Abstract: A contact assembly for a testing system for testing integrated circuit devices is disclosed. The contact assembly includes a first blade, a second blade, and an elastomer configured to retain the first blade and the second blade. The first blade and the second blade are electrically conductive. The first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape when assembled. The elastomer is at least columnar in part and non-conductive.

Abstract: A socket assembly includes an electrical interconnect having an insulator having apertures. The electrical interconnect includes primary contacts and secondary contacts received in corresponding apertures. The primary contacts include a primary conductive polymer column having upper contact tips and lower contact tips for electrically interconnecting first and second electronic packages. The secondary contacts include a secondary conductive polymer column having upper contact tips and lower contact tips for electrically interconnecting the first and second electronic packages. The contact tips of the secondary conductive polymer columns have a different shape from the shape of the contact tips of the primary conductive polymer columns.

Abstract: A structure may include a first material, a second material joined to the first material at a junction between the first and second materials, and one or more media extending across the junction to form a continuous interconnect between the first and second materials, wherein the first and second materials are heterogeneous. The structure may further include a transition at the junction between the first and second materials. The one or more media may include a functional material which may be electrically conductive. The structure may further include a third material joined to the second material at a second junction between the second and third materials, the media may extend across the second junction to form a continuous interconnect between the first, second, and third materials, and the second and third materials may be heterogeneous.

Abstract: A conductive member includes a connection portion which is to be electrically connected to a cutaway portion of a metal plate. The connection portion includes a first arm portion extending from one end to another end and configured to come into contact with one face of two faces opposed to each other of the cutaway portion, a first bent portion connected to the another end of the first arm portion and bent extending from the another end toward the one end, a second bent portion connected to the first bent portion and bent getting closer toward the first arm portion as getting away from the first bent portion, and a third bent portion connected to the second bent portion and bent getting away from the first arm portion as getting away from the second bent portion so as to come into contact with another face of the two faces.

Abstract: A substrate includes, two first through-holes to which high-frequency signals are transmitted and which are arranged side by side so as to have a predetermined distance, and at least three reference potential second through-holes arranged side by side so as to have an distance smaller than the predetermined distance with respect to the two first through-holes. Among three of the second through-holes, one of the second through-holes is arranged in a region between the two first through-holes, and other two of the second through-holes are arranged in a region other than the region between the first through-holes such that one of the other two second through-holes is arranged side by side with respect to one of the two first through-holes, and the other of other two second through-holes is arranged side by side with respect to the other of the two first through-holes.

Abstract: Disclosed herein are microelectronic structures including bridges, as well as related assemblies and methods. In some embodiments, a microelectronic structure may include a substrate and a bridge.

Abstract: An electrical connector or electrical connector assembly that has a housing, a contact carrier, one or more spring members, and an interposer or contact system. The contact carrier is movable with respect to the housing between unmated and mated electrical positions.

Abstract: A workpiece referencing system, the system having a workpiece support assembly for supporting a plurality of workpieces, wherein the support assembly includes a support platform and a plurality of support members which are disposed to the support platform, each support member being configured to support an individual workpiece; and a workpiece referencing assembly for referencing the workpieces, as supported by the support assembly, to predetermined positions; wherein the support members each includes a body which includes a support surface which supports a workpiece and a resilient coupling which resiliently couples at least an upper part of the body relative to the support platform, such that the at least part of the body is displaceable relative to the support platform from a first, unbiased position to a second, biased reference position by operation of the referencing assembly, and, when released, the at least part of the body returns to the first, unbiased position.

Abstract: According to a certain embodiment, a pin plunger includes: a first contact member; a second contact member that faces the first contact member and is apart from the first contact member; a spring arranged between the first contact member and the second contact member; and a housing that houses the first contact member, the second contact member, and the spring. The housing comprises a bimetal inside or outside the housing. The bimetal comprises a first metal and a second metal, the first metal having a thermal expansion coefficient different from a thermal expansion coefficient of the second metal. The elastic force decreased or increased by contracting or expanding of the spring due to a temperature change is compensated with a warping force due to stretching of the first metal and the second metal.

Abstract: A flexible substrate includes a first area including a first circuit, the first circuit configured to be connectable to a first component, a second area including a second circuit, the second circuit configured to be connectable to a second component, a connecting area provided between the first area and the second area and including a third circuit, the third circuit connecting the first circuit and the second circuit, one or more first via conductors provided between the first area and the connecting area and electrically isolated from the first circuit, the second circuit, and the third circuit, and one or more second via conductors provided between the second area and the connecting area and electrically isolated from the first circuit, the second circuit, and the third circuit.

Abstract: The present disclosure discloses a test socket including an inelastic insulating housing formed of an inelastic insulating material having a plurality of housing holes, and a plurality of electro-conductive parts comprising electro-conductive particles in an elastic insulating material, the electro-conductive parts including an electro-conductive part body having a lower end portion to be connected to a signal electrode of the tester, an upper end portion to be connected to the terminal of the device under inspection, and an electro-conductive part bump connected to the electro-conductive part body to protrude from one or both of an upper and lower surface of the inelastic insulating housing.

Abstract: A connecting structure includes an insulation base, first pads, and second pads. The insulation base includes a first surface, a second surface, and a lateral surface connecting therebetween. First grooves are defined on the first surface, second grooves are defined on the second surface, third grooves are defined on the lateral surface. Each third groove connects one first groove and one second groove. The first pads are deposited in the first grooves. The second pads are deposited in the second grooves. Wiring portions are deposited in the third grooves, each wiring portion connects one first pad and one second pad. A conductive ink layer is coated on the first and the second pads. A protective ink layer is coated on the wiring portions and the insulating base except for the first and the second pads. The first and the second grooves are stepped grooves.

Abstract: Provided is a semiconductor package modularized and manufactured by preparing a main block for putting on a semiconductor chip, an insulator, and one or more sub block, preparing the semiconductor chip, preparing an adhesive used in attaching the semiconductor chip, attaching the semiconductor chip to an upper surface or upper and lower surfaces of the main block, performing an electrical connection of the semiconductor chip, preparing a substrate comprising a pattern enabling an electrical connection and vertically attaching one side of the main block to the pattern of the substrate to enable an electrical connection. In the semiconductor package above, an accumulation rate increases on the substrate due to a vertically arranged structure of the semiconductor chips and a heat emission area is enlarged to improve a heat emission effect.

Abstract: A connector includes a metal cylinder with three or more slots cut from a first end and three or more slots cut from a second end which are intercalated between the slots from the first end, whereby the connector is radially compressible along its entire length. The connector is adapted for insertion at one end into a hole in a circuit board, thereby making electrical contact to traces in the circuit board.

Abstract: The present disclosure provides a connector which is a combination of at least one power pin, one plastic member, and one signal pin, wherein the power pin includes a columnar metal block, each plastic member is connected to the columnar metal block at side surface, each signal pin is attached to a side surface of the plastic member, and extends to two bottom surfaces of the plastic member to form contact surfaces with predetermined areas on the two bottom surfaces; wherein, the contact surface on first bottom surface of the plastic member is flush with first bottom surface of the metal block, and the contact surface on second bottom surface of the plastic member is flush with second bottom surface of the metal block.

Abstract: An electronic apparatus includes a flexible printed circuit board having a main body on which wiring pattern is formed, a connector having a connection terminal connected to the wiring constituting the wiring pattern, and a base body on which the connection terminal is fixed, and a casing. The main body is attached to the casing to be movable, the flexible printed circuit board has an extension part protruding from the main body and extending along with a ground included in the wiring pattern, the extension part bends in the middle of extending to be capable of expansion and contraction, and has a mounting part fixed to the casing on the tip side thereof, the mounting part is provided with a ground terminal connected to the ground extended, and the ground terminal is electrically connected to the casing in the state that the mounting part is fixed to the casing.

Abstract: The invention provides a prepreg comprising: a primary prepreg composed of reinforcing fibers and a resin composition (I) impregnating the interior of a reinforcing fiber layer formed from these fibers; and a surface layer composed of a resin composition (II) formed on one or both sides of the primary prepreg; wherein the resin composition (I) is an epoxy resin composition [B] containing at least an epoxy resin and a thermoplastic resin, and the resin composition (II) is an epoxy resin composition [A] containing at least an epoxy resin and conductive particles.

Abstract: In an embodiment, a vehicle component comprises a thermoplastic element having a thermoplastic element first surface and a thermoplastic element second surface; a structural element defining an opening, wherein the structural element has a structural element first surface and a structural element second surface, wherein the thermoplastic element is in the opening; and an elastic anisotropic bonding element between the thermoplastic element second surface and the structural element first surface.

Abstract: The present disclosure provides a connector which is a combination of at least one power pin, one plastic member, and one signal pin, wherein the power pin includes a columnar metal block, each plastic member is connected to the columnar metal block at side surface, each signal pin is attached to a side surface of the plastic member, and extends to two bottom surfaces of the plastic member to form contact surfaces with predetermined areas on the two bottom surfaces; wherein, the contact surface on first bottom surface of the plastic member is flush with first bottom surface of the metal block, and the contact surface on second bottom surface of the plastic member is flush with second bottom surface of the metal block.

Abstract: In some embodiments, apparatuses and methods are provided herein useful for testing a touchscreen electronic device. In some embodiments, an attachment for an end effector for use with testing a touchscreen electronic device comprises a body, wherein the body includes a connection portion configured to secure the attachment to the end effector, a first end, an opening, wherein the opening is located adjacent to the first end, and a conductive contact member, wherein the conductive contact member is wrapped about the first end, and wherein the conductive contact member is configured to contact the touchscreen during testing and simulate a touch of a human finger.

Abstract: A semiconductor product such as an integrated circuit includes a laminar plastic substrate having first and second opposed surfaces and through holes extending through the substrate, electrically and/or thermally conductive material balls inserted in the through holes at the first surface of the substrate, and one or more semiconductor chips mounted at the first surface of the substrate, the semiconductor chip(s) electrically and/or thermally coupled with electrically and/or thermally conductive material balls inserted in the through holes.

Abstract: A connector for coupling a distal sheath to an inner shaft of a medical delivery device includes a wedge defining a lumen for accepting the inner shaft of the medical delivery device and a cylindrical ring sized to mate with the wedge. The wedge may be welded or otherwise fixed to the inner shaft. The wedge and the ring are configured to be pressed together and lock a portion of the distal sheath therebetween.

Abstract: A display device connected by an anisotropic conductive film, wherein the anisotropic conductive film includes conductive particles and has a minimum melt viscosity of 900 Pa·s to 90,000 Pa·s at 80° C. to 140° C.

Abstract: An apparatus relating generally to a substrate is disclosed. In such an apparatus, a first bond via array has first wires extending from a surface of the substrate. A second bond via array has second wires extending from the surface of the substrate. The first bond via array is disposed at least partially within the second bond via array. The first wires of the first bond via array are of a first height. The second wires of the second bond via array are of a second height greater than the first height for coupling of at least one die to the first bond via array at least partially disposed within the second bond via array.

Abstract: The present invention relates to a reflow film containing a thermoplastic resin which is dissolvable in a solvent, and solder particles, wherein the solder particles are dispersed in the film, and also relates to a solder bump formation method which comprises: (A) a step of mounting the reflow film on the electrode surface side of a substrate, (B) a step of mounting and fixing a flat plate, (C) a step of heating, and (D) a step of dissolving and removing the reflow film, and herewith, a reflow film is provided which, by causing localization of the solder component on the electrodes of the substrate by self-assembly, exhibits excellent storage properties, transportability and handling properties during use, and can form solder bumps or solder joints selectively on only the electrodes.

Abstract: Provided is a semiconductor device, including an anisotropic conductive film connecting the semiconductor device, the anisotropic conductive film having a maximum stress of 0.4 kgf/mm2 or more; and a stress-strain curve having a slope (A) of greater than 0 and less than or equal to 0.2 kgf/(mm2·%) as represented by the following equation 1: slope(A)=(½Smax?S0)/x??(1), wherein: Smax=maximum stress, x=strain (%) at half (½) of the maximum stress, and S0=stress at a strain of 0.

Abstract: An anisotropic conductive film includes a conductive adhesive layer including conductive particles and insulating particles, and an insulating adhesive layer not including conductive particles. In the anisotropic conductive film, the conductive particles and the insulating particles of the conductive adhesive layer have a total particle density of 7.0×105/d2 to 10.0×105/d2 (particles) per square millimeter (mm2) (where d is a diameter of the conductive particles in ?m).

Abstract: A joining sheet includes a solder layer which contains solder particles, a thermoplastic resin, and an active agent capable of activating the solder particles and a thermosetting resin-containing layer which is laminated on at least one surface in a thickness direction of the solder layer and contains a thermosetting resin.

Abstract: An array of composite polymer-metal contact members adapted to form solder free electrical connections with a first circuit member. The contact members include a resilient polymeric base layer and an array of metalized traces printed on selected portions of the base layer. Conductive plating is applied to the metalized layer to create an array of conductive paths. The resilient polymeric base layer, the metalized layer, and the conductive plating have an aggregate spring constant sufficient to maintain distal portions of the contact members in a cantilevered configuration and to form a stable electrical connection between the distal portions and the first circuit member solely by compressive engagement.

Abstract: A mid-plane assembly for use in an IT device includes a circuit board having a first surface and a second surface. At least one drive connector is positioned on the first surface of the circuit board. At least one board connector is positioned on the second surface of the circuit board and at least partially behind the at least one drive connector positioned on the first surface.

Abstract: A memory card adaptor is provided which includes a housing including a bottom lid and a top lid that form the housing. The housing may be configured to receive a memory card. The memory card adaptor may include a package substrate between the bottom lid and the top lid. The package substrate may include a core having a first surface and a second surface; a first layer on the first surface, and the first layer may include a plurality of contact lands; and a second layer on the second surface, and the second layer may include a plurality of contact pads that are electrically connected with the contact lands through a plurality of via holes. The plurality of via holes may be formed such that they penetrate the core. One of the first and second layers may include a return path on at least one signal line.

Abstract: There is provided a mounting adapter to be disposed between a socket and an electronic component when the electronic component is mounted with the socket. The mounting adapter includes a base having insulating property, a first electrode provided on a first surface of the base, the first surface facing the electronic component, the first electrode being to be in contact with an electric pad of the electronic component, a second electrode provided on a second surface of the base, the second electrode facing the socket, the second electrode being to be in contact with a conductor of the socket, and a through via that penetrates through the base and electrically connects the first electrode and the second electrode.

Abstract: A connector insert comprising a plurality of layers of conductive elastomer, and a concomitant method of employing a connector insert, the method comprising the steps of fabricating a plurality of layers of conductive elastomer as an insert and placing the insert into a connector.

Abstract: An interconnection element is disclosed that includes a plurality of drawn metal conductors, a dielectric layer, and opposed surfaces having a plurality of wettable contacts thereon. The conductors may include grains having lengths oriented in a direction between the first and second ends of the conductors. A dielectric layer for insulating the conductors may have first and second opposed surfaces and a thickness less than 1 millimeter between the first and second surface. One or more conductors may be configured to carry a signal to or from a microelectronic element. First and second wettable contacts may be used to bond the interconnection element to at least one of a microelectronic element and a circuit panel. The wettable contacts may match a spatial distribution of element contacts at a face of a microelectronic element or of circuit contacts exposed at a face of component other than the microelectronic element.

Abstract: A compliant printed circuit semiconductor tester interface that provides a temporary interconnect between terminals on integrated circuit (IC) devices being tested. The compliant printed circuit semiconductor tester interface includes at least one dielectric layer printed with recesses corresponding to a target circuit geometry. A conductive material is deposited in at least a portion of the recesses comprising a circuit geometry and a plurality of first contact pads accessible along a first surface of the compliant printed circuit. At least one dielectric covering layer is preferably applied over the circuit geometry. A plurality of openings in the dielectric covering layer are provided to permit electrical coupling of terminals on the IC device and the first contact pads. Testing electronics that to test electrical functions of the IC device are electrically coupled to the circuit geometry.

Abstract: A method of manufacturing a micro structure, includes the steps of: preparing separate first and second substrates, the first substrate having a first surface on which a first structural body having a first height and a second structural body having a second height greater than the first height of the first structural body are arranged, the second substrate having a second surface; then placing the first and second substrates to cause the first and second surfaces to face each other across the first and second structural bodies; and then bonding the first and second substrates to each other while compressing the second structural body in a height direction thereof between the first and second surfaces to cause the second structural body to have a height defined by the first structural body.

Abstract: An electrical interconnect device includes an array of conductive elastomeric columns, each of the elastomeric columns extending between a first end and a second end and being internally conductive between the first and second ends. Upper and lower holders cover the array of conductive elastomeric columns. The upper holder has an upper substrate and a plurality of discrete upper pads held by the upper substrate and arranged in a complementary pattern to the array of elastomeric columns. The discrete upper pads cap corresponding first ends of the elastomeric columns. The lower holder has a lower substrate and a plurality of discrete lower pads held by the lower substrate and arranged in a complementary pattern to the array of elastomeric columns. The discrete lower pads cap corresponding second ends of the elastomeric columns. The upper and lower holders support the array of conductive elastomeric columns.

Abstract: An elastomeric material includes an elastomeric matrix having one or more outer surfaces and a set of electrically conductive pathways disposed through the elastomeric matrix. The elastomeric material also includes a thermally-conductive and electrically-insulative material, disposed through the elastomeric matrix, which improves the formation of the electrically conductive pathways.

Abstract: A probe includes a contact member brought into contact with an object to be tested. Contact particles having conductivity are uniformly distributed in the contact member. A part of the contact particles protrude from a surface of the contact member on the side of the object to be tested. A conductive member having elasticity is placed on a surface of the contact member on the opposite side to the object to be tested. The probe further includes an insulating sheet including a through hole and the contact member is so positioned as to penetrate the through hole. An upper part of the contact member is formed of a conductor which does not include the contact particles. An additional conductor is placed on a surface of the conductor on the side opposite to the object to be tested.

Abstract: An electrical interconnect device includes an array of conductive elastomeric columns, each of the elastomeric columns extending between a first end and a second end and being internally conductive between the first and second ends. Upper and lower holders cover the array of conductive elastomeric columns. The upper holder has an upper substrate and a plurality of discrete upper pads held by the upper substrate and arranged in a complementary pattern to the array of elastomeric columns. The discrete upper pads cap corresponding first ends of the elastomeric columns. The lower holder has a lower substrate and a plurality of discrete lower pads held by the lower substrate and arranged in a complementary pattern to the array of elastomeric columns. The discrete lower pads cap corresponding second ends of the elastomeric columns. The upper and lower holders support the array of conductive elastomeric columns.

Abstract: A connector, the connector comprises a tabulate main body and a plurality of tabulate conductors provided on the main body, nested with a pairing connector. Each conductor includes a tabulate terminal located in the main body and engaged with a pairing terminal of the pairing connector, and a rear end outwardly extended to the main body and connected to a terminal connecting part provided on the surface of a mounting part. A face of the rear end on the side of the mounting part is more distant to the surface of the mounting part than a face of the main body on the side of the mounting part. The rear end is connected to the terminal connecting part through an anisotropic conductive film provided between its face on the side of the mounting part and the terminal connecting part.

Abstract: A compliant insert is provided to support electronic assemblies to mitigate the effects of external loading. The insert comprises a polymer material having a durometer of between 10 and 90 on the Shore A scale and a 3-D negative relief on the surface of the polymer material. The 3-D negative relief is the negative of the 3-D positive relief of a specified geometric design of an electronics assembly. The compliant insert is mated with an instance of the electronics assembly such that the 3-D negative relief of the polymer material engages the 3-D positive relief of the assembly's PCB and electronic components. The polymer material is compliant enough to absorb the vertical and lateral spacing tolerances of the electronic components and stiff enough to mitigate deflections under loading.

Abstract: A socket includes a socket body having a first surface and a second surface with a plurality of openings extending between the first and second surfaces. Sleeve assemblies are received in corresponding openings of the socket body. Each sleeve assembly includes a socket contact configured to interconnect a first electronic component and a second electronic component and each sleeve assembly includes a conductive sleeve extending along a majority of a length of the socket contact between the first and second electronic components. The conductive sleeve provides electrical shielding for the socket contact such that each socket contact is individually shielded from other socket contacts.

Abstract: A conductive component includes a tubular body having at least one of at least one through-hole which penetrates the tubular body from outside to inside thereof; and at least one notch which is cut in from an edge of the tubular body, which are formed at least one predetermined portion on the tubular body. The tubular body includes a first portion, which includes a solder joint portion, and a second portion, which includes a contact portion. The first portion and the second portion are located on the opposite sides from one another with the at least one predetermined portion sandwiched therebetween. The tubular body further includes at least one spring portion which includes the at least one predetermined portion.

Abstract: An electronic device test fixture deploys a plurality of contact elements in a dielectric housing. The plumb arrangement of contact elements each include an armature or transversal configured to first depress and then slide laterally when urged downward by the external contacts of a device under test. The rotary movement of the transversal is optimized via the configuration of a surrounding forked regulator such that surface oxide deposition on the external device under test terminal is disrupted to reliably minimize contact resistance without damaging or unduly stressing the electrical junction of the device under test.

Abstract: An electrical connector assembly includes an electrical connector, a chip located and a printed circuit board located at opposite sides of the anisoptropic conductive film. The electrical connector has an anisoptropic conductive film and a loading mechanism. The anisoptropic conductive film includes an adhesive and a number of conductive particles dispersed in the adhesive. The anisoptropic conductive film has conductivity only in a thicknesswise direction by pressing. The loading mechanism can exert pressure on the anisoptropic conductive film so that the chip and the printed circuit board electrically couples with each other.

Abstract: A socket connector includes an insulative housing with a plurality of receiving holes, and a plurality of contacts received in the receiving holes. The contact has a soldering portion, and a retaining arm and a resilient arm respectively extending upwardly from the soldering portion. The retaining arm has a broken edge facing downward, which is formed by breaking a carrier from the contact.

Abstract: A silicon contactor of which a side contacts test terminals of a semiconductor testing device and of which an other side contacts ball leads of a semiconductor device so as to be used in the semiconductor testing device, including: conductive silicon parts which are formed opposite to the ball leads and/or the test terminals and include silicon rubber and conductive powders; and an insulating silicon part which is formed by filling silicon rubber among areas of the conductive silicon parts, which do not contact the ball leads, and supports the conductive silicon parts, wherein the conductive powders of the conductive silicon parts include plate type powders. Therefore, the plate type powders are used as the conductive powders of the conductive silicon parts to improve contact characteristics between the conductive silicon parts and the semiconductor device.

Abstract: An electrical connector includes a lengthwise housing and two rows of terminals. The housing defines two rows of passageways running through opposite first surface and second surface thereof to load with terminals. Each terminal includes a middle portion and two contacting arms extending from opposite ends of the middle portion. The two contacting arms of the terminals respectively extend beyond the first and second surfaces and curving inwards. Each terminal further includes a stopping rib and a spring rib at opposite lateral sides of the middle portion. Each passageway defines a first stopping shoulder adjacent to the second surface and a second stopping shoulder adjacent to the first surface. The stopping ribs are lodged against the first stopping shoulder or the spring ribs are lodged against the second stopping shoulder so that the terminals are moveable limited in the passageways.

Abstract: A method for fabricating a negative thermal expanding system device includes coating a wafer with a thermally decomposable polymer, patterning the decomposable polymer into repeating disk patterns, releasing the decomposable polymer from the wafer and forming a sheet of repeating patterned disks, suspending the sheet into a first solution with seeding compounds for electroless decomposition, removing the sheet from the first solution, suspending the sheet into a second solution to electrolessly deposit a first layer material onto the sheet, removing the sheet from the second solution, suspending the sheet into a third solution to deposit a second layer of material having a lower TCE value than the first layer of material, separating the patterned disks from one another, and annealing thermally the patterned disks to decompose the decomposable polymer and creating a cavity in place of the decomposable polymer.