Patents Represented by Attorney Arent Cox LLP
  • Patent number: 8127191
    Abstract: A semiconductor integrated circuit includes a self-test circuit, wherein, when a operation mode of the self-test circuit has been switched from a low-speed operation mode to a high-speed operation mode, processing is performed in the high-speed operation mode during a given time period, and the processing result is invalidated based on a control signal.
    Type: Grant
    Filed: December 21, 2009
    Date of Patent: February 28, 2012
    Assignee: Fujitsu Semiconductor Limited
    Inventors: Takashi Maki, Daisuke Tsukuda, Tetsuya Hiramatsu