Abstract: A test device is formed on a chip which allows the susceptibility to failure of functional circuitry formed on the chip to be tested. The test device allows aggressive design of chips which include sensitive circuitry, such as precharged dynamic logic, by testing whether deviations from the design specification introduced during manufacturing of the chip are sufficient to cause failure of the functional circuitry.
Type:
Grant
Filed:
April 30, 1999
Date of Patent:
August 29, 2000
Assignee:
International Business Machines Corporation
Inventors:
Salvatore Nickolas Storino, Robert Russell Williams
Abstract: A test device is formed on a chip which allows the susceptibility to failure of functional circuitry formed on the chip to be tested. The test device allows aggressive design of chips which include sensitive circuitry, such as precharged dynamic logic, by testing whether deviations from the design specification introduced during manufacturing of the chip are sufficient to cause failure of the functional circuitry.
Type:
Grant
Filed:
April 17, 1998
Date of Patent:
April 11, 2000
Assignee:
International Business Machines Corporation
Inventors:
Salvatore Nickolas Storino, Robert Russell Williams