Abstract: Disclosed herein are a semiconductor memory device and word line addressing method. The semiconductor memory device comprises a memory array comprising a plurality of word lines arranged in a predetermined sequence, and a word line driver adapted to sequentially address the plurality of word lines in a discontinuous manner relative to neighboring word lines. The method comprises addressing a plurality of word lines in a discontinuous manner relative to the predetermined sequence, such that neighboring word lines in the plurality of word lines are not coincidently addressed.

Abstract: A self-timed data ordering method and circuit for multi-data rate memories orders a plurality of data words substantially simultaneously retrieved during successive read operations of a memory device. A data word ordering designator is stored from each of the successive read operations and managed in a first-in first-out manner. The data word ordering designator configures ordering circuitry for the desired ordering of the plurality of data words simultaneously retrieved. Following the ordering of the plurality of data words, the properly ordered data words are latched in their desired order for subsequent delivery. Once the properly ordered data words are latched, the ordering circuitry is reconfigured according to the next oldest data word ordering designator. The data word ordering designator retains the pipelined ordering of the corresponding read operations to the corresponding memory banks of the memory device.

Abstract: A computational system comprising a controller and a multi-plane solid state memory device accessible to the controller is disclosed. The controller is configured to provide access to a virtual block having a virtual block address that represents a first block from a first plane of the multi-plane solid state memory device and represents a second block from a second plane of the multi-plane solid state memory device.

Abstract: Systems, devices and methods are disclosed, such as a system and method of sensing the voltage on bit lines that, when respective memory cells coupled to the bit lines are being read that compensates for variations in the lengths of the bit lines between the memory cells being read and respective bit line sensing circuits. The system and method may determine the length of the bit lines between the memory cells and the sensing circuits based on a memory address, such as a block address. The system and method then uses the determined length to adjust either a precharge voltage applied to the bit lines or the duration during which the bit lines are discharged by respective memory cells before respective voltages on the bit lines are latched.

Abstract: An integrated circuit comprises a sampling circuit arranged at a data output of an operating section and operated by sampling edges, data packets appearing at the data output in response to a sequence of request commands, and a control section configured to produce the sampling edges, the control section comprising at least two transmission branches each comprising a copy of the operating section. Pulse trains are applied to the transmission branches which have the same waveform as the sequence of request commands and are delayed relative to one another, wherein the first pulse train is contemporaneous with the sequence of request commands. The sampling edges are produced from leading edges of the pulse trains which appear at the outputs of the transmission branches.

Abstract: Embodiments of the present invention include a data output circuit that can read data in parallel from a plurality of latches in a pipeline circuit. Even-numbered data and odd-numbered data are simultaneously output over a single clock cycle, and are then converted into DDR data and are then serially output. By moving data in this manner, embodiments of the invention can reduce the number of necessary control signals by as much as 50% over conventional data output circuits.

Abstract: A memory array is provided, having at least two memory cells accessed for each row address to retain a sufficient electric charge to properly store “1” and “0” bits. For such a memory array, both even and odd row decoders in the array are permanently enabled so that each row address the array receives causes the even row decoder to energize at least one even word line and the odd row decoder to energize at least one odd word line. As a result, at least two memory cells are accessed for each row address so that each “1” or “0” bit is stored as an electric charge in at least two memory cells.

Abstract: A memory mapping method is provided for writing block data composed of a plurality of lines in first and second memories, each memory including at least two banks of the same number. The method maps the memories such that continuous even-numbered lines are written in different banks of different memories, and continuous odd-numbered lines are written in different banks of different memories when the block data is motion-compensated in a frame mode or a field mode. Accordingly, bank interleaving can be carried out in the respective memories and two memory channels can be simultaneously used to improve bus utilization efficiency and memory channel utilization efficiency.

Abstract: Disclosed herein are a NAND flash memory device and a method of forming a well of the NAND flash memory device. Triple wells of a NAND flash memory device are formed within a cell region in plural. A cell block including flash memory cells is formed on the triple wells. Accordingly, during an erase operation of a flash memory device, a stress time for non-selected blocks can be reduced and erase disturbance can be also prevented, through the plurality of the wells. Further, capacitance between the triple P wells and the triple N well is reduced since triple P wells are divided. Therefore, well bias charging and discharging time can be reduced and an overall erase time budget can be thus reduced.

Abstract: Storage circuits (180-183 and 280-281) may be used for low power operation while allowing fast read access. In one embodiment (e.g. circuit 100), shared complementary write bit lines (101, 102), separate read bit lines (103-106), a shared read word line (107), and separate write word lines (108-111) are used. In an alternate embodiment (e.g. circuit 200), shared complementary write bit lines (201, 202), a shared read bit line (203), separate read word lines (206-207), and separate write word lines (208-209) are used. The storage circuit may be used in a variety of contexts, such as, for example, a register file (17), a branch unit (15), an SRAM (19), other modules (20), a cache (18), a buffer (21), and/or a memory (14).

Abstract: A method for programming a non-volatile memory system. The method includes programming a first non-volatile storage element on a first word line and a first NAND string to store “n” bits of data. A second non-volatile storage element on the first word line and a second NAND string is programmed to store n+1 bits of data. The second non-volatile storage element is a neighbor to the first non-volatile storage element. A third non-volatile storage element on a second word line and the second NAND string is programmed to store n bits of data. The third non-volatile storage element is a neighbor to the second non-volatile storage element. A fourth non-volatile storage element on the second word line and the first NAND string is programmed to store n+1 bits of data.

Abstract: A dynamic random access memory (DRAM) having DRAM cells coupled to wordlines and bitlines. In a self-refresh mode, the cells coupled with the even numbered rows retain main data previously stored therein and the assistant data, which is logically opposite to the main data, is overwritten into the cells coupled with the wordlines of the odd numbered rows. When the DRAM enters the self-refresh mode, a starting refresh address for the self-refresh mode is detected. If the detected starting refresh address does not match with a predetermined correct address set for the self-refresh operation mode, a dummy refresh cycle will be established in an entry-burst self-refresh period. During the dummy refresh cycle, a dummy refresh command is added to increment an internal row address counter that provides row addresses for self-refreshing the cells of the selected wordlines within the cell array.

Abstract: A method and system for operating a DRAM device in either a high power, full density mode or a low power, half density mode. In the full density mode, each data bit is stored in a single memory cell, and, in the half density mode, each data bit is stored in two memory cells that are refreshed at the same time to permit a relatively slow refresh rate. When transitioning from the full density mode to the half density mode, data are copied from each row of memory cells storing data to an adjacent row of memory cells. The adjacent row of memory cells are made free to store data from an adjacent row by remapping the most significant bit of the row address to the least significant bit of the row address, and then remapping all of the remaining bits of the row address to the next highest order bit.

Abstract: A self-timed data ordering method and circuit for multi-data rate memories orders a plurality of data words substantially simultaneously retrieved during successive read operations of a memory device. A data word ordering designator is stored from each of the successive read operations and managed in a first-in first-out manner. The data word ordering designator configures ordering circuitry for the desired ordering of the plurality of data words simultaneously retrieved. Following the ordering of the plurality of data words, the properly ordered data words are latched in their desired order for subsequent delivery. Once the properly ordered data words are latched, the ordering circuitry is reconfigured according to the next oldest data word ordering designator. The data word ordering designator retains the pipelined ordering of the corresponding read operations to the corresponding memory banks of the memory device.

Abstract: Circuits and methods are described for decoding exemplary memory arrays of programmable and, in some embodiments, re-writable passive element memory cells, which are particularly useful for extremely dense three-dimensional memory arrays having more than one memory plane. In addition, circuits and methods are described for selecting one or more array blocks of such a memory array, for selecting one or more word lines and bit lines within selected array blocks, for conveying data information to and from selected memory cells within selected array blocks, and for conveying unselected bias conditions to unselected array blocks.

Abstract: Memory devices configured to reduce coupling noise between adjacent wordlines in a memory array. More specifically, wordline drivers are interleaved such that adjacent wordlines are driven by wordline drivers enabled by different row decoders. Each wordline driver includes a weak transistor to ground and a strong transistor to ground. By disabling the wordline driver on the wordlines directly adjacent to the active wordlines, a path is provided to drive the coupling noise from the active wordline to ground through the strong transistor.

Abstract: A dynamic random access memory device includes an array of dynamic random access memory cells subdivided into a group of blocks. Each of the blocks of memory cells can be independently operated in either a single cell mode or a twin cell mode.

Abstract: Various aspects of the low cost line buffer system allow a reduction in circuitry versus conventional approaches to line buffer design. A plurality of line buffers such that the output of one line buffer in the plurality of line buffers may be coupled to an input of a succeeding line buffer in the plurality of line buffers. A first line buffer in the plurality of line buffers may be coupled to an input write data signal, while the width of a subsequent plurality of line buffers may be less than or equal to the width of the previous line buffers in the plurality of line buffers.

Abstract: In a system of using a plurality of memories with a plurality of CPUs, a plurality of memory arrays are placed on the same memory chip with each memory array being individually provided with a data-related circuit, an address-related circuit and a control-related circuit. These memory arrays however share a data terminal, an address terminal and a control terminal for chip external connection. A data, address and control signals are distributed to the memory arrays via three MUX of signal selection circuits controlled with an array selection signal (clock). A signal is supplied to one memory array at rising timing of the clock while a signal is supplied to another memory array at falling timing of the clock. Thus, in memory integration of placing a plurality of memory arrays on one chip, independent operation for each memory array is attained, and no bus arbitration between CPUs is necessary.

Abstract: An integrated circuit memory device, system and method embodiments decode interleaved row and column request packets transferred on an interconnect at a first clock frequency. Separate row decode logic and column decode logic, clocked at a relatively slower second clock frequency, output independent column and row control internal signals to a memory core in response to memory commands in the request packets. An integrated circuit memory device includes an interface having separate row and column decode logic circuits for providing independent sets of row and control signals. A row decode logic circuit includes a first row decode logic circuit that provides a first row control signal, such as a row address, and a second row decode logic circuit that provides a second row control signal. A column decode logic circuit includes a first column decode logic circuit that provides a first column control signal, such as a column address and a second column logic circuit that provides a second column control signal.

Abstract: A method of verifying a flash memory device includes discharging memory cell strings respectively connected to an even bit line and an odd bit line. Next, a voltage is applied to the memory cell strings respectively connected to the even bit line and the odd bit line, thus precharging the memory cell strings. The memory cell string connected to the even bit line are verified as erased by sensing the status of each memory cell string connected to the even bit line, and the memory cell string connected to the odd bit line are verified as erased by sensing the status of the memory cell string connected to the odd bit line.

Abstract: A dual-plane type flash memory device having a random program function and program operation method thereof. The flash memory device includes a first plane, a second plane, a first X-decoder, and a second X-decoder. The first plane includes first memory blocks sequentially arranged in a row direction. The second plane includes second memory blocks sequentially arranged in a row direction. The first X-decoder activates one of the first memory blocks in response to a first block address signal. The second X-decoder activates one of the second memory blocks in response to a second block address signal. The block activated by the first X-decoder of the first memory block is different from the block activated by the second X-decoder of the second memory blocks. Accordingly, during a program operation, memory blocks of two planes having different block addresses can be selected and programmed. Accordingly, the operational performance of the flash memory device can be enhanced.

Abstract: There is disclosed a semiconductor integrated circuit device having first and second load circuits for write. At the time of an all bit-stress test, a high voltage for write is supplied from the first and second load circuits for write to the all bit lines. At the time of an even bit-stress test, the high voltage for write is supplied from the first load circuit for write to the even bit lines and a lower potential than the high voltage for write is supplied from the second load circuit for write to the odd bit lines. At the time of an odd bit-stress test, the lower potential is supplied from the first load circuit for write to the even bit lines and the high voltage for write is supplied from the second load circuit for write to the odd bit lines.

Abstract: An integrated semiconductor memory includes a memory cell array in which first sense amplifiers are arranged on a right-hand side of the memory cell array and second sense amplifiers are arranged on a left-hand side of the memory cell array. Due to “post-sense coupling” effects upon activation of the sense amplifiers in conjunction with capacitive coupling effects between bit lines, potential changes occur on adjacent bit lines. The integrated semiconductor memory makes it possible to simulate parasitic coupling effects between adjacent bit lines in a functional test in which the first and second sense amplifiers can be activated in temporarily delayed fashion. As a result, the test severity can be improved and test time can be saved.

Abstract: Embodiments of the present invention include a data output circuit that can read data in parallel from a plurality of latches in a pipeline circuit. Even-numbered data and odd-numbered data are simultaneously output over a single clock cycle, and are then converted into DDR data and are then serially output. By moving data in this manner, embodiments of the invention can reduce the number of necessary control signals by as much as 50% over conventional data output circuits.

Abstract: A dynamic random access memory (DRAM) having DRAM cells coupled to wordlines and bitlines. In a self-refresh mode, the cells coupled with the even numbered rows retain main data previously stored therein and the assistant data, which is logically opposite to the main data, is overwritten into the cells coupled with the wordlines of the odd numbered rows. When the DRAM enters the self-refresh mode, a starting refresh address for the self-refresh mode is detected. If the detected starting refresh address does not match with a predetermined correct address set for the self-refresh operation mode, a dummy refresh cycle will be established in an entry-burst self-refresh period. During the dummy refresh cycle, a dummy refresh command is added to increment an internal row address counter that provides row addresses for self-refreshing the cells of the selected wordlines within the cell array.

Abstract: Embodiments of the invention provide a memory arrangement having an even number k=4 of physically spaced RAM chips, on each of which it is possible for m data items to be simultaneously written or read via an m-bit data bus, also having a register for buffer-storing and transmitting n respective parallel data bits as a packet between an n-bit parallel port and the data buses, and having a selection device which responds to selection bits in order to select a respective separate cell group within the plurality of the chips for each of the disjoint m-bit groups (d) of the n-bit packet. The k chips are classified into q=2 disjoint chip groups, each of which comprises k/q chips which differ as little as possible from one another in terms of their distance from the register. The number m is chosen to be equal to q*n/k, and the selection device is designed to select a respective separate chip from the same chip group and a cell group in this chip for each m-bit group of the same n-bit packet.

Abstract: A non-volatile semiconductor memory device comprises first and second sub-memory arrays and a strapping line disposed between the first and second sub-memory arrays. A programming operation of the first sub-memory array is performed by simultaneously applying a programming voltage to odd and even bit lines connected to memory cells within the first sub-memory array.

Abstract: An improved Flash memory device, control circuit, or data handling methods is described that facilitate the moving and consolidating data in split and non-split user/overhead data sector architectures, moving and storing user and overhead data from and to separate non-volatile memory devices, differing erase blocks, or differing sectors of an erase block. This enables ECC checking and masking while moving data. In addition, the use of a split data storage approach is enabled that avoids the issue of potential corruption of both the user data and overhead data due to each being held within close proximity to each other on the same physical row by allowing user/overhead data split across two erase blocks to be easily moved, consolidated, and managed.

Abstract: Disclosed is a memory device including self-ID information. The memory device has a storage unit for storing information related to the memory device, such as a manufacturing factory, a manufacturing date, a wafer number, coordinates on a wafer and the like. Each bank of the memory device stores self-ID information related to the memory device and outputs the self-ID information out of a chip when an address is applied thereto during a test mode.

Abstract: Method and apparatus for writing and reading information to and from a memory cell. For a read, a write path is used to electrically shield at least one adjacent bitline from a bitline associated with the memory cell to be read, and the memory cell is read while the at least one adjacent bitline is electrically shielded from the bitline associated with the memory cell being read. For a write, the write path is used to electrically shield at the least one adjacent bitline from a bitline associated with a memory cell to be written to; memory cells coupled to a wordline are read and buffered; and the memory cell is written to while the at least one adjacent bitline is electrically shielded from the writing to the memory cell.

Abstract: A receiver multi-protocol interface includes a wide bandwidth amplifier, a data sampling module, and a clocking module. The wide bandwidth amplifier amplifies a first formatted input signal or a second formatted input signal to produce an amplified input signal. The data sampling module converts the amplified input signal into a first data stream in accordance with at least one first sampling clock signal when the interface is configured in the first mode and to converts the amplified input signal into a second data stream in accordance with at least a second sampling clock signal when the interface is in a second mode. The clocking module generates the first sampling clock signals from a reference clock when the multi-protocol interface is in a first operational mode and generates the second sampling clock signals based on the reference clock when the interface is in the second operational mode.

Abstract: A twin-cell type semiconductor memory device in which the area of a chip can be reduced. In the twin-cell type semiconductor memory device for storing data in at least one pair of memory cells as complementary information, memory cells are arranged at each of a plurality of word lines at intervals at which bit lines are located. At least the one pair of memory cells, which have stored the complementary information and which indicate a plurality of areas each connected to a pair of bit lines, form a twin cell.

Abstract: A memory storage device having an address control system is disclosed. The memory storage device includes memory cells and an address control system configured to decode a bit number which identifies a number of the memory cells which are selected in parallel. The memory cells selected in parallel correspond to least significant bits of an address which has a range that includes the memory cells.

Abstract: In one embodiment, an optimized interleaving instruction is provided. The interleaving instruction facilitates a bit-level interleaving of two streams of data stored in two source registers into a combined stream of data.

Abstract: Method and apparatus for data monitoring for error detection is described. A programmable logic device includes a configurable logic block having function generators, each of which is configurable for at least two programmable mode functions. The function generators are coupled to an array of memory cells for storing configuration bits for configuring the function generators. A primary address line is coupled to each memory cell spanning two or more of the function generators. A secondary address line is coupled to groups of memory cells associated with the function generators. A mask circuit is configured to selectively communicate a signal of the primary address line to a segment of the secondary address line or to a ground responsive in part to the program mode function.

Abstract: A non-volatile semiconductor memory includes: a cell array including a plurality of memory cells arranged in a matrix; a plurality of bit lines extending in a column direction of the matrix; a sense amplifier configured to amplify data read out from the memory cells via the bit lines; a shield power supply providing a voltage to shield the bit lines; and a bit line selection circuit, configured to connect even bit lines to the shield power supply when odd bit lines are connected to the sense amplifier, and to connect the odd bit lines to the shield power supply when the even bit lines are connected to the sense amplifier.

Abstract: In a bit-line direction, a plurality of memory mats are arranged including a plurality of memory cells respectively coupled to bit lines and word lines, and a sense amplifier array is arranged including a plurality of latch circuits having input/output nodes connected to a half of bit-line pairs separately provided to the memory mats in a region between the memory mats placed in the bit-line direction, thereby making possible to replace with a redundant bit line pair and the corresponding redundant sense amplifier on a basis of each bit-line pair and sense amplifier connected thereto, thereby realizing effective and rational Y-system relief.

Abstract: A method for in-place interleaving and de-interleaving of a memory includes, in one embodiment, generating a new address corresponding to a new location in the memory by performing a bit-wise XOR operation on a number of bits of a first portion of a current address and a number of bits of a different portion of the current address. The current address corresponds to a current location in the memory. In addition, the method includes performing a data swap on data stored at the current location with data stored at the new location.

Abstract: A memory device and method receives write data through a unidirectional downstream bus and outputs read data through a unidirectional upstream bus. The downstream bus is coupled to a pair of internal write data buses, and the upstream bus is coupled to a pair of internal read data buses. A first set of multiplexers selectively couple each of the internal write data buses to any of a plurality of banks of memory cells. Similarly, a second set of multiplexers selectively couple each of the banks of memory cells to any of the internal read data buses. Write data can be coupled to one of the banks concurrently with coupling read data from another of the banks. Also, write data may be concurrently coupled from respective write data buses to two different banks, and read data may be concurrently coupled from two different banks to respective read data buses.

Abstract: Non-volatile memory devices may include a buffer memory corresponding to one block of a memory cell array, thus improving a read operation. The non-volatile memory device may include a memory cell array including a plurality of memory blocks, each having memory cells disposed at the intersections of bit lines and word lines, a plurality of page buffers connected to the bit lines through a sensing line, and a buffer memory connected between the plurality of memory blocks and the plurality of page buffers. The buffer memory may include special buffers for storing the same data as those of the memory cells.

Abstract: To provide a non-volatile semiconductor memory device which can increase the speed of a writing operation of a physical checker pattern, a logical checker pattern, etc. carried out in an inspection process. First group writing circuits 30a, 30c connected to even-numbered bit lines BL0, BL2 and second group writing circuits 30b, 30d connected to odd-numbered bit lines BL1, BL3 are controlled to an active state and a non-active state respectively on the basis of control signals TSE, TSO.

Abstract: A page buffer circuit of a flash memory device includes page buffers which are connected to the plurality of bit line pairs, respectively, and execute a read operation or a program operation on memory cells in response to bit line control signals, bit line select signals and control signals, and bit line precharge circuits, which are connected to the plurality of bit line pairs, respectively, and in the read operation, precharge one of a pair of bit lines connected thereto to a reference voltage level in response to bit line precharge signals. The reference voltage can be a stable voltage regardless of variation in temperature and/or voltage. A bit line precharge circuit supplies a stable precharge voltage to bit line regardless of variation in temperature and/or voltage in a read operation. Therefore, erroneous data can be prevented from being read.

Abstract: The invention describes and provides pipelining of addresses to memory products. Addresses are pipelined to multibank memories on both rising and falling edges of a clock. Global Address Supervisor pipelines these addresses optimally without causing bank or block or subarray operational conflicts. Enhanced data through put and bandwidth, as well as substantially improved bus utilization (simultaneously), can be realized. In peer-to-peer connected systems, significant random data access throughput can be obtained.

Abstract: A program method of a flash memory device having first and-second bitlines connected with a plurality of memory cells for storing multi-bit data indicating one of a plurality of states. The program method includes programming memory cells, connected to a selected row and first or second bitlines, with multi-bit data; and reprogramming programmed memory cells connected to a row disposed directly below the selected row and the first bitlines or the second bitlines, whereby increasing a read margin between adjacent states reduced due to high temperature stress (HTS).

Abstract: The present invention provides circuitry for implementing a multiple data rate interface architectures for programmable logic devices. The programmable logic device of the invention includes a core and surrounding periphery. The core includes a plurality of logic elements arranged in an array. Some of the logic elements within the core include registers that are used as data registers for the multiple data rate interface.

Abstract: Systems and methods for reducing delays between successive write and read accesses in multi-bank memory devices are provided. Computer circuits modify the relative timing between addresses and data of write accesses, reducing delays between successive write and read accesses. Memory devices that interface with these computer circuits use posted write accesses to effectively return the modified relative timing to its original timing before processing the write access.

Abstract: A processor having the capability to dispatch multiple parallel operations, including multiple load operations, accesses a cache which is divided into banks. Each bank supports a limited number of simultaneous read and write access operations. A bank prediction field is associated with each memory access operation. Memory access operations are selected for dispatch so that they are predicted to be non-conflicting. Preferably, the processor automatically maintains a bank predict value based on previous bank accesses, and a confirmation value indicating a degree of confidence in the bank prediction. The confirmation value is preferably an up-or-down counter which is incremented with each correct prediction and decremented with each incorrect prediction.

Abstract: A method of accessing matrix data of a semiconductor memory having memory banks. The memory banks each having memory cells arranged in X and Y directions, a Y decoder for selecting Y-direction addresses of the memory cells and an X decoder for selecting X-direction addresses of the memory cells, predicated on the memory banks being operable independently. Items of data specified by a specified number of continuous X addresses and having the same Y addresses are successively written into or read from the memory cells arranged in the X direction, which are specified by X addresses corresponding to 1+knth in one of the banks. After all data have been written into or read from the specified memory cells, corresponding data are successively written into or read from the memory cells specified by X addresses corresponding to 2+knth in another one of the banks.

Abstract: A memory device and method receives write data through a unidirectional downstream bus and outputs read data through a unidirectional upstream bus. The downstream bus is coupled to a pair of internal write data buses, and the upstream bus is coupled to a pair of internal read data buses. A first set of multiplexers selectively couple each of the internal write data buses to any of a plurality of banks of memory cells. Similarly, a second set of multiplexers selectively couple each of the banks of memory cells to any of the internal read data buses. Write data can be coupled to one of the banks concurrently with coupling read data from another of the banks. Also, write data may be concurrently coupled from respective write data buses to two different banks, and read data may be concurrently coupled from two different banks to respective read data buses.