Abstract: A technique for reducing errors in a PTIC (parallel, time-interleaved analog-to-digital converter) consisting of M ADCs involves sampling an input signal with the PTIC and performing M different DFTs, one for each ADC. Elements of the M DFTs are grouped together according to bin number. If all elements corresponding to the same bin number exceed a predetermined threshold, the elements are multiplied by correction matrices to yield corrected, DFT terms for a reconstructed power spectrum. If they do not exceed the threshold, DFT elements are processed to produce uncorrected DFT terms for the reconstructed power spectrum.