Tool, Workpiece, Or Mechanical Component Inspection Patents (Class 382/152)
  • Publication number: 20110069878
    Abstract: An optical inspection system is provided for inspecting a workpiece including a feature to be inspected. The system includes a workpiece transport configured to transport the workpiece in a nonstop manner. An illuminator is configured to provide a first strobed illumination field type and a second strobed illumination field type. The illuminator includes a light pipe having a first end proximate the feature, and a second end opposite the first end and spaced from the first end. The light pipe also has at least one reflective sidewall. The first end has an exit aperture and the second end has at least one second end aperture to provide a view of the feature therethrough. An array of cameras is configured to digitally image the feature. The array of cameras is configured to generate a first plurality of images of the feature with the first illumination field and a second plurality of images of the feature with the second illumination field.
    Type: Application
    Filed: September 21, 2010
    Publication date: March 24, 2011
    Inventors: Steven K. Case, Beverly Caruso, Carl E. Haugan, Steven A. Rose, David M. Kranz
  • Patent number: 7899573
    Abstract: A system and method for inspecting a machined surface. The method includes acquiring optical information of the machined surface from a predefined orientation. Further, the method includes comparing one or more parameters of the optical information with a corresponding one or more reference parameters. Furthermore, the method includes assessing a quality of the machined surface based on the comparison.
    Type: Grant
    Filed: June 16, 2008
    Date of Patent: March 1, 2011
    Assignee: GM Global Technology Operations LLC
    Inventors: John S. Agapiou, Phillip K Steinacker
  • Patent number: 7889911
    Abstract: An image processing apparatus for wafer inspection tool that is able to perform continuously cell to cell comparison inspection, die to die comparison inspection, and cell-to-cell and die-to-die hybrid comparison inspection, employing a plurality of processors. This image processing apparatus for wafer inspection tool comprises a plurality of processors for performing parallel processing, means for cutting out image data including a forward end overlap and a rear end overlap at partition boundaries in order to cut serial data into a predetermined image size, means for distributing the cutout image data to the plurality of processors, and means for assembling results of processing performed by the plurality of processors. The forward end overlap is set greater than a pitch of the cell subject to cell to cell comparison inspection.
    Type: Grant
    Filed: July 10, 2008
    Date of Patent: February 15, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Michio Nakano, Shigeya Tanaka, Yoshiyuki Momiyama, Takashi Hiroi, Kazuya Hayashi, Dai Fujii, Takako Fujisawa, Atsushi Ichige, Ichiro Kawashima
  • Patent number: 7889907
    Abstract: A system for inspecting a composite material laid onto a substrate by a lamination machine. An imaging assembly attached to a rear portion of a delivery head of the machine obtains an image of at least a portion of the laid material beneath the imaging assembly. A processor inspects the image to detect a flaw. This system can provide an image of laid tape obtained close to a tape compaction point and can be implemented as a retrofit or as original equipment in lamination machines.
    Type: Grant
    Filed: January 12, 2005
    Date of Patent: February 15, 2011
    Assignee: The Boeing Company
    Inventors: Roger W Engelbart, Reed Hannebaum, Brian S Hensley, Timothy T Pollock, Samuel D Orr
  • Publication number: 20110017381
    Abstract: An apparatus and method are provided for performing, on-the-fly, real time inspection of a composite structure formed by an automated fiber placement machine, through comparison of a visual image of at least a portion of the composite structure to a virtual image of the composite structure. Proper formation of the structure, and/or anomalies within the structure, are determined by comparing the visual image to the virtual image. The automated fiber placement machine, and/or tooling upon which the fiber is placed, are manipulated, and a visual indicator are provided to facilitate inspection and/or repair of any detected anomalies during fabrication of the composite structure.
    Type: Application
    Filed: October 5, 2010
    Publication date: January 27, 2011
    Applicant: INGERSOLL MACHINE TOOLS, INC.
    Inventor: Tino Oldani
  • Patent number: 7860601
    Abstract: A system and method are disclosed for quickly characterizing the profile of a surface of a processed workpiece using a non-contact scanner, such as a laser scanner, in preparation for subsequent machining. The method determines the location of a plurality of features of a processed workpiece on a machine tool, and includes steps of reading a first list of approximate feature locations, defining a scan path based on the first list, scanning a profile of the workpiece along the scan path and calculating an actual location of each feature of the plurality of features based on the profile. The system and method are well suited to determine the location of features such as holes in welder header boxes.
    Type: Grant
    Filed: December 13, 2007
    Date of Patent: December 28, 2010
    Assignee: Quickmill, Inc.
    Inventors: David C. Piggott, Andy Chik Hung Wong
  • Publication number: 20100312370
    Abstract: Methods and systems are provided to improve design, manufacture and performance of oilfield equipment and well tools using three dimensional (3D) scanning technology and one or more feedback loops. Manufacturing processes and techniques associated with a well tool may be evaluated based on comparing “as built” 3D data with a design data file for the well tool. Based on differences between “as built” 3D data and the design data file, one or more changes in associated manufacturing procedures and/or technique may be made. Computational fluid dynamic applications may be used to simulate fluid flow characteristics of a well tool using associated design data file, “as built” 3D data and/or after use 3D data. The associated design data file, manufacturing procedures and/or procedures for use of the well tool may be modified based on comparing simulated fluid flow data with desired fluid flow characteristics for the well tool.
    Type: Application
    Filed: November 26, 2008
    Publication date: December 9, 2010
    Inventors: William H. Lind, Kevin L. Glass
  • Patent number: 7844103
    Abstract: An automated optical inspection system includes a pulsed light source illuminating an article to be inspected thereby to generate at least one image thereof, at least one camera having a field of view, and a relative motion provider operative to provide relative motion between the camera and at least one image of at least a portion of the article. The relative motion provider may include a first continuous motion provider and a second, velocity-during-imaging-lessening motion provider. The relative motion is a superposition of a first continuous component of motion provided by the first motion provider and a second, smaller component of motion provided by the second motion provider which lessens the velocity of the at least one image relative to the camera, during imaging.
    Type: Grant
    Filed: October 12, 2006
    Date of Patent: November 30, 2010
    Assignee: Applied Materials Israel, Ltd.
    Inventor: Ehud Tirosh
  • Patent number: 7839404
    Abstract: A method and system of increasing the speed of a ray-casting algorithm for producing direct volume rendering images in the melt-through interaction mode. Since the viewing direction is not changed during a melt-through interaction, it is possible to reuse the samples calculated along each ray from one frame to another. The samples along each ray are partitioned into different groups, and the samples within each partition can be composited to generate an RGBA-tuple (Red Green Blue and Alpha, which is an opacity factor) for the partition. The associative property of the composition operation allows computation of the final RGBA value for each ray by compositing the RGBA-values of the partitions, instead of compositing the RGBA-values of each sample along the ray.
    Type: Grant
    Filed: June 27, 2007
    Date of Patent: November 23, 2010
    Assignee: Siemens Medical Solutions USA, Inc.
    Inventors: Udeepta D. Bordoloi, Lining Yang, Min Xie, Gabriel Artaud
  • Patent number: 7835567
    Abstract: An apparatus and method are provided for performing, on-the-fly, real time inspection of a composite structure formed by an automated fiber placement machine, through comparison of a visual image of at least a portion of the composite structure to a virtual image of the composite structure. Proper formation of the structure, and/or anomalies within the structure, are determined by comparing the visual image to the virtual image. The automated fiber placement machine, and/or tooling upon which the fiber is placed, are manipulated, and a visual indicator are provided to facilitate inspection and/or repair of any detected anomalies during fabrication of the composite structure.
    Type: Grant
    Filed: January 23, 2007
    Date of Patent: November 16, 2010
    Assignee: Ingersoll Machine Tools, Inc.
    Inventor: Tino Oldani
  • Publication number: 20100284603
    Abstract: A manufacturing process for sheet or shaped work products includes advancing the work product in a direction along a processing path; establishing a reference line with respect to the processing path; capturing visual data related to the work product; converting the visual data into a pixel array; and setting a predetermined line of pixels to correspond with the reference line.
    Type: Application
    Filed: June 22, 2010
    Publication date: November 11, 2010
    Inventor: Major K. Howe
  • Publication number: 20100278417
    Abstract: The automated testing device contains a platform, a rotational plate on a top side of the platform, and, around the rotational plate and along a rotating direction of the rotational plate, an uploading member, a guiding member, an optical testing member, and an unloading member are provided and located in this sequence. The uploading member places fasteners in an upright manner on the top side of the rotational plate. The guiding member aligns the upright fasteners along a specific path. The optical testing member obtains and examines at least a profile image of each fastener. The unloading member screens out substandard fasteners and collects those qualified fasteners out of the rotational plate.
    Type: Application
    Filed: April 30, 2009
    Publication date: November 4, 2010
    Inventor: YEA-YIH YANG
  • Publication number: 20100278418
    Abstract: A method for measuring errors of workpieces by comparing a three-dimensional model and the workpieces manufactured according to the three-dimensional model is provided. The method converts a point cloud of each workpiece to a measured triangular mesh model, and aligns each measured triangular mesh model to the three-dimensional model. The method further compares each measured triangular mesh model with the three-dimensional model to check for differences between two model so as to obtain errors of each workpiece, and generates one or more analysis reports according to the errors of each workpiece.
    Type: Application
    Filed: October 21, 2009
    Publication date: November 4, 2010
    Applicants: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: CHIH-KUANG CHANG, XIN-YUAN WU, HUA HUANG
  • Patent number: 7822263
    Abstract: Systematic use of infrared imaging characterizes marks made on items and identifies the particular marking tool with better accuracy than use of visual imaging. Infrared imaging performed in total darkness eliminates shadows, glint, and other lighting variations and artifacts associated with visible imaging. Although normally used to obtain temperature measurements, details in IR imagery result from emissivity variations as well as thermal variations. Disturbing an item's surface texture creates an emissivity difference producing local changes in the infrared image. Identification is most accurate when IR images of unknown marks are compared to IR images of marks made by known tools. However, infrared analysis offers improvements even when only visual reference images are available.
    Type: Grant
    Filed: October 13, 2009
    Date of Patent: October 26, 2010
    Inventor: Francine J. Prokoski
  • Publication number: 20100266197
    Abstract: What is disclosed is a novel system and method for determining which hole punch die is installed on a multifunction document reproduction device. A document scanner of a document reproduction system is used to scan a sample page that has been hole-punched by the presently installed punch die. The pattern of die holes on the punched test page is examined and compared to known punch die patterns. The method compares the current punch unit with bindings loaded in a hopper for the print/copy job. Information about the currently installed hole punch die is displayed on a graphical user interface so the user can confirm the print/copy job prior to the time of submission. The user can then accept the current hole punch configuration or change the unit to another before releasing their print/copy job. The method ensures that the selected punch pattern is compatible with other print/copy job finishing selections.
    Type: Application
    Filed: April 15, 2009
    Publication date: October 21, 2010
    Applicant: Xerox Corporation
    Inventor: J. FREDERICK WHITING
  • Patent number: 7817847
    Abstract: A robot system having a vision sensor. The robot system includes a robot; a robot controlling section for controlling an operation of the robot; an imaging section provided on the robot and obtaining image data of a working environment of the robot; an image processing section for processing the image data obtained in the imaging section; a vision controlling section for controlling the imaging section and the image processing section to cause execution of obtaining the image data, transmitting the image data thus obtained, and processing the image data; and a communication network to which the robot controlling section, the image processing section and the vision controlling section are connected.
    Type: Grant
    Filed: October 5, 2005
    Date of Patent: October 19, 2010
    Assignee: Fanuc Ltd
    Inventors: Yoshiki Hashimoto, Minoru Enomoto
  • Patent number: 7813537
    Abstract: Myocardial tissue tracking techniques are used to project or guide a single manually-defined set of myocardial contours through time. Displacement encoding with stimulated echoes (DENSE), harmonic phase (HARP) and speckle tracking is used to encode tissue displacement into the phase of complex MRI images, providing a time series of these images, and facilitating the non-invasive study of myocardial kinematics. Epicardial and endocardial contours need to be defined at each frame on cine DENSE images for the quantification of regional displacement and strain as a function of time. The disclosed method presents a novel and effective two dimensional semi-automated segmentation technique that uses the encoded motion to project a manually defined region of interest through time. Contours can then easily be extracted for each cardiac phase.
    Type: Grant
    Filed: May 14, 2007
    Date of Patent: October 12, 2010
    Assignees: Siemens Medical Solutions USA, Inc., University of Virginia Patent Foundation, University of Cape Town
    Inventors: Frederick H Epstein, Ernesta M Meintjes, Bruce S Spottiswoode
  • Publication number: 20100239964
    Abstract: Test structures and methods for semiconductor devices, lithography systems, and lithography processes are disclosed. In one embodiment, a method of manufacturing a semiconductor device includes using a lithography system to expose a layer of photosensitive material of a workpiece to energy through a lithography mask, the lithography mask including a plurality of first test patterns having a first phase shift and at least one plurality of second test patterns having at least one second phase shift. The layer of photosensitive material of the workpiece is developed, and features formed on the layer of photosensitive material from the plurality of first test patterns and the at least one plurality of second test patterns are measured to determine a optimal focus level or optimal dose of the lithography system for exposing the layer of photosensitive material of the workpiece.
    Type: Application
    Filed: June 2, 2010
    Publication date: September 23, 2010
    Inventor: Sajan Marokkey
  • Patent number: 7783100
    Abstract: An apparatus and method for inspecting and analyzing welded structures includes a laser for directing at least one beam of light at a weld bead to define at least one visible profile line; a camera directed at the weld bead for capturing an image of the at least one profile line and generating a usable image signal based on the image; and a preprogrammed microprocessor assembly configured for receiving the usable image signal and processing the signal as an image to determine a dimension of the weld bead defined along the at least one profile line and comparing the dimension of the weld bead with a predetermined dimension set point to determine the quality of the weld bead.
    Type: Grant
    Filed: March 21, 2007
    Date of Patent: August 24, 2010
    Assignee: Topy America, Inc.
    Inventors: Stephen Byington, Keith Carpenter
  • Patent number: 7769230
    Abstract: A method of processing an array of pixels captured by an image capture device, includes providing a first two-dimensional array having first and second groups of pixels wherein pixels from the first group of pixels have narrower spectral photoresponses than pixels from the second group of pixels and wherein the first group of pixels has individual pixels that have spectral photoresponses that correspond to a set of at least two colors and the placement of the first and second groups of pixels define a pattern that has a minimal repeating unit arranged to permit the reproduction of a captured color image under different lighting conditions; responding to ambient lighting conditions, whether panchromatic pixels are to be combined with color pixels; combining pixels to produce a second two-dimensional array of pixels which has fewer pixels than the first two-dimensional array of pixels; and correcting the color pixels.
    Type: Grant
    Filed: November 30, 2006
    Date of Patent: August 3, 2010
    Assignee: Eastman Kodak Company
    Inventors: Bruce H. Pillman, Michele O'Brien, John F. Hamilton, Jr., Amy D. Enge, Thomas E. DeWeese
  • Patent number: 7764823
    Abstract: A system and method for automatically detecting cracks in components produced by a stamping process. A substantially uniform backlighting of the component can be produced, even when direct backlighting is partially blocked by structure used to support the component during inspection. One or more image detectors simultaneously image the component from a top side while it is backlit. One or more images of the current component are then compared to a master image of the component. Light passing through or visible through cracks in the component will cause the system to see a difference between the current image(s) of the component and the master image(s), thereby indicating a crack(s). A user is automatically notified upon detection of a crack.
    Type: Grant
    Filed: February 16, 2007
    Date of Patent: July 27, 2010
    Assignee: Honda Motor Co., Ltd.
    Inventors: Milan Jurich, Molly Hamilton, Shaun McCann
  • Patent number: 7760090
    Abstract: An apparatus for monitoring an access portal through an enclosure around a hazard comprises a line-scan camera mounted above the portal so that its linear field of view extends along a generally opposite threshold of the portal and can detect electromagnetic radiation reflected from an object passing through the portal. The apparatus distinguishes signals from the camera corresponding to items that are intended to pass through the portal for example on a conveyor from signals corresponding to items, particularly intruders that are not intended to pass through the portal. The apparatus preferably comprise an elongate sodium discharge lamp mounted above the portal and provided with a reflector so that monochromatic light therefrom is concentrated in a narrow strip extending along the threshold and the camera is sensitive only to this monochromatic light.
    Type: Grant
    Filed: July 25, 2005
    Date of Patent: July 20, 2010
    Assignee: R.W.L. Consultants Limited
    Inventor: Richard Walter Lea
  • Patent number: 7760930
    Abstract: The present disclosure provides a system and method for recognizing a defect image associated with a semiconductor substrate. In one example, the method includes collecting defect data of the defect image by testing and measuring the semiconductor substrate, extracting a pattern from the defect data, normalizing a location, orientation, and size of the pattern, and identifying the pattern after the pattern is normalized.
    Type: Grant
    Filed: February 21, 2006
    Date of Patent: July 20, 2010
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chen-Ting Lin, Chih-Cheng Chou, Chih-Hung Wu, Chia-Hua Chang
  • Patent number: 7756318
    Abstract: A mask/reticle pattern inspection apparatus capable of readily detecting local critical dimension (CD) errors of a circuit pattern of a testing workpiece is disclosed. This apparatus includes a search unit for finding a plurality of resembling or “look-alike” adjacent patterns around a specific pattern on the workpiece, which have similarity to the specific pattern. The inspection apparatus also includes a calculation unit for obtaining dissimilarity between the specific pattern and look-alike adjacent pattern, a variation evaluation unit which excludes an allowable error from the dissimilarity to thereby obtain a local CD error criterion value, and a CD error decision unit for determining the presence of a local CD error when the criterion value exceeds a threshold value in case the distance between the specific and look-alike patterns increases. A pattern inspection method is also disclosed.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: July 13, 2010
    Assignee: Advanced Mask Inspection Technology Inc.
    Inventor: Yuichi Nakatani
  • Patent number: 7756321
    Abstract: Shims used to join part assemblies are automatically designed and fabricated without the need for fitting part assemblies together in order to determine the exact dimensions of voids filled by the shims. The locations of key features on part assemblies are surveyed using a merged photogrammetry and laser tracking technique that generate the dimensions of a virtual shim. The dimensions of the virtual shim are contained in a digital file that can be used to automatically fabricate the shim using automated fabrication equipment such as a CNC machining center. The automated virtual shim design may be modified to reflect the effect of part assembly fit on performance characteristics of the aircraft.
    Type: Grant
    Filed: February 28, 2007
    Date of Patent: July 13, 2010
    Assignee: The Boeing Company
    Inventors: Bobby J. Marsh, Thomas Vanderwiel, Kinson VanScotter, Michael Thompson
  • Patent number: 7751612
    Abstract: An occlusionless scanner for sequentially scanning a series of workpieces translating in a downstream flow direction wherein the workpieces flow sequentially to the scanner on an infeed conveyor and sequentially from the scanner on an outfeed conveyor and across an interface between the infeed conveyors and the outfeed conveyors wherein scanner cameras are mounted so as to not interfere with one another nor to interfere with the conveyors to provide for the gathering of individual partial images of the workpiece by the individual scanner cameras so as to allow a processor to assemble a collective image of the partial images.
    Type: Grant
    Filed: October 10, 2006
    Date of Patent: July 6, 2010
    Assignee: USNR/Kockums Cancar Company
    Inventors: Lyle Baker, Carl Flatman
  • Patent number: 7751611
    Abstract: An appearance inspection apparatus for inspecting a board is provided with multiple imaging units for capturing respective images of the board. Multiple slave personal computers respectively provided for the multiple imaging units inspect the board by referring to data of images of the board captured by the respective imaging units. Each of the multiple slave personal computers transmits, to other slave personal computers, shared data that are necessary for inspection by other slave personal computers. The shared data is acquired by each of the slave personal computers from data of an image of the inspection piece captured by an associated imaging unit. Each of the slave personal computers inspects an appearance of the board by referring to the shared data received from another slave personal computer.
    Type: Grant
    Filed: December 22, 2005
    Date of Patent: July 6, 2010
    Assignee: Saki Corporation
    Inventors: Yoshihiro Akiyama, Yong Yang, Sakie Akiyama
  • Patent number: 7747080
    Abstract: An exemplary method for edge scan of an image is provided. The method includes: setting parameters of an image edge scan; setting parameters for scanning edges of the workpiece; obtaining an image of the workpiece; processing the image and designating a point in the image; searching a first edge point near the designated point in a clockwise direction, wherein there is at least one point adjacent to the first edge point whose color is different with the color of the first edge point; searching other edge points in the manner of searching the first edge point by utilizing a recursive method; calculating coordinates of initial points and end points of scan lines according to the parameters, and searching scanned points according to the initial points and end points on the image that has not been processed; scanning edges of the image based on the scanned points. A related system is also provided.
    Type: Grant
    Filed: December 28, 2006
    Date of Patent: June 29, 2010
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Chih-Kuang Chang, Xiao-Chao Sun, Li Jiang
  • Patent number: 7747065
    Abstract: A manufacturing process for sheet or shaped work products includes advancing the work product in a direction along a processing path; establishing a reference line with respect to the processing path; capturing visual data related to the work product; converting the visual data into a pixel array; and setting a predetermined line of pixels to correspond with the reference line.
    Type: Grant
    Filed: September 13, 2005
    Date of Patent: June 29, 2010
    Inventor: Major K. Howe
  • Patent number: 7747066
    Abstract: Height attributes of features of an object having a plurality of physical features thereon is determined by illuminating the features of the object at a low angle and capturing the reflected light at a camera mounted along the z-axis perpendicular to the object. The reflected light from the features is analyzed to determine if any of the features is of an unacceptable height. The reflected light being either brighter or dimmer than the average determines that the corresponding feature is higher or lower respectively than the average feature.
    Type: Grant
    Filed: March 15, 2006
    Date of Patent: June 29, 2010
    Assignee: International Business Machines Corporation
    Inventor: Vincent P. Mulligan
  • Publication number: 20100158349
    Abstract: A gear inspection system and method for a gearbox, wherein an image acquisition unit is oriented proximate the gearbox with a field of view of a section of the gears. The image acquisition unit obtains images of a gear tooth and corresponding contact pattern. In one embodiment a processing unit transforms the images to a gear tooth model so that the gear tooth image and contact pattern image matches the model gear tooth. Metrics are computed for the contact pattern, and based on threshold values, a determination is made as to whether the gearbox is acceptable.
    Type: Application
    Filed: December 23, 2008
    Publication date: June 24, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Sheri George, Sivaramanivas Ramaswamy, Abhinav Ramnath Bajpai
  • Publication number: 20100158350
    Abstract: The invention relates to an apparatus rating a monitoring element to which is or was applied a dye penetrant procedure and which is fitted with at least one artificial defect in the form of at least one indentation, the apparatus including an image recorder generating an image of at least parts of the monitoring element, said parts comprising at least portions of the minimum of one artificial defect, said apparatus including an image analyzer rating the image generated by the image recorder, and to a corresponding method.
    Type: Application
    Filed: May 19, 2008
    Publication date: June 24, 2010
    Applicant: ILLINOIS TOOL WORKS, INC.
    Inventor: Thomas Vetterlein
  • Patent number: 7738694
    Abstract: The present invention provides a method of calibrating a fuel nozzle patternation system. The method includes testing a master nozzle having desired spray characteristics in the system to determine a virtual origin of the system and then using the virtual origin to replace a fixed spatial origin of the system for testing other nozzles of the same nozzle family.
    Type: Grant
    Filed: March 23, 2006
    Date of Patent: June 15, 2010
    Assignee: Pratt & Whitney Canada Corp.
    Inventors: Lev Alexander Prociw, Harris Shafique, Patrice Fiset
  • Patent number: 7734102
    Abstract: A system for screening cargo containers is provided including an image generation device, an apparatus for screening cargo containers and an output module. The image generation device generates an image signal conveying information related to the contents of the cargo container. The apparatus receives the image signal and a list of objects conveying objects expected to be present in the cargo container. A processing unit processes the image signal in combination with the list of objects and a group of target images associated with objects to derive mismatch information data. The mismatch information data conveys at least one distinction between the list of objects and the information related to the contents of the cargo container conveyed by the image signal. Information conveying the mismatch information data is released and conveyed to a user of the system by an output module.
    Type: Grant
    Filed: November 8, 2005
    Date of Patent: June 8, 2010
    Assignee: Optosecurity Inc.
    Inventors: Eric Bergeron, Luc Perron, Alain Bergeron
  • Patent number: 7734083
    Abstract: The present invention relates to a bendable printed board, an image pickup apparatus, and a camera. The bendable printed board is provided with: a first end connected to a moving body movable in an arbitral direction within a predefined plane; a second end connected to fixed body with slack providing movability to the moving body; and a slit formed on at least a part of a slack portion of the printed board.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: June 8, 2010
    Assignee: Konica Minolta Opto, Inc.
    Inventors: Tougo Teramoto, Masahiro Takashima
  • Publication number: 20100135571
    Abstract: In a measuring system, a method for evaluating parameters of a workpiece includes measuring a periodic structure, such as a grating, on the workpiece to produce image data. An orientation of features in the image data, produced by higher order diffractions from the periodic structure, is identified. An orientation of the periodic structure is determined based on the orientation of the features in the image data. The image data is then modified, based on the orientation of the periodic structure, to correlate with, and for comparison to, simulated image data to ascertain parameters of the workpiece. Alternatively, optical components in the measuring system, or the workpiece itself, are adjusted to provide a desired alignment between the optical components and the periodic structure. A microstructure on the workpiece may then be measured, and the resulting image data may be compared to the simulated image data to ascertain parameters of the microstructure.
    Type: Application
    Filed: January 28, 2010
    Publication date: June 3, 2010
    Applicant: NANOMETRICS INCORPORATED
    Inventors: Mike Littau, Darren Forman, Chris Raymond, Steven Hummel
  • Publication number: 20100118136
    Abstract: The invention concerns a device for inspecting a surface of a workpiece (1) comprising a processor for reading image data of the surface, wherein the image data comprises at least a bright field (B) and at least a dark field (D1). A portion (A) of the surface is in the image data in at least one position in the bright field. (B) and in at least a second position in the dark field (D1). The processor generates a result by comparing the portion (A) in the bright field (B) to the portion (A) in the dark field (D1) in order to find surface anomalies, and outputs the result using an outputting means. Furthermore, the invention concerns a surface inspection arrangement for inspecting a workpiece (1) comprising the device, and further comprising a light source (2), at least one image pick-up device (3) and means for transferring the image data from the image pick-up device (3) to the processor that reads image data.
    Type: Application
    Filed: June 13, 2007
    Publication date: May 13, 2010
    Inventors: Jan Arie Pieter van Riet, Jonas Hallbäck
  • Publication number: 20100119145
    Abstract: A method of automatically counting a number of inclusions by eliminating the effects of shrinkage cavities in the conventional method and securing a high correlation with a value measured by a skilled worker and a casting mold for obtaining a cast sample used for the same are provided. A method of measurement of a number of nonmetallic inclusions comprising capturing an image of a rectangular fracture surface of a cast sample consisting of an aluminum alloy by a CCD camera or other image capturing means, processing the image captured by the image capturing means for color density, digitalizing the processed image by a predetermined threshold value, and counting the number of pixel clusters of a predetermined size or more, the method characterized by detecting the end edges of the short sides of the rectangular fracture surface before the capturing of its image and automatically setting measurement regions of an area of ¼ to ? of the area of the fracture surface at the two ends of the fracture surface.
    Type: Application
    Filed: March 7, 2008
    Publication date: May 13, 2010
    Inventors: Mitsuyoshi Sato, Hiroshi Kawai, Yukio Kuramasu, Ryouji Abe
  • Patent number: 7715615
    Abstract: A test assembly is used to determine a characteristic of a separator sheet. The test assembly includes a source of light to illuminate at least a portion of the separator sheet. The test assembly also includes a vision inspection system to record at least one discrete image of the illuminated surface of the separator sheet and apply at least one test to the discrete image to determine the characteristic of the separator sheet.
    Type: Grant
    Filed: February 25, 2005
    Date of Patent: May 11, 2010
    Assignee: Busse/SJI Corporation
    Inventors: Jeff G. Van Nice, Dennis A. VanderHoeven, Brian E. Busse
  • Patent number: 7706912
    Abstract: An orifice formation system is provided. The system includes a manufacturing machine configured to form an orifice in a workpiece, a computed tomography x-ray machine configured to generate data based on geometry of the workpiece, and a computer in communication with the manufacturing machine and the computed tomography x-ray machine. The computer is configured to control the manufacturing machine based on the data generated by the computed tomography x-ray machine. A method of controlling formation of an orifice in a workpiece is also provided. The method includes acquiring computed tomography data about the workpiece, determining geometry of the workpiece based on the computed tomography data, and forming an orifice in the workpiece based on the determined geometry of the workpiece.
    Type: Grant
    Filed: November 30, 2007
    Date of Patent: April 27, 2010
    Assignee: Caterpillar Inc.
    Inventors: Marion B. Grant, Nien L. Lee
  • Patent number: 7702134
    Abstract: A method and apparatus for identifying 3-D coordinates of a target region on a tire includes: taking a digital image of a tire; finding an edge of a tire bead using pixel brightness values from the tire image; calculating tire bead circle center and radius using a plurality of image pixels on the tire bead edge; and performing a pixel brightness search around the bead circumference using the bead circle's center and radius to identify the target area X, Y coordinates. The Z-coordinate and slope of the target area are determined from multiple point distance calculations across the region.
    Type: Grant
    Filed: December 2, 2005
    Date of Patent: April 20, 2010
    Assignee: The Goodyear Tire & Rubber Company
    Inventor: Daniel McAllister, Jr.
  • Patent number: 7698010
    Abstract: The present invention provides methods, systems and computer program products for altering video images including superimposing objects onto the images, particularly addressed to identifying fastener insertion locations onto displayed images of a work pieces. The invention is capable of importing an image of a work piece contained in a computer file, displaying the image, and altering the displayed image and/or superimposing objects onto the image to show the location(s), sequence(s) and/or type(s) of fasteners to be inserted onto the displayed work piece according to operator input and instructions. After each insertion is completed, the display is again altered to show the completion. During use, the system is capable of tracking the fastener installations and updating the video display to show the current status of insertions on the work piece.
    Type: Grant
    Filed: September 29, 2005
    Date of Patent: April 13, 2010
    Assignee: Haeger, Inc.
    Inventors: Jeff Cannedy, Thomas Clark Boster
  • Patent number: 7693325
    Abstract: A system and methods for transprojection of geometry data acquired by a coordinate measuring machine (CMM). The CMM acquires geometry data corresponding to 3D coordinate measurements collected by a measuring probe that are transformed into scaled 2D data that is transprojected upon various digital object image views captured by a camera. The transprojection process can utilize stored image and coordinate information or perform live transprojection viewing capabilities in both still image and video modes.
    Type: Grant
    Filed: January 14, 2004
    Date of Patent: April 6, 2010
    Assignee: Hexagon Metrology, Inc.
    Inventors: Sandeep Pulla, Homer Eaton
  • Patent number: 7684054
    Abstract: A system and method are disclosed for inspecting a component having a length, a width, and an axis. The system includes a fixture for holding the component, a light source disposed on one side of the component, and an optical detector disposed on the other side of the component. In the preferred embodiment, the detector has a field of view wider than the width of the component, thereby enabling the detector to image a portion of the outer edges of the component. A translation stage is operative to move the light source and detector in unison along the length of the component and a processor, in communication with the detector and the translation stage, is operative to: a) receive electrical signals representative of the outer profile imaged by the detector; b) move the translation stage incrementally along the length of the component; and c) record the outer profile imaged by the detector at each increment and form a composite profile of the component.
    Type: Grant
    Filed: August 25, 2006
    Date of Patent: March 23, 2010
    Assignee: GII Acquisition, LLC
    Inventor: David Crowther
  • Patent number: 7679758
    Abstract: A method of optically inspecting a fastener to determine whether it meets two or more dimensional parameters is provided. The method includes using centrifugal force to place the fastener in a predetermined location. Two or more sets of image data of the fastener are generated from two or more corresponding different angles. Fastener pass/fail data is generated using a dimensional requirement associated with each set of image data.
    Type: Grant
    Filed: April 29, 2005
    Date of Patent: March 16, 2010
    Assignee: Microview Technologies PTE Ltd.
    Inventors: Wong Su Wei, Victor Vertoprakhov, Zhou Wensen, Noor Ashedah Binti Jusoh, Tian Poh Yew, Ah Kow Chin, Chee Leong Chua
  • Patent number: 7676078
    Abstract: An inspection method for an illumination optical system of an exposure tool includes coating a surface of an exposure target substrate with a resist film; placing a plurality of imaging components deviating from an optical conjugate plane of a surface of the resist film; generating a plurality of inspection patterns of the resist film having a plurality of openings, by projecting exposure beams output from a plurality of effective light sources onto the resist film via the imaging components; measuring one of the inspection patterns as a reference image, and processing the reference image so as to provide reference image data; and determining an abnormal inspection image by measuring inspection images of the inspection patterns and comparing a plurality of inspection image data provided by processing the inspection images with the reference image data.
    Type: Grant
    Filed: February 12, 2004
    Date of Patent: March 9, 2010
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Kazuya Fukuhara
  • Patent number: 7660457
    Abstract: A method for determining a change in position of an item of luggage, examined by a first examination system, in order to thereafter examine only a suspect region of the item of luggage in a secondary examination system.
    Type: Grant
    Filed: July 3, 2008
    Date of Patent: February 9, 2010
    Assignee: Morpho Detection, Inc.
    Inventors: Armin Uwe Schmiegel, Helmut Rudolf Strecker
  • Patent number: 7656445
    Abstract: By mounting a camera to rotate with a rotating component to be viewed it is possible to review the whole component illuminated by a light source. Generally the component will be specifically marked with target markings to highlight its profile to allow images produced by the camera to be compared for distortion and displacement. Such in situ monitoring arrangements also allow profiling of the surface, and by projection of a grid or matrix onto a component surface any distortion in that matrix is indicative of variations in the surface or through use of astigmatic techniques variations in the incident image pattern can be utilized in order to determine distance variations.
    Type: Grant
    Filed: June 12, 2006
    Date of Patent: February 2, 2010
    Assignee: Rolls-Royce PLC
    Inventor: Harold Heyworth
  • Patent number: 7643158
    Abstract: A method is presented that allows multiple devices for generating three dimensional surface models of moving objects to be used simultaneously. A timing pattern is used to control and trigger the devices in order to operate seven of the devices without interference. In one embodiment, a method of employing optical filters is also described that then allows operation of forty nine of the devices at the same time if the normal visible spectrum is to be used for simultaneous video acquisition. In another embodiment, if no simultaneous video acquisition is required, the optical filtering technique can support up to one hundred fifty four imaging devices operating simultaneously.
    Type: Grant
    Filed: October 4, 2006
    Date of Patent: January 5, 2010
    Assignee: Motion Analysis Corporation
    Inventor: Eugene J. Alexander
  • Patent number: 7636466
    Abstract: Apparatus for high resolution processing of a generally planar workpiece having microscopic features to be imaged, comprising a video camera acquiring at least two candidate images of a microscopic portion on generally planar workpiece; a motion controller operative to effect motion, relative to the workpiece, of at least an optical element of the video camera along an optical axis extending generally normally to a location on a surface of the workpiece, the video camera acquiring the at least two candidate images at selected time intervals, each of the at least two candidate images differing by at least one image parameter; an image selector operative to select an individual image from among the at least two candidate images according to predefined criteria of image quality; and a selected image analyzer operative to analyze at least a portion of the individual image selected by the image selector.
    Type: Grant
    Filed: January 11, 2006
    Date of Patent: December 22, 2009
    Assignee: Orbotech Ltd
    Inventors: Ofer Saphier, Raanan Adin, David Fisch