Giant Magnetoresistance (gmr) Patents (Class 977/934)
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Patent number: 8885398Abstract: Spin current generators and systems and methods for employing spin current generators. A spin current generator may be configured to generate a spin current polarized in one direction, or a spin current selectively polarized in two directions. The spin current generator may by employed in spintronics applications, wherein a spin current is desired.Type: GrantFiled: June 6, 2013Date of Patent: November 11, 2014Assignee: Micron Technology, Inc.Inventors: Jun Liu, Gurtej Sandhu
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Patent number: 8860159Abstract: A spintronic electronic apparatus having a multilayer structure. The apparatus includes a substrate, having disposed in succession upon the substrate; a bottom interface layer; a pinned layer; a tunneling barrier; a free layer; and a top interface layer, wherein the apparatus operates as a non-resonant magnetic tunnel junction in a large amplitude, out-of-plane magnetization precession regime having weakly current dependent, large diode volt-watt sensitivity when external microwave signals that exceed a predetermined threshold current and have a frequency that is lower than a predetermined level excite the magnetization precession.Type: GrantFiled: October 20, 2011Date of Patent: October 14, 2014Assignee: The United States of America as represented by the Secretary of the ArmyInventors: Thomas J. Meitzler, Elena N. Bankowski, Michael Nranian, Ilya N. Krivorotov, Andrei N. Slavin, Vasyl S. Tyberkevych
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Publication number: 20130272061Abstract: Spin current generators and systems and methods for employing spin current generators. A spin current generator may be configured to generate a spin current polarized in one direction, or a spin current selectively polarized in two directions. The spin current generator may by employed in spintronics applications, wherein a spin current is desired.Type: ApplicationFiled: June 6, 2013Publication date: October 17, 2013Applicant: Micron Technology, Inc.Inventors: Jun Liu, Gurtej Sandhu
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Patent number: 8283184Abstract: In a method for measurement of very small local magnetic fields, in particular of local magnetic stray fields produced by magnetic beads, at least one magnetoresistive element is used. The element includes a hard-magnetic reference layer and a soft-magnetic sensor layer, whose magnetization can be rotated to a parallel position or an antiparallel position with respect to the reference layer magnetization, and whose output signal which can be tapped off is dependent on the position of the sensor layer magnetization with respect to the reference layer magnetization.Type: GrantFiled: September 20, 2006Date of Patent: October 9, 2012Assignee: Siemens AktiengesellschaftInventor: Manfred Rührig
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Patent number: 7633796Abstract: A storage element includes a storage layer for holding information depending on a magnetization state of a magnetic material; and a magnetization fixed layer in which magnetization direction is fixed, that is arranged relative to the storage layer through a nonmagnetic layer. The magnetization direction of the storage layer is changed with application of an electric current in a laminating direction to enable information to be recorded to the storage layer. A plurality of magnetization regions respectively having magnetization components in laminating directions and having magnetizations in different directions from each other are formed in the magnetization fixed layer or on an opposite side of the magnetization fixed layer relative to the storage layer.Type: GrantFiled: January 14, 2008Date of Patent: December 15, 2009Assignee: Sony CorporationInventors: Kazutaka Yamane, Minoru Ikarashi, Masanori Hosomi, Hiroyuki Ohmori, Tetsuya Yamamoto, Yutaka Higo, Yuki Oishi, Hiroshi Kano
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Patent number: 7502249Abstract: A method and system for providing and utilizing a magnetic memory are described. The magnetic memory includes a plurality of magnetic storage cells. Each magnetic storage cell includes magnetic element(s) programmable due to spin transfer when a write current is passed through the magnetic element(s) and selection device(s). The method and system include driving a first current in proximity to but not through the magnetic element(s) of a portion of the magnetic storage cells. The first current generates a magnetic field. The method and system also include driving a second current through the magnetic element(s) of the portion of the magnetic storage cells. The first and second currents are preferably both driven through bit line(s) coupled with the magnetic element(s). The first and second currents are turned on at a start time. The second current and the magnetic field are sufficient to program the magnetic element(s).Type: GrantFiled: April 17, 2007Date of Patent: March 10, 2009Assignees: Grandis, Inc., Renesas Technology Corp.Inventor: Yunfei Ding
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Publication number: 20090040662Abstract: An MR element includes a free layer having a direction of magnetization that changes in response to an external magnetic field, a pinned layer having a fixed direction of magnetization, and a spacer layer disposed between these layers. The spacer layer includes a first region, a second region and a third region that are each in the form of a layer and that are arranged in a direction intersecting the plane of each of the foregoing layers. The second region is sandwiched between the first region and the third region. The first region and the third region are each composed of an oxide semiconductor, and the second region includes at least a nonmagnetic conductor phase out of the nonmagnetic conductor phase and an oxide semiconductor phase.Type: ApplicationFiled: August 8, 2007Publication date: February 12, 2009Applicant: TDK CORPORATIONInventors: Tsutomu Chou, Tomohito Mizuno
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Publication number: 20090015969Abstract: Magnetic thin film having high spin polarizability and a magnetoresistance effect device and a magnetic device using the same, provided with a substrate (2) and Co2MGa1-xAlx thin film (3) formed on the substrate (2), the Co2MGa1-xAlx thin film (3) has a L21 or B2 single phase structure, M of the thin film is either one or two or more of Ti, V, Mo, W, Cr, Mn, and Fe, an average valence electron concentration Z in M is 5.5?Z?7.5, and 0?x?0.7, shows ferromagnetism at room temperature, and can attain high spin polarizability. A buffer layer (4) may be inserted between the substrate (2) and the Co2FexCr1-xAl thin film (3). The tunnel magnetoresistance effect device and the giant magnetoresistance effect device using this magnetic thin film can attain large TMR and GMR at room temperature under the low magnetic field.Type: ApplicationFiled: February 8, 2005Publication date: January 15, 2009Applicant: JAPAN SCIENCE AND TECHNOLOGY AGENCYInventors: Ryosuke Kainuma, Koichiro Inomata, Kiyohito Ishida
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Publication number: 20080151610Abstract: The semiconductor industry seeks to replace traditional volatile memory devices with improved non-volatile memory devices. The increased demand for a significantly advanced, efficient, and non-volatile data retention technique has driven the development of integrated Giant-Magneto-resistive (GMR) structures. The present teachings relates to integrated latch memory and logic devices and, in particular, concerns a spin dependent logic device that may be integrated with conventional semiconductor-based logic devices to construct high-speed non-volatile static random access memory (SRAM) cells.Type: ApplicationFiled: January 21, 2008Publication date: June 26, 2008Applicant: MICRON TECHNOLOGY, INC.Inventors: Romney R. Katti, Theodore Zhu
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Publication number: 20080150643Abstract: Microwave generating and detection portions of a electronic circuit is improved in efficiency and reduced in size. A microwave generating element A comprises a lower electrode 1, a layer 3 formed on the lower electrode 1 in an island shape, forming a magnetoresistance element, an insulator 7 formed on the lower electrode 1 in such a manner as to surround the layer 3 forming the magnetoresistance element, and an upper electrode 5 formed on the insulator 7 and the layer 3 forming the magnetoresistance element. The layer 3 forming the magnetoresistance element includes, in order from the side of the lower electrode 1, a magnetization fixed layer 3a, an intermediate layer 3b, and a magnetization free layer 3c. The magnetization free layer 3c, which is required to produce resonance oscillation based on a current, preferably is dimensioned to be equal to or smaller than 200 nm square in a cross-sectional area and on the order of 1 to 5 nm in film thickness, for example.Type: ApplicationFiled: March 17, 2006Publication date: June 26, 2008Inventors: Yoshishige Suzuki, Shinji Yuasa, Akio Fukushima, Ashwin Tulapurkar
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Patent number: 7391091Abstract: A ferromagnetic thin-film based magnetic field detection system having a substrate supporting a magnetic field sensor in a channel with a first electrical conductor supported on the substrate positioned at least in part along the channel gap and in direct contact with at least some surface of the magnetic field sensor ands a second electrical conductor supported on the substrate positioned at least in part along the channel gap in a region thereof adjacent to, but separated from, the magnetic field sensor.Type: GrantFiled: September 29, 2005Date of Patent: June 24, 2008Assignee: NVE CorporationInventors: Mark C. Tondra, John M. Anderson, David J. Brownell, Anthony D. Popple
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Patent number: 7122852Abstract: An MTJ (magnetic tunneling junction) MRAM (magnetic random access memory) cell is formed on a conducting lead and magnetic keeper layer that is capped by a sputter-etched Ta layer. The Ta layer has a smooth surface as a result of the sputter-etching and that smooth surface promotes the subsequent formation of a lower electrode (pinning/pinned layer) with smooth, flat layers and a radical oxidized (ROX) Al tunneling barrier layer which is ultra-thin, smooth, and to has a high breakdown voltage. A seed layer of NiCr is formed on the sputter-etched layer of Ta. The resulting device has generally improved performance characteristics in terms of its switching characteristics, GMR ratio and junction resistance.Type: GrantFiled: May 12, 2004Date of Patent: October 17, 2006Assignees: Headway Technologies, Inc., Applied Spintronics, Inc.Inventors: Cheng T. Horng, Mao-Min Chen, Liubo Hong, Ru-Ying Tong