Of Sensing Device Patents (Class 702/116)
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Publication number: 20030004668Abstract: The present invention discloses a system and method for providing an automated imaging system comprising an illumination source, a phosphorescent imaging target, and an optical imaging sensor for receiving luminance information emitted from the phosphorescent imaging target.Type: ApplicationFiled: June 21, 2001Publication date: January 2, 2003Inventors: Richard Lynn Gardner, Paul C. Coffin, Michael J. Chaloner
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Patent number: 6502050Abstract: A method and structure for measuring the minimum lock frequency of a delay locked loop (DLL) within a programmable integrated circuit device such as a field programmable gate array (FPGA). The device is temporarily configured such that one DLL is programmed as a ring oscillator (RO) and connected directly to the input terminal of a second DLL (the DLL under test). Optionally, the RO is connected to the DLL under test through a divider to provide a lower DLL drive frequency. To test the DLL, the RO frequency is decreased until the DLL under test fails to lock. The frequency of the RO at that point is measured by comparing its output signal to the known frequency of an external clock source using two counters, and decremented until the DLL locks successfully. The lock frequency of the DLL under test is then computed from the ratio of the counter values.Type: GrantFiled: June 20, 2000Date of Patent: December 31, 2002Assignee: Xilinx, Inc.Inventor: Siuki Chan
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Patent number: 6498996Abstract: Vibration induced errors in sensors are predicted based on a measurement of vibration power spectra. Accelerometer samples are used to estimate vibration power spectral densities. A calibration procedure using suitable vibration stimulus provides the ability to estimate sensitivity coefficients to be used to compensate for the vibration induced error. The vibration power spectrum estimates are combined with previously obtained calibration coefficients to generate real time vibration-induced error corrections. Vibration bias sensitivity coefficients are estimated in a controlled environment to ensure their accuracy to compensate the sensor in real-time applications using acceleration measurement devices such as accelerometers mounted to a rigid sensor assembly shared with the sensor to be compensated. Vibration bias estimates are then used to correct the outputs of the sensors(s) being compensated for vibration-induced error.Type: GrantFiled: August 4, 1999Date of Patent: December 24, 2002Assignee: Honeywell International Inc.Inventor: Lawrence C. Vallot
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Patent number: 6487521Abstract: Disclosed is a method, system, and program for monitoring a device. A determination is made as to a first time, a current time, and a system-up time. The current time follows the first time and the system-up time indicates an elapsed time at the device since the last power cycle. A determination is then made as to whether the current time minus the first time is less than the system up time to determine whether the device has started a new power cycle since the first time.Type: GrantFiled: July 7, 1999Date of Patent: November 26, 2002Assignee: International Business Machines CorporationInventor: Dennis Michael Carney
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Patent number: 6466885Abstract: A cable testing system for testing individual lines of a cable. The cable testing system includes a main unit having an input jack and a plurality of identifying lights connected to the input jack, and at least one remote module including an input jack and an output jack, a power source in communication with the output jack, and a plurality of identifying lights connected to the input jack. Preferably, the output jack of the remote module is configured to receive one end of a multiple line cable and the input jacks of both the main unit and remote module are configured to receive the other end of the multiple line cable. The remote module preferably includes a test signal generator configured to send test signals sequentially along each line of the cable, and includes an identifying signal generator which is configured to send an identifying signal along a line of the cable.Type: GrantFiled: April 30, 1999Date of Patent: October 15, 2002Assignee: Greenlee Textron Inc.Inventor: Garth Miller, Jr.
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Publication number: 20020139166Abstract: In a method for the analysis and evaluation of measured values of an open test system, a test piece is monitored during a test run by at least one signal channel which sends a signal to an evaluation unit for further processing whereby at least one plausibility node is coupled with at least one signal channel. In order to allow a statement to be made about the value of plausibility nodes and their results in relation to a specific measuring task, an evaluated plausibility is ascertained for at least one of the measured values from the type and number of plausibility nodes as well as their possible, variable interconnection.Type: ApplicationFiled: March 28, 2002Publication date: October 3, 2002Inventors: Klaus-Christoph Harms, Christian Beidl
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Patent number: 6453258Abstract: A system and method for ensuring comprehensive testing coverage of components within a dynamic logic macro during a burn-in test cycle. Burn-in testing is initiated within dynamic logic circuit having a dynamic logic block and a self-reset loop for generating a reset signal. A multiple phase burn-in test input is applied to the self-reset loop for modifying the duration of the reset signal during burn-in testing, such that the components within the dynamic logic macro are adequately stressed during the burn-in test cycle.Type: GrantFiled: December 17, 1999Date of Patent: September 17, 2002Assignee: International Business Machines CorporationInventors: Naoaki Aoki, Sang Hoo Dhong, Joel Abraham Silberman, Osamu Takahashi
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Patent number: 6453279Abstract: A method for adaptively scheduling maintenance of a sensor (14) infers the need for maintenance of that sensor on the basis of an error signal indicative of a difference between a measurement signal generated by that sensor and an independently obtained reference signal that is correlated with the measurement signal (16). Although the reference signal is not identical to the measurement signal, the correlation between these two signals assures that when the sensor is functioning, the two signal will track each other over time. The method includes the step of generating this error signal and then monitoring that error signal to detect a triggering event indicative of a mismatch between the reference signal and the measurement signal. This mismatch is indicative of a probability that there exists a malfunction in the sensor. The value of this probability depends on the choice of the triggering event.Type: GrantFiled: November 5, 1999Date of Patent: September 17, 2002Assignee: The Foxboro CompanyInventors: Mohan Prasad, David N. DeMoura
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Patent number: 6434510Abstract: A vehicle mileage tracking system including an input device mounted in the vehicle for receiving one of a first and second door unlock signals, and a vehicle tripmeter. The vehicle tripmeter is coupled to the input device and to a vehicle odometer sensor for accumulating a first accumulated travel distance during vehicle travel following receipt by the input device of the first door unlock signal, and for accumulating a second accumulated travel distance during vehicle travel following receipt by the input device of the second door unlock signal. The tripmeter does not accumulate the first accumulated travel distance during vehicle travel following receipt by the input device of the second door unlock signal. The vehicle mileage tracking system also preferably includes a display coupled to the vehicle tripmeter for selectively displaying the first and second accumulated travel distance. The input device is preferably a receiver for receiving a signal from a remote transmitter.Type: GrantFiled: July 21, 1999Date of Patent: August 13, 2002Inventor: Terry S. Callaghan
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Publication number: 20020082794Abstract: In order to test a hearing aid having at least one microphone, one signal processing unit and one sound transducer, a sound channel is produced between the microphone and the sound transducer. The electrical signal path in the hearing aid is interrupted, and a test signal is fed into the interrupted signal path within the hearing aid, is emitted via the sound transducer, and is passed on through the sound channel to the microphone. The signal received by the microphone is then evaluated.Type: ApplicationFiled: September 18, 2001Publication date: June 27, 2002Inventors: Manfred Kachler, Fred Zoels
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Patent number: 6393371Abstract: A method and apparatus for operating an integrated circuit in an electronic device by controlling the supply voltage to the integrated circuit (IC). A parameter of the IC is measured and used to adjust the supply voltage of the IC. The measured parameter is indicative of the effective channel mobility of the IC. One purpose of adjusting the voltage is to modify the effective channel mobility such that the individual channel currents are substantially constant over a predetermined operating temperature range of the IC. The modification of channel mobility is chosen to set the individual channel currents at levels that either maximizes operating speed, minimizes power consumption, extends the range of operating temperature, or increases the operational reliability of the IC.Type: GrantFiled: April 24, 2001Date of Patent: May 21, 2002Assignee: Hewlett-Packard CompanyInventors: James F. Bausch, Andrew L. Van Brocklin, Chadwick W. Stryker
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Publication number: 20020049557Abstract: A sample testing system has a chamber sealing apparatus adapted to receive a chamber containing a fluid sample material and to seal portions of a chamber into segments. A reagent injector cartridge actuator is adapted to receive a reagent injector cartridge having at least one needle in fluid communication with a reagent reservoir, and to move a reagent injector cartridge to inject a quantity of reagent into a segment of a chamber. In certain preferred embodiments, a flow control device induces a flow of sample in a segment. A sensor generates a signal corresponding to a condition of the mixture.Type: ApplicationFiled: July 20, 2001Publication date: April 25, 2002Applicant: Chen & Chen, LLCInventor: Shuqi Chen
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Publication number: 20020045996Abstract: A cable testing system for testing individual lines of a cable. The cable testing system includes a main unit having an input jack and a plurality of identifying lights connected to the input jack, and at least one remote module including an input jack and an output jack, a power source in communication with the output jack, and a plurality of identifying lights connected to the input jack. Preferably, the output jack of the remote module is configured to receive one end of a multiple line cable and the input jacks of both the main unit and remote module are configured to receive the other end of the multiple line cable. The remote module preferably includes a test signal generator configured to send test signals sequentially along each line of the cable, and includes an identifying signal generator which is configured to send an identifying signal along a line of the cable.Type: ApplicationFiled: April 30, 1999Publication date: April 18, 2002Inventor: GARTH MILLER JR.
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Patent number: 6374196Abstract: An alarm propagation model of a transmission line is expressed by an equation. A fault portion on the transmission line is estimated by using the alarm propagation model. As a result, it is possible to estimate the fault portion by minimum observation time without lack of precision.Type: GrantFiled: March 16, 1999Date of Patent: April 16, 2002Assignee: KDD CorporationInventors: Kazuo Hashimoto, Kazunori Matsumoto
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Patent number: 6263476Abstract: A system that can test individual components having tolerances on a circuit board without complete access to every node on the board is disclosed. The system uses a method that develops test limits from a model of the board, component tolerances, and a list of accessible nodes. A method of reducing the complexity of the test problem by limiting the number of components under consideration is also disclosed. A method of reducing the complexity of the test problem by limiting the number of nodes under consideration is also disclosed. A method of picking nodes to apply stimulus to a board is also disclosed. Finally, a method of correcting for certain parasitics associated with tester hardware is disclosed.Type: GrantFiled: October 9, 1998Date of Patent: July 17, 2001Assignee: Agilent TechnologiesInventors: Rodney A. Browen, Cherif Ahrikencheikh, William P. Darbie, John E. McDermid, Kay C. Lannen
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Patent number: 6236951Abstract: There is disclosed a method for interrogating a sensor comprising the steps: applying a periodic electrical signal to the sensor; obtaining a signal therefrom; and performing an operation on the obtained signal to obtain the sensor response at a plurality of frequencies, said operation including a transformation to the frequency domain of said signal or a quantity related to said signal.Type: GrantFiled: May 13, 1998Date of Patent: May 22, 2001Assignee: Osmetech PLCInventors: Peter Alfred Payne, Krishna Chandra Persaud, Mohammed El Hassan Amrani
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Patent number: 6148409Abstract: In an electronic system for the transmission of data between a plurality of stations the control signals and functions of the basic elements of power supply, watchdog and signal converter in each station are linked to one another so as to ensure that the number of possible modes of operation, taken for all the elements, is reduced to a number necessary for the corresponding task and thereby guarantees a more reliable operation. Moreover, the linkage leads to an optimum default behavior of the station with regard to application-specific power-saving and safety requirements, even when, for example, the malfunction of the microcontroller of the station persists.Type: GrantFiled: May 18, 1998Date of Patent: November 14, 2000Assignee: U.S. Philips CorporationInventor: Robert Mores
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Patent number: 6133727Abstract: A method for verifying correct operation and functional stability of a tester for semiconductor devices is disclosed. In addition, a method for creating a standard device for use with the tester is also disclosed. In creating a standard device according to the present invention, the tester repeatedly tests a candidate device a predefined number of times and evaluates the test results to determine whether the candidate device is suitable for use as a standard device. In verifying the operation and functional stability of a semiconductor device tester, data generated by repeatedly testing a standard device a predefined number of times are compared to recorded reference data of previous tests of the standard device.Type: GrantFiled: January 5, 1999Date of Patent: October 17, 2000Assignee: Samsung Electronics Co., Ltd.Inventors: Byoung Ok Chun, Byung Rae Cho, Sang Hon Lee, Yun Soon Park
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Patent number: 6121769Abstract: Displacement detector includes a displaceable core, two detecting coils variable in their inductance in response to displacement of the core, and two reference resistances each connected in series with the corresponding detecting coil. Pulse power is supplied to each pair of the series-connected detecting coil and reference resistance, and two transient response voltages across the reference resistances are taken out. Two bottom holding circuits are also provided in corresponding relation to transient response voltages, so that each of the bottom holding circuits detects and holds a smallest or bottom level of the corresponding transient response voltage and thereby provides the bottom voltage as an output voltage. Then, a difference is evaluated between the two output voltages from the bottom holding circuits.Type: GrantFiled: August 3, 1998Date of Patent: September 19, 2000Assignee: Honda Giken Kogyo Kabushiki KaishaInventors: Yoshinobu Mukai, Yoshiki Noro
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Patent number: 6073083Abstract: The invention is directed to an arrangement for determining the internal resistance of a lambda probe having a positive pole and an internal resistance. A computer includes at least one computer port having a switchable state, a signal input and fixed pregiven values. A supply voltage source having a positive pole and a measurement resistor are also provided. The positive pole of the supply voltage source is connected to the positive pole of the lambda probe via the computer port and the measurement resistor. An analog/digital converter is connected forward of the signal input and the positive pole of the lambda probe is connected directly to the analog/digital converter for applying variable values to the signal input via the analog/digital converter. The computer is adapted to compute the internal resistance of the lambda probe from the variable values applied to the signal input and the fixed pregiven values. A method of determining the internal resistance of a lambda probe is also disclosed.Type: GrantFiled: September 5, 1997Date of Patent: June 6, 2000Assignee: Robert Bosch GmbHInventors: Eberhard Schnaibel, Erich Junginger, Lothar Raff
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Patent number: 6016465Abstract: The sensor fault detector is one in which each sensor signal is compared with a reference signal provided by e.g. a model of the system being monitored. Prior art sensor fault detectors subtract the output of the sensor and the corresponding reference signal from each other, and a fault is declared when the residual difference exceeds a prescribed threshold. However, modelling errors (such as scaling discrepancies), d.c bias and noise mean that faults are often wrongly declared, or alternatively that only large faults can be detected. These problems are overcome according to the invention by comparing the "shape" of the sensor signal with that of the corresponding reference signal (i.e. comparing the signal outlines) over a finite time window, using e.g. correlation techniques. A fault is declared when the shapes differ by a prescribed amount.Type: GrantFiled: January 12, 1998Date of Patent: January 18, 2000Assignee: The Secretary of State for DefenceInventor: Ronald W Kelly
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Patent number: 5991698Abstract: A lapping system data acquisition unit is disclosed for use in measuring resistances of multiple resistors embedded in a structure to be machined. Each of multiple independent current sources directs a current through one of the multiple resistors embedded in the structure during machining of a surface of the structure. Each of multiple voltage sensing devices couples to a separate one of the multiple resistors and provides a separate analog voltage output signal indicative of the resistance of the resistor. Each of multiple filters is coupled to a separate one of the multiple voltage sensing devices Analog-to-digital conversion circuitry coupled to the multiple filters generates a digitized signal for each of the filtered output signals.Type: GrantFiled: May 7, 1997Date of Patent: November 23, 1999Assignee: Seagate Technology, Inc.Inventors: Shanlin Hao, Ray V. Rigles, William P. Wood, Lars H. Ahlen, John C. Heitke
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Patent number: 5966311Abstract: A fail-safe fluid transfer control apparatus has full redundancy in the response to various inputs such as overfill probe signals, ground detection signals, and the like. Independent microprocessor controllers independently evaluate the inputs and each output control signals to close a respective relay when the inputs indicate that fluid transfer may commence. The relays are arranged in series such that both must be closed for a fluid transfer to commence. The control signals from each controller include a static signal and an alternating signal, both of which must be properly output to close its respective relay. Each controller monitors the state of each relay, and discontinues its control signals if either relay appears to be malfunctioning. Each controller runs an different, independently written firmware program to process the detected inputs to prevent a common firmware error.Type: GrantFiled: June 22, 1998Date of Patent: October 12, 1999Assignee: Scully Signal CompanyInventors: Francis V. Stemporzewski, Jr., Arthur W. Shea, Gary R. Cadman, Richard O. Beaulieu, Stephen F. Tougas
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Patent number: 5864785Abstract: An improved computer and system thereof which monitors the state of an array of sensors. In the preferred embodiment, these sensors monitor a physical or internal condition and have two states. The invention establishes a time window and identifies which of the sensors have changed state within the time window. The sensors which have changed state are then grouped into a "tuple" which is used by an operator to analyze the operations of the environment being studied using such methods as co-exclusion. Through selective control of the length of the time window, changes in two or more sensors permit co-exclusion properties to be inferred.Type: GrantFiled: August 15, 1997Date of Patent: January 26, 1999Inventor: Michael Manthey