Abstract: Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with each processor being connected to its own memory controller. Each memory controller is connected to its own memory. The processors are connected in a circular arrangement by multiple high-speed interconnects. There are multiple bridges with each processor being connected to its own bridge. There are multiple system buses with each bridge been connected to its own system bus. A housing encloses the processors, memory controllers, high-speed interconnects, and bridges.