Patents Represented by Attorney Derek Meeker
  • Patent number: 8228072
    Abstract: A test and measurement instrument including a plurality of channels, each channel configured to receive a corresponding input signal. Each channel includes a comparator configured to compare the input signal to a threshold for the channel; an edge detector configured to detect an edge of an output signal of the comparator; and a threshold controller configured to adjust the threshold for the channel in response to the edge detector.
    Type: Grant
    Filed: April 23, 2009
    Date of Patent: July 24, 2012
    Assignee: Tektronix, Inc.
    Inventor: Michael S. Hagen
  • Patent number: 8102396
    Abstract: An apparatus for measuring a parameter of a digitized signal including a digitizer to digitize an input signal into a digitized signal, a rasterizer to generate a raster image from the digitized input signal, a processor to receive the raster image, and a control interface to receive an input control signal indicating a request for a measurement. The rasterizer is responsive to the control signal to generate the raster image from the digitized input signal, and the processor is responsive to the control signal to generate a histogram from the raster image.
    Type: Grant
    Filed: July 17, 2006
    Date of Patent: January 24, 2012
    Assignee: Tektronix, Inc.
    Inventors: Kenneth P. Dobyns, Paul M. Gerlach
  • Patent number: 8103473
    Abstract: A test and measurement instrument and a method of calibrating the test and measurement instrument including a reference signal generator; multiple input channels; and multiple input circuits. Each input channel is coupled to a corresponding input circuit; and one of the input circuits is coupled to the reference signal generator.
    Type: Grant
    Filed: October 15, 2008
    Date of Patent: January 24, 2012
    Assignee: Tektronix, Inc.
    Inventors: Ronald A. Acuff, Lester L. Larson, Kevin E. Cosgrove
  • Patent number: 8089293
    Abstract: A test and measurement instrument including a port including a plurality of connections; an impedance sense circuit configured to sense an impedance coupled to a connection of the plurality of connections; and a controller configured to setup the test and measurement instrument in response to a sensed impedance from the impedance sense circuit.
    Type: Grant
    Filed: April 20, 2009
    Date of Patent: January 3, 2012
    Assignee: Tektronix, Inc.
    Inventor: Michael S. Hagen
  • Patent number: 8085812
    Abstract: A method of displaying protocol-specific data includes receiving data, extracting protocol-specific information from the data, converting protocol-specific information into a symbolic representation, and presenting the symbolic representation. A dimension of symbols of the symbolic representation differentiates protocol layers. A test and measurement instrument for displaying data includes an acquisition system configured to receive an input signal, a processor coupled to the acquisition system and configured to generate a symbolic representation of protocol-specific information within the input signal, and a user interface coupled to the processor and configured to present the symbolic representation. A dimension of symbols of the symbolic representation differentiates protocol layers.
    Type: Grant
    Filed: March 23, 2007
    Date of Patent: December 27, 2011
    Assignee: Tektronix, Inc.
    Inventor: Leo David Frishberg
  • Patent number: 7827209
    Abstract: A test and measurement instrument and method of operating for presenting data in a data presentation, receiving a data selection indicating a portion of the data presented in the data presentation, generating a data object in response to the data selection, presenting the data object in an analysis sandbox, and generating an analysis construct in response to analysis objects in the analysis sandbox.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: November 2, 2010
    Assignee: Tektronix, Inc.
    Inventors: Leo David Frishberg, Eric Gould Bear
  • Patent number: 7545377
    Abstract: An apparatus for displaying a digitized waveform includes an overview display configured to display a digitized waveform scrolling across the overview display, a zoom display configured to display a portion of the digitized waveform, and a control unit configured to cause the portion of the digitized waveform displayed in the zoom display to track the displayed portion of the digitized waveform in response to a track signal.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: June 9, 2009
    Assignee: Tektronix, Inc.
    Inventors: Kenneth P. Dobyns, Paul M. Gerlach
  • Patent number: 7516028
    Abstract: A test and measurement instrument includes a memory configured to store a digitized signal, a display configured to display the digitized signal, a mark interface configured to generate a mark creation signal, a processor coupled to the memory, the display, and the mark interface. The processor is configured to identify a feature of the digitized signal and create a mark indicating the feature and the digitized signal in response to the mark creation signal.
    Type: Grant
    Filed: August 2, 2006
    Date of Patent: April 7, 2009
    Assignee: Tektronix, Inc.
    Inventors: Keith D. Rule, Lance H. Forsberg, Robert L. Beasley, Steven C. Herring, Kenneth P. Dobyns, Scott R. Ketterer
  • Patent number: 7474972
    Abstract: An acquisition apparatus for a test and measurement instrument including a splitter configured to split an input signal into a plurality of split signals, a plurality of oscillators, each oscillator configured to generate a periodic signal, a plurality of combiners, each combiner configured to combine an associated plurality of the periodic signals into an associated signal combination where at least one of the signal combinations is substantially non-periodic. The apparatus also includes a plurality of mixers, each mixer configured to mix an associated split signal and an associated signal combination into an associated mixed signal, a first digitizer configured to digitize an associated split signal, and a plurality of second digitizers, each second digitizer configured to digitize an associated mixed signal.
    Type: Grant
    Filed: March 23, 2007
    Date of Patent: January 6, 2009
    Assignee: Tektronix, Inc.
    Inventors: John J. Pickerd, Kan Tan, Thomas C. Hill, III
  • Patent number: 7257497
    Abstract: An acquisition apparatus for a test and measurement instrument includes an input to receive an input signal, a digitizer to digitize a selected signal, a bypass path to selectively couple the input to the digitizer, a frequency shift path to frequency shift the input signal and selectively couple the frequency-shifted input signal to the digitizer, the frequency shift path including a means for frequency shifting, an input switch to switch the input signal to one of the bypass path and the frequency shift path, and an output switch to provide the selected signal to the digitizer by selectively coupling an output of one of the frequency shift path and the bypass path to the digitizer.
    Type: Grant
    Filed: February 7, 2006
    Date of Patent: August 14, 2007
    Assignee: Tektronix, Inc.
    Inventor: John J. Pickerd