled between the first circuits and the second circuits. The level shifter is configured to select a supply voltage output for a circuit including one of the first supply voltage and the second supply voltage in accordance an input signal, where the input signal depends on at least one of an operation to be performed and component performing the operation.

Abstract: A circuit and method for testing address uniqueness of a memory array are disclosed. The circuit includes a plurality of current sinks associated with rows and columns of the memory array. A plurality of word lines of the memory array are coupled to the plurality of current sinks. A current mirror circuit is coupled to the plurality of current sinks and a circuit output node is coupled to the current mirror circuit. The circuit output node is configured to compare a total current from tested word lines of the memory array with a predetermined reference current, and to output a test pass or test fail indication in response to the comparison.

Abstract: A semiconductor storage device includes: a plurality of memory cell arrays, each having a memory cell arranged therein, the memory cell including a ferroelectric capacitor and a transistor; a dummy capacitor operative to provide a reference potential corresponding to a potential read from the memory cell; a sense amplifier circuit including an amplifier circuit to compare and amplify potentials between a pair of bit lines; a reference potential correction capacitor connected to the pair of bit lines together with the dummy capacitor; and a control circuit configured to output a correction signal based on shift information to correct the reference potential, the shift information being retained in at least one of the plurality of memory cell arrays. The reference potential correction capacitor shifts the reference potential by changing the amount of accumulated electric charges according to the correction signal.

Abstract: A shift register is provided, the shift register comprising at least one track including a storage region. The storage region comprises a plurality of magnetic domains for storing data. A given first one of the plurality of magnetic domains is adjacent to a given second one of the plurality of magnetic domains. The given first one of the plurality of magnetic domains and the given second one of the plurality of magnetic domains are arranged in a linear configuration. Further, the given first one of the plurality of magnetic domains and the given second one of the plurality of magnetic domains are separated from one another by at least one layer of non-magnetic material. The at least one layer of non-magnetic material preventing a propagation of a nucleated wall from traveling between the given first one of the plurality of magnetic domains and the given second one of the plurality of magnetic domains.

Abstract: Example embodiments relate to a memory system and a method of controlling power thereof. The memory system may include a memory device and a memory controller. The memory device may be configured to be set to a specific power characteristic mode in response to a mode register set command so as to provide a power characteristic information corresponding to the specific power characteristic mode. The memory controller may be configured to provide the mode register set command to the memory device, configured to read the power characteristic information corresponding to the specific power characteristic mode from the memory device, configured to generate a power control information based on the power characteristic information, configured generate a command in response to the power control information, and provide the command to the memory device according to the power control information.

Abstract: Methods and apparatus are disclosed for identifying a system. In various embodiments, values of identification codes are read from each of a plurality of electronic devices of the system. The values of the identification codes are used to generate a system identifier value.

Abstract: A nonvolatile semiconductor memory device transmits/receives data to/from a data input/output terminal every j bits (e.g., eight bits). Each of memory cells in a memory cell array can hold data of n bits in correspondence to 2n threshold levels. A write data conversion circuit generates write data from bit data input from the same data input/output terminal in a set of a plurality of data of j bits input at different timings.

Abstract: A hybrid circuit for a memory includes: a skewed static logic gate circuit; a dynamic pre-discharge device coupled with the skewed static logic gate circuit for operating the static logic gate circuit as a dynamic circuit.

Abstract: A signaling system includes a signaling path, a master device coupled to the signaling path, a slave device coupled to the signaling path, and a clock generator. The slave device includes timing circuitry to generate an internal clock signal having a phase offset relative to a clock signal supplied by the clock generator, the phase offset being determined at least in part by a signal propagation time on the signal path.

Abstract: Methods for inputting a data-value pattern into a nanowire crossbar, for inputting a data-value pattern into a nanowire crossbar that support computer instructions stored in a computer-readable medium, and for distributing a received data value to each of a set of nanowires that support control logic implemented in logic circuits are provided. First and second nanoscale shift registers are employed, the first having output signal lines that form or interconnect with a first parallel set of nanowire-crossbar nanowires and the second having output signal lines that form or interconnect with a second parallel set of nanowire-crossbar nanowires. A first pattern of values is stored in the first shift register and a second pattern of values is stored in the second shift register using voltage signals below the WRITE voltage for junctions of the crossbar. Voltage signals greater than or equal to the WRITE threshold are applied for junctions of the crossbar to write the pattern of data values into the crossbar.

Abstract: A method for executing a program verify operation in a non-volatile memory. A data register having master and slave latching circuits is used for concurrently storing two different words of data. In a program operation, the master latch stores program data which is used for programming selected memory cells. In a program verify operation, the data programmed to the memory cells are read out and stored in the slave latches. In each data register stage, the logic states of both latches are compared to each other, and a status signal corresponding to a program pass condition is generated if opposite logic states are stored in both latches. The master latch in each stage is inverted if programming was successful, in order to prevent re-programming of that bit of data.

Abstract: A power up detection system for a memory device. Two rows of memory cells are mask programmed to include a word of data having an arbitrary size. The word in the second row is a single-bit shifted version of the word in the first row, such that each bit is shifted one bit position in a predetermined direction. The bits of the first word are read from the first row into slave latches of the register stages of a data register, and then shifted into the master latches of the next register stage of the data register. The bits of the second word are read from the second row into the slave latches of the register stages. Data comparison logic compares data stored in the master and slave latches of each register stage, and provides a signal indicating matching data between the first latches and the second latches, thereby indicating successful power up of the memory device.

Abstract: A multi-port memory device having a plurality of ports performing a serial input/output (I/O) communication with external devices, and a plurality of banks performing a parallel I/O communication with the ports through a plurality of global I/O lines. The multi-port memory device includes: a write clock generating unit for generating a write clock selectively toggled only while write data are applied; a write control unit for generating a write flag signal group and a write driver enable signal in response to the write clock and a write command; a data latch unit for outputting intermediate write data by storing burst write data under the control of the write flag signal group; and a write driver for receiving the intermediate write data to write final write data in a memory cell of a corresponding bank in response to the write driver enable signal and a data mask signal group.

Abstract: Column redundancy is provided outside of a FLASH memory chip using a separate companion controller chip. The companion chip initially receives and stores fuse address information from the FLASH memory chip for defective memory cells in the FLASH memory. In a read mode of operation, the companion control chip detects receipt of a defective address from the FLASH memory and stores in a redundant shift register redundant data that is downloaded from the FLASH memory chip. The redundant data is used to provide correct FLASH memory data to an external user that interfaces with the companion control chip. In a program mode of operation, the companion control chip provides redundant bits that are stored in redundant columns in the FLASH memory chip. The companion control chip provides flexibility by readily providing a number of different redundancy schemes for bits, nibbles, or bytes without requiring additional logic circuits in the FLASH memory chip itself.