Histogram Distribution Patents (Class 702/180)
  • Patent number: 6535836
    Abstract: A method for analyzing an abnormal particle population in an experimental sample containing particles involves a particle property distribution index based on an average particle property (e.g., size) distribution curve for multiple normal samples in a particle analysis instrument. The process involves producing an experimental particle property distribution curve by analyzing an experimental sample containing particles in the instrument. The distribution curve of the experimental sample is analyzed to identify particle populations at the lower or upper region of the experimental distribution curve that differ from particle populations in the regions of an average particle property distribution curve. Thereafter, the number of particles within the lower or upper region of the experimental distribution curve that differs from the average curve is determined and employed for diagnosis of a relevant characteristic of the particle population.
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: March 18, 2003
    Assignee: Coulter International Corp.
    Inventor: Eric Malcolm Grace
  • Patent number: 6516277
    Abstract: This invention relates to methods and apparatus for determining the multi-dimensional topology of a substance (system) within a volume (space). A method according to a preferred embodiment of the invention comprises the steps of: acquiring a set of relative values for the density (scalar properties) of the volume, each value for a given location (point) within the volume; interpolating a set of functions to generate a continuous relative density for the volume; identifying critical points of the continuous relative density by using an eigenvector following method; and associating critical points with one another by following a gradient path of the continuous relative density between the critical points. The method is applicable to a wide range of data relating to fields such as crystallography, fluid dynamics, edge detection, and financial markets, to determine the topology of structures contained therein.
    Type: Grant
    Filed: February 4, 2002
    Date of Patent: February 4, 2003
    Assignee: Queen's University at Kingston
    Inventors: Kenneth E. Edgecombe, Alan D. Ableson
  • Patent number: 6470297
    Abstract: The present invention is a method of accentuating a deviation in a set of information and locating a cause thereof that includes the steps of receiving a set of information; selecting a subset of information; setting initial states; setting transition states; initializing a vector; selecting the first information segment; modifying the vector if the information segment contains an initial and transition state, otherwise stopping; selecting the next available information segment and returning to the previous step, otherwise recording a number of occurrences of each unique vector; determining the number of the least occurring vector; dividing each occurrence number by the least occurring number; determining an occupation time for each vector; calculating an inverse characteristic time for each unique vector; calculating at least one subset value for the subset of information using a temperature-based function, an entropy-based function, an energy-based function, or any combination thereof; setting a value vi fo
    Type: Grant
    Filed: June 21, 2000
    Date of Patent: October 22, 2002
    Assignee: The United States of America as represented by the Director of the National Security Agency
    Inventor: David K. Ford
  • Publication number: 20020138231
    Abstract: Circuitry for generating a histogram of output codes produced by an analog/digital converter (ADC) on an integrated circuit chip includes a comparator, disposed on the chip together with the ADC. A first input of the comparator is coupled to receive output codes from the ADC, while a second input is coupled to receive a sequence of target codes covering at least a portion of a range of the output codes. A pulse generator is disposed on the chip together with the ADC and the comparator, and coupled to receive the output of the comparator and, when the output is in the first state, to generate pulses for output from the chip at a pulse rate determined by a clock signal of the ADC.
    Type: Application
    Filed: March 23, 2001
    Publication date: September 26, 2002
    Applicant: International Business Machines Corporation
    Inventors: Israel Wagner, Tibi Galambos
  • Patent number: 6449584
    Abstract: A method of processing data representing intensity values of a measurement signal as a function of a discrete variable such as time, which signal being characterized by series of peaks mixed with a substantially regular background noise, provides efficient noise attenuation and peak detection capabilities. When applied to a two-dimensional system, the method comprises an initial step of forming an intensity histogram vector representing a frequency distribution from the intensity values, which intensity histogram vector having N frequency vector components associated with corresponding N intensity sub-ranges within a maximum range extending from a minimum intensity value to a maximum intensity value. This initial step is followed by a step of zeroing a portion of the data corresponding to the intensity values which are below an intensity threshold value derived from shape characteristics of the distribution.
    Type: Grant
    Filed: November 8, 1999
    Date of Patent: September 10, 2002
    Assignee: Université de Montréal
    Inventors: Michel J. Bertrand, Dimo Zidarov
  • Patent number: 6445969
    Abstract: A method and system for monitoring process parameters associated with a manufacturing or testing process. The system includes: at least one machine which is used in the manufacturing or testing process; at least one sensing device, coupled to the at least one machine, for measuring a process parameter associated with the at least one machine; and a controller, coupled to the at least one sensing device, for receiving and storing measured data from the at least one sensing device. The method includes the acts of: measuring a value of a process parameter associated with a machine used in the manufacturing or testing process; converting the measured value of the process parameter into a digital data signal having a specified data format; transmitting the digital data signal to a controller; and storing the digital data signal in a database.
    Type: Grant
    Filed: January 9, 1998
    Date of Patent: September 3, 2002
    Assignee: Circuit Image Systems
    Inventors: Jim Kenney, John Leon
  • Publication number: 20020103619
    Abstract: A method and system for monitoring, maintaining and analyzing statistical performance information in a signal processing system includes collecting data representing a plurality of aspects of the signal processing system, developing a histogram representative of the data in accordance with a chosen algorithm, and analyzing historical histogram data to generate condition signals for use by the signal processing system.
    Type: Application
    Filed: November 29, 2000
    Publication date: August 1, 2002
    Inventor: Karl M. Bizjak
  • Patent number: 6360183
    Abstract: The device and method for triggering a random event is suited for use as an RPG in a Packinko gaming machine and involves the use of a radioactive source and detector. Repeated measurement of decay events detected by the detector during selected time periods are compared against one another and preferably against a predetermined number and a win event is triggered when the numbers are equal. Appropriate selection of the predetermined number for comparison determines the probability of a win event being triggered. With this device and method materials having very low radioactivity may be used. Also, the device and method operates to trigger a win event at a desired probability without the need for the Mean output of the radioactive material to be measured accurately.
    Type: Grant
    Filed: March 19, 1999
    Date of Patent: March 19, 2002
    Assignee: Nycomed Amersham PLC
    Inventor: Mark Golder Shilton
  • Patent number: 6351724
    Abstract: An apparatus and method are presented for monitoring the performance of a microprocessor. The apparatus includes performance monitoring hardware incorporated within the microprocessor. The performance monitoring hardware includes a memory unit for storing performance data. The memory unit includes multiple memory locations, each memory location being accessed by a unique set of address signals. Circuitry within the performance monitoring hardware produces the address signals. In one embodiment, the performance monitoring hardware includes an event select register array and circuitry for producing a set of high order (i.e., most significant) address signals. The event select register array preferably includes several event select registers for storing binary codes corresponding to selected events. A performance data acquisition period is divided into multiple histogram time periods of equal length. The high order address signals partition the memory unit into sections.
    Type: Grant
    Filed: January 10, 2001
    Date of Patent: February 26, 2002
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Steven R. Klassen, Atish Ghosh, Hans L. Magnusson
  • Patent number: 6345235
    Abstract: This invention relates to methods and apparatus for determining the multi-dimensional topology of a substance (system) within a volume (space). A method according to a preferred embodiment of the invention comprises the steps of: acquiring a set of relative values for the density (scalar properties) of the volume, each value for a given location (point) within the volume; interpolating a set of functions to generate a continuous relative density for the volume; identifying critical points of the continuous relative density by using an eigenvector following method; and associating critical points with one another by following a gradient path of the continuous relative density between the critical points, The method is applicable to a wide range of data relating to fields such as crystallography, fluid dynamics, edge detection, and financial markets, to determine the topology of structures contained therein.
    Type: Grant
    Filed: May 29, 1998
    Date of Patent: February 5, 2002
    Assignee: Queen's University at Kingston
    Inventors: Kenneth E. Edgecombe, Alan D. Ableson
  • Patent number: 6332178
    Abstract: A method estimates statistics of properties of transactions processed by a memory sub-system of a computer system. The method randomly selects memory transactions processed by the memory sub-system. States of the system are recorded as samples while the selected transaction are processed by the memory sub-system. The recorded states from a subset of the selected transactions are statistically analyzed to estimate statistics of the memory transactions.
    Type: Grant
    Filed: November 26, 1997
    Date of Patent: December 18, 2001
    Assignee: Compaq Computer Corporation
    Inventors: Jeffrey A. Dean, James E. Hicks, Jr., Carl A. Waldspurger, William E. Weihl
  • Patent number: 6327549
    Abstract: A differential correction apparatus for use with a spectroscopy device. The spectroscopy device simultaneously produces two histograms corresponding to the spectrum acquired. The first histogram contains the counts recorded by a differential correction method (DCM), giving the best estimate of the counts per channel in the absence of dead time. The second histogram is the error spectrum, giving the variance of the counts in each channel of the first spectrum. The two spectra have the same size, true acquisition time, and energy calibration with the only difference being the number of counts in each channel. By obtaining both histograms, it is possible to both obtain an accurate spectrum when the energy peaks have varying decay times and retain the necessary information about the spectrum to allow the statistical error to be calculated.
    Type: Grant
    Filed: July 12, 2000
    Date of Patent: December 4, 2001
    Assignee: PerkinElmer, Inc.
    Inventors: Russell D. Bingham, Dale A. Gedcke, Rex C. Trammell, Timothy R. Twomey, Ronald M. Keyser
  • Publication number: 20010044704
    Abstract: A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.
    Type: Application
    Filed: June 27, 2001
    Publication date: November 22, 2001
    Applicant: Wavecrest Corporation
    Inventors: Peng Li, Ross Adam Jessen, Jan Brian Wilstrup, Dennis Petrich
  • Patent number: 6317662
    Abstract: The stability of a recursive estimator process (e.g., a Kalman filter is assured for long time periods by periodically resetting an error covariance P(tn) of the system to a predetermined reset value Pr. The recursive process is thus repetitively forced to start from a selected covariance and continue for a time period that is short compared to the system's total operational time period. The time period in which the process must maintain its numerical stability is significantly reduced as is the demand on the system's numerical stability. The process stability for an extended operational time period To is verified by performing the resetting step at the end of at least one reset time period Tr whose duration is less than the operational time period To and then confirming stability of the process over the reset time period Tr.
    Type: Grant
    Filed: July 24, 2000
    Date of Patent: November 13, 2001
    Assignee: Hughes Electronics Corporation
    Inventors: Rongsheng Li, Yeong-Wei Andy Wu
  • Patent number: 6298315
    Abstract: A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.
    Type: Grant
    Filed: December 11, 1998
    Date of Patent: October 2, 2001
    Assignee: Wavecrest Corporation
    Inventors: Peng Li, Ross Adam Jessen, Jan Brian Wilstrup, Dennis Petrich
  • Patent number: 6295508
    Abstract: An automatic pole-zero (APZ) adjustment circuit for an ionizing radiation spectroscopy system. An amplitude histogram of an acquired spectrum is obtained. The shape of a selected peak from the amplitude histogram is analyzed for peak shape distortion indicating the existence of undershoot or overshoot. An analog correction signal generated by a pole-zero adjustment network is added to cancel existing undershoot or overshoot, thereby minimizing distortion of the peak shape. In an alternate embodiment, the correction signal is a digital transformation algorithm applied to a programmable digital shaping filter, thereby digitally minimizing distortion of the peak shape.
    Type: Grant
    Filed: September 1, 1999
    Date of Patent: September 25, 2001
    Assignee: PerkinElmer Instruments, Inc.
    Inventors: Rex C. Trammell, Russell D. Bingham, Dale A. Gedcke
  • Patent number: 6295514
    Abstract: A system method, and computer program product for visualizing and interactively analyzing data relating to chemical compounds. A user selects a plurality of compounds to map, and also selects a method for evaluating similarity/dissimilarity between the selected compounds. A non-linear map is generated in accordance with the selected compounds and the selected method. The non-linear map has a point for each of the selected compounds, wherein a distance between any two points is representative of similarity/dissimilarity between the corresponding compounds. A portion of the non-linear map is then displayed. Users are enabled to interactively analyze compounds represented in the non-linear map.
    Type: Grant
    Filed: November 4, 1997
    Date of Patent: September 25, 2001
    Assignee: 3-Dimensional Pharmaceuticals, Inc.
    Inventors: Dimitris K. Agrafiotis, Victor S. Lobanov, Francis R. Salemme
  • Patent number: 6233531
    Abstract: An apparatus and method are presented for monitoring the performance of a microprocessor. The apparatus includes performance monitoring hardware incorporated within the microprocessor. The performance monitoring hardware includes a memory unit for storing performance data. The memory unit includes multiple memory locations, each memory location being accessed by a unique set of address signals. Circuitry within the performance monitoring hardware produces the address signals. In one embodiment, the performance monitoring hardware includes an event select register array and circuitry for producing a set of high order (i.e., most significant) address signals. The event select register array preferably includes several event select registers for storing binary codes corresponding to selected events. A performance data acquisition period is divided into multiple histogram time periods of equal length. The high order address signals partition the memory unit into sections.
    Type: Grant
    Filed: December 19, 1997
    Date of Patent: May 15, 2001
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Steven R. Klassen, Atish Ghosh, Hans L. Magnusson
  • Patent number: 6210983
    Abstract: A method for predicting yield limits of semiconductor wafers in a factory, including the steps of generating a wafer probe test pareto, determining a histogram of the distribution from a selected group from the wafer probe test pareto, extracting parametric data from a database from the histogram, screening the parametric data for values of the parametric data outside of a predetermined range, determining if an average value of the screened parametric data shows a sensitivity to variations in the parametric data, determining specification limits of the screened parametric data, and using the specification limits to form an operating window to show the sensitivity.
    Type: Grant
    Filed: June 15, 1999
    Date of Patent: April 3, 2001
    Assignee: Texas Instruments Incorporated
    Inventors: Nick Atchison, Ron Ross
  • Patent number: 6188990
    Abstract: A method and apparatus is provided for monitoring the processing of a group of articles having different properties, for example differing weights and/or quality grades. The method includes the steps of obtaining information about the differing properties of the group, using this information to provide a main visual model of the property distribution within the group, and providing a first subsidiary visual model relating to the processing of a first sub-group of articles from within the group, the provision of the first subsidiary model causing a modified form of the main visual model to appear, related to the remaining articles of the group after removal of the articles forming the first sub-group. The method is particularly effective for use in monitoring the processing of poultry carcasses being conveyed in succession along a path, for sorting by weight and grade of carcass.
    Type: Grant
    Filed: November 13, 1998
    Date of Patent: February 13, 2001
    Assignee: Autosystems Limited
    Inventors: Richard Morley Brook, Christopher Bernard Bullivant
  • Patent number: 6148268
    Abstract: An efficient method for optimization of product characteristics or manufacturing processes. The method utilized a Chi-square model to identify error sources that contribute to the product or process variability. The method is particularly useful for evaluation of processes related to optics and electronics fabrication but also has application in fields where a chi-square distribution is observed.
    Type: Grant
    Filed: June 2, 1998
    Date of Patent: November 14, 2000
    Inventors: Yongan Wu, Constance J. Chang-Hasnain
  • Patent number: 6108647
    Abstract: A novel and unique method of approximating the data cube and summarizing database data in order to provide quick and approximate answers to aggregate queries by precomputing a summary of the data cube using histograms and answering queries using the substantially smaller summary. A unique method according to the present invention provides for identifying accurate histogram classes and distributing the space among the histograms on various sub-cubes such that the errors are minimized, while at the same time computer resources are maximized.
    Type: Grant
    Filed: May 21, 1998
    Date of Patent: August 22, 2000
    Assignee: Lucent Technologies, Inc.
    Inventors: Viswanath Poosala, Venkatesh Ganti
  • Patent number: 6088658
    Abstract: Statistical methods of partial discharge analysis utilizing histogram similarity measures are provided by quality assessment and condition monitoring methods of evaluating high voltage electrical insulation. The quality assessment method is utilized to evaluate the quality of insulation within the electrical equipment. The condition monitoring method is utilized during normal operation of the equipment to identify degradation in the insulation and to predict catastrophic insulation failures.
    Type: Grant
    Filed: April 11, 1997
    Date of Patent: July 11, 2000
    Assignee: General Electric Company
    Inventors: Birsen Yazici, John Raymond Krahn
  • Patent number: 6055484
    Abstract: This counting apparatus is a tool monitor and assembly qualifier that verifies that the correct number of fasteners have been properly installed into an assembly. When used in conjunction with a pressure tool, proper fastener torque and count can be verified. The device monitors internal tool pressures and has the ability to "learn" the pressure characteristics of the tool during the assembly process. This assembly qualifier is a device that monitors either the pressure of an air tool, the current of an electrical tool or the torque of a mechanical wrench to determine if the tool shut off at a target torque. The qualifier also determines if some unknown means shuts off the tool.
    Type: Grant
    Filed: April 20, 1999
    Date of Patent: April 25, 2000
    Assignee: C.E. Electronics, Inc.
    Inventor: Richard G. Lysaght
  • Patent number: 5999918
    Abstract: A computer interface system that includes interactive interface controls as well as aural and kinetic interface controls to assist in educating a user, in profiling a user, and in controlling and monitoring the implementation of actions involving probabilistic distributions. The system allows the user to indicate, either directly or indirectly, a confidence level that he or she desires for actions such as investments, as well as other characteristics and constraints. The user is able to manipulate the interface controls to evaluate results in terms of confidence and risk. If the user approves the results and his or her profile, in a preferred embodiment the selections are transmitted to effectuate an action.
    Type: Grant
    Filed: April 2, 1997
    Date of Patent: December 7, 1999
    Assignee: Rational Investors, Inc.
    Inventors: James Benjamin Williams, Stanley W. Lyness, Francois G. Gadenne, William J. Fox
  • Patent number: 5974403
    Abstract: A computer implemented tool forecasts the spot price of electric power in a deregulated market and the amounts of power that may be traded in this market. Using generating capacities of multiple utilities, price functions, weather forecasts, and transmission variables, the computer implemented tool makes these forecasts at different delivery points, providing the decision maker with probabilistic distributions for spot prices and trading.
    Type: Grant
    Filed: July 21, 1997
    Date of Patent: October 26, 1999
    Assignee: International Business Machines Corporation
    Inventors: Samer Takriti, Liliam Shiao-Yen Wu
  • Patent number: 5918200
    Abstract: In a state estimating apparatus, an input space quantization section quantizes an input space according to a required precision of output data. A storage section calculates and stores the number of times of occurrence of output data corresponding to each input event in the quantized input space, the mean values of the output data, and the change amounts of the output data. A neighborhood definition section calculates an input space neighborhood satisfying the required precision of the output. A similar case extraction section zooms up the predetermined neighborhood of the input space to the predetermined degree and extracts input case similar to the neighborhood from input case in the input space. A similarity determination section determines the similarity between the new input event and the extracted similar input cases on the basis of the degree of zooming.
    Type: Grant
    Filed: August 19, 1993
    Date of Patent: June 29, 1999
    Assignee: Yamatake-Honeywell Co., Ltd.
    Inventors: Hiroaki Tsutsui, Atsushi Kurosaki, Kazuyuki Kamimura, Tadahiko Matsuba
  • Patent number: 5864483
    Abstract: A system (10) is provided for monitoring services or products. The system (10) includes an interface (12, 18) which can receive criteria information (14) specifying an unacceptable level for services or products. The interface (12, 18) can also receive services or products information (20) relating to the services or products. A database (16), which is coupled to the interface (12, 18), stores the criteria information (14). A processor (22, 27) is coupled to the database (16) and the interface (12, 18). The processor (22, 27) can identify non-random patterns in a predefined danger zone in order to determine when the services or products are approaching the unacceptable level specified in the criteria information (14), thereby monitoring the services or products.
    Type: Grant
    Filed: August 1, 1996
    Date of Patent: January 26, 1999
    Assignee: Electronic Data Systems Corporation
    Inventor: Harriet E. Brichta
  • Patent number: 5822718
    Abstract: A device and method are disclosed which perform diagnostics on a microphone and display diagnostic information and instructions to a user. The invention uses a processor to create histograms of the PCM (Pulse Code Modulation) signal after removing any dc bias to determine signal and noise levels and ratios, as well as other parameters. Messages are generated and displayed by the device and method to inform a user that the microphone is working correctly or about possible malfunctions, such as low gain. The messages can advise the user on steps to take to correct the malfunctions, for example, to try a different adapter cable or plug.
    Type: Grant
    Filed: January 29, 1997
    Date of Patent: October 13, 1998
    Assignee: International Business Machines Corporation
    Inventors: Raimo Bakis, Francis Fado, Peter John Guasti, Amado Nassiff