Patents Represented by Attorney, Agent or Law Firm David A. Tcuker
  • Patent number: 6219517
    Abstract: A registration pattern data generating portion is configured of a pattern set data generator for rough order error estimation and a pattern set data generator for fine order error estimation. When an error is estimated, a pattern set for rough order error estimation is checked first so as to roughly determine the size of the error and then another pattern set for fine order error estimation is checked so as to finely determine the size of the error. Thus, checking the two types of pattern sets makes it possible to exactly recognize the error in rough and fine units, providing fast and exact error determination.
    Type: Grant
    Filed: October 27, 1999
    Date of Patent: April 17, 2001
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Kazunobu Takahashi, Kyosuke Taka, Hidekazu Sakagami, Nobuo Manabe