Abstract: A dual modality imaging apparatus, comprising a magnetic resonance imaging (=MRI) system and a fluorescence molecular tomography (=FMT) system, for investigating a sample (42) located at a sample position (10), wherein the MRI system comprises a magnet (9) with a room temperature bore (8), with the sample position (10) located within the bore (8), and wherein the FMT system comprises means for directing a light beam (12, 17; 30) towards the sample position (10), and a position-sensitive detector (37) for collecting fluorescence light from the sample (42), is characterized in that the position-sensitive detector (37) is located within the bore (8), wherein at least part of the sample (42) is imaged onto the position-sensitive detector (37), and that the means for directing the light beam (12, 17; 30) comprise a focusing device for focusing the light beam (12, 17; 30) into a focal spot (41) on the sample (42), and a scanning device for scanning the focal spot (41) on the sample (42).
Type:
Grant
Filed:
May 5, 2010
Date of Patent:
August 29, 2017
Assignee:
University of Zurich
Inventors:
Florian Stuker, Katerina Dikaiou, Christof Baltes, Markus Rudin
Abstract: The present invention is directed to methods of preparing nanoprobes, including multifunctional cellular endoscope-like devices, comprising nanotubes, nanorods, and/or nanowires.
Abstract: Provided are methods and systems for high resolution imaging of a material immersed in liquid by scanning probe microscopy. The methods further relate to imaging a material submersed in liquid by tapping mode atomic force microscopy (AFM), wherein the AFM has a microfabricated AFM probe comprising a nanoneedle probe connected to a cantilever beam. The nanoneedle probe is immersed in the liquid, and the rest of the AFM probe, including the cantilever beam to which the nanoneedle probe is attached, remains outside the liquid. The cantilever is oscillated and the nanoneedle probe tip taps the material to image the material immersed in liquid. In an aspect, the material is supported on a shaped substrate to provide a spatially-varying immersion depth with specially defined regions for imaging by any of the methods and systems of the present invention.
Type:
Grant
Filed:
April 28, 2011
Date of Patent:
July 2, 2013
Assignee:
The Board of Trustees of the University of Illinois
Abstract: A coupling device for an atomic force microscope with acoustic sample excitation includes a sound generator, in particular an ultrasonic test head, and designed for coupling of sound waves generated using the sound generator into a sample body for the acoustic excitation of the sample body, where the coupling device has a liquid reservoir fillable and/or filled with a liquid in its inner space; the lower side of the sample body can be arranged and/or is arranged laterally displaceably on the liquid reservoir; the end of the sound generator formed for coupling the sound waves into the sample body is arranged in the inner space of the liquid reservoir and/or that sound waves can be coupled into the inner space with this end; and the spatial section of the inner space of the liquid reservoir disposed between this end and the lower side of the sample body is completely fillable and/or filled with the liquid.
Type:
Grant
Filed:
February 2, 2010
Date of Patent:
October 23, 2012
Assignee:
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
Abstract: A microscope configuration according to an exemplary embodiment includes a microscope system with at least one addressable component and also a control system with a plurality of control modules for influencing a plurality of test-environment parameters in a test chamber of the microscope system. The control modules are configured to be combined in modular manner and to be coupled through an interface unit with a unified bus, through which they are controlled. A control module influencing a test-environment parameter of an incubation system has a control command interface unit configured to receive at least one control command. The control command interface unit couples with a bus. A control device is coupled with the control command interface unit and influences the test-environment parameter based upon the control command. A further interface unit is coupled to the control command interface unit and outputs, again, the received control command.
Abstract: An atomic force microscopy sensor includes a substrate, a cantilever beam and an electrostatic actuator. The cantilever beam has a proximal end and an opposite distal end. The proximal end is in a fixed relationship with the substrate and the cantilever beam is configured so that the distal end is in a moveable relationship with respect to the substrate. The electrostatic actuator includes a first electrode that is coupled to the cantilever beam adjacent to the proximal end and a spaced apart second electrode that is in a fixed relationship with the substrate. When an electrical potential is applied between the first electrode and the second electrode, the first electrode is drawn to the second electrode, thereby causing the distal end of the cantilever beam to move.