Flaw Analysis Patents (Class 378/58)
  • Patent number: 11961305
    Abstract: Systems and methods for tracking the location of a non-destructive inspection (NDI) scanner using scan data converted into images of a target object. Scan images are formed by aggregating successive scan strips acquired using one or two one-dimensional sensor arrays. An image processor computes a change in location of the NDI scanner relative to a previous location based on the respective positions of common features in partially overlapping scan images. The performance of the NDI scanner tracking system is enhanced by: (1) using depth and intensity filtering of the scan image data to differentiate features for improved landmark identification during real-time motion control; and (2) applying a loop-closure technique using scan image data to correct for drift in computed location. The enhancements are used to improve localization, which enables better motion control and coordinate accuracy for NDI scan data.
    Type: Grant
    Filed: September 8, 2021
    Date of Patent: April 16, 2024
    Assignee: The Boeing Company
    Inventors: Walter J. Jarecki, Gregory J. Sweers, Gary E. Georgeson, James J. Troy, Phillip R. Riste, Armando X. Membrila
  • Patent number: 11931207
    Abstract: Artificial intelligence (AI) recognition of echocardiogram (echo) images by a mobile ultrasound device comprises receiving a plurality of the echo images captured by the ultrasound device, the ultrasound device including a display and a user interface (UI) that displays the echo images to a user, the echo images comprising 2D images and Doppler modality images of a heart. One or more neural networks process the echo images to automatically classify the echo images by view type. The view type of the echo images is simultaneously displayed in the UI of the ultrasound device along with the echo images. A report is generated showing the calculated measurements of features in the echo images. The report showing the calculated measurements is displayed on a display device.
    Type: Grant
    Filed: March 31, 2021
    Date of Patent: March 19, 2024
    Assignee: EKO.AI PTE. LTD.
    Inventors: James Otis Hare, II, Su Ping Carolyn Lam, Yoran Hummel, Mathias Iversen, Andrie Ochtman
  • Patent number: 11877894
    Abstract: Artificial intelligence (AI) recognition of echocardiogram (echo) images by a mobile ultrasound device comprises receiving a plurality of the echo images captured by the ultrasound device, the ultrasound device including a display and a user interface (UI) that displays the echo images to a user, the echo images comprising 2D images and Doppler modality images of a heart. One or more neural networks process the echo images to automatically classify the echo images by view type. The view type of the echo images is simultaneously displayed in the UI of the ultrasound device along with the echo images. A report is generated showing the calculated measurements of features in the echo images. The report showing the calculated measurements is displayed on a display device.
    Type: Grant
    Filed: March 31, 2021
    Date of Patent: January 23, 2024
    Assignee: EKO.AI PTE. LTD.
    Inventors: James Otis Hare, II, Su Ping Carolyn Lam, Yoran Hummel, Mathias Iversen, Andrie Ochtman
  • Patent number: 11781998
    Abstract: An inspection method of a membrane electrode assembly includes a first process of acquiring an X-ray transmission image of the membrane electrode assembly, a second process of identifying a luminance-reduced region having a luminance lower than a luminance of a surrounding region in the X-ray transmission image acquired in the first process, a third process of correcting the luminance of the luminance-reduced region identified in the second process, in accordance with a planar size of the luminance-reduced region, based on a correlation between a planar size of a foreign matter in the membrane electrode assembly and change in luminance due to diffraction of X-rays, and a fourth process of finding a thickness of the foreign matter in the membrane electrode assembly based on the luminance corrected in the third process.
    Type: Grant
    Filed: February 14, 2022
    Date of Patent: October 10, 2023
    Assignees: TOYOTA JIDOSHA KABUSHIKI KAISHA, HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Shinya Takeshita, Toshiyuki Takahara
  • Patent number: 11714054
    Abstract: An x-ray inspection apparatus may comprise an x-ray source, an x-ray detector, and a drive assembly. The drive assembly may be configured to lift a part carrier such that the part carrier is disengaged from a feed assembly and an object mounted on the part carrier is positioned between the x-ray source and the x-ray detector. The feed assembly may be configured to feed part carriers into and out of the x-ray inspection apparatus. The drive assembly may be further configured to subsequently lower the part carrier such that the part carrier is reengaged with the feed assembly.
    Type: Grant
    Filed: September 14, 2020
    Date of Patent: August 1, 2023
    Assignee: Illinois Tool Works Inc.
    Inventor: Mark B. Kirschenman
  • Patent number: 11609189
    Abstract: CT scanner comprising a scanning conveyor (9) mounted on a supporting structure and configured to move an object (3) for CT examination forward through a scanning area (8), an input conveyor (10) configured to convey the object until the scanning chamber (2), and an output conveyor (11) configured to convey an object (3) out of the scanning chamber (2), wherein the input conveyor (10), the scanning conveyor (9) and the output conveyor (11) are configured to move forward the object (3) placed on a supporting unit (19) mechanically detached therefore, and wherein the scanning conveyor (9) is configured to rotate the supporting unit (19) and the object (3) on themselves as they travel through the scanning area (8). The input conveyor (10) and the output conveyor (11) are fitted with shields configured in such a way as to intercept all x-rays emitted from the scanning area (8) which escape from the scanning chamber (2) towards the conveyors.
    Type: Grant
    Filed: June 3, 2021
    Date of Patent: March 21, 2023
    Assignee: BIOMETIC S.R.L.
    Inventors: Thomas Prenn, Enrico Ursella
  • Patent number: 11590394
    Abstract: A method and system for determining concentricity of a multiple layer golf ball are disclosed herein. One or more images of a golf ball are generated using an X-ray source, a camera or a digital detector, and an image intensifier. An edge detection algorithm is preferably utilized. The method also includes calculating Y,Z center coordinates of the a best fit diameter or ellipse of the inner edge layer and outer edge layer of the multiple layer golf ball.
    Type: Grant
    Filed: June 14, 2021
    Date of Patent: February 28, 2023
    Assignee: Topgolf Callaway Brands Corp.
    Inventors: Julie Caterina, Megan Ilnicky
  • Patent number: 11543241
    Abstract: Systems and methods for measuring the concentricity of golf balls using varying energy levels to gather and analyze data on concentricity.
    Type: Grant
    Filed: July 7, 2021
    Date of Patent: January 3, 2023
    Assignee: Acushnet Company
    Inventors: Paul Furze, Brian Comeau
  • Patent number: 11460417
    Abstract: A method of inspecting a membrane-electrode assembly includes obtaining an X-ray transmission image by applying X-rays to the membrane-electrode assembly, and determining whether a foreign matter having a size equal to or larger than a predetermined value is included in the membrane-electrode assembly, according to a brightness reduction amount in each pixel of the X-ray transmission image obtained, while referring to a correlative relationship between the size of the foreign matter measured in a planar direction of the membrane-electrode assembly, and the brightness reduction amount in the X-ray transmission image.
    Type: Grant
    Filed: February 24, 2021
    Date of Patent: October 4, 2022
    Assignees: TOYOTA JIDOSHA KABUSHIKI KAISHA, HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Shinya Takeshita, Toshiyuki Takahara, Masaki Tatsumi
  • Patent number: 11446009
    Abstract: An automated workflow receives a patient study comprising cardiac biomarker measurements and a plurality of echocardiographic images taken by an ultrasound device of a patient heart. A filter separates the plurality of echocardiogram images by 2D images and Doppler modality images based on analyzing image metadata. The 2D images are classified by view type, and the Doppler modality images are classified by view type. The cardiac chambers are segmented in the 2D images, and the Doppler modality images are segmented to generate waveform traces, producing segmented 2D images and segmented Doppler modality images. Using both the sets of images, measurements of cardiac features for both left and right sides of the heart are calculated. The cardiac biomarker measurements and the calculated measurements are compared with international cardiac guidelines to generate conclusions, and a report is output showing the measurements that fall within or outside of the guidelines.
    Type: Grant
    Filed: November 9, 2020
    Date of Patent: September 20, 2022
    Assignee: EKO.AI PTE. LTD.
    Inventors: James Otis Hare, II, Paul James Seekings, Su Ping Carolyn Lam, Yoran Hummel, Jasper Tromp, Wouter Ouwerkerk, Zhubo Jiang
  • Patent number: 11378389
    Abstract: A device for detecting the profile of a tread includes a light source, a mask configured for receiving a light emission of the light source and permeable to the light emission in correspondence of a slit provided therein. The slit is configured for generating, when traversed by the light emission, a light curtain. At least one image-acquisition device is configured for acquiring a projection of the light curtain on a tread, and a data-processing unit is operatively connected to the image-acquisition device for reception of image data acquired thereby.
    Type: Grant
    Filed: February 27, 2020
    Date of Patent: July 5, 2022
    Assignee: SUNTEKNE S.R.L.
    Inventor: Cesare Santanera
  • Patent number: 11340176
    Abstract: The X-ray inspection apparatus includes an X-ray source, a sample moving mechanism, an X-ray detector equipped with a line sensor with pixels detecting X-ray radiation passing through a sample, an image storage unit for storing X-ray radiation intensities, an intensity correction unit for correcting the X-ray radiation intensities stored in the image storage unit, and a defect detector for detecting a defect in the sample. The intensity correction unit sets an intensity of X-rays detected from the inspection initiation region after starting inspection of the sample or an intensity of X-rays preliminarily detected from the sample before starting the inspection as a reference radiation intensity, and corrects an intensity of X-rays detected from the subsequent inspection region based on a correction coefficient obtained from comparison between the intensity of X-rays detected from the subsequent inspection region and the reference radiation intensity.
    Type: Grant
    Filed: August 21, 2020
    Date of Patent: May 24, 2022
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventor: Akihiro Takeda
  • Patent number: 11301996
    Abstract: A method for training neural networks of an automated workflow performed by a software component executing on a server in communication with remote computers at respective laboratories includes downloading and installing a client and a set of neural networks to a first remote computer of a first laboratory, the client accessing the echocardiogram image files of the first laboratory to train the set of neural networks and to upload a first trained set of neural networks to the server. The process continues until the client and the second trained set of neural networks is downloaded and installed to a last remote computer of a last laboratory, the client accessing the echocardiogram image files of the last laboratory to continue to train the second trained set of neural networks and to upload a final trained set of neural networks to the server.
    Type: Grant
    Filed: March 27, 2020
    Date of Patent: April 12, 2022
    Assignee: EKO.AI PTE. LTD.
    Inventors: James Otis Hare, II, Paul James Seekings, Su Ping Carolyn Lam, Yoran Hummel, Jasper Tromp, Wouter Ouwerkerk, Zhubo Jiang
  • Patent number: 11255705
    Abstract: A method for setting testing thresholds applied by a testing device to products being made includes obtaining an initial lower threshold for testing the products and counting, followed by manual review, first, second, third, and fourth type product qualities as being quantities under the initial lower threshold. The method adds a minimum product parameter of defective products, the initial lower threshold, and a number of values between the minimum product parameter and the initial lower threshold into a set, repeating the application of one selected element from the set as an experiment threshold. First to fourth type quantities of the current products are counted again under the experiment threshold, an effectiveness of each element of the set is calculated, and an element of the set with the maximum effectiveness is defined as a suggested lower threshold for testing the products.
    Type: Grant
    Filed: June 23, 2020
    Date of Patent: February 22, 2022
    Assignee: HONGFUJIN PRECISION ELECTRONICS (TIANJIN) CO., LTD.
    Inventors: Wan-Hsin Tarng, Han-Ting Hsu
  • Patent number: 11185294
    Abstract: A super-resolution digital tomosynthesis system for imaging an object including a source configured to emit penetrating particles toward an object; a detector configured to acquire a series of projection images of the object in response to the penetrating particles from the source; positioning apparatus configured to position the source and the detector; and an imaging system coupled to the source, the detector, and the positioning apparatus. The imaging system is configured to control the positioning apparatus to position the source in relation to the detector along a scan path and to change a distance between the source and the detector, control the source and the detector to acquire the series of projection images along the scan path with the distance change between the source and detector, and construct a tomographic volume exhibiting super-resolution from data representing the acquired series of projection images.
    Type: Grant
    Filed: February 27, 2017
    Date of Patent: November 30, 2021
    Assignees: The Trustees of the University of Pennsylvania, Real Time Tomography, LLC
    Inventors: Andrew D. A. Maidment, Raymond J. Acciavatti, Susan Ng, Peter A. Ringer, Johnny Kuo
  • Patent number: 11175243
    Abstract: An x-ray imaging/inspection system includes an x-ray source having a plurality of sub-sources in thermal communication with a substrate. The system further includes a first grating positioned to receive at least some of the x-rays from the x-ray source, a stage configured to hold a sample positioned to receive at least some of the x-rays from the x-ray source, at least one x-ray detector, and a second grating having periodic structures. The x-ray source, the first grating, and the second grating are configured such that a ratio of a pitch p0 of the plurality of sub-sources to a pitch p2 of the periodic structures of the second grating is substantially equal to a ratio of a distance dS-G1 between the plurality of sub-sources and the first grating and a distance dG1-G2 between the first grating and the second grating: (p0/p2)=(dS-G1/dG1-G2).
    Type: Grant
    Filed: February 4, 2021
    Date of Patent: November 16, 2021
    Assignee: Sigray, Inc.
    Inventors: Wenbing Yun, Sylvia Jia Yun Lewis, Janos Kirz
  • Patent number: 11125704
    Abstract: A measurement system obtains its own measurement result through use of a different system's measurement result obtained by a different measurement system. The measurement system includes: an output data acquisition unit, a designated position acquisition unit configured to acquire a designated position, which is a position indicating an address at which the different system's measurement result is represented in the output data, by a user's designation, a different system's measurement result acquisition unit, a measurement result acquisition unit, and a position data storage unit configured to store position data indicating the designated position.
    Type: Grant
    Filed: June 19, 2019
    Date of Patent: September 21, 2021
    Assignee: RIGAKU CORPORATION
    Inventors: Yu Aoki, Tatsuya Inoue, Seiji Fujimura, Hiroaki Kita
  • Patent number: 11041818
    Abstract: A dimensional X-ray computed tomography system configured to obtain projection images by irradiating an object to be measured disposed between an X-ray source and an X-ray detector with X-rays for CT scan, and generate a three-dimensional image of the object to be measured by performing CT reconstruction on the projection images, includes a fixed table on which the object to be measured is placed, and a movable X-ray source and a movable X-ray detector that are capable of moving around the fixed table with the fixed table therebetween.
    Type: Grant
    Filed: October 23, 2019
    Date of Patent: June 22, 2021
    Assignee: MITUTOVO CORPORATION
    Inventors: Yusuke Goto, Hidemitsu Asano
  • Patent number: 11031144
    Abstract: A fuel assembly inspection system that utilizes a pressure transducer mounted to a utility's spent fuel handling tool to detect a relative change in depth of a fuel assembly during fuel inspections. The system then wirelessly transmits the signal to a fuel inspection recording system, which converts the signal to a relative height along the fuel assembly being viewed by a camera, and displays the relative height along with the applicable fuel assembly feature being viewed by the camera (e.g., nozzle, grid, span) via a text overlay on the video image of the inspection.
    Type: Grant
    Filed: December 26, 2017
    Date of Patent: June 8, 2021
    Assignee: Westinghouse Electric Company LLC
    Inventors: James T. Polidora, Shawn D. Lazeski, Jeff H. Sleasman
  • Patent number: 10976266
    Abstract: An apparatus for inspecting a component of an aerial power line. A frame has a support member extending along a support member axis. The support member is mountable about the power line in proximity to the component. The support member is rotatable about the line axis upon being mounted about the power line. A stabilizing member is mountable to a stabilizing structure separate from the power line. The stabilizing member is mountable to the support member to rotate the support member about the line axis. A source of electromagnetic imaging energy is mounted to the support member and has an emitter to face the component. A detector is mounted to the support member at a distance from the source to position the component between the source and the detector. The source and/or the detector is displaceable along the support member axis to vary the distance separating the detector and source.
    Type: Grant
    Filed: August 14, 2017
    Date of Patent: April 13, 2021
    Inventors: Nicolas Pouliot, Gilles Rousseau, Marco Lepage, François Morin, Pierre-Luc Richard, Eric Lavoie
  • Patent number: 10896879
    Abstract: A semiconductor package includes a semiconductor package substrate. An insulating layer is disposed on the semiconductor package substrate. A semiconductor chip is disposed on the semiconductor package substrate and is covered by the insulating layer. A reflective layer is disposed on the insulating layer and is spaced apart from the semiconductor chip. The reflective layer is configured to selectively transmit radiation through to the insulating layer. A protective layer is disposed on the reflective layer.
    Type: Grant
    Filed: November 27, 2018
    Date of Patent: January 19, 2021
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Kun Sil Lee, Dong Kwan Kim, Bo Ram Kang, Ho Geon Song, Won Keun Kim
  • Patent number: 10891508
    Abstract: This invention makes it possible to properly detect a detection object region in an image. For this purpose, an image processing apparatus according to this invention includes an image input unit configured to input an object image and a reference image different in pixel value component type from the object image, a detection unit configured to detect a detection object candidate region from the object image, an extraction unit configured to extract at least one feature amount from the detection object candidate region by using at least the reference image, and a selection unit configured to select the detection object candidate region based on the feature amount.
    Type: Grant
    Filed: September 24, 2018
    Date of Patent: January 12, 2021
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Tomotaka Fujimori, Yusuke Mitarai, Masafumi Takimoto, Hiroshi Okuda
  • Patent number: 10825164
    Abstract: A black and white image of a wood product, such as a veneer sheet, is captured with a first camera and a color image of the wood product is captured with a second camera. Computer processing of the black and white image is performed to determine dimensions of the wood product, the existence of voids within the wood product, and the presence of debris on the wood product. Computer processing of the color image is performed to determine whether colored defects are present in the wood product. A grade is assigned to the wood product based on this computer processing. The wood product can then be sorted based on the grade.
    Type: Grant
    Filed: November 29, 2018
    Date of Patent: November 3, 2020
    Assignee: Boise Cascade Company
    Inventors: David Bolton, Jude Richard Peek, Curtis Fennell
  • Patent number: 10822997
    Abstract: An engine assembly includes an engine including a component and defining an opening and an interior, the component including a first side and an opposite second side, the second side positioned within the interior of the engine. The engine assembly also includes an inspection tool having a first member including at least one of a receiver or a transmitter and directed at the first side of the component. The inspection tool also includes a second member including the other of the receiver or the transmitter and positioned at least partially within the interior of the engine and directed at the second side of the component to communicate a signal with the first member through the component, the second member being a robotic arm extending through the opening of the engine.
    Type: Grant
    Filed: June 14, 2018
    Date of Patent: November 3, 2020
    Assignee: General Electric Company
    Inventors: Andrew Crispin Graham, Lyle Timothy Rasch, Michael Dean Fullington, Wayne Ray Grady, David Scott Diwinsky
  • Patent number: 10769770
    Abstract: Quality monitoring system and method for a fuel cell manufacturing line are disclosed. The system includes an image collection unit and a real-time quality control computer. The image collection unit is configured for generating a captured image of a surface of one fuel cell in the fuel cell manufacturing line. The computer is configured to receive the captured image and generate a set of feature vectors based on the captured image. The computer comprises a defect model repository comprising a defect detection model repository and a defect classification model repository, a defect detection module and a defect classification module. The defect detection module is configured to access the defect detection model repository and determine whether the fuel cell is defective based on the set of feature vectors and the defect detection model repository.
    Type: Grant
    Filed: May 7, 2018
    Date of Patent: September 8, 2020
    Assignee: CUMMINS ENTERPRISE LLC
    Inventors: Honggang Wang, Todd Striker, Matthew J. Alinger
  • Patent number: 10670769
    Abstract: The present invention is a self-contained mobile inspection system and method and, more specifically, improved methods and systems for detecting materials concealed within a wide variety of receptacles and/or cargo containers. In particular, the present invention is an improved method and system with a novel boom structure that reduces the weight of the boom. The single, light-weight boom of the inspection system is relatively compact in a stowed configuration and has a low height and center of gravity lending to greater maneuverability.
    Type: Grant
    Filed: May 24, 2018
    Date of Patent: June 2, 2020
    Assignee: Rapiscan Systems, Inc.
    Inventors: Edward James Morton, Francis Baldwin, Andreas F. Kotowski
  • Patent number: 10559396
    Abstract: Objects undergoing processing by a high resolution x-ray microscope with a high flux x-ray source that allows high speed metrology or inspection of objects such as integrated circuits (ICs), printed circuit boards (PCBs), and other IC packaging technologies. The object to be investigated is illuminated by collimated, high-flux x-rays from an extended source having a designated x-ray spectrum. The system also comprises a stage to control the position and orientation of the object; a scintillator that absorbs x-rays and emits visible photons positioned in very close proximity to (or in contact with) the object; an optical imaging system that forms a highly magnified, high-resolution image of the photons emitted by the scintillator; and a detector such as a CCD array to convert the image to electronic signals.
    Type: Grant
    Filed: March 27, 2017
    Date of Patent: February 11, 2020
    Assignee: SVXR, Inc.
    Inventor: David Lewis Adler
  • Patent number: 10507990
    Abstract: An article transport system with few missed detections, and a controller used in the system. The system includes: a conveyor that sequentially transports plural workpieces; a conveyor sensor that obtains conveyance operation information of the conveyor; an arrival sensor that senses the arrival of each workpiece; a camera that captures an image of each workpiece; a position detection processing section that detects the workpiece from the image, and identifies a position of the workpiece on the conveyor; a movement distance designation section that designates first and second movement distances; an image capturing control section that controls the camera to capture an image of the workpiece upon the conveyor advancing by the first movement distance after the arrival of the workpiece has been sensed, and each time the conveyor advances by the second movement distance; and a number designation section that designates an upper limit number for the detection process.
    Type: Grant
    Filed: July 19, 2018
    Date of Patent: December 17, 2019
    Assignee: FANUC CORPORATION
    Inventors: Kentaro Koga, Masafumi Ooba
  • Patent number: 10416100
    Abstract: An adapter apparatus includes a generally cylindrical adapter body 14 including a channel 16 extending axially therethrough, the adapter body having an interior surface bounding the channel, and an exterior surface 18, a generally circular external cross section and an interior cross section which is adapted to engage at least one object 10, the external surface being formed from a material which is capable of supporting a scanning or testing apparatus at a constant distance from the origin of the circle forming the external cross section.
    Type: Grant
    Filed: October 17, 2018
    Date of Patent: September 17, 2019
    Assignee: Johnson Matthey Public Limited Company
    Inventors: Oliver John Beckett, Brian Wilson
  • Patent number: 10352879
    Abstract: A method including inspecting, using an X-ray transmission image, internal defects in a TSV formed in a semiconductor wafer, and detecting the X-rays, and processing an X-ray transmission image. Therein, the detection of X-rays is configured such that: the detection azimuth of the X-rays, and the detection elevation angle of the X-rays relative to the X-ray source are determined on the basis of information on the arrangement interval, depth, and planar shape of structures formed in the sample. The angle of rotation of a rotating stage on which the sample is mounted is adjusted in accordance with the detection azimuth which has been determined, and the X-rays that have been transmitted through the sample are detected with the position of the detector set to the detection elevation angle which has been determined.
    Type: Grant
    Filed: December 16, 2015
    Date of Patent: July 16, 2019
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORAITON
    Inventors: Toshiyuki Nakao, Yuta Urano, Kaifeng Zhang, Hideaki Sasazawa
  • Patent number: 10215716
    Abstract: An x-ray inspection system includes a cabinet including an x-ray source, a sample support supporting a sample to be inspected, and an x-ray detector. The system further includes an air mover configured to force air into the cabinet through an air inlet in the cabinet above the sample support. The air mover and cabinet are configured to force air through the cabinet from the air inlet past the sample support to an air outlet in the cabinet below the sample support. The cabinet may be constructed to provide an x-ray shield. The x-ray inspection system can be used in a clean room environment to inspect items such as semiconductor wafers.
    Type: Grant
    Filed: April 3, 2015
    Date of Patent: February 26, 2019
    Assignee: Nordson Corporation
    Inventors: John Tingay, William T. Walker, Kate Donaldson-Stewart
  • Patent number: 10209204
    Abstract: An X-ray inspection system includes an X-ray source and a detector. A rotary table is arranged between the X-ray source and the detector. The rotary table is configured to secure a test object on the rotary table. The rotary table is arranged on a positioning table. The positioning table is configured to move parallel to an xy-plane between the X-ray source and the detector. The xy-plane is perpendicular to a surface of the detector extending parallel to the xz-plane and the rotary table is configured to rotate about a z-axis.
    Type: Grant
    Filed: October 21, 2014
    Date of Patent: February 19, 2019
    Assignee: YXLON INTERNATIONAL GMBH
    Inventors: Andreas Mecke, Jan Spalding, Axel Klein
  • Patent number: 10132762
    Abstract: An adapter apparatus includes a generally cylindrical adapter body 14 including a channel 16 extending axially therethrough, the adapter body having an interior surface, bounding the channel, and an exterior surface 18, a generally circular external cross section and an interior cross section which is adapted to engage at least one object 10, the external surface being formed from a material which is capable of supporting a scanning or testing apparatus at a constant distance from the origin of the circle forming the external cross section.
    Type: Grant
    Filed: December 18, 2014
    Date of Patent: November 20, 2018
    Assignee: Johnson Matthey Public Limited Company
    Inventors: Oliver John Beckett, Brian Wilson
  • Patent number: 10031092
    Abstract: The system for determining and imaging wax deposition and corrosion in pipelines relate to systems for determining wax deposition and corrosion by one or both of two techniques. In both techniques, a source of neutron radiation is directed at the pipeline. In one technique, a neutron detector surrounded by an absorption shield defining a collimation window counts neutrons reflected back to the detector by back diffusion or backscatter radiation. In the other technique, a gamma ray detector measures gamma rays emitted when the emitted neutrons are absorbed in the pipeline. A neutron moderator-reflector is placed around three sides of the pipeline to increase the likelihood of neutron capture. A gamma detector surrounded by a gamma absorption shield defining a collimation window counts neutron capture gamma rays. An energy window can be taken for selection of Fe and H gamma rays for high precision imaging.
    Type: Grant
    Filed: May 1, 2017
    Date of Patent: July 24, 2018
    Assignee: KING ABDULAZIZ UNIVERSITY
    Inventor: Samir Abdul-Majid Alzaidi
  • Patent number: 9965840
    Abstract: The invention relates to a device and a method for determining the weight of product (2), in particular a pharmaceutical product, which is located in a container (3). The device comprises at least one x-ray source (28), which produces a radiation path (18), for passing radiation through the container (3), and a sensor (14), which detects the radiation of the container (3) through which radiation is passed in the form of an image (12), wherein an evaluating apparatus (14), is provided, which divides the image (12) of the container (3) through which radiation is passed into at least one evaluation region (21) in which there is no product (2).
    Type: Grant
    Filed: May 26, 2014
    Date of Patent: May 8, 2018
    Assignee: Robert Bosch GmbH
    Inventors: Iulian Maga, Martin Vogt, Jens Schlipf
  • Patent number: 9857163
    Abstract: A method of measuring an object having associated geometric data and material data receives the geometric data and material data relating to the object, and controls an x-ray device to scan the object. The x-ray device operates in accordance with a plurality of operating parameters. The method then varies at least one of the operating parameters during the scan as a function of one or both the geometric data and the material data.
    Type: Grant
    Filed: October 24, 2014
    Date of Patent: January 2, 2018
    Assignee: Hexagon Metrology, Inc.
    Inventors: Jonathan J. O'Hare, Stephen Darrouzet
  • Patent number: 9857319
    Abstract: The method of an embodiment includes the steps of: obtaining a first rocking curve with respect to a wafer obtained using an X-ray diffraction device; setting an X-ray incident angle range having a higher intensity than a reference level in the first rocking curve, calculating an inter-plane spacing for the set X-ray incident angle, calculating a strain value of the wafer using the calculated inter-plane spacing, and calculating sampled strain values on the basis of the calculated strain value; modeling a thickness according to the degree of damage of the wafer on the basis of the intensities of X-ray diffraction beams corresponding to the sampled strain values; obtaining a second rocking curve on the basis of the set X-ray incident angle range, the calculated inter-plane spacing, the sampled strain values and the modeled thickness; matching the second rocking curve to the first rocking curve by changing at least one of the X-ray incident angle range, the inter-plane spacing, the sampled strain values and the
    Type: Grant
    Filed: August 12, 2014
    Date of Patent: January 2, 2018
    Assignee: LG SILTRON INCORPORATED
    Inventor: Kyu Hyung Lee
  • Patent number: 9683949
    Abstract: A method for quantitatively assessing a quality of a weld joint includes positioning an electromagnetic radiation source adjacent the weld joint. The electromagnetic radiation source may be aligned to direct a beam of electromagnetic radiation onto the weld joint. A detector for capturing the electromagnetic radiation emitted from the electromagnetic radiation source may be positioned adjacent the weld joint along a side opposite the electromagnetic radiation source, such that the weld joint is positioned between the electromagnetic radiation source and the detector. A radiographic image of the weld joint may be obtained by directing the beam of electromagnetic radiation toward the weld joint and onto the detector. A weld joint quality rating may be determined for the weld joint based at least in part on the radiographic image.
    Type: Grant
    Filed: January 30, 2015
    Date of Patent: June 20, 2017
    Assignee: TOYOTA MOTOR ENGINEERING & MANUFACTURING NORTH AMERICA, INC.
    Inventors: Gary Lee, Jason David Hind, William Brad Cheeseman
  • Patent number: 9484178
    Abstract: The target includes a target layer configured to be irradiated with an electron to generate an X-ray and a support substrate configured to support the target layer. The support substrate includes a polycrystalline diamond and includes multiple structure planes having different area densities of plane orientations from one another. The target layer is supported by the support substrate at a structure plane with a smaller area density of the {101} plane than the area density of the {100} plane and the area density of the {111} plane.
    Type: Grant
    Filed: April 15, 2015
    Date of Patent: November 1, 2016
    Assignee: Canon Kabushiki Kaisha
    Inventors: Shuji Yamada, Tadayuki Yoshitake, Yoichi Ikarashi, Takao Ogura, Takeo Tsukamoto
  • Patent number: 9470740
    Abstract: Quality control testing for a batch of electronic modules. A series of tests are performed on manufactured electronic modules, including tests sensitive to the failure rate of previously tested modules. Specifically, a first test comprised of two phases is performed on the module batch. Further screening is then performed responsive to detection of a wire sweep failure in a subset of failed modules from the first test phase. The further screening is on modules that passed the first test phase and excludes modules that failed the first test phase.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: October 18, 2016
    Assignee: International Business Machines Corporation
    Inventors: Stephen Peter Ayotte, Michael Russell Uy Gonzales, Mark Tiam Weng Lam
  • Patent number: 9360438
    Abstract: The present invention relates to a method for radiographically inspecting a component by means of X-rays, where at least one component surface to be radiographed is provided with a surface structure, with at least the surface provided with the surface structure being smoothed by means of a smoothing material to level out the surface structure, with at least one organic compound and at least one metal powder being used as smoothing material, with the X-ray absorption behavior of the smoothing material essentially equaling the X-ray absorption behavior of the material of the component, as well as to a smoothing material for carrying out the method in accordance with Claim.
    Type: Grant
    Filed: August 9, 2011
    Date of Patent: June 7, 2016
    Assignee: Rolls-Royce Deutschland Ltd & Co KG
    Inventors: Karl Schreiber, Josef Geitner
  • Patent number: 9341546
    Abstract: An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.
    Type: Grant
    Filed: January 13, 2009
    Date of Patent: May 17, 2016
    Assignee: GE SENSING & INSPECTION TECHNOLOGIES GMBH
    Inventors: Ingo Stuke, Til Florian Guenzler, Michael Wuestenbecker, Jan Kraemer, Holger Lux, Nicolas Bretzke
  • Patent number: 9330493
    Abstract: There is described a method for generating a 3D representation of an object, the method comprising retrieving a 3D structure representative of the object and comprising a plurality of voxels each having a respective position therein, each one of the voxels being shaped to mimic a shape of at least a portion of a potential internal feature for the respective position; receiving a densitometry measurement comprising densitometry data of the object; assigning a density value to each one of the voxels using the received densitometry data, thereby generating a 3D model of the object; and outputting the 3D model.
    Type: Grant
    Filed: December 15, 2011
    Date of Patent: May 3, 2016
    Assignee: FPINNOVATIONS
    Inventor: Gary Stephen Schajer
  • Patent number: 9322789
    Abstract: A method is provided for feeding-in X-ray fluoroscopy images of an object in the context of a digital laminography technique, in which the X-ray fluoroscopy images are not fed in at 360°, but a feed-in of first X-ray fluoroscopy images takes place at 180° and, after tilting the object, a feed-in of second X-ray fluoroscopy images follows in the same angular range of 180°. The second X-ray fluoroscopy images, after suitable reflection onto the complementary points, are set to the first X-ray fluoroscopy images and, from the resultant complete data set, a calculation is carried out in the context of the digital laminography technique. A multiaxis manipulator system is used for feeding-in X-ray fluoroscopy images in the context of carrying out a digital laminography technique on an object, which is secured on a fixing device of the manipulator system.
    Type: Grant
    Filed: July 5, 2013
    Date of Patent: April 26, 2016
    Assignee: YXLON INTERNATIONAL GMBH
    Inventor: Martin Muenker
  • Patent number: 9042516
    Abstract: A system comprises a structure having particles embedded at a level within the structure, and X-ray imaging apparatus for capturing images of the particles at the level.
    Type: Grant
    Filed: October 9, 2012
    Date of Patent: May 26, 2015
    Assignee: The Boeing Company
    Inventors: James A. Grossnickle, Robert B. Greegor
  • Publication number: 20150131779
    Abstract: With an image processing device (20), the presence/absence of a product defect is judged based on detected-image data obtained by a radiographic device that detects radiation that has passed through a product, which is an inspection subject. With the image processing device (20), a position of a product feature in the detected-image data is identified based on a shape of the product feature indicated by feature data stored in a DB storage portion (36) in advance, defect candidates are extracted with reference to the identified product feature in the detected-image data, and the presence/absence of a product defect is judged based on characteristic quantities of product defects indicated by the defect characteristic DB stored in the DB storage portion (36) in advance and characteristic quantities of the defect candidates.
    Type: Application
    Filed: June 7, 2013
    Publication date: May 14, 2015
    Inventors: Kiichi Sugimoto, Yosuke Fujitomi, Tsuyoshi Tomita, Atsushi Kiya, Akemi Takano, Hidenori Takeda
  • Patent number: 9031188
    Abstract: A system for the inspection of the internal structure of a target includes at least one x-ray source that emits collimated x-rays to irradiate the target. At least one detector is positioned to detect backscatter x-rays from the target. The detector may include a collimation slot that limits the field of view of the detector. The target may be a railway component and the system may inspect the internal structure of the component as it is moved along the railway by a vehicle. The system may detect a change in the density of a target based on a comparison of the detected backscatter x-rays. The use of a plurality of segmented backscatter x-ray detectors having a collimation slot may pixelate the internal image in the direction of the collimation slot.
    Type: Grant
    Filed: February 7, 2013
    Date of Patent: May 12, 2015
    Assignee: Georgetown Rail Equipment Company
    Inventors: Jeb Belcher, Charles Wayne Aaron
  • Publication number: 20150110244
    Abstract: An X-ray inspection apparatus including: a transmission type X-ray source including an electron emission source configured to emit an electron beam, and a transmission type target; a collimator provided with a plurality of slits formed therein, each slit configured to form a fan beam X-ray by allowing the X-ray radiation emitted from the transmission type X-ray source to pass therethrough; a plurality of detectors arranged at positions where the fan beam X-rays passed through the plurality of slits respectively are irradiated, each of the plurality of detectors configured to detect intensity of the fan beam X-ray passed through a corresponding slit; and a conveying portion configured to convey a sample along a conveying path crossing an irradiation path from each of the collimators to corresponding detector so that the sample is irradiated in sequence with the fan beam X-rays passed through the plurality of slits.
    Type: Application
    Filed: October 16, 2014
    Publication date: April 23, 2015
    Inventors: Kazuya Tsujino, Kazuyuki Ueda
  • Publication number: 20150103974
    Abstract: An X-ray source is disposed and a detector is disposed adjacent to the X-ray source. A test specimen holder is disposed between the X-ray source and the detector. A filter is disposed between the X-ray source and the test specimen holder. The filter has a plate-shaped semiconductor, a granular semiconductor, or a combination thereof.
    Type: Application
    Filed: August 8, 2014
    Publication date: April 16, 2015
    Inventors: SANG-YOUNG KIM, KYUNG-SOO RHO, HO-JEONG MOON, HYUCK SHIN, SUN-NYEONG JUNG
  • Patent number: 9008266
    Abstract: In a testing device (10) for determining the quality of leather (9) in the production of leather, wherein the testing device (10) is formed for examining a quality category of the leather (9) and for delivering a quality value characterizing the leather (9) in regard to its quality category, the testing device (10) comprises screening means (16) for examining the homogeneity of the leather (9) auf, which may screen at least portions (22, 23, 24, 27, 29) of the leather (9) and which are formed for delivering screening data (D) to analysis means (19), and wherein there are formed analysis means (19) for comparing the screening data (D) with feature data typical for hide injuries or inhomogeneities, respectively, of the leather (9) and for classifying determined hide injuries of examined portions (22, 23, 24, 27, 29) of the leather (9) and wherein there are formed display means (20) for display the categorized hide injuries or quality value, respectively, of the leather (9), preferably per portion (22, 23, 24, 2
    Type: Grant
    Filed: December 23, 2010
    Date of Patent: April 14, 2015
    Assignee: Wollsdorp Leder Schmidt & Co. Ges.m.b.H
    Inventors: Georg Kraus-Guentner, Elisabeth Kraus-Guentner