Abstract: A test structure tests an electronic card having electrical contacts on one face and a chip on the other face. By way of example, the electrical contacts on the card comprise an array of solder balls. The structure comprises a socket for receiving the card such that the electrical contacts of the card face electrical contacts within the socket. The structure further comprises a plate, received over the socket and having at least two ribs which protrude downwardly from one face of the plate and are positioned over the socket to engage a center portion of the chip when the card is received in the socket. The plate also has at least two holes. One of the ribs is positioned between the two holes but does not surround either of the holes. Consequently, forced air can flow downwardly through the holes in the plate, horizontally between the plate and the chip and out of the test structure.

Abstract: A computer system monitors a variety of conditions indicating levels to which different components, services and resources are being utilized, and based on these levels, determines a measure of overall system utilization. By way of example, the conditions are CPU utilizations dispatcher queue length, number of active users, number of users in an I/O wait queue and the paging rate. The system determines and repeatedly updates a data value for each of the conditions representing a respective amount of utilization. Then, the system determines a weighted summation based on the latest update of the data values and a significance of each of the data values in indicating system utilization. Next, the system compares the weighted summation to two or more thresholds, and determines and performs an action based on the comparison of the weighted summation to the thresholds.