Patents Represented by Law Firm Chernoff, Vilhauer, McClung, & Stenzel, L
  • Patent number: 7321233
    Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.
    Type: Grant
    Filed: January 11, 2007
    Date of Patent: January 22, 2008
    Assignee: Cascade Microtech, Inc.
    Inventors: Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason
  • Patent number: 7086546
    Abstract: A method and a display rack apparatus for the efficient display of large or bulky inventory items. The display rack includes mounting brackets attached to sloping lateral frame arms to support similar parts of disassembled items of inventory in an inclined, raised array. The mounting brackets grip the frame arms by pressure of cam pins and may include associated fingers shaped to engage the parts being displayed.
    Type: Grant
    Filed: June 27, 2005
    Date of Patent: August 8, 2006
    Inventor: Roger L. Meier
  • Patent number: 6122972
    Abstract: A pressure sensor system includes a first conductive surface electrically isolated from a second conductive surface. A dielectric material is interposed between the first conductive surface and the second conductive surface. The dielectric material is movable with respect to at least one of the first conductive surface and the second conductive surface in response to a change in pressure exerted on the pressure sensor. A measurement system is connected to at least one of the first conductive surface and the second conductive surface to measure the capacitance between the first conductive surface and the second conductive surface representative of pressure.
    Type: Grant
    Filed: March 4, 1998
    Date of Patent: September 26, 2000
    Assignee: Veris Industries
    Inventor: Jim Crider