Nanotube Tip Patents (Class 977/876)
  • Patent number: 8726411
    Abstract: A charged probe and an electric field measuring method are provided. The probe can be charged with single electricity on single nano particle attached on the top of the probe tip being a charged probe and the probe is applicable for measuring the electric fields of object in the nano scale. The probe comprises an insulating tip base, a cantilever and a single nano-particle. The cantilever is arranged for supporting the insulating tip base and the single nano-particle is configured on the erosion plane. After conducting contact electrification method to charge the electric nano particle, the single nano-particle will be charged with fixed number of single electrical charge. Then, the amount of the fixed number of single electrical charge is calculated by the virtual image charge calculation method. The charged probe can be used to measure the electric fields distribution by tapping mode or f-d curve measurement.
    Type: Grant
    Filed: June 18, 2013
    Date of Patent: May 13, 2014
    Assignee: National Tsing Hua University
    Inventors: Fan-Gang Tseng, Joe-Ming Chang
  • Patent number: 8216480
    Abstract: Methods to manufacture metal nanopins and metal oxide nanopins are disclosed. Metal nanopins are fabricated on a metal foil by capillaritron plasma source dry etching. The aspect ratio and the density of metal nanopins are controlled by adjusting the temperature of the metal foil during ion beam dry etching. The end radius of metal nanopins less than 10 nm and the aspect ratio of metal nanopins between 25 and 30 can be achieved. Besides, metal oxide nanopins are fabricated by ion implantation and thermal oxidation. The metal foil is implanted with ions and then thermally oxidized to form the metal oxide nanopins. It shows that the metal oxide nanopins fabricated with oxygen implantation exhibit better field emission properties.
    Type: Grant
    Filed: October 15, 2008
    Date of Patent: July 10, 2012
    Assignee: National Taiwan University of Science and Technology
    Inventors: Liang-chiun Chao, Chung-chi Liau, Jun-wei Lee
  • Patent number: 8076124
    Abstract: A method for the transient transformation of a living biological cell having an intact cell membrane defining an intracellular domain, and an apparatus for the transient transformation of biological cells. The method and apparatus include introducing a compartmentalized extracellular component fixedly attached to a cellular penetrant structure to the intracellular domain of the cell, wherein the cell is fixed in a predetermined location and wherein the component is expressed within in the cell while being retained within the compartment and wherein the compartment restricts the mobility and interactions of the component within the cell and prevents transference of the component to the cell.
    Type: Grant
    Filed: January 17, 2007
    Date of Patent: December 13, 2011
    Assignee: UT-Battelle, LLC
    Inventors: Timothy E. McKnight, Anatoli V. Melechko, Michael L. Simpson
  • Patent number: 8030191
    Abstract: Disclosed herein are a method of producing microstructure and a method of producing mold, the methods permitting production of much smaller pores than before in an atmosphere where impurities are negligible and also permitting production of microstructures having a smaller size and a higher crystallinity than before with the help of the pores. The method of producing microstructure comprises a step of making pores (4) in a substrate (1) to become a mold (5) by irradiation with a focused energy beam (3) and a step of growing a microstructure (8) in the thus made pores (4). The method of producing a mold includes a step of making pores (4) by irradiating a substrate (1) to become a mold (5) with a focused energy beam (3).
    Type: Grant
    Filed: May 26, 2009
    Date of Patent: October 4, 2011
    Assignee: Sony Corporation
    Inventors: Koji Kadono, Yosuke Murakami
  • Patent number: 7884359
    Abstract: Described herein is a field ionization and electron impact ionization device consisting of carbon nanotubes with microfabricated integral gates that is capable of producing short pulses of ions.
    Type: Grant
    Filed: June 22, 2009
    Date of Patent: February 8, 2011
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: David S. Y. Hsu, Jonathan L Shaw
  • Publication number: 20100281587
    Abstract: The optical electric field enhancement element of the invention comprises a nanorod where a conductive layer and an insulating layer are laminated. In particular, the optical electric field enhancement element comprising a tungsten oxide nanorod exhibits a high enhancement effect not by an aggregate of fine crystals but by the crystal structure itself, therefore securing good reproducibility and a stable Raman scattering enhancement effect. A sensor comprising the optical electric field enhancement element enables various high-precision analyses heretofore impossible in the art.
    Type: Application
    Filed: October 24, 2008
    Publication date: November 4, 2010
    Inventors: Yoshitaka Shingaya, Tomonobu Nakayama, Masakazu Aono
  • Patent number: 7735358
    Abstract: The present invention provides a self-sensing tweezer device for micro and nano-scale manipulation, assembly, and surface modification, including: one or more elongated beams disposed in a first configuration; one or more oscillators coupled to the one or more elongated beams, wherein the one or more oscillators are operable for selectively oscillating the one or more elongated beams to form one or more “virtual” probe tips; and an actuator coupled to the one or more elongated beams, wherein the actuator is operable for selectively actuating the one or more elongated beams from the first configuration to a second configuration.
    Type: Grant
    Filed: June 15, 2007
    Date of Patent: June 15, 2010
    Assignee: Insitutec, Inc.
    Inventors: Marcin B. Bauza, Shane C. Woody, Stuart T. Smith
  • Patent number: 7652418
    Abstract: An electron emission device which can uniformly emit electrons and can be simply manufactured at a reduced cost, and a display apparatus having improved uniform brightness of pixels by using the electron emission device. In addition, a simple method of manufacturing the electron emission device. The electron emission device includes: a first substrate; a cathode electrode and an electron emission unit disposed on the first substrate; a gate electrode electrically insulated from the cathode electrode; an insulating layer disposed between the cathode electrode and the gate electrode to insulate the cathode electrode from the gate electrode; and an electron emission source including carbon nanotubes (CNTs) that contact the cathode electrode, wherein distances between the gate electrode and the tips of the CNTs are uniform.
    Type: Grant
    Filed: October 26, 2006
    Date of Patent: January 26, 2010
    Assignee: Samsung SDI Co., Ltd.
    Inventors: Young-Chul Choi, Jong-Hwan Park
  • Patent number: 7610797
    Abstract: A carbon nanotube detection system is disclosed. The detection system is suitable to detect carbon nanotube vibrations. Types of detection systems include but are not limited to: magnetic coupling to a magnetic particle attached at the distal end of the nanotube oscillator, current readout from the nanotube oscillator that has been exposed to electromagnetic radiation or a stress, inductive pick-up coil and corresponding tank circuit, capacitive readout element positioned next to the nanotube oscillator having a charged particle attached at its distal end, an optical beam illumination and detection of its scattering, or combination of any of the above means of detection.
    Type: Grant
    Filed: November 16, 2007
    Date of Patent: November 3, 2009
    Assignee: Xidex Corporation
    Inventor: Vladimir Mancevski
  • Patent number: 7543482
    Abstract: A carbon thin line probe having a carbon thin line selectively formed at a projection-like terminal end portion thereof by means of an irradiation of high-energy beam, the carbon thin line internally containing a metal. Thereby achieved is a carbon thin line probe suitable for example for the probe of SPM cantilever, which has a high aspect ratio and high durability and reliability, capability of batch processing based on a simple manufacturing method, and to which magnetic characteristic can be imparted.
    Type: Grant
    Filed: February 27, 2007
    Date of Patent: June 9, 2009
    Assignee: Olympus Corporation
    Inventors: Masashi Kitazawa, Masaki Tanemura, Junya Tanaka, Tatsuhiko Okita
  • Patent number: 7538015
    Abstract: Disclosed herein are a method of producing microstructure and a method of producing mold, the methods permitting production of much smaller pores than before in an atmosphere where impurities are negligible and also permitting production of microstructures having a smaller size and a higher crystallinity than before with the help of the pores. The method of producing microstructure comprises a step of making pores (4) in a substrate (1) to become a mold (5) by irradiation with a focused energy beam (3) and a step of growing a microstructure (8) in the thus made pores (4). The method of producing a mold includes a step of making pores (4) by irradiating a substrate (1) to become a mold (5) with a focused energy beam (3).
    Type: Grant
    Filed: November 25, 2003
    Date of Patent: May 26, 2009
    Assignee: Sony Corporation
    Inventors: Koji Kadono, Yosuke Murakami
  • Patent number: 7535014
    Abstract: A field ionization device can include a first insulator layer on a first side of a substrate, a conductive gate layer on the first insulator layer, a cavity in the substrate, a portion of first insulator over the cavity, an aperture in the portion of the first insulator layer and the conductive gate layer thereby forming an aperture and aperture sidewall. The device can include a second insulator layer on the aperture sidewall and surface of the cavity, a metallization layer over the second insulator layer, a catalyst layer on the metallization layer, and a carbon nanotube. The cavity can be made by etching a second side of the substrate to near the insulator layer, wherein the second side is opposite the first side. The carbon nanotube can be grown from the catalyst layer. The device can further include a collector located near the carbon nanotube. The conductive gate layer can be biased negative with respect to the carbon nanotube.
    Type: Grant
    Filed: June 9, 2006
    Date of Patent: May 19, 2009
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: David S. Y. Hsu, Jonathan L. Show
  • Patent number: 7514678
    Abstract: A probe for a scanning thermal microscope includes a cantilever beam, an insulating layer, a conductive layer and a carbon nanotube. The cantilever beam includes a microtip at a distal end thereof, and the microtip has a conductive exterior portion with a pointed part. The insulating layer is formed on a part of the conductive exterior portion other than the pointed part thereof. The conductive layer is formed on the insulating layer and has a coupling portion in contact with the pointed part of the conductive exterior portion of the microtip, the coupling portion of the conductive layer and the pointed part of the conductive exterior portion thereby cooperatively form a thermocouple junction. The carbon nanotube has one end arranged on the thermocouple junction. The probe for a scanning thermal microscope increases spatial resolution of scanning thermal microscope and can prevent excessive current leakage.
    Type: Grant
    Filed: June 7, 2006
    Date of Patent: April 7, 2009
    Assignees: Tsinghua University, Hon Hai Precision Industry Co., Ltd.
    Inventors: Yuan Yao, Chang-Hong Liu, Shou-Shan Fan
  • Patent number: 7507958
    Abstract: A conductive carbon nanotube tip and a manufacturing method thereof are provided. The conductive carbon nanotube tip includes a carbon nanotube tip substantially vertically placed on a substrate, and a ruthenium coating layer covering a surface of the carbon nanotube tip and extending to at least a part of the substrate. The manufacturing method includes substantially vertically placing a carbon nanotube tip on a substrate, and forming a ruthenium coating layer on the carbon nanotube tip and at least a part of the substrate.
    Type: Grant
    Filed: August 31, 2006
    Date of Patent: March 24, 2009
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Sang-jun Choi, Jung-hyun Lee, Sang-bong Bang, Bum-seok Seo, Chang-soo Lee
  • Patent number: 7479052
    Abstract: Methods of growing carbon nanotubes and manufacturing a field emission device using the carbon nanotubes are provided. The method of growing carbon nanotubes includes the steps of preparing a substrate, forming a catalyst metal layer on the substrate to promote the growing of the carbon nanotubes, forming an amorphous carbon layer on the catalyst metal layer where the amorphous carbon layer partially covers the catalyst metal layer, and growing the carbon nanotubes from a surface of the catalyst metal layer. The carbon nanotubes are grown in a portion of the surface of the catalyst metal layer that is not covered by the amorphous carbon layer. In the method of growing carbon nanotubes, the carbon nanotubes are grow at a low temperature. A density of carbon nanotubes can be controlled to improve field emission characteristics of an emitter of a field emission device.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: January 20, 2009
    Assignee: Samsung SDI Co., Ltd.
    Inventors: Ha-Jin Kim, In-Taek Han
  • Patent number: 7452432
    Abstract: Disclosed herein are an apparatus for and a method of bonding a nano-tip using electrochemical etching, in which a good bonding stability can be provided. The nano-tip bonding apparatus comprises a glass plate having a top surface of a certain desired area. An electrolytic solution having conductivity is placed on the top surface of the glass plate by means of surface tension. Means for moving reciprocally a base material having conductivity in opposite direction is provided. A carbon nano-tube is adhered to a pointed tip of the base material by means of an adhesive. An end portion of the carbon nano-tube is to be immersed in the electrolytic solution. A power supply is provided for applying an electric power to the electrolytic solution and the base material.
    Type: Grant
    Filed: May 26, 2005
    Date of Patent: November 18, 2008
    Assignee: Korean Advanced Institute of Science and Technology
    Inventors: Soo Hyun Kim, Jun Sok Lee, Jai Seong Choi, Gyung Soo Kang
  • Patent number: 7446044
    Abstract: Switches having an in situ grown carbon nanotube as an element thereof, and methods of fabricating such switches. A carbon nanotube is grown in situ in mechanical connection with a conductive substrate, such as a heavily doped silicon wafer or an SOI wafer. The carbon nanotube is electrically connected at one location to a terminal. At another location of the carbon nanotube there is situated a pull electrode that can be used to elecrostatically displace the carbon nanotube so that it selectively makes contact with either the pull electrode or with a contact electrode. Connection to the pull electrode is sufficient to operate the device as a simple switch, while connection to a contact electrode is useful to operate the device in a manner analogous to a relay. In various embodiments, the devices disclosed are useful as at least switches for various signals, multi-state memory, computational devices, and multiplexers.
    Type: Grant
    Filed: September 19, 2006
    Date of Patent: November 4, 2008
    Assignee: California Institute of Technology
    Inventors: Anupama B. Kaul, Eric W. Wong, Richard L. Baron, Larry Epp
  • Patent number: 7442926
    Abstract: The present invention relates to a nano tip and a fabrication method of the nano tip that is generally usable in mechanical, physical, and electrical devices for detecting surface signals or chemical signals, or is usable for a source scanning energy beam. The fabrication method of a nano tip according to the present invention includes providing a supporting holder that is fixed at one end thereof to a mechanical or electrical device, bonding a carbon nanotube to the free end of the supporting holder, and modifying the property or the shape of the carbon nanotube by scanning an energy beam thereto. The nano tip, having improved stiffness and perpendicularity, is fabricated by adjusting the length, the diameter, and the shape of the end of the carbon nanotube tip attached with carbon nanotubes by means of the energy beam so that the nano tip may stably and repeatedly reproduce information of a sample and may minimize a deviation between the tips.
    Type: Grant
    Filed: August 21, 2006
    Date of Patent: October 28, 2008
    Assignee: Korea Institute of Machinery & Materials
    Inventors: Chang-Soo Han, June-Ki Park
  • Patent number: 7427754
    Abstract: A microscope device includes a probe having a dielectric material with a first side and a second side. First and second electrodes are disposed on the first side of the dielectric material. A nanotube connects the first and second electrodes. A gate electrode is disposed on the second side (e.g., backside) of the dielectric material. The device includes a stage adapted for holding a sample. The stage and probe are moveable with respect to one another such that the sample can be brought in close proximity to the nanotube. The device further includes current measurement circuitry for measuring current (e.g., Random Telegraph Signals) passing through the nanotube. The microscope device is able to identify and characterize single defects on the molecular or atomic scale. The probe device may be combined with spin resonance and/or optical systems such that the detection/mapping/manipulate of single spin and single photon could be achieved.
    Type: Grant
    Filed: April 12, 2006
    Date of Patent: September 23, 2008
    Assignee: The Regents of the University of California
    Inventors: Kang L. Wang, Fei Liu
  • Patent number: 7402736
    Abstract: A probe of a scanning probe microscope having a sharp tip and an increased electric characteristic by fabricating a planar type of field effect transistor and manufacturing a conductive carbon nanotube on the planar type field effect transistor. To achieve this, the present invention provides a method for fabricating a probe having a field effect transistor channel structure including fabricating a field effect transistor, making preparations for growing a carbon nanotube at a top portion of a gate electrode of the field effect transistor, and generating the carbon nanotube at the top portion of the gate electrode of the field effect transistor.
    Type: Grant
    Filed: December 23, 2005
    Date of Patent: July 22, 2008
    Assignee: POSTECH Foundation
    Inventors: Wonkyu Moon, Geunbae Lim, Sang Hoon Lee
  • Patent number: 7176478
    Abstract: New, hybrid vacuum electron devices are proposed, in which the electrons are extracted from the nanotube into vacuum. Each nanotube is either placed on the cathode electrode individually or grown normally to the cathode plane. Arrays of the nanotubes are also considered to multiply the output current. Two- and three-terminal device configurations are discussed. In all the cases considered, the device designs are such that both input and output capacitances are extremely low, while the efficiency of the electron extraction into vacuum is very high, so that the estimated operational frequencies are expected to be in a tera-hertz range. New vacuum triode structure with ballistic electron propagation along the nanotube is also considered.
    Type: Grant
    Filed: January 26, 2004
    Date of Patent: February 13, 2007
    Inventors: Alexander Kastalsky, Sergey Shokhor
  • Patent number: 7102157
    Abstract: New, hybrid vacuum electronic devices are proposed, in which the electrons are extracted from the nanotube into vacuum. Each nanotube is either placed on the cathode electrode individually or grown normally to the cathode plane. Arrays of the nanotubes are also considered to multiply the output current. Two- and three-terminal device configurations are discussed. In all the cases considered, the device designs are such that both input and output capacitances are extremely low, while the efficiency of the electron extraction into vacuum is very high, so that the estimated operational frequencies are expected to be in a tera-hertz range. New vacuum triode structure with ballistic electron propagation along the nanotube is also considered.
    Type: Grant
    Filed: May 23, 2005
    Date of Patent: September 5, 2006
    Inventors: Alexander Kastalsky, Sergey Shokhor
  • Patent number: 7073937
    Abstract: A heat emitting probe including a conductive nanotube probe needle with its base end fastened to a holder and its tip end protruded, a heat emitting body formed on the probe needle, a conductive nanotube lead wire fastened to the heat emitting body, and an electric current supply that causes an electric current to pass through the conductive nanotube lead wire and both ends of the probe needle. The tip end of the probe needle is thus heated by an electric current flowing through the heat emitting body. A heat emitting probe apparatus includes the above-described heat emitting probe, a scanning mechanism that allows the heat emitting probe to scan over a thermal recording medium, and a control circuit that causes the tip end of the probe needle to emit heat, thus recording extremely small hole patterns in the surface of a thermal recording medium.
    Type: Grant
    Filed: February 13, 2002
    Date of Patent: July 11, 2006
    Assignees: Yoshikaza Nakayama, Daiken Chemical Co., Ltd.
    Inventors: Yoshikazu Nakayama, Akio Harada