Abstract: A active thermographic method for detecting subsurface defects in a specimen, particularly kissing unbond defects, includes heating a specimen, applying a force to the surface of the specimen to shift and separate the walls of the defect, and obtaining thermographic images of the specimen over time to monitor the heat flow through the specimen and detect thermal discontinuities. Because kissing unbond defects normally have good physical contact, and therefore good thermal conductivity, between its walls, these defects can go undetected in conventional active thermographic methods. By distorting the surface of the specimen, the kissing unbond defect is enlarged enough to generate sufficient thermal contrast for the defect to appear in the thermographic images.

Abstract: An apparatus and method for the monitoring and measurement of chemical and/or biological deposition in heat exchangers and other fluid processing vessels. The new and original sensing system includes at least two hollow fluid vessels conductively mounted across a constant heat transfer path. Thin film heat flux sensors are attached to a heat transfer surface of the vessels in order to measure changes in differential heat flux that occur when deposition begins to accumulate in the vessel. In this way, it is shown that differential heat flux measurements can be used to detect and measure the early onset of chemical and/or biological deposition.

Abstract: The invention relates to a method and to a device for system- and/or process-monitoring in connection with a measurement apparatus that determines/monitors at least one process parameter of a medium. The method and device enable statements to be made regarding the present and future functionality of a measurement apparatus, or individual components of the measurement apparatus. The temperature values (T) of the medium are ascertained directly or indirectly and a trend analysis regarding the thermal loading of the measurement apparatus or the thermal loading of individual components of the measurement apparatus is carried out on the basis of the ascertained temperature values (T) of the medium or on the basis of the derivatives of the ascertained temperature values of the medium.

Abstract: An apparatus for non-destructively testing the response of a specimen to temperature change. An embodiment temperature cycles a specimen, such as a wet mortar beam, dynamically measuring change in dimension and the temperature of the specimen during the cycle. Among other elements, the apparatus employs an accelerometer, a thermistor, a thermocouple, a temperature controller, linear variable differential transducers (LVDTs), an FFT device, a data logger and a heat tape controller. A typical cycle involves using liquid nitrogen to reduce the temperature in an insulated test chamber from ambient to less than ?60° C. and returning to ambient by dispersing the nitrogen with a source of ambient air. Further, in select embodiments, the apparatus measures fundamental frequencies induced by a micro-hammer as measured transversely along a dimension of a specimen during the cooling-warming cycle. Also provided is a method for testing specimens using devices representative of embodiments of the present invention.

Abstract: The invention relates to a method and to a device (1) for testing materials by determining and displaying as an image temperature differences above a threshold value on the surface of test objects (8). In a first step, a camera for determining and displaying as an image the temperature differences above a threshold value is used to determine the temperatures of object elements (22) within a test area (14) of the test object (8) facing the camera. The test area (14) is then provided with heat by beam (4) in such a manner that the temperature of the surface of the test object (8) rises in the test area (14) by at least of the threshold value. The object elements (22) are displayed as image elements in such a manner that the temperature differences above the threshold value between the object elements (22) are visible. The cool-down of the test area (14) is indicated by means of the image elements (20).

Abstract: The invention concerns a device for exposing samples to photonic radiation for accelerated artificial weathering tests, comprising: chamber (30), a sample-holding cage (40) rotating about a horizontal axis (H—H), at least an electromagnetic radiation lamp (10) in the central part of the cage (45, 46). One improvement consists in ventilating means blowing air into the chamber (30) through the air intake orifice (50), so as to generate an air stream arriving directly on the lamp (10), then diverging about the lamp (10) to be evacuated through the fixed air outlets (31–38) at the periphery of the cage (40). Another improvement consists in the fact that the lower part of the rotary sample-holding cage is immersed in a liquid tank, such that the samples are cyclically in immersion phases into the liquid alternating with emergence phases into the air stream. The invention also concerns test devices and methods integrating said improvements.

Abstract: An accelerated weathering apparatus of the type used to concentrate solar radiation upon test specimens includes a frame supporting a reflecting solar concentrator disposed in opposition to a target board. A channel is connected to the target board and includes a cover to define a chamber. A fluid source is in communication with the chamber, whereby a fluid introduced into the chamber reacts with the test specimens in order to accelerate degradation of the test specimens during exposure to concentrated solar radiation. Cooling apparatus contiguous with the test specimens may also be included.

Abstract: Heat is applied to a conductive structure that includes one or more vias, and the temperature at or near the point of heat application is measured. The measured temperature indicates the integrity or the defectiveness of various features (e.g. vias and/or traces) in the conductive structure, near the point of heat application. Specifically, a higher temperature measurement (as compared to a measurement in a reference structure) indicates a reduced heat transfer from the point of heat application, and therefore indicates a defect. The reference structure can be in the same die as the conductive structure (e.g. to provide a baseline) or outside the die but in the same wafer (e.g. in a test structure) or outside the wafer (e.g. in a reference wafer), depending on the embodiment.

Abstract: Methods and apparatus for detecting wear in a liner. In one embodiment of the present invention, an electrically conductive wire is placed on or near the outside surface of the liner and the electrical resistance in the electrically conductive wire is measured to determine whether the wire has worn through. In another embodiment of the present invention, the temperature measured by a temperature measuring device, such as a thermocouple, is monitored over time to estimate wear in the liner.

Abstract: A vehicle tire is provided that contains at least one temperature sensor embedded in the tire in a critical location, and a transmission unit for transferring the output signal of the temperature sensor to a location externally of the vehicle tire. A method is also provided for precisely measuring the temperature of a vehicle tire with such a temperature sensor. A method is also provided for monitoring the operation of the vehicle tire.

Abstract: The non-invasive corrosion sensor includes a heat sink, at least two peltiers, a reference standard and a data acquisition device. Each peltier has a negative side and a positive side, and each peltier communicates with the heat sink such that the negative side of each peltier is maintained at a common temperature. The reference standard communicates with the positive side of one of the peltiers while the test piece communicates with the positive side of the other peltier; and the data acquisition devise is able to record and compare the differences in temperatures between the test piece and the reference standard. A higher temperature in the test piece than in the reference standard indicates the presence of corrosion. The differences in temperatures of the test piece and the reference standard are obtained via electrical currents in the peltiers.

Abstract: The temperature of the tread surface part of a tire is increased by running the tire in contact with a drum. The increase in the temperature of the tread surface part is due to the heat of friction between the tread surface part and the drum. Because large increases in temperature indicate that the friction is causing a large amount of wear, it is possible to forecast with ease the amount of wear of the tire from the increase in temperature of the tread surface part. The temperature of the tread surface part can be measured using a thermography machine, and the wear in the tread can be determined by looking at an image that shows the temperature.

Abstract: An apparatus (10) for performing acoustic thermography including a fixture (32) having a compliant member (40) that allows contacting surfaces of a horn face (20) and a specimen surface (16) to self-align into parallel contact in response to only the contacting force (FC) there between. When the contacting surfaces are brought together in a slightly non-parallel alignment, the contacting force develops a force component (FN) that is normal to the plane of contact. This normal force causes deflection of a compliant member, thereby providing movement that brings the contacting surfaces into parallel alignment. The compliant member may be a spring (48), elastomer (50), swivel member (56), bearing member (80), or a curved non-stick surface (90) in various embodiments.

Abstract: A method and semiconductor device for detecting a heat generating failure in an unpassivated semiconductor device. The semiconductor device has an unpassivated surface and a heat generating failure, e.g., short circuit. A coating may be applied to the unpassivated surface of the semiconductor device. The coating may be non-electrically conducting and capable of localizing heat generated by the failure in a particular area. The semiconductor device may be biased. The failure may then be detected by detecting a location of the heat generated by the failure in the coating.

Abstract: A high thermal change rate of test apparatus aims to realize test equipment requirement of highly accelerated life test(HALT) and highly accelerated stress screening(HASS). Structurally, the apparatus is provided with a cabinet body with an interior for placing test specimen. The cabinet body is provided with elements of fans, electric heating tubes and liquid nitrogen nozzles therein. The positions of the cabinet body and the control system are separate. Several groups (normally 2 or 3 groups, depends on the size of cabinet) of liquid nitrogen pipes connecting the cabinet body are flexible stainless steel pipes for enclosing and insulating sleeve tubes. During full-speed temperature cooling, all groups of the pipes simultaneously eject liquid nitrogen. When temperature is constant, only one group of liquid nitrogen pipe with cryogenic valve and nozzles is used and micro-adjusted to achieve good temperature stability.

Abstract: A non-ferrous component comprising a thermally-affected adhesive applied to a surface of the component, and at least one ferrous metal wire attached to the surface of the component by the thermally-affected adhesive.

Abstract: In accordance with one aspect of the disclosure, a method of sensing the temperature of a molten metal vehicle is provided. In one exemplary embodiment, the method includes utilizing at least one thermal imager located to the side of the molten metal during the dispensing of the molten metal and capturing at least one thermal image for determining the rotational position of the molten metal vehicle by calculating an area of the molten metal.

Abstract: A thermal testing control system for notebook computers, remotely controlled by a control means, is described. An enclosure can test notebook computers in its inner space under a predetermined temperature. A temperature sensor, mounted in the testing room is electrically connected to the control means. A blower is mounted in one opening, and electrically connected to the control means. If the temperature measured by the temperature sensor is higher than the predetermined temperature, the blower begins to operate.

Abstract: A monitoring system for rotating equipment includes detection of temperature conditions in various areas of the system including motor and pump bearings, mechanical seal environment including seal flush, seal cooler and seal reservoir and process fluid temperature. The monitoring system allows for the prediction of component failures and a proactive repair schedule which minimizes if not eliminates component damage.

Abstract: This invention provides an apparatus for nondestructive residential inspection and various methods for using a thermal imaging apparatus coupled to inspect exterior residential components, interior residential components, a pitched roof and basement of a residential building and the electrical system of a residential building.

Abstract: An infrared camera is configured to measure a temperature distribution on a surface of at least one rotating turbine bucket. With the measured surface temperature distribution, a condition index is determined which reflects either an overall condition of a bucket or a specific location on the bucket. The condition index can be used to predict the remaining useful life of a turbine bucket, which can be used to optimize maintenance intervals and thereby reduce maintenance costs.

Abstract: The invention provides a failure diagnosing apparatus having a first sensor for detecting a temperature of cooling water of an engine mounted on a vehicle and a second sensor for detecting a temperature associated with the engine. The apparatus calculates a first difference between a temperature detected by the first sensor at the time when the engine stops in a previous operating cycle and a temperature detected by the first sensor at the time when the engine starts in a current operating cycle is calculated. The apparatus also calculates a second difference between a temperature detected by the second sensor at the time when the engine stops in the previous operating cycle and a temperature detected by the second sensor at the time when the engine starts in the current operating cycle. It is determined whether the first sensor is faulty based on the first difference and the second difference.

Abstract: Oxidation of turbine buckets may cause unexpected and expensive turbine failures. Turbine bucket oxidation condition may be estimated to predict remaining useful bucket life during operation of a turbine by processing time-varying temperature distributions measured with a pyrometer of at least one rotating turbine bucket.

Abstract: In a data carrier (1) having an electrical circuit (2), indication means (3) are implemented by means of the electrical circuit (2), which means are arranged so as to determine the occurrence of a change in a parameter influencing the data carrier (1) in relation to at least one threshold value, the at least one threshold value dividing a first parameter range from a second parameter range, and which means are arranged so as to give a permanent indication of the change during the time following the first occurrence of said change.

Abstract: A measuring instrument includes a first temperature sensor, a second temperature sensor and circuitry. The first and second temperature sensors each generate a signal indicative of the temperature of a medium being detected. The circuitry is configured to activate verification of temperature being sensed with the first sensor. According to one construction, the first temperature sensor comprises at least one thermocouple temperature sensor and the second temperature sensor comprises an optical temperature sensor, each sensor measuring temperature over the same range of temperature, but using a different physical phenomena. Also according to one construction, the circuitry comprises a computer configured to detect failure of one of the thermocouples by comparing temperature of the optical temperature sensor with each of the thermocouple temperature sensors. Even further, an output control signal is generated via a fuzzy inference machine and control apparatus.

Abstract: In a method of detecting damage in materials or objects (4) the material or object is physically influenced to produce a physical change of the material or object inducing transient slow dynamics in case of damages in the material or object. Slow dynamics induced material elastic modulus changes are detected as indication of damages of the material or object. In a device for non-destructive detection of damage in materials or objects (4), an impact source (16) is provided to impact the material or object to physically influence the material or object to produce a physical change of the material or object inducing transient slow dynamics in case of damages in the material or object. A detector (2,8,10,12,14,6) is provided to detect by said slow dynamics induced material elastic modulus changes as indications of damages of the material or object.

Abstract: A method and device for photothermal imaging tiny metal particles which are immersed in a given medium like a living cell deposited onto a transparent glass slide. The given medium and immersed tiny metal particles are illuminated through separate phase reference laser beam and sensitive probe laser beam, with the sensitive probe laser beam including a heating laser beam undergoing through impingement on the given medium slight phase changes induced by photothermal effect due to a local heating, in the absence of any substantial phase changes to the phase reference laser beam. Illuminating is performed by focusing the separate phase reference and sensitive probe laser beam through the transparent glass slide at a given depth within the given medium and a transmitted phase reference laser beam and a transmitted sensitive probe laser beam undergoing the slight phase changes are generated.

Abstract: A system and method for verifying conductive paths in test parts and for testing the conductive paths for flaws subjects the test part to a current flow from one location to another via conduction. Sites containing dislocations cause a concentration of current around them which results in increased ohmic heating which can be detected with an infrared camera.

Abstract: The invention involves the use of thermal imaging equipment to take infrared images of a steam turbine during start-up. The exterior temperatures developed from the infrared images are correlated with turbine vibration data to determine which insulation temperature patterns reflect insulation poor enough to cause packing seal teeth to rub and the turbine to vibrate during operation or shut-down. From the thermal images and vibration data, control limits are developed for insulation surface temperature. Insulation is added, before the steam turbine is shut down, in accordance with the obtained data and control limits.

Abstract: A device and method identify and compensate for tensile and/or shear stress due to heat-caused expansion and contraction between an integrated heat spreader and thermal interface material. This device and method may change the shape of the integrated heat spreader based upon the identification of location(s) of high tensile and/or shear stress so that additional thermal interface material may be deposited between the integrated heat spreader and a die in corresponding locations. Utilizing this method and device, heat is efficiently transferred from the die to the integrated heat spreader.

Abstract: An accelerated weathering apparatus of the type used to concentrate solar radiation upon test specimens includes a frame supporting a reflecting solar concentrator disposed in opposition to a target board. A channel is connected to the target board and includes a cover to define a chamber. A fluid source is in communication with the chamber, whereby a fluid introduced into the chamber reacts with the test specimens in order to accelerate degradation of the test specimens during exposure to concentrated solar radiation. Cooling apparatus contiguous with the test specimens may also be included.

Abstract: A thermographic detection system (10) and method for detecting imperfections within a bond (23) of a structure (14′). The system (10) includes a cooling device (32) for nondestructively cooling a bonded region (24) of the structure (14′). A thermal sensor (34) detects thermal changes within the bonded region (24) and generates a thermal signal. A thermal indicator (36) is electrically coupled to the thermal sensor (34) and indicates the thermal changes in response to the thermal signal.

Abstract: A test apparatus and method of its use for evaluating various performance aspects of a piping segment locates a piping segment between two cold boxes. A first cold box conditions test fluid before providing the fluid into the piping segment. The first and second cold boxes both significantly reduce, if not eliminate, any heat transfer from the ends of the piping so that accurate measurements of heat leak rates from the sides of the piping segment may be determined.

Abstract: An apparatus (10) for performing acoustic thermography including a fixture (32) having a compliant member (40) that allows contacting surfaces of a horn face (20) and a specimen surface (16) to self-align into parallel contact in response to only the contacting force (FC) there between. When the contacting surfaces are brought together in a slightly non-parallel alignment, the contacting force develops a force component (FN) that is normal to the plane of contact. This normal force causes deflection of a compliant member, thereby providing movement that brings the contacting surfaces into parallel alignment. The compliant member may be a spring (48), elastomer (50), swivel member (56), bearing member (80), or a curved non-stick surface (90) in various embodiments.

Abstract: A method for inspecting an object and detecting defects is taught (BGA and Flip-Chip solder joints on a PCB particularly). The method comprises injecting a thermal stimulation on the object; capturing a sequence of consecutive infrared images of the object to record heat diffusion resulting from the heat pulse; comparing the heat diffusion on said object to a reference; and determining whether the object comprises any defects. Also described is a system comprising a mounting for mounting the object; a thermal stimulation module for applying a thermal stimulation to the bottom surface of the object; an infrared camera for capturing infrared images of the object on the top surface of the object to record a change in infrared radiation from the top surface resulting from the thermal stimulation; and a computer for comparing the change in infrared radiation within a region on the top surface to a reference and determining whether the object comprises any defects.

Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.

Abstract: An accelerated weathering test apparatus for concentrating solar radiation upon at least one test specimen including a target board, a reflector device, an air circulation device, a feedback device, an input device and a controller. Ambient air is circulated over the target board to cool the test specimens. The controller continuously sets a dynamic set point based on the reference signal from the input device which is representative of a complex temperature cycle of a material end-use application and adjusts the rate of air circulation based on a test signal from the feedback device.

Abstract: An accelerated weathering test apparatus for concentrating solar radiation upon at least one test specimen including a target board, a reflector device, an air circulation device, a feedback device, an input device and a controller. Ambient air is circulated over the target board to cool the test specimens. The controller continuously sets a dynamic set point based on the reference signal from the input device which is representative of a complex temperature cycle of a material end-use application and adjusts the rate of air circulation based on a test signal from the feedback device.

Abstract: There is provided a temperature control system for a humidity sensor, which is capable of eliminating impurities attached to a sensor element of the sensor efficiently and sufficiently while preventing the sensor element from being cracked due to heat generated by a heater in a state of condensation formed thereon, and suppressing attachment of impurities to the sensor element, thereby making it possible to preserve an excellent detection accuracy of the humidity sensor. The temperature control system controls the temperature of the sensor element of the humidity sensor arranged in an exhaust pipe for detecting humidity within the exhaust pipe. A heater heats the sensor element. The temperature of the sensor element is detected. When the detected temperature of the sensor element is higher than a predetermined temperature, said heater is operated.

Abstract: A multi-faceted concentrator apparatus for providing ultra-accelerated natural sunlight exposure testing for sample materials under controlled weathering conditions comprising: facets that receive incident natural sunlight, transmits VIS/NIR and reflects UV/VIS to deliver a uniform flux of UV/VIS onto a sample exposure plane located near a center of a facet array in chamber means that provide concurrent levels of temperature and/or relative humidity at high levels of up to 100× of natural sunlight that allow sample materials to be subjected to accelerated irradiance exposure factors for a significant period of time of about 3 to 10 days to provide a corresponding time of about at least a years worth representative weathering of sample materials.

Abstract: An accelerated thermal stress cycle test which can be conducted in a significantly reduced test time compared to the conventional test is provided. The test is carried out in a cluster of reaction chambers that includes a CVD chamber and a cool-down chamber such that a pre-processed wafer can be heated from room temperature to at least 350° C. in an inert gas in about 2 min., and then cooled down to not higher than 70° C. in a cool-down chamber in less than 30 sec. The heating and cooling steps can be repeated between 3 and 7 times to reveal any defect formation caused by the thermal stress cycle test. Typical defects are metal film peeling from insulating dielectric material layer or void formation.

Abstract: An improved method for simulating an oxidative aging of an asphalt sample comprises accumulating a number of samples from the asphalt load under test. The samples are initially heated by convection and microwave units to a common temperature. Subsequently, the samples are incrementally, as heated in a “ramp” control heating, from 27° C. to 147° C. over a 60-minute period. Subsequently, the samples are microwave heated for three successive 60-minute periods and one 30-minute period under a pressure of 440 psi. Upon pressure release, a subsequent short convection heating and subsequent degassing, a resulting aged residue is presented which is equivalent to residue provided by known conventional tests but at a reduced time period.

Abstract: An apparatus and method for evaluating thermal barrier coating material on a surface of a part or component that is subjected to transient heat/thermal cycles. A pulsed laser heating apparatus that preferably uses lenses and optical fiber focusing components simulates conditions of brief heating on the test specimen. In the method of the invention, the temporal shape, spatial distribution, and total energy of the laser pulse are designed to produce a spot of uniform illumination and heat absorption on the test specimen that closely approximates the thermal loading that the specimen is expected to receive during use. The test specimen is then examined for thermally induced changes.

Abstract: An apparatus (10) for inline testing of a product (15) includes an environmental chamber (20), a conveyor (40), a stimulation means (60), and a monitoring means (80). The environmental chamber (20) provides thermal shock to the product (15) and includes a hot zone (22) and a cold zone (24). The conveyor (40) transports the product (15) through the hot (22) and cold zones (24) of the environmental chamber (20). The stimulation means (60) provides continuous electric stimulation to the product (15) during transport of the product (15) through the environmental chamber (20). The monitoring means (80) continuously monitors the effect of the stimulation means (60) on the product (15) during transport of the product (15) through the environmental chamber (20).

Abstract: An accelerated thermal stress cycle test which can be conducted in a significantly reduced test time compared to the conventional test is provided. The test is carried out in a cluster of reaction chambers that includes a CVD chamber and a cool-down chamber such that a pre-processed wafer can be heated from room temperature to at least 350° C. in an inert gas in about 2 min., and then cooled down to not higher than 70° C. in a cool-down chamber in less than 30 sec. The heating and cooling steps can be repeated between 3 and 7 times to reveal any defect formation caused by the thermal stress cycle test. Typical defects are metal film peeling from insulating dielectric material layer or void formation.

Abstract: An accelerated weathering test apparatus for concentrating solar irradiance upon and immersing at least one test specimen including at least one support member and an operative portion operatively connected to the at least one support member. The operative portion includes a mirror bed, at least one standard and a channel. The operative portion is moveable relative to the at least one support member from a first operative position to a second operative position. A target board is disposed in the channel for supporting the at least one test specimen for exposure to concentrated solar radiation when the operative portion is disposed in the first operative position and immersion in a fluid when the operative portion is disposed in the second operative position.

Abstract: A method for estimating the life of an apparatus under a random stress amplitude variation, involving determining a probability density function of a cumulated damage quantity and estimating the life of the apparatus on the basis of the probability density function, characterized by: approximating a damage coefficient indicative of a damage quantity per unit by a linear expression when the random stress amplitude variation is in a narrow band; and representing the random stress amplitude variation &sgr;(t)(instantaneous) in terms of the sum of a time averaged value &sgr;(t)(mean) and a stochastic variation &sgr;′.

Abstract: A method to accurately evaluate a thermal cycle life of an article with a restraint rate as an evaluating parameter without providing a thermal cycle under actual service conditions to the article subjected to the thermal cycle.

Abstract: A heat capacity C1 is obtained by conducting two-dimensional thermal analysis simulation to the cross-section of a wiring. Next, based on one-dimensional approximate equation of &thgr;0=(Q0/2) (&lgr;·SC1)−½ along a wiring length direction, a wiring temperature rise &thgr;0 in the void is obtained. In the expression, &thgr;0 is a rise in wiring temperature in the void, Q0 is a thermal quantity of the void in the wiring, &lgr; is a heat conductivity of the wiring and S is a cross-sectional area of the wiring. The heat capacity C1 may be obtained from an expression C1=&lgr;′{(w/t)+(2.80/1.15) (h/t)0.222}. In the expression, W is wiring width, h is wiring thickness, t is substrate film thickness and &lgr;′ is the heat conductivity of the substrate film. By so obtaining, it is possible to shorten analysis time, to save the capacity of a memory and that of a disk for use in calculation, to obtain a simpler analysis model and to facilitate creating a mesh.

Abstract: The present invention provides a method for testing an electronic component comprising exposing the electronic component to a test fluid comprising a fluoroketone that is essentially non-flammable. Preferably the test fluid is comprised of 90% by weight to 100% by weight of the fluoroketone.