Abstract: Provided is a scanning probe microscope capable of precisely analyzing characteristics of samples having an overhang surface structure. The scanning probe microscope comprises a first probe, a first scanner changing a position of the first probe along a straight line, and a second scanner changing a position of a sample in a plane, wherein the straight line in which the position of the first probe is changed by using the first scanner is non-perpendicular to the plane in which the position of the sample is changed by using the second scanner.

Abstract: A scanning probe microscopy head may include a base portion, cantilevers coupled to the base portion, and at least one tip coupled to each of the cantilevers. At least two of the cantilevers and associated tips may be configured to perform a different scanning probe microscopy technique. The cantilevers may be positioned perpendicular to the base portion and may be coupled to the perimeter of the base portion. The base portion may include circuitry coupled thereto for providing electricity to the tips. The cantilevers may each be placed into a recessed slot along the perimeter of the base and secured to the base by a securing mechanism, such as a spring clip. The cantilevers may be operatively coupled to a linear positioner, such as a piezoelectric motor, coupled to the perimeter of the base for controlling the amount of protrusion of the cantilevers from the perimeter of the base.

Abstract: An information storage device includes a substrate and a shape memory alloy film established on the substrate. The shape memory alloy film may receive, supply, and store digital information. One or more thermoelectric modules is/are nanoimprinted between the substrate and the shape memory alloy film. The thermoelectric modules(s) is adapted to selectively erase at least some of the digital information from the shape memory alloy film.

Abstract: A method is provided for constructing a nanodevice. The method includes: fabricating an electrode on a substrate; forming a nanogap across the electrode; dispersing a plurality of nanoobjects onto the substrate using electrophoresis; and pushing one of the nanoobjects onto the electrode using a tip of an atomic force microscope, such that the nanoobject lies across the nanogap formed in the electrode. In addition, remaining nanoobjects may also be pushed away from the electrode using the atomic force microscope, thereby completing construction of a nanodevice.

Abstract: A storage device includes a storage medium and a probe having a tip and a first magnetic element. The tip of the probe is adapted to form a dent in the storage medium. The storage device further has a second magnetic element, where the first and second magnetic elements are adapted to interact magnetically to indicate a storage state.