Abstract: A modification to the available simulated annealing algorithm is provided to better utilize direct connects and other architecture-specific features of a Field Programmable Gate Array. A preferred embodiment comprises adding a template-based move to the SA move-set that recognizes a specific pattern or template in the user's design after mapping, and arranges the components into the optimal configuration for the specific template discovered. The present invention increases the intelligence of the SA move-set by selectively supplementing the random moves in the move-set with moves that produce locally good solutions.

Abstract: A decryption scheme is provided for encrypted configuration bitstreams in a programmable logic device. One embodiment includes circuitry for altering a decryption key for a plurality of encrypted bitstream portions, thereby providing a high level of security of the circuit layout embodied in the bitstream.

Abstract: A method of computer aided design of coarse grain FPGA's by employing a library of selected primitive cells, defining the connection classes useful in the FPGA design, and assigning appropriate connection classes to the inputs and outputs of the respective primitive cells. The primitive cells and defined interconnections used therein have accurately established timing and power parameters thereby enabling more accurate assessments of static timing and power consumption for the entire FPGA design. Moreover, the method of the present invention results in placement directives which then serve as connection criteria in carrying out subsequent place and route algorithms. One such placement directive is implemented as a "local output" (LO) of some of the primitive cells which implies that that particular output must be connected to another primitive cell input within the local configurable logic block (CLB). Another such placement directive is obtained by using a plurality of virtual buffers.

Abstract: A novel test procedure is used to determine the optimum programmable charge pump levels for a flash memory array in a CPLD. According to the method of the invention, an automated tester steps through all combinations of charge pump codes and attempts to program the flash memory with each combination of voltage levels. For each combination, the results of the test (pass or fail) are logged and stored into a map or array. The center of a window of passing pump codes is taken as the starting reference point. The next step is to verify the actual voltage level associated with the pump code combination corresponding to the starting reference point. The reference pump code is loaded into the device and the corresponding flash memory cell voltage levels are measured. If the measured voltage level does not fall into the preferred range, the tester automatically adjusts the level towards the preferred range by adjusting the pump codes.

Abstract: An apparatus and method for decreasing the amount of time necessary to load configuration data into Field Programmable Gate Arrays (FPGAs) or other integrated circuit devices. In a preferred embodiment, serially arrayed FPGAs receive a concatenated stream of data from a common data bus. As a first FPGA reaches a loading-complete state, an enabling token is passed from the first FPGA to an enabling input on the next FPGA. The process repeats until all devices are completely loaded or fully configured.

Abstract: An improved circuit tester allows for increased storage of test vectors in existing memory structures by noting where segments of test vectors repeat and storing such segments only once, then further utilizing memory space corresponding to otherwise unused test channels. Switching circuitry is included to selectively forward signals to and from a designated, multi-source conductor.

Abstract: A system and method for event-driven simulation of a circuit is disclosed. The system includes a simulation history of events and node values at various times throughout the simulation of the circuit. The system allows the user to access the simulation history during the simulation, make changes to the state of the circuit at any time recorded within the simulation history, and resume the simulation of the circuit automatically corrected for any changes.

Abstract: A latch may be formed as a two-part structure, one part for data input and one part for feeding back the data to form the latch. A clock signal controls whether data from a data input terminal will be forwarded to the output or whether the output signal will be provided as input and forwarded, thus forming the latch. A problem called the static ones hazard, namely registering a logical 0 when data input is logical 1, can occur with a latch of this logic structure when the circuit is entering the latch mode. In accordance with the invention, this static ones hazard is avoided by controlling trip points in the gates of the cell and input buffers of the cell so that the cell implements a make-before-break transition.

Abstract: A method and structure for verifying interconnect structure of an FPGA device after programming. In a preferred embodiment, after programming, a single wire segment on each net of a layout is pulled down to a low reference voltage. Voltage levels on all wire segments of the device are then captured and shifted out of the device for comparison to the expected values. Low voltage levels on segments expected to remain high reveal short circuit flaws. High voltage levels on segments expected to remain low reveal open circuit flaws.