Patents Represented by Attorney, Agent or Law Firm Alana G. Kriegsman, Esq.
  • Patent number: 6490913
    Abstract: The present invention provides a novel humidity chamber suitable for use with an atomic force microscope (AFM). The humidity chamber of the present invention employs an intricate geometrical design which can accommodate a scanned-stylus AFM with an optical lever. This geometrical design allows the invention to enclose one or more of the AFM scanner, tip assembly, optical lever detection system, sample and an optical microscope objective lens, without degrading the ability to operate the AFM or the related systems. The invention is comprised of two major pieces: a chamber within which the AFM scanning head assembly is placed, and an integrated sample platform and spring-loaded base-plate that allows samples to be loaded and unloaded without removal of the chamber from the AFM scanning head assembly. The sample platform, which extends up from the base-plate and is inserted into the chamber, can include a magnet that is securely attached to the base.
    Type: Grant
    Filed: May 18, 2000
    Date of Patent: December 10, 2002
    Assignee: The United States of America as represented by the Secretary of Commerce
    Inventors: Jonathan W. Martin, Edward Embree, Mark R. VanLandingham
  • Patent number: D459898
    Type: Grant
    Filed: May 15, 2001
    Date of Patent: July 9, 2002
    Inventor: Henick Sanford
  • Patent number: D460273
    Type: Grant
    Filed: May 15, 2001
    Date of Patent: July 16, 2002
    Inventor: Sanford Henick