Article Count Or Size Distribution Patents (Class 702/128)
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Publication number: 20120253724Abstract: A management device includes a measurement data storage unit configured to store measurement data transmitted from a substrate processing apparatus; a setting unit configured to set an item of the measurement data as a determination target, reference data, and upper and lower limit values with respect to the reference data; a counting unit configured to count the number of times that the value of the measurement data corresponding to the item exceeds the upper and lower limit values; and a determining unit configured to determine that the measurement data as a determination target is abnormal, when the counted number exceeds a predetermined value.Type: ApplicationFiled: March 29, 2012Publication date: October 4, 2012Applicant: HITACHI KOKUSAI ELECTRIC INC.Inventors: Kazuhide Asai, Hideto Shimizu, Kayoko Yashiki
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Publication number: 20120245881Abstract: There is provided an information processing apparatus including an extraction section which extracts, out of pieces of detection information each including position information and motion detection data acquired by terminal devices of respective users, detection information of a user on a specific train, based on the position information, and an estimation section which estimates distribution of people on the train based on the motion detection data included in the detection information extracted by the extraction section.Type: ApplicationFiled: February 15, 2012Publication date: September 27, 2012Applicant: Sony CorporationInventor: Tomohisa TAKAOKA
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Patent number: 8200042Abstract: An endoscope apparatus includes an electronic endoscope that picks up a measurement object and produces a picked-up-image signal; an image-processing unit that produces a image signal based on the picked-up-image signal; and an measurement processing unit that undertakes measurement processing to the measurement object based on the image signal. The measurement processing unit includes: a reference point-designating unit that designates two reference points on the measurement object; an approximate-outline—calculating unit that calculates an approximate outline by approximating the outline of the measurement object based on the reference points; and a loss-composing points-calculating unit that calculates loss-composing points that constitute a loss outline formed on the measurement object based on the reference points and the approximate outline. This enables loss size measurement upon designating two reference points, thereby reducing complex operations and improving operability.Type: GrantFiled: January 29, 2008Date of Patent: June 12, 2012Assignee: Olympus CorporationInventors: Takahiro Doi, Fumio Hori
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Publication number: 20120143357Abstract: Embodiments of the present invention include an occupancy sensing unit configured to monitor an environment illuminated by a lighting fixture. An inventive occupancy sensing unit may include an occupancy sensor to detect radiation indicative of at least one occupancy event in the environment illuminated by the lighting fixture according to sensing parameters. The occupancy sensor can be coupled to a memory that logs sensor data, which represent the occupancy events, provided by the occupancy sensor. A processor coupled to the memory performs an analysis of the sensor data logged in the memory and adjusts the sensing parameters of the occupancy sensor based on the analysis.Type: ApplicationFiled: November 4, 2011Publication date: June 7, 2012Inventors: Brian Chemel, Colin N. Piepgras, Frederick Morgan
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Patent number: 8195426Abstract: Data analysis systems and related methods. An implementation of a method of determining a relationship between a variable of interest and one or more process variables represented by a corresponding plurality of tags may include accessing a data historian including historical data including a variable of interest and a plurality of tags. The method may include defining a plurality of bins, retrieving historical data corresponding with the plurality of bins using the data historian, filtering the historical data for each of the plurality of bins using one or more filters to produce filtered historical data, generating an output display using the filtered historical data for the variable of interest and each of the plurality of tags, and determining which of the plurality of tags correlate with the variable of interest using the output display. The output display may include an overlay CUSUM chart and a correlation plot.Type: GrantFiled: October 21, 2008Date of Patent: June 5, 2012Inventor: John Antanies
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Patent number: 8185341Abstract: Thermometric apparatus includes one or more temperature sensors, which are configured to provide respective temperature-dependent readings at two or more locations on a surface in a vicinity of a sub-surface heal source. A processing unit is configured to process the readings from the two or more locations so as to determine a temperature of the sub-surface heat source.Type: GrantFiled: May 30, 2008Date of Patent: May 22, 2012Assignee: Medisim Ltd.Inventors: Moshe Yarden, Marina Rogachevsky
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Patent number: 8145337Abstract: A method to enable wafer result prediction from a batch processing tool, includes collecting manufacturing data from a batch of wafers processed in batch in the batch processing tool, to form a batch processing result; defining a degree of freedom of the batch processing result based on the manufacturing data; and performing an optimal curve fitting by trial and error for an optimal function model of the batch processing result based on the batch processing result.Type: GrantFiled: November 16, 2007Date of Patent: March 27, 2012Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chun-Hsien Lin, Amy Wang, Francis Ko, Jean Wang
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Patent number: 8131495Abstract: A system includes a filter, a sensor, a processor, and a memory. The filter can be coupled to an engine exhaust and can operate in an accumulating mode during which particulate matter (PM) from the engine is trapped and also operate in a regenerating mode during which PM in the filter is emitted. The sensor is coupled to a discharge port of the filter and has an output to provide a sensor signal based on a concentration of PM in the filtered exhaust. The processor is coupled to receive the sensor signal and operable to determine at least one of a base level for the sensor signal during the accumulating mode and a regenerate level for the sensor signal during the regenerating mode, and operable to determine a calibration value for the sensor using at least one of the base level and the regenerate level. The memory stores the calibration value.Type: GrantFiled: August 19, 2008Date of Patent: March 6, 2012Assignee: Honeywell International Inc.Inventors: Brian C. Krafthefer, Gregory J. Hampson
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Publication number: 20120053885Abstract: An information processing apparatus counts as a result the number of sheets output by an image forming apparatus with reference to collected job history information and obtains the amount of electric power consumed by the image forming apparatus based on the job history information. When the information processing apparatus generates display data required to display a screen indicating an emission amount of greenhouse effect gases, the information processing apparatus analyzes the number of sheets that is output if a saving setting is applied to a job corresponding to a history included in the job history information. The information processing apparatus generates the display data required to display the screen in such a way as to indicate an emission amount of the greenhouse effect gas obtained based on the analyzed number of sheets.Type: ApplicationFiled: August 26, 2011Publication date: March 1, 2012Applicant: CANON KABUSHIKI KAISHAInventor: Kazunori Kato
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Publication number: 20120041708Abstract: The present method proposes, according to a first aspect, a method for counting stacked items forming on one side of the stack at least one level variation lineformed by the edges of the stacked items. The method includes the telemetric measurement of a variation in level on a line of points traversing the whole side of the stack and recording a corresponding raw signal. The method subsequently includes analysing the raw signal in order to estimate one or more parameters relating to the structure of the stack, followed by processing the raw signal in one or more statistical processing operations on the basis of the estimated parameters, and analysing the processed signal in order to determine the number of stacked items.Type: ApplicationFiled: August 10, 2011Publication date: February 16, 2012Inventor: Jacob Rutti
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Publication number: 20120029863Abstract: There is provided a support method for a particle distribution analysis for a substrate. In the support method, histogram data of inter-particle distances are created for all particles on a target substrate subjected to the particle distribution analysis from particle coordinate data of the target substrate. Further, histogram data of inter-particle distances are created for multiple virtual substrates each having the same number of randomly distributed particles as the particles on the target substrate. Based on a difference between the histogram data of the target substrate and the histogram data of each of the virtual substrates, determination data are created by quantifying a distance between the histogram data of the target substrate and the histogram data of the multiple virtual substrates, and the determination data are displayed on a display unit.Type: ApplicationFiled: July 1, 2011Publication date: February 2, 2012Applicant: TOKYO ELECTRON LIMITEDInventors: Kunio Miyauchi, Hiroyuki Nakayama
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Publication number: 20110282618Abstract: A photon detecting device including a sensor including a vacuum chamber, a photocathode arranged therein to convert photons to primary electrons, a converter converting at least part of the energy of accelerated primary electrons to secondary charges collected by a plurality of detection cells, an acquisition circuit adapted to read the charges collected by the detection cells with an integration time allowing an impact density to be obtained per unit of time and per unit surface of a cell of the order of a single electron, a system identifying a cluster of adjacent detection cells of which at least one so-called main cell includes a quantity of collected charges higher than a threshold value, a system determining at least one characteristic of the cluster, a system memorizing at least one characteristic of a reference cluster resulting from conversion of a primary electron, and a system comparing the determined characteristic(s) of the cluster with the memorized characteristic(s) of the reference cluster toType: ApplicationFiled: December 8, 2009Publication date: November 17, 2011Applicants: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, UNIVERSITE CLAUDE BERNARD LYON IInventors: Rémi Barbier, Nicolas Estre
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Patent number: 8032234Abstract: A condition of an industrial process is diagnosed based upon process variable information related to a value of a measured process variable. Histogram information is calculated based upon the determined process variable information and time information related to a duration of time the measured process variable has the value. Condition of the industrial process is diagnosed based upon the calculated histogram information.Type: GrantFiled: May 16, 2006Date of Patent: October 4, 2011Assignee: Rosemount Inc.Inventors: Scot R. Foss, Terry A. Cureton
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Publication number: 20110213581Abstract: To facilitate evaluation of a measurement condition in order to set an optimum measurement condition for each sample. A particle size distribution measuring device is provided with: an device main body that measures a particle size distribution of a sample; and an interface device that receives an input from an operator to perform drive control of the device main body, and receives a measurement result from the device main body to display the measurement result, wherein the interface device displays, in a graph, a relationship between values of operational parameters, which are to be set to measure the particle size distribution, and values of evaluation parameters obtained by using the measurement result from the device main body, which correspond to each of the values of the operational parameters.Type: ApplicationFiled: February 28, 2011Publication date: September 1, 2011Applicant: HORIBA, LTD.Inventor: Hirosuke SUGASAWA
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Patent number: 7984399Abstract: In random defect yield simulation, a specific defect size interacts with a specific physical design and has a calculated probability of failure associated with it. The failure model is in terms of probability of failure. It provides a solution to the random defect yield simulation problem of chips with a built-in redundancy scheme. The solution first defines the independent failure modes of the chip with a built-in redundancy scheme and efficiently models each mode. Then, it may accumulate the respective probability of failures according to the chip's architecture.Type: GrantFiled: December 27, 2007Date of Patent: July 19, 2011Assignee: Cadence Design Systems, Inc.Inventors: Roland Ruehl, Mathew Koshy, Jonathan Fales, Udayan Gumaste
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Publication number: 20110172848Abstract: Systems, apparatus, interfaces, methods, and articles of manufacture for smart visi-coolers are provided.Type: ApplicationFiled: January 11, 2011Publication date: July 14, 2011Applicant: VENDMORE SYSTEMS, LLCInventors: Paul T. Breitenbach, Paul D. Signorelli, Igor Zhuk
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Patent number: 7871237Abstract: A method and system for monitoring a gas turbine engine (20) to predict maintenance requirements. Particles suspended in a gas flow (24, 32) of the engine (20) are monitored and quantified to predict a particle accumulation rate. Monitoring may be done using particle flow sensors (61-63) in a diverted portion (33) of the working gas flow (24), such as in the cooling gas flow (32). Particle sampling (S1-S3) may be done to determine particle size and composition distributions. Particle mass flow rates may then be continuously monitored per engine operating condition, and compared to predetermined values such as a normal upper limit per engine operating condition. An integrated particle mass flow may be used in conjunction with an instantaneous mass flow rate to predict a maintenance requirement. Multiple locations (L1-L3) may be monitored to recognize a maintenance requirement by flow section or component.Type: GrantFiled: July 7, 2006Date of Patent: January 18, 2011Assignee: Siemens Energy, Inc.Inventors: Richard H. Bunce, Francisco Dovali-Solis
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Patent number: 7855370Abstract: A method of detecting edges of a preamplifier signal including identifying a first portion of the signal wherein each part thereof has an instantaneous slope having a first polarity, identifying a second portion immediately following the first portion wherein each part thereof has an instantaneous slope having a second opposite polarity, and identifying a third portion immediately following the second portion wherein each part thereof has an instantaneous slope having the first polarity. The method further includes determining a first difference between the magnitudes associated with an end point and a beginning point of the second segment, determining a second difference between the magnitude associated with an end point of the third segment and the magnitude associated with a beginning point of the first segment, and detecting an edge if: (i) the first difference exceeds a threshold, and (ii) the second difference exceeds a fraction of the threshold.Type: GrantFiled: August 1, 2008Date of Patent: December 21, 2010Assignee: Pulsetor, LLCInventor: Richard B. Mott
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Publication number: 20100248046Abstract: A particle size distribution creating method includes a particle size range determining step, an integrating step of integrating the frequency of appearance of particles within the particle size range determined in the particle size range determining step, a division point determining step of determining particle sizes that provide division points, using the integral of the frequency of appearance obtained in the integrating step, and a typical point determining step of determining the minimum particle size, maximum particle size and the particle sizes of the division points as typical points.Type: ApplicationFiled: March 31, 2010Publication date: September 30, 2010Applicant: Toyota Jidosha Kabushiki KaishaInventors: Hiroko Kimura, Naoki Takehiro, Manabu Kato, Kazutaka Kimura
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Patent number: 7791482Abstract: A material is laced with Radio Frequency Identification (RFID) tags at a known concentration of RFID tags per unit of material. Subsequently, if an interrogation of the RFID tags reveals a reduced concentration of RFID tags in the material, then a conclusion is drawn that the material has been diluted.Type: GrantFiled: March 20, 2008Date of Patent: September 7, 2010Assignee: International Business Machines CorporationInventors: Robert L. Angell, James R. Kraemer
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Publication number: 20100169038Abstract: The present invention provides processes employing algorithms and methods for calculating particle size distribution. In particular, the present invention provides processes employing algorithms and methods for calculating particle size distribution of different particle shapes from chord length distributions.Type: ApplicationFiled: April 23, 2008Publication date: July 1, 2010Applicant: TUFTS UNIVERSITYInventors: Christos Georgakis, Sze Wing Wong
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Patent number: 7689385Abstract: A method of analyzing structural vibration according to one aspect of the present invention includes reception of data from a plurality of sensors on a structure, filtration of the data to exclude data outside of a selected frequency band, association of sensor locations with locations on computer model, and generation of an animation which displays the structural vibration.Type: GrantFiled: October 29, 2007Date of Patent: March 30, 2010Assignee: Pratt & Whitney Rocketdyne, Inc.Inventor: Lawrence Shen
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Publication number: 20100036754Abstract: A stocked product sensing system that can be used with a product display, displaying product items on one or more shelves thereof, to determine the level of product availability and/or configuration of product items on one or more shelves of the product display. According to one embodiment of this invention, the stocked product sensing system utilizes capacitive sensing at the shelf-level. According to another embodiment of this invention, the stocked product sensing system utilizes optical sensing at the shelf-level. The stocked product sensing system of this invention may utilize a store-level management system and/or a central management system and generate low stock alarms based on user-defined criteria in a software system.Type: ApplicationFiled: August 6, 2008Publication date: February 11, 2010Inventors: Farrukh Khan, Yehea Ismail
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Patent number: 7657392Abstract: A method and apparatus for measuring the size and distribution of particles within a multiphase fluid flowing within a pipe is provided, wherein the apparatus includes at least one metering device for determining at least one of the mixture density of the fluid, the flow rate of the fluid and the dispersion of the fluid, wherein the at least one metering device generates meter data responsive to at least one of the mixture density of the fluid, the flow rate of the fluid and the dispersion of the fluid and a processing device communicated with the at least one metering device, wherein the processing device receives and processes the meter data to generate fluid information responsive to the size and distribution of the particles within the fluid.Type: GrantFiled: May 16, 2006Date of Patent: February 2, 2010Assignee: Cidra Corporate Services, Inc.Inventor: Daniel L. Gysling
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Patent number: 7623978Abstract: A method of assessing damage of a dual damascene structure includes obtaining a wafer after the wafer has been processed using a dual damascene process. A first damage-assessment procedure is performed on the wafer using an optical metrology process to gather damage-assessment data for a first set of measurements sites on the wafer. For each measurement site in the first set of measurement sites, the optical metrology process determines an amount of damage of a damaged area of a periodic grating in the measurement site. The damage-assessment data includes the amount of damage determined by the optical metrology process. A first damage-assessment map is created for the dual damascene process. The first damage-assessment includes the damage-assessment data and the locations of the first set of measurement sites on the wafer. One or more values in the damage-assessment map are compared to damage-assessment limits established for the dual damascene process to identify the wafer as a damaged or undamaged wafer.Type: GrantFiled: March 30, 2006Date of Patent: November 24, 2009Assignee: Tokyo Electron LimitedInventors: Kevin Lally, Merritt Funk, Radha Sundararajan
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Patent number: 7623943Abstract: Methods and systems are provided for packing a required quantity of products, wherein a plurality of different packages for packing the products and a plurality of packaging specifications comprising rounding rules are provided. In one implementation, a method is provided comprising determining a packaging specification out of a plurality of packaging specifications, extracting parameter values form the determined packaging specification and rounding, according to a predetermined packaging specification, the required quantity of products to a multiple of packages.Type: GrantFiled: September 7, 2006Date of Patent: November 24, 2009Assignee: SAP AGInventors: Andreas Huber-Buschbeck, Hans-Ulrich Von Helmolt
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Patent number: 7558680Abstract: Methods and systems of measuring progressive multilateral dysfunction of a system are provided. Methods of measuring progressive multilateral dysfunction of a system include, obtaining a plurality of different health measures for the system, defining a multidimensional space with one dimension corresponding to each health measures and defining a point in the multidimensional space representing the values of the health measures. Further the method includes, comparing the position of the defined point to a predefined trajectory through said multidimensional space representing progressive multilateral dysfunction of the system where the measure of the progressive multilateral dysfunction of the system is calculated from the position of the point relative to the predefined trajectory.Type: GrantFiled: August 19, 2004Date of Patent: July 7, 2009Assignee: Siemens Medical Solutions USA, Inc.Inventors: Jerome Marie Joseph Declerck, Thomas George Wright, Robert Ainsley Mclaughlin
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Patent number: 7526535Abstract: A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's measurement system hardware (and/or software) to perform the desired task. Additionally, if the user does not have the hardware required to perform the task, the required hardware may be sent to the user, along with programs and/or configuration information. The hardware may be reconfigurable hardware, such as an FPGA or a processor/memory based device. In one embodiment, the required hardware may be pre-configured to perform the task before being sent to the user. In another embodiment, the system and method may provide a graphical program in response to receiving the user's task specification, where the graphical program may be usable by the measurement system to perform the task.Type: GrantFiled: January 18, 2005Date of Patent: April 28, 2009Assignee: National Instruments CorporationInventors: Joseph E. Peck, Matthew Novacek, Hugo A. Andrade, Newton G. Petersen, Ganesh Ranganathan, Brian Sierer, John Pasquarette
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Patent number: 7506282Abstract: An apparatus and methods for predicting and/or for calibrating memory yields due to process defects and/or device variations, including determining a model of a memory cell, identifying a subset of parameters associated with the model, determining and executing a refined model using the parameters, determining a predicted probability the simulated memory cell will be operational based on the simulated operation of the refined model, determining yield prediction information from the predicted probability, and determining the minimum number of repair elements to include in a memory array design to insure a desired yield percentage based on the yield prediction information.Type: GrantFiled: August 18, 2005Date of Patent: March 17, 2009Assignee: International Business Machines CorporationInventors: Chad A. Adams, Anthony G. Aipperspach, George F. Paulik
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Patent number: 7502709Abstract: A method of monitoring a dual damascene procedure that includes calculating a pre-processing confidence map for a damascene process, the pre-processing confidence map including confidence data for a first set of dies on the wafer. An expanded pre-processing measurement recipe is established for the damascene process when one or more values in the pre-processing confidence map are not within confidence limits established for the damascene process. A reduced pre-processing measurement recipe for the first damascene process is established when one or more values in the pre-processing confidence map are within confidence limits established for the damascene process.Type: GrantFiled: March 28, 2006Date of Patent: March 10, 2009Assignees: Tokyo Electron, Ltd., International Business Machines CorporationInventors: Merritt Funk, Radha Sundararajan, Daniel Joseph Prager, Wesley Natzle
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Patent number: 7463158Abstract: The present invention provides an acoustic particle alarm comprising a particle sensor for indicating the concentration of particles exceeding a specified size and specified concentration, for particles entrained in a fluid flow impinging on a front face of the sensor, and a nozzle for directing the fluid flow such that the particles impact the sensor in a direction substantially normal to the front face of the sensor. Each particle impacting the front face of the sensor causes a response in an output of the sensor with amplitude that is monotonic in the momentum of the impinging particle.Type: GrantFiled: October 19, 2005Date of Patent: December 9, 2008Assignee: Linear Measurements, Inc.Inventors: Robert K. Hatch, William D. Squire, Harper J. Whitehouse
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Publication number: 20080208511Abstract: An instrument for measuring the size distribution of a particle sample by counting and classifying particles into selected size ranges. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles at one time is reduced to an acceptable level. A light beam is focused or collimated through a sample cell, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle size. So both the decrease in the beam intensity, due to light removal by the particle, and increase of light, scattered by the particle, may be used to determine the particle size, to classify the particle and count it in a certain size range.Type: ApplicationFiled: October 25, 2007Publication date: August 28, 2008Inventor: Michael Trainer
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Publication number: 20080204719Abstract: An instrument for measuring the size distribution of a particle sample by counting and classifying particles into selected size ranges. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles at one time is reduced to an acceptable level. A light beam is focused or collimated through a sample cell, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle size. So both the decrease in the beam intensity, due to light removal by the particle, and increase of light, scattered by the particle, may be used to determine the particle size, to classify the particle and count it in a certain size range.Type: ApplicationFiled: October 26, 2007Publication date: August 28, 2008Inventor: Michael Trainer
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Patent number: 7412508Abstract: A device (1) for indicating downloading of a data item (3) by a user computer (5) from a first computer (7) using a data communication network (9) is disclosed. The device (1) comprises a processor (13) being configured for receiving an upload instruction for uploading the data item (3) from a second computer (15) to the user computer (5) via the data communication network (9). The upload instruction has been generated by a first markup language tag referring to the data item (3). The first markup language tag has been generated by a browser executable script uploaded to the user computer (5) from the first computer (7). The first markup language tag differs from a second markup language tag in a cache memory of the user computer (5) causing the user computer (5) to download from the second computer (15). The first and second markup language tags were generated by the browser executable script. The processor is also configured for indicating that the upload instruction has been received.Type: GrantFiled: August 26, 2003Date of Patent: August 12, 2008Assignee: Admeta ABInventors: Leif Jagerbrand, Fredrik Strauss
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Publication number: 20080077351Abstract: A data analysis method includes automatically generating a set of curve fits for a data set from a mass spectrometer. The set of curve fits includes a plurality of suggested curve fits, each associated with a curve fit equation type. For each suggested curve fit, a fit metric is generated that indicates how well the curve fit matches the data set. Thereafter, a user interface is displayed that includes a table of user selectable suggested curve fits for display. A default suggested curve fit having a highest fit metric is displayed. A user override selection may be received for displaying at least one of the suggested curve fits in the table. The set of suggested curve fits under consideration can be filtered to conform with user requirements.Type: ApplicationFiled: August 21, 2006Publication date: March 27, 2008Applicant: Agilent Technologies, Inc.Inventors: Marc Tischler, Vadim Kalmeyer
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Publication number: 20080040050Abstract: A mass spectrometer includes an ion detector, an analog-to-digital (A/D) converter, and a decimator. The analog-to-digital (A/D) converter is configured to receive and sample an analog signal from the ion detector thereby providing a first plurality of samples at a first rate. The decimator is configured to receive the first plurality of samples and to transmit, at a second rate, a second plurality of samples that are based on the first plurality of samples. The decimator is further configured to dynamically adjust the second rate so that memory requirements for the mass spectrometer are reduced.Type: ApplicationFiled: August 4, 2006Publication date: February 14, 2008Inventors: August Jon Hidalgo, John Christian Fjeldsted, William Daniel Frazer
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Publication number: 20080027676Abstract: A method of analyzing a dataset of spectra is provided in which each spectrum has a count value for each of a number of parameter values within a parameter range. The method is for identifying one or more parameter values that exhibit a significant variation within the dataset. A dataset of spectra is obtained and a statistical analysis is applied to the count values for each of the parameter values. The result of the analysis for each parameter value is a function of the variation in the count values. A spectrum that is representative of at least part of the dataset of spectra is then displayed together with the results of the statistical analysis. A corresponding computer program and system for performing the method are also disclosed.Type: ApplicationFiled: July 28, 2006Publication date: January 31, 2008Applicant: OXFORD INSTRUMENTS ANALYTICAL LIMITEDInventors: Peter John Statham, Charles Penman
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Publication number: 20080015810Abstract: When detecting light scattered by an object to be inspected by using a pulse laser as a light source, noise increases unless a sampling repletion period of an A/D converter is determined so as to be related to a pulse oscillation repetition period of the light source. (1) The sampling repletion period of the A/D converter is set equal to the pulse oscillation repetition period of the light source or an integer times thereof, and the sampling is synchronized with oscillation of the light source. Or (2) the sampling repletion period of the A/D converter is set equal to a half-integer times the pulse oscillation repetition period of the light source. Even if a ripple component resulting from emission pulses of the light source remains in the scattered light signal supplied to the A/D converter remains, therefore, its influence can be eliminated or reduced.Type: ApplicationFiled: July 12, 2007Publication date: January 17, 2008Inventor: Shigeru Matsui
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Patent number: 7308380Abstract: A planar pressure-sensitive switch unit has multiple pressure-sensitive switches that are disposed in a longitudinal direction of a bumper cover of a vehicle with given intervals for detecting the number of collision objects. Collision load sensors are disposed between a bumper reinforcement and side members for detecting a total collision load by adding up two outputs. Then, a collision load per a single collision object is computed by dividing the total collision load by the number of collision objects and is compared with a collision load corresponding to a pedestrian. Thus, even when the vehicle collides with multiple objects at the same time, collision with a pedestrian can be properly determined.Type: GrantFiled: October 13, 2005Date of Patent: December 11, 2007Assignee: DENSO CORPORATIONInventor: Takatoshi Tanabe
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Patent number: 7277777Abstract: A method to adjust a boiler having a flue gas duct including: sensing flue gas emissions in the gas duct with a plurality of emission sensors arranged in an array; generating a multidimensional graphical depiction of the flue gas emissions by plotting sensor data captured from the emission sensor; adjusting the boiler to modify the distribution of flue gases in the gas duct; generating a subsequent multidimensional graphical depiction of the flue gas emissions by plotting sensor data captured subsequent to the boiler adjustment, and repeating these steps until the graphical depiction displays an acceptable plot of flue gas emissions.Type: GrantFiled: March 6, 2006Date of Patent: October 2, 2007Assignee: General Electric CompanyInventors: Dean E. Draxton, Craig Gordon Stephens
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Patent number: 7243034Abstract: A sensor device according to the present invention has a detection mode for detecting an object W, a first setting mode for changing the output duration of an output signal, and a second setting mode for changing a light-emission period of light emitted to the object W. These modes are switchable by a mode selector switch 12. If a rotary control knob 15 is operated in the detection mode, a CPU 30 changes a setting of a threshold value in response to the operation of the rotary control knob 15 and displays the changed setting of the threshold value on a digital indicator 20. This makes it possible to accurately change settings through relatively simple operations. The rate of change may correspond to the speed of operation of the knob.Type: GrantFiled: July 28, 2005Date of Patent: July 10, 2007Assignee: SUNX LimitedInventors: Masahiro Fujita, Yoji Shibata
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Patent number: 7200498Abstract: The present invention defines a system (100) for detecting copper contamination within a semiconductor manufacturing process. According to the present invention, a semiconductor wafer (102) is transferred (108) from a semiconductor manufacturing component (104), which may have exposed the wafer to copper contamination, to a measurement system (106). The measurement system measures an electrical value at a plurality of locations along a surface of the wafer, prior to and after exposure of the surface to an activation system (112). The activation system is provided to cause any copper contamination along the surface to form a precipitate thereon. An analysis component (110) is provided to receive electrical value and location information from the measurement system and to identify, from the measurements, the presence and location of copper contamination along the semiconductor wafer surface.Type: GrantFiled: May 26, 2004Date of Patent: April 3, 2007Assignee: Texas Instruments IncorporatedInventor: Deepak A. Ramappa
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Patent number: 7130771Abstract: The present invention is directed to a method for generating a list of package shipment routes in a shipment solution system comprising the steps of entering product information, place of origin, destination and shipment temperature parameters for a package into the system. A list is generated containing a listing of all possible shipment routes available for the package between the place of origin and the destination. For each of the shipment routes, an ambient thermal temperature model is generated corresponding to the external temperatures the package is exposed to during each of the possible shipment routes. The thermal characteristics of the package are calculated along the available shipping routes, based on each of the ambient thermal temperature models, so as to determine feasible shipment routes and corresponding packaging information.Type: GrantFiled: August 5, 2002Date of Patent: October 31, 2006Inventor: Xerxes Aghassipour
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Patent number: 7115857Abstract: Apparatus for remotely counting the number of individual objects of the same general shape and disposed in a collection having a front end in a common vertical plane.Type: GrantFiled: June 27, 2005Date of Patent: October 3, 2006Assignee: River City Software LLCInventor: Anthony Joseph Berke
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Patent number: 7117101Abstract: A remote particle counter comprising a pulsed laser generator, laser light emitting optics, scattered light collecting optics, a high-sensitivity two-dimensional photo detector as a scattered light detecting portion having a fast gating capability such as a CCD camera, and a control and measure system, wherein suspended fine particles forming aerosols in the atmosphere which are far away from the site of laser emission are illuminated with laser light, the resulting backward scattered light from the individual fine particles is detected as image, and the number and size distribution of the suspended fine particles are measured at a remote site.Type: GrantFiled: January 27, 2004Date of Patent: October 3, 2006Assignee: Japan Atomic Energy Research InstituteInventors: Akira Ohzu, Masaaki Kato, Katsuaki Akaoka, Yoichiro Maruyama
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Patent number: 7085670Abstract: A system and method for configuring a device to perform a function, where the device includes a programmable hardware element and one or more fixed hardware resources. A program is stored which represents the function. A hardware configuration program is generated based on the program, specifying a configuration for the programmable hardware element that implements the function, and usage of the fixed hardware resources by the programmable hardware element in performing the function. A deployment program deploys the hardware configuration program onto the programmable hardware element, where, after deployment, the device is operable to perform the function, where the programmable hardware element directly performs a first portion of the function, and the programmable hardware element invokes the fixed hardware resources to perform a second portion of the function. An optional measurement module couples to the device and performs signal conditioning and/or conversion logic on an acquired signal for the device.Type: GrantFiled: October 29, 2001Date of Patent: August 1, 2006Assignee: National Instruments CorporationInventors: Brian Keith Odom, Joseph E. Peck, Hugo A. Andrade, Cary Paul Butler, James J. Truchard, Newton G. Petersen, Matthew Novacek
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Patent number: 7043394Abstract: A novel measuring method which allows measurement of fine particles which are extremely fine and contained in a very small amount in ultrapure water is provided. The number frequency with respect to the fine particles having a particle diameter of 0.1 ?m or more is measured based on the finding that the fine particles contained in the ultrapure water at the use point of an ultrapure water production system exhibits a logarithmic normal distribution to determine the logarithmic normal distribution of the fine particles contained in the ultrapure water, and the number of the fine particles having a particle diameter of less than those of the measured particles contained in the ultrapure water is obtained from the distribution.Type: GrantFiled: April 25, 2003Date of Patent: May 9, 2006Assignee: Nomura Micro Science Co., Ltd.Inventors: Yasuo Kousaka, Mutsuko Endou, Seiichi Inagaki, Takazou Hirose, Motonori Yanagi
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Patent number: 7028723Abstract: An apparatus and method are used to perform the verification of a pharmaceutical prescription after it is filled but prior to shipment. Due to the high volume of mail/internet orders, the analysis is to be performed on the whole prescription, not on each individual pill of the prescription. The apparatus automatically gathers information about the pills contained in a pill bottle, including image and weight information, and incorporates a decision-making engine to decide whether the content of the pill bottle matches the prescription order.Type: GrantFiled: November 2, 2004Date of Patent: April 18, 2006Inventors: Ali Tahor Alouani, Kenneth R. Currie
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Patent number: 6970799Abstract: A method and apparatus provides for particle size detection. A particle detector signal is utilized to provide particle size information. The particle detection signal is obtained by utilizing particle detector information.Type: GrantFiled: October 2, 2003Date of Patent: November 29, 2005Assignee: AirAdvice, Inc.Inventor: Meindert J. Kleefstra
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Patent number: 6963782Abstract: The present invention includes a system and method for fine tuning the control of a manufacturing process. A material adjusting device is in communication with a PID controller and PID control loop, and is used to alter a flow of material used in the manufacturing process, so as to maintain a target physical property of the material at a setpoint. A measurement device captures measurements of the flow relevant to the physical property of interest. A change is introduced to the material adjusting device while the PID controller and PID control loop are disabled, and appropriate measurements of the flow are continually captured; a process that may be repeated several times. Once sufficient physical property measurement data has been captured, the data is loaded into an optimization program that outputs optimized controlled parameters that may be used by the PID controller and control loop to better control the physical property of the material.Type: GrantFiled: April 15, 2003Date of Patent: November 8, 2005Assignee: Automation and Control Technology, Inc.Inventors: Steve Kieman, David Honigford