Abstract: A method of controlling a power mode of a memory device is provided, which includes providing a power mode control signal responsive to a control signal and frequency information. The control signal is provided by a processing device operatively coupled to the memory device. The frequency information is associated with a clock signal used to operate the processing device, and the power mode control signal is operative to control the power mode. The control signal includes a chip select (CS) signal and/or a wait-for-interrupt (WFI) signal, and the power mode includes a light sleep (LS) mode and/or a deep sleep (DS) mode. The frequency information represents a low frequency range, medium frequency range, and/or high frequency range. A corresponding computer-readable medium, power management controller, and electronic system are also disclosed.

Abstract: A controlling method for a memory storage device is provided. The method includes: disposing a rewriteable non-volatile memory module which is operated at a first working voltage in the memory storage device; and detecting whether the first working voltage is lower than a first voltage threshold. The method also includes: detecting whether a circuit component working voltage is lower than a circuit component voltage threshold; when the first working voltage is lower than the first voltage threshold, setting the memory storage device to stop executing commands from a host system and to stop giving commands to the rewriteable non-volatile memory module; and, when the circuit component working voltage is lower than the circuit component voltage threshold, enabling a reset signal to stop receiving and executing commands from the host system. Therefore, the method can effectively improve the stability of the memory storage device.

Abstract: A voltage source controller for a memory array includes an input coupled to a voltage source, an output coupled to one or more memory cells of a memory array, where the output is configured to provide a cell source voltage to the memory cells. The controller also includes a switch circuit configured to: receive a retention enable signal, a write assist enable signal, and a standard mode enable signal; and based on the retention enable signal, write assist enable signal, and standard mode enable signal, selectively set the cell source voltage for one or more of the memory cells to one of: a retention voltage, a write assist voltage, or a standard mode voltage, where the retention voltage and the write assist voltage are less than the standard mode voltage.

Abstract: A signal processing circuit that consumes less power by stop of supply of power for a short time. In a storage element, before supply of power is stopped, data in a first storage circuit is stored to a second storage circuit, and the data is read from the second storage circuit and a verification circuit can determine whether or not the data in the second storage circuit matches the data in the first storage circuit. After supply of power is restarted, the data in the second storage circuit is stored to the first storage circuit, and the verification circuit can determine whether or not the data in the second storage circuit matches the data in the first storage circuit. In such a manner, verification can be performed without requiring a time for verification.

Abstract: A semiconductor device includes plural memory cells each having a first inverter and a second inverter, with an input of the first inverter being coupled to an output of the second inverter and an input of the second inverter being coupled to an output of the first inverter. The first and second inverters have drive transistors supplied with a source voltage where the source voltage is raised in response to a level shift of a control signal supplied to a switch of a control circuit. The control circuit further includes a resistance element in parallel with a MOS transistor connected as a diode.

Abstract: An apparatus including a memory module and power converter and method of operating the same. In one embodiment, the apparatus includes a memory module, located on a circuit board, configured to operate from a first voltage and a second voltage being a multiple of the first voltage. The apparatus also includes a power converter employing a switched-capacitor power train, located on the circuit board, configured to provide the second voltage for the memory module from the first voltage.

Abstract: A semiconductor device comprises a first pair of signal lines and a first control circuit. The first control circuit precharges each of the first pair of signal lines to a first voltage in response to a precharge signal, and changes the voltage level of each of the first pair of signal lines to a second voltage different from the first voltage when a deep power down signal is input.

Abstract: The present disclosure includes apparatuses and methods for power consumption control. A number of embodiments include determining power consumption information for each phase in a combination of phases of a command, and authorizing execution of at least one of the phases in the combination based, at least partially, on the power consumption information determined for the at least one of the phases.

Abstract: A semiconductor device which can reduce the peak value of the rush current generated during a transition from resume mode to normal mode. The semiconductor device has a plurality of daisy-chained memory modules. Each of the memory modules includes a memory array, a switch for controlling, in resume mode, source voltage supply to a constituent element of the memory module, and a delay circuit which receives a resume control signal ordering a transition from resume mode to normal mode and outputs a resume control signal delayed from the inputted resume control signal to the memory module of the next stage.

Abstract: One or more timing signals used to time data and command transmission over highspeed data and command signaling links are paused or otherwise disabled when a memory system enters a low-power state, and require substantial time to be re-established at appropriate frequency and/or phase as the system returns to an active operating state. Instead of waiting for the high-speed timing signals to be re-established before beginning memory access operations, an alternative, lower-frequency timing source is used to time transfer of one or more memory-access commands over a combination of data and command signaling links while the high-speed timing signals are being restored, thereby hastening transmission of memory-access commands to memory devices and reducing the incremental latency required to exit the low-power state.

Abstract: An integrated circuit includes a high voltage generator generating a high voltage, a negative voltage generator generating a negative voltage, a divided voltage generator generating a divided voltage by dividing the power source voltage and supplying it to a read voltage terminal, a first power gate supplying the high voltage or the divided voltage to a program voltage terminal, a second power gate supplying the negative voltage or the ground voltage to a deactivation voltage terminal, a third power gate supplying the ground voltage or the divided voltage to an activation voltage terminal, and an e-fuse array circuit operating using voltage of the program voltage terminal as a program voltage, voltage of the divided voltage terminal as a read voltage, voltage of the activation voltage terminal as an activation voltage, and voltage of the deactivation voltage terminal as a deactivation voltage.

Abstract: Methods are provided for operating a memory device. An exemplary method involves obtaining a standby current through a memory block and adjusting a supply voltage for the memory block based on the obtained standby current. An exemplary memory device includes a block of one or more memory cells, a voltage regulating element coupled to the block to provide a supply voltage to the block, a current sensing element coupled to the block to measure current through the block, and a control module coupled to the voltage regulating element and the current sensing element to adjust the supply voltage provided by the voltage regulating element based on a measured current through the block obtained from the current sensing element.

Abstract: A method of reducing leakage current in a memory circuit is disclosed (FIG. 8A). The method includes connecting a first supply voltage terminal (VDD) to a bulk terminal of a transistor in an active mode of operation. The method further includes detecting a low power mode (SLEEP) of operation of the transistor and disconnecting the first supply voltage terminal from the bulk terminal in response to the step of detecting.

Abstract: According to one embodiment, there is provided a semiconductor memory device including a memory cell. The memory cell includes a first driving transistor, a first load transistor, a first read transfer transistor, a first write transfer transistor, a second driving transistor, a second load transistor, a second read transfer transistor, a second write transfer transistor, and one or more variable resistance elements. The one or more variable resistance elements has resistance that changes depending on a direction of a bias applied to both terminals. The one or more variable resistance elements are arranged in at least one of a portion between a first storage node and a first write transfer transistor and a portion between a second storage node and a second write transfer transistor.

Abstract: A memory circuit including at least one memory array and at least one sleep transistor connected to the at least one memory array and connected to a first power line for providing a first power voltage. The memory circuit further includes at least one diode-connected transistor directly connected to the at least one memory array and directly connected to the first power line and a back-bias circuit electrically coupled with a bulk of the at least one diode-connected transistor.

Abstract: Methods and devices for sensing non-volatile storage are disclosed. Technology disclosed herein reduces the time for sensing operations of non-volatile storage such as read and program verify. In one embodiment, a kicking voltage is applied to a selected word line during a sensing operation. The kicking voltage may be applied to one end of a selected word line during a transition from a first reference voltage to a second reference voltage. The kicking voltage may help the other end of the word line reach the second reference voltage quickly. Since the bit lines can be sensed after the selected word line has reached the target reference voltage, the time delay prior to sensing of the bit lines may be reduced.

Abstract: An integrated circuit package is provided with a thin-film battery electrically connected to and encapsulated with an integrated circuit die. The battery can be fabricated on a dedicated substrate, on the die pad, or on the integrated circuit die itself.

Abstract: A method of managing the charge stored by a series arrangement of capacitor stages, each stage including a single capacitor or a plurality of capacitors in parallel, involves supplying each capacitor stage with charge current via a common charging terminal; separately measuring a stored potential of each capacitor stage in the series arrangement; selectively removing a controlled amount of charge from each of the capacitor stages individually) while the series arrangement is receiving the charge current from the common charging terminal; and maintaining each capacitor stage at a substantially equal stored potential.

Abstract: An electronic device includes an integrated circuit with a FRAM memory and an integrated capacitor connected between a power supply for the FRAM memory and ground. The integrated capacitor has a capacitance sufficient to store the charge necessary for a complete read-and-write-back cycle of the FRAM memory. When granting read-access to the FRAM memory, the FRAM memory is supplied by the integrated capacitor which is then disconnected from the integrated circuit power supply. Upon receiving a request for a read-access to the FRAM memory, a charge detector detects whether the internal capacitor is sufficiently charged for a complete read-and-write-back cycle of the FRAM memory. Read-access to the FRAM memory is only granted if the internal capacitor is sufficiently charged and disconnected from the power supply. An alternative embodiment alternately charges and powers the FRAM from two integrated capacitors.

Abstract: A variety of data storage devices, methods and systems are implemented for control of memory associated with backup functionality. One such data storage device includes a power circuit that provides main power. The data storage device has a first solid-state memory circuit that maintains data in the absence of electrical power. A second memory circuit is subject to data loss in the absence of electrical power. A storage circuit stores energy and provides the stored energy to the second memory circuit in response to a loss of main power. A test circuit discharges a portion of the stored energy to provide output data indicative of power-providing capabilities of the storage circuit. A memory controller controls data transfers to the data storage device by temporarily storing data destined for the first solid-state memory circuit and setting the amount of memory available for temporary storage in response to the output data.

Abstract: Some embodiments include a voltage generator to generate a voltage to apply to a line used to access a memory cell of a memory device in which the voltage is applied to the line when the memory cell is not being accessed, and a power controller to cause the voltage to change during a time interval after a refresh operation of the memory device. Other embodiments including additional apparatus, systems, and methods are disclosed.

Abstract: In a low-power signaling system, an integrated circuit device includes an open loop-clock distribution circuit and a transmit circuit that cooperate to enable high-speed transmission of information-bearing symbols unaccompanied by source-synchronous timing references. The open-loop clock distribution circuit generates a transmit clock signal in response to an externally-supplied clock signal, and the transmit circuit outputs a sequence of symbols onto an external signal line in response to transitions of the transmit clock signal. Each of the symbols is valid at the output of the transmit circuit for a symbol time and a phase offset between the transmit clock signal and the externally-supplied clock signal is permitted to drift by at least the symbol time.

Abstract: A secondary memory device includes a substrate configured to receive power from an external power source, at least one of non-volatile memory devices mounted on the substrate, a control device mounted on the substrate to control the non-volatile memory devices, and a secondary battery electrically connected to the substrate and configured to supply second power to the substrate when a power supply from the external power source is abnormally stopped.

Abstract: Battery backup devices and methods of performing a backup operation using the same are provided. A battery backup device can include a partial battery power controller configured to shut off power to components to be backed up one by one as data backup is completed on each device. The battery backup devices and methods provided can efficiently utilize battery power such that power consumption and charging time can be reduced.

Abstract: Systems and methods are used to manage the contents of NVRAM in a wagering game machine. NVRAM may be pre-allocated for various purposes prior to loading a first wagering game on a the wagering game machine. A second wagering may be loaded on the wagering game machine. The second wagering game reuses the pre-allocated NVRAM portions for the same purposes as the first wagering game.

Abstract: A data storage system is disclosed including a data storage device having a controller coupled to non-volatile semiconductor memory and a power device having a common power rail and first, second, and third spindle phase switching elements, the common power rail receiving an input voltage and providing power to the data storage device and the power device. The data storage system further includes an inductor coupled between outputs of the first and second spindle phase switching elements, and a charge storage element coupled between the second spindle phase switching element output and ground. The power device further includes control circuitry that controls the first and second spindle phase switching elements to generate boost output voltage for charging the charge storage element during a boost mode, the boost output voltage enabling the controller to perform a data operation in an event of an interruption of power to the data storage system.

Abstract: A logic circuit in a system LSI is provided with a power switch so as to cut off the switch at the time of standby, reducing leakage current. At the same time, an SRAM circuit of the system LSI controls a substrate bias to reduce leakage current.

Abstract: Systems and methods, including computer software for performing operations enable interleaving of charging operations in a charging pump. A first charge pump is charged to a predetermined level, and a first operation is performed using a charge stored in the first charge pump after it reaches the predetermined level. A second charge pump is charged during a time that overlaps with performing the first operation. A second operation is performed using a charge stored in the second charge pump as a result of charging the second charge pump.

Abstract: Two on-chip capacitors including one HV capacitor VPPcap and one LV VCC capacitor VCCcap are built over a NVSRAM memory chip as a back-up second power supplies for each NVSRAM cell, regardless of 1-poly, 2-poly, PMOS or NMOS flash cell structures therein. The on-chip HV and LV capacitors are preferably made from one or more MIM or MIP layers for achieving required capacitance. A simplified VCC power system circuit without a need of a State machine designed for performing only one NVSRAM Program operation without Erase operations is proposed for initiating NVSRAM's Auto-Store operation without using any off-chip Vbat and Vcap. During the Auto-Store operation, all HV pumps and oscillators associated with the two on-chip capacitors are shut off once VCC voltage drop is detected by a VCC detector to be below 80% of regular VDD level.

Abstract: A semiconductor device in accordance with an aspect of the present invention includes first and second power-supply circuits each of which generates an internal power-supply voltage by converting a voltage value of a power-supply voltage into a different voltage value, a first internal circuit that receives a supply of the internal power-supply voltage from the first power-supply circuit through a first line, a second internal circuit that receives a supply of the internal power-supply voltage from the second power-supply circuit through a second line, an inter-block line that connects the first and second lines to each other, and a control circuit that operates the first and second internal circuits in a predetermined operating cycle, and controls a length of a period during which the first and second internal circuits operate simultaneously.

Abstract: The present invention discloses a power supply. The power supply may comprise an input power terminal, a capacitor module, a first converter module and a second converter module. The first converter module may have a first terminal and a second terminal, wherein the first terminal is coupled to the input power terminal and the second terminal is coupled to the capacitor module. The second converter module may comprise an input and an output, wherein the input of the second converter module is coupled to the input power terminal, and the output of the second converter module is configured to supply a load.

Abstract: Disclosed herein is a semiconductor device comprising a global bit line, a first local bit line coupled to normal memory cells, a second local bit line coupled to redundant memory cells first and second hierarchical switches, a precharge circuit precharging the global bit line, a redundancy determination circuit determining whether or not an accessed address matches a defective address, and a control circuit. In a standby state, the global bit line and the second local bit line are precharged through the second hierarchical switch. In an active state, the first local bit line is precharged through the first hierarchical switch, subsequently when the redundancy determination circuit determines that the addresses do not match, the second hierarchical switch is inactivated to access the normal memory cells, and when the redundancy determination circuit determines that the addresses match each other, the first hierarchical switch is inactivated to access the redundant memory cells.

Abstract: A circuit for controlling leakage current in random access memory devices comprises a pre-charge equalization circuit. The pre-charge equalization circuit provides a pre-charge voltage to a pair of complementary bit lines of a memory cell of a random access memory device in accordance with a pre-charge signal. When the memory cell is in a self-refresh mode, the pre-charge signal is activated by a periodically triggered pre-charge request and also activated before and after the memory cell is self-refreshed.

Abstract: Memory devices and methods are provided for reducing simultaneous switching output noise and power supply noise during burst data write and refresh operations. An embodiment of a memory device according to the present invention includes a first power domain coupled to some of the components of the memory device and a second power domain coupled to different components of the memory device. One or more distributed power domain coupling circuits may be coupled to the first and second power domains. The power domain coupling circuit includes a controller configured to generate an enable signal responsive to control signals, data signals, or any combination thereof. The power domain coupling circuit also includes coupling circuitry coupled to the first and second power domains and coupled to the controller. The coupling circuitry is configured to couple the first and second power domains together responsive to the enable signal.

Abstract: An integrated circuit having a logic element that includes an array of storage elements convertibly functioning as either a configuration random access memory (CRAM) or a static random access memory (SRAM) is provided. The logic element includes first and second pairs of data paths having dedicated multiplexers. In one embodiment, the first and second pairs of data paths are multiplexed into bit lines of a row of the array. The logic element also includes a data path control block generating control signals for each of the dedicated multiplexers. The control signals determine whether the storage elements function as a CRAM or a SRAM. A method for selectively configuring a memory array between a CRAM mode and SRAM mode are provided.

Abstract: A device includes a backup power supply configured to provide power to an external system upon loss of primary system power, the backup power provided by at least one capacitor; logic to create, while the capacitor is available as the backup power supply to the external system, a transient elevation of the capacitor's stored potential above a upper predetermined operating potential of the capacitor; logic to obtain measurements of the capacitor's output voltage during the transient elevation of the capacitor's stored potential; and logic to determine a capacitance of the capacitor from the measurements; the device comprising multiple capacitors in series; logic to discharge each capacitor in series individually from the others; and logic to monitor for overcharging of any of the capacitors in series, and, during charging of the capacitors in series, to operate the discharge logic for any capacitor in the series that is in danger of overcharging.

Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.

Abstract: One embodiment of an integrated circuit includes a local circuit block, a first power supply for supplying power to a first terminal of the local circuit block, a second power supply for supplying power to a second terminal of the local circuit block, a first transmission gate coupled between the second terminal of the local circuit block and a current path from the second power supply, and a second transmission gate coupled between the current path from the second power supply and a gate of a p-type metal-oxide-semiconductor (PMOS) transistor in the first transmission gate, the second transmission gate including a single transistor.

Abstract: A memory device includes a command decoder and control interface logic. One or more external inputs, such as row and column address strobes, communicate with the command decoder through the control interface logic. A control signal is also in communication with the control interface logic. During operation of a drowsy mode in the memory device, a self-refresh signal causes the control signal to disable the external inputs. With the external inputs disabled, command hazards are reduced when exiting drowsy mode.

Abstract: A voltage down converter (VDC) applicable to high-speed memory devices. The VDC includes a steady driver and active driver along with at least one additional transistor. The steady driver and active driver are coupled by a transistor switch during device start-up to provide fast ramp-up to operating voltage and current. After start-up, the steady driver and active drive function to maintain a steady operating voltage and current. An additional transistor is digitally controlled to drive up operating voltage and current upon issuance of an active command representing read, write, and/or refresh of memory. In this manner, the additional transistor provides fast compensation for fluctuations in operating voltage and current brought on by activity in the memory array.

Abstract: An apparatus for securely protecting data in a flash memory upon power off is disclosed. In the apparatus, a power detector monitors a voltage output from a power supply unit, and outputs a power fail signal when the voltage drops by a predetermined reference voltage or more. A Programmable Logic Device (PLD) outputs a Write Protect (WP) signal for performing write protection on the flash memory upon receiving the power fail signal from the power detector. A WP controller outputs the WP signal output from the PLD to the flash memory, according to a Ready/Busy (R/B) state of the flash memory.

Abstract: A memory device includes memory cells, each of the memory cells having corresponding bit and word lines connected thereto for accessing the memory cells, a word line circuit coupled with at least one word line, and a bit line circuit coupled with at least one bit line. The memory device further includes at least one control circuit coupled with the bit and word line circuits. The control circuit is operative to cause state information to be stored in the memory cells. At least one switching element selectively connects the memory cells, the bit and word line circuits, and the control circuit to at least one power supply as a function of at least one control signal. The control circuit generates the control signal for disconnecting at least portions of the word line and bit line circuits from the power supply while state information is retained in the memory cells.

Abstract: A memory array including at least one cross-latched pair of transistors for storing data. The memory array further includes a first power line for supplying a first reference voltage and a second power line for supplying a second reference voltage. The memory array further includes a first switch having a first output coupled with the at least one cross-latched pair of transistors for selectively connecting the at least one cross-latched pair of transistors to the first power line. The memory array further includes a second switch having a second output coupled with the at least one cross-latched pair of transistors for selectively connecting the at least one cross-latched pair of transistors to the second power line. The first output is coupled to the second output.

Abstract: Circuits, architectures, a system and methods for memories with multiple power supplies and/or multiple low power modes. The circuit generally includes peripheral circuitry operating at a first voltage, a memory array operating at a second voltage, and translation circuitry configured to receive an input from the peripheral circuitry at the first voltage and provide an output to the memory array at the second voltage, the translation circuitry further configured to prevent leakage during a standard operating mode of the memory.

Abstract: When an operational mode is shifted to a standby mode, a first transistor is brought into a conduction state by a control signal, and a word line is thereby clamped to a ground voltage. Further, a second transistor is brought into a non-conduction state, and supply of an internal power supply voltage to a word line driver is shut off. Subsequently, the supply of the internal power supply voltage is halted for saving electrical power. When the operational mode returns to a normal mode, the supply of the internal power supply voltage is started, and subsequently, the first transistor is brought into the non-conduction state by the control signal, and the second transistor is thereby brought into the conduction state.

Abstract: A system including an integrated circuit (IC) and a power supply regulator external to the IC. The IC operates in accordance with an active mode and a lower power mode, and is configured to retain a logical state during the low power mode. The power supply regulator is configured to i) supply a first voltage potential to a first pin of the IC during the active mode, and ii) disable the first voltage potential during the low power mode. The IC is configured to provide a first feedback signal from an internal supply of the IC to the power supply regulator via the first pin.

Abstract: Described herein are methods and apparatuses for write-assist voltage generation and power-down voltage scaling for static random access memory (SRAM) cells. According to various embodiments, an SRAM cell may include a local power supply voltage node for receiving a power supply voltage generated by a power supply voltage generator circuit, the generated power supply voltage being substantially equal to or less than a global power supply voltage provided to one or more transistors of the SRAM cell during a write-enable or power-down mode.

Abstract: A semiconductor memory device has an operation mode in which a read/write operation is performed in response to a command supplied externally in synchronization with a clock, and a power-down mode in which no external read/write command is accepted. The semiconductor memory device performs a refresh operation in response to an externally supplied signal during the power-down mode. A memory system has a plurality of the semiconductor devices and a memory controller. The memory controller outputs a control signal during the power-down mode, and the plurality of semiconductor devices perform a refresh operation in response to the control signal during the power-down mode.

Abstract: A clock control device includes a set circuit for triggering an input address in response to an internal command signal to output a first address, a shift register including a plurality of flip-flops connected in series wherein some of the flip-flops perform a flip-flop operation of the first address in synchronism with an internal clock to provide a second address and the remaining flip-flops sequentially conduct a flip-flop operation of the second address in synchronism with a synchronous clock to produce an internal address, an active signal generator for outputting an active signal based on state of an active control signal indicating whether or not each bank is activated and a precharge control signal, and a clock generator for generating the synchronous clock depending on the internal clock and the active signal.

Abstract: A semiconductor integrated circuit device with reduced consumption current is provided. A first step-down circuit stationarily forms internal voltage lower than supply voltage supplied through an external terminal. A second step-down circuit is switched between first mode and second mode according to control signals. In first mode, the internal voltage is formed from the supply voltage supplied through the external terminal and is outputted through a second output terminal. In second mode, operating current for a control system that forms the internal voltage is interrupted and an output high impedance state is established. The first output terminal of the first step-down circuit and the second output terminal of the second step-down circuit are connected in common, and the internal voltage is supplied to internal circuits.