Abstract: An apparatus for loading configuration information into a programmable integrated circuit (e.g., an FPGA) configurable to perform parallel loading or bit serial loading within the same architecture. The configuration information is presented to the FPGA in data frames of N serial bits each. Each data frame is divided into discrete serial portions having Y bits each (e.g., a data frame comprises N/Y portions). In parallel mode, the portions are loaded into a segmented configuration register, one portion per programming cycle, such that Y bits are loaded into the segmented configuration register in parallel. On each programming clock cycle during parallel loading, all the bits of a data frame portion are simultaneously loaded into the segments of the configuration register (at the first bit position for each segment) such that each segment receives one bit per programming cycle. The bits of the configuration register are then shifted down by one and the cycle repeats for the next data frame portion.

Abstract: Signal routing resource tiles that can be manipulated as circuit "cells" in that they can be readily characterized and implemented on a programmable logic device, e.g., a field programmable gate array (FPGA). In one embodiment, vertical placement and horizontal placement routing resource tiles are provided. Routing resources tiles may be selectively added in areas of the programmable logic device determined to be prone to high signal congestion, e.g., the central portions of the array, and along the array perimeter. The additional routing resource tiles simplify routing for complex logic functions and increase utilization of configurable logic blocks (CLBs) forming the array. The tiles can be positioned within the array in any position horizontally or vertically within the CLB array. Specifically, placement can be either in the core of the chip or along the periphery with each tile providing programmable connections to the existing routing resources (e.g., input/output ports) within the CLBs.

Abstract: A plurality of DRAM cells are used to store the state of the programmable points in a programmable logical device (e.g., a field programmable gate array or FPGA). An individual DRAM cell is used in conjunction with each programmable interconnect point (PIP) within the FPGA to hold a logical state indicating the connectivity state of the PIP. During a refresh cycle, each DRAM memory cell is loaded with its current logical state in order to maintain this state within the PIP. An information store contains duplicate data for each DRAM cell and this duplicate data is supplied and read during the refresh cycle in order to provide each DRAM cell with its proper logical state. In this manner, the refresh cycle does not alter the logic configuration of its associated FPGA DRAM cell.

Abstract: A programmable logic array improves connectivity and more efficiently routes signals between logic blocks by allowing programmable connections between each logic block and the horizontal interconnect lines above and below the logic block. Thus, more efficient signal transfer is achieved, particularly when connectivity is required between logic blocks in adjacent rows. The logic array decreases transmission delay and frees up bandwidth on vertical interconnect lines, thereby optimizing the use of routing resources.

Abstract: An apparatus for loading configuration information into a programmable integrated circuit (e.g., an FPGA) configurable to perform parallel loading or bit serial loading within the same architecture. The configuration information is presented to the FPGA in data frames of N serial bits each. Each data frame is divided into discrete serial portions having Y bits each (e.g., a data frame comprises N/Y portions). In parallel mode, the portions are loaded into a segmented configuration register, one portion per programming cycle, such that Y bits are loaded into the segmented configuration register in parallel. On each programming clock cycle during parallel loading, all the bits of a data frame portion are simultaneously loaded into the segments of the configuration register (at the first bit position for each segment) such that each segment receives one bit per programming cycle. The bits of the configuration register are then shifted down by one and the cycle repeats for the next data frame portion.

Abstract: A reference ring oscillator circuit (RROC) is used to determine timing characteristics of a test interconnect structure in an integrated circuit. The RROC includes an odd number of inverters coupled together in a ring manner and has defined test segments at which a test interconnect can be loaded. Reference timing characteristics of the unloaded RROC are determined according to a calibration method including the steps of: (a) directly measuring signal propagation delay through each segment of the RROC; (b) modeling each test segment using an RC tree type reference circuit model having reference elements; (c) simulating the reference circuit model to provide a functional relationship between two reference capacitors; (d) defining upper and lower bounds for propagation delay through the test segment in terms of the reference elements; (e) determining values for the reference capacitor elements; and (f) measuring a reference frequency of oscillation of the unloaded RROC.

Abstract: A system for interfacing with a test access communication port. Specifically, the present invention has application to the IEEE 1149.1 Test Access Port ("JTAG") standard. The novel system includes a hardware unit having a memory unit and a special processor unit (SPU) that interfaces between the test access port and components of a general purpose host computer system. The host computer system uses software procedures to formulate a set of compressed instructions instructing the hardware unit to generate and/or receive signals in connection with the test access port. In one embodiment, the host computer system contains configuration data in a special format. The host computer system translates this configuration data into the compressed instructions which are transmitted to the hardware unit causing it to download the configuration data using signals recognized by the test access port. The data is downloaded into a programmable integrated circuit device using the test access port.