Abstract: A method for reconstructing uncorrectable forward error correction (FEC) data includes generating and transcoding a known bit sequence and transmitting a FEC encoded codeword that includes a payload containing the transcoded known bit sequence through a component under test. The method further includes receiving the FEC encoded codeword transmitted via the component under test and determining that the encoded contents of the FEC encoded codeword contains a number of symbol errors that exceeds a predefined threshold. The method also includes utilizing stored scramble seed bits corresponding to an immediately preceding FEC encoded codeword and the transcoded known bit sequence to generate a reconstructed codeword.

Abstract: A shared bus for inter-channel communication comprising two or more channels having signal processing elements such that each channel is configured to receive and process an incoming channel specific signal. A sequence generator is configured to generate a test sequence suitable for testing the signal processing elements of a channel. An error checker is configured to error check incoming channel specific signals. A shared bus connects to the two or more channels to communicate an incoming channel specific signal to the error checker and communicate the test sequence to the signal processing elements of a channel. One or more pull up resistors and/or termination resistors connect to the shared bus. The bus may comprise a clock signal path and a data signal path. The test sequence may be a pseudo-random bit sequence. The bus interface comprises an open collector current mode logic driver in cascode arrangement.

Abstract: A PAM (Pulse Amplitude Modulation) modulator driver is configured to receive a PAM input signal having N input amplitude levels and provide a PAM output signal having N output amplitude levels, where N is an integer. The PAM modulator driver circuit configured to electrically adjust amplitude levels in the PAM output signal.

Abstract: A variety of applications can include systems and methods that include a memory system tester having an analyzer coupled to a test flow controller. The test flow controller can be arranged to generate test signals to a memory system with the analyzer arranged to couple to test pads of a package platform for the memory system. The analyzer can provide data to the test flow controller to conduct testing and/or debugging of the memory system, with the data based on real time monitoring of the test pads of the package platform. In various embodiments, the analyzer can provide data feedback to the test flow controller in real time such that the test flow controller can control the flow of test signals to the memory system in real time. Additional apparatus, systems, and methods are disclosed.

Abstract: In one embodiment, a method includes receiving data comprising a plurality of data elements; creating a binary sequence comprising a plurality of bonus bits using a first binary sequence generator; using a first exclusive-or module to provide a XOR calculation using bits of each data element of the data with a bonus bit from the binary sequence; passing each data element along with its corresponding parity bit to an input of a data path; receiving each data element along with its corresponding parity bit at an output of the data path; creating the binary sequence using a second binary sequence generator; using a second XOR module to XOR together bits of each data element along with its corresponding parity bit and a bonus bit from the binary sequence to produce a result; and analyzing the result to determine whether an error has occurred to the data in the data path.

Abstract: An Integrated Circuit (IC) includes a digital phase-locked loop (DPLL) circuit and DPLL Diagnostics circuitry (DPLL-DC). The DPLL circuit includes an oscillator, a digital phase detector and a digital feedback bus (DPLL-DFB). The oscillator is configured to generate an output signal. The digital phase detector is configured to generate a digital feedback signal indicative of a phase difference between the output signal and a reference input signal. The DPLL-DFB is configured to feed-back the digital feedback signal for controlling the oscillator. The DPLL-DC is coupled to the DPLL-DFB and is configured to monitor events depending at least on the digital feedback signal transferred on the DPLL-DFB.

Abstract: The disclosure relates to evaluating bit error vectors for symbol error analysis on real-world framed signals. Forward error correction (FEC) may generate a bit error vector to correct binary lanes such as non-return-to-zero (NRZ) lanes demultiplexed from a symbol-encoding lane such as a 4-level pulse amplitude modulation (PAM-4) lane. An apparatus may apply the bit error vector to the demultiplexed NRZ lanes to identify bit errors that occurred on the NRZ lanes. The apparatus may map the bit errors on the NRZ lanes to symbol errors on the PAM-4 lane. The apparatus may generate detailed symbol error information based on the identified symbol errors. The symbol error information may then be used for link tuning, thereby mitigating the effects of high frequency physical effects and other impairments on high-speed data links.

Abstract: A semiconductor apparatus includes a test entry control block configured to generate a plurality of trigger signals and a reset signal according to a test setting command and addresses; and a test entry signal generation block configured to enable a test entry signal when the plurality of trigger signals are sequentially enabled.

Abstract: The present invention relates to a method for synchronized communication in access network applied G.hn technology thereto, access network multiplexer (GAM), an access network terminal (GNT), and access network system using the same, which comprises a plurality of domain masters that communicate with the access network terminal; a clock controller controlling at least one of speed or output of the signal that the domain master transmits; and an access network terminal which communicates with the access network multiplexer (GAM) connecting the domain masters and G.hn specification physical layer, and at least one of speed or output of the signal that the access terminal transmits is controlled by the clock control unit. The present invention provides efficient data transmission and high bandwidth to service subscribers with applying G.hn technology to conventional coaxial cable or telephone line, thereby reducing crosstalk occurred in data transmission.

Abstract: A clock divider comprises a clock delay line that comprises a plurality of delay elements, a clock delay selector coupled to the clock delay line and configured to select one of the plurality of delay elements and a bit pattern source coupled to the clock delay selector. The clock delay line is configured to generate a modulated divided clock signal with a suppressed fundamental spectral component.

Abstract: In one embodiment, a method includes receiving data including a plurality of data elements and creating a binary sequence having a plurality of bonus bits using a first binary sequence generator. A total length of the binary sequence is equal to or greater than a predetermined maximum burst size, and the first binary sequence generator is configured to produce the binary sequence to have less than a 0.1% chance of matching any sequence of bits in the data while in a data path. Moreover, the method includes providing a parity calculation using bits of each data element along with a bonus bit from the binary sequence to produce a corresponding parity bit for each data element and passing bursts of data that include the plurality of data elements along with a number of parity bits to an input of the data path.

Abstract: A digital network assistant which can detect network anomalies, identify actions likely to remediate them, and assist the user in carrying out those actions. In particular, a digital network assistant constantly monitors data streams associated with the network to determine key performance indicators for the network. When these key performance indicators indicate a network anomaly, the digital network assistant associates it with a digital string to one or more actions likely to remediate similar network issues. The digital network assistant can take these actions automatically or present them to a user to be taken. The system can also aid the user in taking the required actions via an augmented reality interface. In addition, the system can create narratives embedding findings from data analysis eliminating subjectivity. The system can also find optimal parameter sets by continuously analyzing anomaly-free parts of the network and their key performance indicators.

Abstract: In an example of this disclosure, a method may include receiving, by a bit error location analyzer, a split information signal at a second data rate derived from an information signal at a first data rate. In this example, the second data rate is less than the first data rate, and the bit error location analyzer may be incapable of performing error analysis at the first data rate The method may include performing error analysis, by the bit error location analyzer, on information represented by the split information signal. In some examples, performing error analysis may include comparing the information represented by the split information signal to an information seed to determine a plurality of bit error locations in the information represented by the split information signal relative to the information seed.

Abstract: A test control port (TCP) includes a state machine SM, an instruction register IR, data registers DRs, a gating circuit and a TDO MX. The SM inputs TCI signals and outputs control signals to the IR and to the DR. During instruction or data scans, the IR or DRs are enabled to input data from TDI and output data to the TDO MX and the top surface TDO signal. The bottom surface TCI inputs may be coupled to the top surface TCO signals via the gating circuit. The top surface TDI signal may be coupled to the bottom surface TDO signal via TDO MX. This allows concatenating or daisy-chaining the IR and DR of a TCP of a lower die with an IR and DR of a TCP of a die stacked on top of the lower die.

Abstract: An integrated circuit and method of performing a reliability screen of an electrically programmable non-volatile memory array in the integrated circuit. At a first memory address of the array, a most stringent value of a sensing reference level at which correct data are read is identified. The remainder of the addresses of the array are evaluated in sequence, beginning at the value determined for the first address, and incrementally adjusting the sensing reference level for each, if necessary, until correct data are read at that address. The sensing reference level may be a reference current applied to a sense amplifier, against which read current from the addressed memory cell is compared, or may be control gate voltage applied to the control gate of a floating-gate transistor in the addressed memory cell.

Abstract: An integrated circuit and method of performing a reliability screen of an electrically programmable non-volatile memory array in the integrated circuit. At a first memory address of the array, a most stringent value of a sensing reference level at which correct data are read is identified. The remainder of the addresses of the array are evaluated in sequence, beginning at the value determined for the first address, and incrementally adjusting the sensing reference level for each, if necessary, until correct data are read at that address. The sensing reference level may be a reference current applied to a sense amplifier, against which read current from the addressed memory cell is compared, or may be control gate voltage applied to the control gate of a floating-gate transistor in the addressed memory cell.

Abstract: A semiconductor memory includes a memory block configured to perform an operation according to a first test pattern or a second test pattern, a switching circuit configured to provide the first test pattern or the second test pattern to the memory block according to a first test mode signal and a second test mode signal, and a test pattern setup circuit configured to store a test pattern source signal in a feedback loop varied according to a third test mode signal and output the stored test pattern source signal as the first test pattern.

Abstract: Messages transmitted between a receiver and a transmitter are used to maximize a communication data rate. In particular, a multicarrier modulation system uses messages that are sent from the receiver to the transmitter to exchange one or more sets of optimized communication parameters. The transmitter then stores these communication parameters and when transmitting to that particular receiver, the transmitter utilizes the stored parameters in an effort to maximize the data rate to that receiver. Likewise, when the receiver receives packets from that particular transmitter, the receiver can utilize the stored communication parameters for reception.

Abstract: An automated method for testing audio signal quality of cell phone transmissions provides a Mean Opinion Score (MOS) output using inexpensive test components. The test system uses a server computer to eliminate the need for expensive faders used in a bench test system. The server computer manipulates data packets from the reference media file to simulate impairments, including losses, errors, noise and jitter, at a much lower cost than using actual faders. Transmission through two separate radio access networks RANs is provided to simulate two parties communicating using separate mobile devices (an end-to-end test solution) with a single cell phone.

Abstract: A mechanism is provided for effectively validating cache coherency within a processor. For each node in a set of nodes, responsive to a node in a set of nodes being a controlling node, at least one action is performed on each controlled node mapped to the controlling node. After performing the at least one action on each controlled node mapped to the controlling node or responsive to the node failing to be a controlling node, a self-modifying branch test pattern is executed based on the selected execution pattern in the condition register through the set of nodes. Responsive to the self-modifying branch test pattern ending, values output from the execution unit during execution of the self-modifying branch test pattern are compared to a set of expected results. Responsive to a match of the comparison for the execution patterns in the set of execution patterns, the execution unit is validated.

Abstract: As single-ended signaling is implemented in higher-speed communications, accurate and consistent reading of the data signal becomes increasingly challenging. In particular, single-ended links can be limited by insufficient timing margins for sampling a received input signal. A single ended receiver provides for improved timing margins by adjusting a reference voltage used to sample the input signal. A calibration pattern is provided to the receiver as the input signal, and the reference voltage is adjusted toward a median value of the signal.

Abstract: A test pattern generating apparatus that generates a test pattern to be communicated with a device under test having a plurality of terminals, the test pattern generating apparatus comprising a primitive generating section that generates a cycle primitive indicating a signal pattern to be communicated with each of the terminals during a base cycle, based on instructions from a user; a device cycle generating section that generates a device cycle indicating signal patterns of a plurality of base cycles, by arranging a plurality of the cycle primitives based on instructions from the user; and a sequence generating section that generates a sequence of the test pattern to be supplied to the device under test, by arranging a plurality of the device cycles based on instructions from the user.

Abstract: A mechanism is provided for effectively validating execution units within a processor. A branch test pattern is generated for execution by an execution unit that is under validation testing. An execution pattern is selected from a set of execution patterns thereby forming a selected execution pattern. The selected execution pattern is loaded into a condition register. The branch test pattern is executed by an execution unit based on the selected execution pattern in the condition register. Responsive to the branch test pattern ending, values output from the execution unit during execution of the branch test pattern are compared to a set of expected results. Responsive to a match of the comparison, the process is repeated for each execution pattern in the set of execution patterns. Responsive to a match of the comparison for the execution patterns in the set of execution patterns, the execution unit is validated.

Abstract: A mechanism is provided for effectively validating execution units within a processor. A branch test pattern is generated for execution by an execution unit that is under validation testing. An execution pattern is selected from a set of execution patterns thereby forming a selected execution pattern. The selected execution pattern is loaded into a condition register. The branch test pattern is executed by an execution unit based on the selected execution pattern in the condition register. Responsive to the branch test pattern ending, values output from the execution unit during execution of the branch test pattern are compared to a set of expected results. Responsive to a match of the comparison, the process is repeated for each execution pattern in the set of execution patterns. Responsive to a match of the comparison for the execution patterns in the set of execution patterns, the execution unit is validated.

Abstract: A method for detecting unstable signatures when testing a VLSI chip that includes adding to an LFSR one or more save and restore registers for storing an initial seed consisting of 0s and 1s; loading the initial seed into the LFSR and one or more save and restore registers; initializing a MISR and running test loops. Upon reaching a predetermined number of test loops, moving a signature of the MISR to a shadow register; then, performing a signature stability test by loading the initial seed to the LFSR; executing the predetermined number of BIST test loops, and comparing a resulting MISR signature for differences versus a previous signature stored in a MISR save and restore register, wherein unloading is performed by way of serial MISR unloads and single bit XORs.

Abstract: A method and apparatus for evaluating and optimizing a signaling system is described. A pattern of test information is generated in a transmit circuit of the system and is transmitted to a receive circuit. A similar pattern of information is generated in the receive circuit and used as a reference. The receive circuit compares the patterns. Any differences between the patterns are observable. In one embodiment, a linear feedback shift register (LFSR) is implemented to produce patterns. An embodiment of the present disclosure may be practiced with various types of signaling systems, including those with single-ended signals and those with differential signals. An embodiment of the present disclosure may be applied to systems communicating a single bit of information on a single conductor at a given time and to systems communicating multiple bits of information on a single conductor simultaneously.

Abstract: A method and apparatus for evaluating and optimizing a signaling system is described. A pattern of test information is generated in a transmit circuit of the system and is transmitted to a receive circuit. A similar pattern of information is generated in the receive circuit and used as a reference. The receive circuit compares the patterns. Any differences between the patterns are observable. In one embodiment, a linear feedback shift register (LFSR) is implemented to produce patterns. An embodiment of the present disclosure may be practiced with various types of signaling systems, including those with single-ended signals and those with differential signals. An embodiment of the present disclosure may be applied to systems communicating a single bit of information on a single conductor at a given time and to systems communicating multiple bits of information on a single conductor simultaneously.

Abstract: Techniques and mechanisms are provided for an improved built in self-test (BIST) mechanism for 3D assembly defect detection. According to an embodiment of the present disclosure, the described mechanisms and techniques can function to detect defects in interconnects which vertically connect different layers of a 3D device, as well as to detect defects on a 2D layer of a 3D integrated circuit. Additionally, according to an embodiment of the present disclosure, techniques and mechanisms are provided for determining not only the presence of a defect in a given set of interfaces of an integrated circuit, but the particular interface at which a defect may exist.

Abstract: A method of testing an interconnect between an electronic component and an external memory comprises receiving a data word having data bits and translating the data word into multiple cycles. The multiple cycles are transmitted through the interconnect to the external memory one after another such that a value of the data bit being transmitted is switched for each cycle. In another embodiment, an electronic component comprises an interface, a translation unit, and a test module. The translation module is configured to receive a burst from the external memory through the interface and is configured to translate the burst into a data word. The test module is configured to receive the data word from the translation module and is configured to compare the data word to a test pattern to detect an interconnect defect.

Abstract: Electronic apparatus, systems, and methods of operating and constructing the electronic apparatus and/or systems include an embedded processor disposed in a logic chip to direct, among other functions, self-testing of an electronic device structure in conjunction with a pattern buffer disposed in the logic chip, when the electronic device structure is coupled to the logic chip. Additional apparatus, systems, and methods are disclosed.

Abstract: A method and apparatus for evaluating and optimizing a signaling system is described. A pattern of test information is generated in a transmit circuit of the system and is transmitted to a receive circuit. A similar pattern of information is generated in the receive circuit and used as a reference. The receive circuit compares the patterns. Any differences between the patterns are observable. In one embodiment, a linear feedback shift register (LFSR) is implemented to produce patterns. An embodiment of the present disclosure may be practiced with various types of signaling systems, including those with single-ended signals and those with differential signals. An embodiment of the present disclosure may be applied to systems communicating a single bit of information on a single conductor at a given time and to systems communicating multiple bits of information on a single conductor simultaneously.

Abstract: A method and circuit for testing a multi-chip package is provided. The multi-chip package includes at least a memory chip, and the memory chip includes a number of memory cells. The method includes performing a normal read operation on the memory cells to check if data read from the memory cells is the same with preset data in the memory cells; and performing a special read operation on the memory cells to check if data read from the memory cells is the same with an expected value, wherein the expected value is independent from data stored in the memory cells.

Abstract: A test device includes a packet input receiver for receiving encapsulated packets from a network; a packet reader for extracting timing information from the encapsulated packets, and for decapsulating encapsulated packets so as to obtain test packets; a FIFO queue for storing the test packets; a packet controller for reading the test packets from the FIFO queue and writing the test packets into a de-jitter buffer in accordance with the timing information, the de-jitter buffer for storing the reordered test packets; and, a packet output generator for providing the test packets to a target device wherein time intervals between the test packets are reproduced using the timing information.

Abstract: An apparatus for performing sequence detection on a stream of incoming bits comprises a memory and circuitry coupled to the memory. The circuitry is operative, for each bit of the stream of incoming bits, to overwrite a first binary number presently stored in the memory with a second binary number, and to provide an output indicative of when the second binary number is equal to a predetermined value. The output indicative of when the second binary number is equal to the predetermined value is, in turn, indicative of when a binary number constructed by the stream of incoming bits is divisible by a prescribed integer.

Abstract: Embodiments of the invention include a system for preventing a packet of a test pattern from being communicated over a network. In one embodiment, a communications management system is disclosed that includes a network interface configured to enable the communications management system to communicate with a plurality of network nodes over a network. The communications management system further includes a processor configured to execute instructions to determine whether one or more portions of the network are congested, and generate and transmit a message to at least one of the network nodes to terminate communication of test packets in response to a determination that one or more portions of the network is congested.

Abstract: Methods and systems for implementing self-testing of packet processing devices are disclosed. For example, a packet-processing device can include a plurality of ports having a receive media access controller (RX MAC) and a transmit media access controller (TX MAC). The TX MAC of a first port is selectably configurable to loop back packets to its respective RX MAC during the self-testing. The packet-processing device can further include a switching engine configured to provide a test packet received from a packet generator to the TX MAC of the first port, and route to the TX MAC of one or more second ports at least the test packet received from the RX MAC of the first port, or a copy of the received test packet, after the received test packet or its copy has been looped-back one or more times between the TX MAC and the RX MAC of the first port.

Abstract: A transmission/reception device includes a transmission device that divides a plurality of connection lines into a plurality of groups, determines corresponding connection lines in the plurality of groups, determines a correspondence between test pattern and the connection line, and outputs the test pattern to the plurality of connection lines based on the correspondence between the test pattern and the connection line, and a reception device that receives the test pattern from the transmission device, compares bits in a same position of the test pattern received through a corresponding connection line in the plurality of groups based on the correspondence between the test pattern and the connection line, and generates erroneous connection line information indicating an erroneous connection line as a connection line in which an error has occurred in the plurality of connection lines based on a result of the comparison.

Abstract: There are included an opposite-side transmitter unit for transmitting the same messages to plural communication paths, respectively; and a host-side receiver unit for receiving the messages flowing through the plural communication paths, respectively; wherein, the receiver unit, compares the plural received messages to perform verification using error-detection code on any one of the messages when they are identical, or on all of the messages when there is a mismatch; and when detected error of message due to error inclusion or reception failure, discards all of the messages received at that time, and calculates an accumulated number of error detections for each of the communication paths through which the messages has been transmitted, so as to stop receiving the control-related message, when the number of error detections has reached a given number, from the communication path where the number of error detections has reached the given number.

Abstract: A method is provided for determining a measure of error of a device under test (DUT). The method includes storing baseband data received from the DUT in a storage device, segmenting the baseband data into multiple data segments, determining processing parameters for one data segment of the plurality of data segments, and storing the determined processing parameters for the one data segment. The method further includes retrieving additional data segments of the multiple data segments from the storage device, and processing the additional data segments using the stored processing parameters for the one data segment. The measure of error of the DUT is determined based at least in part on data from the processed additional data segments.

Abstract: A test pattern generating apparatus that generates a test pattern to be communicated with a device under test having a plurality of terminals, the test pattern generating apparatus comprising a primitive generating section that generates a cycle primitive indicating a signal pattern to be communicated with each of the terminals during a base cycle, based on instructions from a user; a device cycle generating section that generates a device cycle indicating signal patterns of a plurality of base cycles, by arranging a plurality of the cycle primitives based on instructions from the user; and a sequence generating section that generates a sequence of the test pattern to be supplied to the device under test, by arranging a plurality of the device cycles based on instructions from the user.

Abstract: A network device for building up a network connection via a high-definition multimedia interface, includes a scrambler, a descrambler, a comparator and a control unit. The scrambler is utilized for generating a transmission signal according to a first seed. The descrambler is for decoding a receiving signal to generate a second seed. The comparator is for generating a comparing result according to the first seed and the second seed. The control unit is for controlling the network connection according to the comparing result.

Abstract: A method of detecting lost data within a data stream by inserting sequence numbers within the stream. Network data blocks to be transmitted are assembled from data chunks, where each data chunk contains a sequence number. Where the data is originating from multiple sources, the sequence numbers are labeled with an unique source ID, and are inserted into the composite data stream after one or more data chunks are generated.

Abstract: Electronic apparatus, systems, and methods of operating and constructing the electronic apparatus and/or systems include an embedded processor disposed in a logic chip to direct, among other functions, self-testing of an electronic device structure in conjunction with a pattern buffer disposed in the logic chip, when the electronic device structure is coupled to the logic chip. Additional apparatus, systems, and methods are disclosed.

Abstract: Memory apparatus and methods utilizing multiple bit lanes may redirect one or more signals on the bit lanes. A memory agent may include a redrive circuit having a plurality of bit lanes, a memory device or interface, and a fail-over circuit coupled between the plurality of bit lanes and the memory device or interface.

Abstract: A semiconductor die includes interface logic for performing a function on an external device, and a surrogate circuit in communication with the interface logic. The interface logic facilitates testing of the interface logic by attempting to perform the function on the surrogate circuit. The interface logic may be a memory interface, and the surrogate circuit may be a memory circuit that is a smaller and simpler replica of an external memory die. The surrogate circuit allows the interface logic to be tested before the semiconductor die is physically coupled to the external device, for exampled in a three dimensional (3D) integrated circuit (IC).

Abstract: An eye-opening margin measurement method for a high-speed serial data reception circuit which uses a circuit for eye-opening margin measurement involving operation of a clock data recovery circuit without fixing the clock phase. In this method, an error acceleration test can also be made on received data by giving an offset pulse signal to phase information to add a jitter component. The method uses a semiconductor integrated circuit device which includes a serializer/deserializer circuit (SerDes) for receiving serial data and a reference serializer/deserializer circuit (Ref_SerDes) for receiving an accompanying clock signal. The SerDes circuit converts received serial data into parallel data through a recovery clock whose phase is controlled using phase control signal P_CS generated by the Ref_SerDes circuit. An offset pulse signal Offset_Pulse from the pulse-forming circuit is applied to the phase control signal P_CS to make eye-opening margin measurement.

Abstract: A testing device for testing a board managing controller (BMC) of a computer motherboard including a power supply, a BMC, and a warning unit, includes a storing module, a voltage adjusting module, and a voltage displaying module. The storing module stores a preset warning voltage and an upper limit voltage larger than the preset warning voltage. The voltage adjusting module is used for adjusting the voltage of the power supply. The voltage displaying module is used for displaying the output voltage of the voltage adjusting module. It indicates the BMC works properly if the warning unit provides warning when the output voltage of the voltage adjusting module is less than the preset warning voltage, or the warning unit is silent when the output voltage of the voltage adjusting module falls between the preset warning voltage and the upper limit voltage.

Abstract: Various embodiments are described for back channel communication. One embodiment is a method that comprises receiving data at customer premises equipment (CPE), determining at least one error in the received data, formatting the determined error for communication to a central office (CO), and sending the formatted error to the CO via a back channel, wherein the formatted error is sent between sync frames of a discrete multitone (DMT) superframe.

Abstract: A computer-implemented method for focusing product testing based on areas of change within the product is described. A link between resource files of a product and test cases associated with the product is created. The resource files of a first build of the product are compared with the resource files of a second build of the product. A report that comprises which resource files changed between the first build of the product and the second build of the product is generated. The resource files that have changed and the test cases linked to the changed resource files are displayed. The test cases linked to the changed resource files are executed.

Abstract: A system includes a plurality of devices that are connected in series and a controller that communicates with the devices. Each of the devices has a plurality of input ports and corresponding output ports. The outputs of one device and the inputs of a next device are interconnected. The controller is coupled to the first device and the last device of the series-connection. The controller applies a test pattern to the plurality of input ports at the first device connected in series, by the controller. Each data channel defines a data path between corresponding pairs of input and output ports of the first and last devices. A data channel is enabled if the test pattern is detected at its corresponding output port.