Abstract: In one embodiment, the disclosed methodology and apparatus measure relative duty cycle information of a clock signal with respect to an input node as the clock signal travels to selected nodes of a clock distribution network on an electronic circuit. The apparatus operates in a benchmark mode to determine benchmark duty cycle information and then subsequently operates an a relative mode to determine relative duty cycle information of the clock signal at a selected node in comparison to the clock signal at an external input node.

Abstract: An information handling system includes a processor that issues instructions out of program order. The processor includes an issue queue that may advance instructions toward issue even though some instructions in the queue are not ready-to-issue. The issue queue includes a matrix of storage cells configured in rows and columns including a first row that couples to execution units. Instructions advance toward issuance from row to row as unoccupied storage cells appear. Unoccupied cells appear when instructions advance toward the first row and upon issuance. When a particular row includes an instruction that is not ready-to-issue a stall condition occurs for that instruction. However, to prevent the entire issue queue and processor from stalling, a ready-to-issue instruction in another row may bypass the row including the stalled or not-ready-to-issue instruction. Out-of-order issuance of instructions to the execution units thus continues.

Abstract: The disclosed methodology and apparatus measures the duty cycle of a clock signal. A variable duty cycle circuit receives a clock signal from a clock signal generator. The variable duty cycle circuit adjusts the duty cycle of the clock signal by an amount dependent on a duty cycle index value that it receives. The variable duty cycle circuit supplies a duty-cycle adjusted clock signal to a divider circuit. The apparatus sweeps the frequency of the clock signal from a starting value up to a maximum frequency above which the divider circuit fails. The apparatus then determines the duty cycle of the duty-cycle adjusted clock signal from the maximum frequency.

Abstract: The disclosed methodology and apparatus measure and correct the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. In one embodiment, the DCM circuit includes a capacitor driven by a charge pump. The reference clock signal drives the charge pump. The clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit applies a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. Control software accesses the data store to determine the duty cycle to which the test clock signal corresponds, thus providing a measured duty cycle.