Patents Represented by Attorney Antony Grillo

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  • Integrated circuit processing
    Patent number: 6004827
    Abstract: A variety of test structures may be fabricated with aluminum runners and overlying dielectrics. The dielectrics are removed and bumps are observed upon the aluminum runners. Unevenness in the bump distribution is a predictor of long term reliability problems. A test structure may be utilized to design integrated mass production fabrication processes.
    Type: Grant
    Filed: September 3, 1997
    Date of Patent: December 21, 1999
    Assignee: Lucent Technologies Inc.
    Inventor: Vivian Wanda Ryan