Abstract: A thin film of organic resin material (17), such as novolac, is used as an etch mask and openings (32) are formed in the mask in a predetermined pattern to allow processing in selected areas defined by the openings. The openings (32) are formed by applying a pattern of droplets (76) of caustic etchant, such as sodium hydroxide (NaOH) or potassium hydroxide (KOH) in the areas where the openings are to be formed. The droplets (76) are applied using a inkjet printer (90) which is scanned over the surface of the organic resin as the droplets are applied. The droplets (76) are of a size which defines the dimension of the openings (32) and allows the organic resin (17) under the droplet (76) to be completely removed. After the etchant has etched through the organic resin to expose an underlying surface (12), the etchant is washed from the organic resin and the openings (32).

Abstract: In accordance with the invention, a boot having a forward lean system is provided that includes medial and lateral side cable members on the boot wherein the cable members are attached to a forward portion of the boot at only one general position. The forward lean system also includes a tension adjustment member connected to the cable members for altering the length of the cable member, thereby providing adjustable forward lean.

Abstract: An overvoltage and transient protection circuit with extended bandwidth is provided for the protection of a low voltage test signal path (210) such as a test signal path in a multimeter. The disclosed circuit maintains the integrity of a test signal (TS) (114) transmitted by the test signal path (210) by minimizing the effect that unwanted capacitive coupling would otherwise have on the frequency transmission capability of the circuit. During normal operation of the circuit, a test signal path isolation circuit (218) is held between the test signal (TS) (114) and an equivalent buffered guard signal (GS) 227. Held between these equivalent values (TS=GS), no (or minimal) current will be generated in the components of the test signal path isolation circuit (218) as a result of parasitic capacitance. The guard signal (65) (227) is used with guard traces (412) and guard planes (414) to isolate other parts of the test signal path in much the same way.