Abstract: Various approaches for testing an electronic system are disclosed. The hardware units of a hardware configuration of the system are determined, and a time constraint parameter value is input. Also input is a hardware unit type identifier that specifies a first type of hardware unit of the electronic system to be tested. A database that describes a plurality of test programs is provided, and from the database at least one test program that tests the specified type of hardware unit is selected. A subset of identifiers of the hardware units of the configuration is selected for testing based on the input time constraint parameter value and the type of hardware unit tested by the at least one test program. The at least one test program is executed on the electronic system with the identifiers of the subset of hardware units as inputs.